High-energy electron beam focusing scanning method, system, and radiotherapy device

Abstract

The present disclosure relates to a large-angle electron beam focusing scanning method, system and radiotherapy device. The method comprises: filtering low-energy electrons in a large-angle electron beam of different orders of emission by using a low-energy filtering module to obtain a large-angle high-energy electron beam; and by controlling the magnetic induction intensity of a diverging dipole magnet and a focusing dipole magnet to change and be opposite in direction, the diverging dipole magnet deflects the large-angle high-energy electron beam to different positions into the focusing dipole magnet, and the focusing dipole magnet deflects the large-angle high-energy electron beam into the target object at different angles and focuses on the target region. According to the embodiment of the present disclosure, the color dispersion and deflection of the large-angle high-energy electron beam by the dipole magnet can focus the large-angle high-energy electron beam in the target region, especially in the deep target region, and form a dose peak, thereby reducing the irradiation dose to other normal tissues in the target object, and the energy dispersion tolerance of the electron beam is higher.

Description

[0001] This disclosure claims priority to Chinese Patent Application No. 202211461413.0, filed on November 21, 2022, entitled “Electron Beam Focusing System and Radiotherapy Device”, the entire contents of which are incorporated herein by reference. Technical Field

[0002] This disclosure relates to the field of electron beam processing, and more particularly to a high-energy diffused electron beam focusing scanning method, system, and radiotherapy equipment. Background Technology

[0003] Radiation therapy utilizes high-energy ionizing radiation to destroy the biochemical structure of cancer cells, thereby inhibiting tumor growth. Currently, radiation therapy primarily uses electron, photon, and proton beams. Traditional electron beam therapy mainly employs low-energy electron beams in the energy range of 6 MeV to 20 MeV. Due to its shallow penetration depth and poor transverse penumbra quality, it is only suitable for treating superficial tumors (within 5 cm of the body), such as those in the skin and limbs, and cannot be used for radiotherapy of deep tumors.

[0004] In recent years, the development of laser plasma accelerator technology has made it possible to use high-energy electron beams (such as electron beams with energies higher than 50 MeV) for radiotherapy of deep tumors in the human body. However, the high-energy electron beams generated by laser plasma accelerators have large energy dispersion. When they are directly injected into the human body, they will form high dose deposition at the entrance and exit of the body, making it difficult to form a dose peak in the deep lesion area of ​​the human body, which will reduce the effect of electron radiotherapy. Summary of the Invention

[0005] In view of this, this disclosure proposes a high-energy diffused electron beam focusing scanning method, system, and radiotherapy equipment, which helps to reduce the dose deposition formed by the high-energy diffused electron beam at the entrance and exit of the human body, and enables the high-energy diffused electron beam to form a dose peak in the deep lesion area of ​​the human body, thereby improving the effect of electron radiotherapy.

[0006] According to a first aspect of the present disclosure, a high-energy diffused electron beam focusing scanning method is provided, comprising: for high-energy diffused electron beams of different frequencies to be focused, using a low-energy filtering module to filter out low-energy electrons in the high-energy diffused electron beams of different frequencies, obtaining high-energy diffused high-energy electron beams of different frequencies and injecting them into a focusing module, the focusing module including a diverging diode and a focusing diode; by controlling the diverging diode and the focusing diode to generate varying and opposite magnetic induction intensities, the diverging diode deflects the high-energy diffused high-energy electron beams of different frequencies to different positions and injects them into the focusing diode, and the focusing diode deflects the injected high-energy diffused high-energy electron beams of different frequencies to different angles and injects them into the target object and focuses them onto the target area within the target object.

[0007] In one possible implementation, the diverging diode is further used to deflect electrons with different energies in the high-energy diverging electron beam to different positions and inject them into the focusing diode; the focusing diode is further used to deflect electrons injected at different positions to different angles and inject them into the target object and focus them into the target area within the target object.

[0008] In one possible implementation, the low-energy filtering module includes a deflecting diode and a low-energy blocking plate. The step of using the low-energy filtering module to filter out low-energy electrons from the high-energy diffused electron beams of different firing orders to obtain high-energy diffused electron beams of different firing orders includes: using the deflecting diode in the low-energy filtering module to deflect each electron in the high-energy diffused electron beams of different firing orders to obtain deflected high-energy diffused electron beams, wherein electrons of different energies in the deflected high-energy diffused electron beams have different deflection radii; and using the low-energy blocking plate to filter out low-energy electrons from the deflected high-energy diffused electron beams to obtain high-energy diffused electron beams of different firing orders.

[0009] In one possible implementation, the low-energy filtering module further includes a collimating diode, the collimating diode having the same magnetic induction intensity and opposite direction to the deflecting diode; the method further includes: using the collimating diode to re-collimate the high-energy divergent electron beams of different firing orders, obtaining collimated high-energy divergent electron beams of different firing orders; wherein, the step of deflecting the high-energy divergent electron beams of different firing orders to different positions by the diverging diode and injecting them into the focusing diode includes: deflecting the collimated high-energy divergent electron beams of different firing orders to different positions by the diverging diode and injecting them into the focusing diode.

[0010] In one possible implementation, controlling the diverging diode and the focusing diode to produce varying and opposite magnetic induction intensities includes: for different high-energy divergent electron beams to be focused, determining the magnetic induction intensities that the diverging diode and the focusing diode should each possess under different high-energy divergent electron beams, based on the focusing depth corresponding to the target region; and controlling the magnitude and direction of the current flowing through the diverging diode and the focusing diode, based on the magnetic induction intensities that the diverging diode and the focusing diode should each possess under different high-energy divergent electron beams, so that the diverging diode and the focusing diode produce varying and opposite magnetic induction intensities.

[0011] In one possible implementation, the low-energy filtering module and the focusing module are disposed outside the beam transmission channel of the high-energy divergent electron beam. The diverging diode and the focusing diode in the focusing module can rotate around the axis of the beam transmission channel so that high-energy divergent electron beams of different blasts enter the target object from different planes and different angles and are focused on the target area within the target object.

[0012] In one possible implementation, the high-energy diffused electron beam includes a high-energy diffused electron beam generated by a laser plasma accelerator.

[0013] According to a second aspect of the present disclosure, a high-energy diffused electron beam focusing scanning system is provided, comprising: a low-energy filtering module for filtering out low-energy electrons from different bursts of high-energy diffused electron beams to obtain high-energy diffused high-energy electron beams of different bursts; a focusing module including a diverging diode and a focusing diode, wherein the diverging diode and the focusing diode generate varying and opposite magnetic induction intensities; the diverging diode is used to deflect the high-energy diffused high-energy electron beams of different bursts to different positions and inject them into the focusing diode; and the focusing diode is used to deflect the injected high-energy diffused high-energy electron beams of different bursts to different angles and inject them into a target object and focus them onto a target region within the target object.

[0014] In one possible implementation, the diverging diode is also used to deflect electrons with different energies from high-energy diverging electron beams of different firings to different positions and inject them into the focusing diode; the focusing diode is also used to deflect electrons injected at different positions to different angles and inject them into the target object and focus them into the target area within the target object.

