Chip exception processing method and device and related medium product

Abstract

Embodiments of the present application provide a chip exception processing method and device and related medium products, the method comprises: obtaining first running data of a chip; determining state information of the chip according to the first running data; if the state information is first exception state information, determining type information of the first exception state information; extracting first sub-running data corresponding to the type information from the first running data; performing exception analysis on the first sub-running data to obtain exception data; determining an exception factor corresponding to the exception data; determining exception processing information according to the exception factor; and performing exception processing on the chip according to the exception processing information, which can determine chip exceptions based on running data of the chip, perform exception processing according to running data, and thus improve the efficiency of exception processing on the chip.

Description

Technical Field

[0001] This application relates to the field of data processing technology, specifically to a method, apparatus, and related media products for handling chip anomalies. Background Technology

[0002] With the continuous development of chip technology, chips, as indispensable components in various electronic devices, have received increasing attention for their security performance. Chip security includes fault handling. Current solutions for handling chip anomalies typically involve reporting errors after an anomaly occurs and then manually processing the issue, resulting in low efficiency in handling chip anomalies. Summary of the Invention

[0003] This application provides a chip anomaly handling method, apparatus, and related media product, which can perform anomaly handling based on the chip's operating data when an anomaly is determined, thereby improving the efficiency of chip anomaly handling.

[0004] A first aspect of this application provides a method for handling exceptions in a chip, the method comprising:

[0005] Obtain the chip's initial operating data;

[0006] Based on the first operating data, determine the status information of the chip;

[0007] If the status information is a first abnormal status information, then determine the type information of the first abnormal status information;

[0008] Extract the first sub-run data corresponding to the type information from the first run data;

[0009] Anomaly analysis is performed on the first sub-run data to obtain abnormal data;

[0010] Determine the anomaly factor corresponding to the abnormal data;

[0011] The anomaly handling information is determined based on the anomaly factor;

[0012] The chip is subjected to anomaly handling based on the anomaly handling information.

[0013] In one possible implementation, determining the anomaly factor corresponding to the abnormal data includes:

[0014] Obtain the anomaly identification information from the abnormal data;

[0015] The anomaly type is determined by identifying the anomaly identifier information.

[0016] Extract an abnormal keyword set from the abnormal data based on the abnormal type;

[0017] Based on the set of abnormal keywords, determine the abnormal factor corresponding to the abnormal data.

[0018] In one possible implementation, determining the exception handling information based on the exception factor includes:

[0019] Determine the operating mode corresponding to the abnormal factor;

[0020] Based on the operating mode, determine the validity parameters of the abnormal status information;

[0021] If the validity parameter is a preset validity parameter, then the exception handling information is determined to be empty.

[0022] In one possible implementation, the method further includes:

[0023] Obtain the exception handling result of the chip based on the exception handling information;

[0024] If the exception handling result determines that the chip's operating state is a second exception state, then the chip's second operating data is obtained;

[0025] Obtain the second sub-run data of the preset field from the second run data;

[0026] The correction information is determined based on the second sub-run data;

[0027] The anomaly handling information is corrected based on the correction information to obtain the corrected anomaly handling information;

[0028] The chip is subjected to exception handling based on the corrected exception handling information.

[0029] A second aspect of this application provides an exception handling apparatus for a chip, the apparatus comprising:

[0030] The acquisition unit is used to acquire the chip's first operating data;

[0031] The first determining unit is configured to determine the state information of the chip based on the first operating data;

[0032] The second determining unit is used to determine the type information of the first abnormal state information if the state information is a first abnormal state information.

[0033] Extraction unit, used to extract first sub-running data corresponding to the type information from the first running data;

[0034] An analysis unit is used to perform anomaly analysis on the first sub-run data to obtain abnormal data;

[0035] The third determining unit is used to determine the abnormal factor corresponding to the abnormal data;

[0036] The fourth determining unit is used to determine the anomaly handling information based on the anomaly factor;

[0037] The processing unit is used to perform exception handling on the chip according to the exception handling information.

[0038] In one possible implementation, the third determining unit is used for:

[0039] Obtain the anomaly identification information from the abnormal data;

[0040] The anomaly type is determined by identifying the anomaly identifier information.

