A performance test system of an optical device, a bonding clamp and a test method thereof

By designing an optical device performance testing system and using a super magnetic ring to adjust the direction of light propagation, the problems of high equipment investment, high cost, and low efficiency in existing optical device testing systems have been solved, achieving efficient optical device performance testing and defective product screening.

CN116026564BActive Publication Date: 2026-06-05WUHAN YILUT TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
WUHAN YILUT TECH CO LTD
Filing Date
2022-12-16
Publication Date
2026-06-05

AI Technical Summary

Technical Problem

Existing optical device testing systems involve significant investment, high costs, and low efficiency. Furthermore, the testing devices are not highly stable and cannot simultaneously test isolators and circulators. Automated equipment is also costly to maintain, difficult to operate, and applicable to only a limited range of types.

Method used

Design an optical device performance testing system, including an optical insertion loss tester, an external PD, a super magnetic ring, and a light source. The electromagnetic field of the super magnetic ring is used to adjust the propagation direction of light, and the optical signal is received by the optical insertion loss tester and the external PD to realize the performance testing of optical devices.

Benefits of technology

It reduces testing costs, improves testing efficiency, enables the screening of defective products at the semi-finished product stage, simplifies the testing process, and reduces the difficulty of equipment maintenance.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application provides a performance testing system of an optical device, which comprises an optical insertion loss tester, an external PD, a super magnetic ring, a light source line and an optical device; the external PD is connected to a PD port of the optical insertion loss tester; the super magnetic ring is installed at one end of the external PD away from the optical insertion loss tester, and an electromagnetic field generated by the super magnetic ring acts on a light transmission port area of the external PD, wherein an N pole faces a side away from the external PD, and an S pole faces a side close to the external PD; one end of the optical device is connected with an isolator; light is transmitted into an optical fiber of the optical device from the light source line, is emitted from an end surface of the isolator, and is received by the external PD to receive the light emitted by the isolator, so that the performance testing of the optical device is completed. Meanwhile, a lamination clamp and a testing method of the optical device are also provided, irreversible transmission of light is realized by the super magnetic ring, equipment investment cost is reduced, and efficiency is improved.
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Description

Technical Field

[0001] This invention relates to the field of optical communication technology, and in particular to a performance testing system, bonding fixture, and testing method for optical devices. Background Technology

[0002] An isolator is a device that uses linear optocoupler isolation to convert input signals into output signals. Its input, output, and power supply are mutually isolated, making it particularly suitable for use with equipment and instruments that require optical isolation.

[0003] Isolators, also known as optical isolators, are an important component of industrial control systems. Existing devices suffer from low efficiency due to the long assembly time of connectors during testing; furthermore, the testing device cannot test both sound insulators and circulators simultaneously, resulting in low operational stability.

[0004] For example, existing testing equipment and architectures connect the light source to the collimator, and fix the product and collimator on an adjustable motorized six-axis platform. By adjusting the position of the product and collimator, the light is transmitted to the optical fiber through the isolator. This testing method requires a lot of equipment, is costly, and has extremely poor efficiency.

[0005] The existing bonding process for isolators involves automated equipment automatically picking up the isolators, dispensing adhesive, and curing. This equipment is expensive, has high maintenance costs, takes a long time to debug, is difficult to operate, and is difficult to handle when malfunctions occur. It also has limited applicability and a wide range of applications. Summary of the Invention

[0006] This invention provides a performance testing system, bonding fixture, and testing method for optical devices to solve the technical problems of existing testing systems having a large number of equipment, high cost, and extremely poor efficiency.

[0007] To address the aforementioned problems, the primary objective of this invention is to provide a performance testing system for optical devices, comprising an optical insertion loss tester, an external power distribution unit (PD), a super magnetic ring, a light source line, and optical devices.

[0008] The external PD is connected to the PD port of the optical insertion return loss tester; the super magnetic ring is installed at the end of the external PD away from the optical insertion return loss tester, and the electromagnetic field generated by the super magnetic ring acts on the light transmission port area of ​​the external PD, wherein the N pole faces away from the external PD, and the S pole faces inward and close to the external PD.

[0009] One end of the optical device is connected to an isolator;

[0010] Light is transmitted from the light source line direction into the optical fiber of the optical device, exits through the end face of the isolator, and is received by the external PD to receive the light emitted by the isolator, thereby completing the performance test of the optical device.

[0011] Preferably, the optical device includes a double-sided ceramic ferrule, and further includes:

[0012] A metal ring has a through hole along its axial direction. The through hole includes a first through hole, a first cylindrical through hole, and a second cylindrical through hole that are connected in sequence and whose axes coincide. The diameter of the arc surface of the first through hole and the diameter of the second cylindrical through hole are larger than the inner diameter of the first cylindrical through hole. One end of the double-sided ceramic insert is tightly fitted and embedded in the first cylindrical through hole of the metal ring.

