Diagnostic test methods, apparatuses, devices, and storage media

Abstract

The application provides a diagnostic test method, device, equipment and storage medium, relates to the technical field of computers, and the method comprises the following steps: reading configuration data cached in a storage chip of a baseboard management controller; determining configuration requirements of the baseboard management controller, and diagnosing the configuration data based on the configuration requirements; in the case that the configuration data does not meet the configuration requirements, sending an erasing instruction to the baseboard management controller, so that the baseboard management controller performs configuration data erasing according to the erasing instruction, thereby enabling the test terminal to automatically generate the erasing instruction to control the baseboard management controller to perform data erasing, and improving the test efficiency of the automatic test process.

Description

Technical Field

[0001] This application relates to the field of computer technology, and in particular to a diagnostic testing method, apparatus, device, and storage medium. Background Technology

[0002] The Baseboard Management Controller (BMC) occupies a central position in the server, controlling and monitoring the machine's status. The BMC also stores various types of server information, such as asset codes and trademarks. This type of information is typically stored in the BMC's EEPROM (Electrically Erasable Programmable Read-Only Memory), a type of memory chip that retains data even after power loss. Version changes, upgrades, and refreshes of the BMC do not alter the data stored in the EEPROM.

[0003] Currently, to meet the needs of the market, server configurations vary widely, and customer customization requirements are also diverse. The BMC's EEPROM stores various types of information. During the production process, to save production costs and reuse resources, there are scenarios where residual data stored in the server motherboard's BMC EEPROM is reused. When the motherboard is assembled onto a newly configured machine, the stored residual data may be incompatible with the new machine's configuration. Furthermore, BMC version upgrades cannot change the residual data. In this case, the new machine will experience abnormal problems due to the incompatibility of the motherboard's BMC information.

[0004] The current approach typically requires a testing terminal to perform diagnostic tests on the BMC on the motherboard of a new machine. When an anomaly is detected in the data stored in the BMC's EEPROM, the motherboard needs to be removed and the BMC's EEPROM needs to be programmed separately, which is time-consuming and labor-intensive and not conducive to automated testing processes. Summary of the Invention

[0005] This application provides a diagnostic testing method, apparatus, device, and storage medium to solve the technical problem in the prior art where, when abnormal problems occur due to mismatch of BMC information on the motherboard, the motherboard needs to be removed for special processing such as separately burning the EEPROM of the BMC, which is time-consuming and labor-intensive and not conducive to the automated testing process of production.

[0006] This application provides a diagnostic testing method applied to a testing terminal, wherein the testing terminal is connected to the management port of the management controller of the substrate under test via a test network cable, including:

[0007] Read the configuration data cached in the memory chip of the baseboard management controller;

[0008] Determine the configuration requirements of the baseboard management controller, and diagnose the configuration data based on the configuration requirements;

[0009] If the configuration data is found to be inconsistent with the configuration requirements, an erase command is sent to the baseboard management controller so that the baseboard management controller erases the configuration data according to the erase command.

[0010] According to a diagnostic testing method provided in this application, sending an erase command to the substrate management controller includes:

[0011] Based on the configuration requirements, determine the target configuration data to be erased from the configuration data;

[0012] The cache address of the target configuration data is determined, and an erase command carrying the cache address is sent to the baseboard management controller.

[0013] According to a diagnostic testing method provided in this application, after sending an erase command to the substrate management controller, the method includes:

[0014] Upon receiving a feedback signal from the substrate management controller, the configuration data cached in the substrate management controller's memory chip is reread; wherein, the feedback signal is a signal generated by the substrate management controller after executing the erase command;

[0015] If the configuration data is found to be inconsistent with the configuration requirements, an erase command is sent to the substrate management controller.

[0016] According to a diagnostic testing method provided in this application, after receiving the feedback signal sent by the substrate management controller, the method includes:

[0017] Record the erase log corresponding to the feedback signal.

[0018] According to a diagnostic testing method provided in this application, after continuing to send an erase command to the substrate management controller, the method includes:

[0019] If the number of times the erase command is sent reaches a preset number, an alarm message is generated and an alarm log is recorded;

[0020] The diagnostic process for the configuration data is terminated, and diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules of the baseboard management controller other than the electrically erasable programmable read-only memory.