[0041] Extract an abnormal keyword set from the abnormal data based on the abnormal type;

[0042] Based on the set of abnormal keywords, determine the abnormal factor corresponding to the abnormal data.

[0043] In one possible implementation, regarding the determination of the anomaly handling information based on the anomaly factor, the fourth determining unit is configured to:

[0044] Determine the operating mode corresponding to the abnormal factor;

[0045] Based on the operating mode, determine the validity parameters of the abnormal status information;

[0046] If the validity parameter is a preset validity parameter, then the exception handling information is determined to be empty.

[0047] In one possible implementation, the device is further used for:

[0048] Obtain the exception handling result of the chip based on the exception handling information;

[0049] If the exception handling result determines that the chip's operating state is a second exception state, then the chip's second operating data is obtained;

[0050] Obtain the second sub-run data of the preset field from the second run data;

[0051] The correction information is determined based on the second sub-run data;

[0052] The anomaly handling information is corrected based on the correction information to obtain the corrected anomaly handling information;

[0053] The chip is subjected to exception handling based on the corrected exception handling information.

[0054] In one possible implementation, the device is further used for:

[0055] If the first abnormal status information is an off-chip abnormal information, then the correlation between the off-chip abnormal information and the chip is determined;

[0056] If the correlation degree is higher than the preset correlation degree, then extract the set of key abnormal information from the off-chip abnormal information;

[0057] Based on this set of key anomaly information, the type of parameters to be adjusted for the chip is determined;

[0058] Extract the parameters to be adjusted corresponding to the type of parameter to be adjusted;

[0059] If the parameter to be adjusted is within a preset abnormal range, then the parameter to be adjusted is adjusted.

[0060] A third aspect of this application provides a terminal including a processor, an input device, an output device, and a memory, wherein the processor, input device, output device, and memory are interconnected, wherein the memory is used to store a computer program, the computer program including program instructions, and the processor is configured to invoke the program instructions to execute the step instructions as described in the first aspect of this application.

[0061] A fourth aspect of this application provides a computer-readable storage medium storing a computer program for electronic data interchange, wherein the computer program causes a computer to perform some or all of the steps described in the first aspect of this application.

[0062] A fifth aspect of this application provides a computer program product, wherein the computer program product includes a non-transitory computer-readable storage medium storing a computer program operable to cause a computer to perform some or all of the steps described in the first aspect of this application. The computer program product may be a software installation package.

[0063] Implementing the embodiments of this application has at least the following beneficial effects:

[0064] By acquiring the chip's first operating data, determining the chip's status information based on the first operating data, and if the status information is a first abnormal status information, determining the type information of the first abnormal status information, extracting the first sub-operating data corresponding to the type information from the first operating data, performing anomaly analysis on the first sub-operating data to obtain abnormal data, determining the anomaly factor corresponding to the abnormal data, determining the anomaly handling information based on the anomaly factor, and performing anomaly handling on the chip based on the anomaly handling information, the efficiency of chip anomaly handling can be improved when an anomaly is determined based on the chip's operating data. Attached Figure Description

[0065] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0066] Figure 1 This application provides a flowchart illustrating a chip exception handling method according to an embodiment of the present application.

[0067] Figure 2 This application provides a flowchart illustrating another chip exception handling method.

[0068] Figure 3 This application provides a flowchart illustrating another chip exception handling method.

[0069] Figure 4 This is a schematic diagram of the structure of a terminal provided in an embodiment of this application;

[0070] Figure 5 This application provides a schematic diagram of the structure of an exception handling device for a chip. Detailed Implementation

[0071] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0072] The terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0073] In this application, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described in this application can be combined with other embodiments.

[0074] Please see Figure 1 , Figure 1 This application provides a flowchart illustrating a chip exception handling method according to an embodiment. Figure 1 As shown, the exception handling method of this chip is applied to the terminal, and the method includes:

[0075] 101. Obtain the chip's first operating data.

[0076] When acquiring the first operating data of the chip, it can be retrieved from the chip's storage address, obtained from the internet, or acquired through input. This first operating data can be the operating data of a chip in the terminal or another terminal; no specific limitation is made here.