[0013] A metal part includes a metal part body, a flange integrally connected to the metal part body, and an insert end integrally connected to the flange. The metal part body, the flange, and the insert end are sequentially provided with a third cylindrical through hole and a fourth cylindrical through hole that are coaxially arranged and interconnected along the axial direction. The other end of the ceramic insert is inserted into the third cylindrical through hole and the fourth cylindrical through hole of the metal part, so that the insert end is embedded in the second cylindrical through hole of the metal ring.

[0014] The isolator is installed in the first through hole of the metal ring.

[0015] Preferably, the isolator has a cubic structure.

[0016] The second objective of this invention is to provide a bonding fixture for optical devices, based on the aforementioned optical device performance testing system, comprising a strip base, a metal positioning strip, and an isolator limiting strip;

[0017] The end face of the strip base is provided with a groove;

[0018] The metal positioning strip includes a positioning base and a metal positioning seat connected to the positioning base. The metal positioning seat has a plurality of vertically and evenly distributed first positioning holes.

[0019] The isolator limiting strip includes an isolator limiting strip body and a clamp plate integrally connected to the isolator limiting strip body. The isolator limiting strip body is adapted to be connected to the positioning base, and the clamp plate is provided with a second positioning hole that corresponds one-to-one with the first positioning hole.

[0020] The first positioning hole is adapted to accommodate the metal end of the optical device, and the second positioning hole is adapted to accommodate the isolator end of the optical device.

[0021] Preferably, it also includes a connecting block, the lower end face of which is provided with a positioning pin, and the positioning base is provided with a first positioning hole opposite to the positioning pin, and the positioning pin of the connecting block is adapted to be inserted into the first positioning hole of the positioning base.

[0022] The connecting block is provided with a first screw hole on the side near the positioning pin, and the isolator limiting strip body is provided with a second screw hole opposite the first screw hole. The limiting bolt is adapted to pass through the second screw hole and the first screw hole in sequence to fix the metal positioning strip to the isolator limiting strip.

[0023] A third objective of this invention is to provide a performance testing method for optical devices. Based on the aforementioned performance testing system for optical devices, the testing method includes the following steps:

[0024] S1: Fabricate and install the first assembly, which is formed by combining a double-sided ceramic insert with metal parts;

[0025] S2: A bonding fixture for fabricating optical devices;

[0026] Place the optical components sequentially into the metal positioning strips of the isolator fitting fixture, adjust the placement angle of the optical components as required, and then lock them in place.

[0027] Apply thermosetting adhesive to the end face of the double-sided ceramic insert, but do not apply adhesive to the inserts at the beginning and end holes of the metal positioning strip.

[0028] Combine and fix the metal positioning strip of the isolator fitting fixture with the isolator limiting strip;

[0029] S3: Fabricating optical devices with isolators;

[0030] Use a pneumatic ceramic suction nozzle to hold the isolator and insert it into the holes of the assembled isolator limiting strip in sequence. The first and last holes of the isolator limiting strip are not inserted into the isolator and are reserved for positioning.

[0031] Combine and fix the isolator limiting strip filled with isolators with the strip base of the isolator fitting fixture with optical devices installed;

[0032] Align the isolator with the reference lines of the first and last holes and the charge-coupled device (CCD) to ensure proper fit.

[0033] Remove the isolator limit strip so that the isolator falls onto the double-sided ceramic insert with glue applied. Gently press the isolator with a cotton swab to ensure that the glue layer thickness and amount are consistent for each isolator.

[0034] S4: Move the bonding fixture for the optical device and the optical device with the isolator to the heating stage for initial curing;

[0035] S5: Place the pre-cured optical device with the isolator into the oven for secondary curing;

[0036] S6: Clamp the optical device with the isolator and inspect and clean the cured optical device;

[0037] S7: Performance testing of optical devices with isolators;

[0038] Set the insertion loss tester to the band to be tested, connect an external PD to the PD port of the insertion loss tester, and zero the device.

[0039] A super magnetic ring is installed on the iron tube of the external PD. The magnetic field will act on the light transmission port area of ​​the external PD, with the N pole facing outward and the S pole facing inward.

[0040] Connect the LC end of the cured optical device to the light source of the insertion loss tester, and align the isolator end with the light receiving port of the external PD;

[0041] Under the influence of the magnetic field, the Faraday plate of the isolator starts to work, allowing light to pass through normally. The PD receives the light and displays the performance indicators of the optical device.

[0042] S8: Install the metal ring and magnetic ring;

[0043] S9: Remove the cured optical components for inspection and cleaning.

