Image acquisition method and device, chip, electronic device and storage medium
By segmenting image acquisition and adjusting parameters, the problems of poor user experience and lighting variations during image acquisition were solved, achieving efficient and stable image quality acquisition.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHIPONE TECHNOLOGY (BEIJING) CO LTD
- Filing Date
- 2022-11-11
- Publication Date
- 2026-07-14
Smart Images
Figure CN115797613B_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the field of image processing, and more particularly to an image acquisition method and apparatus, a chip, an electronic device, and a storage medium. Background Technology
[0002] With the advancement of technology, biometric technology is being used more and more widely in daily life. For example, identity verification is performed using biometric features such as fingerprints, faces, and irises.
[0003] This requires first acquiring a clear image representing a specific part of the human body (the target object), and then analyzing the image to achieve the purpose of identification. However, since the lighting conditions for acquiring images of the target object are not fixed as the scene changes, it is necessary to reset the image acquisition parameters according to the lighting conditions each time an image is acquired to ensure image quality.
[0004] In related technologies, it is often necessary to acquire multiple frames of images of the target object in order to obtain the image acquisition parameters of the current scene. This requires the user to maintain a posture for a long time or repeat an action multiple times, which greatly affects the user experience. Summary of the Invention
[0005] In view of this, this disclosure proposes an image acquisition scheme that can improve the efficiency of acquiring images that meet quality requirements.
[0006] According to one aspect of this disclosure, an image acquisition method is provided, the method comprising:
[0007] According to the first image acquisition parameters, image acquisition is performed on non-critical regions in a single frame image to obtain the data amount of the first voltage signal of the non-critical regions.
[0008] When the amount of data of the first voltage signal is less than the amount of data of the preset standard voltage signal, the second image acquisition parameters corresponding to the amount of data of the preset standard voltage signal are determined according to the first image acquisition parameters and the amount of data of the first voltage signal.
[0009] According to the second image acquisition parameters, the key regions in the single frame image are acquired.
[0010] In one possible implementation, determining the second image acquisition parameters corresponding to a preset standard voltage data amount based on the first image acquisition parameters and the data amount of the first voltage signal includes:
[0011] Based on the data volume of the first image acquisition parameters and the first voltage signal, determine the mapping relationship between the data volume of the image acquisition parameters and the voltage signal;
[0012] Based on the mapping relationship, the second image acquisition parameters corresponding to the preset standard voltage data volume are determined.
[0013] In one possible implementation, the image acquisition parameters include: exposure time and / or charge signal gain value. The step of acquiring image data of non-critical regions in a single frame image according to the first image acquisition parameters to obtain the first voltage signal data of the non-critical regions includes:
[0014] According to the first exposure time, image acquisition is performed on non-critical areas in a single frame image, and the charge amount of the non-critical areas is measured.
[0015] The charge quantity is converted according to the first charge signal gain value to obtain a first voltage signal and the data quantity of the first voltage signal.
[0016] In one possible implementation, determining the second image acquisition parameters corresponding to a preset standard voltage data amount based on the first image acquisition parameters and the data amount of the first voltage signal includes:
[0017] With the first charge signal gain value fixed, a second exposure time corresponding to a preset standard voltage data quantity is determined based on the first exposure time and the data quantity of the first voltage signal; or,
[0018] With the first exposure time fixed, the second charge signal gain value corresponding to the preset standard voltage data amount is determined based on the first charge signal gain value and the data amount of the first voltage signal.
[0019] In one possible implementation, the first image acquisition parameter is a preset empirical value, and the method further includes:
[0020] If the amount of data in the first voltage signal is not less than the amount of data in the preset standard voltage signal, the key area in the single frame image is acquired according to the first image acquisition parameters.
[0021] In one possible implementation, the data amount of the first voltage signal is the average gray value of a single pixel in the non-critical region.
[0022] According to another aspect of this disclosure, an image acquisition device is provided, the device comprising:
[0023] The voltage signal data quantity determination unit is used to perform image acquisition of non-critical areas in a single frame image according to the first image acquisition parameters, and obtain the data quantity of the first voltage signal of the non-critical area.
[0024] The second image acquisition parameter determination unit is used to determine the second image acquisition parameters corresponding to the preset standard voltage data amount based on the first image acquisition parameters and the data amount of the first voltage signal when the data amount of the first voltage signal is less than the preset standard voltage data amount.