[0021] According to a diagnostic testing method provided in this application, the configuration requirements include at least one of the following:

[0022] Server attribute parameter configuration requirements;

[0023] The server's default hardware configuration requirements;

[0024] The configuration requirements of the target firmware set by the user.

[0025] According to a diagnostic testing method provided in this application, after diagnosing the configuration data based on the configuration requirements, the method includes:

[0026] If the configuration data is found to meet the configuration requirements, diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules of the baseboard management controller other than the electrically erasable programmable read-only memory.

[0027] This application also provides a diagnostic testing device, comprising:

[0028] A reading unit is used to read configuration data cached in the storage chip of the baseboard management controller;

[0029] A diagnostic unit is used to determine the configuration requirements of the baseboard management controller and to diagnose the configuration data based on the configuration requirements.

[0030] An erasure unit is configured to send an erasure command to the substrate management controller when it is diagnosed that the configuration data does not meet the configuration requirements, so that the substrate management controller erases the configuration data according to the erasure command.

[0031] This application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement any of the diagnostic testing methods described above.

[0032] This application also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the diagnostic testing method as described above.

[0033] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the diagnostic testing method described above.

[0034] The diagnostic testing method, apparatus, equipment, and storage medium provided in this application read configuration data cached in the storage chip of the baseboard management controller; determine the configuration requirements of the baseboard management controller; diagnose the configuration data based on the configuration requirements; and send an erase command to the baseboard management controller when the configuration data does not meet the configuration requirements, so that the baseboard management controller can erase the configuration data according to the erase command. Thus, the test terminal can actively generate erase commands to control the baseboard management controller to erase data, thereby improving the testing efficiency of the automated testing process. Attached Figure Description

[0035] To more clearly illustrate the technical solutions in this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0036] Figure 1 This is a flowchart illustrating the diagnostic testing method provided in this application;

[0037] Figure 2 This is a schematic diagram of the structure of the diagnostic testing device provided in this application;

[0038] Figure 3 This is a schematic diagram of the structure of the electronic device provided in this application. Detailed Implementation

[0039] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0040] In existing technologies, when a test terminal performs diagnostic tests on the BMC on the motherboard of a new machine, if an abnormality is found in the data stored in the EEPROM of the BMC, the motherboard needs to be removed and the EEPROM of the BMC needs to be specially processed, such as being burned separately. After the special processing, the test terminal is used again to perform diagnostic tests. If an abnormality is found, the motherboard needs to be removed again for separate processing until the test is successful. This process is time-consuming and labor-intensive, and is not conducive to automated testing processes.

[0041] To address the aforementioned technical issues, this embodiment provides a diagnostic testing method. This method involves reading configuration data cached in the memory chip of the baseboard management controller; determining the configuration requirements of the baseboard management controller; diagnosing the configuration data based on these requirements; and, if the configuration data is found to be inconsistent with the configuration requirements, sending an erase command to the baseboard management controller to erase the configuration data. This allows the test terminal to proactively generate erase commands to control the baseboard management controller to erase data, thereby improving the testing efficiency of the automated testing process.

[0042] The diagnostic testing method provided in this embodiment is applied to a test terminal. The test terminal is connected to the management port of the board management controller under test via a test network cable, so as to connect the server matched by the board management controller under test to the test local area network deployed on the test terminal for diagnostic testing.

[0043] The following is combined Figure 1 Describe the diagnostic testing method provided in the embodiments of the application. For example... Figure 1 The diagram shown is a flowchart of a diagnostic testing method provided in an embodiment of this application. The method mainly includes the following steps:

[0044] Step 101: Read the configuration data cached in the memory chip of the baseboard management controller;

[0045] In this embodiment, after the test terminal detects that the server matched with the baseboard management controller under test is powered on and running, the test terminal reads the configuration data cached in the storage chip of the baseboard management controller through the IP address of the management port of the baseboard management controller under test.

