Chip testing method and device, electronic equipment and storage medium
By acquiring and correcting current data caused by human error in chip testing, a more accurate current data analysis method is provided, which solves the problem of inaccurate data caused by human error in chip testing and improves the effectiveness of testing.
CN115951195BActive Publication Date: 2026-07-21XIAN UNISOC TECH CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- XIAN UNISOC TECH CO LTD
- Filing Date
- 2022-12-09
- Publication Date
- 2026-07-21
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Figure CN115951195B_ABST
Abstract
The application provides a chip testing method and device, electronic equipment and storage medium. After the testing equipment obtains first current data when the chip executes a testing instruction, error current data is determined and repaired to obtain second current data. Finally, the chip is analyzed according to the more accurate current data to obtain a testing result. Therefore, when the testing equipment tests the chip, the influence of the current data caused by the manual clicking operation error of the tester can be eliminated according to the error current data. The second current data is obtained by repairing the error current data in the first current data, so that the second current data can more accurately reflect the actual current change of the chip, and the testing equipment can more effectively test the chip according to the second current data.
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