[0025] The image acquisition unit is used to acquire images of key regions in the single-frame image according to the second image acquisition parameters.
[0026] According to another aspect of this disclosure, a chip is provided that includes the aforementioned image acquisition device.
[0027] According to another aspect of this disclosure, an electronic device is provided, comprising: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to implement the above-described method when executing instructions stored in the memory.
[0028] According to another aspect of this disclosure, a non-volatile computer-readable storage medium is provided that stores computer program instructions thereon, wherein the computer program instructions, when executed by a processor, implement the above-described method.
[0029] According to another aspect of this disclosure, a computer program product is provided, including computer-readable code, or a non-volatile computer-readable storage medium carrying computer-readable code, wherein when the computer-readable code is run in a processor of an electronic device, the processor in the electronic device performs the above-described method.
[0030] In this embodiment, image acquisition of non-critical regions in a single frame image is performed according to first image acquisition parameters to obtain the data amount of a first voltage signal in the non-critical regions. If the data amount of the first voltage signal is less than a preset standard voltage data amount, second image acquisition parameters corresponding to the preset standard voltage data amount are determined based on the first image acquisition parameters and the data amount of the first voltage signal. Image acquisition of critical regions in the single frame image is then performed according to the second image acquisition parameters. This allows image acquisition parameters suitable for the current scene to be directly determined during the acquisition of a single frame image, ensuring that most areas of the acquired image meet image quality requirements and can be used for subsequent image processing, thus improving the efficiency of acquiring images that meet quality requirements.
[0031] Other features and aspects of this disclosure will become clear from the following detailed description of exemplary embodiments with reference to the accompanying drawings. Attached Figure Description
[0032] The accompanying drawings, which are included in and form part of this specification, illustrate exemplary embodiments, features, and aspects of this disclosure together with the specification and serve to explain the principles of this disclosure.
[0033] Figure 1 This is a flowchart illustrating an image acquisition method provided in an embodiment of this application.
[0034] Figure 2 This is a schematic diagram of the structure of an image acquisition device provided in an embodiment of this application.
[0035] Figure 3 This is a schematic diagram of the structure of an image acquisition electronic device provided in an embodiment of this application. Detailed Implementation
[0036] Various exemplary embodiments, features, and aspects of this disclosure will now be described in detail with reference to the accompanying drawings. The same reference numerals in the drawings denote elements that have the same or similar functions. Although various aspects of the embodiments are shown in the drawings, they are not necessarily drawn to scale unless specifically indicated otherwise.
[0037] In the description of this disclosure, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this disclosure and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this disclosure.
[0038] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this disclosure, "a plurality of" means two or more, unless otherwise expressly specified.
[0039] In this disclosure, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.
[0040] In this document, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent three cases: A alone, A and B simultaneously, and B alone. Furthermore, the term "at least one" in this document means any combination of at least two of any one or more elements. For example, including at least one of A, B, and C can mean including any one or more elements selected from the set consisting of A, B, and C.
[0041] Figure 1 This is a schematic flowchart illustrating an image acquisition method provided in an embodiment of this application. Figure 1 As shown, the method includes:
[0042] S11, according to the first image acquisition parameters, perform image acquisition of non-critical areas in a single frame image to obtain the data amount of the first voltage signal of the non-critical areas.
[0043] The first image acquisition parameter can be a preset parameter, which can be a parameter pre-set for the image acquisition device. The image acquisition parameter can be at least one of the following parameters: exposure time, exposure amount, and ISO. This is only for illustrative purposes, and the image acquisition parameter is not limited to the above parameters.
[0044] An image acquisition device can acquire images containing a target object according to image acquisition parameters. The quality of the acquired image is related to the image acquisition parameters. In this embodiment of the disclosure, when acquiring an image containing a target object, non-critical regions of the image containing the target object can be acquired first according to first image acquisition parameters. These non-critical regions can be a portion of the image containing the target object. For example, a non-critical region can be an edge region in the image containing the target object, or a region outside the target object in the image containing the target object. For instance, when the image acquisition mode is progressive scan, the non-critical region can be a region composed of pixels from the first few rows of the image.
[0045] The image acquisition process includes the conversion of light signals into voltage signals, so the first voltage signal of non-critical areas can be obtained, and thus the amount of data of the first voltage signal can be obtained.
