Infrared LED testing system and method based on LabVIEW development platform

Abstract

The application discloses an infrared LED testing system and method based on a LabVIEW development platform, the system comprises a voltage and current driving module, an infrared light power probe module, an infrared power meter module, a LabVIEW program and a computer, and the modules are connected through signal lines; the method comprises the following steps: the LabVIEW program controls the voltage and current driving module to apply an infrared LED voltage signal, and collects real-time voltage and current data to the computer, the infrared probe collects an output power value of the LED, the power signal is collected by the LabVIEW program after being processed by the power meter, and the original data is processed by using a logical relationship set in the LabVIEW program, so that the real-time performance of the infrared LED is obtained. The system and the method can realize real-time acquisition of the voltage, current and light power of the infrared LED, and accurately calculate the performance of the device.

Description

Technical Field

[0001] This invention belongs to the field of infrared LED testing, specifically relating to an infrared LED testing system and method based on the LabVIEW development platform. Background Technology

[0002] Over the past decade, near-infrared light-emitting diodes (NIR-LEDs) have been widely used in biomedical imaging and clinical diagnostics, night vision devices, fiber optic communication, and computing. Semiconductor colloidal quantum dots (CQDs) offer unique opportunities for realizing near-infrared emitting devices due to their high photoluminescence (PL) efficiency in solution, tunable size, convenience, and low cost. However, because infrared LEDs require more complex testing environments, more cumbersome testing systems, and more intricate performance calculations compared to visible light LEDs, a simple and accurate testing method is crucial for researchers. Summary of the Invention

[0003] Technical Problem: To address the aforementioned existing technologies, an infrared LED testing system based on the LabVIEW development platform is proposed. This system solves the problems of complex and inaccurate test results in current infrared LED testing methods, and provides a simple, fast, and accurate infrared LED testing method and system.

[0004] Technical Solution: The system includes a voltage and current drive module, an infrared light power probe module, an infrared power meter module, and a computer for setting up LabVIEW programs. The modules are connected via signal lines. The method includes: the LabVIEW program controls the voltage and current drive module to apply a voltage signal to the infrared LED and collects real-time voltage and current data to the computer; the infrared probe collects the output power value of the LED; after processing by the power meter, the LabVIEW program collects the power signal and uses the logic relationships set in the LabVIEW program to process the raw data, thereby obtaining the real-time performance of the infrared LED.

[0005] The system is divided into three parts. The first part is the hardware environment, which consists of a voltage and current drive module, an infrared light power probe module, an infrared power meter module, and a computer for setting up LabVIEW programs. The modules are connected to each other through signal lines and data lines.

[0006] The second part is the software LabVIEW environment: The LabVIEW program controls the data to collect raw data of voltage, current and optical power values ​​according to the set initial voltage value, voltage end value and step voltage value, and processes the raw data using the logic relationship set in the LabVIEW program, thereby obtaining the real-time performance of the infrared LED; and the computer stores the LabVIEW program and the raw data characterizing the real-time performance of the infrared LED.

[0007] The third part is about data processing and methods for calculating the performance of infrared LED devices.

[0008] The real-time characteristics of the power are obtained using the following method, and the calculation formula is as follows:

[0009]

[0010] Where P is the measured optical power of the LED device; I is the real-time current of the device; and V is the real-time voltage of the device.

[0011] The real-time EQE characteristics of the device are obtained using the following method, and the calculation formula is as follows:

[0012]

[0013] Where q is the elementary charge, with a value of 1.60217733 × 10⁻¹⁹ coulombs; V is the real-time voltage of the device; h is Planck's constant, with a value of 6.62607015 × 10⁻³⁴ J·s; c is the speed of light, with a value of 299792458 m / s; λ is the emission wavelength of the LED device; S(λ) is the optical power value at the corresponding wavelength; η P This represents the real-time efficiency value corresponding to the device.

[0014] The calculated device efficiency is stored in the computer.

[0015] Beneficial effects: Compared with the prior art, the present invention has the following advantages:

[0016] (1) The present invention can realize the real-time acquisition of infrared LED voltage, current and light power.