[0015] In one possible implementation, the low-energy filtering module includes: a deflecting diode and a low-energy blocking plate; the deflecting diode in the low-energy filtering module is used to deflect each electron in the high-energy diffused electron beam of different firing orders to obtain a deflected high-energy diffused electron beam, wherein electrons of different energies in the deflected high-energy diffused electron beam have different deflection radii; the low-energy blocking plate is used to filter out low-energy electrons in the deflected high-energy diffused electron beam to obtain high-energy diffused high-energy electron beams of different firing orders.

[0016] In one possible implementation, the low-energy filtering module further includes a collimating diode, which has the same magnetic induction intensity and opposite direction to the deflecting diode; the collimating diode is used to bring the high-energy divergent electron beams of different firing orders back into collimation, thereby obtaining high-energy divergent electron beams of different firing orders after collimation; wherein, the diverging diode in the focusing module is also used to deflect the high-energy divergent electron beams of different firing orders after collimation to different positions and inject them into the focusing diode.

[0017] In one possible implementation, the system further includes a control module electrically connected to the diverging diode and the focusing diode in the focusing module. The control module controls the diverging diode and the focusing diode to generate varying magnetic induction intensities in opposite directions. Controlling the varying magnetic induction intensities in opposite directions for the diverging diode and the focusing diode includes: determining the magnetic induction intensities that the diverging diode and the focusing diode should each possess under different high-energy diverging electron beams of different firing orders, based on the focusing depth corresponding to the target region; and controlling the magnitude and direction of the current flowing through the diverging diode and the focusing diode based on the magnetic induction intensities that the diverging diode and the focusing diode should each possess under different high-energy diverging electron beams of different firing orders, so that the diverging diode and the focusing diode generate varying magnetic induction intensities in opposite directions.

[0018] In one possible implementation, the low-energy filtering module and the focusing module are disposed outside the beam transmission channel of the high-energy divergent electron beam. The diverging diode and the focusing diode in the focusing module can rotate around the axis of the beam transmission channel so that high-energy divergent electron beams of different blasts enter the target object from different planes and different angles and are focused on the target area within the target object.

[0019] In one possible implementation, the high-energy diffused electron beam includes a high-energy diffused electron beam generated by a laser plasma accelerator.

[0020] According to a third aspect of the present disclosure, a radiotherapy device is provided, comprising: a laser plasma accelerator for generating a high-energy diffused electron beam; and the aforementioned high-energy diffused electron beam focusing scanning system.

[0021] In one possible implementation, the high-energy diffused electron beam focusing scanning system is disposed in a rotating gantry of the radiotherapy equipment, the rotating gantry being rotatable around the target object.

[0022] According to embodiments of this disclosure, a low-energy filtering module can filter out low-energy electrons from high-energy diffused electron beams of different bursts, resulting in high-energy electrons in the filtered high-energy diffused high-energy electron beam. Then, a focusing module can direct the high-energy diffused high-energy electron beams of different bursts onto the target area of ​​the target object, such as a lesion area in the human body, with different trajectories. Because the magnetic induction intensity of the diverging diode and the focusing diode in the focusing module varies and is in opposite directions, the diverging diode can deflect the high-energy diffused high-energy electron beams of different bursts to different positions before they enter the focusing diode. Furthermore, because the magnetic induction intensity of the diverging diode and the focusing diode are in opposite directions, the focusing diode can deflect high-energy, diffused electron beams of different volitions that are injected from different positions into the target object at different angles and focus them onto the target area. This can reduce the dose deposition of the high-energy, diffused electron beam at the entrance / exit of the target object, and has a high tolerance for the energy dispersion of the high-energy, diffused electron beam. It can achieve the peak dose deposition of high-energy, diffused electron beams of different volitions in the target area, thereby greatly reducing the radiation dose to other normal tissues within the target object and improving the radiotherapy effect.

[0023] Other features and aspects of this disclosure will become clear from the following detailed description of exemplary embodiments with reference to the accompanying drawings. Attached Figure Description

[0024] The accompanying drawings, which are included in and form part of this specification, illustrate exemplary embodiments, features, and aspects of this disclosure together with the specification and serve to explain the principles of this disclosure.

[0025] Figure 1 A schematic diagram of a high-energy diffuse electron beam focusing scanning system according to an embodiment of the present disclosure is shown.

[0026] Figure 2 A schematic diagram of a high-energy diffuse electron beam focusing scanning system according to an embodiment of the present disclosure is shown.

[0027] Figure 3 A schematic diagram of a high-energy diffuse electron beam focusing scanning system according to an embodiment of the present disclosure is shown.

[0028] Figure 4A schematic diagram showing the trajectory of a high-energy dissipative electron beam according to an embodiment of the present disclosure.

[0029] Figure 5 A schematic diagram showing the trajectories of electrons with different energies according to embodiments of the present disclosure.

[0030] Figure 6 A schematic diagram of a high-energy diffuse electron beam focusing scanning system according to an embodiment of the present disclosure is shown.

[0031] Figure 7 A flowchart is shown for a high-energy diffuse electron beam focusing scanning method according to an embodiment of the present disclosure.

[0032] Figure 8a and Figure 8b This diagram illustrates the dose distribution of a high-energy dissipative electron beam deposited in water according to an embodiment of the present disclosure.

[0033] Figure 9a and Figure 9b The diagram shows the dose distribution of a high-energy diffused electron beam directly injected into a body of water using a related technique. Detailed Implementation

[0034] Various exemplary embodiments, features, and aspects of this disclosure will now be described in detail with reference to the accompanying drawings. The same reference numerals in the drawings denote elements that have the same or similar functions. Although various aspects of the embodiments are shown in the drawings, they are not necessarily drawn to scale unless specifically indicated otherwise.

[0035] The term “exemplary” as used herein means “serving as an example, embodiment, or illustration.” Any embodiment illustrated herein as “exemplary” is not necessarily to be construed as superior to or better than other embodiments.

[0036] Furthermore, to better illustrate this disclosure, numerous specific details are set forth in the following detailed description. Those skilled in the art will understand that this disclosure can be practiced without certain specific details. In some instances, methods, means, components, and circuits well known to those skilled in the art have not been described in detail in order to highlight the main points of this disclosure.

[0037] As mentioned above, traditional electron radiotherapy mainly uses low-energy electron beams in the energy range of 6MeV-20MeV. Due to their shallow penetration depth and poor lateral penumbra quality, they are only suitable for treating superficial tumors (within 5cm of the body) such as those in the skin and limbs, and cannot be used for radiotherapy of deep tumors. High-energy electron beams (such as electron beams with energies higher than 50MeV) overcome the above-mentioned shortcomings of low-energy electron beams, enabling deeper dose deposition and a sharper lateral penumbra. With the development of new electron accelerator technology using laser plasma wake acceleration, the scale of laser plasma accelerators can be reduced to the desktop scale, making compact high-energy electron radiotherapy equipment have a broad application prospect. However, the high-energy electron beams generated by laser plasma accelerators generally have a wide energy spectrum (e.g., energy dispersion above 10%), which easily leads to high dose deposition at the entrance and exit of the body, making it difficult to form dose peaks in deep regions of the body. Therefore, traditional beam focusing methods cannot be directly applied to high-energy electron radiotherapy equipment.

