Methods, apparatus, systems and computer equipment for testing the reliability of pre-charge resistors

Abstract

This application relates to a method, apparatus, system, computer device, storage medium, and computer program product for testing the reliability of a pre-charged resistor. The method includes: acquiring a target temperature for the pre-charged resistor; wherein the target temperature is the maximum temperature the pre-charged resistor can withstand during operation; determining the measured resistance of the pre-charged resistor after maintaining it at the target temperature for a target test duration; the target test duration is determined based on temperature distribution data of the pre-charged resistor under all operating conditions within a preset period; and determining the reliability of the pre-charged resistor within the preset period based on the measured resistance. This method can improve the accuracy of pre-charged resistor reliability testing.

Description

Technical Field

[0001] This application relates to the field of power battery technology, and in particular to a method, apparatus, system, computer equipment, storage medium, and computer program product for detecting the reliability of pre-charge resistance. Background Technology

[0002] In the drive system of an electric vehicle, the power battery and the motor controller are connected, and the motor controller has a large capacitor as its load. If the main relay is directly connected to the capacitor during a cold start, it will damage the relay and the battery cells. Therefore, a pre-charging solution is incorporated into the power battery system of electric vehicles, allowing a pre-charging circuit composed of a pre-charging resistor with higher impedance to be connected first. When the pre-charging circuit is working, the voltage across the load capacitor increases, while the pre-charging current decreases, thus reducing the inrush current during power-on and protecting the motor controller, battery, and main relay. It is evident that the pre-charging resistor plays an indispensable role in electric vehicles.

[0003] In battery systems, the pre-charge resistor is typically located near the high-voltage relay and high-voltage copper busbar, and is continuously exposed to high-temperature heat radiation. According to the failure mechanism, high temperatures cause material aging, leading to failure modes such as pre-charge circuit interruption, resistance decrease, and parameter drift. Since power battery systems generally have a lifespan requirement of 8 to 10 years, the reliability of the pre-charge resistor needs to be tested to ensure it can effectively perform its pre-charge function throughout its entire lifespan.

[0004] Currently, the reliability of pre-charge resistors is generally determined at a constant temperature by considering the effect of a certain number of charge-discharge cycles on the pre-charge resistor, which results in low accuracy of the test. Summary of the Invention

[0005] Therefore, it is necessary to provide a method, system, computer device, computer-readable storage medium, and computer program product for detecting the reliability of pre-charge resistors, which can improve the accuracy of detecting the reliability of pre-charge resistors, in order to address the above-mentioned technical problems.

[0006] Firstly, this application provides a method for detecting the reliability of a pre-charge resistor. The method includes:

[0007] Obtain the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation.

[0008] The measured resistance of the pre-charge resistor after maintaining the target test duration at the target temperature is determined; the target test duration is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period.

[0009] The reliability of the pre-charge resistor within the preset period is determined based on the measured resistance.

[0010] In one embodiment, the method for determining the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period includes:

[0011] Acquire first temperature distribution data of the pre-charge resistor under storage conditions within a preset period; the first temperature distribution data includes at least one first temperature and a first quantity percentage value of each first temperature.

[0012] Determine the current variation data of the pre-charge resistor under operating conditions;

[0013] The number of times the pre-charge resistor operates at each of the first temperatures is determined based on the percentage values ​​of each of the first temperatures and the total number of times the pre-charge resistor operates.

[0014] Based on each of the first temperatures and the number of times the operation is performed at each of the first temperatures, the pre-charge resistor is controlled to operate according to the current change data to obtain the second temperature distribution data of the pre-charge resistor under the working condition in the preset period.

[0015] Based on the first temperature distribution data and the second temperature distribution data, the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period are determined.

[0016] In one embodiment, the current change data includes first change data generated during the current rise phase and second change data generated during the current fall phase of the pre-charge resistor during power-on. The step of controlling the pre-charge resistor to operate according to the current change data based on each of the first temperatures and the number of operations at each of the first temperatures, to obtain second temperature distribution data of the pre-charge resistor under the operating conditions of the preset period, includes:

[0017] When the pre-charge resistor is at each of the first temperatures, based on the number of times it operates at each of the first temperatures, power is applied according to the first change data and the second change data to obtain the second temperature distribution data of the pre-charge resistor under the working condition of the preset cycle.

[0018] The second temperature distribution data includes at least one second temperature and the percentage of the at least one second temperature.

[0019] In one embodiment, the step of powering on the pre-charge resistor at each of the first temperatures, based on the number of operations at each of the first temperatures and according to the first change data and the second change data, to obtain second temperature distribution data of the pre-charge resistor under the operating conditions of the preset period, includes:

[0020] When the ambient temperature of the pre-charge resistor reaches each of the first temperatures, power is applied sequentially according to the number of operations at each of the first temperatures, based on the first change data and the second change data.

[0021] When the number of times the pre-charge resistor is powered on is equal to the number of times it operates at each of the first temperatures, the power-on is paused, and each of the first temperatures is controlled to change according to the rate of temperature change until the first temperature is the set temperature, thereby obtaining the second temperature distribution data of the pre-charge resistor under the operating condition in the preset period.

[0022] In one embodiment, obtaining the target temperature of the pre-charge resistor includes:

[0023] Based on the accuracy and temperature drift of the pre-charge resistor, a first resistance threshold and a second resistance threshold are determined for the pre-charge resistor; the first resistance threshold is less than the second resistance threshold.

[0024] The resistance value of the pre-charge resistor is measured at each temperature point when the temperature increases at a preset temperature with a corresponding preset temperature change rate.

[0025] The target temperature of the pre-charge resistor is determined based on the first resistance threshold, the second resistance threshold, and the resistance values ​​at each temperature point.

