A test device that provides transient input voltage jumps

Abstract

This invention introduces a test device for providing transient input voltage, comprising a cooling device power supply module, a proportional amplifier module, and a power amplifier circuit module. The cooling device power supply module is connected to a cooling device, which dissipates heat from the power amplifier circuit module. One signal input terminal of the proportional amplifier module is connected to a signal injection module, which is configured to generate a transient signal of arbitrary waveform. The output terminal of the proportional amplifier module is connected to the signal input terminal of the power amplifier circuit module. Both the proportional amplifier module and the power amplifier circuit module serve as output terminals for the test device providing the transient input voltage, thus the power amplifier circuit module acts as a voltage follower for the proportional amplifier module. The device of this invention provides a transient input voltage and has high current carrying capacity.

Description

Technical Field

[0001] This invention is designed for verification schemes widely used in switching power supply products, specifically involving a test device that provides transient input voltage. Background Technology

[0002] With the rapid development of semiconductor technology, consumer electronics have become indispensable in our daily lives. And every electronic product, whether it's a smartwatch, mobile phone, tablet, or IoT device, relies on a power management chip.

[0003] Power management chips play a crucial role in system architecture. Almost all power chips on the market require fast input voltage transient (Line Transient) and startup testing. A good power chip's output must respond quickly to changes in the power supply. For example, if a sudden drop in power occurs, it's essential to determine whether the LDO (Low Dropout Linear Regulator) chip's output voltage can maintain a stable output. This underscores the importance of fast input voltage transient testing.

[0004] like Figure 1 The image shows a typical fast transient waveform of the input voltage from a power management chip datasheet provided by an analog chip company, used for testing power management chips. Figure 1 Input voltage V IN This refers to the input voltage and output voltage V of the power management chip under test. OUT This refers to the output voltage of the power management chip under test, and the bottom one is the inductor current I. L An ideal power management chip will have no output voltage ripple regardless of how the input voltage changes.

[0005] Therefore, there is an urgent need for a test device that provides transient input voltage, hereinafter referred to as LNTB (Line Transient Board), which is used to provide transient input voltage and has high current carrying capacity. Summary of the Invention

[0006] The purpose of this invention is to provide a test device for providing transient input voltage, which is used to provide transient input voltage and has a large current carrying capacity.

[0007] To achieve the above objectives, the present invention provides a test device for providing transient input voltage, comprising a cooling device power supply module, a proportional amplifier module, and a power amplifier circuit module; the cooling device power supply module is connected to a cooling device and is configured to supply power to the cooling device, the cooling device being configured to dissipate heat from the power amplifier circuit module; one signal input terminal of the proportional amplifier module is connected to a signal injection module, the signal injection module being configured to generate a transient signal of arbitrary waveform; the output terminal of the proportional amplifier module is connected to one signal input terminal of the power amplifier circuit module, and the output terminals of both the proportional amplifier module and the power amplifier circuit module are output terminals of the test device for providing transient input voltage, such that the power amplifier circuit module constitutes a voltage follower of the proportional amplifier module.

[0008] The cooling device power supply module, proportional amplifier module, and power amplifier circuit module are mounted on the same circuit board.

[0009] The power supply module for the cooling device includes a first chip with a buck-boost converter circuit topology to obtain a stable output voltage and serve as the power source for the cooling device.

[0010] The cooling device is a fan, and the first chip is a TPS55165 chip.

[0011] The VINP, VINL, and IGN_PWRL pins of the TPS55165 chip are all connected to the positive power supply. The VINP and VINL pins are grounded through a first input capacitor, while the IGN_PWRL and PS pins are both connected to the positive power supply through a second input capacitor. An energy storage inductor is connected between the L1 and L2 pins. The L1 pin is also connected to the BST1 pin through a first pilot capacitor and grounded through a first energy storage resistor and a first energy storage capacitor connected in series. The L2 pin is also connected to the BST2 pin through a second pilot capacitor and grounded through a first energy storage resistor and a first energy storage capacitor connected in series. The second energy storage resistor and the second energy storage capacitor are grounded; the VOUT pin and VOUT_SENSE pin of the TPS55165 chip are directly connected, and the VOUT pin is grounded through multiple output capacitors connected in parallel with each other, and the VOUT pin is connected to the PG pin of the TPS55165 chip through the first output resistor. The cooling device is connected to the VOUT pin at one end through the pin header interface, and the other end is grounded; the SS_EN pin, PG_DLY pin, PGND pin, GND pin and PAD pin of the TPS55165 chip are directly grounded, and the VOS_FB pin, VREG pin and VREG_Q pin are grounded through the first grounding capacitor.