[0038] In view of this, the present disclosure provides a high-energy dispersed electron beam focusing scanning system and method, which can be applied to radiotherapy equipment using high-energy dispersed electron beams. It can be used in radiotherapy of deep tumors within the human body, especially by applying the dispersion and deflection of the high-energy dispersed electron beam by a dipole. By adjusting the magnetic induction intensity of the dipole, multiple high-energy dispersed electron beams can be focused at a large angle within the human body, particularly in the target area of ​​deep tumors, to form a dose peak. This significantly reduces the radiation dose to other normal tissues, solving the problem of excessively high inlet / outlet doses from high-energy dispersed electron beams within the human body. The system addresses the issue that, by adjusting the magnetic induction intensity of the dipole iron, a high-energy electron beam with high energy dispersion can achieve a dose peak at any depth in the lesion region within the body. Furthermore, the system is also suitable for the transmission and focusing of high-energy electron beams with high energy dispersion. Because the different deflection effects of electrons of different energies in the high-energy electron beam within the magnetic field are utilized, electrons of different energies can converge at the target region via different deflection trajectories. This makes the system unaffected by the energy dispersion of the high-energy electron beam, exhibiting high tolerance for energy dispersion, thus solving the problem of dose distribution distortion caused by energy dispersion during the transmission of high-energy electron beams with high energy dispersion.

[0039] The following is based on Figures 1 to 6 The high-energy diffuse electron beam focusing scanning system provided in the embodiments of this disclosure will be described in detail.

[0040] Figure 1 A schematic diagram of a high-energy diffused electron beam focusing scanning system according to an embodiment of the present disclosure is shown. This high-energy diffused electron beam focusing scanning system can be applied to various radiotherapy devices, such as radiotherapy devices employing high-energy diffused electron beams. Figure 1As shown, the high-energy dispersed electron beam focusing scanning system includes:

[0041] The low-energy filtering module 101 is used to filter out low-energy electrons in different high-energy diffused electron beams of different firing orders to obtain high-energy diffused high-energy electron beams of different firing orders.

[0042] The focusing module 102 includes a diverging diode 1021 and a focusing diode 1022. The diverging diode 1021 and the focusing diode 1022 generate varying magnetic induction intensities in opposite directions. The diverging diode 1021 is used to deflect high-energy electron beams of different frequencies to different positions and direct them into the focusing diode 1022. The focusing diode 1022 is used to deflect high-energy electron beams of different frequencies to different angles and direct them into the target object and focus them onto the target area within the target object.

[0043] The high-energy diffused electron beam entering the high-energy diffused electron beam focusing and scanning system can be a high-energy diffused electron beam generated by a laser-plasma accelerator. This high-energy diffused electron beam can include an electron beam with a full width at half maximum (FWHM) of 1% to 50%. The high-energy electron beam can include an electron beam with an energy higher than 50 MeV. It should be understood that the laser-plasma accelerator can emit multiple high-energy diffused electron beams into the high-energy diffused electron beam focusing and scanning system in stages. Each high-energy diffused electron beam emitted into the system can be referred to as a single stage of high-energy diffused electron beam, or a single high-energy diffused electron beam can be considered a single stage of high-energy diffused electron beam. The high-energy diffused electron beams of different stages sequentially pass through the low-energy filtering module 101, the diverging diode 1021 in the focusing module 102, and the focusing diode 1022.

[0044] In one possible implementation, such as Figure 2 As shown, the low-energy filtering module 101 may include a deflecting diode 1011 and a low-energy blocking plate 1012. The deflecting diode 1011 in the low-energy filtering module is used to deflect each electron in the high-energy diffused electron beam of different firing orders to obtain a deflected high-energy diffused electron beam. Electrons of different energies in the deflected high-energy diffused electron beam have different deflection radii. The low-energy blocking plate 1012 is used to filter out low-energy electrons in the deflected high-energy diffused electron beam to obtain high-energy diffused high-energy electron beams of different firing orders. The low-energy electrons may include electrons with energy less than 30 MeV. The magnetic induction intensity of the deflecting diode 1011 can be a custom fixed value, which is not limited in this embodiment.

[0045] It is known that, due to the energy dispersion of the high-energy dispersed electron beam, the electrons in each high-energy dispersed electron beam generated by the laser plasma accelerator have different energies. Furthermore, based on formulas (1) and (2), it is known that electrons of different energies have different deflection radii in the same magnetic field, resulting in different offset distances. Therefore, the dispersion of electrons by the magnetic field within the deflecting dipole 1011 in the low-energy filter module 101 can be utilized to cause electrons of different energies in each high-energy dispersed electron beam (i.e., each high-energy dispersed electron beam emitted) to produce different offset distances. Since the lower the energy of an electron, the greater its deflection distance, or the greater its deviation from the beam center, the high-energy diffused electron beam obtained after deflection by the deflecting diode 1011 will be blocked and absorbed by the low-energy barrier plate 1012 when it passes through the low-energy barrier plate 1012. This achieves the filtering of low-energy electrons in the high-energy diffused electron beam, thereby filtering out low-energy electrons in each high-energy diffused electron beam and selecting high-energy electrons to meet the needs of radiotherapy for deep lesion areas using high-energy diffused electron beams.

[0046]

[0047]

[0048] Where r is the deflection radius, m is the mass of the electron, v is the velocity of the electron, e is the charge of the electron, B is the magnetic flux density, and E is the magnetic flux density. e Let be the energy of the electron, l be the length of the dipole (i.e., the width of the magnetic field inside the dipole), and Δx be the offset distance.

[0049] Considering, after Figure 2 The low-energy filtering module 101 shown produces high-energy electron beams of different energies with different divergence angles. To reduce the impact of the divergence angle on the focusing module 102, in one possible implementation, such as... Figure 3 As shown, the low-energy filtering module 101 may include: a deflecting diode 1011 and a collimating diode 1013, and a low-energy blocking plate 1012. The magnetic induction intensity of the deflecting diode 1011 and the collimating diode 1013 is the same but in opposite directions. As described above, the deflecting diode 1011 is used to deflect electrons in high-energy diffused electron beams of different firing orders, and the low-energy blocking plate 1012 is used to filter out low-energy electrons in the deflected high-energy diffused electron beams to obtain high-energy diffused high-energy electron beams. The collimating diode 1013 is used to collimate the high-energy diffused high-energy electron beams of different firing orders to obtain collimated high-energy diffused high-energy electron beams of different firing orders.

[0050] based on Figure 3The low-energy filtering module 101 shown, the diverging diode 1021 in the focusing module 102 is also used to deflect the collimated high-energy diverging electron beams of different frequencies to different positions and inject them into the focusing diode 1022. In turn, the focusing diode 1022 can deflect the high-energy diverging electron beams of different frequencies into different angles and inject them into the target object and focus them into the target area within the target object.

