一种数据校验测试方法、装置及计算机可读存储介质
By generating and comparing verification data within the SSD and utilizing asynchronous event information to obtain on-site environmental data, the problem of accurately locating verification errors in SSD device consistency function testing is solved, thus improving the efficiency of problem location.
CN116149901BActive Publication Date: 2026-07-17ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
- Filing Date
- 2023-02-28
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
In existing technologies, solid-state drive (SSD) devices cannot accurately locate the location of write errors during consistency function tests, making problem localization difficult.
Method used
The control commands generated by the IO testing tool are sent to the SSD to generate verification data. The test data and verification data are compared in the SSD's internal processing unit. If an error is found, asynchronous event information is sent to the host to obtain the on-site environment data.
Benefits of technology
It enables accurate location of verification errors in SSD device consistency function testing, protects the field environment, and facilitates further problem localization.
✦ Generated by Eureka AI based on patent content.
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Figure CN116149901B_ABST
Abstract
本申请公开了一种数据校验测试方法、装置及计算机可读存储介质，涉及计算机存储技术领域。方案具体令固态硬盘根据主机发送的控制指令生成校验数据，并通过主机发送测试数据至固态硬盘，从而在固态硬盘内部处理测试数据I / O的流程中实现了数据校验，因此能将校验错误第一时间暴露出来，从而不依赖主机侧的读命令，实现了校验错误位置的准确定位；同时在发生校验错误的第一时间向主机反馈，保护了现场环境，为进一步的问题定位提供了便利。
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