[0046] S12, when the data volume of the first voltage signal is less than the preset standard voltage data volume, determine the second image acquisition parameters corresponding to the preset standard voltage data volume based on the first image acquisition parameters and the data volume of the first voltage signal.
[0047] In this embodiment, a standard voltage data volume can be preset. The standard voltage data volume indicates that the acquired image meets both the image quality requirements of subsequent image processing and the hardware requirements of the image acquisition device. Image quality here can be an evaluation index characterizing one or more aspects such as image sharpness, color quality, and the amount of information contained in the image. Hardware requirements here can include the transmission bandwidth required to transmit the image to the processing module.
[0048] In one possible implementation, the data amount of the first voltage signal is the average gray value of the pixels in the non-critical area.
[0049] In this embodiment, after performing analog-to-digital conversion on the first voltage signal, binary data representing the first voltage signal can be obtained. This binary data can also represent the grayscale value of each pixel in the non-critical area. In this embodiment, the sum of the grayscale values of each pixel in the non-critical area can be determined; then, based on the ratio of the sum of grayscale values to the number of pixels in the non-critical area, the average grayscale value of a single pixel in the non-critical area can be determined. Since the hardware bandwidth can be limited by the amount of data per pixel when transmitting an image, the average grayscale value of a single pixel in the non-critical area can be used as the amount of data for the first voltage signal.
[0050] Image quality is often related to the amount of voltage data. For example, when the amount of data for the first voltage signal is between 0 and a preset standard voltage data amount, the image quality is positively correlated with the amount of data for the first voltage signal; when the amount of data for the first voltage signal is greater than the preset standard voltage data amount, the image quality is negatively correlated with the amount of data for the first voltage signal.
[0051] Therefore, if the amount of voltage signal data is less than the preset standard voltage data amount, the image quality may not meet the requirements of subsequent image processing. It is necessary to determine the second image acquisition parameters. By acquiring images using the second image acquisition parameters, the amount of voltage signal data obtained can be close to or equal to the standard voltage data amount.
[0052] Therefore, in the current scenario, the key areas acquired using the second image acquisition parameters can meet the image quality requirements of subsequent image processing.
[0053] S13, according to the second image acquisition parameters, perform image acquisition of the key region in the single frame image.
[0054] In this embodiment of the disclosure, the key region can be: an image region in an image containing the target object after removing non-key regions. The key region includes all or most of the target object. The key region can contain the vast majority of image information of the target object.
[0055] Since key and non-key regions are captured in the same scene, the second image acquisition parameters determined by capturing non-key regions can be used to capture key regions and obtain key regions that meet expectations. Moreover, most of the information of the target object will be retained in the image composed of non-key and key regions, which can meet the requirements of subsequent image processing.
[0056] In this embodiment, image acquisition of non-critical regions in a single frame image is performed according to first image acquisition parameters to obtain the data amount of a first voltage signal in the non-critical regions. If the data amount of the first voltage signal is less than a preset standard voltage data amount, second image acquisition parameters corresponding to the preset standard voltage data amount are determined based on the first image acquisition parameters and the data amount of the first voltage signal. Image acquisition of critical regions in the single frame image is then performed according to the second image acquisition parameters. This allows image acquisition parameters suitable for the current scene to be directly determined during the acquisition of a single frame image, ensuring that most areas of the acquired image meet image quality requirements and can be used for subsequent image processing, thus improving the efficiency of acquiring images that meet quality requirements.
[0057] In one possible implementation, determining the second image acquisition parameter corresponding to the preset standard voltage data amount based on the first image acquisition parameter and the data amount of the first voltage signal includes: determining the mapping relationship between the image acquisition parameter and the data amount of the voltage signal based on the first image acquisition parameter and the data amount of the first voltage signal; and determining the second image acquisition parameter corresponding to the preset standard voltage data amount based on the mapping relationship.
[0058] There is a mapping relationship between image acquisition parameters and the amount of voltage signal data. However, this mapping relationship changes with the scene because the lighting conditions vary from scene to scene. Therefore, even with the same image acquisition parameters, the amount of charge accumulated on the image acquisition device may differ in different scenes. Consequently, the mapping relationship between image acquisition parameters and the amount of voltage signal data will also differ depending on the scene. In other words, this mapping relationship between image acquisition parameters and the amount of voltage signal data needs to be redefined as the scene changes. Only by determining this mapping relationship can image acquisition parameters that meet the required quality be obtained.
