A method, device and storage medium for determining an equivalent capacitance
By determining the charge amount based on the output junction capacitance-voltage curve in the case of MOSFET output junction capacitance, and fitting the charge-voltage curve, the problem of low efficiency in determining the equivalent capacitance in the prior art is solved, and the equivalent capacitance is determined quickly and accurately, supporting the design and selection of MOSFETs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- GUANGZHOU SHIYUAN ELECTRONICS CO LTD
- Filing Date
- 2021-09-08
- Publication Date
- 2026-06-23
AI Technical Summary
The existing technology for determining the equivalent capacitance of the output junction capacitance of a MOSFET is inefficient, cannot accurately predict it in one go, and requires retesting for new voltage requirements, resulting in low testing efficiency.
By determining the output junction capacitance value corresponding to each equal voltage value based on the output junction capacitance-voltage curve, calculating the charge corresponding to each equal voltage value, and fitting the charge-voltage curve, a fitting formula is obtained, thereby quickly determining the equivalent capacitance under the target voltage.
It enables the rapid and accurate determination of the equivalent capacitance of the output junction capacitance as it rises from 0V to the target voltage, improving the efficiency of determining the equivalent capacitance and providing a reference for the design and selection of MOSFETs.
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Figure CN115774977B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] Embodiments of the present application relate to the field of field effect tubes, and particularly relate to a method and device for determining equivalent capacitance, and a storage medium. BACKGROUND
[0002] Due to the working characteristics of the PN junction of a Metal Oxide Semiconductor (MOS) tube, the MOS tube will generate equivalent capacitances on each pole, such as input capacitance Ciss, reverse conduction capacitance Crss, and output junction capacitance Coss. The performance of Coss will greatly affect the loss and switching time of the MOS tube. However, the output junction capacitance does not actually exist, but is an equivalent junction capacitance based on the working characteristics of the PN junction of the MOS tube, which will change with voltage changes. Figure 1 For a traditional half-bridge LLC schematic, when designing a half-bridge LLC circuit, the influence of Coss1 and Coss2 capacitances needs to be considered. Because in the dead time, Coss1 and Coss2 capacitances will be charged and discharged back and forth, but since the capacitance value of Coss will change with voltage changes, this results in a non-linear time for Coss capacitance to discharge from a certain voltage Vp to 0 or to rise from 0 to a certain voltage Vp. For an LLC circuit, it is very important to reasonably control the dead time, and the dead time needs to be matched with the charging and discharging time of the Coss capacitance.
[0003] The traditional method for obtaining the charging and discharging time of Coss is to inject a constant current I into the Coss capacitance of the MOS tube, and monitor the voltage of the MOS tube Coss capacitance in the process of continuous charging. When the voltage of the MOS tube is monitored to be the required voltage (Vx), the time t1 at this time is recorded. A variable capacitor is set, and a constant current I is also used to charge it, so that its voltage continuously rises. When the capacitor rises to Vx, the time t2 is recorded. If t1≠t2, the solute of the set capacitor is changed, and the test is continued. When t1=t2, the set capacitor is considered to be the equivalent capacitance when the original Coss capacitance rises to Vx. However, this requires continuous testing to obtain the equivalent capacitance at this voltage, and the size of the capacitor cannot be accurately estimated at one time. Moreover, for new voltage requirements, retesting is also needed, which is low in testing efficiency. SUMMARY
[0004] The present application provides a method and device for determining equivalent capacitance, which can quickly determine the equivalent capacitance of the output junction capacitance when it rises from 0V voltage to a target voltage, thereby improving the efficiency of determining equivalent capacitance.
[0005] In a first aspect, embodiments of the present application provide a method for determining equivalent capacitance, applied to the output junction capacitance of a field effect tube, which comprises:
[0006] determine an output junction capacitance value corresponding to each of the divided voltage values according to the output junction capacitance-voltage curve;
[0007] determine a charge amount corresponding to each of the divided voltage values according to each of the divided voltage values and the corresponding output junction capacitance value;
[0008] determine a charge amount-voltage fitting curve according to each of the divided voltage values and the charge amount;
[0009] determine a fitting formula of the charge amount according to the fitting curve;
[0010] determine an equivalent capacitance of the output junction capacitance at a target voltage according to the fitting formula.