[0077] 102. Determine the status information of the chip based on the first operating data.

[0078] The chip's state information can be determined by extracting state indication information from the first operating data. Alternatively, the chip's state can be evaluated based on the first operating data to obtain state information. This state evaluation can be performed using a pre-defined state evaluation model. Specifically, for example, a portion of the first operating data can be extracted and analyzed using the state evaluation model to obtain state information. This state evaluation model is a pre-trained model designed for evaluating the chip's state.

[0079] 103. If the status information is a first abnormal status information, then determine the type information of the first abnormal status information.

[0080] The type of the first abnormal status information can be determined based on the type identifier in the first abnormal status information. Alternatively, keywords can be extracted from the first abnormal status information to obtain a keyword set, and the type information can be determined based on this keyword set. One abnormal type can correspond to multiple keywords, thus the type of the first abnormal status information can be determined based on the keywords in the keyword set. In subsequent processing, different types can correspond to different processing information, etc.

[0081] 104. Based on the type information and the first running data, determine the exception handling information corresponding to the chip.

[0082] Sub-running data corresponding to this type of information can be extracted from the first running data, and anomaly factors obtained by anomaly analysis of this sub-running data can be used to determine anomaly handling information. Therefore, the anomaly handling information is adapted to this type of information, thereby improving the accuracy of anomaly handling.

[0083] 105. Perform anomaly handling on the chip according to the anomaly handling information.

[0084] It can process abnormal parameters and states based on abnormal handling information, thereby realizing abnormal handling based on running parameters.

[0085] In this example, by acquiring the first operating data of the chip, the state information of the chip is determined based on the first operating data. If the state information is a first abnormal state information, the type information of the first abnormal state information is determined. Based on the type information and the first operating data, the abnormal handling information corresponding to the chip is determined. The chip is then subjected to abnormal handling based on the abnormal handling information. Therefore, when a chip abnormality is determined based on the chip's operating data, abnormal handling can be performed based on the operating data, thereby improving the efficiency of abnormal handling of the chip.

[0086] In one possible implementation, a method for determining the exception handling information corresponding to the chip based on the type information and the first operating data includes:

[0087] A1. Extract the first sub-run data corresponding to the type information from the first run data;

[0088] A2. Perform anomaly analysis on the first sub-run data to obtain abnormal data;

[0089] A3. Determine the abnormal factors corresponding to the abnormal data;

[0090] A4. Determine the anomaly handling information based on the anomaly factor.

[0091] Different types of information correspond to different fields of running data, so the first sub-running data can be extracted from the fields corresponding to the type of information.

[0092] Keyword extraction can be performed on the first sub-run data to obtain a keyword set. Anomaly analysis can then be conducted based on the keywords in this set to identify anomalous data. A general keyword extraction algorithm can be used to extract the keywords from the first sub-run data. Anomaly analysis can then be performed by comparing the keywords within the keyword set across different ranges. Specifically, this could involve determining whether a keyword falls within a normal operating parameter range. If it does, the keyword is considered normal data; otherwise, it is considered anomalous data.

[0093] Anomaly factors can be identified based on anomaly identifiers in the abnormal data. Different anomaly factors correspond to different anomaly handling information, thus allowing the determination of the corresponding anomaly handling information. Alternatively, anomaly handling information can be determined based on the operating mode corresponding to the anomaly factor. For example, if the operating mode is disabled, the anomaly handling information can be empty, meaning that even if an anomaly occurs, no anomaly handling will be performed.

[0094] Another specific method for determining anomaly handling information based on anomaly factors can be as follows: if there are multiple anomaly factors, determine the sub-anomaly handling information corresponding to each of the multiple anomaly factors; obtain the correlation information between the multiple anomaly factors; determine the order information between the sub-anomaly handling information of the anomaly factors and the connection information between adjacent sub-anomaly handling information based on the correlation information between the multiple anomaly factors; combine and process the sub-anomaly handling information corresponding to the multiple anomaly factors based on the order information and the connection information to obtain the anomaly handling information.