[0017] (2) The present invention has built a system for testing infrared LEDs, which can exclude invalid data and perform calculations automatically, thereby improving the stability of the system.

[0018] (3) Compared with traditional LED device analysis systems, this system has lower power consumption, smaller size, more accurate measurement, and more timely data reading. Attached Figure Description

[0019] Figure 1 This describes the hardware environment of the infrared LED testing system based on the LabVIEW development platform of the present invention. 1—Infrared power probe module, 2—Infrared power meter module, 3—LabVIEW program and computer, 4—Voltage and current drive module, 5—Infrared LED under test.

[0020] Figure 2This is the software environment for the infrared LED testing system based on the LabVIEW development platform of the present invention. The components are as follows: 1—voltage and current drive module port connection signal; 2—scan start voltage setting value; 3—scan end voltage setting value; 4—test communication; 5—scan step voltage setting value; 6—optical power meter port connection signal; 7—system protection current setting value; 8—voltage mode and current mode selection; 9—voltage and current drive module switch; 10—mode selection; 11—optical power meter switch; 12—optical power value acquisition and display; 13—voltage acquisition and display; 14—current acquisition and display; 15—raw data processing and infrared LED device efficiency calculation; 16—data storage; 17—voltage and current drive module switch; 18—optical power meter module switch.

[0021] Figure 3 This is the software control and display port of the infrared LED testing system based on the LabVIEW development platform of the present invention. Wherein 1—set scan start voltage, 2—set scan voltage step size, 3—set scan voltage end voltage, 4—set system protection current, 5—real-time voltage display, 6—real-time current display, and 7—real-time optical power value display. Detailed Implementation

[0022] like Figure 1 The system includes a voltage and current drive module 4, an infrared light power probe module 1, an infrared power meter module 2, and a computer 3. The computer 3 is programmed with LabVIEW. The usage and connection methods of each module are as follows:

[0023] The voltage and current signal drive module 4 is controlled by a LabVIEW program and can adjust the start voltage, end voltage, and step voltage values ​​of the test. The collected current signal is then transmitted to the LabVIEW program on the computer side for processing. It is connected to the computer 3 via an RSR232-USB data cable.

[0024] The infrared optical power probe module 1 consists of a standard photodiode power probe, suitable for measuring the light intensity signals of low-power coherent and incoherent light sources from ultraviolet to near-infrared; and transmits the collected light intensity electrical signals to the optical power meter module 2 for processing. It is connected to the optical power meter module 2 via a signal line.

[0025] The infrared power meter module 2 is controlled by a LabVIEW program and can measure the optical power of lasers or other monochromatic or near-monochromatic light sources, as well as the energy of pulsed light sources. It collects the optical intensity electrical signal from the infrared optical power probe module 1, converts it into an optical power signal, and transmits it to the LabVIEW program on the computer side for processing. It connects to computer 3 via a Type-A-USB data cable.

[0026] After all modules are connected, open the LabVIEW program on the computer, such as... Figure 2 Enter the starting voltage, ending voltage, and voltage step size at the program port, and run the program. Each module will transfer the collected raw data to the LabVIEW program on the computer for subsequent data processing. Figure 3 The LabVIEW program controls the data according to the set initial voltage value 1, step voltage value 2, and voltage end value 3. The software will automatically run and display the collected voltage 4, current 5, and optical power value 6 raw data to the LabVIEW software side. The raw data is processed using the logic relationship set in the LabVIEW program to obtain the real-time performance of the infrared LED. The computer stores the LabVIEW program and the raw data characterizing the real-time performance of the infrared LED.

[0027] This system can operate automatically, and the steps of its operation are as follows: Figure 2 See below:

[0028] 1. Connect the computer to the voltage and current drive module.

[0029] 2. Input the starting voltage for the test in the LabVIEW program.

[0030] 3. Enter the end voltage of the test in the LabVIEW program.

[0031] 4. Test whether the voltage and current drive modules can communicate normally.