[0011] In a second aspect, the embodiments of the present application further provide a determination device of an equivalent capacitance, which is applied to a scenario of an output junction capacitance of a field effect transistor, and the device comprises:
[0012] a first determination module, configured to determine an output junction capacitance value corresponding to each of the divided voltage values according to the output junction capacitance-voltage curve;
[0013] The first determination module is further configured to determine a charge amount corresponding to each of the divided voltage values according to each of the divided voltage values and the corresponding output junction capacitance value;
[0014] a second determination module, configured to determine a charge amount-voltage fitting curve according to each of the divided voltage values and the charge amount;
[0015] The second determination module is configured to determine a fitting formula of the charge amount according to the fitting curve.
[0016] The second determination module is configured to determine an equivalent capacitance of the output junction capacitance at a target voltage according to the fitting formula.
[0017] In a third aspect, the embodiments of the present application further provide a computer device, which comprises a memory and a processor, and when the memory stores a computer program and the processor executes the computer program, a determination method of an equivalent capacitance is realized.
[0018] In a fourth aspect, the embodiments of the present application further provide a computer readable storage medium, which stores a computer program, and when the computer program is executed by a processor, a determination method of an equivalent capacitance is realized.
[0019] This application provides a method, apparatus, device, and storage medium for determining the equivalent capacitance. The method is applied to the output junction capacitance scenario of a field-effect transistor (FET), and includes: determining the output junction capacitance value corresponding to each equal voltage segment based on the output junction capacitance-voltage curve; determining the charge amount corresponding to each equal voltage segment based on each equal voltage segment and its corresponding output junction capacitance value; determining a charge-voltage fitting curve based on each equal voltage segment and its charge amount; determining a fitting formula for the charge amount based on the fitting curve; and determining the equivalent capacitance of the output junction capacitance at a target voltage based on the fitting formula. This method allows for the rapid determination of the equivalent capacitance of the output junction capacitance as it rises from 0V to the target voltage, thereby improving the efficiency of determining the equivalent capacitance. Attached Figure Description
[0020] Figure 1 This is a schematic diagram of a traditional half-bridge LLC in existing technology;
[0021] Figure 2 This is a flowchart of a method for determining equivalent capacitance provided in an embodiment of this application;
[0022] Figure 3 This is a data curve showing the output junction capacitance as a function of voltage, provided in an embodiment of this application.
[0023] Figure 4 This is a charge-voltage fitting curve diagram from an embodiment of this application;
[0024] Figure 5 This is a fitted curve of the energy versus voltage value on the output junction capacitor in an embodiment of this application;
[0025] Figure 6 This is a schematic diagram of the structure of the device for determining the equivalent capacitance in the embodiments of this application;
[0026] Figure 7 This is a schematic diagram of the structure of the computer device provided in the embodiments of this application. Detailed Implementation
[0027] The present application will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the application and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present application, not the entire structure.
[0028] Furthermore, in the embodiments of this application, terms such as "optionally" or "exemplarily" are used to indicate examples, illustrations, or explanations. Any embodiment or design described as "optionally" or "exemplarily" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design solutions. Specifically, the use of terms such as "optionally" or "exemplarily" is intended to present the relevant concepts in a specific manner.
[0029] Figure 2 This document presents a flowchart of a method for determining the equivalent capacitance according to an embodiment of this application. This method can be applied to the output junction capacitance scenario of a field-effect transistor (FET). By dividing the voltage equally, the changing trend of the output junction capacitance under all voltage conditions is fitted, thereby quickly and conveniently determining the equivalent capacitance of the output junction capacitance. This method can be executed by a device integrated into a computer device (e.g., a computer, server, etc.). This device can be implemented in software and / or hardware. The following description uses the example of this device integrated into a computer device to illustrate the implementation process of the method. Figure 2 As shown, the method may include, but is not limited to, the following steps:
[0030] S201. Determine the output junction capacitance value corresponding to each equal voltage value based on the output junction capacitance-voltage curve.
