Aging sensor, aging compensation method, chip, chip module, and electronic device

Abstract

The application provides an aging sensor, an aging compensation method, a chip, a chip module and an electronic device. The aging sensor comprises a first ring oscillator, a second ring oscillator, a first counter, a second counter and a calculation module; the first ring oscillator is used for working for a first time length every preset time interval; the second ring oscillator is used for continuously working; the first counter is used for counting a first oscillation frequency of the first ring oscillator within an initial first time length and a second oscillation frequency within each first time length thereafter; the second counter is used for counting a third oscillation frequency of the second ring oscillator within the initial first time length and a fourth oscillation frequency within each first time length thereafter; and the calculation module is used for determining a compensation voltage value for compensating the chip after each preset time interval according to the first oscillation frequency, the second oscillation frequency, the third oscillation frequency and the fourth oscillation frequency, so that dynamic chip aging compensation is realized.

Description

Technical Field

[0001] This application relates to chip technology, and more particularly to an aging sensor, an aging compensation method, a chip, a chip module, and an electronic device. Background Technology

[0002] When a chip is in operation, its temperature rises due to energy consumption. In high-temperature and high-voltage environments, chip performance is degraded, which greatly reduces the chip's lifespan, a phenomenon known as chip aging. Chip aging leads to a decline in chip performance, and in severe cases, it can affect the chip's timing and even cause chip failure. Therefore, how to combat aging has become a focus of attention in the semiconductor industry.

[0003] In related technologies, a margin is added to the timing circuits based on the target chip's lifespan during chip design. The drawback of this approach is that it reduces chip specifications, leaving unused performance improvement space and potentially causing design non-convergence. Therefore, a new chip anti-aging solution is urgently needed. Summary of the Invention

[0004] This application provides an aging sensor, an aging compensation method, a chip, a chip module, and an electronic device, which realizes dynamic chip aging compensation.

[0005] In a first aspect, this application provides an aging sensor, comprising: a first ring oscillator, a second ring oscillator, a first counter, a second counter, and a computing module;

[0006] The first ring oscillator is used to operate for a first duration at preset time intervals, and the second ring oscillator is used to operate continuously;

[0007] The first counter is used to count the number of first oscillations of the first ring oscillator within an initial first duration, and the number of second oscillations within each subsequent first duration; the second counter is used to count the number of third oscillations of the second ring oscillator within the initial first duration, and the number of fourth oscillations within each subsequent first duration.

[0008] The calculation module is used to determine the compensation voltage value for aging compensation of the chip after each preset time interval based on the first oscillation count, the second oscillation count, the third oscillation count, and the fourth oscillation count.

[0009] In one embodiment, it further includes: a first switching element;

[0010] The first switching element is connected to the first ring oscillator, and the first switching element is used to close within the first duration to control the operation of the first ring oscillator;

[0011] In one embodiment, it further includes: a second switching element;

[0012] The second switching element is connected to the second ring oscillator, and the second switching element is used to control the second ring oscillator to work continuously.

[0013] In one embodiment, the calculation module is used to determine an aging coefficient based on the first number of oscillations, the second number of oscillations, the third number of oscillations, and the fourth number of oscillations, and to determine the compensation voltage value based on the aging coefficient and the voltage sensitivity coefficient corresponding to the operating voltage of the chip.

[0014] In one implementation, it further includes: a register array;

[0015] The register array is used to store the correspondence between the operating voltage and the voltage sensitivity coefficient, and outputs the voltage sensitivity coefficient corresponding to the operating voltage of the chip to the calculation module.

[0016] In one embodiment, the first ring oscillator and the second ring oscillator are symmetrically arranged.

[0017] In one embodiment, the number of inverters in the first ring oscillator and the second ring oscillator is odd and prime.