[0051] Among them, Figure 3 In the low-energy filtering module 101 shown, the magnetic induction intensity of the deflecting diode 1011 and the collimating diode 1013 can be set to be the same but opposite in direction. The specific values ​​of their magnetic induction intensities can be determined according to actual needs (e.g., the size of the diodes, the magnetic field, etc.). Optionally, the deflecting diode 1011 and the collimating diode 1013 in the low-energy filtering module 101 can be electromagnets. Therefore, the magnitude and direction of the magnetic induction intensity can be controlled by controlling the magnitude and direction of the current flowing through the deflecting diode 1011 and the collimating diode 1013, respectively. Of course, other controllable magnetic induction diodes known in the art can also be used, and this embodiment of the present disclosure does not limit this.

[0052] Based on the above formulas (1) and (2), it can be seen that the deflection angle of the same electron with the same energy in the same magnetic field is the same. However, the deflection direction of the same electron is different in different magnetic fields with different magnetic induction intensities. Since the magnetic induction intensities of the deflecting diode 1011 and the collimating diode 1013 are the same and opposite in direction, the deflection angle of the same electron in the deflecting diode 1011 is the same as that in the collimating diode 1013, but the deflection direction is opposite. Thus, the collimating diode 1013 can adjust the high-energy electron beam with large energy dispersion obtained after being deflected by the deflecting diode 1011 and filtered by the low-energy blocking plate 1012 back to collimation, so as to maintain the small divergence angle before entering the deflecting diode 1011.

[0053] It should be understood that those skilled in the art can use low-energy barrier plates with low-energy electron filtering functions known in the art to filter out low-energy electrons, and this disclosure does not limit such use.

[0054] It is known that when an electron beam propagates through matter, it diverges in a pencil shape due to beam scattering. If each high-energy, high-dispersion electron beam were to directly strike the lesion area of ​​the human body along the same trajectory (i.e., at the same position and angle), the dose deposited on the surface of the skin (i.e., the entrance and exit point of the body) would be too high. To obtain a peak dose deposition in deeper lesion areas, it is necessary to strike the lesion area with high-energy, high-dispersion electron beams at different angles and positions to achieve a peak dose deposition in the lesion area. Here, dose represents the energy delivered by radiation to a unit mass of matter. The target object can be understood as the object to be radiotreated, such as a human or animal, and the target area can be understood as the target region to be radiotreated, such as the lesion area where a tumor is located in the human body.

[0055] As can be seen from formulas (1) and (2) above, the magnetic induction intensity also affects the deflection radius and offset distance of the electrons. Therefore, the varying magnetic induction intensity generated by the diverging diode 1021 in the focusing module 102 can be controlled, so that the high-energy diverging electron beams entering the diverging diode 1021 at different times will have different deflection positions before entering the focusing diode 1022. Figure 4 As shown, each line represents the trajectory of a high-energy electron beam with high energy dispersion at different times. Since the magnetic induction intensity of the deflecting diode 1011 and collimating diode 1013 in the low-energy filtering module 101 is fixed, although the offset distances of electrons of different energies in the high-energy electron beam with high energy dispersion differ, the energy has a limited impact on the offset distance, and the low-energy blocking plate 1012 ensures that each high-energy electron beam with high energy consists entirely of high-energy electrons. Therefore, each high-energy electron beam with high energy dispersion passes through the deflecting diode 1011 and collimating diode 1013. The motion trajectories of the polaritron 1013 are roughly the same, which means that the energy of the high-energy divergent electron beams obtained after collimation by the collimating polaritron 1013 is similar and the divergence angle is small. However, since the magnetic induction intensity of the divergent polaritron 1021 in the focusing module 102 is different, the high-energy divergent electron beams obtained after collimation by different polaritrons 1021 with different magnetic induction intensities will be laterally deflected to different positions under the influence of different magnetic induction intensities, and will enter the focusing polaritron 1022 in the focusing module 102 at different positions.

[0056] In this scenario, if the magnetic induction intensity of the diverging diode 1021 gradually increases, then the deflection distance of the high-energy divergent electron beams entering the focusing diode 1022 at different times usually gradually increases. To ensure that these high-energy divergent electron beams with gradually increasing deflection distances are ultimately focused onto the target region, the magnetic induction intensity of the focusing diode 1022 can gradually increase in the opposite direction. Conversely, if the magnetic induction intensity of the diverging diode 1021 gradually decreases, then the magnetic induction intensity of the focusing diode 1022 can gradually decrease in the opposite direction. That is, the magnetic induction intensity of the focusing diode 1022 and the magnetic induction intensity of the diverging diode 1021 can be positively correlated and opposite in direction, thereby deflecting the high-energy divergent electron beams at different times to enter the target object at different angles and focusing them onto the target region within the target object. Figure 4 As shown, the diverging diode 1021 and the focusing diode 1022 can focus high-energy electron beams of different trajectories onto the target area.

[0057] Optionally, in order to accurately focus high-energy divergent electron beams from different volleys onto the target region, the magnetic induction intensity of the diverging diode 1021 and the magnetic induction intensity of the focusing diode 1022 can be positively correlated. For example, the magnetic induction intensity of the diverging diode 1021 can be increased or decreased according to a preset intensity step, while the magnetic induction intensity of the focusing diode 1022 can be controlled to increase or decrease in a positive correlation with the magnetic induction intensity of the diverging diode 1021. The changing magnetic induction intensities of the diverging diode 1021 and the focusing diode 1022 can be controlled by adjusting the current flowing through them.

[0058] Considering that different lesion areas within the human body may be at different depths, in order to achieve focusing of high-energy divergent electron beams of different frequencies at any depth within the human body, or to focus high-energy divergent electron beams of different frequencies onto target areas at different depths, the magnetic induction intensity of the divergent diode 1021 in the focusing module 102 can be controlled to increase or decrease in a specified step size. Furthermore, based on the focusing depth corresponding to the target area and the magnetic induction intensity of the divergent diode 1021 in the focusing module 102, the magnetic induction intensity of the focusing diode 1022 in the focusing module 102 is controlled to change in a positive correlation with the magnetic induction intensity of the divergent diode 1021. This allows the divergent diode 1021 and the focusing diode 1022 in the focusing module 102 to work together to focus high-energy divergent electron beams of different frequencies, or collimated high-energy divergent electron beams of different frequencies, onto the target area.

[0059] The focusing depth can be understood as the distance between the focusing diode 1022 in the focusing module 102 and the target area, or the distance between the diverging diode 1021 in the focusing module 102 and the target area, or it can be the distance between the emission port of the laser plasma accelerator and the target area, or the distance between the surface of the target object and the target area, etc. In practical applications, this focusing depth can be input into the system as a known parameter, and the present disclosure does not limit the method of determining the focusing depth.

[0060] It should be understood that different focusing depths require different offset distances, which means that different focusing depths require different magnetic induction intensities. If the magnetic induction intensities of the diverging diode 1021 are varied (increased or decreased) in a fixed preset intensity step, then for the focusing diode 1022, the magnetic induction intensities of the focusing diode 1022 should be adjusted based on different focusing depths and the magnetic induction intensities of the diverging diode 1021 at each step. In this way, the high-energy diverging electron beams emitted by the diverging diode 1021 at different times can be injected into the target object with different trajectories and focused onto the target area.