[0012] The proportional amplifier module includes an OPA552 chip; the negative power supply pin of the OPA552 chip is directly connected to the negative power supply, and the positive power supply pin of the proportional amplifier module is directly connected to the positive power supply. The negative input terminal of the OPA552 chip is directly connected to one end of the first feedback resistor and one end of the second feedback resistor. The other end of the first feedback resistor is grounded, and the other end of the second feedback resistor is the voltage output terminal BOUT of the test device that provides transient input voltage. The two ends of the second feedback resistor are connected to the first feedback capacitor. The signal injection module is connected to the positive input terminal of the proportional amplifier module through an SMA connector.

[0013] The first pin of the SMA connector is connected to the positive input terminal of the proportional amplifier module via a switchable multiplier adjustment module. The switchable multiplier adjustment module includes a multiplier switch with its moving end connected to the first pin of the SMA connector, a first grounding resistor, a second grounding capacitor, and a pair of grounding resistors connected in parallel between the first pin of the SMA connector and ground. The pair of grounding resistors includes a third grounding resistor and a fourth grounding resistor connected in series, wherein the fourth grounding resistor is directly grounded, and the connection point of the third and fourth grounding resistors is connected to the positive input terminal of the proportional amplifier module. The first stationary end of the multiplier switch is connected to the connection point of the third and fourth grounding resistors, and the second stationary end of the multiplier switch is disconnected from all other devices.

[0014] The power amplifier circuit module uses the OPA549S chip.

[0015] The positive power supply terminal of the power amplifier circuit module is connected to the positive power supply, and its negative power supply terminal is connected to the negative power supply. Its positive input terminal is connected to the output terminal of the proportional amplifier module, and both its negative input terminal and output terminal are connected to the second output resistor. The end of the second output resistor furthest from the power amplifier circuit module is the voltage output terminal of the test device that provides transient input voltage. The voltage output terminal of the test device that provides transient input voltage is grounded through a Zener diode and a third output resistor. The reference pin of the power amplifier circuit module is grounded. The current limiting pin of the power amplifier circuit module is grounded through a current limiting resistor and a limiting capacitor connected in parallel.

[0016] The power amplifier circuit modules are multiple and connected in parallel, and the signal input terminal of each power amplifier circuit module is connected to the output terminal of the proportional amplifier module.

[0017] The present invention provides a test device for providing transient input voltage. The test device for providing transient input voltage first amplifies the injection signal from the signal injection module through the proportional amplifier module (amplification factor of 10 or 1), and then outputs the amplified signal through the power amplifier circuit module to enable it to have a large current carrying capacity, thereby providing a large current carrying capacity while providing a transient input voltage.

[0018] Therefore, the rise rate of the power pulse of the test device for providing transient input voltage of the present invention is much faster than that of a programmable DC power supply, up to 10V / 0.1ms; at the same time, the cost is low, as the test device is composed of a voltage regulator IC and a power amplifier chip circuit, which is more cost-effective than expensive power amplifiers on the market; furthermore, it is easy to operate, and only requires setting the waveform of the signal injection module to work; in addition, since its principle is to amplify the waveform of the signal injection module, it can realize transient signals of arbitrary waveforms. Attached Figure Description

[0019] Figure 1 It is a measured waveform diagram of transient transitions from the power chip's datasheet.

