A method and apparatus for long duration storage system testing

Abstract

The application provides a kind of storage system long stable operation test method and device, method includes: creating the number Disk0-Disk3 4 Dual-active LUN of capacity 500GB, and create the number Disk4-Disk39 36 normal LUN of capacity 500GB;Create LUN_snap and LUN_clone, and LUN_snap and LUN_clone are mapped to host, create Ext4 file system, and write file file1 in LUN_snap, write file file2 in LUN_clone, and respectively create snapshot SNAP_LUN_snap and SNAP_LUN_clone to LUN_snap and LUN_clone;Dual-active LUN and normal LUN created are evenly mapped to 2 hosts, and use Vdbench to run 4 stages of stress test on pressure machine;According to the stress test result of each stage, the storage system is evaluated. By using the scheme of the application, the function items can be verified more fully, rather than single-point verification of a function, common operation can be introduced in long stable test, which is closer to the actual use scene, and the overall stability evaluation of the storage system has more basis.

Description

Technical Field

[0001] This invention relates to the field of computers, and more specifically to a method and apparatus for long-term stable operation testing of a storage system. Background Technology

[0002] Storage systems are primarily responsible for storing and retrieving data, playing a crucial role in the entire IT system. Instability in these systems can potentially lead to irreparable losses. Therefore, multi-dimensional testing of storage systems is a necessary step before deployment. Storage system testing typically involves single-point functional testing to assess how well the system fulfills specific functionalities. However, this approach struggles to evaluate the system's actual performance during use, as real-world usage scenarios are numerous and complex, not simply a series of sequential function executions. Additionally, storage systems undergo long-term stability testing, which involves stress testing under fixed I / O loads for extended periods. The drawback of this approach is the lack of real-world operational scenarios and an overly simplistic and idealized testing process. Summary of the Invention

[0003] In view of this, the purpose of this invention is to provide a method and apparatus for long-term stable operation testing of a storage system. By using the technical solution of this invention, functional items can be verified more fully, rather than verifying a single function. Common operation and maintenance operations can be introduced into the long-term stable test, which is closer to the actual use scenario and provides a more reliable basis for the overall stability assessment of the storage system.

[0004] To achieve the above objectives, one aspect of the present invention provides a method for long-term stable operation testing of a storage system, comprising the following steps:

[0005] Create four 500GB dual-active LUNs numbered Disk0-Disk3, and create 36 500GB regular LUNs numbered Disk4-Disk39;

[0006] Create LUN_snap and LUN_clone, and map LUN_snap and LUN_clone to the host. Create an Ext4 file system, write file1 to LUN_snap and file2 to LUN_clone, and create snapshots SNAP_LUN_snap and SNAP_LUN_clone for LUN_snap and LUN_clone respectively.

[0007] The created dual-active LUN and regular LUN are evenly mapped to 2 hosts, and a 4-stage stress test is run on the stress machine using Vdbench;

[0008] The storage system is evaluated based on the results of stress tests at each stage.

[0009] According to one embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on a stress machine using Vdbench, including:

[0010] Twenty hours after the start of the test, ten 500GB LUNs numbered Disk101-Disk110 were created, and the created LUNs were mapped to the host for continuous read and write operations for 24 hours.

[0011] Perform a clone operation on LUNs numbered Disk4-Disk7 and LUN_clone, with the target LUNs to be cloned being Disk4_T-Disk7_T and LUN_clone_T;

[0012] After formatting LUN_clone on the host side, check if file2 exists.

[0013] Map LUN_clone_T to the host and view the contents of LUN_clone_T;

[0014] Use the snapshot SNAP_LUN_clone to restore the LUN_clone and view the contents of the restored LUN_clone;

[0015] Unmap and delete LUNs numbered Disk101-Disk110 48 hours after the test begins;

[0016] After 49 hours of testing, two hard drives were removed one at a time, and the first one was reinserted after 20 minutes. The other hard drive was reinserted after 60 minutes.

[0017] One controller was removed 50 hours after the start of testing and plugged back in 8 hours later;

[0018] After 53 hours of testing, one of the front-end interface cards with business logic was removed and then reinserted.

[0019] 72 hours after the start of the test, modify the contents of file1 in LUN_snap and save it as file11. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, named SNAP_Disk36-39 and SNAP_LUN_snap1 respectively. Create timed snapshots for LUNs numbered Disk32-Disk35, with a time interval of 4 hours and retaining 3 snapshots.

