Modular inverter burn-in test apparatus, method, and electronic device

Abstract

The application provides a modular inverter aging test device, method and electronic equipment. The modular inverter aging test device comprises at least a first inverter module and a second inverter module, the first inverter module and the second inverter module are used as a to-be-tested module and a simulation module alternately, wherein the to-be-tested module executes a plurality of to-be-tested working modes in a preset order; the simulation module executes a simulation working mode corresponding to the current to-be-tested working mode of the to-be-tested module to provide a test condition of the current to-be-tested working mode of the to-be-tested module. The application can reduce the equipment resources occupied by the aging test of the modular inverter.

Description

Technical Field

[0001] This invention relates to the field of aging test technology, and in particular to a modular inverter aging test device, method and electronic equipment. Background Technology

[0002] A converter is an electrical device that changes the voltage, frequency, number of phases, and other electrical quantities or characteristics of a power supply system. There are various types, such as rectifiers (AC to DC), inverters (DC to AC), AC converters, and DC converters. With the development of converter technology, modular inverters have emerged, and due to their assemblable nature, they have gradually become a key product for major manufacturers.

[0003] Currently, modular inverters need to undergo aging tests before leaving the factory. However, modular inverters require a DC power source and a power grid to perform aging tests, which consumes a lot of equipment resources. Summary of the Invention

[0004] This invention provides a modular inverter aging test device, method, and electronic equipment to solve the problem of excessive equipment resource consumption during modular inverter aging tests.

[0005] In a first aspect, embodiments of the present invention provide a modular inverter aging test device, comprising at least a first inverter module and a second inverter module, wherein the PV terminal of the first inverter module is electrically connected to the PV terminal of the second inverter module; the battery terminal of the first inverter module is electrically connected to the battery terminal of the second inverter module; the load terminal of the first inverter module is electrically connected to the load terminal of the second inverter module; the grid-connected terminal of the first inverter module is electrically connected to the grid-connected terminal of the second inverter module, and both the grid-connected terminals of the first inverter module and the second inverter module are connected to the power grid;

[0006] The first inverter module and the second inverter module take turns serving as the module under test (DUT) and the simulation module, respectively. The DUT executes multiple DUT operating modes in a preset order. The simulation module executes a simulation operating mode corresponding to the current DUT operating mode of the DUT to provide the test conditions for the current DUT operating mode of the DUT.

[0007] In one possible implementation, the multiple operating modes under test include a first MPPT mode with an operating path from PV to the grid, a second MPPT mode with an operating path from PV to the battery, a battery discharge mode with an operating path from the battery to the grid, and a battery charging mode with an operating path from the grid to the battery.

[0008] The simulation working mode corresponding to the first MPPT mode is the first MPPT simulator mode with the working path from the grid to the PV. The simulation working mode corresponding to the second MPPT mode is the second MPPT simulator mode with the working path from the battery to the PV. The simulation working mode corresponding to the battery discharge mode is the simulated battery charging mode with the working path from the grid to the battery. The simulation working mode corresponding to the battery charging mode is the simulated battery discharge mode with the working path from the battery to the grid.

[0009] In one possible implementation, the preset order is any of the following: first MPPT mode, second MPPT mode, battery discharge mode, and battery charging mode.

[0010] In a second aspect, embodiments of the present invention provide a modular inverter aging test method, applied to the modular inverter aging test apparatus described in the first aspect or any possible implementation thereof, the method comprising:

[0011] The simulation module obtains the current working mode of the test module;

[0012] The simulation module determines the target simulation working mode corresponding to the current working mode under test of the test module according to the preset correspondence; wherein, the preset correspondence records the simulation working mode corresponding to any working mode under test;

[0013] The simulation module executes the target simulation working mode.

[0014] In one possible implementation, before the simulation module acquires the current operating mode under test of the test module, the modular inverter aging test method further includes:

[0015] The module under test sends a first instruction to the simulation module; wherein, the first instruction carries the target operating mode to be executed by the module under test;

[0016] After receiving the first instruction, the simulation module returns a second instruction to the module under test, so that the module under test executes the target working mode under test;

[0017] The simulation module obtains the current working mode of the test module, including:

[0018] The simulation module determines the target operating mode to be tested as the current operating mode to be tested of the test module.

[0019] In one possible implementation, the simulation module obtains the current working mode of the test module, including:

[0020] The simulation module acquires the port information of the module under test; the port information includes the electrical status of the PV terminal, battery terminal, load terminal, and grid-connected terminal.

[0021] The simulation module determines the current working mode of the test module based on the port information.

