A system and method for measuring the thickness of oxide layer on the surface of power generation components

Abstract

A system and method for measuring the thickness of the oxide layer on the surface of a power generation component are disclosed. The measurement system includes a microscope and a base device fixed to a detection area. The microscope is mounted on the base device. The detection area includes a polished portion of the oxide layer on the surface of the power generation component that exposes the substrate. An oxide layer separation line is formed between the polished portion and the unpolished portion of the oxide layer on the surface of the power generation component. The base device also includes a rotation device for the microscope, a rotation angle measuring device, and a relative tilt angle measuring device after the base device is fixed to the polished portion. This invention enables relatively accurate measurement of the oxide layer thickness on the surface of power generation components and is easy to carry and apply in the field.

Description

Technical Field

[0001] This invention relates to a surface oxide layer thickness measurement system and method, and more particularly to a surface oxide layer thickness measurement system and method for power generation components, belonging to the field of non-destructive testing technology. Background Technology

[0002] As is well known, with the continuous improvement of the operating parameters of thermal power units and the deepening of their participation in peak shaving, the rate at which oxide scale is generated on the surface of power generation components such as pipes, impellers, and valves has increased significantly compared to the past. In particular, the valves of steam turbines frequently become stuck due to the generation and shedding of oxide scale. Once the valves become stuck or jammed, it directly affects the safe operation of the unit, and in severe cases, it can even lead to the steam turbine overspeeding.

[0003] Because the oxide scale covers the outer surface of the power generation components and is ferromagnetic, it is difficult to inspect it using existing ultrasonic and eddy current testing methods. The ultrasonic testing technology is, for example, the known method for measuring the thickness of the metal layer and oxide layer on the wall of the boiler heating surface tube (CN102980539A), while the eddy current testing technology is, for example, the known method for measuring the thickness of the corrosion layer on the inner wall of an austenitic tube (CN112378329A).

[0004] Currently, the inspection of oxide scale on the surface of power generation components such as control valves is based on visual inspection after valve disassembly during maintenance. This can only roughly reflect the concept of whether there is more or less oxide scale, and cannot form a systematic inspection data comparison of the oxide scale formation rate, nor can it predict the oxide scale growth rate. This will be detrimental to the safe operation of valves during long-term operation of the unit. Summary of the Invention

[0005] In order to overcome the above-mentioned shortcomings of related technologies, the present invention provides a system and method for measuring the thickness of oxide layer on the surface of power generation components, which can accurately measure the thickness of oxide layer on the surface of power components and is easy to carry and apply in the field.

[0006] One technical solution adopted by the present invention to solve its technical problem is:

[0007] A system for measuring the thickness of the oxide layer on the surface of a power generation component includes a microscope and a base device fixed to a detection area. The microscope is mounted on the base device, and the detection area includes a polished portion of the oxide layer on the surface of the power generation component that exposes the substrate. An oxide layer separation line is formed between the polished portion and the unpolished portion of the oxide layer on the surface of the power generation component.

[0008] The base device is also equipped with a rotating device for the microscopic device, a rotating angle measuring device, and a relative tilt angle measuring device after the base device is fixed on the grinding part.

[0009] Optionally, the microscopic device includes a low-power microscope with at least 50x magnification and a crosshair measuring scale.

[0010] Optionally, the basic device includes a support, on which a clamping member for fixing a low-power microscope is provided, and the clamping member is mounted on the support by a rotating device;

[0011] The rotating device includes a rotating frame, with a clamping component fixedly connected to one side of the rotating frame and the other side rotatably mounted on the front of the support.

[0012] The bracket is also provided with a base for fixed connection with the detection part. The base has a threaded hole that runs through the top and bottom and is used in conjunction with a fastening component.

[0013] Optionally, the fastening component uses a magnetic fastening screw.

[0014] Optionally, the rotation angle measuring device includes a scale dial, which is detachably fixed to the back of the bracket by a locking member, the bracket being made of a transparent material.

[0015] Optionally, the relative tilt angle measuring device includes a level mounted on the base for calibrating the horizontal deviation of the base relative to the grinding area.

[0016] Another technical solution adopted by the present invention to solve its technical problem is: a method for measuring the thickness of the oxide layer on the surface of a power generation component, using the above-mentioned system for measuring the thickness of the oxide layer on the surface of a power generation component, including the following operating steps:

[0017] 1) Adjacent polished and unpolished areas are formed on the oxide layer surface of the power generation components, with an oxide layer dividing line between them;

[0018] 2) Place the base device on the grinding area and adjust it to be relatively horizontal. If it cannot be relatively horizontal, record the relative tilt angle β.