[0044] Preferably, in step S1, the fabrication and installation of the optical device includes the following steps:

[0045] S 11 Remove the coating from one end of the optical fiber, exposing 9-11 mm of the cladding, and clean it.

[0046] S 12 Insert the fiber optic section after the coating has been removed into the double-sided ceramic ferrule, and then apply adhesive to cure it.

[0047] S 13 Grind one side of the cured double-sided ceramic ferrule, while pressing the ceramic sleeve and guide ring into the metal part, and press the ground ferrule surface into the metal part;

[0048] S 14 Grind the other side of the double-sided ceramic insert and insert it into the metal ring;

[0049] S 15 The first assembly, formed by the ground double-sided ceramic ferrule and the metal parts, is tested, inspected, and cleaned.

[0050] Preferably, in step S3, the fabrication of the optical device with an isolator includes the following steps:

[0051] S 31 Use a pneumatic ceramic suction nozzle to hold the isolator and insert it into the holes of the assembled isolator limiting strip in sequence. The first and last holes of the isolator limiting strip are not inserted into the isolator and are reserved for positioning.

[0052] S 32 : Combine and fix the isolator limiting strip filled with isolators with the strip base of the isolator fitting fixture with the optical components installed;

[0053] S 33 Align the isolator with the reference line of the charge-coupled device (CCD) by comparing the ferrule at the first and last holes with the reference line of the CCD.

[0054] S 34 Remove the isolator limit strip and let the isolator fall onto the double-sided ceramic insert with the glue applied. Gently press the isolator with a cotton swab to ensure that the glue layer thickness and amount are consistent for each isolator.

[0055] Preferably, in step S8, the specific steps for installing the metal ring and the magnetic ring include:

[0056] S 81 The tested first assembly with isolator is placed on the fixing fixture, and the metal ring is pressed in to form the second assembly;

[0057] S 82 The second assembly with the pressed metal ring is placed under the charge-coupled device (CCD), and the magnetic ring is placed inside the metal ring, with the S pole of the magnetic ring facing away from the metal ring and the N pole of the magnetic ring facing inward towards the metal ring.

[0058] S 83 Apply heat-curing adhesive around the magnetic ring and heat it to cure.

[0059] Compared with the prior art, the present invention has significant advantages and beneficial effects, specifically reflected in the following aspects:

[0060] This invention relates to a performance testing system. The system includes an optical insertion-return loss tester, an external photodetector (PD), a super magnetic ring, a light source, and optical devices. The external PD is connected to the PD port of the optical insertion-return loss tester. The super magnetic ring is installed at the end of the external PD furthest from the tester, and the electromagnetic field generated by the super magnetic ring acts on the optical port area of ​​the external PD. Light travels from the light source line into the optical fiber of the optical device, exits through the end face of the isolator, and is received by the external PD. The principle is to utilize the non-reciprocity of the super magnetic ring's adjustment of the light polarization state to achieve irreversible light transmission, thereby completing the performance testing of the optical devices. Simply put, it ensures that light can only travel in one direction. By changing the direction of the magnetic field and the direction of light propagation, the same effect is achieved. This system is low-cost, highly efficient, and perfectly solves the problem of testing efficiency. Attached Figure Description

[0061] Figure 1 This is a schematic diagram of the performance testing system for optical devices in an embodiment of the present invention;

[0062] Figure 2 This is a schematic diagram of the docking structure in which the optical device is inserted into the super magnetic ring and the external PD in an embodiment of the present invention;

[0063] Figure 3 This is a schematic diagram of the main view structure of the optical device in an embodiment of the present invention;

[0064] Figure 4 This is a schematic diagram of one direction of the bonding fixture for optical devices in an embodiment of the present invention;

[0065] Figure 5 This is a schematic diagram of the bonding fixture for optical devices in another direction according to an embodiment of the present invention;

[0066] Figure 6 This is an exploded structural diagram of the bonding fixture for optical devices according to an embodiment of the present invention;

[0067] Figure 7 This is a schematic diagram of the structure of a testing system for optical devices in the prior art;

[0068] Figure 8 This is a top view schematic diagram of a testing system for optical devices in the prior art;

[0069] Figure 9 This is a schematic diagram of the performance testing method for optical devices in an embodiment of the present invention.

