一种采用通用检测工具检测的检查次序优化方法和系统
By optimizing the inspection order of general detection tools and exchanging the product of inspection time and weight coefficient of adjacent groups based on fault probability and weight coefficient, the problem of long fault location time in complex systems is solved, and more efficient fault diagnosis is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NAVAL UNIV OF ENG PLA
- Filing Date
- 2022-12-12
- Publication Date
- 2026-07-17
AI Technical Summary
In the existing technology, there is a lack of effective methods to optimize the inspection sequence of general testing tools to reduce the fault location time of electronic equipment, especially in complex systems where the workload of finding faulty units is huge and time-consuming.
By obtaining the probability of failure and the fault investigation weight coefficient of each unit, the inspection time and weight coefficient of each group of the general detection tool are calculated. The product of the inspection time and weight coefficient of adjacent groups is swapped as the sorting basis to optimize the inspection order between groups until the comprehensive value is obtained and sorted in ascending order, thereby shortening the fault location time.
By optimizing the inspection sequence, the fault location time during general testing is significantly reduced, maximizing the efficiency and cost-effectiveness of the testing tools.
Smart Images
Figure CN115879720B_ABST