[0019] 3) Adjust the position of the low-power microscope so that it is aligned with the oxide layer separation line to meet the requirements for microscope observation;

[0020] 4) Rotate the low-power microscope to a certain angle α to clearly observe the thickness of the oxide layer. At this time, the microscope field of view includes the junction a between the metal substrate of the component and the oxide layer and the junction b between the upper surface of the oxide layer and the cross section. The distance Lab between position a and position b is measured by the microscope and recorded.

[0021] 5) Calculate the oxide layer T using the following formula:

[0022] When the base of the device is level with the surface of the component, the actual thickness of the oxide layer is calculated according to the following formula.

[0023] T = Lab / cosα or T = Lab × cosβ / cosα.

[0024] Optionally, step 1) includes: polishing the surface of the power generation component with an oxide scale morphology, so that part of it forms a polished part that exposes the substrate and has a metallic luster, and part of it remains an unpolished part, with an oxide layer separating the two.

[0025] Optionally, step 2) includes: placing the base of the base device on the grinding area, adjusting the fastening components to make the two relatively horizontal and relatively fixed; if the relative horizontality cannot be guaranteed, the relative tilt angle β at this time is recorded by a level.

[0026] Optionally, step 3) includes: adjusting the position of the low-power microscope in the height direction so that the distance between the lens and the oxide layer separation line meets the requirements for microscope observation.

[0027] Compared with related technologies, the present invention provides a system and method for measuring the thickness of the oxide layer on the surface of a power generation component. This system uses a base device to fix the detection area of ​​the oxide layer on the surface of the power generation component, and then uses a microscope device installed on the base device to observe the oxide layer separation line between the artificially formed polished area and the unpolished area. After obtaining the necessary parameters, the actual thickness of the oxide layer is obtained by using a formula. Compared with visual inspection, this method not only greatly improves the measurement accuracy, but also has good portability, which is conducive to its widespread application in various actual field situations. Attached Figure Description

[0028] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0029] Figure 1 This is a front-view perspective view of a system for measuring the thickness of the oxide layer on the surface of a power generation component according to an embodiment of the present invention, omitting the display of the microscopic device.

[0030] Figure 2 This is a side-view perspective view of a system for measuring the thickness of the oxide layer on the surface of a power generation component according to an embodiment of the present invention, omitting the display of the microscopic device.

[0031] Explanation of the reference numerals in the figure:

[0032] 2-Basic device; 21-Support; 22-Clamping component; 23-Base; 231-Threaded hole; 2311-Fastening component;

[0033] 3-Rotating device; 31-Rotating frame;

[0034] 4- Rotation angle measuring device; 41- Scale; 42- Locking component;

[0035] 5-Relative tilt angle measuring device; 51-Level instrument. Detailed Implementation

[0036] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present invention.

[0037] Figure 1 and Figure 2 The figure shows a structural schematic diagram of a preferred embodiment of the present invention. A system for measuring the thickness of the oxide layer on the surface of a power generation component includes a microscopic device and a base device 2 fixed to the detection area. The microscopic device is mounted on the base device 2. The detection area includes a polished portion of the oxide layer on the surface of the power generation component that exposes the substrate. An oxide layer separation line is formed between the polished portion and the unpolished portion of the oxide layer on the surface of the power generation component.

[0038] The base device 2 is also equipped with a microscopic rotating device 3, a rotation angle measuring device 4, and a relative tilt angle measuring device 5 after the base device 2 is fixed on the grinding part.

[0039] Among them, the premise of the polishing part is to select the location with a more typical oxide scale morphology for polishing based on the oxidation condition of the component surface.

[0040] The aforementioned basic device 2, as a key component connecting the upper and lower parts, mainly has three functions: 1) It has a low-magnification microscope clamping function, and the clamping position should ensure that the microscope is firm and stable; 2) The base 23 has a function to make firm contact with the surface of the component, and the contact part can be adjusted to be relatively horizontal using the locking component 42; 3) The rotating frame 31 of the low-magnification microscope clamping part can rotate in 5° increments (the angle increment rotation function here can be achieved by various gear adjustment rotation structures in the existing technology, such as ratchet mechanism or paddle mechanism), and the clamping component 22 can be fixed by the fastening component 2311 after each increment rotation.

[0041] As a further optional implementation of the measurement system in this embodiment, the microscopic device includes a low-power microscope with at least 50x magnification and a crosshair measuring scale. A low-power microscope is preferred because it offers a large field of view and high brightness, the at least 50x magnification meets the minimum usage requirements, and the crosshair measuring scale structure enables quantitative observation to ensure accuracy.