[0031] Since the output junction capacitance of a MOSFET is a variable that changes with voltage, a curve showing the output junction capacitance as a function of voltage can be obtained through testing. Figure 3 As shown. In this embodiment of the application, the voltage can be divided into equal parts to obtain the voltage value of each division point. For example, the voltage values of each division can be 0.1V, 0.2V, 0.3V, etc. After division, the voltage values of each division can be 0.1V, 0.2V, 0.3V, etc. Combined with the obtained output junction capacitance-voltage curve, the output junction capacitance value corresponding to each voltage value can be determined.
[0032] S202. Determine the charge amount corresponding to each equal voltage value based on each equal voltage value and the corresponding output junction capacitance value.
[0033] Since there are multiple voltage values after equal division in this embodiment, it is necessary to determine the charge corresponding to each equal voltage value. For example, the charge corresponding to each equal voltage value can be determined in the following way:
[0034] Step 1: Determine the voltage change between the current equal-division voltage value and the previous equal-division voltage value.
[0035] Assuming the current equal-division voltage value is V(n+1), and the previous equal-division voltage value is V(n), then the voltage change between the current equal-division voltage value and the previous equal-division voltage value can be expressed as:
[0036] ΔV(n)=V(n+1)-V(n) (1)
[0037] Step 2: Determine the charge change between the current and previous equal-division voltage values based on the voltage change, the output junction capacitance corresponding to the current equal-division voltage value, and the output junction capacitance corresponding to the previous equal-division voltage value.
[0038] For example, assuming the output junction capacitance corresponding to the current equal-division voltage value is C(n+1) and the output junction capacitance corresponding to the previous equal-division voltage value is C(n), then the charge change between the current equal-division voltage value V(n+1) and the previous equal-division voltage value V(n) can be determined based on the voltage change ΔV(n), as well as C(n+1) and C(n).
[0039] For example, determine the average capacitance between the output junction capacitance corresponding to the current equal-division voltage value and the output junction capacitance corresponding to the previous equal-division voltage value, and determine the charge change between the current equal-division voltage value and the previous equal-division voltage value by multiplying the average capacitance by the voltage change. Assume the charge change is ΔQ(n), i.e.
[0040]
[0041] Step 3: Determine the charge corresponding to the current equal voltage value based on the change in charge and the charge corresponding to the previous equal voltage value.
[0042] Assuming the charge corresponding to the previous equal voltage value is Q(n), and the charge corresponding to the current equal voltage value is Q(n+1), then...
[0043] Q(n+1)=Q(n)+ΔQ(n) (3)
[0044] In this embodiment, the initial value of Q(n) is 0, i.e., Q(0) = 0. The next equal-division voltage value of the current equal-division voltage value is determined as the current equal-division voltage value, and steps one to three above are repeated until the charge corresponding to each equal-division voltage value is determined.
[0045] S203. Determine the charge-voltage fitting curve based on each equal voltage value and charge amount.
[0046] By continuously superimposing each additional charge ΔQ(n) onto Q(n) using the method described in step S202 above, a charge-voltage fitting curve can be determined based on each equally divided voltage value and its corresponding charge, such as... Figure 4 As shown.
[0047] S204. Determine the fitting formula for the charge quantity based on the fitted curve.
[0048] By fitting the curve based on the fitting coefficients, we can obtain the function of charge on voltage, that is, the fitting formula for charge, such as... Figure 4 As shown, there is an inflection point in the fitted curve. Let the inflection point be V_cut. The curve corresponding to V≤V_cut is the first curve, and the curve corresponding to V>V_cut is the second curve. Then, by fitting these two curves based on the fitting coefficients, we can obtain the corresponding fitting formula for the charge.
[0049] Since the voltage used in practical applications is greater than V_cut, the formula for fitting the charge quantity can be determined as follows:
[0050]
[0051] It should be noted that, Figure 4 Formula R in 2.0000E+00 =9.9900E-01 is the fitting coefficient corresponding to formula (4), which is also the fitting coefficient of the second curve.