[0020] Figure 2 This is a schematic diagram of the overall structure of the test device for providing transient input voltage according to the present invention;

[0021] Figure 3 This is a schematic diagram of the cooling device power supply module of the test device for providing transient input voltage according to the present invention;

[0022] Figure 4 This is a schematic diagram of the proportional amplifier module and the power amplifier circuit module of the test device for providing transient input voltage jumps according to the present invention.

[0023] Figure 5 This is an actual test waveform diagram of the voltage follower (power amplifier circuit) of the test device for providing transient input voltage jumps according to the present invention. Detailed Implementation

[0024] like Figure 2As shown, the test device for providing transient input voltage of the present invention includes a cooling device power supply module 10, a proportional amplifier module 20, and a power amplifier circuit module 30 disposed on the same circuit board. The cooling device power supply module 10 is connected to a cooling device 40 and is configured to supply power to the cooling device, which is configured to dissipate heat from the power amplifier circuit module 30. One signal input terminal of the proportional amplifier module 20 is connected to a signal injection module 50 (such as a signal generator), and the output terminal of the proportional amplifier module 20 is connected to one signal input terminal of the power amplifier circuit module 30. The output terminals of both the proportional amplifier module 20 and the power amplifier circuit module 30 are output terminals of the test device for providing transient input voltage, such that the power amplifier circuit module 30 constitutes a voltage follower (i.e., a two-stage power amplifier) ​​of the proportional amplifier module 20.

[0025] like Figure 3 As shown, the cooling device power supply module 10 includes a first chip with a BUCK-BOOST (buck-boost) converter circuit topology. The function of the BUCK-BOOST (buck-boost) converter is to obtain a stable output voltage as the power supply for the cooling device 40.

[0026] In this embodiment, the cooling device is a fan, and correspondingly, the first chip is a TPS55165 chip. The TPS55165 chip is a wide input range, fixed output voltage buck-boost converter, set to output a stable 12V voltage to drive the cooling device, enabling the cooling device to dissipate heat for the power amplifier circuit module 30. The fan's rated current is below 800mA, and the TPS55165 chip can achieve 90% efficiency (i.e., the output power of the buck-boost converter divided by the input power) under a 1A load, thus having sufficient capacity to drive the fan.

[0027] The TPS55165 chip is commercially available and includes the following pins: VINP, VINL, IGN_PWRL, IGN, PS, PGND, GND, BST1, BST2, L1, L2, PG, VOUT, VOUT_SENSE, SS_EN, VOS_FB, VREG, VREG_Q, PG_DLY, and PAD.

[0028] The descriptions of each pin are as follows:

[0029] The VINP pin is the power input voltage pin, and this pin needs to be connected to the input power supply.

[0030] The VINL pin is the input voltage pin provided for internal bias and needs to be connected to the input power supply.

[0031] The IGN pin is the ignition enable input signal pin. Ignition is enabled when the signal on this pin is high and disabled when the signal is low.

[0032] The IGN_PWRL pin is a logic-level IGN power-lock signal pin. When the signal on this pin is high, the IGN pin is locked; when the signal on this pin is low, the IGN pin is not locked.

[0033] The PS pin is a logic level input signal pin that enables and disables low-power mode. When this pin is high, the power mode is low-power mode, and when this pin is low, the power mode is normal mode.

[0034] The PGND pin is the power ground pin.

[0035] The GND pin is the analog ground pin.

[0036] The L1 pin is the switching node for the buck power stage, and the L2 pin is the switching node for the boost power stage. An inductor with a nominal value of 4.7µH is connected between the L1 and L2 pins.

[0037] Pin BST1 is the boot node for the buck power stage; a 100 nF capacitor needs to be connected between this pin and pin L1. Pin BST2 is the boot node for the boost power stage; a 100 nF capacitor needs to be connected between this pin and pin L2.

[0038] The PG pin is the output good indicator pin, and it is an open-drain pin. When the signal on this pin is high, the power supply is functioning normally; when the signal on this pin is low, the power supply is malfunctioning.

[0039] VOUT is the output voltage pin of the buck-boost converter.

