Automatic X-ray flaw detection method and device with autonomous decision function

Abstract

The application discloses an automatic X-ray flaw detection method and device with autonomous decision function, and the automatic X-ray flaw detection method comprises the following steps: a model construction step: the shape information of a measured object is obtained by scanning the shape of the measured object, and a three-dimensional model of the measured object is obtained by modeling the measured object according to the shape information; an X-ray scanning step: a scanning scheme of the measured object is determined based on the three-dimensional model, and real-time X-ray scanning of the measured object is carried out based on the scanning scheme to obtain a real-time image; a flaw detection step: the real-time image of the measured object is divided into a plurality of flaw detection areas according to a preset rule based on the real-time image, and the flaw detection work of the measured object is completed by scanning the measured object through X-ray based on the flaw detection areas. The application has the advantages of high automation, good imaging effect and low radiation damage to personnel.

Description

Technical Field

[0001] This invention belongs to the field of X-ray flaw detection technology, and more specifically, it relates to an automated X-ray flaw detection method and apparatus with autonomous decision-making function. Background Technology

[0002] X-ray flaw detection is an important non-destructive testing technique that can inspect the internal quality of an object without damaging it. It is widely used in casting, forging, welding, and other forming industries. Currently, the most widely used X-ray flaw detection methods are traditional film placement and real-time imaging X-ray flaw detection. Traditional film placement requires manual film placement, manual movement of the object, and film processing, resulting in low efficiency, high labor intensity, and radiation hazards for personnel. Current real-time imaging X-ray flaw detection equipment often only includes a turntable for workpiece positioning, achieving semi-automation and higher efficiency than manual film placement. However, it has poor adaptability to complex objects, cannot adjust the X-ray probe to be perpendicular to the object's surface, and produces significantly distorted images. Furthermore, both traditional film placement and real-time imaging X-ray flaw detection require manual measurement of the object's thickness before X-ray testing, followed by operator input of the X-ray parameters into the equipment. For objects with complex structures and varying wall thicknesses, manual measurement and manual calculation, parameter determination, and adjustment can easily lead to errors and affect work efficiency.

[0003] Therefore, there is an urgent need to develop an automated X-ray flaw detection method and device with autonomous decision-making function that overcomes the above-mentioned defects. Summary of the Invention

[0004] To address the aforementioned problems, this invention provides an automated X-ray flaw detection method with autonomous decision-making capabilities, which addresses the issues of low automation levels in current X-ray flaw detection equipment, inability to adapt to complex structures, and low efficiency due to manual measurement of object thickness and determination of X-ray flaw detection parameters. The method includes:

[0005] Model building steps: Obtain the shape information of the object under test by scanning its shape, and obtain a three-dimensional model of the object under test based on the shape information.

[0006] X-ray scanning steps: Based on the three-dimensional model, determine the scanning scheme for the object under test, and perform real-time X-ray scanning on the object under test based on the scanning scheme to obtain real-time images;

[0007] Flaw detection steps: Based on the real-time image, the real-time image of the object under test is divided into multiple flaw detection areas according to preset rules. Based on the flaw detection areas, the object under test is scanned with X-rays to complete the flaw detection work.

[0008] The aforementioned automated X-ray flaw detection method, wherein the model construction step includes:

[0009] The shape information is obtained by scanning the object under test layer by layer by controlling the scanning position of the infrared light.

[0010] The aforementioned automated X-ray flaw detection method, wherein the X-ray scanning step includes:

[0011] Based on the 3D model, a scanning scheme is constructed for the object under test, the scanning scheme including the scanning path and scanning speed;

[0012] The X-ray scanning position is controlled according to the scanning scheme to scan the object under test and obtain the real-time image.

[0013] The aforementioned automated X-ray flaw detection method includes the following flaw detection steps:

[0014] The real-time image is divided into multiple flaw detection areas based on the optimal measurement area of ​​X-rays.

[0015] The smoothness information of the flaw detection area is obtained by scanning the flaw detection area with ultrasonic waves, and the flaw detection scheme of the flaw detection area is determined based on the smoothness information.

[0016] After adjusting the X-rays based on the coordinates of the inspection area obtained by infrared scanning, the inspection is carried out through the X-rays in the inspection area until the inspection of all the inspection areas is completed.