[0061] One approach is to obtain the correspondence between the magnetic induction intensity of the divergent diode 1021 and the magnetic induction intensity of the focused diode 1022 at different focusing depths through theoretical analysis combined with Monte Carlo simulation verification. This correspondence can be linear or nonlinear, and the magnetic induction intensity of the focused diode 1022 can be controlled based on this correspondence. Alternatively, this correspondence can be converted into a MAP chart, and in practical applications, the magnetic induction intensity that the focused diode 1022 should have at different focusing depths and when the divergent diode 1021 has different magnetic induction intensities can be looked up in the table.

[0062] For example, if the magnetic induction intensity of the diverging diode 1021 does not exceed 1.35T, then to achieve focusing of a high-energy diverging electron beam at a depth of 20cm in water, the magnetic induction intensity of the focusing diode 1022 must not exceed 1.1T; to achieve focusing at a depth of 15cm in water, the magnetic induction intensity of the focusing diode 1022 must not exceed 1.2T; and to achieve focusing at a depth of 10cm in water, the magnetic induction intensity of the focusing diode 1022 must not exceed 1.28T, etc.

[0063] It should be understood that the above-mentioned control of the magnetic induction intensity of the diverging diode 1021 and the focusing diode 1022 to be positively correlated is one possible implementation method provided by the embodiments of this disclosure. In fact, those skilled in the art can control the magnetic induction intensity of the diverging diode 1021 and the focusing diode 1022 to be negatively correlated. As long as the two work together to inject high-energy diverging electron beams of different frequencies into the target object at different angles and focus them into the target area within the target object, they should be within the protection scope of the embodiments of this disclosure.

[0064] As described above, due to the energy dispersion of the high-energy diffused electron beam, the electrons in each high-energy diffused electron beam generated by the laser plasma accelerator have different energies. Based on the above formulas (1) and (2), it can be seen that the deflection radius of electrons with different energies in the same high-energy diffused electron beam in the same magnetic field is different, and the resulting offset distance is also different. Based on this, the diverging diode 1021 in the focusing module 102 is also used to deflect electrons with different energies in high-energy diffused electron beams of different bursts to different positions and inject them into the focusing diode 1022. The focusing diode 1022 is also used to deflect electrons injected at different positions to different angles and inject them into the target object and focus them into the target area within the target object.

[0065] Specifically, the magnetic field of the diverging diode 1021 can be used to disperse and disperse electrons of different energies, causing electrons of different energies in each high-energy electron beam with large energy dispersion to be deflected at different positions before entering the focusing diode 1022. Since the magnetic induction intensity of the focusing diode 1022 is opposite to that of the magnetic induction intensity of the diverging diode 1021, the deflection direction of the same electron in the diverging diode 1021 is opposite to that in the focusing diode 1022. Therefore, the focusing diode 1022 can deflect different electrons injected at different positions to different angles entering the target object and focus them onto the target area within the target object. Figure 5 As shown, each line can represent the trajectory of electrons of different energies in the same high-energy divergent electron beam. The trajectories of electrons of different energies in the same high-energy divergent electron beam are different when passing through the diverging diode 1021 and the focusing diode 1022, but electrons of different energies are still focused on the target area.

[0066] As mentioned above, due to energy dispersion in high-energy-dispersion electron beams, the energy of electrons in each high-energy-dispersion electron beam is different. Figure 4 The lines shown represent the approximate overall trajectory of each high-energy divergent electron beam. However, for each electron within a high-energy divergent electron beam, the trajectories of electrons with different energies also differ due to variations in electron energy. Assuming... Figure 5The diagram illustrates the trajectories of electrons of different energies as a high-energy electron beam with a large energy dispersion of 200 MeV passes through a diverging diode 1021 and a focusing diode 1022. Following a top-down order, assuming the second line represents the trajectory of an electron with an energy of 200 MeV, the third line represents the trajectory of an electron with a higher energy. This is because higher-energy electrons are less deflected by the magnetic field. The first line represents the trajectory of an electron with a lower energy, because lower-energy electrons are more deflected by the magnetic field. However, using the high-energy electron beam focusing scanning system of this disclosure, electrons of different energies in the same high-energy electron beam still converge in the target region, thus the high-energy electron beam focusing scanning system is unaffected by the energy dispersion of the high-energy electron beam and has a high tolerance for energy dispersion.

[0067] According to embodiments of this disclosure, a low-energy filtering module can filter out low-energy electrons from high-energy diffused electron beams of different frequencies, resulting in high-energy electrons in the filtered high-energy diffused high-energy electron beam. Then, a focusing module can direct high-energy diffused high-energy electron beams of different frequencies onto the target area of ​​the target object, such as a lesion area in the human body, with different trajectories. Because the magnetic induction intensity of the diverging diode and the focusing diode in the focusing module varies and is in opposite directions, the diverging diode can deflect high-energy diffused high-energy electron beams of different frequencies to different positions before they enter the focusing diode. Meanwhile, since the magnetic induction intensity of the diverging diode and the focusing diode are in opposite directions, the focusing diode can deflect high-energy, diffused electron beams of different volitions that are injected from different positions into the target object at different angles and focus them on the target area. This can reduce the dose deposition of high-energy, diffused electron beams of different volitions at the entrance / exit of the target object. It has a high tolerance for energy dispersion of high-energy, diffused electron beams and achieves the peak dose deposition of high-energy, diffused electron beams of different volitions in the target area. In this way, it can greatly reduce the radiation dose to other normal tissues in the target object and improve the radiotherapy effect.

[0068] To more conveniently control the changing and opposite magnetic induction intensities generated by the diverging diode 1021 and the focusing diode 1022 in the focusing module 102, both the diverging diode 1021 and the focusing diode 1022 can be electromagnets, or other diodes with controllable magnetic induction intensity. This embodiment of the present disclosure does not limit this. Figure 6As shown, the high-energy diffused electron beam focusing scanning system also includes a control module 103, which is used to control the diverging diode 1021 and the focusing diode 1022 to generate varying magnetic induction intensities in opposite directions. The control module 103 is electrically connected to the diverging diode 1021 and the focusing diode 1022, so that the control module 103 can supply power to the diverging diode 1021 and the focusing diode 1022 respectively, so as to control the varying magnetic induction intensities in opposite directions generated by the diverging diode 1021 and the focusing diode 1022 respectively.

[0069] Specifically, the control module 103 can control the magnitude of the current flowing through the diverging diode 1021 and the focusing diode 1022 to control the changing magnetic induction intensity generated by the diverging diode 1021 and the focusing diode 1022, and can control the magnetic induction intensity generated by the diverging diode 1021 and the focusing diode 1022 in opposite directions by controlling the direction of the current flowing through the diverging diode 1021 and the focusing diode 1022.

[0070] In one possible implementation, the control module 103 controls the diverging diode 1021 and the focusing diode 1022 to generate varying and opposite magnetic induction intensities. This includes: determining the appropriate magnetic induction intensities for each of the diverging diode 1021 and the focusing diode 1022 under different high-energy diverging electron beams of varying frequencies, based on the focusing depth corresponding to the target region; and controlling the magnitude and direction of the current flowing through the diverging diode 1021 and the focusing diode 1022 based on their respective magnetic induction intensities, so that the diverging diode 1021 and the focusing diode 1022 generate varying and opposite magnetic induction intensities. This method enables peak dose deposition of high-energy diverging electron beams of varying frequencies at any depth within the target region.