[0020] Delete the files in LUN_snap 96 hours after the test begins.

[0021] According to one embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on a stress machine using Vdbench, including:

[0022] Restore Disk36-Disk39 and LUN_snap using snapshots SNAP_Disk36-39 and SNAP_LUN_snap1, and view the contents of LUN_snap;

[0023] Unplug one controller and plug it back in after 10 minutes.

[0024] According to one embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on a stress machine using Vdbench, including:

[0025] Create 10 LUNs of 500GB each, numbered Disk201-Disk210, and map the created LUNs to the host for continuous read and write operations for 48 hours;

[0026] Unmap and delete LUNs numbered Disk200-Disk209 48 hours after the test begins;

[0027] One hard drive was removed 49 hours after the start of the test and reinserted 20 minutes later;

[0028] After 50 hours of testing, disconnect all power to the dual-active remote devices and plug them back in after 20 minutes.

[0029] A third-party arbitration fault was constructed 53 hours after the test began and recovered 2 hours later;

[0030] Disconnect all replication links for both active-active and remote replication 54 hours after the test begins, and restore all links 30 minutes later.

[0031] After 55 hours of testing, one controller was unplugged and plugged back in after 10 minutes.

[0032] 72 hours after the start of the test, modify the contents of file11 in LUN_snap and save it as file111. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, with snapshots named 2nd_SNAP_Disk36-39 and SNAP_LUN_snap11.

[0033] Delete the files in LUN_snap 96 hours after the test begins.

[0034] According to one embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on a stress machine using Vdbench, including:

[0035] Stop scheduled snapshots, delete snapshots SNAP_Disk36-39 and 2nd_SNAP_Disk36-39, and delete the scheduled snapshot policy;

[0036] One hour after the test started, ten 500GB LUNs numbered Disk301-Disk310 were created and mapped to the host for continuous read and write operations for eight hours.

[0037] Eight hours after the test began, the mapping of LUN numbered Disk301-310 was removed and the LUN was deleted.

[0038] Another aspect of the present invention provides an apparatus for long-term stable operation testing of a storage system, the apparatus comprising:

[0039] Create a module, configured to create four 500GB dual-active LUNs numbered Disk0-Disk3, and 36 500GB regular LUNs numbered Disk4-Disk39;

[0040] The mapping module is configured to create LUN_snap and LUN_clone, map LUN_snap and LUN_clone to the host, create an Ext4 file system, write file1 to LUN_snap and file2 to LUN_clone, and create snapshots SNAP_LUN_snap and SNAP_LUN_clone for LUN_snap and LUN_clone respectively.

[0041] The test module is configured to map the created dual-active LUN and ordinary LUN to two hosts on an even basis, and use Vdbench to run four stages of stress test on the stress machine;

[0042] The evaluation module is configured to evaluate the storage system based on the stress test results at each stage.

[0043] According to one embodiment of the present invention, the test module is further configured as follows:

[0044] Twenty hours after the start of the test, ten 500GB LUNs numbered Disk101-Disk110 were created, and the created LUNs were mapped to the host for continuous read and write operations for 24 hours.

[0045] Perform a clone operation on LUNs numbered Disk4-Disk7 and LUN_clone, with the target LUNs to be cloned being Disk4_T-Disk7_T and LUN_clone_T;

[0046] After formatting LUN_clone on the host side, check if file2 exists.

[0047] Map LUN_clone_T to the host and view the contents of LUN_clone_T;

[0048] Use the snapshot SNAP_LUN_clone to restore the LUN_clone and view the contents of the restored LUN_clone;

[0049] Unmap and delete LUNs numbered Disk101-Disk110 48 hours after the test begins;

[0050] After 49 hours of testing, two hard drives were removed one at a time, and the first one was reinserted after 20 minutes. The other hard drive was reinserted after 60 minutes.

[0051] One controller was removed 50 hours after the start of testing and plugged back in 8 hours later;

[0052] After 53 hours of testing, one of the front-end interface cards with business logic was removed and then reinserted.

[0053] 72 hours after the start of the test, modify the contents of file1 in LUN_snap and save it as file11. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, named SNAP_Disk36-39 and SNAP_LUN_snap1 respectively. Create timed snapshots for LUNs numbered Disk32-Disk35, with a time interval of 4 hours and retaining 3 snapshots.

[0054] Delete the files in LUN_snap 96 hours after the test begins.