[0018] Secondly, this application provides an aging compensation method applied to the aging sensor as described in the first aspect, the method comprising:

[0019] Within an initial first duration, the first and second ring oscillators are controlled to operate, and the first number of oscillations of the first ring oscillator and the third number of oscillations of the second ring oscillator within the initial first duration are obtained. Then, the second ring oscillator is controlled to continue operating.

[0020] After a preset time interval, the first and second ring oscillators are controlled to operate for a first duration. The second oscillation count of the first ring oscillator within the first duration and the fourth oscillation count of the second ring oscillator within the first duration are obtained. Then, the second ring oscillator is controlled to continue operating. Based on the first oscillation count, the second oscillation count, the third oscillation count, and the fourth oscillation count, the compensation voltage value for aging compensation of the chip after the preset time interval is determined. This step is repeated until the chip voltage reaches the maximum operating voltage.

[0021] In one embodiment, determining the compensation voltage value for aging compensation of the chip after each preset time interval based on the first oscillation count, the second oscillation count, the third oscillation count, and the fourth oscillation count includes:

[0022] The aging coefficient is determined based on the first number of oscillations, the second number of oscillations, the third number of oscillations, and the fourth number of oscillations.

[0023] The compensation voltage value is determined based on the aging coefficient and the voltage sensitivity coefficient corresponding to the chip's operating voltage.

[0024] In one embodiment, determining the aging coefficient based on the third oscillation number and the fourth oscillation number includes:

[0025] The ratio of the second oscillation number to the first oscillation number is determined as the first variation coefficient, and the ratio of the fourth oscillation number to the third oscillation number is determined as the second variation coefficient;

[0026] The difference between the first variation coefficient and the second variation coefficient is determined as the aging coefficient.

[0027] In one embodiment, after obtaining the first number of oscillations of the first ring oscillator within an initial first duration and the third number of oscillations of the second ring oscillator within the initial first duration, the method further includes:

[0028] The second ring oscillator is controlled to operate at the maximum operating voltage for a first duration, and the fifth oscillation number of the second ring oscillator during the first duration of operation at the maximum operating voltage is obtained accordingly.

[0029] The voltage sensitivity coefficient is determined based on the third oscillation number, the fifth oscillation number, the chip's operating voltage, and the maximum operating voltage.

[0030] Thirdly, this application provides a chip including the aging sensor as described in the first aspect above.

[0031] Fourthly, this application provides a chip module, including the chip described in the third aspect above.

[0032] Fifthly, this application provides an electronic device, including: a memory, a processor, and a transceiver;

[0033] The memory is used to store computer programs;

[0034] The processor is configured to implement the method described in the second aspect above when the computer program is executed.

[0035] In a sixth aspect, this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the method described in the second aspect above.

[0036] In a seventh aspect, this application provides a computer program product, including a computer program that, when executed by a processor, implements the method described in the second aspect above.

[0037] This application provides an aging sensor, an aging compensation method, a chip, a chip module, and an electronic device. The aging sensor includes a first ring oscillator, a second ring oscillator, a first counter, a second counter, and a calculation module. The first ring oscillator is used to operate for a first duration at preset time intervals, and the second ring oscillator is used to operate continuously. The first counter is used to count the number of first oscillations of the first ring oscillator in the initial first duration and the number of second oscillations in each subsequent first duration. The second counter is used to count the number of third oscillations of the second ring oscillator in the initial first duration and the number of fourth oscillations in each subsequent first duration. The calculation module is used to determine the compensation voltage value for aging compensation of the chip after each preset time interval based on the number of first oscillations, the number of second oscillations, the number of third oscillations, and the number of fourth oscillations. This realizes dynamic aging compensation of the chip, which helps to mitigate the impact of voltage application on accelerated aging and ensures that the chip maintains high performance without degradation and functional failure during operation. Attached Figure Description

[0038] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0039] Figure 1 A schematic diagram of the structure of an aging sensor provided in this application embodiment. Figure 1 ;

[0040] Figure 2 A schematic diagram of a ring oscillator and counter provided in this application embodiment;