[0070] Explanation of reference numerals in the attached figures:

[0071] 1-Optical insertion return loss tester; 11-PD port; 2-External PD; 3-Super magnetic ring; 31-N pole face; 32-S pole face; 4-Light source;

[0072] 5-Optical device; 51-Metal part; 511-Metal part body; 512-Flange; 513-Embedded end; 514-Third cylindrical through hole; 515-Fourth cylindrical through hole; 52-Double-sided ceramic ferrule; 53-Fiber optic cable; 54-Isolator; 55-Metal ring; 551-Through hole; 5511-First through hole; 5512-First cylindrical through hole; 5513-Second cylindrical through hole; 56-Magnetic ring; 57-Guide ring; 58-Thermosetting adhesive; 59-Ceramic sleeve;

[0073] 6-Fitting clamp; 61-Strip base; 611-Groove; 62-Metal part positioning strip; 621-Positioning base; 6211-Third positioning hole; 622-Metal part positioning seat; 6221-First positioning hole; 63-Isolator limiting strip; 631-Isolator limiting strip body; 6311-Second screw hole; 632-Clamping plate; 6321-Second positioning hole; 64-Connecting block; 641-Positioning pin; 642-First screw hole; 65-Limiting bolt;

[0074] 7-Electric six-axis platform; 8-Collimator; 9-Polarizer. Detailed Implementation

[0075] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention. Furthermore, the technical features involved in the various embodiments of this invention described below can be combined with each other as long as they do not conflict with each other.

[0076] It should be noted that when a component is referred to as "fixed to," "set on," or "located on" another component, it can be directly on or indirectly on that other component. When a component is referred to as "connected to" another component, it can be directly connected to or indirectly connected to that other component.

[0077] Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first," "second," etc., may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0078] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installed," "connected," "linked," and "equipped with" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0079] Please see Figure 7-8 As shown, Figure 7 , 8 The diagram shows the existing testing equipment and architecture. The light source 4 is connected to the collimator 8. The optical device 5, collimator 8, and polarizer 9 are fixed on an adjustable motorized six-axis platform 7. By adjusting the positions of the optical device 5 and collimator 8, the light is transmitted to the optical fiber 53 through the isolator 54. The existing bonding process of the isolator 54 involves an automated device automatically picking up the isolator 54 and then applying adhesive for curing. This testing method requires a large investment in equipment, which is expensive, has high maintenance costs, long equipment debugging time, and is difficult for personnel to operate. It is also difficult to handle equipment malfunctions. The applicable types are also relatively limited, and the testing is highly restricted and inefficient.

[0080] To solve the above technical problems, such as Figure 1-3 As shown, an embodiment of the present invention provides a performance testing system for optical devices. The performance testing system includes an optical insertion-return loss tester 1, an external PD 2, a super magnetic ring 3, a light source 4, and an optical device 5, wherein:

[0081] An external PD 2 is connected to the PD port 11 of the optical insertion return loss tester 1. A super magnetic ring 3 is installed at the end of the external PD 2 away from the optical insertion return loss tester 1, and the electromagnetic field generated by the super magnetic ring 3 acts on the light transmission port area of ​​the external PD 2. The N pole of the super magnetic ring 3 faces away from the external PD 2, and the S pole of the super magnetic ring 3 faces inward and close to the external PD 2.

[0082] One end of the optical device 5 is connected to an isolator 54. In the prior art, an isolator 54 is added to the optical path of the optical device 5. The isolator 54 is composed of a polarizer, a Faraday rotator, a polarizer and a magnetic ring. The light emitted by the laser is polarized into linearly polarized light by the polarizer. After passing through the Faraday rotator with magnetic induction intensity loaded by the magnetic ring, the polarization plane of the linearly polarized light is rotated by 45 degrees. Then, it is transmitted to the fiber end face for coupling by the polarizer with the same polarization direction of 45 degrees.

[0083] Light is transmitted from the direction of the light source 4 into the optical fiber 53 of the optical device 5, exits through the end face of the isolator 54, and is received by the external PD to receive the light emitted by the isolator, thereby completing the performance test of the optical device.

[0084] Thus, light is transmitted from the direction of the light source line. Through the reverse magnetic field added by the super magnetic ring 3, the direction of light propagation is reversed, and the light enters from the direction of the ferrule of the optical device 5, exits from the isolator 54, and is received by the external PD 2. Since the light-receiving area of ​​the external PD 2 is very large, it can completely receive the light from the isolator 54, so the test time is greatly shortened. The test process is very simple and efficient, and defective products can be screened out at the semi-finished product stage, which greatly saves costs.

[0085] It should be further explained that the return loss (RL) of fiber optic devices is related to the stability of the laser signal source, the insertion loss (IL) is related to the transmission distance of the entire optical network, and the correlated polarization loss (PDL) is related to the transmission quality of the entire optical communication network.

[0086] Return loss is the ratio of incident optical power to reflected optical power in an optical fiber device. Insertion loss is the optical power lost after passing through an optical fiber device; it is the difference between the incident optical power and the outgoing optical power. Based on the definition of return loss, return loss testers have appeared on the market. However, these testers are complex to operate, expensive, and can only be used for return loss testing. According to the definition of insertion loss, it can be measured using an optical power meter and a splitter, but this requires manual calculation. Currently, there are no instruments specifically designed for measuring insertion loss on the market.