[0026] In one embodiment, determining the target temperature of the pre-charge resistor based on the first resistance threshold, the second resistance threshold, and the resistance values ​​at each temperature point includes:

[0027] Based on the first resistance threshold, the second resistance threshold, and the resistance values ​​at each temperature point, the candidate temperature for the pre-charge resistance is determined.

[0028] The target temperature of the pre-charge resistor is determined based on the mean temperature and the standard deviation of the candidate temperatures.

[0029] In one embodiment, the temperature distribution data includes a third temperature under all operating conditions and the percentage of each of the third temperatures. The target test duration is determined based on the temperature distribution data and includes:

[0030] Determine the test temperature of the pre-charge resistor;

[0031] The acceleration factor for shortening the test time of the pre-charge resistor is determined based on the test temperature, each of the third temperatures, and the percentage of each of the third temperatures.

[0032] The target test duration of the pre-charge resistor is determined based on the acceleration coefficient and the usage duration parameter of the pre-charge resistor.

[0033] Secondly, this application also provides an apparatus for detecting the reliability of a pre-charge resistor. The apparatus includes:

[0034] The data acquisition module is used to acquire the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation.

[0035] The data determination module is used to determine the measured resistance of the pre-charged resistor after maintaining the target test duration at the target temperature; the target test duration is determined based on the temperature distribution data of the pre-charged resistor under all operating conditions within a preset period.

[0036] A detection module is used to determine the reliability of the pre-charge resistor within the preset period based on the measured resistor.

[0037] Thirdly, this application also provides a system for detecting the reliability of a pre-charged resistor. The system includes a temperature-controlled device, a pre-charged resistor disposed within the temperature-controlled device, and a terminal connected to the temperature-controlled device. The temperature-controlled device is used to apply a temperature load to the pre-charged resistor, simulating different operating conditions of the pre-charged resistor at different temperatures. The system includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0038] Obtain the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation.

[0039] The measured resistance of the pre-charge resistor after maintaining the target test duration at the target temperature is determined; the target test duration is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period.

[0040] The reliability of the pre-charge resistor within the preset period is determined based on the measured resistance.

[0041] Fourthly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to perform the following steps:

[0042] Obtain the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation.

[0043] The measured resistance of the pre-charge resistor after maintaining the target test duration at the target temperature is determined; the target test duration is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period.

[0044] The reliability of the pre-charge resistor within the preset period is determined based on the measured resistance.

[0045] Fifthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, performs the following steps:

[0046] Obtain the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation.

[0047] The measured resistance of the pre-charge resistor after maintaining the target test duration at the target temperature is determined; the target test duration is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period.

[0048] The reliability of the pre-charge resistor within the preset period is determined based on the measured resistance.

[0049] Sixthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, performs the following steps:

[0050] Obtain the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation.

[0051] The measured resistance of the pre-charge resistor after maintaining the target test duration at the target temperature is determined; the target test duration is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period.

[0052] The reliability of the pre-charge resistor within the preset period is determined based on the measured resistance.

[0053] The aforementioned method, apparatus, system, computer equipment, storage medium, and computer program products for testing the reliability of pre-charge resistors determine the reliability of the pre-charge resistor by identifying all temperature distribution data of the pre-charge resistor within a preset period and the maximum operating temperature the pre-charge resistor can withstand. Based on the temperature distribution data, a target test duration for the pre-charge resistor is determined, and the reliability of the pre-charge resistor is determined by measuring its resistance after maintaining the target test duration at the maximum operating temperature. By testing the pre-charge resistor based on temperature distribution data under all operating conditions within the preset period and determining the test duration, all actual temperature data within the preset period are considered. Compared to relying solely on temperature data, this increases the amount of data analyzed and the analytical dimensions, thereby improving the accuracy of the test results. Attached Figure Description

[0054] Figure 1 This is a diagram illustrating the application environment of a method for detecting the reliability of a pre-charge resistor in one embodiment.

[0055] Figure 2 This is a flowchart illustrating a method for detecting the reliability of a pre-charge resistor in one embodiment;

[0056] Figure 3 This is a flowchart illustrating a method for determining temperature distribution data for all operating conditions within a preset period, as shown in one embodiment.

[0057] Figure 4 This is a cross-sectional schematic diagram of the pre-charge resistor power-on process in one embodiment;

[0058] Figure 5 This is a flowchart illustrating a method for determining second temperature distribution data in one embodiment;

[0059] Figure 6 This is a schematic diagram of the current profile for continuously energizing a pre-charge resistor in one embodiment.

[0060] Figure 7 This is a schematic diagram of the pre-charge resistor being powered on in one embodiment;

[0061] Figure 8 This is a flowchart illustrating a method for determining the target temperature of a pre-charge resistor in one embodiment.

[0062] Figure 9 This is a schematic diagram illustrating the determination of the resistance value corresponding to each temperature gradient of the pre-charge resistor in one embodiment.

[0063] Figure 10 This is a flowchart illustrating a method for detecting the reliability of a pre-charge resistor in another embodiment;

[0064] Figure 11 This is a structural block diagram of a device for detecting the reliability of a pre-charge resistor in one embodiment;

[0065] Figure 12 This is a block diagram of a system for detecting the reliability of a pre-charge resistor in one embodiment;

[0066] Figure 13 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0067] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0068] The method for detecting the reliability of the pre-charge resistor provided in this application embodiment can be applied to, for example... Figure 1In the application environment shown, terminal 102 communicates with temperature acquisition device 104 via a network. A data storage system can store the data that terminal 102 needs to process. The data storage system can be integrated into terminal 102 or placed on a cloud server or other network server. The terminal acquires temperature distribution data of the pre-charge resistor under all operating conditions within a preset period and the target temperature of the pre-charge resistor; wherein the target temperature is the maximum temperature that the pre-charge resistor can withstand; determines the measured resistance of the pre-charge resistor after maintaining a target test duration at the target temperature; wherein the target test duration is determined based on the temperature distribution data; and determines the reliability of the pre-charge resistor within the preset period based on the measured resistance. Terminal 102 can be, but is not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, etc. Temperature acquisition device 104 can be, but is not limited to, different types of temperature sensors.