[0022] In one possible implementation, the simulation module determines a target simulation operating mode corresponding to the current operating mode under test of the test module, based on a preset correspondence, including:

[0023] When the current test mode of the test module is the first MPPT mode, the simulation module will determine the first MPPT simulator mode as the target simulation mode.

[0024] When the test module is currently operating in the second MPPT mode, the simulation module will determine the second MPPT simulator mode as the target simulation operating mode.

[0025] If the current test mode of the test module is the battery discharge mode, the simulation module will determine the simulated battery charging mode as the target simulated operating mode.

[0026] If the current test mode of the test module is the battery charging mode, the simulation module will determine the simulated battery discharging mode as the target simulated operating mode.

[0027] In one possible implementation, the aging test method for modular inverters also includes:

[0028] The first inverter module sends a third command to the second inverter module to make the second inverter module act as an analog module.

[0029] In one possible implementation, the aging test method for modular inverters also includes:

[0030] When the first inverter module completes multiple test modes in a preset order, the first inverter module sends a fourth instruction to the second inverter module to make the second inverter module the test module.

[0031] Thirdly, embodiments of the present invention provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the method as described in the second aspect above or any possible implementation of the second aspect.

[0032] This invention provides a modular inverter aging test apparatus, method, and electronic device. The modular inverter aging test apparatus includes at least a first inverter module and a second inverter module. The PV terminal, battery terminal, load terminal, and grid-connected terminal of the first inverter module and the second inverter module are connected respectively, and both the grid-connected terminals of the first and second inverter modules are connected to the power grid. During aging testing, the first and second inverter modules in the modular inverter aging test apparatus take turns serving as the module under test (DUT) and the simulation module. Since the DUT sequentially executes multiple DUT operating modes according to a preset order, and the simulation module executes a simulation operating mode corresponding to the current DUT operating mode of the DUT, it provides the test conditions for the current DUT operating mode. Therefore, the two inverter modules in the modular inverter can be used for mutual aging tests. Thus, when using the modular inverter aging test apparatus to perform aging tests on a modular inverter, there is no need to connect a DC power source, thereby greatly saving the equipment resources required for aging testing. Attached Figure Description

[0033] To more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 This is a schematic diagram of the structure of a modular inverter aging test device provided in an embodiment of the present invention;

[0035] Figure 2 This is a flowchart illustrating the implementation of a modular inverter aging test method provided in an embodiment of the present invention.

[0036] Figure 3 This is a schematic diagram of an electronic device provided in an embodiment of the present invention; Detailed Implementation

[0037] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of the invention. However, those skilled in the art will understand that the invention can be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods are omitted so as not to obscure the description of the invention with unnecessary detail.

[0038] To make the objectives, technical solutions, and advantages of the present invention clearer, specific embodiments will be described below in conjunction with the accompanying drawings.

[0039] As described in related technologies, existing modular inverters require a DC power source and a power grid for aging tests, resulting in significant equipment resource consumption for aging tests. Furthermore, the energy consumption for aging tests is also substantial.

[0040] To address the problems of existing technologies, embodiments of the present invention provide a modular inverter aging test apparatus, method, and electronic device. The modular inverter aging test apparatus provided by the embodiments of the present invention will be described first below.

[0041] This invention provides a modular inverter aging test device, such as... Figure 1 As shown, the test device includes at least a first inverter module 11 and a second inverter module 12. During testing, the first inverter module 11 and the second inverter module 12 need to be connected according to the following connection relationship: the PV terminal of the first inverter module 11 is electrically connected to the PV terminal of the second inverter module 12; the battery terminal BAT of the first inverter module 11 is electrically connected to the battery terminal BAT of the second inverter module 12; the load terminal LOAD of the first inverter module 11 is electrically connected to the load terminal LOAD of the second inverter module 12; and the grid-connected terminal GRID of the first inverter module 11 is electrically connected to the grid-connected terminal GRID of the second inverter module 12. Furthermore, both the grid-connected terminals GRID of the first inverter module 11 and the second inverter module 12 are connected to the AC source of the power grid.

[0042] It should be noted that the PV terminal and battery terminal of the first inverter module 11 and the second inverter module 12 can be electrically connected through a converter circuit, such as a DC-DC converter circuit or a DC-AC converter circuit, to ensure the normal operation of the two inverter modules.

[0043] After the first inverter module 11 and the second inverter module 12 are connected according to the above connection relationship, the aging test of the modular inverter can begin. During the aging test, the first inverter module 11 and the second inverter module 12 take turns serving as the module under test and the simulation module. For the module under test, it can sequentially execute multiple test operating modes according to a preset order. For the simulation module, it can execute a simulation operating mode corresponding to the current test operating mode of the module under test, so as to provide the test conditions for the current test operating mode of the module under test. In this way, different operating modes can be set for different inverter modules in the modular inverter, achieving the purpose of mutual aging test, and the energy circulates within the modular inverter, thus achieving energy saving effect.