[0046] Understandably, configuration data refers to configuration data for a specific object, such as configuration for the server identifier, configuration for the server's hard drive, or configuration for a specific firmware of the server.

[0047] The configuration data includes at least one of the following:

[0048] Server attribute parameter configuration data, such as server asset code, trademark, server Internet Protocol IP address information, username, gateway information, subnet mask information, and other attribute information.

[0049] Server hardware parameter configuration data, such as the configuration of logical partitions of logical hard drives and CPU configuration in the server;

[0050] The configuration requirements of the target firmware set by the user, such as the configuration of the SOL (Serial over LAN) redirection output port selection, the configuration of the default boot program of BIOS (Basic Input Output System), and the configuration of the fan logic control program.

[0051] The storage chips in this embodiment include EPROM (Erasable Programmable Read-Only Memory), EEPROM (Electrically Erasable Programmable Read-Only Memory), PROM (Programmable Read-Only Memory), and other non-volatile storage chips whose stored data will not be lost in the event of a sudden power outage or other unexpected situations in the server.

[0052] Step 102: Determine the configuration requirements of the baseboard management controller, and diagnose the configuration data based on the configuration requirements;

[0053] The configuration requirements for the baseboard management controller include at least one of the following:

[0054] The configuration requirements for server attribute parameters, such as the server's asset code, trademark, server's Internet Protocol IP address information, username, gateway information, subnet mask information, and other attribute information.

[0055] The server's hardware parameter configuration requirements, such as the configuration of logical partitions of logical hard drives, CPU configuration, and other hardware parameter configuration requirements in the server.

[0056] The configuration requirements of the target firmware set by the user, such as the selection of SOL (Serial over LAN) redirection output port, the default boot program of BIOS (Basic Input Output System), the logic control program of the fan, and other firmware configuration requirements.

[0057] In this embodiment, after reading the configuration data cached in the storage chip, the test terminal checks whether the configuration data of each object meets the configuration requirements of the current baseboard management controller in the order of reading.

[0058] In some embodiments, if the configuration data of an object cached in the memory chip is different from the data required in the configuration requirements, it is determined that the object does not meet the configuration requirements.

[0059] For example, if the configuration data read shows that the server's Internet Protocol (IP) address is "xxxx001", while the required IP address should be "xxxx005", then the server's IP address information is determined to be inconsistent with the configuration requirements.

[0060] In some embodiments, if the memory chip contains configuration data for an object that does not meet the configuration requirements, it is determined that the memory chip does not meet the configuration requirements.

[0061] For example, if the memory chip contains a configuration for a control program that protects the power module, which forces the server to enter a low-power mode when the server's power is below a certain value, but the current scenario of reusing the baseboard management controller does not require the configuration of a control program for the power module, then it is determined that it does not meet the configuration requirements.

[0062] Step 103: If the configuration data is found to be inconsistent with the configuration requirements, an erase command is sent to the substrate management controller so that the substrate management controller erases the configuration data according to the erase command.

[0063] In some embodiments, the erase command can be an instruction carrying an enable command and a block erase command. After receiving and parsing the erase command, the substrate control controller first transmits the enable command to the memory chip of the substrate control controller. After the memory chip enters the editable and erasable state, the block erase command is then transmitted to the memory chip to erase the data.

[0064] In some embodiments, the erase command may also be a command carrying an erase operation signal. After receiving the command, the substrate management controller first generates an enable command and a block erase command, and then sequentially transmits the enable command and the block erase command to the memory chip to perform data erasure.

[0065] The diagnostic testing method proposed in this embodiment reads the configuration data cached in the memory chip of the baseboard management controller; determines the configuration requirements of the baseboard management controller; diagnoses the configuration data based on the configuration requirements; and sends an erase command to the baseboard management controller when the configuration data does not meet the configuration requirements, so that the baseboard management controller can erase the configuration data according to the erase command. In this way, the test terminal can actively generate erase commands to control the baseboard management controller to erase data, thereby improving the testing efficiency of the automated testing process.

[0066] In some embodiments, sending an erase command to the substrate management controller includes:

[0067] Based on the configuration requirements, determine the target configuration data to be erased from the configuration data;

[0068] The cache address of the target configuration data is determined, and an erase command carrying the cache address is sent to the baseboard management controller.