[0040] The VOUT_SENSE pin is the detection pin for the output voltage of the buck-boost converter, and this pin must be connected to the VOUT pin.

[0041] The SS_EN pin is a configuration pin used to enable and disable spread spectrum. The spread spectrum function is enabled when this pin is on and disabled when this pin is low.

[0042] The VOS_FB pin is the output voltage selection pin. When this pin is connected to the GND pin, the output voltage is set to 5V. When this pin is connected to the VREG pin, the output voltage is 12V.

[0043] The VREG pin is the gate drive power supply pin for the buck-boost power stage. A 4.7µF (typical) decoupling capacitor on this pin needs to be connected to power supply ground. The VREG pin cannot drive external loads.

[0044] The VREG_Q pin is the mute feedback pin for the gate drive power supply of the buck-boost power stage. This pin must be connected near the top side of a 4.7µF (typical) decoupling capacitor at the VREG output pin.

[0045] The PG_DLY pin is the configuration pin for the power-good delay time. Connect this pin to a resistor with a value of 10kΩ to 100kΩ to configure the PG delay time from 0.5 ms to 40 ms. Ground this pin, and the default PG delay time is 2 ms (typical value).

[0046] The VINP pin of the TPS55165 chip is powered by the positive power supply VCC. The circuit topology of the TPS55165 chip is a BUCK-BOOST converter.

[0047] In this embodiment, the VINP, VINL, and IGN_PWRL pins of the TPS55165 chip are all connected to the positive power supply VCC. The VINP and VINL pins are grounded through a first input capacitor C16, which filters and regulates the input voltage. The capacitance of the first input capacitor C16 is preferably 0.47μF. The IGN_PWRL and PS pins are both connected to the positive power supply VCC through a second input capacitor C23, which is preferably 22μF. An energy storage inductor M1 is connected between the L1 and L2 pins. The energy storage inductor M1 is an essential energy storage component for the buck-boost converter, and its inductance is preferably 4.7μH. The L1 pin is also connected to the BST1 pin via a first pilot capacitor C32, and grounded via a first energy storage resistor R19 and a first energy storage capacitor C35 connected in series. The capacitance of the first pilot capacitor C32 is preferably 0.1 μF, the resistance of the first energy storage resistor R19 is preferably 1 KΩ, and the capacitance of the first energy storage capacitor C35 is preferably 10 nF. The L2 pin is also connected to the BST2 pin via a second pilot capacitor C34, and grounded via a second energy storage resistor R20 and a second energy storage capacitor C36 connected in series. The capacitance of the second pilot capacitor C34 is preferably 0.1 μF, the resistance of the second energy storage resistor R20 is preferably 1 KΩ, and the capacitance of the second energy storage capacitor C36 is preferably 10 nF.

[0048] The VOUT and VOUT_SENSE pins of the TPS55165 chip are directly connected. The VOUT pin is grounded through multiple output capacitors connected in parallel (such as the first output capacitor C26, the second output capacitor 27, and the third output capacitor C28). The VOUT pin is also connected to the PG pin through the first output resistor R9. The cooling device is connected to the VOUT pin at one end via a pin header interface, and grounded at the other end. Preferably, the resistance value of the first output resistor R9 is 100KΩ, and the capacitance values ​​of the first output capacitor C26, the second output capacitor 27, and the third output capacitor C28 are 0.1μF, 22μF, and 22μF, respectively. The function of the first output capacitor C26, the second output capacitor 27, and the third output capacitor C28 is to stabilize the output voltage, making the power supply voltage of the fan more stable.

[0049] The SS_EN, PG_DLY, PGND, GND and PAD pins of the TPS55165 chip are directly grounded, while the VOS_FB, VREG and VREG_Q pins are grounded through the first grounding capacitor C33, which has a capacitance of 4.7μF.

