Impact testing device and impact testing method

Abstract

This application relates to an impact testing apparatus and an impact testing method. The impact testing apparatus includes: a base; a positioning member disposed on the base, the positioning member having a bearing surface for supporting and fixing the sample to be tested; and a launching assembly disposed on the base, the launching assembly being configured to launch an impactor toward the sample to be tested on the positioning member; wherein the vertical height of the bearing surface of the positioning member is greater than the vertical height of the launching end of the launching assembly. This application can avoid secondary or multiple impacts on the sample to be tested during the impact test, making the impact test results more accurate.

Description

Technical Field

[0001] This application relates to the field of impact testing technology, and in particular to an impact testing device and an impact testing method. Background Technology

[0002] With the current trend of consumers pursuing thinner and lighter display devices, the structure of display devices is becoming increasingly thinner, posing a severe challenge to the entire display supply industry. CG (Graphics Processing), screens, modules, and even the display devices themselves need to maintain a certain level of resistance to pressure, drops, and impacts while achieving thinner designs. Currently, the display industry generally uses impact testing, such as ball drop tests, to assess and simulate the impact resistance of display devices when dropped. However, during such drop tests, the sample under test is susceptible to secondary impacts from the ball, affecting the accuracy of the test results. Summary of the Invention

[0003] Therefore, it is necessary to provide an impact testing device and an impact testing method to improve the accuracy of the test.

[0004] According to one aspect of this application, an impact testing apparatus is provided, comprising: a base; a positioning member disposed on the base, the positioning member having a bearing surface for bearing and fixing a sample to be tested; and a launching assembly disposed on the base, the launching assembly being configured to launch an impactor toward the sample to be tested on the positioning member; wherein the vertical height of the bearing surface of the positioning member is greater than the vertical height of the launching end of the launching assembly.

[0005] In the above scheme, by setting up a launching component, the launching component can launch an impactor toward the sample to be tested on the positioning component for impact testing. In addition, since the vertical setting height of the bearing surface of the positioning component is greater than the vertical setting height of the launching end of the launching component, the impactor launched by the launching component impacts the sample to be tested fixed on the bearing surface of the positioning component from bottom to top. After the impact energy hits the sample to be tested, the impactor will bounce off the surface of the sample to be tested and then fall freely, avoiding secondary or multiple impacts on the sample to be tested, thus making the impact test results more accurate.

[0006] In some embodiments, the angle α between the emission direction of the emission component and the vertical direction satisfies the condition: 0° < α < 90°;

[0007] Preferably, the angle α between the emission direction of the emission component and the vertical direction satisfies the condition: 30° < α < 60°.

[0008] In some embodiments, the base includes: a housing; and a connector disposed on the housing, wherein the positioning member and the transmitting assembly are both connected to the connector, the connector being configured to have a variable connection position relative to the housing to adjust the relative position of the bearing surface of the positioning member and the transmitting end of the transmitting assembly in the vertical direction.

[0009] In some embodiments, the connector is configured to rotate relative to the housing.

[0010] In some embodiments, the housing has a first support plate and a second support plate that are arranged opposite to each other and spaced apart. A first mating part is provided on the facing surfaces of the first support plate and the second support plate. A mating rod is provided on the connector. The two ends of the mating rod in the length direction are inserted into the two first mating parts in a one-to-one correspondence. The mating rod is configured to be rotatable relative to the two first mating parts.

[0011] In some embodiments, the positioning element and the launching assembly are located at two opposite ends of the connector, and the mating rod is located between the two opposite ends.

[0012] In some embodiments, the impact testing device includes a drive motor, the drive end of which is connected to the connector to drive the connector to rotate.

[0013] In some embodiments, the launching assembly includes: an adjustment member disposed on the connector; and an impact launcher connected to the adjustment member; the adjustment member is configured to be movable relative to the connector in a direction parallel to the bearing surface and to be movable relative to the connector in a direction perpendicular to the bearing surface to adjust the relative position of the impact launcher to the bearing surface.