[0069] In one embodiment, such as Figure 2 As shown, a method for detecting the reliability of a pre-charge resistor is provided, and this method is applied to... Figure 1 Taking the terminal in the example, the explanation includes the following steps:

[0070] Step 202: Obtain the target temperature of the pre-charge resistor; wherein, the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation.

[0071] The pre-charge resistor can be incorporated into the power battery, which provides driving force to the vehicle. For example, power batteries can be used in different types of electric vehicles to provide driving force. During a cold start of an electric vehicle, using the pre-charge resistor to pre-charge the battery reduces the inrush current upon power-up, protecting the motor controller, battery, and main relay. The pre-charge resistor is a component to be verified; its resistance value varies depending on the vehicle model selected, and it is generally a wire-wound resistor with a metal casing.

[0072] The pre-charge resistor's operating conditions include both active and storage conditions. Active conditions can be understood as the pre-charge resistor being energized at a certain temperature, maintained for a period, and then de-energized. After de-energization, it enters a long-term storage state, which can also be understood as storage conditions. It's understandable that the storage and active states of the pre-charge resistor differ at different temperatures. In battery systems, pre-charge resistors are typically located near high-voltage relays and copper busbars, and are continuously exposed to high-temperature heat radiation. The preset period can be understood as the set service life of the pre-charge resistor to meet actual usage requirements. This set service life can be, but is not limited to, one year. In actual use scenarios, the number of times the pre-charge resistor can operate can be set. As the number of operations increases, beyond the set service life, the pre-charge resistor's performance may no longer meet the actual usage requirements.

[0073] Temperature distribution data includes temperature distribution data under operating conditions and temperature distribution data under storage conditions. Each temperature distribution data includes at least one temperature and its corresponding percentage, where the percentage can be understood as a time percentage—the proportion of each temperature's duration within the total duration of all temperatures. Temperature distribution data under storage conditions can be understood as the ambient temperature distribution data of the environment in which the pre-charge resistor is located. This data can be determined based on the ambient temperature within a preset period obtained from the battery system management system. It is understood that if the battery system management system does not have the ambient temperature within the preset period, the ambient temperature within the preset period can be obtained from a preset temperature database. Temperature distribution data under operating conditions can be understood as the temperature distribution data of the outer surface of the pre-charge resistor.

[0074] Step 204: Determine the measured resistance after the pre-charge resistor has been held at the target temperature for the target test duration.

[0075] The target test duration is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period. It is understood that the external stresses experienced by the pre-charge resistor within the preset period include electrical stress and temperature stress. The failure mechanisms influenced by electrical stress include two types: electromigration behavior caused by electrical stress and temperature-related failure mechanisms caused by heat generation after energization. Since the pre-charge resistor operates under very few conditions within the preset period, the failure impact of electromigration related to electrical stress is relatively small; the main failure mechanism is temperature-related. Accelerated temperature testing can verify the reliability of the pre-charge resistor within the preset period.

[0076] Specifically, the maximum temperature that the pre-charge resistor can withstand is determined as the target temperature, and the target test duration corresponding to the target temperature is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period.

[0077] Step 206: Determine the reliability of the pre-charge resistor within the preset period based on the measured resistance.

[0078] Specifically, the measured resistance is compared to an allowable resistance threshold range. If the measured resistance is within the threshold range, the reliability of the pre-charge resistor within the preset period meets the actual requirements. For example, in the case of a cold start of an electric vehicle, using the pre-charge resistor for pre-charging can reduce the inrush current upon power-up, thus protecting the motor controller, battery, and main relay. If the measured resistance is outside the threshold range, the reliability of the pre-charge resistor within the preset period does not meet the actual requirements. For example, in the case of a cold start of an electric vehicle, using the pre-charge resistor for pre-charging cannot reduce the inrush current upon power-up, thus failing to protect the motor controller, battery, and main relay.

[0079] The aforementioned method for detecting the reliability of a pre-charge resistor involves determining all temperature distribution data of the pre-charge resistor within a preset period, as well as the maximum operating temperature the pre-charge resistor can withstand. Based on the temperature distribution data, a target test duration for the pre-charge resistor is determined. The reliability of the pre-charge resistor is then determined by measuring its resistance after maintaining the target test duration at the maximum operating temperature. By testing the pre-charge resistor using temperature distribution data under all operating conditions within a preset period and determining the test duration, all actual temperature data within the preset period are considered. Compared to using only temperature data, this increases the amount of data analyzed and the analytical dimensions, thereby improving the accuracy of the test results.

[0080] To accurately analyze the reliability of the pre-charge resistor and its performance in the same application scenario, the actual number of times the pre-charge resistor is used within a preset period is obtained. After statistical analysis, the number of times the pre-charge resistor is used at each temperature can be obtained, and the temperature performance of the pre-charge resistor at each temperature can be evaluated. Furthermore, the temperature distribution of the pre-charge resistor at each temperature can be combined with the temperature distribution under storage conditions within the preset period to obtain the actual temperature distribution within the preset period, including both working and storage scenarios.

[0081] In one embodiment, such as Figure 3 As shown, a method for determining temperature distribution data for all operating conditions within a preset period is provided, and this method is applied to... Figure 1 Taking the terminal in the example, the explanation includes the following steps:

[0082] Step 302: Obtain the first temperature distribution data of the pre-charge resistor under storage conditions within a preset period.