[0050] like Figure 4 As shown, one of the signal input terminals of the proportional amplifier module 20 is connected to a signal injection module 50, configured to amplify the output of the signal injection module 50. The proportional amplifier module 20 has a positive power supply terminal V+, a negative power supply terminal V-, a positive input terminal IN+, a negative input terminal IN-, an output terminal OUT, and a thermal shutdown indicator terminal FLAG. In this embodiment, the proportional amplifier module 20 includes an OPA552 chip, which is a high-current (380mA), high-voltage (60V), high-bandwidth (12MHz) operational amplifier, configured as a 10x proportional amplifier to amplify the output of the signal generator.

[0051] The negative power supply terminal V- of the OPA552 chip is directly connected to the negative power supply VSS, and the positive power supply terminal V+ of the proportional amplifier module 20 is directly connected to the positive power supply VCC, thereby powering the proportional amplifier module 20. Both the positive and negative power supplies are directly powered from an external power source, providing a wide voltage input range (±3V~±40V). The negative input terminal IN- of the OPA552 chip is directly connected to one end of the first feedback resistor R4 and one end of the second feedback resistor R5. The other end of the first feedback resistor R4 is grounded, and the other end of the second feedback resistor R5 is the voltage output terminal BOUT of the test device providing transient input voltage of the present invention. The two ends of the second feedback resistor R5 are connected to the first feedback capacitor CF1. The resistance values ​​of the first feedback resistor R4 and the second feedback resistor R5 are 1KΩ and 9.09KΩ, respectively, and the capacitance value of the first feedback capacitor CF1 is 10nF.

[0052] The positive input terminal IN+ of the proportional amplifier module 20 is set to receive the injection signal from the signal injection module 50. .

[0053] Based on the principle of "virtual short" and "virtual open" of proportional amplifier module 20:

[0054] =

[0055] Therefore we can conclude that:

[0056] -R5 =R4 -R4

[0057] (R4+R5) =R4

[0058] Therefore, the magnification factor is:

[0059]

[0060] in, The signal at the voltage output terminal of the test device is provided to supply the input voltage that experiences transient jumps. The signal is injected into the signal injection module 50.

[0061] In this embodiment, R4 = 1KΩ, R5 = 9.09KΩ, so the amplification factor k 10 times.

[0062] Therefore, the amplification of the proportional amplifier module 20 is achieved through the first feedback resistor R4 and the second feedback resistor R5, with a scaling factor of 10. The thermal shutdown indicator terminal FLAG is grounded through the thermal protection shutdown resistor R7. Thus, the waveform of the signal VSIN output from the output terminal OUT of the proportional amplifier module 20 is a signal injected into the signal injection module 50, amplified 10 times. The waveform.

[0063] The signal injection module 50 is configured to generate transient jump signals of arbitrary waveforms. Therefore, through amplification by the proportional amplifier module 20, transient jumps of arbitrary waveforms can be achieved. The signal injection module 50 is connected to the positive input terminal IN+ of the proportional amplifier module 20 via an SMA connector 501. Specifically, the first pin of the SMA connector 501 is connected to the positive input terminal IN+ of the proportional amplifier module 20 via a switchable multiplier adjustment module 60, and the remaining four pins are grounded. The switchable multiplier adjustment module 60 includes a multiplier switch S1 whose moving end is connected to the first pin of the SMA connector 501, a first grounding resistor R16 located between the first pin of the SMA connector 501 and ground and connected in parallel, a second grounding capacitor C22, and a grounding resistor pair. The grounding resistor pair includes a third grounding resistor R15 and a fourth grounding resistor R17 connected in series, wherein the fourth grounding resistor R17 is directly grounded, and the connection point of the third grounding resistor R15 and the fourth grounding resistor R17 is connected to the positive input terminal IN+ of the proportional amplifier module 20. Of the two stationary terminals of the amplification switch S1, the first stationary terminal is connected to the junction of the third grounding resistor R15 and the fourth grounding resistor R17, while the second stationary terminal is disconnected from all other devices. In this embodiment, the resistance value of the first grounding resistor R16 is 49.9Ω, the capacitance value of the second grounding capacitor C22 is 4.7μF, and the resistance values ​​of the third grounding resistor R15 and the fourth grounding resistor R17 are 180KΩ and 20KΩ, respectively.