[0044] As can be seen from the above introduction, the modular inverter aging test device is essentially a modular inverter, except that the modular inverter needs to be configured according to the connection relationship and test logic of the aforementioned aging test.

[0045] The following section provides a detailed introduction to the working mode of the module under test and the simulation mode of the simulation module.

[0046] For the module under test, the multiple operating modes it executes may include a first MPPT mode with the operating path from PV to the grid, a second MPPT mode with the operating path from PV to the battery, a battery discharge mode with the operating path from the battery to the grid, and a battery charging mode with the operating path from the grid to the battery.

[0047] For the simulation module, the simulation working modes executed corresponding to the working mode under test are as follows: the simulation working mode corresponding to the first MPPT mode is the first MPPT simulator mode with the working path from the grid to the PV; the simulation working mode corresponding to the second MPPT mode is the second MPPT simulator mode with the working path from the battery to the PV; the simulation working mode corresponding to the battery discharge mode is the simulated battery charging mode with the working path from the grid to the battery; and the simulation working mode corresponding to the battery charging mode is the simulated battery discharge mode with the working path from the battery to the grid.

[0048] It should be noted that the essence of aging testing is to test the operating paths of the inverter modules in the modular inverter, namely the operating paths from PV to the grid, PV to the battery, battery to the grid, and grid to the battery mentioned above. Since the inverter modules are not connected to the PV in the above connection relationships, and the applicant discovered that the inverter modules have the function of simulating PV and MPPT (Maximum PowerPoint Tracking), it is possible to use one inverter module in the modular inverter to provide test conditions for another inverter module, thereby achieving the purpose of mutual aging testing between the two inverter modules in the modular inverter.

[0049] It is worth mentioning that if a modular inverter includes three or more inverter modules, the same test logic can be used. Simply combine any two inverter modules to form the aforementioned module under test and simulation module. After one inverter module has been tested, replace the next inverter module. In this way, mutual aging tests of three or more inverter modules can be completed.

[0050] In some embodiments, the preset order in which the module under test (DUT) sequentially executes multiple operating modes can be varied. For example, the preset order can be any arrangement of the first MPPT mode, the second MPPT mode, the battery discharge mode, and the battery charging mode. As shown in Table 1, one preset order is provided.

[0051] Table 1

[0052] The following section describes the aging test method for modular inverters provided in the embodiments of the present invention.

[0053] See Figure 2 The document illustrates a flowchart of the modular inverter aging test method provided in an embodiment of the present invention. This modular inverter aging test method is applied to the aforementioned modular inverter aging test device, and is described in detail below:

[0054] Step 210: The simulation module obtains the current working mode of the test module.

[0055] In some embodiments, a specific inverter module in the modular inverter can be pre-designated as the master control module, and then the master control module determines and assigns its identity. Specifically, the first inverter module can be set as the master control module, in which case the first inverter module can send a third instruction to the second inverter module to set its identity, thereby setting the second inverter module as an analog module.

[0056] In some embodiments, the simulation module can obtain the current working mode of the test module in a variety of ways.

[0057] For example, the module under test (DUT) can send a first instruction to the simulation module, which carries the target operating mode that the DUT is about to execute. Upon receiving the first instruction, the simulation module obtains the target operating mode that the DUT is about to execute. Since this target operating mode will be executed immediately, it becomes the simulation module's current operating mode. Thus, the simulation module can determine the target operating mode as the current operating mode of the DUT. Furthermore, the simulation module needs to notify the DUT, such as by returning a second instruction, to inform the DUT that it has successfully received the first instruction and to instruct the DUT to execute the target operating mode.

[0058] For example, the simulation module can obtain the current operating mode of the test module through the port information of the module under test (DUT). This port information includes the electrical status of the PV terminal, battery terminal, load terminal, and grid-connected terminal, such as voltage or current values. In this way, the simulation module can obtain the port information of the DUT and then determine the current operating mode of the test module based on the port information.

[0059] Step 220: The simulation module determines the target simulation working mode corresponding to the current working mode under test of the test module according to the preset correspondence.