[0069] Understandably, the target configuration data in this embodiment refers to data that does not meet the configuration requirements, and will not be elaborated further here.

[0070] Here, the cache address refers to the cache location of the target configuration data in the storage chip.

[0071] In this embodiment, when reading data from the memory chip of the substrate management controller, the cache address of each data in the memory chip is also recorded. Therefore, when configuration data that does not meet the configuration requirements is detected, the test terminal can determine the cache address of the target configuration data based on the recorded cache addresses of each data. After the test terminal sends an erase command carrying the cache address to the substrate management controller, the substrate management controller can directly and quickly locate the target configuration data based on the cache address and erase it. This improves the testing efficiency of the automated testing process and avoids the substrate management controller from missing data during the erasure process.

[0072] In some embodiments, after sending the erase command to the substrate management controller, the process includes:

[0073] Upon receiving a feedback signal from the baseboard management controller, the configuration data cached in the baseboard management controller's memory chip is reread;

[0074] If the configuration data is found to be inconsistent with the configuration requirements, an erase command is sent to the substrate management controller.

[0075] The feedback signal is a signal generated after the baseboard management controller executes the erase command. For example, the "001" feedback signal indicates that all target configuration data has been erased, the "002" feedback signal indicates that part of the target configuration data has been erased, and the "003" feedback signal indicates that none of the target configuration data can be erased.

[0076] Understandably, in this embodiment, the code symbol for the feedback signal can be customized and is not limited thereto.

[0077] In this embodiment, after receiving the feedback signal from the baseboard management controller, the configuration data is reread to verify whether the previous erase command was successfully executed. This can involve rereading all the configuration data cached in the memory chip, or simply reading the data cached at the cache address of the target configuration data to be erased last time.

[0078] If the configuration data is found to be inconsistent with the above configuration requirements again, the above steps will be repeated until the configuration data meets the above configuration requirements. This will not be elaborated further here.

[0079] In this embodiment, after receiving the feedback signal sent by the substrate management controller, the configuration data cached in the storage chip of the substrate management controller is re-diagnosed to avoid the substrate management controller losing data during the data erasure process.

[0080] In some embodiments, receiving the feedback signal sent by the substrate management controller includes:

[0081] Record the erase log corresponding to the feedback signal.

[0082] The erase log includes information about the board management controller tested by the test terminal, configuration data read by the test terminal, diagnostic results from the test terminal, erase commands generated by the test terminal, and feedback signals from the board management controller.

[0083] In some embodiments, after continuing to send the erase command to the substrate management controller, the process includes:

[0084] If the number of times the erase command is sent reaches a preset number, an alarm message is generated and an alarm log is recorded;

[0085] The diagnostic process for the configuration data is terminated, and diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules of the baseboard management controller other than the electrically erasable programmable read-only memory.

[0086] Understandably, in some cases, some data in the memory chip may not be completely erased by the test terminal or the baseboard management controller. In order to avoid the test terminal repeatedly executing invalid diagnostic processes, the test terminal determines that there is unerasable configuration data in the memory chip when it detects that the number of erase command transmissions has reached a preset number.

[0087] The alarm log includes information about the board management controller being tested by the test terminal, configuration data information read by the test terminal, diagnostic results from the test terminal, erase commands generated by the test terminal, and feedback signals from the board management controller.

[0088] The alarm information can be displayed on the UI interface of the test terminal, or through the SMS interface of the tester's smart terminal, or through the PUSH channel, etc.

[0089] It should be noted that other functional modules in this embodiment include hardware that can be controlled or monitored by the baseboard control controller, as well as firmware that can be controlled or monitored.

[0090] The test procedure for diagnosing other functional modules of the baseboard management controller in this embodiment is consistent with the test procedure in the prior art, and will not be repeated here.

[0091] In this embodiment, in order to improve the testing efficiency of the automated testing process, after determining that there is non-erasable configuration data in the memory chip, an alarm message is generated to prompt the tester to perform special processing on it separately and then proceed to the next diagnostic testing stage, thereby avoiding the test terminal from repeatedly executing the invalid diagnostic process in a loop.