[0064] Therefore, when the amplification factor switch S1 is connected from the first stationary terminal to the second stationary terminal, the signal injected by the signal injection module 50... If the signal is directly connected to the positive input terminal IN+ of the proportional amplifier module 20, then the amplification factor of the output terminal BOUT of the test device for providing transient input voltage is 10. When the amplification factor switch S1 is switched from the second fixed terminal to the first fixed terminal, it injects the signal into the signal injection module 50. First, the voltage is reduced according to the ratio of the fourth grounding resistor R17 and the third grounding resistor R15 (reduced by a factor of 10 in this embodiment) and then sent to the positive input terminal IN+ of the proportional amplifier module 20. Then, the amplification factor of the voltage output terminal BOUT of the test device for providing transient input voltage of the present invention is 1 (i.e., equal proportion).

[0065] In this embodiment, the power amplifier circuit module 30 uses the OPA549S chip. This is a high-power operational amplifier. The OPA552 chip has a power of 11W, while the OPA549S chip has a power of 90W. A single OPA549S chip has a voltage rating of 60V and a current output capability of 8A.

[0066] In this embodiment, there are multiple power amplifier circuit modules 30 connected in parallel. The signal input terminal of each power amplifier circuit module 30 is connected to the output terminal of the proportional amplifier module 20. Thus, after the signal is processed by the amplifier, it passes through multiple parallel OPA549S voltage followers to enable the overall system to have a large load driving capability. Since the output terminal of the transient input voltage test device (LNTB) of this invention is generally connected to the voltage input terminal of the EVB board (evaluation circuit board) which is the object under test, it must have load-carrying capacity. If the object under test is a Boost circuit, the input current of the object under test may reach about 10A, while the current capability of a single OPA549S chip is only 8A, so multiple stages of operational amplifiers need to be connected in parallel for use.

[0067] like Figure 4 As shown, the power amplifier circuit module 30 has a positive power supply terminal V+, a negative power supply terminal V-, an enable / status pin E_S, a positive input terminal IN+, a negative input terminal IN-, an output terminal VO, a reference pin REF, and a current limit pin ILIM.

[0068] In this circuit, the positive power supply terminal V+ of the power amplifier circuit module 30 is connected to the positive power supply VCC, the negative power supply terminal V- is connected to the negative power supply VSS, the positive input terminal IN+ is connected to the output terminal OUT of the proportional amplifier module 20, and both the negative input terminal IN- and the output terminal VO are connected to the second output resistor R1. The end of the second output resistor R1 furthest from the power amplifier circuit module 30 is the voltage output terminal BOUT of the test device for providing transient input voltage changes of this invention. BOUT is grounded through a Zener diode D1 and a third output resistor R3. The Zener diode D1, model SK84L, is used for circuit protection. The resistance value of the second output resistor R1 is 0.01Ω.

[0069] The reference pin REF of the power amplifier circuit module 30 is grounded, and the current limiting pin ILIM of the power amplifier circuit module 30 is grounded through a current-limiting resistor R2 and a limiting capacitor C1 connected in parallel. The current-limiting resistor R2 has a resistance of 845Ω and is used to limit the maximum current of the operational amplifier. The limiting capacitor C1 has a capacitance of 10nF.

[0070] The positive power supply VCC is grounded through the first power supply stabilizing capacitor C2, the second power supply stabilizing capacitor C3, and the third power supply stabilizing capacitor C4, thereby stabilizing the voltage. In this embodiment, the capacitance of the first power supply stabilizing capacitor C2 is 10μF, the capacitance of the second power supply stabilizing capacitor C3 is 10μF, and the capacitance of the third power supply stabilizing capacitor C4 is 0.1μF.

[0071] The negative power supply VSS is grounded through the fourth, fifth, and sixth power supply stabilizing capacitors C5, C6, and C7, thereby stabilizing the voltage. In this embodiment, the capacitance of the fourth power supply stabilizing capacitor C5 is 10μF, the capacitance of the fifth power supply stabilizing capacitor C6 is 10μF, and the capacitance of the sixth power supply stabilizing capacitor C7 is 0.1μF.

