Method and system for testing radiation sensitivity

Abstract

A method for testing radiation sensitivity includes emitting a radiation wave to a device under test, measuring a first voltage at the device under test in response to the radiation wave, outputting a reference voltage to a coupling device to cause the coupling device to generate a second voltage in response to the reference voltage, adjusting the reference voltage to cause the second voltage to approximate the first voltage, storing the adjusted reference voltage, and outputting the second voltage to the device under test in response to the adjusted reference voltage to simulate the effect of the radiation wave on the device under test.

Description

Technical Field

[0001] This invention relates to a method and system for testing radiation sensitivity, and more particularly to a method and system for testing radiation sensitivity that can simulate the effect of radiation waves on the device under test. Background Technology

[0002] For electronic devices, such as computers or servers, radiated susceptibility (RS) testing is crucial. Since electromagnetic fields are ubiquitous, failure to pass RS testing can lead to functional malfunctions and damage due to interference from radiation waves.

[0003] Currently, to test radiation sensitivity, electronic equipment must be placed in an anechoic chamber, radio waves are emitted to the equipment, and the effects on the equipment are measured. If the result is unsatisfactory, a trial-and-error approach is required, where engineers enter the anechoic chamber, adjust the settings, and repeat the relevant operations for analysis or debugging.

[0004] This process consumes significant site resources and operating time, and it is not easy to identify the root cause of errors. Furthermore, since engineers must frequently enter high-radiation areas, it is also detrimental to their safety and health. Summary of the Invention

[0005] An embodiment provides a method for testing radiation sensitivity, comprising: emitting a radiation wave to a device under test; measuring the device under test to obtain a first voltage based on the radiation wave; outputting a reference voltage to a coupling device to cause the coupling device to generate a second voltage based on the reference voltage; adjusting the reference voltage to make the second voltage approximate the first voltage; storing the adjusted reference voltage; and outputting the second voltage to the device under test based on the adjusted reference voltage to simulate the effect of the radiation wave on the device under test.

[0006] An embodiment provides a system for testing radiation susceptibility, comprising a coupling device, a signal generator, and a device under test (DUT). The coupling device includes a first terminal, a second terminal, and a third terminal, wherein the first terminal is used to receive a reference voltage, and the second terminal is used to output a second voltage corresponding to the first voltage based on the reference voltage. The signal generator is coupled to the first terminal of the coupling device to output the reference voltage. The DUT is coupled to the second terminal of the coupling device to receive the second voltage. The first voltage can be measured when a radiation wave is applied to the DUT, and the reference voltage is set such that the second voltage approximates the first voltage to simulate the effect of the radiation wave on the DUT. Attached Figure Description

[0007] Figure 1 This is a schematic diagram of applying radiation waves to the device under test in an embodiment.

[0008] Figure 2 This is a schematic diagram illustrating the effect of simulated radiation waves on the device under test in an embodiment.

[0009] Figure 3 This is a flowchart illustrating a method for testing radiation sensitivity in an embodiment.

[0010] Figure 4 This is a schematic diagram of the system for testing radiation sensitivity in an embodiment.

[0011] Figure 5 For use Figure 4 The system, a flowchart for testing radiation sensitivity.

[0012] Figure 6 for Figure 2 and Figure 4 A schematic diagram of the coupling device.

[0013] Component designation explanation

[0014] 110: Anechoic Chamber

[0015] ANT: Antenna

[0016] W: Radiation wave

[0017] EUT: Device under Test

[0018] MD: Measuring device

[0019] FC: Faraday Cage

[0020] CT: Coupling device

[0021] VRS: First Voltage

[0022] SG: Signal Generator

[0023] PD: Peripheral control device

[0024] Vi: Reference voltage

[0025] P1: First end

[0026] P2: Second end

[0027] P3: Third end

[0028] V'RS: Second voltage

[0029] 300: Method

[0030] 310 to 360, 510 to 530: Step 400: System

[0031] T,T1,T2: Workbench

[0032] Sr: Measurement result

[0033] Sc1: First control signal

[0034] Sc2: Second control signal

[0035] 610: Choke circuit

[0036] A: Amplifier

[0037] C: Adapter Detailed Implementation

[0038] To address the aforementioned deficiencies, embodiments may provide systems and methods for testing radiation sensitivity, as described below.