[0041] Figure 3 A schematic diagram of the structure of an aging sensor provided in this application embodiment. Figure 2 ;

[0042] Figure 4 A flowchart illustrating an aging compensation method provided in an embodiment of this application;

[0043] Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0045] In related technologies, during chip design, a margin is added to the timing circuitry based on the target chip's lifespan. For example, if the target operating frequency of a chip is 2GHz, and aging after 10 years might result in a 10% frequency reduction, then sufficient margin is added to the timing information during circuit timing verification to ensure that its operating frequency can reach at least 1.8GHz. This guarantees that the chip can still maintain an operating frequency of 1.8GHz after 10 years, thus ensuring performance. The disadvantage of this approach is that it reduces chip specifications, decreasing the competitiveness of the designed chip. Furthermore, the chip may not be used for 10 years, leaving unused performance improvement space and causing design non-convergence. Therefore, a new chip anti-aging solution is urgently needed.

[0046] Since a chip's operating frequency is related to its voltage, generally speaking, a higher voltage often results in a higher frequency, provided the circuit meets timing verification requirements. Therefore, increasing the voltage can be considered to ensure the chip maintains its target operating frequency even after a certain degree of aging. However, increasing the voltage to a sufficiently high level from the outset can lead to problems. High voltage means high power consumption, which in turn increases the chip's operating temperature, further accelerating the aging process.

[0047] To address this, this application proposes an aging sensor. This sensor utilizes a ring oscillator (RO) as the aging target and another ring oscillator as a reference to monitor the real-time aging status of the chip. It dynamically adjusts the compensation voltage based on the chip's real-time aging status, rather than directly applying a constant voltage value to the chip. Since the aging rate of a chip slows down with increasing operating time, its aging speed is extremely fast when the chip first starts operating (e.g., less than a day), but slows down after a week or a year. Therefore, dynamically adjusting the voltage helps mitigate the impact of voltage on accelerated aging and ensures that the chip maintains high performance without degradation and functional failure during operation.

[0048] The aging sensor provided in this application will be described in detail below through specific embodiments. It is understood that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments.

[0049] Figure 1 This is a schematic diagram of an aging sensor provided in an embodiment of this application. The aging sensor is disposed in a chip. Figure 1 As shown, the aging sensor includes: a first ring oscillator 101, a second ring oscillator 102, a first counter 103, a second counter 104, and a calculation module 105.

[0050] The first ring oscillator 101 is used to operate for a first duration at preset time intervals, and the second ring oscillator 102 is used to operate continuously.

[0051] The first counter 103 is used to count the number of first oscillations of the first ring oscillator 101 in the initial first duration and the number of second oscillations in each subsequent first duration. The second counter 104 is used to count the number of third oscillations of the second ring oscillator 102 in the initial first duration and the number of fourth oscillations in each subsequent first duration.

[0052] The calculation module 105 is used to determine the compensation voltage value for aging compensation of the chip after each preset time interval based on the first oscillation number, the second oscillation number, the third oscillation number, and the fourth oscillation number.

[0053] First, let's describe the ring oscillator. A ring oscillator is a device that forms a ring by connecting the output and input terminals of three or more odd-numbered inverters end to end. Its output oscillates at a certain frequency to generate two voltage levels. As the operating time increases, the ring oscillator gradually ages, and its oscillation frequency changes, meaning the number of oscillations within a certain time period changes. Therefore, in this embodiment, two ring oscillators are used for aging detection. The second ring oscillator 102 is the aging target, and it is continuously operated while the chip is working so that it reaches the same or similar aging state as the chip. The first ring oscillator 101 is used as a reference. While the chip is working, the first ring oscillator 101 is basically not working, only briefly operating in the initial stage and after each preset time interval when it is necessary to count the number of oscillations (i.e., the first working duration).

