Detection system and detection method

Abstract

The application discloses a detection system and a detection method. The detection circuit board with a controller is arranged. A plurality of different detection configuration parameters are stored in the controller in advance. After the detection system is connected with a circuit board to be detected, the detection configuration parameter required to be written into the circuit board can be determined according to the currently connected circuit board. The parameter configuration of the currently connected circuit board to be detected is carried out according to the determined detection configuration parameter. After the parameter configuration is completed, the display data and the driving control signal are input to the currently connected circuit board to be detected. Thus, the plurality of different detection configuration parameters are only required to be stored in the controller in advance. When the configuration parameters required by the connected circuit board to be detected are different, the controller does not need to be switched, so that the versatility of the controller can be improved, the detection requirement of one controller compatible with all the circuit boards to be detected can be realized, and the automatic performance is improved.

Description

Technical Field

[0001] This invention relates to the field of circuit board testing technology, and particularly to testing systems and methods. Background Technology

[0002] After the semiconductor circuit board is manufactured, it needs to be tested to determine whether its functions meet the usage requirements, ensure product quality, and improve work efficiency. Summary of the Invention

[0003] In a first aspect, embodiments of this disclosure provide a testing system, including: inspecting circuit boards;

[0004] The inspection circuit board includes:

[0005] The controller, connected to the circuit board under test, is configured as follows:

[0006] Upon receiving a parameter selection instruction, the system determines the detection configuration parameters corresponding to the currently connected circuit board to be tested from a variety of pre-stored detection configuration parameters of different types.

[0007] Based on the determined detection configuration parameters, configure the parameters of the currently connected circuit board to be tested;

[0008] After the parameters are configured, display data and drive control signals are input to the currently connected circuit board under test.

[0009] The beneficial effects of this embodiment are as follows: By pre-storing multiple different types of detection configuration parameters, after the detection system connects to the circuit board to be tested, the detection configuration parameters that need to be written to the circuit board can be determined based on the currently connected circuit board. Based on the determined detection configuration parameters, the parameters of the currently connected circuit board to be tested are configured. After the parameter configuration is completed, display data and drive control signals are input to the currently connected circuit board to be tested. After the display data and drive control signals are input to the currently connected circuit board to be tested, an output signal can be generated. The detection system can perform detection based on the output signal to determine whether the currently connected circuit board to be tested is qualified. This eliminates the need to pre-program parameters into the circuit board to be tested; instead, the controller configures the parameters during detection. Therefore, only multiple different types of detection configuration parameters need to be pre-stored in the controller. This also eliminates the need to switch controllers when the required configuration parameters for the connected circuit boards to be tested are different; the circuit boards to be tested can be configured and tested without switching controllers. This improves the versatility of the controller, enabling a single controller to meet the detection needs of all circuit boards to be tested, thus improving automation performance.

[0010] Secondly, embodiments of this disclosure provide a detection method, including:

[0011] Upon receiving a parameter selection instruction, the system determines the detection configuration parameters corresponding to the currently connected circuit board to be tested from a variety of pre-stored detection configuration parameters of different types.

[0012] Based on the determined detection configuration parameters, configure the parameters of the currently connected circuit board to be tested;

[0013] After the parameters are configured, display data and drive control signals are input to the currently connected circuit board under test.

[0014] The beneficial effects of this embodiment are as follows: By pre-storing multiple different types of detection configuration parameters, after the detection system connects to the circuit board to be tested, the detection configuration parameters that need to be written to the circuit board can be determined based on the currently connected circuit board. Based on the determined detection configuration parameters, the parameters of the currently connected circuit board to be tested are configured. After the parameter configuration is completed, display data and drive control signals are input to the currently connected circuit board to be tested. After the display data and drive control signals are input to the currently connected circuit board to be tested, an output signal can be generated. The detection system can perform detection based on the output signal to determine whether the currently connected circuit board to be tested is qualified. This eliminates the need to pre-program parameters into the circuit board to be tested; instead, the controller configures the parameters during detection. Therefore, only multiple different types of detection configuration parameters need to be pre-stored in the controller. This also eliminates the need to switch controllers when the required configuration parameters for the connected circuit boards to be tested are different; the circuit boards to be tested can be configured and tested without switching controllers. This improves the versatility of the controller, enabling a single controller to meet the detection needs of all circuit boards to be tested, thus improving automation performance. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the detection system in an embodiment of the present invention;

[0016] Figure 2 This is a partial structural diagram of the detection system in an embodiment of the present invention;

[0017] Figure 3 These are some signal timing diagrams from embodiments of the present invention;

[0018] Figure 4 These are some other signal timing diagrams in embodiments of the present invention;

[0019] Figure 5 This is a schematic diagram of the clock driving circuit in an embodiment of the present invention;

[0020] Figure 6These are some structural schematic diagrams of the voltage control circuit in the embodiments of the present invention;

[0021] Figure 7 These are some other structural schematic diagrams of the voltage control circuit in the embodiments of the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Furthermore, the embodiments and features in the embodiments of the present invention can be combined with each other without conflict. Based on the described embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] Unless otherwise defined, the technical or scientific terms used in this invention shall have the ordinary meaning understood by one of ordinary skill in the art to which this invention pertains. The terms "first," "second," and similar terms used in this invention do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed following the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect.

[0024] It should be noted that the dimensions and shapes of the figures in the accompanying drawings do not reflect actual proportions and are intended only to illustrate the content of the invention. Furthermore, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout.

[0025] With the improvement of living standards, motors have become essential household appliances. A typical motor assembly includes a control motherboard (such as a System on Chip (SOC)), a display screen, and a timing controller (TCON) board that matches the display screen. The control interface on the control motherboard connects to the interface on the TCON board via signal lines (such as I2C), and the TCON board, in turn, connects to the display screen via signal lines (such as GPIO). In this way, the control motherboard can transmit image data signals to the TCON board, which processes the image data signals and converts them into drive control signals to power the display screen, thus enabling the display to show images.