[0071] As described above, the focusing depth can be understood as the distance between the focusing diode 1022 and the target area, or the distance between the diverging diode 1021 and the target area, or it can also be the distance between the emission port of the laser plasma accelerator and the target area, or the distance between the surface of the target object and the target area, etc. In practical applications, this focusing depth can be input into the system as a known parameter, and the embodiments of this disclosure do not limit the method of determining the focusing depth.

[0072] It should be understood that the required offset distance for different high-energy divergent electron beams varies at different focusing depths, meaning that the required magnetic flux density for different high-energy divergent electron beams at different focusing depths is also different. To direct different high-energy divergent electron beams into the target object at different angles and focus them onto the target area, different magnetic flux densities can be applied based on the focusing depth for different high-energy divergent electron beams. This can be verified through theoretical analysis combined with Monte Carlo simulations, yielding various magnetic flux densities that divergent diode 1021 and focusing diode 1022 can possess at different focusing depths. The magnetic induction intensities of the diverging diode 1021 and the focusing diode 1022 can be combined in different ways. For example, to achieve focusing of a high-energy divergent electron beam at a depth of 20 cm in water, the magnetic induction intensities of the diverging diode 1021 and the focusing diode 1022 can be 1.2T and 0.8T, 1.3T and 0.9T, 1.35T and 1.1T, etc. Therefore, the diverging diode 1021 and the focusing diode 1022 can be controlled to have these combinations of magnetic induction intensities in sequence. In this way, different high-energy divergent electron beams can be deflected to different positions and angles under different combinations of magnetic induction intensities, but they will all be focused on the target area at the focusing depth.

[0073] In one possible implementation, based on the focusing depth corresponding to the target area, the magnetic induction intensity that the diverging diode 1021 and the focusing diode 1022 should each possess under different high-energy diverging electron beams is determined. This may further include: controlling the magnetic induction intensity of the diverging diode 1021 to increase or decrease according to a specified step size; and controlling the focusing diode 1022 to generate a magnetic induction intensity that changes in correlation with the diverging diode 1021 based on the focusing depth corresponding to the target area and the magnetic induction intensity of the diverging diode 1021. The specified step size can be customized according to actual needs, for example, it can be set to increase or decrease the magnetic induction intensity of the diverging diode 1021 by 0.1T per second, etc., and this embodiment of the present disclosure does not limit this.

[0074] As described above, the correspondence between the magnetic induction intensity of the diverging diode 1021 and the focusing diode 1022 at different focusing depths can be obtained through theoretical analysis combined with Monte Carlo simulation verification. According to a certain correspondence, the focusing diode 1022 can be controlled to generate a magnetic induction intensity that changes in correlation with the magnetic induction intensity of the diverging diode 1021. This correspondence can be pre-set, and it can be linear or non-linear; this embodiment does not limit this.

[0075] It should be understood that the control module 103 can supply power to the diverging diode 1021 and the focusing diode 1022 respectively based on the magnetic induction intensity that the diverging diode 1021 and the focusing diode 1022 should possess. This embodiment of the present disclosure does not limit the hardware structure or type of the control module, as long as it can achieve its intended functions. Optionally, the control module 103 can communicate with an external computing device to obtain the focusing depth of the target area; of course, the control module 103 can also directly obtain the focusing depth input by the user, which is not limited in this embodiment of the present disclosure.

[0076] According to the embodiments of this disclosure, the control module 103 can conveniently and effectively control the diverging diode 1021 and the focusing diode 1022 in the focusing module 102 to generate their respective magnetic induction intensities, thereby enabling the system to efficiently focus different batches of high-energy diffused electron beams onto the target area. In particular, by controlling the diverging diode 1021 and the focusing diode 1022 in the focusing module 102 to generate varying and opposite magnetic induction intensities, different batches of high-energy diffused electron beams can be injected into the target object with different trajectories and focused onto the target area.

[0077] It is known that electron beams are typically transmitted within a beam transmission channel. Considering that the magnetic field of the diode causes a lateral deflection of the electrons, the trajectories of multiple high-energy, high-dispersion electron beams are planar in actual space. To input each high-energy, high-dispersion electron beam with different trajectories into the target object and focus it onto the target area as much as possible at a wide angle and over a wide range, in one possible implementation, the low-energy filtering module 101 and the focusing module 102 can be disposed outside the beam transmission channel of the high-energy, high-dispersion electron beam. The diverging diode 1021 and the focusing diode 1022 in the focusing module 102 can rotate around the axis of the beam transmission channel, so that high-energy, high-dispersion electron beams of different emanations enter the target object from different planes and at different angles and are focused onto the target area within the target object.

[0078] The axis of the beam transmission pipe can be understood as the central axis of the beam transmission pipe, which can be, for example, a vacuum-sealed steel pipe. Each diode in the low-energy filtering module 101 and the focusing module 102 can be fitted outside the vacuum-sealed pipe. For example, the deflecting diode 1011 and the collimating diode 1013 in the low-energy filtering module 101 can be fitted outside the beam transmission pipe at a interval of d1 = 10cm. The low-energy barrier plate 1012 can be placed between the deflecting diode 1011 and the collimating diode 1013. The diverging diode 1021 of the focusing module 102 can be fitted 10cm after the collimating diode 1013, and the focusing diode 1022 of the focusing module 102 can be fitted 30cm after the diverging diode 1021.

[0079] The low-energy filtering module 101 can be fixedly installed outside the beam transmission pipe, or it can rotate together with the focusing module 102 around the axis of the beam transmission pipe. This embodiment of the present disclosure does not limit this. It should be understood that this embodiment of the present disclosure does not limit the arrangement of the low-energy filtering module 101 and the focusing module 102 outside the beam transmission pipe.

[0080] It should be noted that those skilled in the art can customize the arrangement, position, size, and shape of each diode outside the beam transmission channel according to actual needs without limitation. Specifically, the diverging diode 1021 and the focusing diode 1022 in the focusing module 102 can rotate around an axis outside the beam transmission channel at the same angular velocity. This embodiment of the present disclosure does not limit the rotational speed of the diverging diode 1021 and the focusing diode 1022 in the focusing module 102.

[0081] It should be understood that, since the diverging diode 1021 and the focusing diode 1022 in the focusing module 102 can rotate around the axis outside the beam transmission channel, the motion trajectory of multiple high-energy divergent electron beams can be three-dimensionally distributed around the beam transmission channel, or in other words, it is three-dimensional in actual space. This allows high-energy divergent electron beams of different volitions to be injected into the target object from different angles on different planes, that is, injected into the target object with a large-scale three-dimensional motion trajectory and focused on the target area. This can further reduce the dose deposition of the high-energy divergent electron beams at the entrance and exit of the target object, achieve the peak dose deposition of multiple high-energy divergent electron beams in the target area, and improve the radiotherapy effect.