[0017] The aforementioned automated X-ray flaw detection method includes the following flaw detection steps:

[0018] The position of the object under test is adjusted based on the coordinates of the inspection area obtained from infrared scanning. In the aforementioned automated X-ray flaw detection method, the step of adjusting the X-ray based on the coordinates of the inspection area obtained from infrared scanning includes:

[0019] A fitting plane is obtained by fitting the coordinates of the inspection area, and the X-rays are adjusted to inspect the inspection area in a direction perpendicular to the fitting plane.

[0020] The aforementioned automated X-ray flaw detection method, wherein determining the flaw detection scheme for the flaw detection area based on the flatness information includes:

[0021] The number of flaw detections, the flaw detection current, and the exposure time are determined based on the flatness information.

[0022] The present invention also provides an automated X-ray flaw detection device with autonomous decision-making function, comprising:

[0023] The scanning unit is used to scan the shape of the object under test to obtain the shape information of the object under test;

[0024] A position adjustment unit is used to mount the scanning unit and adjust the scanning position of the scanning unit and / or the scanning position of the object under test.

[0025] The control unit is electrically connected to the scanning unit and the position adjustment unit;

[0026] The control unit constructs a three-dimensional model of the object under test based on the shape information and determines a scanning scheme for the object based on the three-dimensional model. Based on the scanning scheme, the control unit controls the scanning unit and / or the position adjustment unit to perform real-time X-ray scanning on the object under test to obtain real-time images. Based on the real-time images, the control unit divides the real-time images of the object under test into multiple flaw detection areas according to preset rules. The control unit then controls the scanning unit and / or the position adjustment unit to perform X-ray scanning on the object under test based on the flaw detection areas to complete the flaw detection work on the object under test.

[0027] The aforementioned automated X-ray flaw detection device, wherein the scanning unit includes:

[0028] An integrated probe, electrically connected to the control unit, includes an X-ray probe, an infrared probe, and an ultrasonic probe. The X-ray probe is used to perform X-ray scanning on the object under test to obtain the real image; the infrared probe is used to perform infrared scanning on the object under test to obtain the shape information; and the ultrasonic probe is used to perform ultrasonic scanning on the object under test to obtain the flatness information of the flaw detection area.

[0029] A multi-degree-of-freedom angle head assembly, wherein the integrated probe is mounted on the multi-degree-of-freedom angle head assembly, and the multi-degree-of-freedom angle head assembly is mounted on the position adjustment unit and electrically connected to the control unit;

[0030] The control unit adjusts the scanning position of the integrated probe by controlling the multi-degree-of-freedom angle head assembly.

[0031] The aforementioned automated X-ray flaw detection device, wherein the position adjustment unit includes:

[0032] guide,

[0033] A support beam is mounted on the guide rail, and the control unit controls the support beam to move along the guide rail in the direction of the guide rail.

[0034] The mounting block is installed on the support beam, the multi-degree-of-freedom angle head assembly is installed on the mounting block, and the control unit controls the mounting block to move on the support beam along the direction of the support beam;

[0035] A rotary table is electrically connected to the control unit and is used to carry the object being measured;

[0036] The control unit controls the movement of the support beam and / or the mounting block to adjust the scanning position of the integrated probe, and the control unit controls the rotary table to rotate the object under test to adjust the scanning position of the object under test.

[0037] The advantages of this invention compared to the prior art are: during flaw detection, the X-ray flaw detection parameters can be adaptively adjusted according to the structure of the object under test with a complex structure, which greatly improves the automation level of X-ray flaw detection, and also has the advantages of good imaging effect and low radiation damage to personnel.

[0038] Other features and advantages of the invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures pointed out in the description and the drawings. Attached Figure Description

[0039] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0040] Figure 1 Flowchart of the automated X-ray flaw detection method of this invention;

[0041] Figure 2 This is a schematic diagram of the structure of the automated X-ray flaw detection device of the present invention;

[0042] Figure 3 This is a schematic diagram of the integrated probe structure;

[0043] Figure 4 This is a schematic diagram of the structure of a multi-degree-of-freedom angle head assembly. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0045] The illustrative embodiments and descriptions of the present invention are used to explain the invention, but are not intended to limit the invention. Furthermore, elements / components using the same or similar reference numerals in the drawings and embodiments are used to represent the same or similar parts.

[0046] The terms "first," "second," "S1," "S2," etc., used in this document do not specifically refer to any order or sequence, nor are they intended to limit the invention. They are merely used to distinguish elements or operations described using the same technical terms.