[0014] In some embodiments, the impact testing apparatus further includes: a command input module for receiving user-preset parameters; a controller electrically connected to the command input module, the impactor launcher, and the adjustment member; the controller is configured to control the impactor launcher to launch with a preset kinetic energy according to the parameters input by the command input module, and to control the adjustment member to move the impactor launcher to a preset position.

[0015] According to a second aspect of this application, an impact testing method is provided, which uses the aforementioned impact testing apparatus to perform the test. The impact testing method includes:

[0016] Adjust the relative positions of the positioning component and the transmitting component so that the vertical setting height of the bearing surface of the positioning component is greater than the vertical setting height of the transmitting end of the transmitting component;

[0017] The launching assembly is controlled to launch an impactor toward the sample to be tested on the positioning component.

[0018] In the above scheme, by adjusting the relative positions of the positioning component and the launching component, the vertical setting height of the bearing surface of the positioning component is greater than the vertical setting height of the launching end of the launching component. The impactor launched by the launching component impacts the sample to be tested fixed on the bearing surface of the positioning component from bottom to top. After the impactor impacts the sample to be tested, it will bounce off the surface of the sample to be tested due to the rebound, and then fall back due to free fall, avoiding secondary or multiple impacts on the sample to be tested, so that the impact test results are more accurate. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the testing process of an impact testing device in related technologies;

[0020] Figure 2 This is a schematic diagram of the impact testing device provided in one embodiment of this application;

[0021] Figure 3 This is an exploded view of the impact testing device provided in one embodiment of this application;

[0022] Figure 4 This is a schematic diagram of the testing process of an impact testing device provided in an embodiment of this application;

[0023] Figure 5 This is a schematic flowchart of an impact testing method provided in an embodiment of this application.

[0024] Explanation of icon numbers:

[0025] 100. Impact testing device; O. First axis;

[0026] 10. Base; 11. Shell; 111. First support plate; 1111. First mating part; 112. Second support plate; 113. Cover plate; 114. Accommodating area; 12. Connector; 121. Mating rod; 1211. Insertion hole;

[0027] 20. Positioning component; 21. Bearing surface; 22. Positioning plate; 23. Fixture;

[0028] 30. Launching assembly; 31. Launching end; 32. Adjustment component; 321. Mounting block; 322. Support plate; 33. Impact launcher;

[0029] 40. Small ball;

[0030] 50. Impacting material; 51. Surface of the sample to be tested;

[0031] 60. Command input module. Detailed Implementation

[0032] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings. Preferred embodiments of this application are shown in the drawings. However, this application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a thorough and complete understanding of the disclosure of this application.

[0033] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the specification of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0034] When describing positional relationships, unless otherwise specified, when an element such as a layer, film, or substrate is referred to as being "on" another element, it may be directly on the other element or there may be intermediate elements present. Furthermore, when a layer is referred to as being "below" another layer, it may be directly below it or there may be one or more light-emitting units present. It is also understood that when a layer is referred to as being "between" two layers, it may be the only layer between the two layers, or there may be one or more light-emitting units present.

[0035] When using the terms “including,” “having,” and “comprising” as described herein, another component may be added unless explicitly qualifying terms such as “only,” “consisting of,” etc. are used. Unless otherwise stated, singular terms may include plural forms and should not be construed as having a quantity of one.

[0036] It should be understood that although the terms “first,” “second,” etc., may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used only to distinguish one element from another. For example, without departing from the scope of this application, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element.

[0037] It should also be understood that, in interpreting an element, although not explicitly described, the element is interpreted as including a range of error, which should be within the acceptable deviation range of a particular value as determined by a person skilled in the art. For example, "approximately," "about," or "substantially" can mean within one or more standard deviations, without limitation herein.

