一种应用于SSD的PCIe Reset测试方法、系统及存储介质
By comprehensively covering the testing methods for four PCIe reset methods—Cold Reset, Warm Reset, Hot Reset, and FLR—the problem of incomplete testing items in existing technologies is solved, ensuring the stability and reliability of SSDs under different operating conditions.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD
- Filing Date
- 2022-11-18
- Publication Date
- 2026-07-17
AI Technical Summary
Existing PCIe Reset testing technologies mainly target power-off testing and hot-plug testing methods for Cold Reset, and the test items are not comprehensive enough to cover testing of multiple PCIe Reset methods.
This paper provides a PCIe Reset testing method for SSDs, which comprehensively covers four PCIe Reset methods: Cold Reset, Warm Reset, Hot Reset, and FLR. By obtaining SSD information, selecting a pre-operation method, and traversing different PCIe Reset combinations in multiple rounds of testing, the method checks the SSD status and archives the test results.
It enables comprehensive testing of various PCIe Reset methods, ensuring the stability and reliability of SSDs under different operating conditions, and improving the completeness and coverage of the tests.
Smart Images
Figure CN115827345B_ABST