[0087] Please see Figure 3 As shown, in an embodiment of the present invention, the optical device 5 includes a double-sided ceramic ferrule 52, a metal ring 55, a metal component 51, an optical fiber 53, an isolator 54, a magnetic ring 56, a guide ring 57, and a ceramic sleeve 59, wherein:

[0088] The metal ring 55 has a through hole 551 inside along the axial direction. The through hole 551 includes a first through hole 5511, a first cylindrical through hole 5512 and a second cylindrical through hole 5513 that are connected in sequence and have the same axis. The diameter of the arc surface of the first through hole 5511 and the diameter of the second cylindrical through hole 5513 are larger than the inner diameter of the first cylindrical through hole 5512. One end of the double-sided ceramic insert 52 is tightly fitted and embedded in the first cylindrical through hole 5512 of the metal ring 55.

[0089] The metal part 51 includes a metal part body 511, a flange 512, and an insert end 513. The flange 512 is integrally connected to the metal part body 511, and the insert end 513 is integrally connected to the flange 512. The metal part body 511, the flange 512, and the insert end 513 are sequentially provided with a third cylindrical through hole 514 and a fourth cylindrical through hole 515 that are coaxially arranged and interconnected along the axial direction. The optical fiber 53 is located in the double-sided ceramic ferrule 52. The other end of the double-sided ceramic ferrule 52 is inserted into the third cylindrical through hole 514 and the fourth cylindrical through hole 515 of the metal part 51, so that the insert end 513 is embedded in the second cylindrical through hole 5513 of the metal ring 55.

[0090] The isolator 54 is installed in the first through hole 5511 of the metal ring 55 and is located on the end face of the double-sided ceramic ferrule 52. The magnetic ring 56 is located in the first through hole 5511 of the metal ring 55 and covers the outside of the isolator 54.

[0091] The outer diameter of the ceramic sleeve 59 fits tightly against the inner diameter surface of the fourth cylindrical through hole 515, and the inner diameter of the ceramic sleeve 59 is tightly embedded in the outer contour surface of the double-sided ceramic insert 52. The guide ring 57 is movably connected to the bottom of the metal part 51 and is connected to the ceramic sleeve 59 through the guide ring 57.

[0092] Specifically, please refer to Figure 2 , 3 As shown, in an embodiment of the present invention, the isolator 54 has a cubic structure.

[0093] By connecting isolator 54 into the optical fiber, the transmission efficiency of optical signals is improved, the propagation quality of optical signals is improved, the reflected light wave shape and forward insertion loss are reduced, and at the same time, the reverse isolation is higher and the return loss is higher.

[0094] It is understood that in this embodiment, the isolator 54 is preferably configured as a cuboid structure. In some other embodiments, it can also be configured as a cylindrical shape, a regular hexagonal structure, etc., depending on actual needs. No restrictions are placed on the shape of the isolator 54 here.

[0095] Please see Figure 4 , 5 As shown in Figure 6, this embodiment of the invention also provides a bonding fixture for optical devices, used in a performance testing system for optical devices. The bonding fixture 6 for optical devices includes a strip-shaped base 61, a metal positioning strip 62, and an isolator limiting strip 63, wherein:

[0096] The end face of the strip base 61 is provided with a groove 611, which is used to support the positioning strip 62 of the limiting metal part.

[0097] The metal positioning strip 62 includes a positioning base 621 and a metal positioning seat 622 connected to the positioning base 621. The metal positioning seat 622 has a plurality of vertically and evenly distributed first positioning holes 6221.

[0098] The isolator limiting strip 63 includes an isolator limiting strip body 631 and a clamping plate 632 integrally connected to the isolator limiting strip body 631. The isolator limiting strip body 631 is adapted to be connected to the positioning base 621, and the clamping plate 632 is provided with a second positioning hole 6321 corresponding to the first positioning hole 6221.

[0099] The first positioning hole 6221 is suitable for accommodating the metal end of the optical device, and the second positioning hole 6321 is suitable for accommodating the isolator end of the optical device.

[0100] Specifically, please refer to Figure 6 As shown, in an embodiment of the present invention, the bonding fixture 6 for the optical device further includes a connecting block 64. The lower end face of the connecting block 64 is provided with a positioning pin 641. The positioning base 621 is provided with a third positioning hole 6211 opposite to the positioning pin 641. The positioning pin 641 of the connecting block 64 is adapted to be inserted into the third positioning hole 6211 of the positioning base 621.