[0039] According to an embodiment, radiated waves are first emitted to the device under test (DUT) in an anechoic chamber using an antenna, and the DUT is measured to obtain a corresponding first voltage. The first voltage will be different depending on the frequency of the emitted radiated waves (e.g., 100MHz, 125MHz, 250MHz, 400MHz, and 1000MHz). Then, a reference voltage is provided by a signal generator, which is used to generate a second voltage applied to the DUT via a coupling device. The reference voltage generated by the signal generator can be adjusted so that the second voltage approximates the first voltage. The adjusted reference voltage can be stored for later use; subsequently, the anechoic chamber is no longer needed, and the stored reference voltage can be used to generate the second voltage again via the coupling device and apply it to the DUT to simulate the effect of radiated waves on the DUT.

[0040] Figure 1 This is a schematic diagram illustrating the application of a radiation wave W to the device under test (EUT) in an embodiment. Figure 2This is a schematic diagram illustrating the effect of simulated radiation wave W on the device under test (EUT) in the embodiment. Figure 3 The flowchart below shows a method 300 for testing radiation sensitivity in an embodiment. Figure 1 Can correspond to Figure 3 Steps 310 to 320, Figure 2 Can correspond to Figure 3 Steps 330 to 360. For example... Figures 1 to 3 As shown, method 300 may include the following steps:

[0041] Step 310: The antenna ANT emits a radiated wave W to the device under test (EUT);

[0042] Step 320: The measuring device MD measures the device under test (EUT) to obtain the first voltage VRS based on the radiated wave W;

[0043] Step 330: Output a reference voltage Vi to the coupling device CT, so that the coupling device CT generates a second voltage V'RS according to the reference voltage Vi;

[0044] Step 340: Adjust the reference voltage Vi so that the second voltage V'RS approximates the first voltage VRS;

[0045] Step 350: Store the adjusted reference voltage Vi; and

[0046] Step 360: Output the second voltage V'RS to the device under test (EUT) based on the adjusted reference voltage Vi to simulate the effect of the radiated wave W on the EUT.

[0047] like Figure 1 As shown, steps 310 to 320 can be performed in the antenna anechoic chamber 110, wherein the radiated wave W emitted by the antenna ANT may have a predetermined frequency according to the test requirements. For example, the measuring device MD may be an oscilloscope, such as a digital storage oscilloscope (DSO). Figure 1 In this process, the measuring device MD can be placed within a Faraday cage FC to avoid interference from radiation waves. The device under test (EUT) may include a network cable (CAT cable) and a network connector; for example, the network cable may be a CAT5E cable, and the network connector may be an RJ45 LAN connector. Therefore, the radiation sensitivity of the network cable and connector can be tested. According to an embodiment, Figure 1 In this setup, the measuring device MD and the device under test (EUT) can be placed on the workbench T. The workbench T can be insulated, for example, a wooden table, to comply with relevant testing specifications.

[0048] Measurements and calculations confirm that the second voltage V'RS can indeed simulate the first voltage VRS, with only a phase difference in the waveform. Therefore, simulating the effect of the radiated wave W using the second voltage V'RS is feasible and accurate.