[0047] The directional terms used in this article, such as up, down, left, right, front, or back, are for reference only when referring to the accompanying drawings. Therefore, the use of directional terms is for illustrative purposes and not to limit this work.

[0048] The terms “include,” “including,” “have,” “contain,” etc., used in this article are all open-ended terms, meaning that they include but are not limited to.

[0049] The term "and / or" as used herein includes any or all of the things mentioned.

[0050] The term "multiple" in this article includes "two" and "more than two"; the term "multiple groups" in this article includes "two groups" and "more than two groups".

[0051] Certain terms used to describe this application will be discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art in describing the application.

[0052] Please see Figure 1 , Figure 1 A flowchart of the automated X-ray flaw detection method of this invention. (See attached flowchart.) Figure 1 As shown, the automated X-ray flaw detection method with autonomous decision-making function of the present invention includes:

[0053] Model building step S1: Obtain the shape information of the object under test by scanning the shape of the object under test, and model the object under test according to the shape information to obtain a three-dimensional model of the object under test; wherein, the model building step S1 includes: obtaining the shape information by scanning the object under test layer by layer by controlling the scanning position of infrared rays.

[0054] X-ray scanning step S2: Based on the three-dimensional model, determine the scanning scheme for the object under test, and perform real-time X-ray scanning on the object under test based on the scanning scheme to obtain real-time images.

[0055] Flaw detection step S3: Based on the real-time image, the real-time image of the object under test is divided into multiple flaw detection areas according to preset rules. Based on the flaw detection areas, the object under test is scanned with X-rays to complete the flaw detection work.

[0056] The X-ray scanning step S2 includes:

[0057] Based on the 3D model, a scanning scheme is constructed for the object under test, the scanning scheme including the scanning path and scanning speed;

[0058] The X-ray scanning position is controlled according to the scanning scheme to scan the object under test and obtain the real-time image.

[0059] Among them, flaw detection step S3 includes:

[0060] The real-time image is divided into multiple flaw detection areas based on the optimal measurement area of ​​X-rays.

[0061] The smoothness information of the flaw detection area is obtained by scanning the flaw detection area with ultrasonic waves, and the flaw detection scheme of the flaw detection area is determined based on the smoothness information.

[0062] After adjusting the X-rays based on the coordinates of the flaw detection area obtained by infrared scanning, flaw detection is performed on the flaw detection area through X-rays until all the flaw detection areas are completed.

[0063] The step of adjusting the X-ray based on the coordinates of the flaw detection area obtained by infrared scanning includes: fitting the coordinates of the flaw detection area to obtain a fitting plane, and adjusting the X-ray to perform flaw detection on the flaw detection area in a direction perpendicular to the fitting plane.

[0064] The flaw detection scheme for determining the flaw detection area based on the flatness information includes: determining the number of flaw detections, the flaw detection current, and the exposure time based on the flatness information.

[0065] In this embodiment, the flatness information is the wall thickness information of the object being tested, obtained through ultrasonic waves.

[0066] Furthermore, the flaw detection step S3 also includes:

[0067] The position of the object under test is adjusted based on the coordinates of the flaw detection area obtained by infrared scanning.

[0068] Please refer to Figure 2 , Figure 2 This is a schematic diagram of the automated X-ray flaw detection device of the present invention. Figure 2 As shown, the automated X-ray flaw detection device with autonomous decision-making function of the present invention includes: a scanning unit 1, a position adjustment unit 2, and a control unit 3. The scanning unit 1 is used to scan the shape of the object under test 4 to obtain the shape information of the object under test 4. The position adjustment unit 2 is used to load the scanning unit 1 and adjust the scanning position of the scanning unit 1 and / or the scanning position of the object under test 4 through the position adjustment unit 3. The control unit 3 is electrically connected to the scanning unit 1 and the position adjustment unit 2. The control unit 3 constructs a three-dimensional model of the object under test based on the shape information and determines a scanning scheme for the object under test 4 based on the three-dimensional model. The control unit 3 controls the scanning unit 1 and / or the position adjustment unit 2 to perform real-time X-ray scanning on the object under test 4 based on the scanning scheme to obtain real-time images. The control unit 3 divides the real-time images of the object under test 4 into multiple flaw detection areas according to a preset rule based on the real-time images. The control unit 3 completes the flaw detection work on the object under test 4 by controlling the scanning unit 1 and / or the position adjustment unit 2 to perform X-ray scanning on the object under test 4 based on the flaw detection areas.