[0101] Specifically, please refer to Figure 4 , 5 As shown in Figure 6, in an embodiment of the present invention, a first screw hole 642 is provided on the side of the connecting block 64 near the positioning pin 641, and a second screw hole 6311 is provided on the isolator limiting strip body 631 directly opposite the first screw hole 642. The limiting bolt 65 is adapted to pass through the second screw hole 6311 and the first screw hole 642 in sequence to fix the metal positioning strip 62 and the isolator limiting strip 63 in a fixed connection.

[0102] Please see Figure 9 As shown, this embodiment of the invention also provides a performance testing method for optical devices. Based on the aforementioned performance testing system for optical devices, the testing method includes the following steps:

[0103] S1: Fabricate and install the first assembly formed by combining the double-sided ceramic insert 52 and the metal part 51;

[0104] S2: Fabricate the bonding fixture 6 for optical device 5;

[0105] Place the first assembly into the metal positioning strip 62 of the isolator fitting fixture in sequence, adjust the placement angle of the first assembly as required, and lock it.

[0106] Apply thermosetting adhesive 58 to the end face of the double-sided ceramic insert 52, but do not apply adhesive to the inserts at the beginning and end holes of the metal positioning strip 62.

[0107] The metal positioning strip 62 of the isolator fitting fixture is combined and fixed with the isolator limiting strip 63.

[0108] S3: Fabricate an optical device 5 with isolator 54;

[0109] Use a pneumatic ceramic suction nozzle to hold the isolator 54 and place it into the second positioning hole 6321 of the assembled isolator limiting strip 63. The first and last holes of the isolator limiting strip 63 are not used to place the isolator 54, but are reserved for positioning.

[0110] The isolator limiting strip 63, which is filled with isolators 54, is combined and fixed with the strip base 61 of the isolator fitting clamp with the first assembly;

[0111] Align the isolator 54 with the reference line of the ferrule at the beginning and end of the hole and the charge-coupled device (CCD).

[0112] Pull out the isolator limit strip 63 so that the isolator 54 falls onto the double-sided ceramic insert 52 with glue applied. Use a cotton swab to gently press the isolator 54 so that the glue layer thickness and amount of glue are consistent for each isolator 54.

[0113] S4: Move the bonding fixture 6 for the optical device and the optical device 5 with the isolator 54 to the heating table for initial curing;

[0114] S5: Place the pre-cured optical device 5 with isolator 54 into the oven for secondary curing;

[0115] S6: Clamp the optical device 5 with isolator 54 and inspect and clean the cured optical device 5.

[0116] S7: Perform performance testing on optical device 5 with isolator;

[0117] The specific steps for performing performance testing on the optical device 5 with the isolator include:

[0118] S 71 Set the optical insertion return loss tester 1 to the band to be tested, connect an external PD 2 to the PD port 11 of the optical insertion return loss tester 1, and clear the device to zero;

[0119] S 72 Install a super magnetic ring 3 on the iron tube of the external PD 2. The magnetic field will act on the light transmission port area of ​​the external PD 2, with the N pole facing outward and the S pole facing inward.

[0120] S 73 Connect the LC end of the cured optical device 5 to the light source 4, and align the isolator end with the light receiving port of the external PD 2;

[0121] S 74Under the influence of the magnetic field, the Faraday plate of the isolator 54 starts to work, allowing light to pass through normally. The external PD2 receives the light and displays the performance indicators of the optical device 5.

[0122] S8: Install metal ring 55 and magnetic ring 56;

[0123] S9: Remove the cured optical device 5 for inspection and cleaning.

[0124] Specifically, in step S1, the fabrication and installation of the first assembly formed by combining the double-sided ceramic insert 52 and the metal part 51 includes the following steps:

[0125] S 11 Remove the coating from one end of fiber 53, exposing 9-11 mm of cladding, and clean it.

[0126] S 12 Insert the fiber portion after removing the coating into the double-sided ceramic ferrule 52 and apply adhesive to cure it.

[0127] S 13 Grind one side of the cured double-sided ceramic ferrule 52, while pressing the ceramic sleeve 59 and guide ring 57 into the metal part 51, and press the ground ferrule surface of the double-sided ceramic ferrule 52 into the metal part 51.

[0128] S 14 Grind the other side of the double-sided ceramic insert 52 and insert it into the metal ring 55;

[0129] It should be noted that during the transmission of optical signals through the fiber optic end face, some light energy is attenuated due to refraction or other reasons; this is the transmission loss of the optical fiber. Therefore, the effect of fiber optic end face polishing is very important. To ensure better contact between the end faces of the two single fibers, the ferrule end faces of fiber optic patch cords are usually polished into different structures using a fiber polishing machine.