[0026] After the TCON adapter board is manufactured, it needs to be tested to determine if its functions meet the requirements, ensuring product quality and improving work efficiency. Currently, due to the lack of a unified industry standard, different brands and models of TCON adapter boards have different designs. Each type of TCON adapter board has a PMU / GAMMA / Level shift chip, and configuration parameters are built into the registers of the corresponding PMU / GAMMA / Level shift chips. This results in each type of TCON adapter board requiring a corresponding motherboard for testing, leading to a wide variety of motherboards. This makes the testing motherboards non-universal and hinders automated testing of TCON adapter boards. Therefore, a universal testing circuit board for TCON adapter boards has been designed to replace the numerous motherboards and achieve compatibility with different types of TCON adapter boards.

[0027] Based on this, embodiments of the present invention provide a detection system. By setting up a detection circuit board with a controller, multiple different types of detection configuration parameters are pre-stored in the controller. After the inspection circuit board is connected to the circuit board to be tested, the required detection configuration parameters to be written to that circuit board can be determined based on the currently connected circuit board. The system then configures the parameters of the currently connected circuit board to be tested according to the determined detection configuration parameters. After the parameter configuration is completed, display data and drive control signals are input to the currently connected circuit board to be tested. After the display data and drive control signals are input to the currently connected circuit board to be tested, an output signal can be generated. The detection system can then perform detection based on the output signal to determine whether the currently connected circuit board to be tested is qualified. This eliminates the need to pre-program parameters into the circuit board to be tested; instead, the controller configures the parameters during detection. Therefore, only multiple different types of detection configuration parameters need to be pre-stored in the controller. This also eliminates the need to switch controllers when the required configuration parameters for the connected circuit boards to be tested are different; the circuit boards to be tested can be configured and tested without switching controllers. This improves the versatility of the controller, enabling a single inspection circuit board to meet the detection needs of all circuit boards to be tested, thus improving automation performance.

[0028] Furthermore, the detection system provided in this embodiment of the invention eliminates the need for additional switching of inspection circuit boards, thereby reducing the overall system cost and facilitating maintenance. Moreover, its functionality is simple, making it easier to troubleshoot and repair compared to a mainboard.

[0029] In this embodiment of the invention, the circuit board to be tested can be configured as a TCON adapter board. Of course, the circuit board to be tested can also be configured as other types of adapter boards or circuit boards, which are not limited here.

[0030] The following explanation uses the example of setting the circuit board to be tested as a TCON adapter board.

[0031] In embodiments of the present invention, such as Figure 1 and Figure 2 As shown, the detection system may include at least one of the following: a controller 210, a communicator 220, a detector 230, an external device interface 240, a display 250, a memory 260, an instruction input device 270, a power supply 280, and an indicator 290. Exemplarily, at least one of the following components may be mounted on a testing circuit board: the controller 210, the communicator 220, the detector 230, the external device interface 240, the memory 260, the instruction input device 270, the power supply 280, and the indicator 290.

[0032] For example, controller 210 is connected to the circuit board under test. For instance, controller 210 can be connected to the circuit board under test via an I2C bus. In a specific implementation, controller 210 can control the operation of the detection system and respond to user operations by running various software control programs (such as operating systems and various applications) stored in memory 260. Alternatively, in response to a received user command to select a UI object to display on display 260, controller 210 can perform operations related to the object selected by the control command. Alternatively, in response to a received user command input via command input device 270, controller 210 can perform operations related to the object selected by the control command.

[0033] For example, communicator 220 is a component used to communicate with external devices or external servers according to various communication protocol types. For instance, the detection system can send content data to an external device connected via communicator 220, or browse and download content data from an external device connected via communicator 220. For example, communicator 220 may include at least one of network communication protocol modules or near-field communication protocol modules such as WIFI module 221, Bluetooth communication protocol module 222, wired Ethernet communication protocol module 223, and an infrared receiver.

[0034] For example, the controller can also communicate with a host computer. For instance, the host computer can start the entire system by scanning the barcode on the TCON adapter board under test. Alternatively, the host computer can be manually operated to start the entire system.

[0035] For example, detector 230 is a component of the detection system used to acquire signals from the external environment or to interact with the external environment. For example, detector 230 may include a sound acquisition device 231, such as a microphone, for receiving the user's voice, such as voice signals from user control commands to the detection system. Detector 230 may also include an image acquisition device 232, such as a camera or webcam, for acquiring user attributes or user interaction gestures to enable interaction between the detection system and the user.

[0036] For example, the external device interface 240 is a component that provides data transmission between the controller 210 and the TCON adapter board to be tested. For example, the external device interface 240 may include, but is not limited to, an I2C bus interface 241.

[0037] For example, memory 260 can be used to store various types of data, software programs, or applications that drive and control the operation of the detection system. Specifically, memory 260 can be used to store the running program of the drive controller 210; various applications built into the detection system and downloaded by the user from external devices; and data such as images used to configure various UIs provided by display 250, various objects related to the UI, and visual effects images of selectors for selecting UI objects.

[0038] For example, the instruction input device 270 can be used to send user-inputted operation instructions to the controller 210. For example, as... Figure 2 As shown, the command input device 270 may include at least one of a button module 271, a voice recognition module 272, and a control panel 273. For example, a user can control the detection system by recognizing voice commands through the button module, voice recognition module, or inputting user commands through the control panel on the command input device 270. For instance, the button module may include physical buttons or virtual buttons. Specifically, the button module can be configured with buttons such as key1, key2, key3, and key4 corresponding to different functions. Users can control the detection system to perform different functions by pressing buttons with different functions. Alternatively, users can input user operation commands through the user interface (UI) displayed on the control panel, and the command input device 270 receives the user input commands through the UI to control the detection system.