[0072] Therefore, the test device for providing transient input voltage of the present invention first amplifies the injection signal of the signal injection module 50 by means of the proportional amplifier module 20 (amplification factor of 10 or 1), and then outputs the amplified signal by means of the power amplifier circuit module 30 to enable it to have a large current carrying capacity, thereby providing a large current carrying capacity while providing a transient input voltage.

[0073] Verification has shown that the test device for providing transient input voltages of the present invention can realize various transient input voltage forms such as pulse waves, square waves, and sine waves. The circuit also includes a power supply module for generating a cooling device, which can provide convection cooling to the heat sink of the power amplifier circuit module 30 base through a cooling device such as a fan, so that it can continuously carry the load without overheating protection.

[0074] In this invention, the power swing (i.e. the difference between the maximum and minimum power supply voltage) of the positive power supply VCC and the negative power supply VSS can reach ±30V and is at least ±10V. This ensures that the power supply switching range is within this voltage range, which can fully meet the daily testing requirements.

[0075] Actual test results:

[0076] Figure 5This is an actual test waveform diagram of the test device (i.e., LNTB board) that provides transient input voltage according to the present invention. The upper curve is the transient signal Pulse output by the signal injection module 50, and the lower curve is the output signal LNTB_out of the test device that provides transient input voltage according to the present invention.

[0077] As can be seen, the transient input voltage testing device of the present invention achieves a 10-fold amplification of the transient signal output by the signal injection module 50, and can also handle a load. From the actual measurement results, the rise slope of the output signal of the transient input voltage testing device of the present invention is 10V / 0.1ms. This is much faster than the slope requirement of a programmable DC power supply, and is consistent with the LineTransient waveform slope of most datasheets on the market. Because the rise slope of currently available programmable DC power supplies is in the tens to hundreds of milliseconds range, and due to the many parasitic parameters within the power supply, even at the maximum rise slope, power-on is relatively slow. The present invention improves the rise slope of the power supply through a proportional amplifier module and a power amplifier circuit module.

[0078] Compared to traditional programmable DC power supplies, the transient input voltage testing device of this invention has several advantages: 1. The rise rate of the power pulse is much faster than that of a programmable DC power supply, up to 10V / 0.1ms; 2. Lower cost, as the testing device is composed of a voltage regulator IC and a power amplifier chip circuit, offering better cost-effectiveness than expensive power amplifiers on the market; 3. Simple operation, requiring only the waveform of the signal injection module 50 to function; 4. Because its principle involves amplifying the waveform of the signal injection module 50, it can realize transient signals of arbitrary waveforms.

Claims

1. A testing device for providing transient input voltage jumps, characterized in that, This includes a cooling device power supply module, a proportional amplifier module, and a power amplifier circuit module; The power supply module for the cooling device is connected to a cooling device, the power supply module for the cooling device is configured to supply power to the cooling device, and the cooling device is configured to dissipate heat from the power amplifier circuit module. One signal input terminal of the proportional amplifier module is connected to a signal injection module, which is configured as a transient jump signal of arbitrary waveform. The output terminal of the proportional amplifier module is connected to one signal input terminal of the power amplifier circuit module. The output terminals of both the proportional amplifier module and the power amplifier circuit module are the output terminals of the test device that provides the transient jump input voltage, so that the power amplifier circuit module constitutes a voltage follower of the proportional amplifier module. The proportional amplifier module includes an OPA552 chip; the negative power supply pin of the OPA552 chip is directly connected to the negative power supply, and the positive power supply pin of the proportional amplifier module is directly connected to the positive power supply. The negative input terminal of the OPA552 chip is directly connected to one end of the first feedback resistor and one end of the second feedback resistor. The other end of the first feedback resistor is grounded, and the other end of the second feedback resistor is the voltage output terminal BOUT of the test device that provides transient input voltage. The two ends of the second feedback resistor are connected to the first feedback capacitor. The signal injection module is connected to the positive input terminal of the proportional amplifier module through an SMA connector. The resistance values ​​of the first and second feedback resistors are 1KΩ and 9.09KΩ, respectively, and the capacitance value of the first feedback capacitor is 10nF. The power amplifier circuit module uses an OPA549S chip. The positive power supply terminal of the power amplifier circuit module is connected to a positive power supply, and its negative power supply terminal is connected to a negative power supply. Its positive input terminal is connected to the output terminal of the proportional amplifier module, and both its negative input terminal and output terminal are connected to a second output resistor. The end of the second output resistor furthest from the power amplifier circuit module is the voltage output terminal of the test device providing transient input voltage. The voltage output terminal of the test device providing transient input voltage is grounded through a Zener diode and a third output resistor. The reference pin of the power amplifier circuit module is grounded. The current limiting pin of the power amplifier circuit module is grounded through a current-limiting resistor and a limiting capacitor connected in parallel. The transient input voltage testing device amplifies the injection signal from the signal injection module through the proportional amplifier module, and then outputs the amplified signal through the power amplifier circuit module to enable it to carry a large current, thereby providing a large current carrying capacity while handling transient input voltage.