[0052] Accordingly, Figure 4 Formula R in 2.0000E+00 =9.9906E-01 and the adjacent formulas are the fitting coefficients and fitting formulas corresponding to the first curve, respectively.
[0053] S205. Determine the equivalent capacitance of the output junction capacitance under the target voltage according to the fitting formula.
[0054] After determining the curve expression formula for the amount of charge based on the above method, the required target voltage can be substituted into the formula to obtain the amount of charge corresponding to the target voltage. Then, the ratio of the amount of charge to the target voltage can be determined as the equivalent capacitance under the target voltage.
[0055] For example, assuming the target voltage is V x The equivalent capacitance is C x Therefore, the equivalent capacitance is obtained as follows:
[0056]
[0057] Based on the above method, the output junction capacitance can be quickly determined from 0V to V. x The equivalent capacitance at voltage is obtained, thereby improving the efficiency of determining the equivalent capacitance. Furthermore, based on the obtained charge-voltage fitting curve, the trend of charge and voltage variation can be predicted and analyzed. For different MOSFETs, the equivalent capacitance of their output junction capacitance can be determined, and the dead time of the corresponding MOSFET's output junction capacitance can be determined based on the charging and discharging time of the equivalent capacitance, thus providing a reference for the design and selection of MOSFETs.
[0058] Alternatively, embodiments of this application also provide another method for determining the charge quantity, namely, integrating the output junction capacitance, for example:
[0059]
[0060] After determining the charge amount corresponding to different voltages based on the above formula, the equivalent capacitance value corresponding to the output junction capacitance under the corresponding voltage can be obtained further based on formula (5).
[0061] Furthermore, for non-resonant topologies, when the MOSFET is switched on, the energy of the output junction capacitance flows into the MOSFET channel, resulting in losses. Therefore, embodiments of this application can further provide a method for determining the output junction capacitance loss. This method includes determining the energy generated on the output junction capacitance and then determining the losses generated on the output junction based on the switching frequency and the energy.
[0062] For example, one implementation involves calculating the energy generated on the output junction capacitance of the MOSFET in a continuous manner, for example,
[0063]
[0064] in,
[0065] I coss V(t) represents the current flowing through the output junction capacitor, V(t) represents the voltage across the output junction capacitor, and E... oss This refers to the energy generated on the output junction capacitance.
[0066] Therefore, the above formula (7) can be transformed into:
[0067]
[0068] Alternatively, in another example, the energy generated on the output junction capacitance can also be determined in a discrete manner. For example, based on Figure 4 The charge-voltage fitting curve shown divides the charge into equal parts, obtaining the charge and voltage value corresponding to each division point. Assume the increment of charge in each division is ΔQ. oss (n), then
[0069] ΔQ oss (n)=Q oss (n+1)-Q oss (n) (10)
[0070] Among them, Q oss (n+1) and Q oss (n) represents the charge amounts corresponding to two adjacent equally spaced points.
[0071] Accordingly, the increase in energy corresponding to two adjacent charges can be determined based on the increment of each charge and the two adjacent voltage values corresponding to that increment. Let the two adjacent charges be Q... oss (n+1) and Q oss (n), charge Q oss (n+1) and Q oss The two adjacent voltage values corresponding to (n) are V. ds (n+1) and V ds (n), these two voltage values are also the charge Q oss (n+1) and Q oss The increment ΔQ between (n) oss Let (n) be the two adjacent voltage values, and let the two adjacent charge quantities be Q. oss (n+1) and Q oss The corresponding increase in energy between (n) is ΔE oss (n), then
[0072]
[0073] Assume charge Q oss (n+1) and Q oss (n)(or voltage V) ds (n+1) and V ds The energies corresponding to (n) are E respectively. oss (n+1) and E oss (n), then
[0074] E oss (n+1)=ΔE oss (n)+E oss (n) (12)
[0075] Among them, E oss The initial value of (n) is 0, i.e., E oss (0) = 0.