[0083] The first temperature distribution data includes at least one first temperature and the percentage of each first temperature. Table 1 shows the first temperature distribution data, including temperature (°C) and the percentage of each temperature (%), including temperatures T1, T2…T… n And the corresponding percentage of quantity.

[0084] Table 1 First Temperature Distribution Data Table

[0085] <![CDATA[T1]]> <![CDATA[p1]]> <![CDATA[T2]]> <![CDATA[p2]]> <![CDATA[T3]]> <![CDATA[p3]]> ... ... <![CDATA[T n ]]> <![CDATA[p n ]]>

[0086] Step 304: Determine the current change data of the pre-charge resistor under operating conditions.

[0087] The current change data can be understood as being used to characterize the current change during the power-on process of the pre-charge resistor. This current change data can include first change data generated during the current rise phase and second change data generated during the current fall phase. The first change data can include a first duration from a first set current to a second set current during the current rise phase. The first change data can also include a second duration from the second set current to the first set current during the current fall phase.

[0088] The pre-charge resistor operates primarily by charging the external load capacitor after the pre-charge relay closes. When the pre-charge voltage reaches a set proportion of the total battery system voltage, such as 0.9 or 0.95, the pre-charge relay is disconnected, and the battery system begins to operate normally. Its operational process can be simplified as follows: Figure 4 As shown. This includes: the initial current I1 upon power-on, which can be understood as the first current, and can be 0; the second current I2 after pre-charging by the pre-charging resistor, which can be understood as the second current I2, and can be 1A; the first time t1 from the first set current to the second set current is the time it takes for pre-charging to reach the maximum current I2, which can be 0.1s. The second time t2 from the second set current to the first set current can be determined based on the resistance value of the pre-charging resistor, the load terminal capacitance, the total voltage of the battery system, the voltage at the load terminal before the high voltage is closed, and the load terminal voltage at the end of pre-charging.

[0089] The expression for calculating the second duration t2 can be expressed as:

[0090]

[0091] Where R is the pre-charge resistor; C is the load capacitance; u s The total voltage of the battery system is u0; u0 is the voltage before the high voltage is closed at the load terminal, u0 can be 0; u t This is the load terminal voltage at the end of the pre-charge.

[0092] Step 306: Determine the number of times the pre-charge resistor operates at each of the first temperatures based on the percentage values ​​of each first temperature and the total number of times the pre-charge resistor operates.

[0093] The total number of times the pre-charging resistor operates can be used to determine the number of times it operates at each temperature under the first temperature distribution data. If the warranty period / design life of the power battery system is n years and the daily operating frequency of the pre-charging resistor is m times, then the total number of times the pre-charging resistor operates within the warranty period / design life is N = n*m, which gives the number of times the pre-charging resistor operates at each temperature under the first temperature distribution data. It is understood that when determining the total number of times the pre-charging resistor operates, the 0.99 quantile or 0.95 quantile can be chosen, or other quantiles can also be selected. In this embodiment, choosing a larger quantile results in more reliable analysis results and covers more vehicles; for example, if there is no statistical data on the number of times a vehicle is powered on for a year, an assumption can be made about the number of times it is powered on each day, and the larger the assumed number, the more reliable the analysis results.

[0094] Table 2 shows the number of times the pre-charge resistor operates at each temperature under the first temperature distribution data.

[0095] Table 2. Number of Operations of the Precharged Resistor

[0096]

[0097]

[0098] Step 308: Based on each first temperature and the number of times the pre-charge resistor operates at each first temperature, control the pre-charge resistor to operate according to the current change data, and obtain the second temperature distribution data of the pre-charge resistor under the working condition in the preset period.

[0099] It is understandable that the temperature rise of the pre-charge resistor after being powered on varies at different temperatures. Therefore, it is necessary to collect data on the temperature performance of the pre-charge resistor after being powered on at each temperature in order to obtain the actual temperature distribution of its working state.

[0100] Specifically, when determining each first temperature and the number of operations corresponding to each first temperature, the pre-charge resistor is placed at each first temperature, and the pre-charge resistor is controlled to be powered on according to the current change data at each first temperature, so that the number of power-on is the number of operations corresponding to each first temperature. This allows the actual temperature distribution of the pre-charge resistor under the working conditions to obtain the second temperature distribution data.

[0101] Further, in one embodiment, by powering on the pre-charge resistor under operating conditions for a preset period based on the number of operations at each first temperature while the pre-charge resistor is at each first temperature, according to first change data and second change data, a second temperature distribution data is obtained; wherein, the second temperature distribution data includes at least one second temperature and a percentage value of at least one second temperature. The determination of the second temperature distribution data is as follows: Figure 5 As shown, it includes the following steps:

[0102] Step 502: When the ambient temperature of the pre-charge resistor reaches each of the first temperatures, power on according to the number of times it has been operated at each of the first temperatures, based on the first change data and the second change data.

[0103] Specifically, when continuously powering on the pre-charge resistor, the time interval between two consecutive power-ups can be set according to actual usage conditions. For example... Figure 6 The diagram shown is a schematic current profile of a pre-charge resistor being continuously energized in one embodiment.

[0104] Specifically, when the pre-charge resistor is powered on, the ambient temperature of the current environment in which the pre-charge resistor is located is acquired, and the ambient temperature is controlled to rise to each first temperature according to a preset temperature change rate. To ensure temperature stability when the pre-charge resistor is powered on, it is maintained at each first temperature for a preset duration. The preset temperature change rate can be, but is not limited to, 3℃ / min; the preset duration can be set according to actual needs, and the preset duration can be 15min. At each first temperature, power is applied according to the first change data and the second change data based on the number of times the resistor operates at each first temperature.