[0038] Furthermore, the accompanying drawings are not drawn to a 1:1 scale, and the relative dimensions of the components are shown in the drawings only as examples and not necessarily to actual scale.

[0039] With the current public's preference for thin and light display terminals, the structure of display terminals is becoming increasingly thinner, which brings severe challenges to the entire display supply industry. CG, screen body, module, and even display terminals need to maintain a certain level of pressure resistance, drop resistance, and impact resistance while reducing thickness. Currently, the display industry generally uses impact testing, such as ball drop testing, to evaluate and simulate the impact resistance of display terminals when dropped.

[0040] The ball drop test involves fixing a ball at a certain height using equipment, while a fixture is used below to hold the sample under test. The ball is then dropped freely from above and impacts the sample. By progressively increasing the impact strength, the critical point at which the sample is damaged is tested.

[0041] The inventors of this application have discovered an unavoidable problem with this drop test: (Referring to...) Figure 1 After the ball 40 falls freely, the first impact point is P1. The ball 40 will rebound, causing a second impact at point P2. This will affect the accuracy of the ball drop test results.

[0042] To address the aforementioned issues, this application proposes an impact testing device and method. By changing the relative positions of the launching component and the sample under test, the impact direction of the impactor is changed to bottom to top, avoiding secondary or multiple impacts on the sample under test and improving the accuracy of the impact test.

[0043] It should be noted that the impact testing device provided in this application embodiment is suitable for various impact tests, such as steel ball drop tests, plastic ball drop tests, and pen drop tests. The impacting object used in the test can be a steel ball, a small plastic ball, a 2B pencil, etc. The steel ball drop test is used as an example here; other types of impact tests are similar and will not be described in detail here.

[0044] Figure 2 This is a schematic diagram of the impact testing device provided in one embodiment of this application. Figure 3 This is an exploded view of the impact testing device provided in one embodiment of this application. Figure 4 This is a schematic diagram of the testing process of an impact testing device provided in an embodiment of this application.

[0045] Reference Figure 2 , Figure 3 , Figure 4The impact testing device 100 provided in this embodiment includes: a base 10; a positioning member 20 disposed on the base 10, and the positioning member 20 having a bearing surface 21 for bearing and fixing a sample to be tested (not shown); and a launching assembly 30 disposed on the base 10, and the launching assembly 30 being configured to launch an impactor 50 toward the sample to be tested on the positioning member 20; wherein, the setting height of the bearing surface 21 of the positioning member 20 in the vertical direction S is greater than the setting height of the launching end 31 of the launching assembly 30 in the vertical direction S.

[0046] In the above scheme, by setting up the launching component 30, the launching component 30 can launch an impactor towards the sample to be tested on the positioning member 20 for impact testing. Furthermore, since the vertical height of the bearing surface 21 of the positioning member 20 in the vertical direction S is greater than the vertical height of the launching end 31 of the launching component 30 in the vertical direction S, the impactor 50 launched by the launching component 30 impacts the sample to be tested fixed on the bearing surface 21 of the positioning member 20 from bottom to top. After the impact energy hits the sample, the impactor will bounce off the surface of the sample and then fall freely, avoiding secondary or multiple impacts on the sample, thus making the impact test results more accurate. It should also be noted that the vertical direction S here refers to the direction of gravity.

[0047] In the embodiments of this application, reference is made to Figure 4 The impact path of the impactor 50 is represented by a dashed line, and Q represents the impact point of the impactor 50 on the surface 51 of the sample to be tested. The angle α between the emission direction F of the emission assembly 30 and the vertical direction S must satisfy the condition: 0° < α < 90°. It is understandable that when the angle α is 90°, there is a possibility that due to insufficient impact energy, the impactor 50 may not bounce off the surface 51 of the sample to be tested and may slide directly down the surface 51, affecting the test results. To avoid this situation, the angle α cannot be 90°. Furthermore, when the angle α is 0°, the emission direction of the emission assembly 30 is vertically upward, and there is a possibility that the impactor 50 may bounce off the surface 51 of the sample to be tested and fall back onto the emission end 31 of the emission assembly 30, damaging the emission assembly 30. To avoid this situation, the angle α cannot be 0°. When the included angle α is in the range of 0° < α < 90°, the impactor 50 can be bounced off the surface of the sample to be tested 51 and leave the surface of the sample to be tested, and then fall freely off the surface of the sample to be tested due to its own gravity.