[0130] S 15 The first assembly formed by the ground double-sided ceramic insert 52 and the metal part 51 is tested, inspected and cleaned.

[0131] Specifically, in step S8, the specific steps for installing the metal ring 55 and the magnetic ring 56 include:

[0132] S 81 The tested first assembly with isolator 54 is placed on the fixing fixture, and the metal ring 55 is pressed in to form the second assembly;

[0133] S 82The second assembly is placed under the charge-coupled device (CCD), and the magnetic ring 56 is placed inside the metal ring 55. The S pole of the magnetic ring 56 faces away from the metal ring 55, and the N pole of the magnetic ring 56 faces inward towards the metal ring 55.

[0134] S 83 Apply heat-curing adhesive 58 around the magnetic ring 56 and heat it to cure.

[0135] The optical insertion and return loss tester is a multifunctional optical communication test instrument that integrates a stabilized light source, a high-precision optical power meter, an insertion loss tester, and a return loss tester. It is widely used for insertion loss and return loss testing, as well as stability measurement of optical fibers, passive optical devices, and optical fiber communication systems. It can be used for device testing by manufacturers, research and development by research institutions, and testing in engineering construction and maintenance.

[0136] It should be noted that the existing process is for finished product testing. Similar to the coupling process, the magnetic poles of the finished product are oriented with the S pole facing outward and the N pole facing inward. The existing testing process requires light to enter from the isolator direction and exit from the ferrule direction. The light is transmitted to the light source line and then from the light source line to the light receiving PD. Because the light entry aperture of the fiber core is only 0.125mm, it is very difficult to enter light from the isolator direction. The light finding time is very long, the efficiency is very low, and it is impossible to screen out defective products in the semi-finished product stage, resulting in a large waste of costs.

[0137] Unlike existing testing processes, the testing process developed in this embodiment of the invention is a semi-finished product test. By applying an external reverse magnetic field, the direction of light propagation is reversed, with light entering from the ferrule direction, exiting from the isolator, and being received by the PD. Since the PD has a large light-receiving area, it can completely receive the light coming out of the isolator, thus greatly shortening the testing time. The testing process is very simple, not only highly efficient, but also able to screen out defective products at the semi-finished product stage, greatly saving costs.

[0138] While the present invention has been disclosed above, its scope of protection is not limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of this disclosure, and all such changes and modifications will fall within the scope of protection of this invention.

Claims

1. A performance testing system for optical devices, characterized in that, Includes optical insertion loss tester, external PD, super magnetic ring, light source line and optical devices; The external PD is connected to the PD port of the optical insertion return loss tester; the super magnetic ring is installed at the end of the external PD away from the optical insertion return loss tester, and the electromagnetic field generated by the super magnetic ring acts on the light transmission port area of ​​the external PD, wherein the N pole faces away from the external PD, and the S pole faces inward and close to the external PD. The optical device includes a double-sided ceramic ferrule, a metal ring, and a metal component; The metal ring has through holes along its axial direction. The through holes include a first through hole, a first cylindrical through hole, and a second cylindrical through hole that are connected in sequence and whose axes coincide. The diameter of the arc surface of the first through hole and the diameter of the second cylindrical through hole are larger than the inner diameter of the first cylindrical through hole. One end of the double-sided ceramic insert is tightly fitted and embedded in the first cylindrical through hole of the metal ring. The metal component includes a metal component body, a flange integrally connected to the metal component body, and an embedded end integrally connected to the flange. The metal component body, the flange, and the embedded end are sequentially provided with a third cylindrical through hole and a fourth cylindrical through hole that are coaxially arranged and interconnected along the axial direction. The other end of the ceramic insert is inserted into the third cylindrical through hole and the fourth cylindrical through hole of the metal component, so that the embedded end is embedded in the second cylindrical through hole of the metal ring. One end of the optical device is connected to an isolator, which is installed in the first through hole of the metal ring. Light is transmitted from the light source line direction into the optical fiber of the optical device, exits through the end face of the isolator, and is received by the external PD to receive the light emitted by the isolator, thereby completing the performance test of the optical device.

2. The performance testing system for optical devices according to claim 1, characterized in that: The isolator has a cubic structure.

3. A bonding fixture for optical devices, based on the performance testing system for optical devices according to any one of claims 1-2, characterized in that, Includes a strip base, metal positioning strips, and isolator limit strips; The end face of the strip base is provided with a groove; The metal positioning strip includes a positioning base and a metal positioning seat connected to the positioning base. The metal positioning seat has a plurality of vertically and evenly distributed first positioning holes. The isolator limiting strip includes an isolator limiting strip body and a clamp plate integrally connected to the isolator limiting strip body. The isolator limiting strip body is adapted to be connected to the positioning base, and the clamp plate is provided with a second positioning hole that corresponds one-to-one with the first positioning hole. The first positioning hole is adapted to accommodate the metal end of the optical device, and the second positioning hole is adapted to accommodate the isolator end of the optical device.