[0059] Therefore, the mapping relationship between the image acquisition parameters and the voltage signal data volume in the current scene can be determined based on the first image acquisition parameters and the first voltage signal data volume. Based on this mapping relationship and the preset standard voltage data volume, the second image acquisition parameters can then be determined.
[0060] The method disclosed herein is not limited by the scene because it can determine the mapping relationship between the image acquisition parameters and the amount of voltage signal data by acquiring non-critical areas, thereby determining the second image acquisition parameters suitable for the current scene and improving the quality of the acquired image.
[0061] Furthermore, it can directly obtain images that meet quality requirements without acquiring multiple frames, thus improving the efficiency of obtaining images that meet quality requirements.
[0062] In one possible implementation, the image acquisition parameters include: exposure time and / or charge signal gain value. The step of acquiring images of non-critical regions in a single frame image according to the first image acquisition parameters to obtain the data amount of the first voltage signal of the non-critical regions includes: acquiring images of non-critical regions in a single frame image according to the first exposure time, measuring the charge amount of the non-critical regions, and converting the charge amount according to the first charge signal gain value to obtain the first voltage signal and the data amount of the first voltage signal.
[0063] The image acquisition process consists of two parts: the exposure process and the data acquisition process. During the exposure process, the amount of charge accumulated on the electronic components is positively correlated with the exposure time. The charge signal gain value can be used to convert the charge into a voltage signal.
[0064] In this embodiment of the disclosure, in order to obtain a voltage signal, or the amount of voltage signal data, it is necessary to obtain a first exposure time and a first charge signal gain value.
[0065] Therefore, exposure can be performed according to the first exposure time to collect data from non-critical areas; the charge amount in the non-critical areas can be determined; and the charge in the non-critical areas can be converted according to the first charge signal gain value to obtain the first voltage signal, which is positively correlated with the amount of charge. This allows us to obtain the data volume of the first voltage signal.
[0066] Since the amount of voltage signal data can be determined using image acquisition parameters during image acquisition, this embodiment of the present disclosure does not require additional steps. It directly determines the amount of first voltage signal data in non-critical areas, thereby improving the efficiency of determining the amount of first voltage signal data and thus improving the efficiency of determining the second image acquisition parameters.
[0067] In one possible implementation, determining the second image acquisition parameter corresponding to the preset standard voltage data amount based on the first image acquisition parameters and the data amount of the first voltage signal includes: when the first charge signal gain value is fixed, determining the second exposure time corresponding to the preset standard voltage data amount based on the first exposure time and the data amount of the first voltage signal; or, when the first exposure time is fixed, determining the second charge signal gain value corresponding to the preset standard voltage data amount based on the first charge signal gain value and the data amount of the first voltage signal.
[0068] In this embodiment, a mapping relationship between the first image acquisition parameters and the data volume of the voltage signal can be determined; then, using this mapping relationship, a second image acquisition parameter for the same scene can be determined. The first image acquisition parameter includes a first exposure time or a first charge signal gain value. The second image acquisition parameter includes a second exposure time or a second charge signal gain value.
[0069] For example, the charge signal gain value can be fixed while the exposure time is adjusted. That is, a non-critical area is sampled according to a first exposure time, the quantity of a first charge on the non-critical area is measured, and the quantity of the first charge is converted according to the first charge signal gain value to obtain a first voltage signal, and the data volume of the first voltage signal is obtained. Based on the data volume of the first voltage signal and the first exposure time, a first mapping relationship between the voltage signal data volume and the exposure time in the current scene can be determined. Based on the first mapping relationship, a second exposure time corresponding to a preset standard voltage data volume is determined.
[0070] For example, the exposure time can be fixed while the charge signal gain value is adjusted. That is, a non-critical area is sampled according to the first exposure time, the amount of second charge on the non-critical area is measured, and the amount of second charge is converted according to the first charge signal gain value to obtain a first voltage signal, and the data amount of the first voltage signal is obtained. Based on the data amount of the first voltage signal and the first charge signal gain value, a second mapping relationship between the data amount of the voltage signal and the first charge signal gain value in the current scene can be determined. Based on the second mapping relationship, a second charge signal gain value corresponding to a preset standard voltage data amount is determined.
[0071] When the image acquisition device provides a point light source, or when the light illuminating the target object is uneven, there is a third mapping relationship between the amount of charge accumulated in non-critical areas and the amount of charge accumulated in critical areas within the same exposure time.