[0049] like Figure 2 As shown, in steps 330 to 350, a coupling device CT and a signal generator SG can be used to generate a second voltage V'RS to simulate the effect of the radiated wave W. Figure 2 As shown, the coupling device CT may include a first terminal P1, a second terminal P2, and a third terminal P3, wherein the first terminal P1 can receive a reference voltage Vi, and the second terminal P2 can output a voltage VRS corresponding to the first voltage (shown in Figure 1) based on the reference voltage Vi. Figure 1 The second voltage V'RS and the third terminal P3 can be coupled to the peripheral control device PD to access the first control signal Sc1. The first control signal Sc1 will be described later. Since the coupling device CT has the first terminal P1 to the third terminal P3, the coupling device CT can be a three-port coupling device.

[0050] The signal generator SG can be coupled to the first terminal P1 of the coupling device CT to output a reference voltage Vi. The device under test (EUT) can be coupled to the second terminal P2 of the coupling device CT to receive a second voltage V'RS. According to an embodiment, the second voltage V'RS can be positively correlated with the sum of the first voltage VRS and the correction factor CF, for example, as shown in equation eq-1:

[0051] Vi=V'RS+CF…eq-1

[0052] As shown in steps 340 to 350, since the first voltage VRS has been obtained in step 320, the reference voltage Vi can be adjusted so that the second voltage V'RS approximates the first voltage VRS. For example, the difference between the first voltage VRS and the second voltage V'RS may not exceed 10%, 5%, or 1% of the first voltage VRS. As described in step 360, the second voltage V'RS can be output to the device under test (EUT) based on the adjusted reference voltage Vi to simulate the effect of the radiated wave W on the EUT.

[0053] According to an embodiment, steps 310 to 350 can be repeated to obtain a reference voltage Vi corresponding to a different frequency. For example, in step 310, the radiated wave W may have a first frequency, so in steps 340 to 350, the adjusted reference voltage Vi may correspond to the first frequency. Subsequently, the radiated wave W can be adjusted from the first frequency to a second frequency to obtain a reference voltage Vi corresponding to the second frequency, and so on.

[0054] Through multiple calibrations and operations, a table of multiple frequencies and multiple reference voltages Vi can be obtained. Then, if a radiation wave W of a predetermined frequency is to be applied to the device under test (EUT), it can be directly... Figure 2In this manner, a second voltage V'RS is output to the device under test (EUT) using the corresponding reference voltage Vi for simulation. For example, the frequencies corresponding to the multiple reference voltages Vi in the lookup table can range from tens to hundreds of megahertz (MHz), but less than 1 gigahertz (GHz), to avoid excessive noise at high frequencies. According to the embodiment, Figure 2 In this system, data transmission can be achieved between the peripheral control device PD, the coupling device CT, and the device under test (EUT) via a local area network (LAN).

[0055] Figure 4 This is a schematic diagram of a system 400 for testing radiation sensitivity, as described in the embodiment. System 400 may include... Figure 2 The diagram shows a coupling device CT, a signal generator SG, a device under test (EUT), a peripheral control device PD, and a measuring device MD. The peripheral control device PD is coupled to the third terminal P3 of the coupling device CT to access the first control signal Sc1. The measuring device MD is coupled to both the peripheral control device PD and the EUT to access the second control signal Sc2 between the measuring device MD and the peripheral control device PD. When the coupling device CT outputs a second voltage V'RS to the EUT, the measuring device EUT is measured to obtain the measurement result Sr.

[0056] According to an embodiment, a first control signal Sc1 may be correlated with a second control signal Sc2, and the second control signal Sc2 may be correlated with a measurement result Sr. The first control signal Sc1 and the second control signal Sc2 can be used to perform related control and data transmission. The measurement result Sr corresponds to the effect of the simulated radiation wave W on the device under test (EUT). Therefore, the effect and interference of the radiation wave W on the EUT can be analyzed based on the measurement result Sr.

[0057] According to the embodiments, such as Figure 4 As shown, system 400 may optionally include an adapter C coupled between a peripheral control device PD and a measuring device MD. For example, adapter C may be an adapter between a Universal Serial Bus (USB) and a General Purpose Interface Bus (GPIB). System 400 may optionally include an amplifier A coupled between a signal generator SG and the first terminal P1 of a coupling device CT to amplify the reference voltage Vi.