[0042] As a further optional implementation of the measurement system in this embodiment, the basic device 2 includes a bracket 21, on which a clamping member 22 for fixing a low-power microscope is provided, and the clamping member 22 is mounted on the bracket 21 by a rotating device 3.

[0043] The rotating device 3 includes a rotating frame 31, one side of which is fixedly connected to a clamping member 22, and the other side is rotatably disposed on the front of the support 21.

[0044] The bracket 21 is also provided with a base 23 for fixed connection with the detection part. The base 23 has a threaded hole 231 that runs through the top and bottom, which is used in conjunction with the fastening component 2311.

[0045] One feasible solution for the aforementioned paddle mechanism is to include a ring gear, for example, with a total of 72 teeth, disposed on the outer periphery of the rotating shaft of the rotating frame 31, and a V-shaped paddle disposed in a hole on the bracket 21 for mounting the rotating shaft. Specifically, the V-shaped paddle can be embedded in a groove in the hole.

[0046] The outer surface of the rotating frame 31 is marked with a 0-point indicator arrow. When the clamping device is positioned horizontally at 180°, the indicator arrow aligns with the 90° mark on the dial 41, and the V-shaped lever engages with the tooth groove of the ring gear on the rotating shaft. When the rotating frame 31 is rotated, the tooth groove and the V-shaped lever undergo a rotational collision once per rotation. After the collision, the V-shaped lever engages with the adjacent tooth groove, thereby achieving a step rotation of 5°.

[0047] The figure shows a specific structure of the clamping member 22, which is an open slot structure. It is essential to have both telescopic adjustment function and locking function. The figure does not show the specific details of the structure, but those skilled in the art can easily obtain the corresponding implementation structure based on the existing technology, as well as the alternative fixture that can completely replace the clamping member shown in the figure, so as to meet the clamping and fixing of microscopic devices with different structural forms and locations.

[0048] As a further optional implementation of the measurement system in this embodiment, the fastening member 2311 adopts a magnetic fastening screw. The application of the magnetic fastening screw achieves a dual reinforcement and fixing effect of screw fastening and magnetic fastening.

[0049] As a further optional implementation of the measurement system in this embodiment, the rotation angle measuring device 4 includes a scale 41, which is detachably fixed to the back of the bracket 21 by a locking member 42. The bracket 21 is made of transparent material. The scale 41 can relatively accurately and quickly acquire the rotation angle α information of the low-magnification microscope.

[0050] As a further optional implementation of the measurement system in this embodiment, the relative tilt angle measuring device 5 includes a level 51 mounted on the base 23 for calibrating the horizontal deviation of the base 23 relative to the grinding area.

[0051] The relative tilt angle β of the base device 2 on the grinding part can be collected relatively accurately and quickly by using the level 51, especially multiple levels 51 arranged in multiple directions.

[0052] This invention also provides a method for measuring the thickness of the oxide layer on the surface of a power generation component. Using the aforementioned method for measuring the thickness of the oxide layer on the surface of a power generation component, the method includes the following steps:

[0053] 1) Adjacent polished and unpolished areas are formed on the oxide layer surface of the power generation components, with an oxide layer dividing line between them;

[0054] 2) Place the base device 2 on the grinding area and adjust it to be relatively horizontal. If it cannot be relatively horizontal, record the relative tilt angle β.

[0055] 3) Adjust the position of the low-power microscope so that it is aligned with the oxide layer separation line to meet the requirements for microscope observation;

[0056] 4) Rotate the low-power microscope to a certain angle α to clearly observe the thickness of the oxide layer. At this time, the microscope field of view includes the junction a between the metal substrate of the component and the oxide layer and the junction b between the upper surface of the oxide layer and the cross section. The distance Lab between position a and position b is measured by the microscope and recorded.

[0057] 5) Calculate the oxide layer T using the following formula:

[0058] When the mounting base 23 is horizontal with the surface of the component, the actual thickness of the oxide layer is calculated according to the following formula.

[0059] T = Lab / cosα or T = Lab × cosβ / cosα.

[0060] As a further optional implementation of the measurement method in this embodiment, step 1) includes: polishing the surface of the power generation component with an oxide scale morphology, so that part of it forms a polished part that exposes the substrate and has a metallic luster, and part of it remains an unpolished part, with an oxide layer separating the two.

[0061] As a further optional implementation of the measurement method in this embodiment, step 2) includes: placing the base 23 of the base device 2 on the grinding part, and adjusting the fastening member 2311 to make the two relatively horizontal and relatively fixed; if the relative horizontality cannot be guaranteed, the relative tilt angle β at this time is recorded by the level 51.