[0055] According to one embodiment of the present invention, the test module is further configured as follows:

[0056] Restore Disk36-Disk39 and LUN_snap using snapshots SNAP_Disk36-39 and SNAP_LUN_snap1, and view the contents of LUN_snap;

[0057] Unplug one controller and plug it back in after 10 minutes.

[0058] According to one embodiment of the present invention, the test module is further configured as follows:

[0059] Create 10 LUNs of 500GB each, numbered Disk201-Disk210, and map the created LUNs to the host for continuous read and write operations for 48 hours;

[0060] Unmap and delete LUNs numbered Disk200-Disk209 48 hours after the test begins;

[0061] One hard drive was removed 49 hours after the start of the test and reinserted 20 minutes later;

[0062] After 50 hours of testing, disconnect all power to the dual-active remote devices and plug them back in after 20 minutes.

[0063] A third-party arbitration fault was constructed 53 hours after the test began and recovered 2 hours later;

[0064] Disconnect all replication links for both active-active and remote replication 54 hours after the test begins, and restore all links 30 minutes later.

[0065] After 55 hours of testing, one controller was unplugged and plugged back in after 10 minutes.

[0066] 72 hours after the start of the test, modify the contents of file11 in LUN_snap and save it as file111. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, with snapshots named 2nd_SNAP_Disk36-39 and SNAP_LUN_snap11.

[0067] Delete the files in LUN_snap 96 hours after the test begins.

[0068] According to one embodiment of the present invention, the test module is further configured as follows:

[0069] Stop scheduled snapshots, delete snapshots SNAP_Disk36-39 and 2nd_SNAP_Disk36-39, and delete the scheduled snapshot policy;

[0070] One hour after the test started, ten 500GB LUNs numbered Disk301-Disk310 were created and mapped to the host for continuous read and write operations for eight hours.

[0071] Eight hours after the test began, the mapping of LUN numbered Disk301-310 was removed and the LUN was deleted.

[0072] The present invention has the following beneficial technical effects: The method for long-term stable operation testing of a storage system provided in the embodiments of the present invention creates four 500GB dual-active LUNs numbered Disk0-Disk3 and 36 500GB ordinary LUNs numbered Disk4-Disk39; creates LUN_snap and LUN_clone, maps LUN_snap and LUN_clone to the host, creates an Ext4 file system, and writes file1 to LUN_snap and file to LUN_clone. 2. Create snapshots SNAP_LUN_snap and SNAP_LUN_clone for LUN_snap and LUN_clone respectively; map the created active-active LUNs and ordinary LUNs to two hosts on an average basis, and run four stages of stress tests on a stress machine using Vdbench; evaluate the storage system based on the results of each stage of stress test. This technical solution can more fully verify the functional items, rather than verifying a single function. It can introduce common operation and maintenance operations into long-term stability testing, which is closer to the actual use scenario and has a more basis for the overall stability assessment of the storage system. Attached Figure Description

[0073] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other embodiments can be obtained based on these drawings without creative effort.

[0074] Figure 1 A schematic flowchart illustrating a method for long-term stable operation testing of a storage system according to an embodiment of the present invention;

[0075] Figure 2 This is a schematic diagram of an apparatus for long-term stable operation testing of a storage system according to an embodiment of the present invention. Detailed Implementation

[0076] To make the objectives, technical solutions, and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below with reference to specific examples and the accompanying drawings.

[0077] Based on the above objectives, a first aspect of the embodiments of the present invention provides an embodiment of a method for long-term stable operation testing of a storage system. Figure 1 The diagram shown is a schematic flowchart of the method.

[0078] like Figure 1 As shown, the method may include the following steps:

[0079] S1 creates four 500GB dual-active LUNs numbered Disk0-Disk3, and 36 500GB regular LUNs numbered Disk4-Disk39.

[0080] S2 creates LUN_snap and LUN_clone, maps LUN_snap and LUN_clone to the host, creates an Ext4 file system, writes file1 to LUN_snap and file2 to LUN_clone, and creates snapshots SNAP_LUN_snap and SNAP_LUN_clone for LUN_snap and LUN_clone respectively.

[0081] S3 maps the created dual-active LUNs and regular LUNs evenly across two hosts and uses Vdbench to run four phases of stress tests on the stress machine. The four phases of testing are performed sequentially, meaning that the next phase of testing begins after the previous phase is completed. Each phase of testing provides corresponding test results for evaluating the performance of the storage system.

