Method and system for establishing a dipole moment model

CN115935584BActive Publication Date: 2026-10-23REALTEK SEMICON CORP
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Patent Information

Application Number
CN202210756048.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Priority Date
2021-10-06
Filing Date
2022-06-29
Publication Date
2026-10-23
Estimated Expiration
2042-06-29

AI Technical Summary

Technical Problem

因此,已知方法的运算量大且运算时间长,对于操作者来说并不方便

Benefits of technology

[0005] In summary, the method and system disclosed herein design a digital filter under the same conditions as near-field measurements, and apply this digital filter to the electric and magnetic divergence fields generated by near-field measurements to perform calculations, thereby obtaining a dipole moment model equivalent to the circuit under test. Compared to known methods that use tensor matrices to perform pseudo-inverse matrix operations, the method and system disclosed herein have less computational load, shorter computation time, and similar accuracy.

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Abstract

The present disclosure provides a method and system for establishing a dipole moment model. The method for establishing a dipole moment model is suitable for a circuit under test, and includes: performing a near-field measurement on the circuit under test to obtain a near-field electric field and a near-field magnetic field associated with the circuit under test; performing a two-dimensional divergence operation on the near-field electric field and the near-field magnetic field to obtain a near-field electric divergence field and a near-field magnetic divergence field; performing a convolution operation on the near-field electric divergence field and the near-field magnetic divergence field by using a digital filter; and constructing a dipole moment matrix equivalent to the circuit under test according to a result of the convolution operation.
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Description

Technical Field

[0001] This disclosure relates to a method and system for establishing a dipole moment model, and in particular to a method and system for establishing a dipole moment model by analyzing a divergence field. Background Technology

[0002] Known methods for establishing dipole moment models require the use of tensor matrices to perform pseudo-inverse matrix operations with the measured electromagnetic field, thereby converting the electromagnetic field into a dipole moment model equivalent to the circuit under test. Since these methods are prone to inaccurate dipole moment values ​​due to noise interference, they also employ regularization parameters to reduce noise interference. However, there is no set criterion for selecting regularization parameters; in practice, multiple parameters must be substituted into the calculations, and the result with the smallest error must be selected to find the appropriate regularization parameters. Therefore, known methods are computationally intensive and time-consuming, making them inconvenient for operators. Summary of the Invention

[0003] One aspect of this disclosure is a method for establishing a dipole moment model. This method, applicable to a circuit under test, includes: performing near-field measurements on the circuit under test to obtain a near-field electric field and a near-field magnetic field associated with the circuit under test; performing a two-dimensional divergence operation on the near-field electric field and the near-field magnetic field to obtain a near-field electric divergence field and a near-field magnetic divergence field; performing a convolution operation on the near-field electric divergence field and the near-field magnetic divergence field using a digital filter; and constructing a dipole moment matrix equivalent to the circuit under test based on the convolution operation result.

[0004] Another aspect of this disclosure is a dipole moment modeling system. This system, applicable to circuits under test (DUTs), includes an electromagnetic scanner and a processing device. The electromagnetic scanner performs near-field measurements on the DUTs to obtain near-field electric and magnetic fields associated with them. The processing device, coupled to the electromagnetic scanner, performs: two-dimensional divergence operations on the near-field electric and magnetic fields to obtain near-field electric and magnetic divergence fields; performs convolution operations on the near-field electric and magnetic divergence fields using a digital filter; and constructs a dipole moment matrix equivalent to the DUTs based on the convolution results.

[0005] In summary, the method and system disclosed herein design a digital filter under the same conditions as near-field measurements, and apply this digital filter to the electric and magnetic divergence fields generated by near-field measurements to perform calculations, thereby obtaining a dipole moment model equivalent to the circuit under test. Compared to known methods that use tensor matrices to perform pseudo-inverse matrix operations, the method and system disclosed herein have less computational load, shorter computation time, and similar accuracy. Attached Figure Description

[0006] Figure 1 This is a block diagram illustrating a dipole moment model for establishing a system, based on some embodiments disclosed herein.

[0007] Figure 2 This is a flowchart illustrating a method for establishing a dipole moment model based on some embodiments of this disclosure.

