Test loop operating pressure control method, apparatus, device, and readable storage medium

Abstract

The application provides a test loop operating pressure control method, device, equipment and readable storage medium, which comprises the following steps: obtaining the operating pressure of a pressure stabilizer in a test loop; calculating the pressure deviation between the operating pressure and a set pressure, and judging whether the pressure deviation is within a set deviation range; if the pressure deviation is within the deviation range, keeping the heating power of the pressure stabilizer unchanged; if the pressure deviation is outside the deviation range and the change trend of the operating pressure meets a preset adjustment condition, calculating a power correction value positively correlated with the pressure deviation according to the operating pressure and the pressure deviation, and adjusting the heating power of the pressure stabilizer to a new heating power according to the power correction value. The application can adaptively adjust the heating power according to the actual size of the pressure deviation when adjusting the operating pressure of the test loop, so as to keep the operating pressure of the test loop in a stable state as much as possible and avoid frequent fluctuations.

Description

Technical Field

[0001] This invention relates to the field of test loop operation control, and in particular to a test loop operation pressure control method, apparatus, equipment, and readable storage medium. Background Technology

[0002] High-temperature and high-pressure test circuits are mainly used for hot-state performance tests of equipment such as pumps and valves. They typically employ electric heating regulators to maintain a constant system pressure. Since the regulator dissipates heat into the environment, the heating output of the electric heater needs to be adjusted to keep the system pressure constant.

[0003] Traditional pressure control methods rely on logic control, stopping heating when the pressure exceeds the upper limit and activating the electric heater when it falls below the lower limit. While this method is logically simple, it causes frequent pressure fluctuations within the test circuit within a certain range, and the rate of pressure change is rapid. This frequent alternating pressure can lead to fatigue damage to the test circuit system equipment and pipelines, affecting both the safety of the high-temperature, high-pressure test circuit operation and reducing its service life and the quality of pressure control. Summary of the Invention

[0004] The main objective of this invention is to provide a method, apparatus, device, and readable storage medium for controlling the operating pressure of a test circuit, aiming to solve the problem of frequent fluctuations in test circuit pressure within a certain range in related technologies.

[0005] In a first aspect, the present invention provides a method for controlling the operating pressure of a test circuit.

[0006] A method for controlling the operating pressure of a test circuit, comprising:

[0007] Obtain the operating pressure of the voltage regulator in the test circuit;

[0008] Calculate the pressure deviation between the operating pressure and the set pressure, and determine whether the pressure deviation is within the set deviation range;

[0009] If the pressure deviation is within the deviation range, the heating power of the voltage regulator remains unchanged;

[0010] If the pressure deviation is outside the deviation range and the trend of the operating pressure meets the preset adjustment conditions, a power correction value that is positively correlated with the pressure deviation is calculated based on the operating pressure and the pressure deviation, and the heating power of the voltage regulator is adjusted to a new heating power based on the power correction value, so that the operating pressure approaches the set pressure at a rate that is positively correlated with the pressure deviation.

[0011] In some embodiments, the adjustment conditions include the operating pressure changing trend gradually moving away from the design pressure;

[0012] If the pressure deviation is outside the deviation range and the operating pressure changes gradually towards the set pressure, the heating power of the voltage regulator remains unchanged.

[0013] In some embodiments, calculating a power correction value that is positively correlated with the pressure deviation based on the operating pressure and the pressure deviation includes:

[0014] The operating temperature of the voltage regulator is obtained based on the operating pressure, and the target correction value of the voltage regulator heating power is calculated based on the operating temperature and the set temperature.

[0015] Determine whether the target correction value is within the set limit correction range;

[0016] If it is in the state where the power correction value is the target correction value;

[0017] If not, the power correction value is the parameter value that is closest to the target correction value within the defined correction range.

[0018] In some embodiments, the defined correction range is obtained based on the set pressure, the set pressure deviation limit, the set temperature, the set ambient temperature, and the set voltage regulator heat dissipation power.

[0019] In some embodiments, the step of adjusting the regulator heating power to a new heating power according to the power correction value involves adjusting the regulator heating power to a new heating power based on the power correction value, the pressure deviation, and the set maximum heating power, while ensuring that the new heating power is within the range between zero and the maximum heating power.