[0039] For example, the display 250 can be used to receive image signals from the controller 210, and to display video content, image content, menu control interface components, and user control UI interface.

[0040] For example, power supply 280 can be used to provide power to the detection system from an external power source under the control of controller 210. For example, power supply 280 can be an adapter.

[0041] For example, indicator 290 can provide prompts through indicator lights, audible prompts, etc., under the control of controller 210. For example, indicator 290 may include indicator light 291. Indicator 290 may also include speaker 292.

[0042] For example, the controller 210 may include at least one of random access memory (RAM) 251, read-only memory (ROM) 252, processor 253 (e.g., central processing unit (CPU)), data output circuitry 254, etc. For example, multiple different types of detection configuration parameters may be pre-stored in RAM 251 or ROM 252.

[0043] In this embodiment of the invention, combined with Figure 1 and Figure 2 As shown, when testing the TCON adapter board, the controller 210 can be connected to the TCON adapter board 100 to be tested via the I2C bus 310. The user can input a power-on command by pressing the physical button key1 to power on the entire testing system (e.g., by inputting a 12V system power supply voltage through the power supply 280). After a certain period of time, once the testing system has stabilized, a parameter selection command can be input by pressing the physical button key1, allowing the controller to receive the parameter selection command. Upon receiving the parameter selection command, the controller can determine the corresponding testing configuration parameters for the currently connected TCON adapter board 100 from a pre-stored list of different types of testing configuration parameters. This allows for parameter configuration of the currently connected TCON adapter board 100 based on the determined testing configuration parameters. Furthermore, after the parameter configuration of the currently connected TCON adapter board 100 is completed, display data and drive control signals are input to the currently connected TCON adapter board 100. After the TCON adapter board 100 under test receives the input display data and drive control signal, it can generate an output signal. The detection system can collect the output signal and detect it to determine whether the currently connected TCON adapter board 100 under test is qualified.

[0044] Exemplarily, in an embodiment of the present invention, combined with Figure 1 and Figure 2As shown, when testing the TCON adapter board, the processor 253 in the controller 210 can be connected to the TCON adapter board 100 to be tested via the I2C bus 310. The user can input a power-on command to the processor by pressing the physical button key1, enabling the processor to control the power-on of the entire testing system (e.g., inputting a 12V system power supply voltage via power supply 280). After a certain period of time, once the testing system has stabilized, a parameter selection command can be input to the processor by pressing the physical button key1. Upon receiving the parameter selection command, the processor can determine the corresponding testing configuration parameters for the currently connected TCON adapter board 100 from a pre-stored set of multiple different types of testing configuration parameters. This allows for parameter configuration of the currently connected TCON adapter board 100 based on the determined testing configuration parameters. Furthermore, after the parameter configuration of the currently connected TCON adapter board 100 is completed, a drive control signal (e.g., ...) is input to the currently connected TCON adapter board 100. Figure 3 and Figure 4 As shown, the frame trigger control signals STV-IN1 and STV-IN2, and the clock generation control signals CLK-IN1 and CLK-IN2.

[0045] In this embodiment of the invention, combined with Figure 1 and Figure 2 As shown, the controller may also include a data output circuit 254. Exemplarily, this data output circuit 254 can be connected to the processor 253 via an I2C bus 320, and it can also be connected to the circuit board under test via a V-By-One, LVDS, or eDP interface. After the processor 253 has configured the parameters of the currently connected TCON adapter board 100 under test, it also inputs a data output control signal to the data output circuit 254. Upon receiving the data output control signal, the data output circuit 254 performs a handshake with the currently connected circuit board under test, and inputs display data to the circuit board under test after the handshake is complete. Exemplarily, the data output circuit 254 can be configured as a Frame Rate Conversion (FRC) chip. Upon receiving the data output control signal, the FRC chip performs a handshake with the currently connected circuit board under test, and after the handshake is complete, it can input display data to the TCON adapter board under test via a V-By-One, LVDS, or eDP interface. After the TCON adapter board 100 under test receives the input display data and drive control signal, it can generate an output signal. The detection system can collect the output signal and detect it to determine whether the currently connected TCON adapter board 100 under test is qualified.

[0046] For example, a TCON adapter board may have a display control chip (e.g., a PMU / GAMMA / Level shift chip). The PMU / GAMMA / Level shift chip contains registers for PMU / GAMMA / Level shift. Different types of PMU / GAMMA / Level shift chips have different specifications for their registers, resulting in different detection configuration parameters for each type. PMU / GAMMA / Level shift chips of the same type can correspond to the same detection configuration parameters. Different types of TCON adapter boards may contain the same or different types of PMU / GAMMA / Level shift chips. If different types of TCON adapter boards contain the same type of PMU / GAMMA / Level shift chips, they can correspond to the same detection configuration parameters. If different types of TCON adapter boards contain different types of PMU / GAMMA / Level shift chips, each TCON adapter board can correspond to a single detection configuration parameter. This allows for storing fewer detection configuration parameters in the controller 210, while still being compatible with detecting various types of TCON adapter boards.

[0047] In this embodiment of the invention, the memory also numbers the stored detection configuration parameters. For example, the detection configuration parameters stored in the memory are numbered with their corresponding PMU / GAMMA / Level shift chips. These three types of detection configuration parameters can be numbered as follows: the detection configuration parameter corresponding to the first type of PMU / GAMMA / Level shift chip is numbered A1, the detection configuration parameter corresponding to the second type of PMU / GAMMA / Level shift chip is numbered A2, and the detection configuration parameter corresponding to the third type of PMU / GAMMA / Level shift chip is numbered A3. The rest are similar, and so on, which will not be elaborated further here.