[0054] After each preset time interval, if the second oscillation count of the first ring oscillator 101 differs from the initial first oscillation count, this change may be due to environmental factors such as temperature and humidity. Similarly, if the fourth oscillation count of the second ring oscillator 102 differs from the initial third oscillation count, this change is due to environmental factors and aging caused by continuous operation of the second ring oscillator 102. Therefore, by using the change in the oscillation count of the first ring oscillator 101 as a reference, combined with the change in the oscillation count of the second ring oscillator 102, the aging state of the second ring oscillator 102 can be determined after excluding the influence of environmental factors. That is, the aging state of the second ring oscillator 102 can be determined based on the first, second, third, and fourth oscillation counts. Since the aging state of the second ring oscillator 102 is consistent with that of the chip, the compensation voltage value for aging compensation of the chip can be determined based on this. In this way, as the chip's usage time changes, the real-time aging state of the chip can be obtained through the oscillation counts of the first and second ring oscillators 101 and 102, thereby enabling dynamic aging compensation.

[0055] The aging sensor provided in this application uses one ring oscillator as the aging object and another ring oscillator as the reference object to monitor the real-time aging status of the chip. The magnitude of the compensation pressure is dynamically adjusted according to the real-time aging status of the chip, which helps to mitigate the impact of pressure on accelerated aging and ensures that the chip maintains high performance without degradation and functional failure in the working state.

[0056] The aging sensor will be further explained based on the above embodiments.

[0057] like Figure 2 As shown, Figure 2 Multiple inverters connected end-to-end by dashed lines constitute a first ring oscillator 101, and multiple inverters connected end-to-end by solid lines constitute a second ring oscillator 102. Optionally, the first ring oscillator 101 and the second ring oscillator 102 are symmetrically arranged to reduce the impact of the layout dependent effect (LDE). Optionally, the number of inverters in the first ring oscillator 101 and the second ring oscillator 102 is odd and prime to cancel out harmonic phenomena in the ring oscillators.

[0058] Optionally, the aging sensor may also include a first switching element, PYoung.

[0059] The first switching element PYoung is connected to the first ring oscillator 101. The first switching element PYoung is used to close within a first time period to control the first ring oscillator 101 to work.

[0060] Optionally, the aging sensor also includes a second switching element PAged.

[0061] The second switching element PAged is connected to the second ring oscillator 102, and the second switching element PAged is used to control the second ring oscillator 102 to work continuously.

[0062] like Figure 2 As shown, the input port Count_En is a switch that controls the first counter 103 and the second counter 104. When the input port Count_En is high and the power domain is normally powered, the first counter 103 and the second counter 104 can work. The first ring oscillator 101 and the second ring oscillator 102 are controlled by the first switching element PYoung and the second switching element PAged, respectively. Under the same working environment (same voltage and temperature), the first switching element PYoung can be continuously in the on state so that the second ring oscillator 102 in this path can work continuously to achieve the aging purpose. The first switching element PYoung is only turned on in the initial stage and when it is necessary to count the number of oscillations after each preset time interval so that the first ring oscillator 101 can work to count.

[0063] When counting is required, the first counter 103 and the second counter 104 are first cleared, and the input port is set to low level (invalid). Then, the input port Count_En is set to high level (valid). The power supply module 200 supplies power normally, and the first switching element PYoung and the second switching element Paged are closed simultaneously. Each time the waveform of the inverter in the first ring oscillator 101 and the second ring oscillator 102 is inverted, the corresponding counter is incremented by 1. After the first counter 103 and the second counter 104 have worked for a first duration, the input port Count_En is set to low level (invalid) again. The first counter 103 and the second counter 104 transmit the counting result to the calculation module 105 for processing through the output ports ROAged and ROYoung, respectively. The number of bits in the output ports of the first counter 103 and the second counter 104 is related to the maximum count value. For example, if the maximum count value is 255, then the number of bits in the output port must be at least 8 bits. After counting is complete, the input port Count_En is set to high level (valid), and only the second switching element Paged is closed, allowing the second ring oscillator 102 to continue working. When it is necessary to count the number of oscillations again after a preset time interval, the above process is repeated.