[0092] In some embodiments, after diagnosing the configuration data based on the configuration requirements, the process includes:

[0093] If the configuration data is found to meet the configuration requirements, diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules of the baseboard management controller other than the electrically erasable programmable read-only memory.

[0094] In this embodiment, if the configuration data configuration requirement is diagnosed, it indicates that the current configuration of the baseboard management controller is suitable for the configuration of the new server. Then the test terminal can enter the next diagnostic test stage to perform diagnostic tests on other functional modules of the baseboard management controller.

[0095] The diagnostic testing apparatus provided in this application is described below. The diagnostic testing apparatus described below can be referred to in correspondence with the diagnostic testing method described above.

[0096] like Figure 2 As shown, this is a diagnostic testing device provided in this embodiment. The device includes a reading unit 210, a diagnostic unit 220, and an erasing unit 230.

[0097] The reading unit 210 is used to read the configuration data cached in the storage chip of the substrate management controller.

[0098] In this embodiment, after the test terminal detects that the server matched with the baseboard management controller under test is powered on and running, the test terminal reads the configuration data cached in the storage chip of the baseboard management controller through the IP address of the management port of the baseboard management controller under test.

[0099] Intuitively, configuration data refers to configuration data for a specific object, such as configuration for the server identifier, configuration for the server's hard drive, or configuration for a specific firmware of the server.

[0100] The configuration data includes at least one of the following:

[0101] Server attribute parameter configuration data, such as server asset code, trademark, server Internet Protocol IP address information, username, gateway information, subnet mask information, and other attribute information.

[0102] Server hardware parameter configuration data, such as the configuration of logical partitions of logical hard drives and CPU configuration in the server;

[0103] The configuration requirements of the target firmware set by the user, such as the configuration of the SOL (Serial over LAN) redirection output port selection, the configuration of the default boot program of BIOS (Basic Input Output System), and the configuration of the fan logic control program.

[0104] The storage chips in this embodiment include EPROM (Erasable Programmable Read-Only Memory), EEPROM (Electrically Erasable Programmable Read-Only Memory), PROM (Programmable Read-Only Memory), and other non-volatile storage chips whose stored data will not be lost in the event of a sudden power outage or other unexpected situations in the server.

[0105] The diagnostic unit 220 is used to determine the configuration requirements of the baseboard management controller and to diagnose the configuration data based on the configuration requirements.

[0106] The configuration requirements for the baseboard management controller include at least one of the following:

[0107] The configuration requirements for server attribute parameters, such as the server's asset code, trademark, server's Internet Protocol IP address information, username, gateway information, subnet mask information, and other attribute information.

[0108] The server's hardware parameter configuration requirements, such as the configuration of logical partitions of logical hard drives, CPU configuration, and other hardware parameter configuration requirements in the server.

[0109] The configuration requirements of the target firmware set by the user, such as the selection of SOL (Serial over LAN) redirection output port, the default boot program of BIOS (Basic Input Output System), the logic control program of the fan, and other firmware configuration requirements.

[0110] In this embodiment, after reading the configuration data cached in the storage chip, the test terminal checks whether the configuration data of each object meets the configuration requirements of the current baseboard management controller in the order of reading.

[0111] In some embodiments, if the configuration data of an object cached in the memory chip is different from the data required in the configuration requirements, it is determined that the object does not meet the configuration requirements.

[0112] For example, if the configuration data read shows that the server's Internet Protocol (IP) address is "xxxx001", while the required IP address should be "xxxx005", then the server's IP address information is determined to be inconsistent with the configuration requirements.

[0113] In some embodiments, if the memory chip contains configuration data for an object that does not meet the configuration requirements, it is determined that the memory chip does not meet the configuration requirements.

[0114] For example, if the memory chip contains a configuration for a control program that protects the power module, which forces the server to enter a low-power mode when the server's power is below a certain value, but the current scenario of reusing the baseboard management controller does not require the configuration of a control program for the power module, then it is determined that it does not meet the configuration requirements.