[0008] Figure 3 This is a schematic diagram illustrating a unit dipole moment according to some embodiments of the present disclosure.

[0009] Figure 4 This is a schematic diagram illustrating a simulated electric divergence field based on some embodiments of the present disclosure.

[0010] Figure 5 This is a schematic diagram of a first sub-filter illustrated according to some embodiments of the present disclosure.

[0011] Figure 6 This is a schematic diagram illustrating a simulated magnetic divergence field based on some embodiments disclosed herein.

[0012] Figure 7 This is a schematic diagram of a second sub-filter illustrated according to some embodiments of the present disclosure. Detailed Implementation

[0013] The following detailed description of embodiments, in conjunction with the accompanying drawings, is provided. However, the specific embodiments described are only for explaining this case and are not intended to limit this case. The description of the structural operations is not intended to limit the order of their execution. Any structure that is recombined from the components and produces a device with equivalent functionality is within the scope of this disclosure.

[0014] Unless otherwise specified, the terms used throughout the specification and the scope of the patent application generally have their ordinary meaning in the context of the field, the content disclosed herein, and the specific content.

[0015] The terms "coupled" or "connected" as used in this article can refer to two or more components making direct physical or electrical contact with each other, or making indirect physical or electrical contact with each other, or to two or more components operating or moving together.

[0016] Please see Figure 1 , Figure 1This description illustrates a dipole moment modeling system 100 according to certain embodiments of the present disclosure. The dipole moment modeling system 100 includes an electromagnetic scanner 110 and a processing device 120. In some embodiments, the dipole moment modeling system 100 constructs a dipole moment matrix (not shown) equivalent to the circuit under test 10 by measuring the electromagnetic field generated by the circuit under test 10 in the near field 12. Since the distribution of multiple dipole moments in the equivalent dipole moment matrix is ​​associated with different signal sources (e.g., noise sources) on the circuit under test 10, the operator of the dipole moment modeling system 100 can identify noise sources on the circuit under test 10 based on the equivalent dipole moment matrix.

[0017] like Figure 1 As shown, the electromagnetic scanner 110 is electrically coupled to the processing device 120 and is used to perform near-field measurements on the circuit under test 10 to obtain the distribution of the electromagnetic field generated by the circuit under test 10 in the near-field 12. In some embodiments, the near-field 12 is located at a predetermined height (e.g., but not limited to 50 mils) above the ground plane (not shown) of the circuit under test 10. The processing device 120 is used to receive and analyze the measurement results of the electromagnetic scanner 110 to construct a dipole moment matrix equivalent to the circuit under test 10. In some embodiments, the processing device 120 may be implemented by a desktop computer, a laptop computer, or other suitable electronic computer, but this disclosure is not limited thereto.

[0018] Please see Figure 2 , Figure 2 This description illustrates a dipole moment model establishment method 200 based on certain embodiments of the present disclosure. The dipole moment model establishment method 200 can be derived from, for example... Figure 1 The dipole moment model establishment system 100 shown is used to perform this. In some embodiments, the dipole moment model establishment method 200 includes operations S201 to S205. For ease of explanation, the following will be used in conjunction with... Figures 1 to 7 This illustrates the method for establishing the dipole moment model 200.

[0019] In operation S201, the electromagnetic scanner 110 performs near-field measurements on the circuit under test 10 to obtain a near-field electric field (not shown) and a near-field magnetic field (not shown). Specifically, the near-field electric field is the electric field generated by different signal sources on the circuit under test 10 in the near field 12, and the near-field magnetic field is the magnetic field generated by different signal sources on the circuit under test 10 in the near field 12. In other words, the near-field electric field and the near-field magnetic field are associated with the circuit under test 10.

[0020] After the processing device 120 receives the measurement results from the electromagnetic scanner 110, operation S202 is executed. In operation S202, the processing device 120 performs a two-dimensional divergence operation on the near-field electric field and the near-field magnetic field to obtain a near-field electric divergence field (not shown) and a near-field magnetic divergence field (not shown). The "two-dimensional divergence operation" described herein is understood by those skilled in the art to which this disclosure pertains, and therefore will not be elaborated upon here.