[0105] Step 504: When the number of times the pre-charge resistor is powered on is equal to the number of times it operates at each of the first temperatures, power-on is paused, and each of the first temperatures is controlled to change according to the rate of temperature change until the first temperature is the set temperature, thereby obtaining the second temperature distribution data of the pre-charge resistor under the working condition of the preset cycle.

[0106] Specifically, when the number of times the pre-charge resistor is powered on equals the number of times it operates at each of the first temperatures, the power-on process is paused. To prevent abnormal temperature changes in the pre-charge resistor, after the power-on is paused, the resistor continues to operate at each of the first temperatures for a preset duration, and the first temperatures are controlled to change according to the rate of temperature change until the first temperature reaches the set temperature. This yields the second temperature distribution data of the pre-charge resistor under operating conditions within a preset period. The rate of temperature change can be, but is not limited to, 3℃ / min. The preset duration can be set according to actual needs; for example, it can be 15 minutes. The operating temperature distribution at each of the first temperatures is determined by obtaining the temperature distribution corresponding to the number of times the pre-charge resistor operates at each of the first temperatures, based on the collected temperatures. This yields the second temperature distribution data of the pre-charge resistor under operating conditions within a preset period.

[0107] like Figure 7 The diagram shown illustrates the power-on of the pre-charge resistor in one embodiment. Based on the determined temperature, temperature percentage, and the number of times the pre-charge resistor operates, the process is as follows: Figure 7The schematic diagram shows the power-on process, which follows a cycle of heating-heating-powering-heating-cooling to obtain the temperature distribution of the pre-charge resistor under actual working conditions.

[0108] In the above embodiments, based on the determined first temperature distribution data, and based on each first temperature in the first temperature distribution data and the number of times the circuit is operated at each first temperature, power is applied according to the first change data and the second change data to accurately determine the temperature distribution of the pre-charge resistor under actual operating conditions.

[0109] Step 310: Determine the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period based on the first temperature distribution data and the second temperature distribution data.

[0110] Specifically, the first temperature distribution data and the second temperature distribution data are merged to obtain the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period. The merging method of the first and second temperature distribution data can be achieved using existing merging methods, which will not be elaborated here. Table 3 shows the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period in one embodiment.

[0111] Table 3 Temperature Distribution Data

[0112]

[0113]

[0114] In the above embodiments, the second temperature distribution data under the working condition is determined based on the first temperature distribution data under the storage condition, and the entire temperature distribution data of the whole life cycle is obtained based on the first temperature distribution data and the second temperature distribution data, that is, the actual temperature distribution of the preset period including the working and storage scenarios is obtained, which increases the amount of data and analysis dimensions for detecting the reliability of the pre-charge resistor.

[0115] In one embodiment, such as Figure 8 As shown, a method for determining the target temperature of the pre-charge resistor is provided, which can be applied to... Figure 1 Taking the terminal in the example, the explanation includes the following steps:

[0116] Step 802: Based on the accuracy and temperature drift of the pre-charge resistor, determine the first resistance threshold and the second resistance threshold of the pre-charge resistor; the first resistance threshold is less than the second resistance threshold.

[0117] Among these, accuracy and temperature drift can be understood as being known. The first resistance threshold R... L It can be represented as:

[0118] R L=R0(1-J)(1-RTC×(T-T0)×10 -6 )

[0119] Second resistance threshold R U It can be represented as: R U =R0(1+J)(1+RTC×(T-T0)×10 -6 ).

[0120] Among them, R L This is the lower limit of the allowable resistance value threshold for the pre-charge resistor, i.e., the first resistance value threshold; R U R0 is the upper limit of the allowable resistance threshold for the pre-charge resistor, i.e., the second resistance threshold; J is the nominal resistance value of the pre-charge resistor; T is the resistance accuracy of the pre-charge resistor, expressed as a percentage; T is the test temperature; T0 is the room temperature. RTC is the temperature drift coefficient.

[0121] Step 804: Measure the resistance value of the pre-charge resistor at each temperature point under the condition that the temperature increases at a preset temperature with a corresponding preset temperature change rate.

[0122] The preset temperature change rate can be set according to actual needs, and can be 3℃ / min. The preset temperature can be the ambient temperature of the environment where the pre-charge resistor is located.

[0123] Step 806: Determine the target temperature of the pre-charge resistor based on the first resistance threshold, the second resistance threshold, and the resistance values ​​at each temperature point.

[0124] Specifically, the pre-charge resistor is controlled by a preset temperature change rate step, corresponding to the ambient temperature, to obtain the resistance value corresponding to each temperature gradient. The resistance value for each temperature gradient is then evaluated. If the measured resistance value is within the resistance threshold range of the pre-charge resistor, the preset temperature change rate step continues. If the measured resistance value is outside the resistance threshold range, the process terminates. The maximum operating temperature that the pre-charge resistor can withstand is determined from the measured resistance values. The resistance threshold range is determined based on a first resistance threshold and a second resistance threshold. In one embodiment, such as... Figure 9 The diagram illustrates the determination of the resistance value of the pre-charge resistor at each temperature gradient in one embodiment. When the ambient temperature of the pre-charge resistor is increased from room temperature (preferably at a rate of 3°C / min), starting from the initial temperature of 40°C, a temperature increment is performed. The increment interval is 10°C within the range of 40°C to 120°C, and 5°C above 130°C. At each temperature step (including 40°C), the temperature is held for a period of 15 minutes, preferably 15 minutes. The resistance value of the pre-charge resistor is measured at room temperature and recorded as R0. The resistance value of the pre-charge resistor at each temperature step is measured and recorded as R. T Determine RT Check if the resistance value is within the allowable range. If it is not within the allowable range, terminate the test. If it is within the allowable range, continue the gradient test.