[0020] In some embodiments, adjusting the voltage regulator heating power to a new heating power based on the power correction value, the pressure deviation, and the set maximum heating power, and ensuring that the new heating power is within the range between zero and the maximum heating power, includes:

[0021] If the operating pressure is lower than the deviation range, the heating power is calculated based on the preset first algorithm, the power correction value, and the set maximum heating power, and the voltage regulator heating power is adjusted to the smaller value between the calculated heating power and the maximum heating power.

[0022] If the operating pressure is higher than the deviation range, the heating power is calculated based on the preset second algorithm, the power correction value, and the set maximum heating power, and the voltage regulator heating power is adjusted to the larger of the heating power calculated value and zero.

[0023] In some embodiments, the initial heating power of the voltage regulator is the set heat dissipation power of the voltage regulator.

[0024] Secondly, the present invention also provides a test circuit operating pressure control device.

[0025] A test circuit operating pressure control device, comprising:

[0026] The acquisition module is configured to acquire the current operating pressure of the voltage regulator;

[0027] The judgment module is configured to calculate the pressure deviation between the operating pressure and the set pressure, and to determine whether the pressure deviation is within the set pressure deviation range.

[0028] The control module is configured to maintain the regulator heating power unchanged if the pressure deviation is within the pressure deviation range; if the pressure deviation is outside the pressure deviation range and meets the preset adjustment conditions, calculate a power correction value that is positively correlated with the pressure deviation based on the changing trend of the operating pressure and the pressure deviation, and adjust the regulator heating power to a new heating power based on the power correction value, so that the operating pressure approaches the design pressure at a rate that is positively correlated with the pressure deviation.

[0029] Thirdly, the present invention also provides a test circuit operating pressure control device.

[0030] A test loop operating pressure control device includes a processor, a memory, and a test loop operating pressure control program stored in the memory and executable by the processor. When the test loop operating pressure control program is executed by the processor, it implements the steps of the test loop operating pressure control method as described above.

[0031] Fourthly, the present invention also provides a readable storage medium.

[0032] A readable storage medium, characterized in that the readable storage medium stores a test loop operating pressure control program, wherein when the test loop operating pressure control program is executed by a processor, it implements the steps of the test loop operating pressure control method as described above.

[0033] This invention addresses the issue of adjusting the voltage regulator's heating power when the operating pressure of a test circuit experiences significant fluctuations, specifically when the pressure deviation from the set pressure falls outside a predetermined range. Based on preset adjustment conditions, it determines whether the voltage regulator's heating power needs adjustment. If the adjustment conditions are met, a power correction value positively correlated with the pressure deviation is calculated, and the voltage regulator's heating power is adjusted accordingly. Ultimately, under gradually changing heating power, the operating pressure approaches the set pressure at a rate positively correlated with the pressure deviation. This invention allows for adaptive adjustment of the heating power based on the actual magnitude of the pressure deviation when adjusting the test circuit's operating pressure. When the pressure deviation is large, the operating pressure is changed more quickly to approach the normal pressure range. When the pressure deviation is small, the operating pressure is changed more slowly to more stably enter the normal pressure range. When the operating pressure is within the normal pressure range, the heating power is kept constant to maintain a stable operating pressure in the test circuit and prevent frequent fluctuations. Attached Figure Description

[0034] Figure 1 This is a schematic diagram of the hardware structure of the test loop operating pressure control device involved in the embodiment of the present invention;

[0035] Figure 2 This is a flowchart illustrating the first embodiment of the test loop operating pressure control method of the present invention;

[0036] Figure 3 This is a schematic diagram of the functional modules of the first embodiment of the test circuit operating pressure control device of the present invention.

[0037] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0038] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0039] High-temperature and high-pressure test circuits are mainly used for hot-state performance testing of equipment such as pumps and valves. They typically employ electric heating regulators to maintain constant system pressure. Since the regulator dissipates heat into the environment, the heating output of the electric heater needs to be adjusted to keep the system pressure constant. Traditional pressure control methods rely on logic control: heating stops when the pressure exceeds the upper pressure limit and activates when the pressure falls below the lower pressure limit. While this method is logically simple, it leads to frequent and rapid pressure fluctuations within a certain range. These rapid pressure changes can cause fatigue damage to the equipment and piping in the test circuit system, affecting both the safety of the high-temperature and high-pressure test circuit operation and reducing its service life and the quality of pressure control. To address these issues, this application proposes a method, device, equipment, and readable storage medium for controlling the operating pressure of a test circuit.