[0095] One method for determining sub-anomaly handling information corresponding to multiple anomaly factors is as follows: different anomaly factors correspond to different anomaly handling information, thus determining the sub-anomaly handling information corresponding to that anomaly factor; alternatively, the sub-anomaly handling information can be determined based on the operating mode corresponding to the anomaly factor. When the operating mode is disabled, the anomaly handling information can be empty, which can be understood as meaning that even if an anomaly exists, no anomaly handling is performed. After determining the sub-anomaly handling information, since there may be correlations between multiple anomaly factors, anomaly handling needs to be performed according to these correlations to achieve more precise anomaly handling. This also allows anomaly handling and anomaly testing to be performed simultaneously. That is, after performing one anomaly handling operation, the previous anomaly can be tested while performing the next anomaly handling operation, thus eliminating the need to perform anomaly testing after all anomaly handling operations are completed, improving efficiency. The connection information between sub-exception handling information can be understood as the content that needs to be connected after the sub-exception handling information has been processed. For example, after a sub-exception handling information is completed, whether initialization, state change, etc. are required during subsequent exception handling. By identifying the above information as the connection content, the sub-exception handling information can be combined to obtain the exception handling information, thereby improving the accuracy of the exception handling information determination.

[0096] In this example, abnormal data is obtained by performing anomaly analysis on the first sub-run data corresponding to the type information, and the anomaly handling information is determined based on the anomaly factors determined by the abnormal data. This allows for the rapid determination of the anomaly handling information and improves the efficiency of obtaining the anomaly handling information.

[0097] In one possible implementation, a possible method for determining the anomaly factor corresponding to the anomalous data includes:

[0098] B1. Obtain the anomaly identification information from the abnormal data;

[0099] B2. Based on the anomaly identification information, identify the anomaly type to obtain the anomaly type;

[0100] B3. Extract the set of abnormal keywords from the abnormal data according to the abnormal type;

[0101] B4. Based on the set of abnormal keywords, determine the abnormal factor corresponding to the abnormal data.

[0102] Specific identification information can be identified to obtain anomaly identification information from abnormal data. Different anomalies are reflected by corresponding anomaly identification information, which can then be extracted. For example, data in fixed fields within abnormal data can be identified as anomaly identification information. Different anomaly identification information corresponds to different anomaly types, thus allowing the identification of the anomaly type corresponding to that specific identification information.

[0103] Since anomaly identification information can be one or multiple, after determining the anomaly type based on the anomaly identification information, a comprehensive set of anomaly keywords can be obtained from the anomaly data based on that anomaly type. Specifically, for example, the anomaly type indicated by the anomaly identification information may also include anomaly keywords other than those indicated by the anomaly identification information. Therefore, it is necessary to obtain these additional anomaly keywords from the anomaly data for a more comprehensive anomaly analysis and to identify the anomaly factors.

[0104] Abnormal keywords correspond to abnormal factors, so the abnormal factors can be obtained based on the abnormal keywords in the abnormal keyword set.

[0105] In this example, the anomaly type is determined by the anomaly identification information, and a more comprehensive set of anomaly keywords is extracted from the anomaly data based on the anomaly type, thereby determining the anomaly factor and improving the accuracy of anomaly factor acquisition.

[0106] In one possible implementation, a possible method for determining the anomaly handling information based on the anomaly factor includes:

[0107] C1. Determine the operating mode corresponding to the abnormal factor;

[0108] C2. Determine the validity parameters of the abnormal status information based on the operating mode;

[0109] C3. If the validity parameter is a preset validity parameter, then the exception handling information is determined to be empty.

[0110] Different anomalies can correspond to different operating modes. For example, when the memory ECC fails, the operating mode includes whether it is enabled or not. The operating mode for power supply and temperature anomalies also includes whether it is enabled or not. If the operating mode is disabled, the validity parameters of the anomaly status information are invalid; if the operating mode is enabled, the validity parameters of the anomaly status information are valid. When the default validity parameters are invalid, the anomaly handling information is set to null, thus not processing the anomaly. This reduces system overhead and improves system performance.