[0125] Furthermore, to ensure the reliability and accuracy of the target temperature when determining the maximum operating temperature that the pre-charge resistor can withstand, multiple maximum operating temperatures of the pre-charge resistor are obtained, and the target temperature of the pre-charge resistor is determined based on these multiple maximum operating temperatures. In one embodiment, candidate temperatures of the pre-charge resistor are determined based on a first resistance threshold, a second resistance threshold, and the resistance values ​​at each temperature point; the target temperature of the pre-charge resistor is determined based on the temperature mean and standard deviation of the candidate temperatures. Here, the candidate temperature can be understood as the maximum operating temperature T that the pre-charge resistor can withstand. max The target temperature T for the pre-charge resistor is determined based on the mean and standard deviation of the candidate temperatures. max,final It can be represented as:

[0126]

[0127] Where μ represents multiple operating temperature limits T max The mean value; σ represents multiple operating temperature limits T. max Standard deviation; T max,final The final determined actual pre-charge resistance operating limit value, i.e., the target temperature.

[0128] In the above embodiments, by measuring the resistance value of the pre-charge resistor at each temperature point under the condition of a preset temperature increase step at a corresponding preset temperature change rate, and based on the accuracy and temperature drift of the pre-charge resistor, the first resistance threshold and the second resistance threshold of the pre-charge resistor and the resistance value at each temperature point are determined, and the target temperature of the pre-charge resistor is determined. Taking into account the accuracy and temperature drift of the pre-charge resistor, the upper and lower limits of the allowable resistance threshold of the pre-charge resistor are determined to determine the target temperature of the pre-charge resistor, thus ensuring the reliability of the target temperature.

[0129] In another embodiment, such as Figure 10 As shown, a method for detecting the reliability of a pre-charge resistor is provided, and this method is applied to... Figure 1 Taking the terminal in the example, the explanation includes the following steps:

[0130] Step 1002: Obtain the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period and the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand.

[0131] The temperature distribution data includes the third temperature under all operating conditions and the percentage of each third temperature.

[0132] Step 1004: Determine the test temperature of the pre-charge resistor.

[0133] The test temperature can be determined based on the target temperature. For example, the test temperature can be determined based on the difference between the target temperature and a set parameter value. The set parameter value can be understood as a margin θ, where θ can be, but is not limited to, 100℃. The test temperature T... test It can be represented as:

[0134] T test =T max,final -θ

[0135] Step 1006: Determine the acceleration factor for shortening the test time of the pre-charge resistor based on the test temperature, each third temperature, and the percentage of each third temperature.

[0136] Wherein, the acceleration coefficient A T,i It can be represented as:

[0137]

[0138] In the formula: E A To activate energy, E A =0.45ev; k is the Boltzmann constant (k = 8.617 × 10⁻⁶). -5 eV / K); T test The test temperature is typically T. max ;T i The actual operating temperature is selected based on temperature distribution data, where i = 1, 2, 3, ..., m. In this embodiment, T i The actual operating temperature can be the test temperature used.

[0139] Step 1008: Determine the target test duration of the pre-charge resistor based on the acceleration coefficient and the usage duration parameters of the pre-charge resistor.

[0140] Specifically, the ratio of the proportion of the third temperature corresponding to the test temperature to the ratio of the acceleration coefficient is summed to obtain a summation value. Based on the summation value and the usage time parameter of the pre-charge resistor, the target test time of the pre-charge resistor is determined. Wherein, the target test time t... test It can be represented as:

[0141]

[0142] n Power battery system warranty period / design life (in years).

[0143] Step 1010: Determine the measured resistance after the pre-charge resistor has been held at the target temperature for the target test duration.

[0144] Step 1012: Determine the reliability of the pre-charge resistor within a preset period based on the measured resistance.

[0145] In the above embodiments, by determining all temperature distribution data of the pre-charge resistor within a preset period and the maximum temperature that the pre-charge resistor can withstand, the target test duration of the pre-charge resistor is determined based on the temperature distribution data. The reliability of the pre-charge resistor is then determined by measuring its resistance after maintaining the target test duration at the maximum operating temperature. By testing the pre-charge resistor based on temperature distribution data under all operating conditions within the preset period and determining the test duration, the actual number of uses and temperature distribution under long-term storage conditions within the preset period are considered. This means that the combined effect of electrical and temperature stress on the reliability of the pre-charge resistor is taken into account. Compared to relying solely on temperature data, this increases the amount of data analyzed and the analytical dimensions, thereby improving the accuracy of the test results.

[0146] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0147] Based on the same inventive concept, this application also provides an apparatus for detecting the reliability of a pre-charge resistor, which implements the method for detecting the reliability of a pre-charge resistor as described above. The solution provided by this apparatus is similar to the implementation described in the above method. Therefore, the specific limitations of one or more apparatus embodiments for detecting the reliability of a pre-charge resistor provided below can be found in the limitations of the method for detecting the reliability of a pre-charge resistor described above, and will not be repeated here.

[0148] In one embodiment, such as Figure 11 As shown, an apparatus for detecting the reliability of a pre-charge resistor is provided. The apparatus includes a data acquisition module 1102, a data determination module 1104, and a detection module 1106, wherein:

[0149] The data acquisition module 1102 is used to acquire the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period and the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand.

[0150] The data determination module 1104 is used to determine the measured resistance of the pre-charge resistor after maintaining the target test duration at the target temperature; the target test duration is determined based on temperature distribution data.

[0151] The detection module 1106 is used to determine the reliability of the pre-charge resistor within a preset period based on the measured resistance.