[0115] The erasure unit 230 is used to send an erasure command to the substrate management controller when it is diagnosed that the configuration data does not meet the configuration requirements, so that the substrate management controller can erase the configuration data according to the erasure command.

[0116] In some embodiments, the erase command can be an instruction carrying an enable command and a block erase command. After receiving and parsing the erase command, the substrate control controller first transmits the enable command to the memory chip of the substrate control controller. After the memory chip enters the editable and erasable state, the block erase command is then transmitted to the memory chip to erase the data.

[0117] In some embodiments, the erase command may also be a command carrying an erase operation signal. After receiving the command, the substrate management controller first generates an enable command and a block erase command, and then sequentially transmits the enable command and the block erase command to the memory chip to perform data erasure.

[0118] In some embodiments, the erasure unit 230 is further configured to determine the target configuration data to be erased in the configuration data based on the configuration requirements; determine the cache address of the target configuration data; and send an erasure instruction carrying the cache address to the substrate management controller.

[0119] In some embodiments, the erasure unit 230 is further configured to reread the configuration data cached in the memory chip of the substrate management controller upon receiving a feedback signal sent by the substrate management controller; wherein the feedback signal is a signal generated by the substrate management controller after executing the erasure command; and if it is diagnosed that the configuration data does not meet the configuration requirements, the unit continues to send an erasure command to the substrate management controller.

[0120] In some embodiments, the erasure unit 230 is also used to record an erasure log corresponding to the feedback signal.

[0121] In some embodiments, the erasure unit 230 is further configured to generate alarm information and record an alarm log when the number of times the erasure command is sent reaches a preset number;

[0122] The diagnostic process for the configuration data is terminated, and diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules of the baseboard management controller other than the electrically erasable programmable read-only memory.

[0123] In some embodiments, the configuration requirements include at least one of the following:

[0124] Server attribute parameter configuration requirements;

[0125] Server hardware configuration requirements;

[0126] The configuration requirements of the target firmware set by the user.

[0127] In some embodiments, after diagnosing the configuration data based on the configuration requirements, the process includes:

[0128] If the configuration data is found to meet the configuration requirements, diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules of the baseboard management controller other than the electrically erasable programmable read-only memory.

[0129] The diagnostic testing device provided in this embodiment reads the configuration data cached in the memory chip of the baseboard management controller; determines the configuration requirements of the baseboard management controller; diagnoses the configuration data based on the configuration requirements; and sends an erase command to the baseboard management controller when the configuration data does not meet the configuration requirements, so that the baseboard management controller can erase the configuration data according to the erase command. Thus, the test terminal can actively generate erase commands to control the baseboard management controller to erase data, thereby improving the testing efficiency of the automated testing process.

[0130] Figure 3 An example is a schematic diagram of the physical structure of an electronic device, such as... Figure 3 As shown, the electronic device may include a processor 301, a communication interface 302, a memory 303, and a communication bus 304, wherein the processor 301, the communication interface 302, and the memory 303 communicate with each other via the communication bus 304. The processor 301 can invoke logical instructions in the memory 303 to execute a diagnostic test method, which includes: reading configuration data cached in the memory chip of the baseboard management controller; determining the configuration requirements of the baseboard management controller; diagnosing the configuration data based on the configuration requirements; and, if the configuration data is found to be inconsistent with the configuration requirements, sending an erase command to the baseboard management controller so that the baseboard management controller erases the configuration data according to the erase command.

[0131] Furthermore, the logical instructions in the aforementioned memory 303 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0132] On the other hand, this application also provides a computer program product, which includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer is able to perform the diagnostic testing methods provided by the above methods. The method includes: reading configuration data cached in the memory chip of the baseboard management controller; determining the configuration requirements of the baseboard management controller; diagnosing the configuration data based on the configuration requirements; and, if the configuration data is found to be inconsistent with the configuration requirements, sending an erase command to the baseboard management controller so that the baseboard management controller erases the configuration data according to the erase command.