[0040] This application discloses a method, apparatus, device, and readable storage medium for controlling the operating pressure of a test circuit. The key feature of this invention is that when the operating pressure of the test circuit experiences significant fluctuations—that is, when the pressure deviation from the set pressure is outside the set deviation range—it can determine whether the heating power of the voltage regulator needs adjustment based on preset adjustment conditions. If the adjustment conditions are met, a power correction value positively correlated with the pressure deviation is calculated, and the voltage regulator heating power is adjusted to the new heating power. Ultimately, under gradually changing heating power, the operating pressure approaches the set pressure at a rate positively correlated with the pressure deviation. This invention allows for adaptive adjustment of the heating power based on the actual magnitude of the pressure deviation when adjusting the operating pressure of the test circuit. When the pressure deviation is large, the operating pressure is changed more quickly to bring it closer to the normal pressure range. When the pressure deviation is small, the operating pressure is changed more slowly to more stably enter the normal pressure range. When the operating pressure is within the normal pressure range, the heating power is kept constant to maintain the operating pressure of the test circuit as stable as possible and avoid frequent fluctuations.

[0041] In a first aspect, embodiments of the present invention provide a test circuit operating pressure control device, which can be a device with data processing capabilities such as a personal computer (PC), a laptop computer, or a server.

[0042] Reference Figure 1 , Figure 1This is a schematic diagram of the hardware structure of the test loop operation pressure control device involved in the embodiment of the present invention. In this embodiment, the test loop operation pressure control device may include a processor 1001 (e.g., a Central Processing Unit, CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. The communication bus 1002 is used to realize communication between these components; the user interface 1003 may include a display screen or an input unit such as a keyboard; the network interface 1004 may optionally include a standard wired interface or a wireless interface (e.g., Wireless Fidelity, Wi-Fi interface); the memory 1005 may be high-speed random access memory (RAM) or stable memory (non-volatile memory), such as a disk storage device. The memory 1005 may also optionally be a storage device independent of the aforementioned processor 1001. Those skilled in the art will understand that… Figure 1 The hardware structure shown does not constitute a limitation of the invention and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0043] Continue to refer to Figure 1 , Figure 1 The memory 1005, which serves as a computer storage medium, may include an operating system, a network communication module, a user interface module, and a test loop operation pressure control program. The processor 1001 can call the test loop operation pressure control program stored in the memory 1005 and execute the test loop operation pressure control method provided in this embodiment of the invention.

[0044] Secondly, embodiments of the present invention provide a method for controlling the operating pressure of a test circuit.

[0045] Reference Figure 2 A method for controlling the operating pressure of a test circuit, comprising:

[0046] S100: Obtain the operating pressure of the voltage regulator in the test circuit;

[0047] S200. Calculate the pressure deviation between the operating pressure and the set pressure, and determine whether the pressure deviation is within the set deviation range;

[0048] S310. If the pressure deviation is within the deviation range, keep the heating power of the voltage regulator constant.

[0049] S320. If the pressure deviation is outside the deviation range and the trend of the operating pressure meets the preset adjustment conditions, calculate the power correction value that is positively correlated with the pressure deviation based on the operating pressure and the pressure deviation, and adjust the heating power of the voltage regulator to a new heating power based on the power correction value, so that the operating pressure approaches the set pressure at a rate that is positively correlated with the pressure deviation.

[0050] In this embodiment, the set pressure is the operating pressure of the test circuit under ideal or specific operating conditions, which is set in advance by technicians as needed. The set deviation range is based on the acceptable pressure deviation limit of the test circuit under the set operating conditions. In this embodiment, the deviation range does not exceed the allowable pressure deviation limit of the test circuit under the set operating conditions, thereby avoiding the test circuit's operating pressure being outside the allowable normal operating pressure range under the set operating conditions, which would prevent the test circuit from achieving or approaching the set operating conditions. Specifically, the set deviation range is (-δp) c ,δp c ), where (0 < δp c <Δp R ), Δp R The allowable pressure deviation limit for the test circuit under set operating conditions shall be determined by the technicians as needed.

[0051] Furthermore, the adjustment conditions include the operating pressure changing trend gradually moving away from the design pressure;

[0052] If the pressure deviation is outside the deviation range and the operating pressure changes gradually towards the set pressure, the heating power of the voltage regulator remains unchanged.