[0152] In the above embodiments, the system for detecting the reliability of a pre-charge resistor can determine all temperature distribution data of the pre-charge resistor within a preset period and the maximum operating temperature that the pre-charge resistor can withstand using a simple system. Based on the temperature distribution data, the target test duration for the pre-charge resistor is determined. The reliability of the pre-charge resistor is then determined by measuring its resistance after maintaining the target test duration at the maximum operating temperature. By detecting the pre-charge resistor based on temperature distribution data under all operating conditions within the preset period and determining the test duration, all actual temperature data within the preset period are considered. Compared to using only temperature data, this increases the amount of data analyzed and the analytical dimensions, thereby improving the accuracy of the detection results.

[0153] In another embodiment, an apparatus for detecting the reliability of a pre-charge resistor is provided. In addition to a data acquisition module 1102, a data determination module 1104, and a detection module 1106, the apparatus further includes a data merging module, a pre-charge module, and a resistance measurement module, wherein:

[0154] The data acquisition module 1102 is also used to acquire first temperature distribution data of the pre-charge resistor under storage conditions within a preset period; the first temperature distribution data includes at least one first temperature and a first quantity percentage value of each first temperature.

[0155] The data determination module 1104 is also used to determine the current change data of the pre-charge resistor under operating conditions;

[0156] The number of times the pre-charge resistor operates at each of the first temperatures is determined based on the percentage of each first temperature and the total number of times the pre-charge resistor operates.

[0157] Based on each first temperature and the number of times it operates at each first temperature, the pre-charge resistor is controlled to operate according to the current change data, thereby obtaining the second temperature distribution data of the pre-charge resistor under the operating condition in the preset period.

[0158] The data merging module is used to determine the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period based on the first temperature distribution data and the second temperature distribution data.

[0159] The data acquisition module 1102 is also used to, when the pre-charge resistor is at each first temperature, based on the number of times it operates at each first temperature, power on according to the first change data and the second change data, and obtain the second temperature distribution data of the pre-charge resistor under the working condition of the preset period.

[0160] The second temperature distribution data includes at least one second temperature and the percentage of at least one second temperature.

[0161] The pre-charge module is used to power on the device sequentially according to the number of times it operates at each of the first temperatures, based on the first change data and the second change data, when the ambient temperature of the pre-charge resistor reaches each of the first temperatures.

[0162] The data determination module 1104 is also used to pause power-on when the number of times the pre-charge resistor is powered on is the number of times it operates at each first temperature, and control each first temperature to change according to the temperature change rate until the first temperature is the set temperature, so as to obtain the second temperature distribution data of the pre-charge resistor under the working condition in the preset period.

[0163] The data determination module 1104 is also used to determine a first resistance threshold and a second resistance threshold of the pre-charge resistor based on the accuracy and temperature drift of the pre-charge resistor; the first resistance threshold is less than the second resistance threshold.

[0164] The resistance measurement module is used to measure the resistance value of the pre-charge resistor at various temperature points when the temperature increases at a preset temperature with a corresponding preset temperature change rate.

[0165] The data determination module 1104 is also used to determine the target temperature of the pre-charge resistance based on the first resistance threshold, the second resistance threshold and the resistance value at each temperature point.

[0166] The data determination module 1104 is also used to determine the candidate temperature of the pre-charge resistor based on the first resistance threshold, the second resistance threshold and the resistance value at each temperature point;

[0167] The target temperature for the pre-charge resistor is determined based on the mean temperature and standard deviation of the candidate temperatures.

[0168] The data determination module 1104 is also used to determine the test temperature of the pre-charge resistor; determine the acceleration coefficient for shortening the test time of the pre-charge resistor based on the test temperature, each third temperature and the percentage of each third temperature; and determine the target test time of the pre-charge resistor based on the acceleration coefficient and the usage time parameter of the pre-charge resistor.

[0169] Based on the same inventive concept, this application also provides a system for detecting the reliability of a pre-charge resistor, which implements the method for detecting the reliability of the pre-charge resistor described above. The solution provided by this system is similar to the solution described in the above method. Therefore, the specific limitations in one or more system embodiments for detecting the reliability of a pre-charge resistor provided below can be found in the limitations of the method for detecting the reliability of the pre-charge resistor described above, and will not be repeated here.

[0170] In one embodiment, such as Figure 12 As shown, a system for detecting the reliability of a pre-charge resistor is provided. The system includes a temperature-controlled device, a pre-charge resistor disposed within the temperature-controlled device, and a terminal connected to the temperature-controlled device. The temperature-controlled device applies a temperature load to the pre-charge resistor to simulate different operating conditions of the pre-charge resistor at different temperatures. The terminal provides power to the pre-charge resistor and can also simulate the power-on and power-off conditions of the pre-charge resistor in a vehicle. The terminal can be a programmable power supply that can control the current rise, current fall, current rise time, current fall time, and number of power-on loads of the pre-charge resistor. The terminal includes a memory and a processor. The memory stores a computer program. The system is characterized in that the processor, when executing the computer program, implements the aforementioned method for detecting the reliability of the pre-charge resistor.

[0171] Each module in the aforementioned system for detecting the reliability of pre-charge resistors can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in hardware within or independently of the processor in a computer device, or stored in software within the memory of the computer device, so that the processor can call and execute the corresponding operations of each module.

[0172] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 13As shown. The computer device includes a processor, memory, communication interface, display screen, and input system connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a method for detecting the reliability of a pre-charge resistor. The display screen can be an LCD screen or an e-ink display. The input system can be a touch layer covering the display screen, buttons, a trackball, or a touchpad on the computer device casing, or an external keyboard, touchpad, or mouse.

[0173] Those skilled in the art will understand that Figure 13 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0174] In one embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above method embodiments.

[0175] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above method embodiments.

[0176] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0177] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties.