[0021] In operation S203, the processing device 120 operates according to an ideal unit dipole moment (e.g., Figure 3 The processing device 120 designs a digital filter using the digital filter (dp). It is worth noting that the processing device 120 can perform calculations using this digital filter to generate an equivalent dipole moment matrix to the circuit under test 10. In some embodiments, this digital filter is a finite impulse response filter. Furthermore, since the multiple dipole moments in the aforementioned equivalent dipole moment matrix to the circuit under test 10 may contain three mutually perpendicular components (i.e., a magnetic dipole moment in the Y direction, a magnetic dipole moment in the X direction, and an electric dipole moment in the Z direction), the digital filter designed by the processing device 120 also correspondingly includes three sub-filters (which will be described in detail in later paragraphs) to generate an equivalent dipole moment matrix.

[0022] Please see Figure 3 , Figure 3 The ideal unit dipole moment dp is described according to some embodiments of this disclosure. Similar to the multiple dipole moments in the dipole moment matrix equivalent to the circuit under test 10 described above, the unit dipole moment dp used to design this digital filter also comprises three mutually perpendicular components. Figure 3 As shown, the unit dipole moment dp includes the unit magnetic dipole moment M. x (For example: 1 ampere * meter square (A * m) 2 )), unit magnetic dipole moment M y and unit electric dipole moment P z And the unit magnetic dipole moment M x Unit magnetic dipole moment M y With unit electric dipole moment P z The three are perpendicular to each other.

[0023] It is worth noting that this disclosure designs the digital filter by analyzing the various fields generated by the unit dipole moment dp under the same conditions as the circuit under test 10 (or near-field measurement), thereby applying the digital filter to the various fields obtained by measuring the circuit under test 10 (e.g., the near-field electric divergence field and near-field magnetic divergence field generated in operation S202). In other words, the unit dipole moment dp is assumed to be located at a position corresponding to the electronic component (or signal source) on the circuit under test 10, and the analysis is based on the various fields generated by the unit dipole moment dp at the position corresponding to the near field 12.

[0024] In some practical applications, the electronic components on the circuit under test 10 are located at a mil height above the ground plane 10 of the circuit under test 10, and the electromagnetic field measured by the electromagnetic scanner 110 is located in the near field 12 at a distance of 50 mils from the ground plane of the circuit under test 10. Accordingly, assuming that the unit dipole moment dp is located at a distance of 5 mils from the ground plane Gnd, various fields generated by the unit dipole moment dp in a plane (not shown in the figure) at a distance of 50 mils from the ground plane Gnd are analyzed.

[0025] The design process of the three sub-filters of this digital filter (i.e., the first sub-filter, the second sub-filter, and the third sub-filter, described below) will be explained in detail below:

[0026] In the design process of the first sub-filter, the processing device 120 first determines the design based on the unit electric dipole moment P. z The simulated electric field (not shown in the figure) was calculated. As explained above, the simulated electric field is located in a plane 50 mils above the ground plane Gnd. Furthermore, the simulated electric field can be calculated using theories known to those skilled in the art (e.g., Maxwell's equations), and therefore will not be elaborated here.

[0027] The processing device 120 then performs a two-dimensional divergence calculation on the simulated electric field to obtain a simulated electric divergence field (e.g., Figure 4 (divE in the text). Please refer to [the relevant section]. Figure 4 , Figure 4 The diagram illustrates a simulated electric divergence field divE according to some embodiments of this disclosure. It will be understood that different gray levels in the simulated electric divergence field divE represent different field intensity values. Figure 4 In some embodiments, the simulated electric divergence field divE calculated by the processing device 120 has a maximum value in the central region Q1 (represented by a solid line), and the minimum value of the simulated electric divergence field divE is located in the surrounding region Q2 (represented by a dotted line) around the central region Q1. In some embodiments, the minimum value of the simulated electric divergence field divE is negative.