[0072] Therefore, non-critical areas can be sampled according to the first exposure time, and the number of third charges on the non-critical areas can be measured. Based on the third mapping relationship, the number of fourth charges in the critical areas under the same exposure time can be determined. The fourth charge is converted into a first voltage signal according to the first charge signal gain value, and the data volume of the first voltage signal is obtained. Based on the data volume of the first voltage signal and the first exposure time, the fourth mapping relationship between the voltage signal data volume and the exposure time in the current scene can be determined. Based on the fourth mapping relationship, the third exposure time corresponding to the preset standard voltage data volume is determined. Alternatively, based on the data volume of the first voltage signal and the first charge signal gain value, the fifth mapping relationship between the voltage signal data volume and the charge signal gain value in the current scene can be determined. Based on the fifth mapping relationship, the third charge signal gain value corresponding to the preset standard voltage data volume is determined.
[0073] In this embodiment, in scenarios where image quality is sensitive to exposure time, the charge signal gain value can be fixed to determine the exposure time required to acquire an image that meets quality requirements. Even in scenarios where image quality is not sensitive to exposure time, or where the exposure time adjustment range of the image acquisition device is limited, the exposure time can be fixed to determine the charge signal gain value required to acquire an image that meets quality requirements, thus improving the universality of this method. It can improve the efficiency of acquiring images that meet quality requirements for different image acquisition devices and scenarios.
[0074] In one possible implementation, the first image acquisition parameter is a preset empirical value, and the method further includes: when the data amount of the first voltage signal is not less than the preset standard voltage data amount, performing image acquisition of key areas in the single frame image according to the first image acquisition parameter.
[0075] In this embodiment of the disclosure, if the first image acquisition parameter is an empirical value, then in most cases, using the first image acquisition parameter can acquire an image that basically meets the quality requirements.
[0076] As mentioned earlier, once the amount of data in the first voltage signal exceeds the preset standard voltage data amount, the image quality may often be negatively correlated with the amount of data in the first voltage signal.
[0077] Therefore, if the amount of voltage signal data is not less than the preset standard voltage data amount, and the amount of voltage signal data is equal to the preset standard voltage data amount, then the image quality has met the requirements of subsequent image processing steps. If the amount of voltage signal data is greater than the preset standard voltage data amount, then the image quality is close to or does not meet the requirements of subsequent image processing steps. Therefore, in this case, the key area can be acquired using the first image acquisition parameters.
[0078] In this embodiment of the disclosure, if the first image acquisition parameter is an empirical value and the data amount of the first voltage signal is not less than the preset standard voltage data amount, the first image acquisition parameter can be used directly to acquire the key area, which not only improves the acquisition efficiency, but also makes the acquired image meet the requirements of subsequent image processing.
[0079] The image acquisition process of the method disclosed herein is described below through examples.
[0080] If, in the scene where the image is being captured, the light illuminating the target object is uniform; image quality is sensitive to exposure time; and the image acquisition device supports regional adjustment of exposure time, then a first exposure time can be preset. An exposure time range can be determined empirically, for example, 20ms to 30ms. The first exposure time can be set within this range, and a first charge signal gain value can be preset.
[0081] Expose for the first exposure time, collect data from non-critical areas, measure the first charge quantity in the non-critical areas, convert the first charge quantity according to the first charge signal gain value to obtain the first voltage signal, and determine the data quantity of the first voltage signal.
[0082] Based on the preset first exposure time and the amount of data of the first voltage signal, a first mapping relationship between the number of voltage signals and the exposure time is determined in the current scene. Based on the first mapping relationship, a second exposure time corresponding to the preset standard voltage data amount is determined.
[0083] Continue exposure for the second exposure duration, acquire images of key areas, measure the charge quantity in the key areas, and convert the charge quantity in the key areas according to the first charge signal gain value to obtain the second voltage signal. This completes the image acquisition of the target object.
[0084] If, in the scene where the image is being captured, the light illuminating the target object is uniform; the image quality is not sensitive to exposure time; or the image acquisition device does not support regional adjustment of exposure time; or the exposure time adjustment range of the image acquisition device is limited, then a first exposure time can be preset. The first exposure time can be taken from the aforementioned exposure time range. A first charge signal gain value can also be preset.