[0111] In one possible implementation, the exception handling result can also be analyzed. If the exception handling result fails to completely resolve the exception, the exception handling information can be corrected, and exception handling can be performed based on the corrected exception handling information, as follows:

[0112] D1. Obtain the exception handling result of the chip based on the exception handling information;

[0113] D2. If the exception handling result determines that the chip's operating state is a second exception state, then obtain the chip's second operating data;

[0114] D3. Obtain the second sub-run data of the preset field from the second run data;

[0115] D4. Determine the correction information based on the second sub-run data;

[0116] D5. Correct the anomaly handling information according to the correction information to obtain the corrected anomaly handling information;

[0117] D6. Perform exception handling on the chip according to the corrected exception handling information.

[0118] The preset fields are set using empirical values ​​or historical data. The method for determining the correction information for the second sub-run data can be as follows: offset the second sub-run data with the expected run data corresponding to the anomaly handling information to obtain offset information; then, determine the correction information based on this offset information. Alternatively, the method of calculating the offset between the second sub-run data and the expected run data corresponding to the anomaly handling information can be achieved by performing a difference operation on the data values ​​of the second sub-run data and the expected run data. Different offset information intervals correspond to different correction information, thus allowing the correction information to be determined based on the offset information interval in which the offset information is located.

[0119] The method for correcting the anomaly handling information based on the correction information to obtain corrected anomaly handling information can be as follows: The correction information and the anomaly handling information can be superimposed to obtain the corrected anomaly handling information; alternatively, the weighted result of the calculation of the data in the correction information and the anomaly handling information can be used to determine the corrected anomaly handling information. Specifically, the weighted result of the calculation of the data in the correction information and the anomaly handling information can be obtained by extracting the weight values ​​corresponding to the correction information and the anomaly handling information, and then performing a weighted calculation based on these weight values ​​to obtain the weighted result.

[0120] In this example, if the situation remains abnormal after handling the exception based on the exception handling information, the second running data corresponding to the abnormal situation can be extracted, and the correction information can be determined based on the second running data. The exception handling information can then be corrected to obtain the corrected exception handling information. The exception handling can then be performed again using the corrected exception handling information, thereby improving the reliability of exception handling.

[0121] In one possible implementation, if the first abnormal state information determined by the first running data is an off-chip abnormal information, then the abnormality can also be handled by the following method:

[0122] E1. If the first abnormal status information is an off-chip abnormal information, then determine the correlation between the off-chip abnormal information and the chip.

[0123] E2. If the correlation degree is higher than the preset correlation degree, then extract the set of key abnormal information from the off-chip abnormal information;

[0124] E3. Based on this set of key anomaly information, determine the type of parameters to be adjusted for the chip;

[0125] E4. Extract the parameters to be adjusted corresponding to the type of parameter to be adjusted;

[0126] E5. If the parameter to be adjusted is in a preset abnormal range, then the parameter to be adjusted shall be adjusted.

[0127] External anomaly information can be understood as anomalies not originating from the chip itself, but from components associated with the chip. Therefore, the set of key anomalies can be determined based on the correlation between external anomaly information and the chip. Since external anomaly information may include multiple categories of anomalies, the correlation between external anomaly information and the chip can be extracted. This correlation can be understood as the degree of impact of the external anomaly information on the normal operation of the chip; the greater the impact, the higher the correlation, and vice versa.

[0128] The preset correlation degree is set through empirical values ​​or historical data. The method for extracting the set of key anomaly information from the off-chip anomaly information can be to extract it by the individual correlation degree between the sub-anomaly information in the off-chip anomaly information and the chip. Anomaly information with an individual correlation degree exceeding the second correlation degree is identified as key anomaly information, thereby obtaining the set of key anomaly information.

[0129] Different sets of key anomaly information can correspond to different types of parameters to be adjusted, thus allowing the chip's parameter types to be identified. These parameter types include multiple parameters to be adjusted. If a parameter is within a preset anomaly range, it is adjusted to a preset normal operating range, thereby achieving the adjustment of the parameter and reducing the chip's risk.