[0178] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0179] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0180] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for detecting the reliability of a pre-charge resistor, characterized in that, The method includes: Obtain the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation. The measured resistance of the pre-charge resistor after maintaining a target test duration at the target temperature is determined; the target test duration is determined based on the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period; the reliability of the pre-charge resistor within the preset period is determined based on the measured resistance. The method for determining the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period includes: Acquire first temperature distribution data of the pre-charge resistor under storage conditions within a preset period; the first temperature distribution data includes at least one first temperature and a first quantity percentage value of each first temperature. Determine the current variation data of the pre-charge resistor under operating conditions; The number of times the pre-charge resistor operates at each of the first temperatures is determined based on the percentage values ​​of each of the first temperatures and the total number of times the pre-charge resistor operates. Based on each of the first temperatures and the number of times the operation is performed at each of the first temperatures, the pre-charge resistor is controlled to operate according to the current change data to obtain the second temperature distribution data of the pre-charge resistor under the working condition in the preset period. Based on the first temperature distribution data and the second temperature distribution data, the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period are determined.

2. The method according to claim 1, characterized in that, The current change data includes first change data generated during the current rise phase and second change data generated during the current fall phase of the pre-charge resistor during power-on. The step of controlling the pre-charge resistor to operate according to the current change data based on each of the first temperatures and the number of operations at each of the first temperatures, to obtain second temperature distribution data of the pre-charge resistor under the operating conditions of the preset period, includes: When the pre-charge resistor is at each of the first temperatures, based on the number of times it operates at each of the first temperatures, power is applied according to the first change data and the second change data to obtain the second temperature distribution data of the pre-charge resistor under the working condition of the preset cycle. The second temperature distribution data includes at least one second temperature and the percentage of the at least one second temperature.

3. The method according to claim 2, characterized in that, When the pre-charge resistor is at each of the first temperatures, based on the number of operations at each of the first temperatures, power is applied according to the first change data and the second change data to obtain second temperature distribution data of the pre-charge resistor under the operating conditions of the preset period, including: When the ambient temperature of the pre-charge resistor reaches each of the first temperatures, power is applied sequentially according to the number of operations at each of the first temperatures, based on the first change data and the second change data. When the number of times the pre-charge resistor is powered on is equal to the number of times it operates at each of the first temperatures, the power-on is paused, and each of the first temperatures is controlled to change according to the rate of temperature change until the first temperature is the set temperature, thereby obtaining the second temperature distribution data of the pre-charge resistor under the operating condition in the preset period.

4. The method according to claim 1, characterized in that, Obtaining the target temperature of the pre-charge resistor includes: Based on the accuracy and temperature drift of the pre-charge resistor, a first resistance threshold and a second resistance threshold are determined for the pre-charge resistor; the first resistance threshold is less than the second resistance threshold. The resistance value of the pre-charge resistor is measured at each temperature point when the temperature increases at a preset temperature with a corresponding preset temperature change rate. The target temperature of the pre-charge resistor is determined based on the first resistance threshold, the second resistance threshold, and the resistance values ​​at each temperature point.

5. The method according to claim 4, characterized in that, Determining the target temperature of the pre-charge resistor based on the first resistance threshold, the second resistance threshold, and the resistance values ​​at each temperature point includes: Based on the first resistance threshold, the second resistance threshold, and the resistance values ​​at each temperature point, the candidate temperature for the pre-charge resistance is determined. The target temperature of the pre-charge resistor is determined based on the mean temperature and the standard deviation of the candidate temperatures.

6. The method according to claim 1, characterized in that, The temperature distribution data includes a third temperature under all operating conditions and the percentage of each of the third temperatures. The target test duration is determined based on the temperature distribution data and includes: Determine the test temperature of the pre-charge resistor; The acceleration factor for shortening the test time of the pre-charge resistor is determined based on the test temperature, each of the third temperatures, and the percentage of each of the third temperatures. The target test duration of the pre-charge resistor is determined based on the acceleration coefficient and the usage duration parameter of the pre-charge resistor.

7. A device for detecting the reliability of a pre-charge resistor, characterized in that, The device includes: The data acquisition module is used to acquire the target temperature of the pre-charge resistor; the target temperature is the maximum temperature that the pre-charge resistor can withstand during operation. The data determination module is used to determine the measured resistance of the pre-charged resistor after maintaining the target test duration at the target temperature; the target test duration is determined based on the temperature distribution data of the pre-charged resistor under all operating conditions within a preset period. The detection module is used to determine the reliability of the pre-charge resistor within the preset period based on the measured resistor; The method for determining the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period includes: Acquire first temperature distribution data of the pre-charge resistor under storage conditions within a preset period; the first temperature distribution data includes at least one first temperature and a first quantity percentage value of each first temperature. Determine the current variation data of the pre-charge resistor under operating conditions; The number of times the pre-charge resistor operates at each of the first temperatures is determined based on the percentage values ​​of each of the first temperatures and the total number of times the pre-charge resistor operates. Based on each of the first temperatures and the number of times the operation is performed at each of the first temperatures, the pre-charge resistor is controlled to operate according to the current change data to obtain the second temperature distribution data of the pre-charge resistor under the working condition in the preset period. Based on the first temperature distribution data and the second temperature distribution data, the temperature distribution data of the pre-charge resistor under all operating conditions within a preset period are determined.

8. A system for detecting the reliability of a pre-charge resistor, characterized in that, The system includes a temperature control device, a pre-charge resistor disposed in the temperature control device, and a terminal connected to the temperature control device. The temperature control device is used to apply a temperature load to the pre-charge resistor to simulate different operating conditions of the pre-charge resistor at different temperatures. The terminal includes a memory and a processor. The memory stores a computer program. The system is characterized in that the processor executes the computer program to implement the steps of the method according to any one of claims 1 to 6.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

11. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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