[0064] Optionally, the calculation module 105 is used to determine the aging coefficient based on the first oscillation number, the second oscillation number, the third oscillation number, and the fourth oscillation number, and to determine the compensation voltage value based on the aging coefficient and the voltage sensitivity coefficient corresponding to the chip's operating voltage.

[0065] Optional, such as Figure 3 As shown, the aging sensor also includes: register array 106. Figure 3 The oscillator module 301 is used to simplify the representation of the first ring oscillator 101, the second ring oscillator 102, the first counter 103, and the second counter 104.

[0066] The register array is used to store the correspondence between the operating voltage and the voltage sensitivity coefficient, and outputs the voltage sensitivity coefficient corresponding to the chip's operating voltage to the calculation module.

[0067] The operating voltage of the chip here refers to the operating voltage of the chip under different application scenarios or different working scenarios, rather than the chip's real-time precise voltage value. For example, the chip's operating voltage is 0.8V in one working scenario, and the chip's real-time precise voltage value may fluctuate around 0.8V in that scenario. In another working scenario, the operating voltage is 1V, and the chip's real-time precise voltage value may fluctuate around 1V in that scenario.

[0068] The following further explains how to determine the aging coefficient, voltage sensitivity coefficient, etc., in conjunction with the method embodiments. Figure 4 This application provides a flowchart illustrating an aging compensation method, which is applied to the aforementioned aging sensor. The method includes:

[0069] S401: Control the first ring oscillator and the second ring oscillator to work within the initial first duration, and obtain the first oscillation number a1 of the first ring oscillator within the initial first duration and the third oscillation number a3 of the second ring oscillator within the initial first duration, and then control the second ring oscillator to continue working.

[0070] In this context, controlling the operation of the first and second ring oscillators within the initial first time period means operating them at the chip's operating voltage V1. Initially, the oscillation counts of the first and second ring oscillators are recorded respectively. Subsequently, the first ring oscillator, serving as a reference, ceases operation, while the second ring oscillator, serving as an aging target, continues operation.

[0071] Optionally, after obtaining the first oscillation count a1 and the third oscillation count a3, in order to obtain the voltage sensitivity coefficient s under the operating voltage, the second ring oscillator can be controlled to operate at the maximum operating voltage for a first duration, and the fifth oscillation count a5 of the second ring oscillator operating at the maximum operating voltage for the first duration can be obtained accordingly. Based on the third oscillation count a3, the fifth oscillation count a5, the chip's operating voltage V1, and the maximum operating voltage V2, the voltage sensitivity coefficient s is determined. The voltage sensitivity coefficient s is (a5 / a3-1) / (V2-V1). After controlling the second ring oscillator to operate at the maximum operating voltage for the first duration, the second ring oscillator is then controlled to continue operating at the operating voltage.

[0072] It should be noted that the voltage sensitivity coefficient can also be obtained through simulation testing.

[0073] S402. After a preset time interval, control the first ring oscillator and the second ring oscillator to work for a first duration, obtain the second oscillation number a2 of the first ring oscillator within the first duration and the fourth oscillation number a4 of the second ring oscillator within the first duration, and then control the second ring oscillator to continue working; based on the first oscillation number a1, the second oscillation number a2, the third oscillation number a3 and the fourth oscillation number a4, determine the compensation voltage value P for aging compensation of the chip after the preset time interval, and repeat this step until the chip voltage reaches the maximum operating voltage V2.

[0074] After a preset time interval, both the first and second ring oscillators operate for a first duration to obtain the corresponding number of oscillations in order to determine the compensation voltage value for aging compensation of the chip. After that, the first ring oscillator stops operating as a reference object, while the second ring oscillator continues to operate as the aging object.

[0075] Optionally, the aging coefficient o can be determined based on the first oscillation number a1, the second oscillation number a2, the third oscillation number a3, and the fourth oscillation number a4.