[0130] Please see Figure 2 , Figure 2 This application provides a schematic flowchart of another chip exception handling method for embodiments of the present application. Figure 2 As shown, the method includes:

[0131] 201. Obtain the chip's first operating data;

[0132] 202. Determine the status information of the chip based on the first operating data;

[0133] 203. If the status information is a first abnormal status information, then determine the type information of the first abnormal status information;

[0134] 204. Extract the first sub-running data corresponding to the type information from the first running data;

[0135] 205. Perform anomaly analysis on the first sub-run data to obtain abnormal data;

[0136] 206. Determine the anomaly factor corresponding to the abnormal data;

[0137] 207. Determine the anomaly handling information based on the aforementioned anomaly factors;

[0138] 208. Perform anomaly handling on the chip according to the anomaly handling information;

[0139] 209. If the first abnormal status information is an off-chip abnormal information, then determine the correlation between the off-chip abnormal information and the chip;

[0140] 210. If the correlation degree is higher than the preset correlation degree, then extract the set of key abnormal information from the off-chip abnormal information;

[0141] 211. Based on the set of key anomaly information, determine the type of parameters to be adjusted for the chip;

[0142] 212. Extract the parameters to be adjusted corresponding to the type of parameter to be adjusted;

[0143] 213. If the parameter to be adjusted is in a preset abnormal range, then the parameter to be adjusted shall be adjusted.

[0144] In this example, different sets of key anomaly information can correspond to different types of parameters to be adjusted, thus allowing the chip's parameter types to be determined. These parameter types include multiple parameters to be adjusted. If a parameter is within a preset anomaly range, it is adjusted to a preset normal operating range, thereby achieving the adjustment of the parameter and reducing the chip's risk.

[0145] Please see Figure 3 , Figure 3 This application provides a schematic flowchart of another chip exception handling method for embodiments of the present application. Figure 3 As shown, the method includes:

[0146] 301. Obtain the chip's first operating data;

[0147] 302. Determine the status information of the chip based on the first operating data;

[0148] 303. If the status information is a first abnormal status information, then determine the type information of the first abnormal status information;

[0149] 304. Based on the type information and the first operating data, determine the exception handling information corresponding to the chip;

[0150] 305. Perform anomaly handling on the chip according to the anomaly handling information;

[0151] 306. Obtain the exception handling result of the chip based on the exception handling information;

[0152] 307. If the exception handling result determines that the chip's operating state is a second exception state, then the second operating data of the chip is obtained;

[0153] 308. Obtain the second sub-run data of the preset field from the second run data;

[0154] 309. Determine correction information based on the second sub-run data;

[0155] 310. Correct the anomaly handling information according to the correction information to obtain the corrected anomaly handling information;

[0156] 311. Perform anomaly processing on the chip based on the corrected anomaly processing information.

[0157] In this example, if the situation remains abnormal after handling the exception based on the exception handling information, the second running data corresponding to the abnormal situation can be extracted, and the correction information can be determined based on the second running data. The exception handling information can then be corrected to obtain the corrected exception handling information. The exception handling can then be performed again using the corrected exception handling information, thereby improving the reliability of exception handling.

[0158] For examples consistent with the above embodiments, please refer to... Figure 4 , Figure 4 A schematic diagram of a terminal structure provided in an embodiment of this application is shown in the figure. It includes a chip and a memory, which are interconnected. The memory is used to store a computer program, which includes program instructions. The chip is configured to call the program instructions. The program includes instructions for performing the following steps.

[0159] Obtain the chip's initial operating data;

[0160] Based on the first operating data, determine the status information of the chip;

[0161] If the status information is a first abnormal status information, then determine the type information of the first abnormal status information;

[0162] Extract the first sub-run data corresponding to the type information from the first run data;

[0163] Anomaly analysis is performed on the first sub-run data to obtain abnormal data;

[0164] Determine the anomaly factor corresponding to the abnormal data;

[0165] The anomaly handling information is determined based on the anomaly factor;

[0166] The chip is subjected to anomaly handling based on the anomaly handling information.

[0167] The above mainly describes the solutions of the embodiments of this application from the perspective of the method execution process. It is understood that, in order to achieve the above functions, the terminal includes the corresponding hardware structure and / or software modules for executing each function. Those skilled in the art should readily recognize that, in conjunction with the units and algorithm steps of the various examples described in the embodiments provided herein, this application can be implemented in hardware or a combination of hardware and computer software. Whether a function is executed in hardware or by computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0168] This application embodiment can divide the terminal into functional units according to the above method example. For example, each function can be divided into a separate functional unit, or two or more functions can be integrated into one processing unit. The integrated unit can be implemented in hardware or as a software functional unit. It should be noted that the unit division in this application embodiment is illustrative and only represents one logical functional division. In actual implementation, there may be other division methods.