[0028] Accordingly, the processing device 120 determines the first sub-filter (e.g., based on the simulated electric divergence field divE) Figure 5 The shape and coefficient of FE in [the original text]. Please refer to [the original text]. Figure 5 , Figure 5 A schematic diagram of a first sub-filter FE illustrated according to some embodiments of this disclosure is shown. Figure 5 In this embodiment, the shape of the first sub-filter FE is formed by a central region p1, four first surrounding regions p2, eight second surrounding regions p3, and four third surrounding regions p4. Specifically, each first surrounding region p2 is two units away from the central region p1, each first surrounding region p2 is adjacent to two second surrounding regions p3, and each third surrounding region p4 is diagonally arranged with respect to the central region p1.

[0029] Depend on Figure 4 and Figure 5 It can be seen that the central region p1 of the first sub-filter FE corresponds to the central region Q1 of the simulated electric divergence field divE, while the region formed by the combination of multiple first surrounding regions p2, multiple second surrounding regions p3, and multiple third surrounding regions p4 corresponds to the surrounding region Q2 of the simulated electric divergence field divE. In other words, the shape of the first sub-filter FE is determined according to the field intensity distribution of the simulated electric divergence field divE.

[0030] After determining the shape of the first sub-filter FE (i.e., after planning the central region p1, multiple first surrounding regions p2, multiple second surrounding regions p3 and multiple third surrounding regions p4), the processing device 120 may then calculate the first coefficient corresponding to the central region p1, the second coefficient corresponding to the first surrounding region p2, the third coefficient corresponding to the second surrounding region p3 and the fourth coefficient corresponding to the third surrounding region p4.

[0031] In some embodiments, since the processing device 120 can obtain the unit electric dipole moment P after convolving the simulated electric divergence field divE with the first sub-filter FE, z Based on this relationship, the processing device 120 can calculate the first, second, third, and fourth coefficients of the first sub-filter FE using the least squares method. In some practical applications, the first coefficient of the first sub-filter FE is 7.98 × 10⁻⁶. -13 The second coefficient of the first sub-filter FE is -4.62 × 10⁻⁶. -14 The third coefficient of the first sub-filter FE is 8.78 × 10⁻⁶. -14 Furthermore, the fourth coefficient of the first sub-filter FE is -5.65 × 10⁻⁶. -15 .exist Figure 5 In the embodiment, the coefficients, magnitudes, or values ​​corresponding to the remaining regions of the first sub-filter FE (i.e., regions that do not belong to p1, p2, p3, and p4) are 0.

[0032] In the design process of the second sub-filter, the processing device 120 first determines the unit magnetic dipole moment M. x The simulated magnetic field (not shown in the figure) was calculated. As previously explained, this simulated magnetic field is located in a plane 50 mils above the ground plane Gnd. Furthermore, this simulated magnetic field can be calculated using theories known to those skilled in the art (e.g., Maxwell's equations), and therefore will not be elaborated upon here.

[0033] The processing device 120 then performs a two-dimensional divergence calculation on the simulated magnetic field to obtain a simulated magnetic divergence field (e.g., Figure 6 (divH in the text). Please refer to [the relevant section]. Figure 6 , Figure 6 The diagram illustrates a simulated magnetic divergence field divH according to some embodiments of this disclosure. It will be understood that different gray levels in the simulated magnetic divergence field divH represent different field intensity values. Figure 6 In the embodiment, the maximum value of the simulated magnetic divergence field divH is located in the left region N1 (represented by a solid line), and the minimum value of the simulated magnetic divergence field divH is located in the right region N2 (represented by a dotted line). Figure 6 The center point N0 in the diagram represents the unit magnetic dipole moment M. x The center point N0 is located directly above the center point N0, with the left region N1 and the right region N2 located on either side of it. It's understandable that the center point N0 doesn't actually exist on the simulated magnetic divergence field divH; it's merely used to illustrate the positional relationship between the left region N1 and the right region N2.

[0034] Accordingly, the processing device 120 determines the second sub-filter (e.g., based on the simulated magnetic divergence field divH). Figure 7 The shape and coefficients of FH in [the original text]. Please refer to [the original text]. Figure 7 , Figure 7 The diagram illustrates a second sub-filter FH according to some embodiments of this disclosure. Similar to the description of the first sub-filter FE, the processing device 120 determines the shape of the second sub-filter FH based on the field intensity distribution of the simulated magnetic divergence field divH.