[0082] S4 evaluates the storage system based on the stress test results at each stage.

[0083] By using the technical solution of this invention, functional items can be verified more fully, rather than verifying a single function. Common operation and maintenance operations can be introduced into long-term stability testing, which is closer to the actual use scenario and provides a more reliable basis for the overall stability assessment of the storage system.

[0084] In a preferred embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on the stress machine using Vdbench, including:

[0085] 1. After 20 hours of testing, create 10 LUNs (500GB each) numbered Disk101-Disk110, map the created LUNs to the host, and perform continuous read and write operations for 24 hours.

[0086] 2. Perform cloning operations on LUNs numbered Disk4-Disk7 and LUN_clone, with the target LUNs to be cloned being Disk4_T-Disk7_T and LUN_clone_T;

[0087] 3. After formatting LUN_clone on the host side, check if file2 exists;

[0088] 4. Map LUN_clone_T to the host and view the contents of LUN_clone_T;

[0089] 5. Use the snapshot SNAP_LUN_clone to restore the LUN_clone and view the contents of the restored LUN_clone;

[0090] 6. After 48 hours of testing, unmap and delete the LUNs numbered Disk101-Disk110;

[0091] 7. After 49 hours of testing, remove the two hard drives one by one, reinsert the first hard drive after 20 minutes, and reinsert the other hard drive after 60 minutes.

[0092] 8. After 50 hours of testing, remove one controller and plug it back in after 8 hours;

[0093] 9. After 53 hours of testing, remove one of the front-end interface cards with business logic, and then insert it back in;

[0094] 10. After 72 hours of testing, modify the contents of file1 in LUN_snap and save it as file11. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, named SNAP_Disk36-39 and SNAP_LUN_snap1. Create timed snapshots for LUNs numbered Disk32-Disk35, with a time interval of 4 hours and retaining 3 snapshots.

[0095] 11. Delete the files in LUN_snap 96 hours after the start of the test. This is the first phase of testing. In steps 3-11, some items need to be checked and recorded, including: In step 3, after formatting, file2 does not exist. In step 4, file2 exists in LUN_clone_T. In step 5, after LUN_clone is restored, file2 exists. In step 7, observe the performance impact before and after disk removal. In step 8, record the IO zero-drop time and storage link recovery status. In step 9, record the IO zero-drop time and storage link recovery status. In step 10, the snapshot and scheduled snapshot policies are successfully created. In step 11, the entire process proceeds without any abnormal alarms or interruptions.

[0096] In a preferred embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on the stress machine using Vdbench, including:

[0097] 1. Use snapshots SNAP_Disk36-39 and SNAP_LUN_snap1 to restore Disk36-Disk39 and LUN_snap, and view the contents of LUN_snap;

[0098] 2. Unplug one controller and plug it back in after 10 minutes. This is the second phase of testing, which begins after the first phase is completed. Several items need to be checked and recorded, including the successful completion of the snapshot recovery in step 1. No abnormal alarms were detected throughout the process.

[0099] In a preferred embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on the stress machine using Vdbench, including:

[0100] 1. Create 10 LUNs (Disk201-Disk210) of 500GB each, and map the created LUNs to the host for continuous read and write operations for 48 hours;

[0101] 2. After 48 hours of testing, unmap and delete the LUNs numbered Disk200-Disk209;

[0102] 3. After 49 hours of testing, remove one hard drive and reinsert it after 20 minutes;

[0103] 4. After 50 hours of testing, disconnect all power to the dual-active remote devices and plug them back in after 20 minutes;

[0104] 5. Construct a third-party arbitration fault 53 hours after the start of the test, and recover after 2 hours;

[0105] 6. Disconnect all replication links for both active-active and remote replication 54 hours after the start of the test, and restore all links after 30 minutes;

[0106] 7. After 55 hours of testing, unplug one controller and plug it back in after 10 minutes;

[0107] 8. After 72 hours of testing, modify the contents of file11 in LUN_snap and save it as file111. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, with snapshots named 2nd_SNAP_Disk36-39 and SNAP_LUN_snap11.

[0108] 9. Delete the files in LUN_snap 96 hours after the start of the test. This is the third phase of testing, which begins after the completion of the second phase. Several items need to be checked and recorded, including recording the performance impact before and after disk removal in step 3; recording the IO zero-drop time and storage link recovery status in steps 4-7; and ensuring no abnormal alarms or interruptions occur throughout the entire phase in step 9.