[0058] According to an embodiment, the peripheral control device PD may include a desktop computer, server, laptop computer, tablet computer, and / or computing device for performing related control. The measuring device MD may include an oscilloscope, such as a digital storage oscilloscope.

[0059] Figure 4 In this circuit, the path between the signal generator SG and the measuring device MD can, for example, use a Universal Interface Bus (GPIB) interface. The path between the signal generator SG and the coupling device CT can be a voltage charging path to transmit the reference voltage Vi and the amplified reference voltage Vi.

[0060] The paths between the coupling device CT and the peripheral control device PD, and between the coupling device CT and the device under test (EUT), can serve as test paths for accessing test-related signals and voltages. For example, a second voltage V'RS can be carried on the signal of a local area network (LAN) on the path between the coupling device CT and the EUT.

[0061] The paths between the peripheral control device PD and the measuring device MD, and between the signal generator SG and the measuring device MD, can be control paths used to control and monitor the signal generator SG and the measuring device MD via the peripheral control device PD.

[0062] The path between the measuring device (MD) and the device under test (EUT) can be a measurement path. For example, the EUT can be measured using an oscilloscope probe.

[0063] According to the embodiments, such as Figure 4 As shown, the signal generator SG, amplifier A, and coupling device CT can be set on the workbench T1, and the device under test (EUT), peripheral control device PD, adapter C, and measuring device MD can be set on the workbench T2 to perform a simulated test of radiation sensitivity.

[0064] Figure 5 use Figure 4 The flowchart for testing radiation sensitivity in System 400 may include the following steps:

[0065] Step 510: Access the first control signal Sc1 between the coupling device CT and the peripheral control device PD;

[0066] Step 520: Store the second control signal Sc2 between the measuring device MD and the peripheral control device PD; and

[0067] Step 530: When the coupling device CT outputs the second voltage V'RS to the device under test (EUT), the measuring device MD measures the EUT to obtain the measurement result Sr.

[0068] Steps 510 to 530 may include Figure 3 In step 360, by using the peripheral control device PD for related control, a second voltage V'RS can be generated using the reference voltage Vi to simulate the radiation sensitivity test.

[0069] Figure 6 for Figure 2 and Figure 4 A schematic diagram of the coupling device CT is provided. According to an embodiment, the coupling device CT may include a set of capacitors and a set of resistors coupled to a first terminal P1. The coupling device CT may further include a choke circuit 610 coupled to a third terminal P3. The choke circuit 610 may, for example, include a common-mode choke. The choke circuit 610 can reduce or even block interference from the second voltage VR'S to the peripheral control device PD. For example, an SMA (Sub-Miniature version A) connector may be coupled to the first terminal P1, a first RJ45 connector may be coupled to the second terminal P2, and a second RJ45 connector may be coupled to the third terminal P3. The external structure of the coupling device CT may, for example, be a cube with suitable heat dissipation holes. For example, the length, width, and height of the coupling device CT may be (but are not limited to) 180 mm, 180 mm, and 50 mm, and the RJ45 connectors of the second terminal P2 and the third terminal P3 may be located on the same face of the cube. According to the embodiments, by modifying the coupling device CT, it is not limited to using an RJ45 connector, but can also be applied to other connectors, such as a Universal Serial Bus (USB) connector.

[0070] In summary, the radiation susceptibility testing method 300 and system 400 provided in the embodiments allow for initial measurement and calibration in the anechoic chamber 110. Subsequently, a signal generator SG can be used to generate a corresponding reference voltage Vi, which in turn generates a second voltage V'RS to simulate the interference and influence of radiated waves W on the device under test (EUT). Since repeated entry into the anechoic chamber 110 is no longer required, personnel health and safety are improved, equipment and time costs are reduced, and debugging and fault analysis are facilitated, which is helpful in addressing long-standing problems in this field. The radiation susceptibility testing method of this invention can be used for server testing to reduce electromagnetic interference, improve server stability and reliability, and make servers more suitable for artificial intelligence (AI) computing, edge computing, or as 5G servers, cloud servers, or vehicle-to-everything (V2X) servers.