[0076] By increasing the energy ΔE by each unit oss (n) continuously accumulates to E oss By applying (n), a fitting curve relating energy and voltage can be obtained, such as... Figure 5 As shown in the figure. In this curve graph, there is also an inflection point V. ds_ Cut the curve, using the inflection point as the dividing point, to obtain two parts of the curve: the third curve and the fourth curve. Then, fit these two curve parts to their respective fitting coefficients, resulting in two fitting functions, such as... Figure 5 The formula is shown in the figure.
[0077] In practical applications, the voltage used is usually greater than the voltage V at the inflection point. ds_cutTherefore, the fitting formula corresponding to the fourth curve is determined as the actual fitting formula for the relationship between energy and voltage, that is...
[0078] E oss (V ds >V ds_cut ) = 4.303·10 -6 ·V ds 2 +6.8222·10 -4 ·V ds +8.6009·10 -1 (13)
[0079] in, Figure 5 Formula R in 2.0000E+00 =9.9996E-01 is the fitting coefficient corresponding to formula (13), that is, the fitting coefficient of the fourth curve. Figure 5 Formula R in 2.0000E+00 =9.9954E-01 and the formula adjacent to it are the fitting coefficient and fitting formula corresponding to the third curve, respectively.
[0080] After determining the energy generated on the output junction capacitance using the two different methods described above, the total loss generated on the output junction capacitance can be determined using the following formula, for example:
[0081] P oss =E oss (V x )·f s (14)
[0082] Among them, P osss E is the total loss generated on the output junction capacitance. oss (V x The drain-source voltage of the MOSFET is V. x At that time, the energy generated on the output junction capacitance, f s This refers to the switching frequency.
[0083] For example, suppose V x 458V, f s If the frequency is 100kHz, then based on the above formula, the output junction capacitance loss can be determined to be 0.135W.
[0084] Based on the above scheme, when determining the equivalent capacitance of the MOSFET output junction capacitance, the losses generated on the output junction capacitance can be further determined.
[0085] Figure 6 This application provides an apparatus for determining the equivalent capacitance, which can be applied to scenarios involving the output junction capacitance of a field-effect transistor, such as... Figure 6As shown, the device includes: a first determining module 601 and a second determining module 602;
[0086] The first determining module is used to determine the output junction capacitance value corresponding to each equally divided voltage value based on the output junction capacitance-voltage curve.
[0087] The first determining module is also used to determine the amount of charge corresponding to each equal voltage value based on each equal voltage value and the corresponding output junction capacitance value;
[0088] The second determining module determines the charge-voltage fitting curve based on each equal voltage value and charge amount;
[0089] The second determining module is used to determine the fitting formula for the charge quantity based on the fitted curve.
[0090] The second determining module is used to determine the equivalent capacitance of the output junction capacitance under the target voltage based on the fitting formula.
[0091] In one example, the first determined module is specifically used to perform the following process:
[0092] Step 1: Determine the voltage change between the current equal-division voltage value and the previous equal-division voltage value;
[0093] Step 2: Determine the charge change between the current and previous equal-division voltage values based on the voltage change, the output junction capacitance corresponding to the current equal-division voltage value, and the output junction capacitance corresponding to the previous equal-division voltage value.
[0094] Step 3: Determine the charge corresponding to the current equal-division voltage value based on the charge change and the charge corresponding to the previous equal-division voltage value;
[0095] The next equal-division voltage value is determined as the current equal-division voltage value. Steps one through three are repeated until the charge corresponding to each equal-division voltage value is determined.
[0096] In one example, the first determining module is specifically used to determine the average capacitance between the output junction capacitance corresponding to the current equal-division voltage value and the output junction capacitance corresponding to the previous equal-division voltage value; and to determine the product between the average capacitance and the voltage change as the charge change between the current equal-division voltage value and the previous equal-division voltage value.
[0097] For example, the first determining module is used to determine the charge amount corresponding to the current voltage value by summing the charge change with the charge amount corresponding to the previous equal voltage value.