[0048] In this embodiment of the invention, combined with Figure 1 and Figure 2As shown, when testing the TCON adapter board, the processor in controller 210 can be connected to the TCON adapter board 100 to be tested via I2C bus 310. The user can input a power-on command to the processor by pressing physical button key2 to control the power-on of the entire testing system (e.g., by connecting power supply 280 to input a 12V system power supply voltage). After a certain period of time, once the testing system is powered on and stable, the user can input a parameter selection command to the processor by pressing physical button key1 to control the testing system to enter the testing parameter selection mode. For example, when the processor receives the parameter selection command, it sends a type acquisition signal to the currently connected TCON adapter board. After receiving the type acquisition signal, the TCON adapter board sends the type of its PMU / GAMMA / Level shift chip to the processor. The processor can determine the number of the testing configuration parameter based on the acquired PMU / GAMMA / Level shift chip type and retrieve the corresponding testing configuration parameter from multiple different types of testing configuration parameters stored in the memory. This allows the detection configuration parameters corresponding to the PMU / GAMMA / Levelshift chip in the currently connected TCON adapter board 100 to be tested to be determined from multiple pre-stored detection configuration parameters. Based on these determined parameters, the PMU / GAMMA / Levelshift chip in the currently connected TCON adapter board 100 to be tested can be configured. Then, display data and drive control signals are input to the TCON adapter board 100 to be tested, enabling the TCON adapter board 100 to generate an output signal based on the input display data and drive control signals. The detection system can acquire and detect this output signal to determine whether the currently connected TCON adapter board 100 to be tested is qualified.

[0049] For example, the type of PMU / GAMMA / Level shift chip in the currently connected TCON adapter board can be manually checked, and the target number corresponding to the detection configuration parameter can be determined based on the type. Then, an instruction is input to the processor to display the numbers corresponding to the various stored detection configuration parameters on the display. The operator then finds the target number from these numbers. The operator inputs a parameter selection instruction to the processor to select the target number, thereby determining the detection configuration parameters corresponding to the PMU / GAMMA / Level shift chip in the currently connected TCON adapter board 100 to be tested from multiple pre-stored different types of detection configuration parameters. This allows for manual operation. Furthermore, the PMU / GAMMA / Level shift chip in the currently connected TCON adapter board 100 to be tested can be configured according to the determined detection configuration parameters. Afterwards, display data and drive control signals are input to the TCON adapter board 100 to be tested, so that the TCON adapter board 100 to be tested can generate an output signal based on the input display data and drive control signals. The detection system can collect the output signal and detect it to determine whether the currently connected TCON adapter board 100 to be tested is qualified.

[0050] In this embodiment of the invention, combined with Figures 1 to 3 As shown, frame trigger control signals STV-IN1 and STV-IN2, and clock generation control signals CLK-IN1 and CLK-IN2 can be input to the TCON adapter board. This allows Levelshift in the TCON adapter board to generate frame trigger signal STV1 based on frame trigger control signal STV-IN1, frame trigger signal STV2 based on frame trigger control signal STV-IN2, and clock signals CLK1 to CLK10 based on clock generation control signals CLK-IN1 and CLK-IN2. Specifically, the output of STV1 is triggered by the rising edge Y31 of STV_IN1, the output of STV2 is triggered by the rising edge Y31 of STV_IN2, CLK1 is triggered by the first rising edge Y11 of CLK_IN1 and the first rising edge Y21 of CLK_IN2, CLK2 is triggered by the second rising edge Y12 of CLK_IN1 and the second rising edge Y22 of CLK_IN2, and so on, until the output of CLK10. For example, the output signals may include frame trigger signals STV1 and STV2 and clock signals CLK1 to CLK10. The detection system can acquire the frame trigger signals STV1 and STV2 and the clock signals CLK1 to CLK10, and detect the frame trigger signals STV1 and STV2 and the clock signals CLK1 to CLK10 to determine whether the currently connected TCON adapter board 100 to be tested is qualified.

[0051] Based on the testing objectives, we need to check whether the Levelshift function in the TCON adapter board is functioning correctly (i.e., controlled by the input frame trigger control signals STV-IN1 and STV-IN2, and the clock generation control signals CLK-IN1 and CLK-IN2) to confirm the component's proper functioning. On the other hand, for the TCON adapter board itself, given its mass production, we focus more on the soldering quality after manufacturing, rather than the timing control, which can be checked by random sampling. Therefore, we want at least one of the STV1 and STV2 outputs from the Levelshift on the TCON adapter board to be high (VGH), and all CLK1-CLK10 to be high (VGH) to facilitate subsequent testing. This eliminates the need for complex and expensive testing equipment while effectively detecting product quality and meeting testing requirements. Based on this objective, combined with... Figure 1 , Figure 2 as well as Figure 4 Only the output waveforms of STV_IN1 and CLK_IN1 need to be controlled, while signals such as STV_IN2 and CLK_IN2 are continuously grounded, which meets the detection requirements. In this embodiment of the invention, the drive control signal may include: multiple frame start control signals; wherein, the multiple frame start control signals can be divided into a first type of frame start control signal and a second type of frame start control signal. The first type of frame start control signal has a first level and a second level, and the second type of frame start control signal has a first level. For example, the first level is a low level and the second level is a high level. The first type of frame start control signal may include the frame start control signal STV_IN1, which requires setting the output waveform. The second type of frame start control signal may include the continuously grounded frame start control signal STV_IN2.

[0052] In this embodiment of the invention, the drive control signal may include: multiple clock generation control signals; wherein, the multiple clock generation control signals may be divided into a first type of clock generation control signal and a second type of clock generation control signal, the first type of clock generation control signal having a first level and a second level, and the second type of clock generation control signal having a first level. For example, combined with Figure 4 As shown, the first level is low and the second level is high. The first type of clock generation control signal may include the clock generation control signal CLK_IN1, which requires setting the output waveform, and the second type of clock generation control signal may include the clock generation control signal CLK_IN2, which is continuously grounded.