[0109] In a preferred embodiment of the present invention, the created dual-active LUN and ordinary LUN are mapped evenly to two hosts, and a four-stage stress test is run on the stress machine using Vdbench, including:

[0110] 1. Stop scheduled snapshots, delete snapshots SNAP_Disk36-39 and 2nd_SNAP_Disk36-39, and delete the scheduled snapshot policy;

[0111] 2. One hour after the start of the test, create 10 LUNs (Disk301-Disk310) of 500GB each, and map the created LUNs to the host for continuous read and write operations for 8 hours.

[0112] 3. Eight hours after the start of testing, unmap and delete the LUNs numbered Disk301-310. This is the fourth phase of testing, which begins after the completion of the third phase. Several items need to be checked and recorded, including: snapshots and snapshot policies in step 1 can be deleted normally; new volume read / write I / O in step 2 is normal; volumes can be deleted normally in step 3; and there were no abnormal alarms or interruptions throughout this phase.

[0113] If the entire test process proceeds without interruption and without any abnormal alarms, the system is considered relatively stable. At the same time, the average IOPS and MBPS of the four test phases are recorded.

[0114] The method of this invention introduces specific operational and maintenance operations during long-term stability testing. On the one hand, under the background of long-term stable business operations, it can more fully verify functional items, rather than verifying a single function. On the other hand, introducing common operational and maintenance operations into long-term stability testing is closer to real-world usage scenarios, providing a more reliable basis for the overall stability assessment of the storage system.

[0115] It should be noted that those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc. The embodiments of the computer program described above can achieve the same or similar effects as any of the corresponding foregoing method embodiments.

[0116] Furthermore, the method disclosed in the embodiments of the present invention can also be implemented as a computer program executed by a CPU, which may be stored in a computer-readable storage medium. When the computer program is executed by the CPU, it performs the functions defined in the method disclosed in the embodiments of the present invention.

[0117] Based on the above objectives, a second aspect of the embodiments of the present invention provides an apparatus for long-term stable operation testing of a storage system, such as... Figure 2 As shown, the device 200 includes:

[0118] Create a module, configured to create four 500GB dual-active LUNs numbered Disk0-Disk3, and 36 500GB regular LUNs numbered Disk4-Disk39;

[0119] The mapping module is configured to create LUN_snap and LUN_clone, map LUN_snap and LUN_clone to the host, create an Ext4 file system, write file1 to LUN_snap and file2 to LUN_clone, and create snapshots SNAP_LUN_snap and SNAP_LUN_clone for LUN_snap and LUN_clone respectively.

[0120] The test module is configured to map the created dual-active LUN and ordinary LUN to two hosts on an even basis, and use Vdbench to run four stages of stress test on the stress machine;

[0121] The evaluation module is configured to evaluate the storage system based on the stress test results at each stage.

[0122] In a preferred embodiment of the present invention, the test module is further configured as follows:

[0123] Twenty hours after the start of the test, ten 500GB LUNs numbered Disk101-Disk110 were created, and the created LUNs were mapped to the host for continuous read and write operations for 24 hours.

[0124] Perform a clone operation on LUNs numbered Disk4-Disk7 and LUN_clone, with the target LUNs to be cloned being Disk4_T-Disk7_T and LUN_clone_T;

[0125] After formatting LUN_clone on the host side, check if file2 exists.

[0126] Map LUN_clone_T to the host and view the contents of LUN_clone_T;

[0127] Use the snapshot SNAP_LUN_clone to restore the LUN_clone and view the contents of the restored LUN_clone;

[0128] Unmap and delete LUNs numbered Disk101-Disk110 48 hours after the test begins;

[0129] After 49 hours of testing, two hard drives were removed one at a time, and the first one was reinserted after 20 minutes. The other hard drive was reinserted after 60 minutes.

[0130] One controller was removed 50 hours after the start of testing and plugged back in 8 hours later;

[0131] After 53 hours of testing, one of the front-end interface cards with business logic was removed and then reinserted.

[0132] 72 hours after the start of the test, modify the contents of file1 in LUN_snap and save it as file11. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, named SNAP_Disk36-39 and SNAP_LUN_snap1 respectively. Create timed snapshots for LUNs numbered Disk32-Disk35, with a time interval of 4 hours and retaining 3 snapshots.

[0133] Delete the files in LUN_snap 96 hours after the test begins.