[0035] like Figure 7 As shown, the shape of the second sub-filter FH is formed by a left region (corresponding to the left region N1 of the simulated magnetic divergence field divH) and a right region (corresponding to the right region N2 of the simulated magnetic divergence field divH). The left and right regions of the second sub-filter FH are located on either side of the center point m0 ​​(represented by a hollow origin), and... Figure 7 The center point m0 ​​corresponds to Figure 6The center point N0. Similarly, the center point m0 ​​does not actually exist on the second sub-filter FH; it is only used to illustrate the positional relationship between the left and right regions of the second sub-filter FH. Specifically, the left region of the second sub-filter FH includes the first central sub-region m1 and two first adjacent sub-regions m2 immediately adjacent to the first central sub-region m1 on both sides, while the right region of the second sub-filter FH includes the second central sub-region m3 and two second adjacent sub-regions m4 immediately adjacent to the second central sub-region m3 on both sides.

[0036] After determining the shape of the second sub-filter FH (i.e., after planning the first central sub-region m1, a plurality of first adjacent sub-regions m2, the second central sub-region m3, and a plurality of second adjacent sub-regions m4), the processing device 120 may then calculate the first coefficient corresponding to the first central sub-region m1, the second coefficient corresponding to the first adjacent sub-region m2, the third coefficient corresponding to the second central sub-region m3, and the fourth coefficient corresponding to the second adjacent sub-region m4.

[0037] Similar to the description of the first sub-filter FE mentioned above, since the processing device 120 can obtain the unit magnetic dipole moment M after performing a convolution operation between the simulated magnetic divergence field divH and the second sub-filter FH, x Based on this relationship, the processing device 120 can calculate the first, second, third, and fourth coefficients of the second sub-filter FH using the least squares method. In some practical applications, the first coefficient of the second sub-filter FH is 2.65 × 10⁻⁶. -12 The second coefficient of the second sub-filter FH is -1.13 × 10⁻⁶. -12 The third coefficient of the second sub-filter FH is -2.65 × 10⁻⁶. -12 Furthermore, the fourth coefficient of the second sub-filter FH is 1.13 × 10⁻⁶. -12 .exist Figure 7 In the embodiment, the coefficients, magnitudes, or values ​​corresponding to the remaining regions of the second sub-filter FH (i.e., the regions that do not belong to m1, m2, m3, and m4) are 0.

[0038] In the design of the third sub-filter, due to the unit magnetic dipole moment M x The unit magnetic dipole moment M is obtained by rotating it 90 degrees counterclockwise. y The processing device 120 can, for example Figure 7 The second sub-filter FH shown is rotated counterclockwise to generate the third sub-filter (not shown). It can be understood that the processing device 120, in the case of a unit magnetic dipole moment M... y Another simulated magnetic divergence field (not shown in the figure, different from the one produced) Figure 6 After convolving the divH with the third sub-filter, the unit magnetic dipole moment M can be obtained. ySize.

[0039] In operation S204, the processing device 120 performs convolution operations on the near-field electric divergence field and the near-field magnetic divergence field generated in operation S202 using the digital filter designed in operation S203. Specifically, the processing device 120 performs convolution operations on the near-field electric divergence field with the first sub-filter FE, and performs convolution operations on the near-field magnetic divergence field with the second sub-filter FH and the third sub-filter, respectively.

[0040] In operation S205, the processing device 120 constructs a dipole moment matrix equivalent to the circuit under test 10 based on the convolution operation result. As explained above, under the same conditions as the circuit under test 10, the processing device 120 generates corresponding electric and magnetic divergence fields (e.g., simulated electric divergence field divE and simulated magnetic divergence field divH) through a unit dipole moment dp. Furthermore, the processing device 120 performs convolution operations between the digital filter designed in operation S203 and the corresponding electric and magnetic divergence fields to obtain the unit dipole moment dp. Based on this relationship, after the processing device 120 performs convolution operations between the filter designed in operation S203 and the near-field electric and near-field magnetic divergence fields generated in operation S202, it can generate a dipole moment matrix equivalent to the circuit under test 10 based on the operation result.