[0071] The above description is only a preferred embodiment of the present invention. All equivalent changes and modifications made within the scope of the claims of the present invention should be included in the scope of the present invention.

Claims

1. A method for testing radiation sensitivity, characterized in that, Include: A radiation wave is emitted to a device under test; The device under test is measured to determine a first voltage based on the radiated wave; A reference voltage is output to a coupling device, so that the coupling device generates a second voltage according to the reference voltage; The reference voltage is adjusted so that the difference between the first voltage and the second voltage is no greater than 10% of the first voltage; Store the adjusted reference voltage; and The second voltage is output to the device under test according to the adjusted reference voltage to simulate the effect of the radiation wave on the device under test; The radiated wave has a first frequency, and the adjusted reference voltage corresponds to the first frequency; The method further includes: The radiated wave is adjusted from the first frequency to a second frequency to obtain the reference voltage corresponding to the second frequency.

2. The method for testing radiation sensitivity according to claim 1, characterized in that, The reference voltage is substantially positively correlated with the sum of the second voltage and a correction factor.

3. The method for testing radiation sensitivity according to claim 1, characterized in that, Also includes: A first control signal is accessed between the coupling device and a peripheral control device; Accessing a second control signal between a measuring device and the peripheral control device; and When the coupling device outputs the second voltage to the device under test, the measuring device measures the device under test to obtain a measurement result; The first control signal is related to the second control signal, the second control signal is related to the measurement result, and the measurement result corresponds to the effect of the radiation wave on the device under test.

4. A system for testing radiation sensitivity, characterized in that, Include: A coupling device includes a first terminal for receiving a reference voltage, a second terminal for outputting a second voltage corresponding to the first voltage according to the reference voltage, and a third terminal. A signal generator, coupled to the first terminal of the coupling device, is used to output the reference voltage; and A device under test is coupled to the second terminal of the coupling device to receive the second voltage; The first voltage can be measured when a radiation wave is applied to the device under test, and the reference voltage is set so that the second voltage is approximately equal to the first voltage to simulate the effect of the radiation wave on the device under test. The radiated wave has a first frequency, and the adjusted reference voltage corresponds to the first frequency; The system further includes: The radiated wave is adjusted from the first frequency to a second frequency to obtain the reference voltage corresponding to the second frequency.

5. The system for testing radiation sensitivity according to claim 4, characterized in that, Also includes: An external control device, coupled to the third terminal of the coupling device, is used to access a first control signal; and A measuring device is coupled between the peripheral control device and the device under test, for storing a second control signal between the measuring device and the peripheral control device, and for measuring the device under test to obtain a measurement result when the coupling device outputs the second voltage to the device under test; The first control signal is related to the second control signal, the second control signal is related to the measurement result, and the measurement result corresponds to the effect of the radiation wave on the device under test.

6. The system for testing radiation sensitivity according to claim 5, characterized in that, in: The peripheral control device includes a desktop computer, a server, a laptop computer, a tablet computer, and / or a computing device; and The measuring device includes an oscilloscope.

7. The system for testing radiation sensitivity according to claim 4, characterized in that, The device under test includes a network cable and a network connector.

8. The system for testing radiation sensitivity according to claim 4, characterized in that, The coupling device comprises: An SMA connector is coupled to the first end; A first RJ45 connector is coupled to the second end; A second RJ45 connector is coupled to the third terminal; and A choke circuit is coupled to the third terminal.

9. The system for testing radiation sensitivity according to claim 4, characterized in that, Also includes: An amplifier is coupled between the signal generator and the first terminal of the coupling device to amplify the reference voltage.

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