[0060] Specifically, a preset correspondence record stores the simulated operating modes corresponding to any operating mode under test. For example, if the current operating mode under test for the test module is the first MPPT mode, the simulation module will determine the first MPPT simulator mode as the target simulated operating mode. If the current operating mode under test for the test module is the second MPPT mode, the simulation module will determine the second MPPT simulator mode as the target simulated operating mode. If the current operating mode under test for the test module is the battery discharge mode, the simulation module will determine the simulated battery charging mode as the target simulated operating mode. If the current operating mode under test for the test module is the battery charging mode, the simulation module will determine the simulated battery discharge mode as the target simulated operating mode.

[0061] Step 230: The simulation module executes the target simulation working mode.

[0062] In this way, the module under test (DUT) and the simulation module can complete the aging test of the DUT sequentially according to a preset order. Afterward, the DUT and the simulation module can switch roles and then complete the aging test of another inverter module according to the aforementioned test logic.

[0063] Taking the first inverter module as the module under test as an example, when the first inverter module executes multiple working modes under test in a preset order, the first inverter module can send a fourth instruction to the second inverter module to make the second inverter module the module under test, thereby performing an aging test on the second inverter module.

[0064] In this embodiment of the invention, a modular inverter aging test device is provided, comprising at least a first inverter module and a second inverter module. The PV terminal, battery terminal, load terminal, and grid-connected terminal of the first inverter module and the second inverter module are connected respectively, and both the grid-connected terminals of the first and second inverter modules are connected to the power grid. During aging testing, the first and second inverter modules in the modular inverter aging test device take turns serving as the module under test (DUT) and the simulation module. Since the DUT executes multiple DUT operating modes sequentially according to a preset order, and the simulation module executes a simulation operating mode corresponding to the current DUT operating mode of the DUT, providing the test conditions for the current DUT operating mode, the two inverter modules in the modular inverter can be used for mutual aging tests. Thus, when using the modular inverter aging test device to perform aging tests on a modular inverter, there is no need to connect a DC power source, thereby greatly saving the equipment resources required for aging testing.

[0065] This invention also provides a computer program product having program code that, when run in a corresponding processor, controller, computing device, or terminal, executes the steps in any of the above-described modular inverter aging test method embodiments, for example... Figure 2 Steps 210 to 230 are shown. Those skilled in the art will understand that the methods and apparatus proposed in the embodiments of the present invention can be implemented in various forms, including hardware, software, firmware, dedicated processors, or combinations thereof. Dedicated processors may include application-specific integrated circuits (ASICs), reduced instruction set computers (RISCs), and / or field-programmable gate arrays (FPGAs). The proposed methods and apparatus are preferably implemented as a combination of hardware and software. The software is preferably installed as an application program on a program storage device. This is typically based on a machine with a computer platform, such as one or more central processing units (CPUs), random access memory (RAM), and one or more input / output (I / O) interfaces. An operating system is also typically installed on the computer platform. The various processes and functions described herein may be part of an application program, or a portion thereof may be executed by an operating system.

[0066] Figure 3 This is a schematic diagram of the electronic device 3 provided in an embodiment of the present invention. Figure 3 As shown, the electronic device 3 in this embodiment includes: a processor 30, a memory 31, and a computer program 32 stored in the memory 31 and executable on the processor 30. When the processor 30 executes the computer program 32, it implements the steps in the various modular inverter aging test method embodiments described above, for example... Figure 2 Steps 210 to 230 are shown.

[0067] For example, the computer program 32 may be divided into one or more modules, which are stored in the memory 31 and executed by the processor 30 to complete the present invention. The one or more modules may be a series of computer program instruction segments capable of performing specific functions, which describe the execution process of the computer program 32 in the electronic device 3.

[0068] The electronic device 3 may include, but is not limited to, a processor 30 and a memory 31. Those skilled in the art will understand that... Figure 3 This is merely an example of electronic device 3 and does not constitute a limitation on electronic device 3. It may include more or fewer components than shown, or combine certain components, or different components. For example, the electronic device may also include input / output devices, network access devices, buses, etc.

[0069] The processor 30 may be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0070] The memory 31 can be an internal storage unit of the electronic device 3, such as a hard disk or memory. The memory 31 can also be an external storage device of the electronic device 3, such as a plug-in hard disk, smart media card (SMC), secure digital card (SD), flash card, etc., equipped on the electronic device 3. Furthermore, the memory 31 can include both internal and external storage units of the electronic device 3. The memory 31 is used to store the computer program and other programs and data required by the electronic device. The memory 31 can also be used to temporarily store data that has been output or will be output.

[0071] Those skilled in the art will understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the functions described above can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this invention. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0072] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0073] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0074] In the embodiments provided by this invention, it should be understood that the disclosed apparatus / terminal devices and methods can be implemented in other ways. For example, the apparatus / terminal device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0075] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0076] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0077] If the integrated module is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the above embodiments of the present invention can also be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the above-described modular inverter aging test method embodiments. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include: any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium, etc.