[0053] In this embodiment of the invention, combined with Figure 4As shown, frame trigger control signals STV-IN1 and STV-IN2, and clock generation control signals CLK-IN1 and CLK-IN2 can be input to the TCON adapter board, causing the Levelshift output of frame trigger signals STV1 and STV2, and clock signals CLK1 to CLK10 in the TCON adapter board. Specifically, STV1 is a signal that switches between high and low levels. The output of STV1 is triggered by the rising edge Y31 of STV_IN1 and continuously outputs a high level. STV_IN2 is low, and the output of STV2 is triggered by STV_IN2 and continuously outputs a low level. CLK_IN1 is a clock signal that switches between high and low levels. CLK_IN2 continuously outputs a low level. CLK1 is triggered by the first rising edge Y11 of CLK_IN1 and the low level of CLK_IN2, continuously outputting a high level. CLK2 is triggered by the second rising edge Y12 of CLK_IN1 and the low level of CLK_IN2, continuously outputting a high level, and so on, until the output of CLK10. Therefore, CLK1 to CLK10 are triggered by CLK_IN1 and CLK_IN2, continuously outputting a high level. For example, the output signals may include at least one of frame trigger signals STV1 and STV2, and clock signals CLK1 to CLK10. The detection system can acquire at least one of the frame trigger signals STV1 and STV2, and clock signals CLK1 to CLK10, and detect these signals to determine whether the currently connected TCON adapter board 100 to be tested is qualified.

[0054] In this embodiment of the invention, the processor can input frame trigger control signals STV-IN1 and STV-IN2, and clock generation control signals CLK-IN1 and CLK-IN2 to the TCON adapter board, so that the Levelshift outputs frame trigger signals STV1 and STV2 and clock signals CLK1 to CLK10 in the TCON adapter board.

[0055] In this embodiment of the invention, a clock driving circuit can also be included in the controller. This clock driving circuit is connected to both the processor and the circuit board under test. The clock driving circuit can input a second type of frame start control signal and a second type of clock generation control signal to the currently connected circuit board under test. Since it is necessary to control the output waveforms of the first type of frame start control signal and the first type of clock generation control signal, these signals can be input to the currently connected circuit board under test via the processor. This reduces the computational complexity of the processor's output and the difficulty of subsequent detection.

[0056] In embodiments of the present invention, such as Figure 5 As shown, the clock driving circuit may include a first control resistor RS1 that corresponds one-to-one with each frame start control signal in the second type of frame start control signal; wherein, the first end of the first control resistor RS1 is connected to the output terminal of the corresponding frame start control signal, and the second end is connected to the ground terminal. For example, a frame start control signal STV_IN2 corresponds to one first control resistor RS1. The first end of the first control resistor RS1 is connected to the output terminal of the frame start control signal corresponding to the frame start control signal STV_IN2, and the second end is connected to the ground terminal, so that the frame start control signal STV_IN2 is continuously in a grounded state.

[0057] In embodiments of the present invention, such as Figure 5 As shown, the clock driving circuit may include a second control resistor RS2 corresponding one-to-one with each clock generation control signal in the second type of clock generation control signals; wherein, the first end of the second control resistor RS2 is connected to the output terminal of the corresponding clock generation control signal, and the second end is connected to the ground terminal. For example, the clock generation control signal CLK-IN2 corresponds to one second control resistor RS2. The first end of the second control resistor RS2 is connected to the output terminal of the clock generation control signal corresponding to the clock generation control signal CLK-IN2, and the second end is connected to the ground terminal, so that the clock generation control signal CLK-IN2 is continuously in a grounded state.

[0058] In embodiments of the present invention, such as Figure 2 As shown, the controller may further include a voltage control circuit 255; and the voltage control circuit 255 is connected to the processor 253 and the circuit board under test (e.g., a TCON adapter board). When the voltage control circuit 255 receives a power-on control signal, it can output a detection voltage (e.g., 12V) to the currently connected circuit board under test.

[0059] In embodiments of the present invention, such as Figure 6As shown, the voltage control circuit 255 may include: a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a first switch K1, a second switch N1, and a first diode VD1. The first end of the first resistor R1 is connected to ground. The second end of the first resistor R1 is connected to the control signal receiving terminal P-NF and the first end of the second resistor R2. The second end of the second resistor R2 is connected to the control terminal of the first switch K1, and the first end of the first switch K1 is connected to ground. The second end of the second switch N1 is connected to the first end of the third resistor R3. The second end of the third resistor R3 is connected to the first ends of the fourth resistor R4 and the fifth resistor R5. The second end of the fourth resistor R4 is connected to the cathode of the first diode VD1 and the control terminal of the second switch N1. The anode of the first diode VD1 is connected to the first end of the fifth resistor R5. The second end of the fifth resistor R5 is connected to the second end of the sixth resistor R6 and the first end of the second switch N1. The first end of the sixth resistor R6 is connected to the detection voltage input terminal P-IN. The second terminal of the second switch N1 is connected to the detection voltage output terminal P-OUT. The detection voltage output terminal P-OUT is configured to connect to the currently connected circuit board under test in order to output a detection voltage to the currently connected circuit board under test.

[0060] For example, the first switch K1 can be configured as an NPN transistor. The second switch N1 can be configured as a p-channel enhancement-mode MOSFET. For instance, taking a high-level power-on control signal as an example, the processor inputs a high-level power-on control signal to the control signal receiver P-NF. Through the action of the first resistor R1 and the second resistor R2, the base voltage of the NPN transistor K1 can be pulled high, causing the NPN transistor K1 to conduct. Then, through the combined action of the third resistor R3, the fourth resistor R4, the first diode VD1, the fifth resistor R5, and the sixth resistor R6, the level of the control terminal of the p-channel enhancement-mode MOSFET switch N1 can be pulled low, thereby turning on the p-channel enhancement-mode MOSFET switch N1. This allows the 12V voltage input at the detection voltage input terminal P-IN to be output as a 12V detection voltage to the currently connected circuit board under test through the detection voltage output terminal P-OUT.