[0053] Specifically, when the trend of operating pressure changes gradually deviates from the set pressure, it includes the following two specific forms: (Δp) c,i >δp c And p c,i >p c,i-1 ) or (Δp c,i <-δp c And p c,i <p c,i-1 );

[0054] Where, Δp c,i =p c,i -p R ;Δp c,i-1 =p c,i-1 -p R ;

[0055] Δp c,iThe pressure deviation calculated based on the operating pressure obtained in this study;

[0056] Δp c,i-1 The pressure deviation calculated based on the previously obtained operating pressure;

[0057] p c,i This refers to the operational pressure obtained in this instance;

[0058] p c,i-1 This refers to the operating pressure obtained last time;

[0059] p R The set pressure is the operating pressure of the test circuit under set conditions.

[0060] This configuration means that when the operating pressure gradually deviates from the set pressure, it indicates that the heating power of the test circuit is inconsistent with controlling the operating pressure within the deviation range. In other words, the current heating power of the test circuit will cause the operating pressure to deviate further from the set pressure, leading to a wider pressure deviation and necessitating an adjustment of the heating power. Conversely, when the operating pressure gradually approaches the set pressure, it indicates that the heating power of the test circuit is bringing the operating pressure closer to the set pressure, thus eliminating the need for heating power adjustment and allowing the operating pressure to continue moving towards the set pressure. This achieves adaptive adjustment based on the actual impact of the current heating power of the test circuit on the operating pressure, optimizing the control logic of the voltage regulator's heating power.

[0061] Further, in step S320, calculating the power correction value that is positively correlated with the pressure deviation based on the operating pressure and the pressure deviation includes:

[0062] S321. Obtain the corresponding operating temperature of the voltage regulator based on the operating pressure, and calculate the target correction value of the voltage regulator heating power based on the operating temperature and the set temperature.

[0063] S322. Determine whether the target correction value is within the set limit correction range;

[0064] If it is in the state where the power correction value is the target correction value;

[0065] If not, the power correction value is the parameter value that is closest to the target correction value within the defined correction range.

[0066] Specifically, in this embodiment, by operating pressure p i Obtain the corresponding voltage regulator operating temperature T s,i Based on the property tables of water and water vapor, the least squares method was used to obtain the multi-order fitting relationship T between the saturated water / water vapor temperature and pressure. s=f(p), in this embodiment a two-order fitting is used, T s =k0+k1p+k2p 2 In other embodiments, multi-order fitting can be used to obtain the operating pressure p. i Corresponding operating temperature T s,i Then, the operating temperature T can be further obtained. s,i The corresponding temperature deviation ΔT p,i =T s,i -T R T R The set temperature, i.e. the operating temperature of the voltage regulator in the test circuit under set conditions, is set in advance by the technicians as needed;

[0067] Target correction value And by limiting it to (-ΔP) h,R ,ΔP h,R The power correction value is obtained within the specified range (-ΔP); while the correction range is limited to (-ΔP). h,R ,ΔP h,R )middle,

[0068] In the above formula, K is a constant that can take values ​​between 1 and 2;

[0069] P R This refers to the heat dissipation power of the voltage regulator under this set operating condition;

[0070] T aR The ambient temperature under this set operating condition;

[0071] ΔT R =min(ΔT) s,1 ,ΔT s,2 Specifically, let p1 = p R +Δp R p2 = p R -Δp R Based on the multi-order fitting relationship T between saturated water / water vapor temperature and pressure s = f(p) Calculate the corresponding saturation temperature T respectively s,1 and T s,2 Then calculate the temperature difference ΔT s,1 =T s,1 -T R ΔT s,2 =T R -T s,2 .

[0072] As can be seen from the above calculation method, the limited correction range is obtained based on the set pressure, the set pressure deviation limit, the set temperature, the set ambient temperature, and the set voltage regulator heat dissipation power.

[0073] This configuration allows for the prior determination of the voltage regulator's heating power correction range by using various parameters of the voltage regulator under set operating conditions. This further ensures that the adjustment range of the voltage regulator's heating power during a single adjustment is not too large, thus ensuring that the change range of the test circuit's operating pressure is within a suitable range, avoiding excessively rapid changes in operating pressure, and effectively ensuring that the test circuit is in a relatively stable operating state.

[0074] Furthermore, in step S320, the heating power of the voltage regulator is adjusted to a new heating power according to the power correction value. The new heating power is adjusted to a new heating power according to the power correction value, the pressure deviation, and the set maximum heating power, and the new heating power is within the range between zero and the maximum heating power.