[0098] In one example, the second determining module is used to fit the fitted curve based on the fitting coefficients to obtain a fitting formula for the charge quantity.
[0099] Furthermore, the second determining module is also used to determine the amount of charge at the target voltage based on the target voltage and the fitting formula; and to determine the ratio of the amount of charge to the target voltage as the equivalent capacitance of the output junction capacitance at the target voltage.
[0100] The equivalent capacitance determination device provided in this application embodiment can execute this application. Figure 2 The method for determining the equivalent capacitance provided in the embodiments has corresponding functional units and beneficial effects for performing the method.
[0101] Figure 7 This application provides a schematic diagram of the structure of a computer device, as shown in the embodiment of the present application. Figure 7 As shown, the computer device includes a processor 701, a memory 702, an input device 703, and an output device 704; the number of processors 701 in the computer device can be one or more. Figure 7 Taking a processor 701 as an example; the processor 701, memory 702, input device 703, and output device 704 in a computer device can be connected via a bus or other means. Figure 7 Taking the example of a connection between China and Israel via a bus.
[0102] The memory 702, as a computer-readable storage medium, can be used to store software programs, computer-executable programs, and modules, as described in the embodiments of this application. Figure 2 The equivalent capacitance determination method corresponds to the program instructions / modules (e.g., the first determining module 601 and the second determining module 602 in the equivalent capacitance determination device). The processor 701 executes various functions of the computer device and data processing by running the software programs, instructions, and modules stored in the memory 702, thereby implementing the above-mentioned equivalent capacitance determination method.
[0103] The memory 702 may primarily include a program storage area and a data storage area. The program storage area may store the operating system and at least one application program required for a given function; the data storage area may store data created based on the use of the cloud server, etc. Furthermore, the memory 702 may include high-speed random access memory and non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some instances, the memory 702 may further include memory remotely located relative to the processor 701, which can be connected to a computer device / terminal / server via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.
[0104] Input device 703 can be used to receive input digital or character information, and to generate key signal inputs related to user settings and function control of the computer device. Output device 704 may include display computer devices such as a display screen.
[0105] This application embodiment also provides a storage medium containing computer-executable instructions, which, when executed by a learning machine processor, are used to perform a method for determining an equivalent capacitance, the method comprising:
[0106] Determine the output junction capacitance value corresponding to each equal voltage value based on the output junction capacitance-voltage curve;
[0107] Based on each equal voltage value and the corresponding output junction capacitance value, determine the amount of charge corresponding to each equal voltage value;
[0108] Determine the charge-voltage fitting curve based on each equal voltage value and charge amount;
[0109] The fitting formula for the charge quantity is determined based on the fitted curve.
[0110] The equivalent capacitance of the output junction capacitance at the target voltage is determined based on the fitting formula.
[0111] Of course, the computer-executable instructions provided in the embodiments of this application are not limited to the method operation described above, but can also execute the method for determining the equivalent capacitance provided in any embodiment of this application.
[0112] Based on the above description of the implementation methods, those skilled in the art can clearly understand that this application can be implemented using software and necessary general-purpose hardware, and of course, it can also be implemented using hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as a computer floppy disk, read-only memory (ROM), random access memory (RAM), flash memory, hard disk, or optical disk, etc., including several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.
[0113] It is worth noting that in the above-described embodiment of the interface-based event triggering module, the various units included are only divided according to functional logic, but are not limited to the above division, as long as the corresponding functions can be implemented; in addition, the specific names of each functional unit are only for easy differentiation and are not used to limit the scope of protection of this application.
[0114] Note that the above are merely preferred embodiments and the technical principles employed in this application. Those skilled in the art will understand that this application is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of this application. Therefore, although this application has been described in detail through the above embodiments, this application is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of this application, the scope of which is determined by the scope of the appended claims.