4. The bonding fixture for optical devices according to claim 3, characterized in that: It also includes a connecting block, the lower end face of which is provided with a positioning pin, and the positioning base is provided with a third positioning hole opposite to the positioning pin of the connecting block, and the positioning pin of the connecting block is adapted to be inserted into the third positioning hole of the positioning base.

5. The bonding fixture for optical devices according to claim 4, characterized in that: The connecting block is provided with a first screw hole on the side near the positioning pin, and the isolator limiting strip body is provided with a second screw hole opposite the first screw hole. The limiting bolt is adapted to pass through the second screw hole and the first screw hole in sequence to fix the metal positioning strip to the isolator limiting strip.

6. A performance testing method for an optical device, based on the bonding fixture for the optical device as described in claim 3, characterized in that: The testing method includes the following steps: S1: Fabricate and install the first assembly, which is formed by combining a double-sided ceramic insert with metal parts; S2: Fabrication of bonding fixtures for optical devices; Place the optical components sequentially into the metal positioning strips of the isolator fitting fixture, adjust the placement angle of the first assembly as required, and lock it in place. Apply thermosetting adhesive to the end face of the double-sided ceramic insert, but do not apply adhesive to the insert at the beginning and end holes of the metal positioning strip. Combine and fix the metal positioning strip of the isolator fitting fixture with the isolator limiting strip; S3: Fabricating optical devices with isolators; S4: Move the bonding fixture for the optical device and the optical device with the isolator to the heating stage for initial curing; S5: Place the pre-cured optical device with the isolator into the oven for secondary curing; S6: Clamp the optical device with the isolator and inspect and clean the cured optical device; S7: Performance testing of optical devices with isolators; Set the insertion loss tester to the band to be tested, connect an external PD to the PD port of the insertion loss tester, and zero the device. A super magnetic ring is installed on the iron tube of the external PD. The magnetic field will act on the light transmission port area of ​​the external PD, with the N pole facing outward and the S pole facing inward. Connect the LC end of the cured optical device to the light source of the insertion loss tester, and align the isolator end with the light receiving port of the external PD; Under the influence of the magnetic field, the Faraday plate of the isolator starts to work, allowing light to pass through normally. The PD receives the light and displays the performance indicators of the optical device. S8: Install the metal ring and magnetic ring; S9: Remove the cured optical components for inspection and cleaning.

7. The performance testing method for optical devices according to claim 6, characterized in that: In step S1, the fabrication and installation of the optical device includes the following steps: S 11 Remove the coating from one end of the optical fiber, exposing 9-11 mm of the cladding, and clean it. S 12 Insert the fiber optic section after the coating has been removed into the double-sided ceramic ferrule, and then apply adhesive to cure it. S 13 Grind one side of the cured double-sided ceramic ferrule, while pressing the ceramic sleeve and guide ring into the metal part, and press the ground ferrule surface into the metal part; S 14 Grind the other side of the double-sided ceramic insert and insert it into the metal ring; S 15 The first assembly, formed by the ground double-sided ceramic insert and the metal parts, is tested, inspected, and cleaned.

8. The performance testing method for optical devices according to claim 7, characterized in that: In step S3, the fabrication of the optical device with an isolator includes the following steps: S 31 Use a pneumatic ceramic suction nozzle to hold the isolator and insert it into the holes of the assembled isolator limiting strip in sequence. The first and last holes of the isolator limiting strip are not inserted into the isolator and are reserved for positioning. S 32 : Combine and fix the isolator limiting strip filled with isolators with the strip base of the isolator fitting fixture with the optical components installed; S 33 Align the isolator with the reference line of the charge-coupled device (CCD) by comparing the ferrule at the first and last holes with the reference line of the CCD. S 34 Remove the isolator limit strip and let the isolator fall onto the double-sided ceramic insert with the glue applied. Gently press the isolator with a cotton swab to ensure that the glue layer thickness and amount are consistent for each isolator.

9. The performance testing method for optical devices according to claim 7, characterized in that: In step S8, the specific steps for installing the metal ring and the magnetic ring include: S 81 The tested first assembly with isolator is placed on the fixing fixture and a metal ring is pressed in to form the second assembly; S 82 Place the second assembly with the pressed metal ring under the CCD of the electrical coupling device, and put the magnetic ring into the metal ring, with the S pole of the magnetic ring facing away from the metal ring and the N pole of the magnetic ring facing inward towards the metal ring. S 83 Apply heat-curing adhesive around the magnetic ring and heat it to cure.