[0075] Among them, the maximum heating power P h,max The temperature rise limit of the voltage regulator structure is determined by technicians based on the set operating conditions.

[0076] This configuration further ensures that the heating power of the test circuit after adjustment is within the specified maximum heating power P. h,max Within this range, avoid exceeding the maximum heating power P. h,max This caused the test circuit to malfunction.

[0077] Further, in step S320, the voltage regulator heating power is adjusted to a new heating power based on the power correction value, the pressure deviation, and the set maximum heating power, and the new heating power is within the range between zero and the maximum heating power, including:

[0078] If the operating pressure is lower than the deviation range, the heating power is calculated based on the preset first algorithm, the power correction value, and the set maximum heating power, and the voltage regulator heating power is adjusted to the smaller value between the calculated heating power and the maximum heating power.

[0079] If the operating pressure is higher than the deviation range, the heating power is calculated based on the preset second algorithm, the power correction value, and the set maximum heating power, and the voltage regulator heating power is adjusted to the larger of the heating power calculated value and zero.

[0080] Specifically, in this embodiment, the power target value P is first calculated using the power correction value. h_goal,i Then, the heating power adjustment value P is calculated based on the power target value. h,i The calculation process is shown in the following formula:

[0081] or (Δp) i <-δp c And pi <p i-1 )

[0082]

[0083] As can be seen from the above calculation formula, after obtaining the operating pressure of the test circuit for the first time, i.e., when i = 1, the initial heating power of the voltage regulator (i = 0), i.e., P, needs to be utilized. h_goal,0 In this embodiment, the initial heating power of the voltage regulator is the heat dissipation power of the voltage regulator under the set operating conditions of the test circuit, i.e., P. h_goal,0 =P R .

[0084] This setup, through the aforementioned control methods and calculation processes, enables precise calculation of the voltage regulator's heating power. This not only improves the accuracy of pressure control and the effectiveness of the test, but also reduces the fluctuation period and rate of change of pressure in the high-temperature and high-pressure test circuit. Consequently, it mitigates the impact of alternating pressure on the voltage regulator, circuit system equipment, and pipelines. While enhancing the pressure control accuracy of the high-temperature and high-pressure test circuit, it also improves the operational safety of the high-temperature and high-pressure test circuit system and equipment, and extends the service life of the circuit system.

[0085] Thirdly, embodiments of the present invention also provide a test circuit operating pressure control device.

[0086] Reference Figure 3 A schematic diagram of the functional modules of the first embodiment of the test circuit operating pressure control device.

[0087] In this embodiment, the test circuit operating pressure control device includes:

[0088] The acquisition module is configured to acquire the operating pressure of the test circuit regulator;

[0089] The judgment module is configured to calculate the pressure deviation between the operating pressure and the set pressure, and to determine whether the pressure deviation is within the set deviation range.

[0090] The control module is configured to maintain the regulator heating power unchanged if the pressure deviation is within the deviation range; if the pressure deviation is outside the deviation range and the trend of the operating pressure meets the preset adjustment conditions, calculate a power correction value that is positively correlated with the pressure deviation based on the operating pressure and the pressure deviation, and adjust the regulator heating power to a new heating power based on the power correction value, so that the operating pressure approaches the set pressure at a rate positively correlated with the pressure deviation.

[0091] The functions of each module in the above-mentioned test circuit operating pressure control device correspond to the steps in the above-mentioned test circuit operating pressure control method embodiment, and their functions and implementation processes will not be described in detail here.

[0092] Fourthly, embodiments of the present invention also provide a readable storage medium.

[0093] The present invention provides a test circuit operating pressure control program stored on a readable storage medium, wherein when the test circuit operating pressure control program is executed by a processor, the steps of the test circuit operating pressure control method described above are implemented.

[0094] The method implemented when the test circuit operating pressure control program is executed can be referred to in various embodiments of the test circuit operating pressure control method of the present invention, and will not be repeated here.

[0095] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or system. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or system that includes that element.

[0096] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0097] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes several instructions to cause a terminal device to execute the methods described in the various embodiments of the present invention.

[0098] The above are merely preferred embodiments of the present invention and do not limit the scope of the patent. Any equivalent structural or procedural transformations made based on the description and drawings of the present invention, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of the present invention.