Claims
1. A method for determining the equivalent capacitance, applied to the output junction capacitance scenario of a field-effect transistor, characterized in that, include: Determine the output junction capacitance value corresponding to each equal voltage value based on the output junction capacitance-voltage curve; The amount of charge corresponding to each equal voltage value is determined based on each equal voltage value and the corresponding output junction capacitance value. A charge-voltage fitting curve is determined based on each equal voltage value and the amount of charge. The fitting formula for the charge quantity is determined based on the fitting curve. The equivalent capacitance of the output junction capacitance under the target voltage is determined according to the fitting formula. The step of determining the charge corresponding to each equally divided voltage value based on each equally divided voltage value and the corresponding output junction capacitance value includes: Step 1: Determine the voltage change between the current equal-division voltage value and the previous equal-division voltage value; Step 2: Determine the charge change between the current equal-division voltage value and the previous equal-division voltage value based on the voltage change, the output junction capacitance corresponding to the current equal-division voltage value, and the output junction capacitance corresponding to the previous equal-division voltage value. Step 3: Determine the charge amount corresponding to the current equal-division voltage value based on the charge change and the charge amount corresponding to the previous equal-division voltage value; The next equal-division voltage value is determined as the current equal-division voltage value. Steps one to three above are repeated until the charge corresponding to each equal-division voltage value is determined.
2. The method according to claim 1, characterized in that, Determining the charge change between the current equal-division voltage value and the previous equal-division voltage value based on the voltage change, the output junction capacitance corresponding to the current equal-division voltage value, and the output junction capacitance corresponding to the previous equal-division voltage value includes: Determine the average capacitance between the output junction capacitance corresponding to the current equal-division voltage value and the output junction capacitance corresponding to the previous equal-division voltage value; The product of the average capacitance and the voltage change is determined as the charge change between the current equal-division voltage value and the previous equal-division voltage value.
3. The method according to claim 1 or 2, characterized in that, The step of determining the charge corresponding to the current equal-division voltage value based on the charge change and the charge corresponding to the previous equal-division voltage value includes: The sum of the charge change and the charge corresponding to the previous equal-division voltage value is determined as the charge corresponding to the current equal-division voltage value.
4. The method according to claim 1, characterized in that, The step of determining the fitting formula for the charge quantity based on the fitting curve includes: The fitting curve is fitted based on the fitting coefficients to obtain the fitting formula for the charge quantity.
5. The method according to claim 1, characterized in that, Determining the equivalent capacitance of the output junction capacitance at the target voltage according to the fitting formula includes: The charge amount at the target voltage is determined based on the target voltage and the fitting formula; The ratio of the charge quantity to the target voltage is determined as the equivalent capacitance of the output junction capacitance under the target voltage.
6. A device for determining equivalent capacitance, applied to the scenario of output junction capacitance of a field-effect transistor, characterized in that, include: The first determining module is used to determine the output junction capacitance value corresponding to each equally divided voltage value based on the output junction capacitance-voltage curve. The first determining module is further configured to determine the charge corresponding to each equal voltage value based on each equal voltage value and the corresponding output junction capacitance value; The second determining module determines a charge-voltage fitting curve based on each equally divided voltage value and the charge amount; The second determining module is used to determine the fitting formula for the charge quantity based on the fitting curve; The second determining module is used to determine the equivalent capacitance of the output junction capacitance under the target voltage according to the fitting formula; The first determining module is specifically used to perform the following process: Step 1: Determine the voltage change between the current equal-division voltage value and the previous equal-division voltage value; Step 2: Determine the charge change between the current equal-division voltage value and the previous equal-division voltage value based on the voltage change, the output junction capacitance corresponding to the current equal-division voltage value, and the output junction capacitance corresponding to the previous equal-division voltage value. Step 3: Determine the charge amount corresponding to the current equal-division voltage value based on the charge change and the charge amount corresponding to the previous equal-division voltage value; The next equal-division voltage value is determined as the current equal-division voltage value. Steps one to three above are repeated until the charge corresponding to each equal-division voltage value is determined.
7. A computer device, comprising a memory and a processor, characterized in that, The memory stores a computer program, and when the processor executes the computer program, it implements the method for determining the equivalent capacitance as described in any one of claims 1-5.
8. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the method for determining the equivalent capacitance as described in any one of claims 1-5.