[0069] Among them, the control unit 3 is an intelligent control unit with programming and autonomous decision-making functions. The control unit is also equipped with a display screen to display the X-ray image of the object being tested in real time, and it also has a storage function.

[0070] This invention can automatically scan the surface of the object under test, measure its thickness, and make the following decisions based on the measurement results: First, it automatically adjusts the shape of the object under test and the angle of the X-ray probe to ensure that the X-ray probe is perpendicular to the surface under test; Second, it autonomously selects and executes X-ray flaw detection parameters based on the thickness information of the object under test.

[0071] Furthermore, the scanning unit 1 includes an integrated probe 11 and a multi-degree-of-freedom angle head assembly 12. The integrated probe 11 is electrically connected to the control unit 3. The integrated probe 11 integrates an X-ray probe, an ultrasonic probe, and an infrared probe into one probe, performing three functions: shape scanning, wall thickness measurement, and X-ray flaw detection. Specifically, the integrated probe 11 includes an X-ray probe 111, an infrared probe 112, and an ultrasonic probe 113. The X-ray probe 111 is used to perform X-ray scanning on the object under test 4 to obtain the real image; the infrared probe 112 is used to perform infrared scanning on the object under test 4 to obtain the shape information; the ultrasonic probe 113 is used to perform ultrasonic scanning on the object under test 4 to obtain the flatness information of the flaw detection area; the integrated probe 11 is mounted on the multi-degree-of-freedom angle head assembly 12, which is mounted on the position adjustment unit 2 and electrically connected to the control unit 3. The control unit 3 adjusts the scanning position of the integrated probe 11 by controlling the multi-degree-of-freedom angle head assembly 12.

[0072] Please refer to Figure 3 , Figure 3 This is a schematic diagram of the integrated probe structure. Figure 3 As shown, the X-ray probe 111 emits X-rays according to the X-ray parameters issued by the control unit 3 under the command of the control unit 3, and performs real-time imaging of the interior of the object under test 4; the ultrasound probe 113 can extend and retract under the control of the control unit 3, and measure the thickness of the measured part after contacting the object under test 4, and transmit the thickness information back to the control unit 3 for decision-making; the infrared probe 112 can scan the surface of the object under test 4, and transmit the obtained shape information back to the control unit 3. The control unit 3 automatically adjusts the position and angle of the probe and the position and angle of the workpiece according to the shape of the measured surface and the position and angle of the integrated probe, so that the probe is perpendicular to the measured surface, ensuring the accuracy of X-ray imaging.

[0073] Please refer to Figure 4 , Figure 4 This is a structural schematic diagram of a multi-degree-of-freedom angle head assembly. (Example:) Figure 4 As shown, the multi-degree-of-freedom angle head assembly 12 includes a telescopic support rod 121 and an angle head 122. One end of the telescopic support rod 121 is connected to the mounting block 23 installed on the position adjustment unit 2, and the other end is connected to the angle head 121. An integrated probe 11 is installed on the angle head 121. The telescopic support rod 121 can be moved by the mounting block 23. At the same time, the telescopic support rod 121 can drive the angle head 122 to move back and forth. The angle head 122 can deflect an angle and rotate around the telescopic support rod 121.

[0074] In one embodiment of the present invention, a gear mechanism may be provided inside the angle head 122, and the multi-degree-of-freedom angle head assembly 12 further includes a first motor. The control unit 3 is electrically connected to the first motor, and the first motor is connected to the gear mechanism. The control unit 3 controls the first motor to drive the gear mechanism, thereby driving the angle head 122 to deflect at an angle, so as to adjust the scanning position of the integrated probe 11. It should be noted that the first motor may be built inside the angle head 122 or disposed outside the angle head 122.

[0075] In another embodiment of the present invention, the degree-of-freedom angle head assembly 12 may further include a second motor, and the control unit 3 is electrically connected to the second motor. The second motor is connected to the telescopic support rod 121. The control unit 3 controls the second motor to drive the telescopic support rod 121, thereby driving the angle head 122 to perform forward and backward telescopic movements to adjust the scanning position of the integrated probe 11. It should be noted that the second motor may be built into the telescopic support rod 121 or disposed outside the telescopic support rod 121.