[0041] In other embodiments, the near-field electric and magnetic fields measured in operation S201 may only have intensity information, lacking phase information. Accordingly, the processing device 120 further analyzes the near-field electric and magnetic fields to obtain phase information. Taking the near-field electric field as an example, the processing device 120 can use the region with a field intensity value of 0 in the near-field electric field as a boundary based on the continuity of the field, and divide the near-field electric field into multiple blocks through the boundary. Limited by the range of the near-field measurement performed by the electromagnetic scanner 110, the phase of each block can theoretically only be 0 degrees or 180 degrees.

[0042] Next, the processing device 120 applies all possible phase combinations to multiple blocks of the near-field electric field and calculates multiple two-dimensional curl fields corresponding to all possible phase combinations. For example, if the near-field electric field is divided into two blocks, there will be four phase combinations (including [0°:0°], [0°:180°], [180°:0°], and [180°:180°]), so the processing device 120 will calculate the corresponding four curl fields. Since theoretically the curl field is much smaller than the divergence field, the processing device 120 selects the one with the smallest curl field from the multiple curl fields and uses the phase combination corresponding to the one with the smallest curl field as the phase information of the near-field electric field. The phrase "the one with the smallest curl field" as used herein means that the maximum curl value of this curl field is less than the maximum curl value of the other curl fields.

[0043] In summary, the method and system disclosed herein design a digital filter under the same conditions as near-field measurements, and apply this digital filter to the electric and magnetic divergence fields generated by near-field measurements to perform calculations, thereby obtaining a dipole moment model equivalent to the circuit under test. Compared to known methods that use tensor matrices to perform pseudo-inverse matrix operations, the method and system disclosed herein have less computational load, shorter computation time, and similar accuracy.

[0044] Although the present disclosure has been described above with reference to embodiments, it is not intended to limit the present disclosure. Those skilled in the art can make various modifications and refinements without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection of the present disclosure shall be determined by the appended claims.

[0045] Symbol Explanation

[0046] 10: Circuit under test

[0047] 12: Near Field

[0048] 100: System for Establishing the Dipole Moment Model

[0049] 110: Electromagnetic Scanner

[0050] 120: Processing device

[0051] 200: Method for Establishing the Dipole Moment Model

[0052] dp: unit dipole moment

[0053] P z Unit electric dipole moment

[0054] M y M x Unit magnetic dipole moment

[0055] divE: Simulated electric divergence field

[0056] divH: Simulated magnetic divergence field

[0057] p1: Central Area

[0058] p2: First surrounding area

[0059] p3: Second surrounding area

[0060] p4: Third surrounding area

[0061] m1: First central subregion

[0062] m2: First adjacent sub-region

[0063] m3: Second central subregion

[0064] m4: Second adjacent sub-region

[0065] FE: First sub-filter

[0066] FH: Second Sub-filter

[0067] Gnd: Grounding

[0068] N0, m0: Center point

[0069] N1: Left side area

[0070] N2: Right side area

[0071] Q1: Central Area

[0072] Q2: Surrounding area

[0073] S201~S205: Operation

Claims

1. A method for establishing a dipole moment model, applicable to the circuit under test, comprising: Near-field measurements are performed on the circuit under test to obtain the near-field electric field and near-field magnetic field associated with the circuit under test; Perform two-dimensional divergence calculations on the near-field electric field and the near-field magnetic field to obtain the near-field electric divergence field and the near-field magnetic divergence field; A digital filter is designed based on the unit dipole moment, wherein the digital filter includes a first sub-filter, a second sub-filter, and a third sub-filter. The shape and coefficients of the first sub-filter are determined based on the simulated electric divergence field generated by the unit dipole moment, the shape and coefficients of the second sub-filter are determined based on the simulated magnetic divergence field generated by the unit dipole moment, and the shape and coefficients of the third sub-filter are determined based on the second sub-filter. The near-field electric divergence field and the near-field magnetic divergence field are convolved using this digital filter; and Based on the convolution operation results, construct a dipole moment matrix equivalent to the circuit under test.