[0082] Based on the aforementioned high-energy dispersed electron beam focusing and scanning system, this disclosure also provides a high-energy dispersed electron beam focusing and scanning method, which can be applied to the aforementioned high-energy dispersed electron beam focusing and scanning system, such as... Figure 7 As shown, the method includes:

[0083] Step S701: For high-energy divergent electron beams of different firing orders to be focused, low-energy electrons in the high-energy divergent electron beams of different firing orders are filtered out by a low-energy filtering module to obtain high-energy divergent high-energy electron beams of different firing orders and injected into the focusing module. The focusing module includes a divergent diode and a focusing diode.

[0084] Step S702: By controlling the diverging diode and the focusing diode to generate varying and opposite magnetic induction intensities, the diverging diode deflects the high-energy electron beams of different frequencies to different positions and injects them into the focusing diode, and the focusing diode deflects the high-energy electron beams of different frequencies into different angles and injects them into the target object and focuses them onto the target area within the target object.

[0085] In one possible implementation, the high-energy diffused electron beam includes a high-energy diffused electron beam generated by a laser plasma accelerator.

[0086] In one possible implementation, the diverging diode is further used to deflect electrons with different energies in the high-energy diverging electron beam to different positions and inject them into the focusing diode; the focusing diode is further used to deflect electrons injected at different positions to different angles and inject them into the target object and focus them into the target area within the target object.

[0087] In one possible implementation, the low-energy filtering module includes a deflecting diode and a low-energy blocking plate. The low-energy filtering module filters out low-energy electrons from the high-energy diffused electron beams of different firing orders to obtain high-energy diffused electron beams of different firing orders. This includes: using the deflecting diode in the low-energy filtering module to deflect each electron in the high-energy diffused electron beams of different firing orders to obtain deflected high-energy diffused electron beams, wherein electrons of different energies in the deflected high-energy diffused electron beams have different deflection radii; and using the low-energy blocking plate to filter out low-energy electrons from the deflected high-energy diffused electron beams to obtain high-energy diffused electron beams of different firing orders.

[0088] In one possible implementation, the low-energy filtering module further includes a collimating diode, the collimating diode having the same magnetic induction intensity and opposite direction to the deflecting diode; the method further includes: using the collimating diode to re-collimate the high-energy divergent electron beams of different orders, obtaining collimated high-energy divergent electron beams of different orders; wherein, the step of deflecting the high-energy divergent electron beams of different orders to different positions by the diverging diode and injecting them into the focusing diode includes: deflecting the collimated high-energy divergent electron beams of different orders to different positions by the diverging diode and injecting them into the focusing diode.

[0089] In one possible implementation, controlling the diverging diode and the focusing diode to produce varying and opposite magnetic induction intensities includes: for different high-energy divergent electron beams to be focused, determining the magnetic induction intensities that the diverging diode and the focusing diode should each possess under different high-energy divergent electron beams, based on the focusing depth corresponding to the target region; and controlling the magnitude and direction of the current flowing through the diverging diode and the focusing diode, based on the magnetic induction intensities that the diverging diode and the focusing diode should each possess under different high-energy divergent electron beams, so that the diverging diode and the focusing diode produce varying and opposite magnetic induction intensities.

[0090] In one possible implementation, the low-energy filtering module and the focusing module are disposed outside the beam transmission channel of the high-energy divergent electron beam. The diverging diode and the focusing diode in the focusing module can rotate around the axis of the beam transmission channel so that high-energy divergent electron beams of different blasts enter the target object from different planes and different angles and are focused on the target area within the target object.

[0091] It should be understood that the specific implementation of the high-energy diffuse electron beam focusing scanning method provided in the embodiments of this disclosure can refer to the implementation described in detail in the high-energy diffuse electron beam focusing scanning system of the embodiments of this disclosure above. For the sake of brevity, it will not be repeated here.

[0092] According to the high-energy diffused electron beam focusing scanning system of this disclosure, a low-energy filtering module can filter out low-energy electrons from different bursts of high-energy diffused electron beams, resulting in high-energy electrons in the filtered high-energy diffused high-energy electron beam. Then, a focusing module can direct the high-energy diffused high-energy electron beams from different bursts onto the target area of ​​the target object, such as a lesion area in the human body, with different trajectories. Because the magnetic induction intensity of the diverging diode and the focusing diode in the focusing module varies and is in opposite directions, the diverging diode can deflect the high-energy diffused high-energy electron beams from different bursts to different positions. The focusing diode, along with the diverging diode whose magnetic induction intensity is opposite to that of the focusing diode, can deflect high-energy, diffused electron beams of different volitions entering from different positions into the target object at different angles and focus them onto the target area. This can reduce the dose deposition of high-energy, diffused electron beams of different volitions at the entrance / exit of the target object, and has a high tolerance for energy dispersion of high-energy, diffused electron beams. It can achieve the peak dose deposition of high-energy, diffused electron beams of different volitions in the target area, thereby greatly reducing the radiation dose to other normal tissues within the target object and improving the radiotherapy effect.

[0093] The beneficial effects of using the high-energy diffused electron beam focusing system and method of the present disclosure are introduced by simulation results obtained by injecting a 200MeV high-energy diffused electron beam (e.g., 20% energy dispersion, source size 4μm, divergence angle 4mrad, all of which are Gaussian distributed high-energy diffused electron beams) generated by a laser plasma accelerator into a water body.

[0094] Figure 8a and Figure 8b This diagram illustrates the dose distribution of a high-energy, dispersed electron beam deposited in water, obtained using the high-energy, dispersed electron beam focusing scanning system and method according to embodiments of this disclosure. Figure 8a The two-dimensional dose distribution along the scanning plane slice (i.e., the dose distribution along the x-axis longitudinal section) is shown. Figure 8b It shows the axis (i.e. Figure 8a One-dimensional dose distribution along the central axis, where Gy is the dose unit, such as Figure 8a and Figure 8b As shown, the dose of high-energy electron beam deposition reaches its peak at a depth of 15 cm in water, and the inlet dose / outlet dose on the axis accounts for only 30% of the peak dose.

[0095] As a comparison Figure 9a and Figure 9b This diagram shows the dose distribution of a high-energy electron beam that has been directly injected into a water body. Figure 9a For the two-dimensional dose distribution of the slice along the scanning plane, Figure 9b On the axis (i.e.) Figure 9a One-dimensional dose distribution (the axis in the diagram). For example... Figure 9a and Figure 9b As shown, a high-energy electron beam with large dispersion is directly incident on the water body, and its distribution exhibits a pencil-shaped beam divergence. The dose reaches its peak at the inlet and then decreases monotonically. Figure 9a and Figure 9b and Figure 8a and Figure 8b In comparison, the high-energy diffused electron beam focusing scanning system and method of the present disclosure can significantly reduce the dose deposited at the inlet of the high-energy diffused high-energy electron beam. Compared with the direct injection of the high-energy diffused high-energy electron beam, the dose deposited at the inlet is less than 20% of the peak dose when directly injected.