[0076] Further, the position adjustment unit 2 includes: a guide rail 21, a support beam 22, a mounting block 23, and a rotary worktable 24. The support beam 22 is mounted on the guide rail 21. The control unit 3 is electrically connected to the support beam 22 via a cable 6. The control unit 3 controls the support beam 22 to move along the guide rail 21. The mounting block 23 is mounted on the support beam 22. One end of the telescopic support rod 121 is mounted on the mounting block 23. The control unit 3 controls the mounting block 23 to move along the support beam 22. The rotary worktable 24... The stage 24 is electrically connected to the control unit 3 via cable 6 and is used to support the object under test 4. The control unit 3 controls the support beam 22 and / or the mounting block 23 to move to adjust the scanning position of the integrated probe 11. The control unit 3 controls the rotary stage 24 to drive the object under test 4 to rotate to adjust the scanning position of the object under test 4. The rotary stage 24 can drive the object under test 4 to rotate circumferentially and tilt at an angle under the control of the control unit 1. At the same time, the rotary stage 24 can be linked with the multi-degree-of-freedom angle head assembly 12 under the control of the control unit 1.

[0077] In another embodiment of the present invention, the position adjustment unit 2 further includes a third motor and a control unit 3 electrically connected to the third motor. The third motor is connected to the support beam 22 through a lead screw mechanism. The control unit 3 controls the third motor to drive the lead screw mechanism, thereby causing the support beam 22 to move along the direction of the guide rail 21 on the guide rail 21. It should be noted that the third motor and / or the lead screw mechanism can be disposed inside or outside the support beam 22.

[0078] In another embodiment of the present invention, the position adjustment unit 2 further includes a fourth motor, the control unit 3 is electrically connected to the fourth motor, the fourth motor is connected to the rotary table 24, and the control unit 3 controls the fourth motor to drive the rotary table 24, thereby causing the object under test 4 to rotate to adjust the scanning position of the object under test 4.

[0079] In another embodiment of the present invention, the position adjustment unit 2 further includes a fifth motor, the control unit 3 is electrically connected to the fifth motor, the fifth motor is connected to the mounting block 23 through a lead screw mechanism, and the control unit 3 drives the fifth motor to drive the lead screw mechanism, thereby causing the mounting block 23 to move along the direction of the support beam 22 on the support beam 22.

[0080] This invention integrates an X-ray probe, an infrared scanning probe, and an ultrasonic probe into a single unit. The integrated probe is equipped with an angle head with five degrees of freedom. The angle head and the integrated probe are placed on a working platform that can be raised, lowered, and moved. This allows the X-ray probe to be adjusted to any position and angle within its working dimensions.

[0081] Specifically, during on-site inspection and real-time assessment of the internal structure of an object, after the multi-degree-of-freedom angle head assembly 12 scans the object, the control unit 3 establishes a three-dimensional model of the object's shape based on the scanned data. The program is typically set with the probe 150mm from the object's surface. The program defaults to aligning the object's surface perpendicular to the integrated probe, with a scanning speed of 5cm / s-20cm / s (depending on the flatness of the partitions). The optimal scanning interval is 100mm-150mm. The scanning speed and interval can be determined based on the required flaw detection accuracy and product structure. Higher accuracy requirements and more complex product structures necessitate slower scanning speeds and smaller scanning intervals. After the object's shape is scanned, the program calculates the required scanning path (path loop) based on the scanning speed and interval. Repeated flaw detection enables real-time imaging through the linkage of the longitudinal beam, integrated probe, and rotary worktable. When flaw detection results are required, the optimal area to be measured is generally 150×150mm2. After the probe completes the scan, the scanned outer contour area is divided into multiple surface grids, i.e., flaw detection areas, according to the set optimal measurement area. The number of grids is rounded up and incremented by one to ensure that no flaw detection surface is missed. When there are areas of different thicknesses in the flaw detection area, multiple flaw detections are performed within the grid according to the number of areas of different thicknesses. The integrated probe automatically captures the coordinates of the area to be measured based on the infrared scanning probe. The probe automatically fits the optimal probe position perpendicular to the area to be measured based on the grid of the surface to be measured, and flaw detection is performed from top to bottom. After one side is flawed, the rotary worktable 7 automatically rotates a certain angle to ensure that all shell areas to be measured are effectively covered until 100% flaw detection is completed.