[0169] For those consistent with the above, please refer to Figure 5 , Figure 5 This application provides a schematic diagram of the structure of a chip exception handling device according to an embodiment of the present application. Figure 5 As shown, the device includes:

[0170] Acquisition unit 501 is used to acquire the chip's first operating data;

[0171] The first determining unit 502 is used to determine the status information of the chip based on the first operating data;

[0172] The second determining unit 503 is used to determine the type information of the first abnormal state information if the state information is a first abnormal state information.

[0173] Extraction unit 504 is used to extract first sub-running data corresponding to the type information from the first running data;

[0174] Analysis unit 505 is used to perform anomaly analysis on the first sub-run data to obtain abnormal data;

[0175] The third determining unit 506 is used to determine the abnormal factor corresponding to the abnormal data;

[0176] The fourth determining unit 507 is used to determine the anomaly handling information based on the anomaly factor;

[0177] The processing unit 508 is used to perform abnormal processing on the chip according to the abnormal processing information.

[0178] In one possible implementation, the third determining unit 506 is used for:

[0179] Obtain the anomaly identification information from the abnormal data;

[0180] The anomaly type is determined by identifying the anomaly identifier information.

[0181] Extract an abnormal keyword set from the abnormal data based on the abnormal type;

[0182] Based on the set of abnormal keywords, determine the abnormal factor corresponding to the abnormal data.

[0183] In one possible implementation, regarding the determination of the anomaly handling information based on the anomaly factor, the fourth determining unit 507 is configured to:

[0184] Determine the operating mode corresponding to the abnormal factor;

[0185] Based on the operating mode, determine the validity parameters of the abnormal status information;

[0186] If the validity parameter is a preset validity parameter, then the exception handling information is determined to be empty.

[0187] In one possible implementation, the device is further used for:

[0188] Obtain the exception handling result of the chip based on the exception handling information;

[0189] If the exception handling result determines that the chip's operating state is a second exception state, then the chip's second operating data is obtained;

[0190] Obtain the second sub-run data of the preset field from the second run data;

[0191] The correction information is determined based on the second sub-run data;

[0192] The anomaly handling information is corrected based on the correction information to obtain the corrected anomaly handling information;

[0193] The chip is subjected to exception handling based on the corrected exception handling information.

[0194] In one possible implementation, the device is further used for:

[0195] If the first abnormal status information is an off-chip abnormal information, then the correlation between the off-chip abnormal information and the chip is determined;

[0196] If the correlation degree is higher than the preset correlation degree, then extract the set of key abnormal information from the off-chip abnormal information;

[0197] Based on this set of key anomaly information, the type of parameters to be adjusted for the chip is determined;

[0198] Extract the parameters to be adjusted corresponding to the type of parameter to be adjusted;

[0199] If the parameter to be adjusted is within a preset abnormal range, then the parameter to be adjusted is adjusted.

[0200] This application also provides a computer storage medium that stores a computer program for electronic data interchange, which causes a computer to perform some or all of the steps of an exception handling method for any chip described in the above method embodiments.

[0201] This application also provides a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program that causes a computer to perform some or all of the steps of any of the chip exception handling methods described in the above method embodiments.

[0202] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0203] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0204] In the several embodiments provided in this application, it should be understood that the disclosed apparatus can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical or other forms.

[0205] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0206] Furthermore, the functional units in the various embodiments of the application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software program module.

[0207] If the integrated unit is implemented as a software program module and sold or used as an independent product, it can be stored in a computer-readable storage device (CMD). Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned memory includes various media capable of storing program code, such as USB flash drives, read-only memory (ROM), random access memory (RAM), portable hard drives, magnetic disks, or optical disks.

[0208] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage device, which may include: a flash drive, a read-only memory, a random access memory, a magnetic disk, or an optical disk, etc.