[0078] Furthermore, the features of the embodiments shown in the accompanying drawings or the various embodiments mentioned in this specification should not be construed as independent embodiments. Rather, each feature described in one example of an embodiment can be combined with one or more other desired features from other embodiments to produce other embodiments not described in words or with reference to the drawings.

[0079] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included within the protection scope of the present invention.

Claims

1. A modular inverter aging test device, characterized in that, It includes at least a first inverter module and a second inverter module, and does not require a DC power source connection; wherein, the PV terminal of the first inverter module is electrically connected to the PV terminal of the second inverter module; the battery terminal of the first inverter module is electrically connected to the battery terminal of the second inverter module; the load terminal of the first inverter module is electrically connected to the load terminal of the second inverter module; the grid-connected terminal of the first inverter module is electrically connected to the grid-connected terminal of the second inverter module, and both the grid-connected terminals of the first inverter module and the second inverter module are connected to the power grid; The first inverter module and the second inverter module take turns serving as the module under test (DUT) and the simulation module, respectively. The DUT executes multiple DUT operating modes sequentially according to a preset order. The simulation module executes a simulation operating mode corresponding to the current DUT operating mode of the DUT to provide test conditions for the current DUT operating mode. The multiple DUT operating modes include a first MPPT mode with a working path from PV to the grid and a second MPPT mode with a working path from PV to the battery. The simulation operating mode corresponding to the first MPPT mode is the first MPPT simulator mode with a working path from the grid to PV, and the simulation operating mode corresponding to the second MPPT mode is the second MPPT simulator mode with a working path from the battery to PV.

2. The modular inverter aging test device according to claim 1, characterized in that, The multiple operating modes to be tested include a battery discharge mode with an operating path from battery to grid and a battery charging mode with an operating path from grid to battery. The simulated operating mode corresponding to the battery discharge mode is the simulated battery charging mode with the operating path from the power grid to the battery, and the simulated operating mode corresponding to the battery charging mode is the simulated battery discharge mode with the operating path from the battery to the power grid.

3. The modular inverter aging test device according to claim 2, characterized in that, The preset order is any one of the following arrangements: the first MPPT mode, the second MPPT mode, the battery discharge mode, and the battery charging mode.

4. An aging test method for a modular inverter, characterized in that, The method, applied to the modular inverter aging test apparatus as described in any one of claims 1-3, comprises: The simulation module obtains the current working mode of the test module; The simulation module determines a target simulation working mode corresponding to the current working mode under test of the test module according to a preset correspondence; wherein, the preset correspondence records the simulation working mode corresponding to any of the working modes under test. The simulation module executes the target simulation working mode.

5. The aging test method for modular inverters according to claim 4, characterized in that, Before the simulation module obtains the current working mode of the test module, the method further includes: The module under test sends a first instruction to the simulation module; wherein the first instruction carries the target working mode to be executed by the module under test. After receiving the first instruction, the simulation module returns a second instruction to the module under test, so that the module under test executes the target working mode under test; The simulation module obtains the current working mode of the test module, including: The simulation module determines the target working mode to be tested as the current working mode to be tested of the test module.

6. The aging test method for modular inverters according to claim 4, characterized in that, The simulation module obtains the current working mode of the test module, including: The simulation module acquires the port information of the module under test; wherein, the port information includes the electrical status of the PV terminal, battery terminal, load terminal and grid-connected terminal; The simulation module determines the current working mode of the test module based on the port information.

7. The aging test method for modular inverters according to claim 4, characterized in that, The simulation module determines a target simulation working mode corresponding to the current working mode under test of the test module according to a preset correspondence, including: When the current test mode of the test module is the first MPPT mode, the simulation module determines the first MPPT simulator mode as the target simulation mode; When the current test mode of the test module is the second MPPT mode, the simulation module determines the second MPPT simulator mode as the target simulation mode; When the current test mode of the test module is the battery discharge mode, the simulation module will determine the simulated battery charging mode as the target simulated operating mode. When the current test mode of the test module is the battery charging mode, the simulation module will determine the simulated battery discharging mode as the target simulated operating mode.

8. The aging test method for modular inverters according to claim 4, characterized in that, The method further includes: The first inverter module sends a third instruction to the second inverter module to make the second inverter module act as the analog module.

9. The aging test method for modular inverters according to claim 8, characterized in that, The method further includes: When the first inverter module completes multiple test modes in a preset order, the first inverter module sends a fourth instruction to the second inverter module so that the second inverter module is the test module.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method as described in any one of claims 4 to 9 above.

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