[0076] Optionally, the ratio of the second oscillation number to the first oscillation number a1 is determined as the first variation coefficient c1, i.e., c1 = a2 / a1, and the ratio of the fourth oscillation number a4 to the third oscillation number a3 is determined as the second variation coefficient c2, i.e., c2 = a4 / a3. The difference between the first variation coefficient c1 and the second variation coefficient c2 is determined as the aging coefficient o, i.e., o = c1 - c2.

[0077] The compensation voltage value P is determined based on the aging factor 'o' and the voltage sensitivity factor 's' corresponding to the chip's operating voltage, where P = 'o' / s. It should be noted that if the value of P is less than 0, then P is set to 0. When performing aging compensation on the chip, it is necessary to ensure that the chip voltage does not exceed the maximum operating voltage V2. Therefore, if the total compensation voltage value is greater than or equal to V2 - V1 after one or more preset time intervals, voltage compensation will no longer be performed.

[0078] The aging compensation method in this application dynamically adjusts the power management module of the chip and adjusts the voltage according to the aging of the chip to ensure that the chip can maintain its performance. Unlike the solution of adding a fixed voltage to the chip from the beginning, the dynamic voltage adjustment in this application can effectively reduce the impact of voltage increase on chip aging, thereby ensuring that the chip does not need to increase the voltage too much after a certain period of time to maintain its working performance, and further improving the effective working life of the chip.

[0079] Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Figure 5 As shown, the electronic device 500 includes a memory 501, a processor 502, and a transceiver 503, wherein the memory 501 and the processor 502 communicate with each other. For example, the memory 501, processor 502, and transceiver 503 can communicate via a communication bus 504. The memory 501 stores a computer program, and the processor 502 executes the computer program to implement the aforementioned communication method. For instance, the processor 502 executes the relevant steps in the above method embodiments.

[0080] Optionally, the aforementioned processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. The general-purpose processor can be a microprocessor or any conventional processor. The steps in the method embodiments disclosed in this application can be directly implemented by a hardware processor, or implemented by a combination of hardware and software modules within the processor.

[0081] This application also provides a chip including the aging sensor described above.

[0082] This application also provides a chip module, including the above-described chip.

[0083] This application also provides a computer-readable storage medium, including: a computer program stored thereon, which, when executed by a processor, implements the method in any of the above method embodiments.

[0084] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the methods in any of the above method embodiments.

[0085] All or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a readable memory. When the program is executed, it performs the steps of the above method embodiments; and the aforementioned memory (storage medium) includes: read-only memory (ROM), RAM, flash memory, hard disk, solid-state drive, magnetic tape, floppy disk, optical disk, and any combination thereof.

[0086] This application describes embodiments with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processing unit of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processing unit of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0087] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0088] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1The steps of the function specified in one or more boxes.

[0089] Obviously, those skilled in the art can make various modifications and variations to the embodiments of this application without departing from the spirit and scope of this application. Therefore, if these modifications and variations to the embodiments of this application fall within the scope of the claims of this application and their equivalents, this application also intends to include these modifications and variations.

[0090] In this application, the term "comprising" and its variations can refer to non-limiting inclusion; the term "or" and its variations can refer to "and / or". The terms "first", "second", etc., in this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. In this application, "multiple" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

Claims

1. An aging sensor, characterized in that, include: A first ring oscillator, a second ring oscillator, a first counter, a second counter, and a calculation module; The first ring oscillator is used to operate for a first duration at preset time intervals, and the second ring oscillator is used to operate continuously; The first counter is used to count the number of first oscillations of the first ring oscillator within an initial first duration, and the number of second oscillations within each subsequent first duration; the second counter is used to count the number of third oscillations of the second ring oscillator within the initial first duration, and the number of fourth oscillations within each subsequent first duration. The calculation module is used to determine the aging coefficient based on the first oscillation count, the second oscillation count, the third oscillation count, and the fourth oscillation count, and to determine the compensation voltage value for aging compensation of the chip after each preset time interval based on the aging coefficient and the voltage sensitivity coefficient corresponding to the chip's operating voltage.