[0134] In a preferred embodiment of the present invention, the test module is further configured as follows:

[0135] Restore Disk36-Disk39 and LUN_snap using snapshots SNAP_Disk36-39 and SNAP_LUN_snap1, and view the contents of LUN_snap;

[0136] Unplug one controller and plug it back in after 10 minutes.

[0137] In a preferred embodiment of the present invention, the test module is further configured as follows:

[0138] Create 10 LUNs with a capacity of 500GB each, numbered Disk201-Disk210, and map the created LUNs to the host for continuous read and write operations for 48 hours.

[0139] Unmap and delete LUNs numbered Disk200-Disk209 48 hours after the test begins;

[0140] One hard drive was removed 49 hours after the start of the test and reinserted 20 minutes later;

[0141] After 50 hours of testing, disconnect all power to the dual-active remote devices and plug them back in after 20 minutes.

[0142] A third-party arbitration fault was constructed 53 hours after the test began and recovered 2 hours later;

[0143] Disconnect all replication links for both active-active and remote replication 54 hours after the test begins, and restore all links 30 minutes later.

[0144] After 55 hours of testing, one controller was unplugged and plugged back in after 10 minutes.

[0145] 72 hours after the start of the test, modify the contents of file11 in LUN_snap and save it as file111. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, with snapshots named 2nd_SNAP_Disk36-39 and SNAP_LUN_snap11.

[0146] Delete the files in LUN_snap 96 hours after the test begins.

[0147] In a preferred embodiment of the present invention, the test module is further configured as follows:

[0148] Stop scheduled snapshots, delete snapshots SNAP_Disk36-39 and 2nd_SNAP_Disk36-39, and delete the scheduled snapshot policy;

[0149] One hour after the test started, ten 500GB LUNs numbered Disk301-Disk310 were created and mapped to the host for continuous read and write operations for eight hours.

[0150] Eight hours after the test began, the mapping of LUN numbered Disk301-310 was removed and the LUN was deleted.

[0151] Furthermore, the method disclosed in the embodiments of the present invention can also be implemented as a computer program executed by a processor, which may be stored in a computer-readable storage medium. When the computer program is executed by the processor, it performs the functions defined in the method disclosed in the embodiments of the present invention.

[0152] Furthermore, the above-described method steps and system units can also be implemented using a controller and a computer-readable storage medium for storing a computer program that enables the controller to perform the functions of the above-described steps or units.

[0153] Those skilled in the art will also understand that the various exemplary logic blocks, modules, circuits, and algorithm steps described in conjunction with the disclosure herein can be implemented as electronic hardware, computer software, or a combination of both. To clearly illustrate this interchangeability between hardware and software, the functionality of various illustrative components, blocks, modules, circuits, and steps has been generally described. Whether this functionality is implemented as software or as hardware depends on the specific application and the design constraints imposed on the system as a whole. Those skilled in the art can implement the functionality in various ways for each specific application, but such implementation decisions should not be construed as departing from the scope of the embodiments disclosed herein.

[0154] In one or more exemplary designs, functionality may be implemented in hardware, software, firmware, or any combination thereof. If implemented in software, functionality may be stored as one or more instructions or code on or transmitted via a computer-readable medium. Computer-readable media include computer storage media and communication media, including any medium that facilitates the transfer of a computer program from one location to another. Storage media may be any available medium accessible to a general-purpose or special-purpose computer. By way of example, and not limitation, computer-readable media may include RAM, ROM, EEPROM, CD-ROM or other optical disc storage devices, disk storage devices or other magnetic storage devices, or any other medium that may be used to carry or store the required program code in the form of instructions or data structures and is accessible to a general-purpose or special-purpose computer or a general-purpose or special-purpose processor. Furthermore, any connection may be appropriately referred to as computer-readable media. For example, if software is transmitted from a website, server, or other remote source using coaxial cable, fiber optic cable, twisted pair, digital subscriber line (DSL), or wireless technologies such as infrared, radio, and microwave, then the aforementioned coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave are all included in the definition of media. As used herein, disks and optical discs include compact discs (CDs), laser discs, optical discs, digital versatile discs (DVDs), floppy disks, and Blu-ray discs, where disks typically reproduce data magnetically, while optical discs reproduce data optically using lasers. Combinations of the above should also be included within the scope of computer-readable media.