[0032] 5. Input the test step voltage in the LabVIEW program.

[0033] 6. Connect the computer to the optical power meter module.

[0034] 7. Set the system's protection current to prevent system damage.

[0035] 8. Start the system's voltage scan mode.

[0036] 9. Enable voltage and current driven output.

[0037] 10. Select single-step output and data collection for real-time drive and signal collection.

[0038] 11. Enable the data collection mode of the optical power meter.

[0039] 12. Display the real-time optical power value of the infrared LED device on the computer software.

[0040] 13. Display the real-time voltage value of the infrared LED device on the computer software.

[0041] 14. Display the real-time current value of the infrared LED device on the computer software.

[0042] 15. Using the various data values ​​and the data model described above, we can calculate the real-time performance data of the infrared LED device.

[0043] 16. Save the original data and the calculated data to the computer's internal memory.

[0044] 17. Turn off the voltage and current drive modules.

[0045] 18. Turn off the optical power meter driver module.

Claims

1. An infrared LED testing system based on the LabVIEW development platform, characterized in that, include: The infrared power probe module, infrared power meter module, computer for setting LabVIEW programs, voltage and current drive module, and LED device are connected in sequence. The voltage and current signal driving module is controlled by a LabVIEW program and can adjust the starting voltage, ending voltage, and step voltage values ​​of the test; the collected current signal is then transmitted to the LabVIEW program on the computer side for processing. The infrared optical power probe module is used to measure the light intensity signals of low-power coherent and incoherent light sources from ultraviolet to near-infrared; and transmits the collected light intensity electrical signals to the optical power meter module for processing; The infrared power meter module is used to measure the optical power of lasers or other monochromatic or near-monochromatic light sources, as well as the energy of pulsed light sources; the optical intensity electrical signal collected by the optical power probe module is converted into an optical power signal and then transmitted to the LabVIEW program on the computer side for processing; The method for testing the efficiency of infrared LED devices based on the aforementioned test system includes the following steps: V: The voltage signal acquisition module acquires the real-time voltage signal of the LED device and transmits it to the LabVIEW program in the computer; I: The current signal acquisition module acquires the real-time current signal of the LED device and transmits it to the LabVIEW program in the computer; P: The light power signal of the LED device is collected by the infrared light probe module, processed by the light power meter module, and transmitted to the LabVIEW program in the computer; The real-time characteristics of the power are obtained using the following method, and the calculation formula is as follows: ； in, The measured optical power value of the LED device; This represents the real-time current of the device. This refers to the real-time voltage of the device. The real-time EQE characteristics of the LED device are obtained using the following method, and the calculation formula is as follows: ； in, The elementary charge has a value of 1.60217733 × 10^-19 coulombs. This refers to the real-time voltage of the device. is Planck's constant, with a value of 6.62607015 × 10^(-34) J·s; The speed of light has a value of 299,792,458 m / s; The wavelength of light emitted by the LED device; This represents the optical power value for the corresponding wavelength. This represents the real-time efficiency value corresponding to the device.

2. The infrared LED testing system based on the LabVIEW development platform according to claim 1, characterized in that: The voltage and current signal driving module is connected to the computer module via an RSR232-USB data cable.

3. The infrared LED testing system based on the LabVIEW development platform according to claim 1, characterized in that: The infrared power probe module is composed of a standard photodiode power probe.

4. The infrared LED testing system based on the LabVIEW development platform according to claim 1, characterized in that: The infrared power meter module and the computer module are connected via a TYPE A-USB data cable.

5. The infrared LED testing system based on the LabVIEW development platform according to claim 1, characterized in that: The LabVIEW program controls the data to collect raw data of voltage, current and optical power values ​​according to the set initial voltage value, voltage end value and step voltage value, and processes the raw data using the logic relationship set in the LabVIEW program, thereby obtaining the real-time performance of the infrared LED. The computer stores LabVIEW programs and raw data characterizing the real-time performance of infrared LEDs; The computer is used to store LabVIEW programs, raw data characterizing infrared LEDs, and calculated LED performance values.

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