[0061] Furthermore, the processor inputs a low-level power-down control signal to the control signal receiver P-NF. Through the action of the first resistor R1 and the second resistor R2, the base voltage of the NPN transistor K1 can be pulled low, causing the NPN transistor K1 to be turned off. Thus, through the combined action of the third resistor R3, the fourth resistor R4, the first diode VD1, the fifth resistor R5, and the sixth resistor R6, the level of the control terminal of the p-communication enhancement field-effect integrated MOSFET switch N1 can be pulled high, thereby turning off the p-communication enhancement field-effect integrated MOSFET switch N1 and disconnecting the detection voltage input terminal P-IN from the currently connected circuit board under test.

[0062] In this embodiment of the invention, to improve the voltage stability of the control terminal of the first switch, such as... Figure 7 As shown, the voltage control circuit 255 may further include: a first capacitor C1. The first end of the first capacitor C1 is connected to the ground terminal, and the second end of the first capacitor C1 is connected to the control terminal of the first switch.

[0063] In this embodiment of the invention, to improve the voltage stability of the control terminal of the second switch, such as... Figure 7 As shown, the voltage control circuit 255 may further include a second capacitor C2. The first terminal of the second capacitor C2 is connected to the first terminal of the second switch, and the second terminal of the second capacitor C2 is connected to the control terminal of the second switch.

[0064] In practical applications, this invention is compatible with the detection of different TCON adapter boards. After the detection of the previous TCON adapter board is completed and the detection system is switched to connect to the next TCON adapter board, multiple operating modes can be set to adapt to the usage environment and facilitate selection for practical applications. For example, a restart operating mode and a continuous power-on operating mode.

[0065] 1. Restart Operation Mode:

[0066] When testing the TCON adapter board, the processor can be connected to the TCON adapter board 100 to be tested via the I2C bus 310. The user can input a power-on command to the processor by pressing physical button key2 to control the power-on of the entire testing system (e.g., by connecting the power supply 280 to input a 12V system power voltage). After waiting for a certain period (e.g., 100ms) until the testing system is stable, the user can input a parameter selection command to the processor by pressing physical button key1 to control the testing system to enter the testing parameter selection mode. For example, when the processor receives the parameter selection command, it sends a type acquisition signal to the currently connected TCON adapter board. After receiving the type acquisition signal, the TCON adapter board sends the type of its PMU / GAMMA / Level shift chip to the processor. The processor can determine the number of the testing configuration parameter based on the acquired PMU / GAMMA / Level shift chip type and retrieve the corresponding testing configuration parameter from multiple different types of testing configuration parameters stored in the memory. This allows the determination of the detection configuration parameters corresponding to the PMU / GAMMA / Level shift chip in the currently connected TCON adapter board 100 from a variety of pre-stored detection configuration parameters. Alternatively, the type of PMU / GAMMA / Level shift chip in the currently connected TCON adapter board can be manually viewed, and the target number corresponding to the detection configuration parameter can be determined based on that type. Then, an instruction is input to the processor to display the numbers corresponding to the various stored detection configuration parameters on the display. The operator then finds the target number from these numbers. A parameter selection instruction is input to the processor to select the target number, thereby determining the detection configuration parameters corresponding to the PMU / GAMMA / Level shift chip in the currently connected TCON adapter board 100 from a variety of pre-stored detection configuration parameters.

[0067] The control system shuts down and restarts, ensuring the running program within the restarted system corresponds to the currently connected TCON adapter board. After the restart stabilizes, pressing physical button key3 sends a power-on command to the processor. Upon receiving the power-on command, the processor, under its control, inputs a high-level power-on control signal to the P-NF terminal of the voltage control circuit. Under this high-level signal, the voltage control circuit supplies a 12V detection voltage to the TCON adapter board, powering it on. Additionally, upon receiving the power-on command, the processor can also provide power input to the FRC chip, powering it on as well.

[0068] After a certain period of time (e.g., 100ms) until the TCON adapter board powers on and stabilizes, the processor can send the determined detection configuration parameters to the TCON adapter board. This allows the PMU / GAMMA / Level shift registers in the PMU / GAMMA / Level shift chips of the TCON adapter board 100 to configure their parameters. During parameter configuration, the indicator light can flash intermittently. The indicator light can be on for 1 second during intermittent flashing. After parameter configuration is complete, the indicator light can remain constantly on.

[0069] After a certain waiting time (e.g., 100ms), the processor can input data and output control signals to the FRC chip. Upon receiving the data output control signal, the FRC chip handshakes with the currently connected circuit board under test. After the handshake is complete, it can input display data to the TCON adapter board under test via the V-By-One interface through the FRC chip, allowing the TCON adapter board to process and output the display data. Furthermore, the processor inputs a frame trigger control signal STV-IN1 and a clock generation control signal CLK-IN1 to the TCON adapter board. It also inputs a frame trigger control signal STV-IN2 and a clock generation control signal CLK-IN2 to the TCON adapter board via a clock drive circuit. The Levelshift function in the TCON adapter board can output a frame trigger signal STV1 based on the frame trigger control signal STV-IN1, and a frame trigger signal STV2 based on the frame trigger control signal STV-IN2. It also generates clock signals CLK-IN1 to CLK-IN2 based on the clock generation control signals CLK-IN1 and CLK-IN2, thus generating clock signals CLK1 to CLK10. The detection system can collect the frame trigger signals STV1 and STV2, clock signals CLK1 to CLK10, and display data processed by the TCON adapter board. Based on the frame trigger signals STV1 and STV2, clock signals CLK1 to CLK10, and display data processed by the TCON adapter board, the system can perform detection to determine whether the currently connected TCON adapter board 100 to be tested is qualified.