[0209] The embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method for handling chip anomalies, characterized in that, The method includes: Obtain the chip's initial operating data; Based on the first operating data, determine the status information of the chip; If the status information is a first abnormal status information, then determine the type information of the first abnormal status information; Extract the first sub-run data corresponding to the type information from the first run data; Anomaly analysis is performed on the first sub-run data to obtain abnormal data; Determine the anomaly factor corresponding to the abnormal data; Based on the aforementioned anomaly factors, determine the anomaly handling information; The chip is subjected to anomaly processing based on the anomaly processing information; Obtain the exception handling result of the chip based on the exception handling information; If the chip's operating state is determined to be a second abnormal state based on the abnormality handling result, then the chip's second operating data is obtained; Obtain the second sub-run data of the preset field from the second run data; The correction information is determined based on the second sub-run data; The anomaly handling information is corrected based on the correction information to obtain the corrected anomaly handling information; The chip is subjected to exception handling based on the corrected exception handling information.

2. The method according to claim 1, characterized in that, The determination of the anomaly factor corresponding to the abnormal data includes: Obtain the anomaly identification information from the abnormal data; The anomaly type is determined by identifying the anomaly identifier information. Extract an abnormal keyword set from the abnormal data based on the abnormal type; Based on the set of abnormal keywords, determine the abnormal factors corresponding to the abnormal data.

3. The method according to claim 1 or 2, characterized in that, The step of determining the anomaly handling information based on the anomaly factor includes: Determine the operating mode corresponding to the abnormal factor; Based on the operating mode, determine the validity parameters of the abnormal status information; If the validity parameter is a preset validity parameter, then the exception handling information is determined to be empty.

4. The method according to claim 3, characterized in that, The method further includes: If the first abnormal status information is an off-chip abnormal information, then the correlation between the off-chip abnormal information and the chip is determined; If the correlation degree is higher than the preset correlation degree, then extract the set of key abnormal information from the off-chip abnormal information; Based on this set of key anomaly information, the type of parameters to be adjusted for the chip is determined; Extract the parameters to be adjusted corresponding to the type of parameter to be adjusted; If the parameter to be adjusted is within a preset abnormal range, then the parameter to be adjusted is adjusted.

5. An anomaly handling device for a chip, characterized in that, The device includes: The acquisition unit is used to acquire the chip's first operating data; The first determining unit is configured to determine the state information of the chip based on the first operating data; The second determining unit is used to determine the type information of the first abnormal state information if the state information is a first abnormal state information. Extraction unit, used to extract first sub-running data corresponding to the type information from the first running data; An analysis unit is used to perform anomaly analysis on the first sub-run data to obtain abnormal data; The third determining unit is used to determine the abnormal factor corresponding to the abnormal data; The fourth determining unit is used to determine anomaly handling information based on the anomaly factor; A processing unit is configured to: perform exception handling on the chip according to the exception handling information; obtain the exception handling result of performing exception handling on the chip according to the exception handling information; if the chip's operating state is determined to be a second exception state according to the exception handling result, then obtain the chip's second operating data; obtain second sub-operating data of a preset field from the second operating data; determine correction information according to the second sub-operating data; perform correction processing on the exception handling information according to the correction information to obtain corrected exception handling information; and perform exception handling on the chip according to the corrected exception handling information.

6. The apparatus according to claim 5, characterized in that, The third determining unit is used for: Obtain the anomaly identification information from the abnormal data; The anomaly type is determined by identifying the anomaly identifier information. Extract an abnormal keyword set from the abnormal data based on the abnormal type; Based on the set of abnormal keywords, determine the abnormal factors corresponding to the abnormal data.

7. The apparatus according to claim 5 or 6, characterized in that, The fourth determining unit is used for: Determine the operating mode corresponding to the abnormal factor; Based on the operating mode, determine the validity parameters of the abnormal status information; If the validity parameter is a preset validity parameter, then the exception handling information is determined to be empty.

8. A terminal, characterized in that, The device includes a chip and a memory interconnected thereto, wherein the memory is used to store a computer program, the computer program including program instructions, and the chip is configured to invoke the program instructions to perform the method as described in any one of claims 1-4.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, the computer program including program instructions that, when executed by the chip, cause the processor to perform the method as described in any one of claims 1-4.

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