[0048] Preferably, the angle α between the emission direction F of the emission assembly 30 and the vertical direction S needs to satisfy the condition: 30° < α < 60°. In this way, after the impactor impacts the surface 51 of the sample, the trajectory of its free fall will have a larger angle with the surface 51, making it easier for it to detach from the surface 51. For example, the impact test effect is optimal when the angle α is 45°.

[0049] In this embodiment of the application, combined with Figure 2 , Figure 3 The base 10 includes a housing 11 and a connector 12. The connector 12 is disposed on the housing 11. The positioning member 20 and the launching assembly 30 are both connected to the connector 12. The connector 12 is configured to have a variable connection position relative to the housing 11 to adjust the relative position of the bearing surface 21 of the positioning member 20 and the launching end 31 of the launching assembly 30 in the vertical direction S. In this way, the positioning member 20 and the launching assembly 30 can be adjusted to a suitable position according to the actual impact test requirements by adjusting the connection position of the connector 12 and the housing 11.

[0050] For example, the housing 11 has a first support plate 111 and a second support plate 112 that are opposite to and spaced apart. Here, a receiving area 114 is defined between the first support plate 111 and the second support plate 112. The positioning member 20 and the launching assembly 30 can be at least partially structurally located within this receiving area 114 to prevent the impacting object 50 from flying around after impact, thus protecting the operators around the impact testing device 100. It is understood that a cover plate 113 can also be connected between the first support plate 111 and the second support plate 112 to further prevent the impacting object from flying out of the testing area.

[0051] In this embodiment, to facilitate adjustment of the relative position of the connector 12 and the housing 11, the connector 12 is configured to rotate relative to the housing 11. Specifically, the connector 12 is configured to rotate relative to the housing 11 around a certain axis, such as the first axis O. It can be understood that when the connector 12 rotates relative to the housing 11 around the first axis O, the positioning member 20 and the launching component 30 connected to the connector 12 also rotate around the first axis O, and their height positions in the vertical direction S also change accordingly, thereby realizing the change of the relative position of the positioning member 20 and the launching component 30 in the vertical direction S.

[0052] In a specific implementation, the impact testing device 100 may include a drive motor (not shown), the drive end of which is connected to the connector 12 via a transmission mechanism to drive the connector 12 to rotate. For example, the drive end of the drive motor is connected to the connector 12 via a gear transmission mechanism. After the connector 12 rotates to the required angle, the drive motor stops rotating, thereby locking the connector 12 at that rotation angle.

[0053] Furthermore, referring to Figure 3Each of the facing surfaces of the first support plate 111 and the second support plate 112 is provided with a first mating portion 1111. The connecting member 12 is provided with a mating rod 121, the two ends of which are inserted into the two first mating portions 1111 respectively, and the mating rod 121 is configured to rotate relative to the two first mating portions 1111. Thus, when the mating rod 121 rotates relative to the two first mating portions 1111, it drives the connecting member 12 to rotate relative to the first support plate 111 and the second support plate 112. Furthermore, the axial direction of the mating rod 121 forms the aforementioned first axis O.

[0054] Here, the first mating part 1111 can be a protrusion structure formed on the opposing surfaces of the first support plate 111 and the second support plate 112. The two ends of the mating rod 121 in the length direction can be formed with insertion holes 1211 for the protrusion structure to be inserted, so that the two ends of the mating rod 121 in the length direction can be inserted into the first support plate 111 and the second support plate 112 in a corresponding manner.