[0082] Please refer to the following: Figures 1-2 The embodiments of the present invention will be described in detail below:

[0083] Example 1:

[0084] Step 1: Securely clamp the object to be measured 4 onto the rotary table 24;

[0085] Step 2: The rotary table 24 begins to rotate under the control of the control unit 3. The multi-degree-of-freedom angle head assembly 12 moves to the bottom of the support beam 22 and begins to slowly move upward. The infrared probe 112 scans the shape of the object 4 layer by layer and transmits the information back to the control unit 33 in real time. During the scanning process, the control unit can autonomously control the support beam 22, the multi-degree-of-freedom angle head 122, and the rotary table 24 according to the shape of the object to be measured to adjust the relative position relationship between the infrared probe 112 and the object 4 to facilitate the probe to scan the object 4 completely and accurately.

[0086] Step 3: After the infrared probe 112 completes the scanning of the object under test 4, the control unit 3 establishes a three-dimensional model of the object under test based on the scanning data information of the object under test, and determines the scanning scheme of the object under test based on the three-dimensional model. The scanning scheme includes the scanning path and scanning speed. According to the scanning scheme, the X-ray scanning position of the X-ray probe 111 is controlled to scan the object under test 4 to obtain the real-time image.

[0087] Step 4: Control unit 3 constructs an X-ray flaw detection scheme based on the real-time image. The flaw detection scheme includes how many X-ray irradiations the object under test needs to undergo, how to divide and image it, and how the longitudinal beam, integrated probe, and rotary table should work together to ensure the perpendicularity between the probe and the surface under test. Specifically, based on the real-time image, the real-time image of the object under test is divided into multiple flaw detection areas according to preset rules. The object under test is then scanned with X-rays based on these flaw detection areas to complete the flaw detection work.

[0088] Step 5: After the control unit designs the X-ray flaw detection scheme, the control unit controls the longitudinal beam, integrated probe and rotary table to work together to make the integrated probe perpendicular to the first partition. The ultrasonic probe in the integrated probe contacts the object being measured through telescopic movement to measure the thickness and transmits the thickness data back to the control unit.

[0089] Step 6: The control unit autonomously selects X-ray parameters such as current and exposure time based on the thickness information of the object being measured transmitted back by the ultrasonic probe, controls the X-ray probe to perform X-ray imaging, and transmits the imaging data back to the control unit for display and storage.

[0090] Step 7: The control unit controls the longitudinal beam, integrated probe, and rotary table to repeat the process of Step 4 and Step 5 according to the designed scheme until all sections of the object to be measured have been detected.

[0091] Step 8: After the X-ray inspection of the entire object is completed, the control unit issues a command to control all motion mechanisms to return to their original positions and shuts down the machine.

[0092] Example 2:

[0093] Step 1: Import the 3D model of the object to be measured into the control unit;

[0094] Step 2: The control unit automatically identifies the shape contour of the object being measured, thickness at different locations, and other information based on the 3D model.

[0095] Step 3: The control unit autonomously designs an X-ray detection scheme based on the identified object information. The detection scheme includes how many times the object needs to be irradiated with X-rays and dividing it into zones. Each zone is based on parameters such as the thickness-designed X-ray current and exposure time. The integrated probe, rotary stage, and other components are linked to ensure the perpendicular relationship between the probe and the surface being measured.

[0096] Step 4: The control unit controls the longitudinal beam, integrated probe, and rotary table to perform X-ray flaw detection on the object under test in turn according to the designed scheme until all zones of the object under test have been detected.

[0097] Step 5: After the X-ray inspection of the entire object is completed, the control unit issues a command to control all motion mechanisms to return to their original positions and shuts down.

[0098] In summary, this invention has functions such as infrared scanning of the shape of the object under test, automatic probe alignment adjustment, thickness detection of the object under test, and autonomous selection of X-ray flaw detection parameters. Thus, during flaw detection, the X-ray flaw detection parameters can be adaptively adjusted according to the structure of the object under test with complex structure, which greatly improves the automation level of X-ray flaw detection, and also has the advantages of good imaging effect and low radiation damage to personnel.

