电镜图像处理方法、装置、电子设备及存储介质

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By performing rasterization and three-dimensional surface analysis on electron microscope images, the problem of ice debris noise in electron microscope images was solved, and accurate classification and differentiation of different information was achieved.

CN115810076BActive Publication Date: 2026-07-17SHUIMU FUTURE (HANGZHOU) TECH CO LTD +1

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Patent Information

Authority / Receiving Office: CN · China
Patent Type: Patents(China)
Current Assignee / Owner: SHUIMU FUTURE (HANGZHOU) TECH CO LTD
Filing Date: 2022-11-24
Publication Date: 2026-07-17

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Abstract

本公开涉及一种电镜图像处理方法、装置、电子设备及存储介质，通过对目标电镜图像进行栅格化处理，得到多个网格区域。根据每个网格区域中的像素值确定目标电镜图像对应的三维曲面并提取三维曲面中的局部极点。根据基准平面和每个局部极点绘制三维曲面的等高线图，根据等高线图确定目标电镜图像中不同的图像信息所在位置，图像信息包括颗粒特征、图像背景和其他干扰信息。本公开通过对电镜图像进行栅格化处理生成三维曲面，再基于三维曲面的等高线图准确的确定电镜图像中不同类别信息所在的位置，实现了对电镜图像中信息的像素级分类。

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