2. The testing apparatus for providing transient input voltage according to claim 1, characterized in that, The cooling device power supply module, proportional amplifier module, and power amplifier circuit module are mounted on the same circuit board.

3. The testing apparatus for providing transient input voltage according to claim 1, characterized in that, The power supply module for the cooling device includes a first chip with a buck-boost converter circuit topology to obtain a stable output voltage and serve as the power supply for the cooling device.

4. The test apparatus for providing transient input voltage according to claim 3, characterized in that, The cooling device is a fan, and the first chip is a TPS55165 chip.

5. The test apparatus for providing transient input voltage according to claim 4, characterized in that, The VINP, VINL, and IGN_PWRL pins of the TPS55165 chip are all connected to the positive power supply. The VINP and VINL pins are grounded through a first input capacitor, and the IGN_PWRL and PS pins are both connected to the positive power supply through a second input capacitor. An energy storage inductor is connected between the L1 and L2 pins. The L1 pin is also connected to the BST1 pin through a first pilot capacitor and grounded through a first energy storage resistor and a first energy storage capacitor in series. The L2 pin is also connected to the BST2 pin through a second pilot capacitor and grounded through a second energy storage resistor and a second energy storage capacitor in series. The VOUT pin and VOUT_SENSE pin of the TPS55165 chip are directly connected, and the VOUT pin is grounded through multiple output capacitors connected in parallel. The VOUT pin is also connected to the PG pin of the TPS55165 chip through a first output resistor. The cooling device is connected to the VOUT pin at one end through a pin header interface and grounded at the other end. The SS_EN, PG_DLY, PGND, GND and PAD pins of the TPS55165 chip are directly grounded, while the VOS_FB, VREG and VREG_Q pins are grounded through the first grounding capacitor.

6. The testing apparatus for providing transient input voltage according to claim 1, characterized in that, The first pin of the SMA connector is connected to the positive input terminal of the proportional amplifier module via a switchable multiplier adjustment module. The switchable multiplier adjustment module includes a multiplier switch with its moving end connected to the first pin of the SMA connector, a first grounding resistor, a second grounding capacitor, and a pair of grounding resistors connected in parallel between the first pin of the SMA connector and ground. The pair of grounding resistors includes a third grounding resistor and a fourth grounding resistor connected in series, wherein the fourth grounding resistor is directly grounded, and the connection point of the third and fourth grounding resistors is connected to the positive input terminal of the proportional amplifier module. The first stationary end of the multiplier switch is connected to the connection point of the third and fourth grounding resistors, and the second stationary end of the multiplier switch is disconnected from all other devices.

7. The testing apparatus for providing transient input voltage according to claim 1, characterized in that, The power amplifier circuit modules are multiple and connected in parallel, and the signal input terminal of each power amplifier circuit module is connected to the output terminal of the proportional amplifier module.

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