[0062] As a further optional implementation of the measurement method in this embodiment, step 3) includes: adjusting the position of the low-power microscope in the height direction so that the distance between the lens and the oxide layer separation line meets the requirements for microscope observation.

[0063] This embodiment innovatively employs microscopic measurement methods. By grinding to form the detection part, and based on the combination of the two, it is possible to obtain microscopic parameters within the microscope's field of view, including the junction position 'a' between the component's metal substrate and the oxide layer, the junction position 'b' between the upper surface of the oxide layer and the cross-section, and the distance Lab between the microscope measurement positions 'a' and 'b'. At the same time, combined with macroscopic position parameters (rotation angle α, relative tilt angle β) that can be directly read after installation, the thickness of the surface oxide layer with high accuracy is finally obtained using a calculation formula.

[0064] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention in any way. Any simple modifications and equivalent changes made to the above embodiments based on the technical essence of the present invention shall fall within the protection scope of the present invention.

Claims

1. A system for measuring the thickness of the oxide layer on the surface of a power generation component, characterized in that: It includes a microscope device and a base device fixed to the detection area. The microscope device is placed on the base device. The detection area includes a polished area where the oxide layer on the surface of the power generation component is exposed to the substrate. An oxide layer separation line is formed between the polished area and the unpolished area of ​​the oxide layer on the surface of the power generation component. The base device is also equipped with a rotating device for the microscope, a rotating angle measuring device, and a relative tilt angle measuring device after the base device is fixed on the grinding part. The microscopic device includes a low-power microscope with a magnification of not less than 50x and a crosshair measuring scale; The basic device includes a support frame, on which a clamping component for fixing a low-power microscope is provided, and the clamping component is mounted on the support frame by a rotating device; The rotating device includes a rotating frame, with a clamping component fixedly connected to one side of the rotating frame and the other side rotatably mounted on the front of the support. The bracket is also provided with a base for fixed connection with the detection part. The base has a threaded hole that runs through the top and bottom and is used in conjunction with a fastening component. The rotation angle measuring device includes a scale dial, which is detachably fixed to the back of the bracket by a locking component. The bracket is made of transparent material. The relative tilt angle measuring device includes a level mounted on the base, used to calibrate the horizontal deviation of the base relative to the grinding area.

2. The system for measuring the thickness of the oxide layer on the surface of a power generation component according to claim 1, characterized in that: The fastening components use magnetic fastening screws.

3. A method for measuring the thickness of the oxide layer on the surface of a power generation component, characterized in that, The method of measuring the thickness of the oxide layer on the surface of the power generation component as described in claim 2 includes the following steps: 1) Adjacent polished and unpolished areas are formed on the oxide layer surface of the power generation components, with an oxide layer dividing line between them; 2) Place the base device on the grinding area and adjust it to be relatively horizontal. If it cannot be relatively horizontal, record the relative tilt angle β. 3) Adjust the position of the low-power microscope so that it is aligned with the oxide layer separation line to meet the requirements for microscope observation; 4) Rotate the low-power microscope to a certain angle α to clearly observe the thickness of the oxide layer. At this time, the microscope field of view includes the junction a between the metal substrate of the component and the oxide layer and the junction b between the upper surface of the oxide layer and the cross section. The distance Lab between position a and position b is measured by the microscope and recorded. 5) Calculate the oxide layer T using the following formula: When the base of the mounting device is level with the surface of the component, the actual thickness of the oxide layer is calculated according to the following formula. T = Lab / cosα or T = Lab × cosβ / cosα.

4. The method for measuring the thickness of the oxide layer on the surface of a power generation component according to claim 3, characterized in that, Step 1) includes: polishing the surface of the power generation component with an oxide scale morphology, so that part of it forms a polished part that exposes the substrate and has a metallic luster, and part of it remains an unpolished part, with an oxide layer separating the two.

5. The method for measuring the thickness of the oxide layer on the surface of a power generation component according to claim 4, characterized in that, Step 2) includes: placing the base of the base device on the grinding area, adjusting the fastening components to make the two relatively horizontal and relatively fixed; if the relative horizontality cannot be guaranteed, the relative tilt angle β at this time is recorded by a level.

6. The method for measuring the thickness of the oxide layer on the surface of a power generation component according to claim 5, characterized in that, Step 3) includes: adjusting the position of the low-power microscope in the height direction so that the distance between the lens and the oxide layer separation line meets the requirements for microscope observation.

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