一种估算地下LNAPL污染量的方法
By measuring the apparent thickness and capillary permeability of the monitoring well, calculating the effective capillary rise height, and combining the coordinate system and distribution function, the amount of underground LNAPL contamination can be accurately estimated, solving the problem of large errors in existing technologies and improving remediation efficiency.
CN115841035BActive Publication Date: 2026-07-17CHANGAN UNIV
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGAN UNIV
- Filing Date
- 2022-12-07
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
In existing technologies, there are significant errors in estimating the amount of underground LNAPL contamination based on the apparent thickness of LNAPL in monitoring wells, leading to inaccurate remediation system design.
Method used
By measuring the apparent thickness and capillary permeability of the monitoring well, the effective capillary rise height is calculated. Combined with the coordinate system and distribution function, the actual thickness and contamination amount of LNAPL in the formation are fitted.
Benefits of technology
This significantly reduces the error in estimating the actual thickness of LNAPL, provides an accurate basis for the treatment and remediation of underground LNAPL contamination, and improves remediation efficiency.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN115841035B_ABST
Abstract
本发明公开了一种估算地下LNAPL污染量的方法，涉及地下水污染与修复技术领域，包括以下步骤：测量出多个监测井中LNAPL的表观厚度；采集地层中的含水介质，测量其饱和含水量和毛细渗透水量并计算出有效毛细上升高度；根据多个监测井中LNAPL的表观厚度和有效毛细上升高度计算地层中多处LNAPL的实际厚度；根据地层中LNAPL的实际厚度和多个监测井的布设形式建立坐标系；在坐标系上为多个监测井赋予多个不同的坐标值，拟合出地层LNAPL分布图以及分布函数；对地层中LNAPL的污染面积、污染体积和污染量进行估算。本发明采用有效毛细上升高度he来代替ha进行近似计算，大大减小了LNAPL实际厚度估算的误差。
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