2. The aging sensor according to claim 1, characterized in that, Also includes: First switching element; The first switching element is connected to the first ring oscillator, and the first switching element is used to close within the first duration to control the operation of the first ring oscillator.

3. The aging sensor according to claim 1, characterized in that, Also includes: Second switching element; The second switching element is connected to the second ring oscillator, and the second switching element is used to control the second ring oscillator to work continuously.

4. The aging sensor according to claim 1, characterized in that, The calculation module is specifically used to determine the ratio of the second oscillation number to the first oscillation number as the first change coefficient, and the ratio of the fourth oscillation number to the third oscillation number as the second change coefficient; and to determine the difference between the first change coefficient and the second change coefficient as the aging coefficient.

5. The aging sensor according to claim 1, characterized in that, It also includes: register array; The register array is used to store the correspondence between the operating voltage and the voltage sensitivity coefficient, and outputs the voltage sensitivity coefficient corresponding to the operating voltage of the chip to the calculation module.

6. The aging sensor according to any one of claims 1-5, characterized in that, The first ring oscillator and the second ring oscillator are arranged symmetrically.

7. The aging sensor according to any one of claims 1-5, characterized in that, The number of inverters in the first ring oscillator and the second ring oscillator is odd and prime.

8. An aging compensation method, characterized in that, Applied to the aging sensor as described in any one of claims 1-7, the method comprises: Within an initial first duration, the first and second ring oscillators are controlled to operate, and the first number of oscillations of the first ring oscillator and the third number of oscillations of the second ring oscillator within the initial first duration are obtained. Then, the second ring oscillator is controlled to continue operating. After a preset time interval, the first and second ring oscillators are controlled to operate for a first duration. The second oscillation count of the first ring oscillator and the fourth oscillation count of the second ring oscillator within the first duration are obtained. Then, the second ring oscillator is controlled to continue operating. An aging coefficient is determined based on the first, second, third, and fourth oscillation counts. Based on the aging coefficient and the voltage sensitivity coefficient corresponding to the chip's operating voltage, a compensation voltage value for aging compensation of the chip is determined after each preset time interval. This step is repeated until the chip's voltage reaches the maximum operating voltage.

9. The method according to claim 8, characterized in that, The step of determining the aging coefficient based on the first oscillation count, the second oscillation count, the third oscillation count, and the fourth oscillation count includes: The ratio of the second oscillation number to the first oscillation number is determined as the first variation coefficient, and the ratio of the fourth oscillation number to the third oscillation number is determined as the second variation coefficient; The difference between the first variation coefficient and the second variation coefficient is determined as the aging coefficient.

10. The method according to claim 8 or 9, characterized in that, After obtaining the first number of oscillations of the first ring oscillator within the initial first duration and the third number of oscillations of the second ring oscillator within the initial first duration, the method further includes: The second ring oscillator is controlled to operate at the maximum operating voltage for a first duration, and the fifth oscillation number of the second ring oscillator during the first duration of operation at the maximum operating voltage is obtained accordingly. The voltage sensitivity coefficient is determined based on the third oscillation number, the fifth oscillation number, the chip's operating voltage, and the maximum operating voltage.

11. A chip, characterized in that, Including the aging sensor as described in any one of claims 1-7 above.

12. A chip module, characterized in that, Includes the chip as described in claim 11 above.

13. An electronic device, characterized in that, include: Memory, processor, and transceiver; The memory is used to store computer programs; The processor is configured to implement the method as described in any one of claims 8-10 when the computer program is executed.

14. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the method as described in any one of claims 8-10.

15. A computer program product, characterized in that, Includes a computer program that, when executed by a processor, implements the method of any one of claims 8-10.

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