[0155] The above are exemplary embodiments disclosed in this invention. However, it should be noted that various changes and modifications can be made without departing from the scope of the embodiments of this invention as defined by the claims. The functions, steps, and / or actions of the methods according to the disclosed embodiments described herein do not need to be performed in any particular order. Furthermore, although the elements disclosed in the embodiments of this invention may be described or claimed individually, they may be understood as multiple unless explicitly limited to a singular number.

[0156] It should be understood that, as used herein, the singular form “a” is intended to include the plural form as well, unless the context clearly supports an exception. It should also be understood that, as used herein, “and / or” refers to any and all possible combinations of one or more of the associated listed items.

[0157] The embodiment numbers disclosed in the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0158] Those skilled in the art will understand that all or part of the steps of the above embodiments can be implemented by hardware or by a program instructing related hardware. The program can be stored in a computer-readable storage medium, such as a read-only memory, a disk, or an optical disk.

[0159] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of the invention (including the claims) is limited to these examples. Within the framework of the invention, technical features of the above embodiments or different embodiments can be combined, and many other variations of different aspects of the invention exist, which are not provided in the details for the sake of brevity. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the invention should be included within the protection scope of the invention.

Claims

1. A method for long-term stable operation testing of a storage system, characterized in that, Includes the following steps: Create four 500GB dual-active LUNs numbered Disk0-Disk3, and create 36 500GB regular LUNs numbered Disk4-Disk39; Create LUN_snap and LUN_clone, and map LUN_snap and LUN_clone to the host. Create an Ext4 file system, write file1 to LUN_snap and file2 to LUN_clone, and create snapshots SNAP_LUN_snap and SNAP_LUN_clone for LUN_snap and LUN_clone respectively. The created dual-active LUN and regular LUN are evenly mapped to 2 hosts, and a 4-stage stress test is run on the stress machine using Vdbench; The storage system is evaluated based on the results of stress testing at each stage; The first phase of stress testing includes: Twenty hours after the start of the test, ten 500GB LUNs numbered Disk101-Disk110 were created, and the created LUNs were mapped to the host for continuous read and write operations for 24 hours. Perform a clone operation on LUNs numbered Disk4-Disk7 and LUN_clone, with the target LUNs to be cloned being Disk4_T-Disk7_T and LUN_clone_T; After formatting LUN_clone on the host side, check if file2 exists. Map LUN_clone_T to the host and view the contents of LUN_clone_T; Use the snapshot SNAP_LUN_clone to restore the LUN_clone and view the contents of the restored LUN_clone; Unmap and delete LUNs numbered Disk101-Disk110 48 hours after the test begins; After 49 hours of testing, two hard drives were removed one at a time, and the first one was reinserted after 20 minutes. The other hard drive was reinserted after 60 minutes. One controller was removed 50 hours after the start of testing and plugged back in 8 hours later; After 53 hours of testing, one of the front-end interface cards with business logic was removed and then reinserted. 72 hours after the start of the test, modify the contents of file1 in LUN_snap and save it as file11. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, named SNAP_Disk36-39 and SNAP_LUN_snap1 respectively. Create timed snapshots for LUNs numbered Disk32-Disk35, with a time interval of 4 hours and retaining 3 snapshots. Delete the files in LUN_snap 96 hours after the test begins; The second phase of stress testing includes: Restore Disk36-Disk39 and LUN_snap using snapshots SNAP_Disk36-39 and SNAP_LUN_snap1, and view the contents of LUN_snap; Unplug one controller and plug it back in after 10 minutes; The third phase of stress testing includes: Create 10 LUNs with a capacity of 500GB each, numbered Disk201-Disk210, and map the created LUNs to the host for continuous read and write operations for 48 hours. Unmap and delete LUNs numbered Disk200-Disk209 48 hours after the test begins; One hard drive was removed 49 hours after the start of the test and then plugged back in 20 minutes later. After 50 hours of testing, disconnect all power to the dual-active remote devices and plug them back in after 20 minutes. A third-party arbitration fault was constructed 53 hours after the test began and recovered 2 hours later; Disconnect all replication links for both active-active and remote replication 54 hours after the test begins, and restore all links 30 minutes later. One controller was unplugged 55 hours after the start of testing and plugged back in 10 minutes later; 72 hours after the start of the test, modify the contents of file11 in LUN_snap and save it as file111. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, with snapshots named 2nd_SNAP_Disk36-39 and SNAP_LUN_snap11. Delete the files in LUN_snap 96 hours after the test begins; The fourth phase of stress testing includes: Stop scheduled snapshots, delete snapshots SNAP_Disk36-39 and 2nd_SNAP_Disk36-39, and delete the scheduled snapshot policy; One hour after the test started, ten 500GB LUNs numbered Disk301-Disk310 were created and mapped to the host for continuous read and write operations for eight hours. Eight hours after the test began, the mapping of LUN numbered Disk301-310 was removed and the LUN was deleted.