[0070] After the TCON adapter board completes its testing, pressing physical button key3 sends a power-down command to the processor. Upon receiving this command, the processor, under its control, inputs a low-level power-down control signal to the voltage control circuit's control signal receiver P-NF. Under this low-level signal, the voltage control circuit disconnects the detection voltage input P-IN from the currently connected circuit board. Furthermore, upon receiving the power-down command, the processor can also cut off the power supply to the FRC chip, thus de-energizing it and reducing power consumption.

[0071] 2. Continuous power-on operation mode:

[0072] When testing the TCON adapter board, the processor can be connected to the TCON adapter board 100 to be tested via the I2C bus 310. The user can input a power-on command to the processor by pressing physical button key2 to control the power-on of the entire testing system (e.g., by connecting the power supply 280 to input a 12V system power voltage). After waiting for a certain period (e.g., 100ms) until the testing system is stable, the user can input a parameter selection command to the processor by pressing physical button key1 to control the testing system to enter the testing parameter selection mode. For example, when the processor receives the parameter selection command, it sends a type acquisition signal to the currently connected TCON adapter board. After receiving the type acquisition signal, the TCON adapter board sends the type of its PMU / GAMMA / Level shift chip to the processor. The processor can determine the number of the testing configuration parameter based on the acquired PMU / GAMMA / Level shift chip type and retrieve the corresponding testing configuration parameter from multiple different types of testing configuration parameters stored in the memory. This allows the determination of the detection configuration parameters corresponding to the PMU / GAMMA / Level shift chip in the currently connected TCON adapter board 100 from a variety of pre-stored detection configuration parameters. Alternatively, the type of PMU / GAMMA / Level shift chip in the currently connected TCON adapter board can be manually viewed, and the target number corresponding to the detection configuration parameter can be determined based on that type. Then, an instruction is input to the processor to display the numbers corresponding to the various stored detection configuration parameters on the display. The operator then finds the target number from these numbers. A parameter selection instruction is input to the processor to select the target number, thereby determining the detection configuration parameters corresponding to the PMU / GAMMA / Level shift chip in the currently connected TCON adapter board 100 from a variety of pre-stored detection configuration parameters.

[0073] The control and detection system remains continuously active, saving detection time on the TCON adapter board. Pressing the physical button key3 inputs a power-on command to the processor. Upon receiving this command, the processor, under its control, inputs a high-level power-on control signal to the P-NF terminal of the voltage control circuit. Under this high-level signal, the voltage control circuit inputs a 12V detection voltage to the TCON adapter board, powering it on. Additionally, upon receiving the power-on command, the processor can also provide power to the FRC chip, powering it on as well.

[0074] After a certain period of time (e.g., 100ms) until the TCON adapter board powers on and stabilizes, the processor can send the determined detection configuration parameters to the TCON adapter board. This allows the PMU / GAMMA / Level shift registers in the PMU / GAMMA / Level shift chips of the TCON adapter board 100 to configure their parameters. During parameter configuration, the indicator light can flash intermittently. The indicator light can be on for 1 second during intermittent flashing. After parameter configuration is complete, the indicator light can remain constantly on.

[0075] After a certain waiting time (e.g., 100ms), the processor can input data and output control signals to the FRC chip. Upon receiving the data output control signal, the FRC chip handshakes with the currently connected circuit board under test. After the handshake is complete, it can input display data to the TCON adapter board under test via the V-By-One interface through the FRC chip, allowing the TCON adapter board to process and output the display data. Furthermore, the processor inputs a frame trigger control signal STV-IN1 and a clock generation control signal CLK-IN1 to the TCON adapter board. It also inputs a frame trigger control signal STV-IN2 and a clock generation control signal CLK-IN2 to the TCON adapter board via a clock drive circuit. The Levelshift function in the TCON adapter board can output a frame trigger signal STV1 based on the frame trigger control signal STV-IN1, and a frame trigger signal STV2 based on the frame trigger control signal STV-IN2. It also generates clock signals CLK-IN1 to CLK-IN2 based on the clock generation control signals CLK-IN1 and CLK-IN2, thus generating clock signals CLK1 to CLK10. The detection system can collect the frame trigger signals STV1 and STV2, clock signals CLK1 to CLK10, and display data processed by the TCON adapter board. Based on the frame trigger signals STV1 and STV2, clock signals CLK1 to CLK10, and display data processed by the TCON adapter board, the system can perform detection to determine whether the currently connected TCON adapter board 100 to be tested is qualified.

[0076] After the TCON adapter board completes its testing, pressing physical button key3 sends a power-down command to the processor. Upon receiving this command, the processor, under its control, inputs a low-level power-down control signal to the voltage control circuit's control signal receiver P-NF. Under this low-level signal, the voltage control circuit disconnects the detection voltage input P-IN from the currently connected circuit board. Furthermore, upon receiving the power-down command, the processor can also cut off the power supply to the FRC chip, thus de-energizing it and reducing power consumption.

[0077] The specific driving principle and implementation method of the detection method provided in this embodiment are the same as those of the detection system in the above embodiment, and will not be repeated here.

[0078] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A detection system, characterized in that, include: Inspect the circuit board; The inspection circuit board includes: a controller connected to the circuit board to be tested; the controller includes: a processor and a data output circuit; wherein the processor is connected to the data output circuit, and the processor and the data output circuit are respectively connected to the circuit board to be tested; The processor is configured to, upon receiving a parameter selection instruction, determine the detection configuration parameters corresponding to the currently connected circuit board under test from a plurality of pre-stored different types of detection configuration parameters; configure the parameters of the currently connected circuit board under test according to the determined detection configuration parameters; and after the parameter configuration, input a drive control signal to the circuit board under test and input a data output control signal to the data output circuit. The data output circuit is configured to, upon receiving the data output control signal, perform a handshake with the currently connected circuit board under test, and input display data to the currently connected circuit board under test after the handshake is completed; The drive control signals include: multiple frame start control signals and multiple clock generation control signals; wherein, the multiple frame start control signals are divided into a first type of frame start control signal and a second type of frame start control signal, the first type of frame start control signal having a first level and a second level, and the second type of frame start control signal having a first level; And / or, the plurality of clock generation control signals are divided into a first type of clock generation control signal and a second type of clock generation control signal, wherein the first type of clock generation control signal has a first level and a second level, and the second type of clock generation control signal has a first level.