[0133] In another aspect, this application also provides a non-transitory computer-readable storage medium storing a computer program thereon, which, when executed by a processor, is implemented to perform the diagnostic testing methods provided by the methods described above. The method includes: reading configuration data cached in the memory chip of the substrate management controller; determining the configuration requirements of the substrate management controller; diagnosing the configuration data based on the configuration requirements; and, if the configuration data is found to be inconsistent with the configuration requirements, sending an erase command to the substrate management controller so that the substrate management controller erases the configuration data according to the erase command.

[0134] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0135] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0136] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A diagnostic testing method applied to a test terminal, wherein the test terminal is connected to the management port of a management controller of a substrate under test via a test network cable, characterized in that, include: Read the configuration data cached in the memory chip of the baseboard management controller; the configuration data includes at least one of the following: server attribute parameter configuration data, server hardware parameter configuration data, and user-defined target firmware configuration data; The configuration requirements of the baseboard management controller are determined, and the configuration data is diagnosed based on the configuration requirements; the configuration requirements include at least one of the following: server attribute parameter configuration requirements, server hardware parameter configuration requirements, and user-defined target firmware configuration requirements. If the configuration data is found to be inconsistent with the configuration requirements, an erase command is sent to the baseboard management controller so that the baseboard management controller erases the configuration data according to the erase command. Wherein, the configuration data does not conform to the configuration requirements, including the configuration data of a certain object cached in the storage chip being different from the data required in the configuration requirements, or the storage chip containing configuration data of a certain object that does not exist in the configuration requirements.

2. The diagnostic testing method according to claim 1, characterized in that, Sending the erase command to the substrate management controller includes: Based on the configuration requirements, determine the target configuration data to be erased from the configuration data; The cache address of the target configuration data is determined, and an erase command carrying the cache address is sent to the baseboard management controller.

3. The diagnostic testing method according to claim 1, characterized in that, After sending the erase command to the substrate management controller, the process includes: Upon receiving a feedback signal from the substrate management controller, the configuration data cached in the substrate management controller's memory chip is reread; wherein, the feedback signal is a signal generated by the substrate management controller after executing the erase command; If the configuration data is found to be inconsistent with the configuration requirements, an erase command is sent to the substrate management controller.

4. The diagnostic testing method according to claim 3, characterized in that, After receiving the feedback signal sent by the substrate management controller, the process includes: Record the erase log corresponding to the feedback signal.

5. The diagnostic testing method according to claim 3, characterized in that, After continuing to send the erase command to the substrate management controller, the process includes: If the number of times the erase command is sent reaches a preset number, an alarm message is generated and an alarm log is recorded; The diagnostic process for the configuration data is terminated, and diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules of the baseboard management controller other than the memory chip.

6. The diagnostic testing method according to any one of claims 1 to 5, characterized in that, After diagnosing the configuration data based on the configuration requirements, the process includes: If the configuration data is found to meet the configuration requirements, diagnostic tests are performed on other functional modules of the baseboard management controller, including functional modules in the baseboard management controller other than the memory chip.

7. A diagnostic testing device, applied to a testing terminal, wherein the testing terminal is connected to the management port of a management controller of a substrate under test via a test network cable, characterized in that, include: The reading unit is used to read configuration data cached in the storage chip of the baseboard management controller; the configuration data includes at least one of the following: server attribute parameter configuration data, server hardware parameter configuration data, and user-defined target firmware configuration data. A diagnostic unit is used to determine the configuration requirements of the baseboard management controller and to diagnose the configuration data based on the configuration requirements; the configuration requirements include at least one of the following: server attribute parameter configuration requirements, server hardware parameter configuration requirements, and user-defined target firmware configuration requirements. The erasure unit is used to send an erasure command to the substrate management controller when it is diagnosed that the configuration data does not meet the configuration requirements, so that the substrate management controller can erase the configuration data according to the erasure command; Wherein, the configuration data does not conform to the configuration requirements, including the configuration data of a certain object cached in the storage chip being different from the data required in the configuration requirements, or the storage chip containing configuration data of a certain object that does not exist in the configuration requirements.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the diagnostic testing method as described in any one of claims 1 to 6.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the diagnostic testing method as described in any one of claims 1 to 6.

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