2. An apparatus for long-term stable operation testing of a storage system, characterized in that, The device includes: The creation module is configured to create four 500GB dual-active LUNs numbered Disk0-Disk3 and 36 500GB ordinary LUNs numbered Disk4-Disk39. The mapping module is configured to create LUN_snap and LUN_clone, map LUN_snap and LUN_clone to the host, create an Ext4 file system, write file1 to LUN_snap and file2 to LUN_clone, and create snapshots SNAP_LUN_snap and SNAP_LUN_clone for LUN_snap and LUN_clone respectively. The testing module is configured to map the created dual-active LUN and ordinary LUN to two hosts on an average basis, and use Vdbench to run a four-stage stress test on the stress machine. An evaluation module configured to evaluate the storage system based on the stress test results at each stage; The testing module is also configured to perform a first-stage stress test, a second-stage stress test, a third-stage stress test, and a fourth-stage stress test. The stress test for the first node includes: Twenty hours after the start of the test, ten 500GB LUNs numbered Disk101-Disk110 were created, and the created LUNs were mapped to the host for continuous read and write operations for 24 hours. Perform a clone operation on LUNs numbered Disk4-Disk7 and LUN_clone, with the target LUNs to be cloned being Disk4_T-Disk7_T and LUN_clone_T; After formatting LUN_clone on the host side, check if file2 exists. Map LUN_clone_T to the host and view the contents of LUN_clone_T; Use the snapshot SNAP_LUN_clone to restore the LUN_clone and view the contents of the restored LUN_clone; Unmap and delete LUNs numbered Disk101-Disk110 48 hours after the test begins; After 49 hours of testing, two hard drives were removed one at a time, and the first one was reinserted after 20 minutes. The other hard drive was reinserted after 60 minutes. One controller was removed 50 hours after the start of testing and plugged back in 8 hours later; After 53 hours of testing, one of the front-end interface cards with business logic was removed and then reinserted. 72 hours after the start of the test, modify the contents of file1 in LUN_snap and save it as file11. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, named SNAP_Disk36-39 and SNAP_LUN_snap1 respectively. Create timed snapshots for LUNs numbered Disk32-Disk35, with a time interval of 4 hours and retaining 3 snapshots. Delete the files in LUN_snap 96 hours after the test begins; The second phase of stress testing includes: Restore Disk36-Disk39 and LUN_snap using snapshots SNAP_Disk36-39 and SNAP_LUN_snap1, and view the contents of LUN_snap; Unplug one controller and plug it back in after 10 minutes; The third phase of stress testing includes: Create 10 LUNs with a capacity of 500GB each, numbered Disk201-Disk210, and map the created LUNs to the host for continuous read and write operations for 48 hours. Unmap and delete LUNs numbered Disk200-Disk209 48 hours after the test begins; One hard drive was removed 49 hours after the start of the test and then plugged back in 20 minutes later. After 50 hours of testing, disconnect all power to the dual-active remote devices and plug them back in after 20 minutes. A third-party arbitration fault was constructed 53 hours after the test began and recovered 2 hours later; Disconnect all replication links for both active-active and remote replication 54 hours after the test begins, and restore all links 30 minutes later. One controller was unplugged 55 hours after the start of testing and plugged back in 10 minutes later; 72 hours after the start of the test, modify the contents of file11 in LUN_snap and save it as file111. Create snapshots for LUNs and LUN_snaps numbered Disk36-Disk39, with snapshots named 2nd_SNAP_Disk36-39 and SNAP_LUN_snap11. Delete the files in LUN_snap 96 hours after the test begins; The fourth phase of stress testing includes: Stop scheduled snapshots, delete snapshots SNAP_Disk36-39 and 2nd_SNAP_Disk36-39, and delete the scheduled snapshot policy; One hour after the test started, ten 500GB LUNs numbered Disk301-Disk310 were created and mapped to the host for continuous read and write operations for eight hours. Eight hours after the test began, the mapping of LUN numbered Disk301-310 was removed and the LUN was deleted.

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