2. The detection system as described in claim 1, characterized in that, The circuit board to be tested has a display control chip; the same type of display control chip corresponds to the same detection configuration parameters; The processor is further configured to: pre-store detection configuration parameters corresponding to multiple different types of display control chips; upon receiving the parameter selection instruction, determine the type of display control chip in the data output circuit; based on the determined type of display control chip, select the detection configuration parameters corresponding to the display control chip in the currently connected circuit board under test from the pre-stored detection configuration parameters; and configure the parameters of the display control chip in the currently connected circuit board under test according to the determined detection configuration parameters.

3. The detection system as described in claim 2, characterized in that, The processor is also configured to: After selecting the detection configuration parameters corresponding to the display control chip in the currently connected circuit board under test, the detection system is controlled to shut down and restart; and after restarting, the display control chip in the currently connected circuit board under test is configured according to the determined detection configuration parameters. Alternatively, after selecting the detection configuration parameters corresponding to the display control chip in the currently connected circuit board under test, the detection system is controlled to remain running, and the parameters of the display control chip in the currently connected circuit board under test are configured according to the determined detection configuration parameters.

4. The detection system as described in claim 3, characterized in that, The controller further includes a voltage control circuit; the voltage control circuit is connected to both the processor and the circuit board to be tested. The processor is further configured to: receive a circuit board power-on command before the detection system is turned on and before receiving the detection start command, and input a power-on control signal to the voltage control circuit under the control of the circuit board power-on command; The voltage control circuit is configured to output a detection voltage to the currently connected circuit board under test when it receives the power-on control signal.

5. The detection system as described in claim 4, characterized in that, The voltage control circuit includes: a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, a first switch, a second switch, and a first diode; The first end of the first resistor is connected to the ground end, and the second end of the first resistor is connected to both the control signal receiving end and the first end of the second resistor. The second end of the second resistor is connected to the control terminal of the first switch, the first end of the first switch is connected to the ground terminal, and the second end of the second switch is connected to the first end of the third resistor. The second end of the third resistor is connected to the first end of the fourth resistor and the first end of the fifth resistor, respectively. The second end of the fourth resistor is connected to the negative terminal of the first diode and the control terminal of the second switch, respectively. The positive terminal of the first diode is connected to the first end of the fifth resistor; The second end of the fifth resistor is connected to the second end of the sixth resistor and the first end of the second switch; The first end of the sixth resistor is connected to the detection voltage input terminal; The second terminal of the second switch is connected to the detection voltage output terminal, which is configured to be connected to the currently connected circuit board under test to output a detection voltage to the currently connected circuit board under test.

6. The detection system as described in claim 1, characterized in that, The controller further includes a clock driving circuit; the clock driving circuit is connected to the processor and the circuit board to be tested, respectively. The processor is further configured to: after the parameter configuration, input the first type of frame start control signal and the first type of clock generation control signal to the currently connected circuit board to be tested; The clock driving circuit is configured to input the second type of frame start control signal and the second type of clock generation control signal to the currently connected circuit board under test.

7. The detection system as described in claim 6, characterized in that, The clock driving circuit includes: a first control resistor corresponding one-to-one with each frame start control signal in the second type of frame start control signal, and a second control resistor corresponding one-to-one with each clock generation control signal in the second type of clock generation control signal. The first end of the first control resistor is connected to the corresponding frame start control signal output terminal, and the second end is connected to the ground terminal; The first end of the second control resistor is connected to the corresponding clock generation control signal output terminal, and the second end is connected to the ground terminal.

8. A detection method, characterized in that, include: Upon receiving a parameter selection instruction, the system determines the detection configuration parameters corresponding to the currently connected circuit board under test from a variety of pre-stored detection configuration parameters of different types; based on the determined detection configuration parameters, the system configures the parameters of the currently connected circuit board under test, and after the parameter configuration, inputs a drive control signal to the circuit board under test and inputs a data output control signal to the data output circuit. The data output circuit is configured to, upon receiving the data output control signal, perform a handshake with the currently connected circuit board under test, and input display data to the currently connected circuit board under test after the handshake is completed; The drive control signals include: multiple frame start control signals and multiple clock generation control signals; wherein, the multiple frame start control signals are divided into a first type of frame start control signal and a second type of frame start control signal, the first type of frame start control signal having a first level and a second level, and the second type of frame start control signal having a first level; And / or, the plurality of clock generation control signals are divided into a first type of clock generation control signal and a second type of clock generation control signal, wherein the first type of clock generation control signal has a first level and a second level, and the second type of clock generation control signal has a first level.

9. The detection method according to claim 8, characterized in that, include: The detection configuration parameters corresponding to multiple different types of display control chips are pre-stored; Upon receiving the parameter selection instruction, the type of the display control chip in the data output circuit is determined; based on the determined type of the display control chip, the detection configuration parameters corresponding to the display control chip in the currently connected circuit board under test are selected from the pre-stored detection configuration parameters; based on the determined detection configuration parameters, the parameters of the display control chip in the currently connected circuit board under test are configured.

10. The detection method according to claim 9, characterized in that, include: After selecting the detection configuration parameters corresponding to the display control chip in the currently connected circuit board to be tested, control the detection system to shut down and restart. After restarting, the display control chip in the currently connected circuit board under test is configured with parameters according to the determined detection configuration parameters. Alternatively, after selecting the detection configuration parameters corresponding to the display control chip in the currently connected circuit board under test, the detection system is controlled to remain running, and the parameters of the display control chip in the currently connected circuit board under test are configured according to the determined detection configuration parameters.

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