Claims

1. A method for controlling the operating pressure of a test circuit, characterized in that, It includes: Obtain the operating pressure of the voltage regulator in the test circuit; Calculate the pressure deviation between the operating pressure and the set pressure, and determine whether the pressure deviation is within the set deviation range; If the pressure deviation is within the deviation range, the heating power of the voltage regulator remains unchanged; If the pressure deviation is outside the deviation range and the trend of the operating pressure change is gradually moving away from the set pressure, the operating temperature of the corresponding voltage regulator is obtained based on the operating pressure, and the target correction value of the voltage regulator heating power is calculated based on the operating temperature and the set temperature; it is then determined whether the target correction value is within the set limit correction range, wherein the limit correction range is obtained based on the set pressure, the set pressure deviation limit, the set temperature, the set ambient temperature, and the set voltage regulator heat dissipation power; Based on the judgment result, determine the power correction value that is positively correlated with the pressure deviation; The voltage regulator heating power is adjusted to a new heating power based on the power correction value, so that the operating pressure approaches the set pressure at a rate positively correlated with the pressure deviation.

2. The test circuit operating pressure control method as described in claim 1, characterized in that, If the pressure deviation is outside the deviation range and the operating pressure changes gradually towards the set pressure, the heating power of the voltage regulator remains unchanged.

3. The test loop operating pressure control method as described in claim 2, characterized in that, The step of determining the power correction value that is positively correlated with the pressure deviation based on the judgment result includes: If the target correction value is within the defined correction range, the power correction value is the target correction value; If the target correction value is not within the limited correction range, the power correction value is the parameter value within the limited correction range that is closest to the target correction value.

4. The test circuit operating pressure control method as described in claim 1, characterized in that, The voltage regulator heating power is adjusted to a new heating power according to the power correction value. The new heating power is adjusted to a new heating power according to the power correction value, the pressure deviation, and the set maximum heating power, and the new heating power is within the range between zero and the maximum heating power.

5. The test loop operating pressure control method as described in claim 4, characterized in that, The step of adjusting the voltage regulator's heating power to a new heating power based on the power correction value, the pressure deviation, and the set maximum heating power, and ensuring that the new heating power is within the range of zero and the maximum heating power, includes: If the operating pressure is lower than the deviation range, the heating power is calculated based on the preset first algorithm, the power correction value, and the set maximum heating power, and the voltage regulator heating power is adjusted to the smaller value between the calculated heating power and the maximum heating power. If the operating pressure is higher than the deviation range, the heating power is calculated based on the preset second algorithm, the power correction value, and the set maximum heating power, and the voltage regulator heating power is adjusted to the larger of the heating power calculated value and zero.

6. The test loop operating pressure control method as described in claim 1, characterized in that, The initial heating power of the voltage regulator is the set heat dissipation power of the voltage regulator.

7. A test circuit operating pressure control device, characterized in that, It includes: The acquisition module is configured to acquire the operating pressure of the test circuit regulator; The judgment module is configured to calculate the pressure deviation between the operating pressure and the set pressure, and to determine whether the pressure deviation is within the set deviation range. The control module is configured to maintain the regulator heating power unchanged if the pressure deviation is within the deviation range; If the pressure deviation is outside the deviation range and the operating pressure gradually moves away from the set pressure, the operating temperature of the voltage regulator is obtained based on the operating pressure, and a target correction value for the voltage regulator heating power is calculated based on the operating temperature and the set temperature. It is then determined whether the target correction value is within a set limit correction range, wherein the limit correction range is obtained based on the set pressure, the set pressure deviation limit, the set temperature, the set ambient temperature, and the set voltage regulator heat dissipation power. The voltage regulator heating power is adjusted to a new heating power based on the power correction value, so that the operating pressure approaches the set pressure at a rate positively correlated with the pressure deviation.

8. A test circuit operating pressure control device, characterized in that, The test loop operating pressure control device includes a processor, a memory, and a test loop operating pressure control program stored in the memory and executable by the processor, wherein when the test loop operating pressure control program is executed by the processor, it implements the steps of the test loop operating pressure control method as described in any one of claims 1 to 6.

9. A readable storage medium, characterized in that, The readable storage medium stores a test loop operating pressure control program, wherein when the test loop operating pressure control program is executed by a processor, it implements the steps of the test loop operating pressure control method as described in any one of claims 1 to 6.

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