A comprehensive reliability test device for nuclear-grade valves
By designing a comprehensive reliability testing device for nuclear-grade valves, rapid hot and cold switching and convenient replacement of test pieces were achieved, solving the problems of low hot and cold switching rate and difficulty in replacing test pieces in existing technologies, thereby improving testing efficiency and reducing costs.
Patent Information
- Application Number
- CN202211618113.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-15
- Publication Date
- 2026-01-27
- Estimated Expiration
- 2042-12-15
AI Technical Summary
Existing nuclear-grade valve testing equipment has a low rate of hot-cold switching under complex operating conditions, long testing cycles, and difficulty in replacing test pieces, making it difficult to meet the requirements of new reactor types.
Design a comprehensive reliability test device for nuclear-grade valves, including a main circuit, a test system, and an intermediate test intervention system, which are set in parallel. The system can operate independently or in combination by controlling the valves. Combined with a swing stress loading device, a vibration stress and environmental temperature and humidity loading device, it can achieve rapid switching and component replacement.
It enables rapid switching between hot and cold modes and convenient replacement of test specimens, improving testing efficiency and reducing construction and testing costs.
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Figure CN115839840B_ABST
Abstract
Citation Information
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