[0099] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. An automated X-ray flaw detection method with autonomous decision-making function, characterized in that, include: Model building steps: Obtain the shape information of the object under test by scanning its shape, and obtain a three-dimensional model of the object under test based on the shape information. X-ray scanning steps: Based on the three-dimensional model, determine the scanning scheme for the object under test, and perform real-time X-ray scanning on the object under test based on the scanning scheme to obtain real-time images; Flaw detection steps: Based on the real-time image, the real-time image of the object under test is divided into multiple flaw detection areas according to preset rules. Based on the flaw detection areas, the object under test is scanned with X-rays to complete the flaw detection work of the object under test. The flaw detection steps include: The real-time image is divided into multiple flaw detection areas based on the optimal measurement area of ​​X-rays. The smoothness information of the flaw detection area is obtained by scanning the flaw detection area with ultrasonic waves, and the flaw detection scheme of the flaw detection area is determined based on the smoothness information. After adjusting the position of the X-ray or the object under test based on the coordinates of the flaw detection area obtained by infrared scanning, the flaw detection area is inspected by X-ray until all the flaw detection areas are inspected. A fitting plane is obtained by fitting the coordinates of the flaw detection area, and the X-ray is adjusted to inspect the flaw detection area in a direction perpendicular to the fitting plane.

2. The automated X-ray flaw detection method as described in claim 1, characterized in that, The model construction steps include: The shape information is obtained by scanning the object under test layer by layer by controlling the scanning position of the infrared light.

3. The automated X-ray flaw detection method as described in claim 1, characterized in that, The X-ray scanning step includes: A scanning scheme for the object under test is constructed based on the three-dimensional model, and the scanning scheme includes a scanning path and a scanning speed. The X-ray scanning position is controlled according to the scanning scheme to scan the object under test and obtain the real-time image.

4. The automated X-ray flaw detection method as described in claim 1, characterized in that, The step of determining the flaw detection scheme for the flaw detection area based on the flatness information includes: The number of flaw detections, the flaw detection current, and the exposure time are determined based on the flatness information.

5. An automated X-ray flaw detection device with autonomous decision-making function, characterized in that, The automated X-ray flaw detection method according to any one of claims 1-4, comprising: The scanning unit is used to scan the shape of the object under test to obtain the shape information of the object under test; A position adjustment unit is used to mount the scanning unit and adjust the scanning position of the scanning unit and / or the scanning position of the object under test. A control unit is used to perform the flaw detection steps, and the control unit is electrically connected to the scanning unit and the position adjustment unit; The control unit constructs a three-dimensional model of the object under test based on the shape information and determines a scanning scheme for the object based on the three-dimensional model. Based on the scanning scheme, the control unit controls the scanning unit and / or the position adjustment unit to perform real-time X-ray scanning on the object under test to obtain real-time images. Based on the real-time images, the control unit divides the real-time images of the object under test into multiple flaw detection areas according to preset rules. The control unit then controls the scanning unit and / or the position adjustment unit to perform X-ray scanning on the object under test based on the flaw detection areas to complete the flaw detection work on the object under test.

6. The automated X-ray flaw detection device as described in claim 5, characterized in that, The scanning unit includes: An integrated probe, electrically connected to the control unit, includes an X-ray probe, an infrared probe, and an ultrasonic probe. The X-ray probe is used to perform X-ray scanning on the object under test to obtain the real-time image; the infrared probe is used to perform infrared scanning on the object under test to obtain the shape information; and the ultrasonic probe is used to perform ultrasonic scanning on the object under test to obtain the flatness information of the flaw detection area. A multi-degree-of-freedom angle head assembly, wherein the integrated probe is mounted on the multi-degree-of-freedom angle head assembly, and the multi-degree-of-freedom angle head assembly is mounted on the position adjustment unit and electrically connected to the control unit; The control unit adjusts the scanning position of the integrated probe by controlling the multi-degree-of-freedom angle head assembly.

7. The automated X-ray flaw detection device as described in claim 6, characterized in that, The position adjustment unit includes: guide, A support beam is mounted on the guide rail, and the control unit controls the support beam to move along the guide rail in the direction of the guide rail. The mounting block is installed on the support beam, the multi-degree-of-freedom angle head assembly is installed on the mounting block, and the control unit controls the mounting block to move on the support beam along the direction of the support beam; A rotary table is electrically connected to the control unit and is used to carry the object being measured; The control unit controls the movement of the support beam and / or the mounting block to adjust the scanning position of the integrated probe, and the control unit controls the rotary table to rotate the object under test to adjust the scanning position of the object under test.

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