[0055] Furthermore, the positioning element 20 and the launching assembly 30 are located at two opposite ends of the connector 12, and the mating rod 121 is located between the two opposite ends. In this way, when the connector 12 rotates about the first axis O, that is, about the mating rod 121, the relative positions of the positioning element 20 and the launching assembly 30 in the vertical direction S can change, and compared with the case where the positioning element 20 and the launching assembly 30 are both located on the same side of the mating rod 121, the rotation process of the connector 12 can be made smoother.

[0056] In the actual impact testing process, the impact testing device of this application embodiment may need to perform impact testing on multiple points on the sample to be tested. Therefore, during the testing process, it is necessary to adjust the relative positions of the launching component 30 and the positioning component 20.

[0057] In the embodiments of this application, reference is made to Figure 3 The launching assembly 30 includes an adjusting member 32 and an impact emitter 33. The adjusting member 32 is disposed on the connecting member 12, and the impact emitter 33 is connected to the adjusting member 32. The adjusting member 32 is configured to move relative to the connecting member 12 in a direction parallel to the bearing surface 21 and to move relative to the connecting member 12 in a direction perpendicular to the bearing surface 21, thereby adjusting the relative position of the impact emitter 33 with respect to the bearing surface 21. Since the adjusting member 32 can move relative to the connecting member 12 in a direction parallel to the bearing surface 21 and to the connecting member 12 in a direction perpendicular to the bearing surface 21, it can drive the impact emitter 33 to move relative to the positioning member 20, thereby changing the relative position of the launching end 31 with respect to the sample to be tested. It should be noted that the launching direction of the impact emitter 33 is always perpendicular to the bearing surface 21, that is, always perpendicular to the test surface of the sample to be tested.

[0058] In a specific implementation, the connector 12 is configured as a rod-shaped member; the adjusting member 32 includes a mounting block 321 and a support plate 322. The mounting block 321 is connected to the circumferential side of the connector 12 and is configured to move relative to the connector 12 in a direction parallel to the bearing surface 21 and to move relative to the connector 12 in a direction perpendicular to the bearing surface 21. The support plate 322 is connected to the side of the mounting block 321 facing the positioning member 20, and the transmitter is connected to the support plate 322.

[0059] Furthermore, continue to refer to Figure 3 The positioning component 20 includes a positioning disk 22 and a fixing fixture 23. The positioning disk 22 is connected to the connector 12, and the surface of the positioning disk 22 facing the transmitting assembly 30 forms a bearing surface 21. The fixing fixture 23 is connected to the positioning disk 22 and is used to fix the sample to be tested.

[0060] In this embodiment, the impact testing device 100 further includes: an instruction input module 60 for receiving user-preset parameters (such as test energy, location, test distance, etc.); and a controller (not shown) electrically connected to the instruction input module 60, the impact launcher 33, and the adjustment member 32. The controller is configured to control the impact launcher 33 to launch with a preset kinetic energy according to the parameters input by the instruction input module 60, and to control the adjustment member 32 to move the impact launcher 33 to a preset position. This ensures that the test distance between the launching end 31 of the launching assembly 30 and the bearing surface 21 of the positioning member 20 meets the requirements, and that the launching point of the launching end 31 of the launching assembly 30 meets the requirements.

[0061] Figure 5 This is a schematic flowchart of an impact testing method provided in an embodiment of this application.

[0062] Based on the same inventive purpose, an embodiment of the second aspect of this application proposes an impact testing method, which uses the impact testing device 100 of the aforementioned embodiment for testing.

[0063] Reference Figure 5 The impact testing method in this embodiment includes:

[0064] S10. Adjust the relative position of the positioning component and the transmitting component so that the vertical setting height of the bearing surface of the positioning component is greater than the vertical setting height of the transmitting end of the transmitting component.

[0065] S20. Control the launching assembly to launch the impactor toward the sample to be tested on the positioning component.