[0085] Exposure is performed during the first exposure, non-critical areas are collected, the first charge quantity in the non-critical areas is measured, the second charge quantity is converted according to the first charge signal gain value to obtain the first voltage signal, and the data quantity of the first voltage signal is determined.
[0086] Based on the preset first charge signal gain value and the first voltage signal data volume, a second mapping relationship between the number of voltage signals and the charge signal gain value is determined in the current scenario. Based on the second mapping relationship, a second charge signal gain value corresponding to the preset standard voltage data volume is determined.
[0087] Continue exposure for the first exposure time, acquire images of key areas, measure the charge quantity in the key areas, and convert the charge quantity in the key areas according to the second charge signal gain value to obtain the second voltage signal. This completes the image acquisition of the target object.
[0088] In this embodiment, image acquisition of non-critical regions in a single frame image is performed according to first image acquisition parameters to obtain the data amount of a first voltage signal in the non-critical regions. If the data amount of the first voltage signal is less than a preset standard voltage data amount, second image acquisition parameters corresponding to the preset standard voltage data amount are determined based on the first image acquisition parameters and the data amount of the first voltage signal. Image acquisition of critical regions in the single frame image is then performed according to the second image acquisition parameters. This allows image acquisition parameters adapted to the current scene to be directly determined during image acquisition, ensuring that most areas of the acquired image meet image quality requirements and can be used for subsequent image processing, thus improving the efficiency of acquiring images that meet quality requirements.
[0089] Figure 2 This is a schematic diagram of the structure of an image acquisition device provided in an embodiment of this application. Figure 2 As shown, the device 20 includes:
[0090] The voltage signal data quantity determination unit 21 is used to perform image acquisition of non-critical areas in a single frame image according to the first image acquisition parameters, and obtain the data quantity of the first voltage signal of the non-critical area.
[0091] The second image acquisition parameter determination unit 22 is used to determine the second image acquisition parameter corresponding to the preset standard voltage data amount based on the first image acquisition parameter and the data amount of the first voltage signal when the data amount of the first voltage signal is less than the preset standard voltage data amount.
[0092] Image acquisition unit 23 is used to acquire images of key regions in the single frame image according to the second image acquisition parameters.
[0093] For example, the devices in this embodiment include, but are not limited to, desktop computers, televisions, mobile devices with large screens such as mobile phones and tablets, and other common devices that require multiple chips to be cascaded together to achieve driving.
[0094] For example, the device can also be user equipment (UE), mobile device, user terminal, terminal, handheld device, computing device, or in-vehicle device, etc. Examples of terminals include: displays, smartphones or portable devices, mobile phones, tablets, laptops, PDAs, mobile internet devices (MIDs), wearable devices, virtual reality (VR) devices, augmented reality (AR) devices, wireless terminals in industrial control, wireless terminals in self-driving, wireless terminals in remote medical surgery, wireless terminals in smart grids, wireless terminals in transportation safety, wireless terminals in smart cities, wireless terminals in smart homes, and wireless terminals in vehicle-to-everything (V2X) networks, etc. For example, the server can be a local server or a cloud server.
[0095] Figure 3 This is a schematic diagram of the structure of an image acquisition electronic device provided in an embodiment of this application. For example, the electronic device 1900 can be provided as a server or a terminal device. (Refer to...) Figure 3 The electronic device 1900 includes a processing component 1922, which further includes one or more processors, and memory resources represented by memory 1932 for storing instructions, such as application programs, that can be executed by the processing component 1922. The application programs stored in memory 1932 may include one or more modules, each corresponding to a set of instructions. Furthermore, the processing component 1922 is configured to execute instructions to perform the methods described above.
[0096] Electronic device 1900 may also include a power supply component 1926 configured to perform power management of electronic device 1900, a wired or wireless network interface 1950 configured to connect electronic device 1900 to a network, and an input / output (I / O) interface 1958. Electronic device 1900 can operate on an operating system stored in memory 1932, such as Windows Server™, Mac OS X™, Unix™, Linux™, FreeBSD™, or similar.
[0097] In an exemplary embodiment, a non-volatile computer-readable storage medium is also provided, such as a memory 1932 including computer program instructions that can be executed by a processing component 1922 of an electronic device 1900 to perform the above-described method.
[0098] The above description is merely an exemplary embodiment of the present invention and is not intended to limit the scope of protection of the present invention, which is determined by the appended claims.
[0099] The term “exemplary” as used herein means “serving as an example, embodiment, or illustration.” Any embodiment illustrated herein as “exemplary” is not necessarily to be construed as superior to or better than other embodiments.