2. The method for establishing the dipole moment model as described in claim 1, wherein the operation of designing the digital filter includes: Based on the unit electric dipole moment of this unit dipole moment, calculate the simulated electric field; Perform a two-dimensional divergence operation on the simulated electric field to obtain the simulated electric divergence field; and Based on the simulated electric divergence field, the shape and coefficients of the first sub-filter of the digital filter are determined, wherein the first sub-filter is used to perform a convolution operation with the near-field electric divergence field to generate at least one electric dipole moment in the dipole moment matrix.

3. The method for establishing the dipole moment model as described in claim 2, wherein the operation of designing the digital filter further includes: Based on the first unit magnetic dipole moment of this unit dipole moment, calculate the simulated magnetic field; Perform a two-dimensional divergence operation on the simulated magnetic field to obtain the simulated magnetic divergence field; and Based on the simulated magnetic divergence field, the shape and coefficients of the second sub-filter of the digital filter are determined, wherein the second sub-filter is used to perform a convolution operation with the near-field magnetic divergence field to generate at least one first magnetic dipole moment in the dipole moment matrix.

4. The method for establishing the dipole moment model as described in claim 3, wherein the operation of designing the digital filter includes: Based on the second sub-filter, the shape and coefficients of the third sub-filter of the digital filter are determined, wherein the third sub-filter is used to perform a convolution operation with the near-field magnetic divergence field to generate at least one second magnetic dipole moment in the dipole moment matrix.

5. A dipole moment model establishment system, applicable to the circuit under test, comprising: An electromagnetic scanner is used to perform near-field measurements on the circuit under test to obtain the near-field electric field and near-field magnetic field associated with the circuit under test. as well as The processing device, coupled to the electromagnetic scanner, is used to: Perform two-dimensional divergence calculations on the near-field electric field and the near-field magnetic field to obtain the near-field electric divergence field and the near-field magnetic divergence field; A digital filter is designed based on the unit dipole moment, wherein the digital filter includes a first sub-filter, a second sub-filter, and a third sub-filter. The shape and coefficients of the first sub-filter are determined based on the simulated electric divergence field generated by the unit dipole moment, the shape and coefficients of the second sub-filter are determined based on the simulated magnetic divergence field generated by the unit dipole moment, and the shape and coefficients of the third sub-filter are determined based on the second sub-filter. The near-field electric divergence field and the near-field magnetic divergence field are convolved using this digital filter; and Based on the convolution operation results, construct a dipole moment matrix equivalent to the circuit under test.

6. The dipole moment model building system as described in claim 5, wherein in the operation of designing the digital filter, the processing device is used to: Based on the unit electric dipole moment of this unit dipole moment, calculate the simulated electric field; Perform a two-dimensional divergence operation on the simulated electric field to obtain the simulated electric divergence field; and Based on the simulated electric divergence field, the shape and coefficients of the first sub-filter of the digital filter are determined, wherein the first sub-filter is used to perform a convolution operation with the near-field electric divergence field to generate at least one electric dipole moment in the dipole moment matrix.

7. The dipole moment model building system as described in claim 6, wherein in the operation of designing the digital filter, the processing device is used to: Based on the first unit magnetic dipole moment of this unit dipole moment, calculate the simulated magnetic field; Perform a two-dimensional divergence operation on the simulated magnetic field to obtain the simulated magnetic divergence field; and Based on the simulated magnetic divergence field, the shape and coefficients of the second sub-filter of the digital filter are determined, wherein the second sub-filter is used to perform a convolution operation with the near-field magnetic divergence field to generate at least one first magnetic dipole moment in the dipole moment matrix.

8. The dipole moment model building system as described in claim 7, wherein in the operation of designing the digital filter, the processing device is used to: Based on the second sub-filter, the shape and coefficients of the third sub-filter of the digital filter are determined, wherein the third sub-filter is used to perform a convolution operation with the near-field magnetic divergence field to generate at least one second magnetic dipole moment in the dipole moment matrix.

Citation Information

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