[0066] In the above scheme, by adjusting the relative positions of the positioning component and the launching component, the vertical setting height of the bearing surface of the positioning component is greater than the vertical setting height of the launching end of the launching component. The impactor launched by the launching component impacts the sample to be tested fixed on the bearing surface of the positioning component from bottom to top. After the impactor impacts the sample to be tested, it will bounce off the surface of the sample to be tested due to the rebound, and then fall back due to free fall, avoiding secondary or multiple impacts on the sample to be tested, so that the impact test results are more accurate.

[0067] In this embodiment of the application, the method further includes the following step between step S10 and step S20:

[0068] Receive user instructions, which include user-preset parameters (such as test energy, location, test distance, etc.);

[0069] The system controls the impactor launcher to launch with a preset kinetic energy according to the preset parameters, and controls the adjustment component to move the impactor launcher to a preset position to ensure that the test distance between the launching end of the launching component and the bearing surface of the positioning component meets the requirements, and that the launching point of the launching end meets the requirements.

[0070] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0071] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. An impact testing device, characterized by, include: Base; A positioning element is disposed on the base, and the positioning element has a bearing surface for bearing and fixing the sample to be tested; A launching assembly is disposed on the base and configured to launch an impactor toward the sample to be tested on the positioning element; Wherein, the vertical height of the bearing surface of the positioning member is greater than the vertical height of the transmitting end of the transmitting assembly; The base includes: Casing; and A connector is disposed on the housing, and the positioning member and the transmitting assembly are both connected to the connector. The connector is configured to have a variable connection position relative to the housing to adjust the relative position of the bearing surface of the positioning member and the transmitting end of the transmitting assembly in the vertical direction. The connector is configured to rotate relative to the housing; The positioning element and the launching assembly are located at two opposite ends of the connector, respectively.

2. The impact testing device according to claim 1, characterized in that, The angle α between the emission direction of the emission component and the vertical direction satisfies the following condition: 0°＜α＜90°。 3. The impact testing device according to claim 2, characterized in that, The angle α between the emission direction of the emission component and the vertical direction satisfies the following condition: 30°＜α＜60°。 4. The impact testing device according to claim 1, characterized in that, The housing has a first support plate and a second support plate that are opposite to each other and spaced apart. Each of the facing surfaces of the first support plate and the second support plate is provided with a first mating part. The connector is provided with a mating rod. The two ends of the mating rod in the length direction are inserted into the two first mating parts in a corresponding manner, and the mating rod is configured to be able to rotate relative to the two first mating parts.

5. The impact testing device according to claim 4, characterized in that, The mating rod is located between the two opposite ends.

6. The impact testing apparatus according to claim 1, characterized in that, The impact testing device includes a drive motor, the drive end of which is connected to the connecting member to drive the connecting member to rotate.

7. The impact testing apparatus according to claim 1, characterized in that, The transmitting component includes: Adjustment component, provided on the connector; An impact launcher is connected to the adjustment member; The adjusting member is configured to move relative to the connector in a direction parallel to the bearing surface and to move relative to the connector in a direction perpendicular to the bearing surface, so as to adjust the relative position of the impactor launcher to the bearing surface.

8. The impact testing apparatus according to claim 7, characterized in that, The impact testing device also includes: The instruction input module is used to receive user-preset parameters; The controller is electrically connected to the command input module, the impactor, and the adjustment component; the controller is configured to control the impactor to launch with a preset kinetic energy according to the parameters input by the command input module, and to control the adjustment component to move the impactor to a preset position.

9. An impact testing method, characterized in that, The impact testing is performed using the impact testing apparatus as described in any one of claims 1-8, and the impact testing method includes: Adjust the relative positions of the positioning element and the transmitting assembly so that the vertical setting height of the bearing surface of the positioning element is greater than the vertical setting height of the transmitting end of the transmitting assembly; The launching assembly is controlled to launch an impactor toward the sample to be tested on the positioning element.

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