[0100] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.
[0101] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of an instruction containing one or more executable instructions for implementing a specified logical function. In some alternative implementations, the functions marked in the blocks may occur in a different order than those shown in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, may be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions.
[0102] The various embodiments of this disclosure have been described above. These descriptions are exemplary and not exhaustive, nor are they limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen to best explain the principles, practical application, or improvement of the technology in the market, or to enable others skilled in the art to understand the embodiments disclosed herein.
Claims
1. An image acquisition method, characterized in that, include: According to the first image acquisition parameters, image acquisition is performed on non-critical regions in a single frame image to obtain the data amount of the first voltage signal of the non-critical region. The non-critical region is an edge region in an image containing a target object, or a region outside the target object in an image containing a target object. The image acquisition parameters are at least one of the following parameters: exposure time, exposure amount, and sensitivity. The data amount of the first voltage signal is the average gray value of a single pixel in the non-critical region. When the amount of data of the first voltage signal is less than the amount of data of the preset standard voltage signal, the second image acquisition parameters corresponding to the amount of data of the preset standard voltage signal are determined according to the first image acquisition parameters and the amount of data of the first voltage signal. According to the second image acquisition parameters, the key region in the single frame image is acquired, and the key region contains the target object.
2. The method according to claim 1, characterized in that, Based on the first image acquisition parameters and the data volume of the first voltage signal, determine the second image acquisition parameters corresponding to the preset standard voltage data volume, including: Based on the data volume of the first image acquisition parameters and the first voltage signal, determine the mapping relationship between the data volume of the image acquisition parameters and the voltage signal; Based on the mapping relationship, the second image acquisition parameters corresponding to the preset standard voltage data volume are determined.
3. The method according to claim 1, characterized in that, The image acquisition parameters include: exposure time and / or charge signal gain value. The step of acquiring image data of non-critical regions in a single frame image according to the first image acquisition parameters to obtain the first voltage signal data of the non-critical regions includes: According to the first exposure time, image acquisition is performed on non-critical areas in a single frame image, and the charge amount of the non-critical areas is measured. The charge quantity is converted according to the first charge signal gain value to obtain a first voltage signal and the data quantity of the first voltage signal.
4. The method according to claim 3, characterized in that, Based on the first image acquisition parameters and the data volume of the first voltage signal, determine the second image acquisition parameters corresponding to the preset standard voltage data volume, including: With the first charge signal gain value fixed, a second exposure time corresponding to a preset standard voltage data quantity is determined based on the first exposure time and the data quantity of the first voltage signal; or, With the first exposure time fixed, the second charge signal gain value corresponding to the preset standard voltage data amount is determined based on the first charge signal gain value and the data amount of the first voltage signal.
5. The method according to claim 1, characterized in that, The first image acquisition parameter is a preset empirical value, and the method further includes: If the amount of data in the first voltage signal is not less than the amount of data in the preset standard voltage signal, the key area in the single frame image is acquired according to the first image acquisition parameters.
6. An image acquisition device, characterized in that, include: The voltage signal data quantity determination unit is used to perform image acquisition of non-critical regions in a single frame image according to the first image acquisition parameters, and obtain the data quantity of the first voltage signal of the non-critical region. The non-critical region is an edge region in an image containing a target object, or a region outside the target object in an image containing a target object. The image acquisition parameters are at least one of the following parameters: exposure time, exposure amount, and sensitivity. The data quantity of the first voltage signal is the average gray value of a single pixel in the non-critical region. The second image acquisition parameter determination unit is used to determine the second image acquisition parameters corresponding to the preset standard voltage data amount based on the first image acquisition parameters and the data amount of the first voltage signal when the data amount of the first voltage signal is less than the preset standard voltage data amount. An image acquisition unit is configured to acquire images of key regions in a single frame image according to the second image acquisition parameters, wherein the key regions contain the target object.
7. A chip, characterized in that, include: The image acquisition device according to claim 6.
8. An electronic device, characterized in that, include: processor; Memory used to store processor-executable instructions; The processor is configured to implement the method of any one of claims 1 to 5 when executing instructions stored in the memory.
9. A non-volatile computer-readable storage medium storing computer program instructions thereon, characterized in that, When the computer program instructions are executed by the processor, they implement the method described in any one of claims 1 to 5.