[0096] According to the high-energy diffused electron beam focusing scanning system and method of the present disclosure, by utilizing the different deflection effects of electrons of different energies in a magnetic field using multiple dipoles, electrons of different energies in the same high-energy diffused electron beam can converge at the target area via different trajectories. At the same time, different high-energy diffused electron beams can be injected into the target object at different positions and angles and focused on the target area, thereby greatly reducing the impact of electron beam divergence on the entire system. In other words, it has a high tolerance for electron beam divergence and can use energy divergence to broaden each high-energy diffused electron beam, increasing the distance between the high-energy diffused electron beams entering the human body, thereby reducing the dose deposition of the high-energy diffused electron beam on the surface of the human body, which is conducive to improving the radiotherapy effect and shortening the radiotherapy time.

[0097] According to the high-energy diffused electron beam focusing scanning system and method of this disclosure, a high-energy diffused electron beam can form a dose peak in a deep region of the body. By adjusting the magnetic induction intensity of the diverging diode and the focusing diode in the focusing module, dose peaks of high-energy diffused electron beams at different depths in the target area of ​​the body can be achieved. This can significantly reduce dose deposition at the entrance and exit points of the human body, reducing the ratio of entrance / exit dose to peak dose to below 50%. It can also form a focused beam by injecting multiple high-energy diffused electron beams through angular scanning, covering a large angle, for example... For example, if the magnetic induction intensity of each diode does not exceed 1.35T, multiple high-energy electron beams with large dispersion can achieve an angle coverage of 600mrad when injected into the target object. The dose of the high-energy electron beam at the entrance / exit of the target object accounts for 30% of the peak dose. Combined with the rotating gantry of traditional radiotherapy equipment, and by rotating each diode in the focusing module around the axis, a wider range of three-dimensional angle incident coverage can be achieved. The energy dispersion tolerance of the high-energy electron beam is very high, and it can tolerate more than 20% energy dispersion, which can meet the application requirements of high-energy electron radiotherapy.

[0098] According to the high-energy diffused electron beam focusing scanning system and method of the present disclosure, the deflection capability of the high-energy diffused electron beam by the diode can be used to enable high-energy diffused electron beams of different shots to enter the target object at multiple angles, thereby achieving deep dose deposition of high-energy diffused electron beams. By utilizing the dispersion of the diode and the low-energy blocking plate, low-energy electron filtering of the high-energy diffused electron beam is achieved, which can filter low-energy electrons with energies less than 30MeV without changing the propagation direction and divergence angle of the high-energy diffused electron beam.

[0099] Based on the high-energy diffused electron beam focusing scanning system in the above-described embodiments of this disclosure, this disclosure also provides a radiotherapy device, which includes: a laser plasma accelerator for generating a high-energy diffused electron beam; and the high-energy diffused electron beam focusing scanning system in the above-described embodiments of this disclosure.

[0100] In one possible implementation, the aforementioned high-energy diffused electron beam focusing scanning system can be housed within a rotating gantry of a radiotherapy device, which can rotate around the target object. This allows for affine therapy to be performed on lesions at any location and depth within the target object.

[0101] It should be understood that the target patient can lie on the treatment bed, and the rotating gantry can rotate around the treatment bed, thereby rotating around the target patient to perform radiotherapy on any lesion area within the target patient. The high-energy diffused electron beam focusing scanning system of this disclosure can be applied to various radiotherapy devices, especially radiotherapy devices using high-energy, high-energy diffused electron beams. This disclosure does not limit the hardware structure, device type, etc. of the radiotherapy device.

[0102] According to the radiotherapy equipment of the present disclosure, the high-energy diffused electron beam focusing scanning system described above can achieve a dose peak in the lesion area by the high-energy diffused high-energy electron beam, which greatly reduces the radiation dose of the high-energy diffused high-energy electron beam to other normal tissues in the target object, improves the effect of radiotherapy, and reduces the time required for radiotherapy.

[0103] The various embodiments of this disclosure have been described above. These descriptions are exemplary and not exhaustive, nor are they limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen to best explain the principles, practical application, or technical improvements to the embodiments in the market, or to enable others skilled in the art to understand the embodiments disclosed herein.

Claims

1. A high-energy dissipative electron beam focusing and scanning method, characterized in that, include: For high-energy divergent electron beams of different firing orders to be focused, a low-energy filtering module is used to filter out low-energy electrons in the high-energy divergent electron beams of different firing orders, resulting in high-energy divergent high-energy electron beams of different firing orders, which are then injected into a focusing module. The focusing module includes a divergent diode and a focusing diode. The high-energy divergent electron beams include electron beams with a full width at half maximum (FWHM) of 1% to 50%. The low-energy electrons include electrons with an energy of less than 30 MeV. By controlling the diverging diode and the focusing diode to generate varying and opposite magnetic induction intensities, the diverging diode deflects the high-energy electron beams of different bursts to different positions and injects them into the focusing diode, and the focusing diode deflects the high-energy electron beams of different bursts to different angles and injects them into the target object and focuses them onto the target area within the target object.

2. The method according to claim 1, characterized in that, The diverging diode is also used to deflect electrons with different energies in the high-energy diverging electron beam to different positions and inject them into the focusing diode; The focusing diode is also used to deflect electrons injected at different positions to different angles and to focus them onto the target area within the target object.

3. The method according to claim 1, characterized in that, The low-energy filtering module includes a deflecting diode and a low-energy blocking plate. The process of using the low-energy filtering module to filter out low-energy electrons from the high-energy diffused electron beams of different firing orders to obtain high-energy diffused electron beams of different firing orders includes: The deflecting diode in the low-energy filtering module is used to deflect each electron in a high-energy diffused electron beam of different blasts to obtain a deflected high-energy diffused electron beam, wherein electrons of different energies in the deflected high-energy diffused electron beam have different deflection radii. By using the low-energy barrier plate to filter out low-energy electrons from the deflected high-energy diffused electron beam, high-energy diffused high-energy electron beams of different firing orders can be obtained.

4. The method according to claim 3, characterized in that, The low-energy filtering module also includes a collimated diode, the collimated diode having the same magnetic induction intensity and opposite direction to the deflecting diode; the method further includes: The collimating diode is used to collimate the high-energy electron beams of different firing orders back to collimation, thus obtaining high-energy electron beams of different firing orders after collimation. The step of deflecting the high-energy electron beams of different bursts into the focusing diode by the diverging diode includes: The diverging diode deflects the collimated high-energy electron beams of different bursts to different positions and injects them into the focusing diode.

5. The method according to claim 1, characterized in that, The control of the magnetic induction intensity of the diverging diode and the focusing diode to change in opposite directions includes: For different high-energy divergent electron beams to be focused, the magnetic induction intensity that the divergent diode and the focusing diode should have under different high-energy divergent electron beams is determined according to the focusing depth corresponding to the target area. Based on the magnetic induction intensity that the diverging diode and the focusing diode should each have under different high-energy diverging electron beams, the magnitude and direction of the current flowing through the diverging diode and the focusing diode are controlled so that the diverging diode and the focusing diode produce varying magnetic induction intensities in opposite directions.

6. The method according to claim 1, characterized in that, The low-energy filtering module and the focusing module are disposed outside the beam transmission channel of the high-energy diffused electron beam. The diverging diode and the focusing diode in the focusing module can rotate around the axis of the beam transmission channel so that the high-energy diffused electron beams of different blasts enter the target object from different planes and different angles and are focused on the target area within the target object.

7. The method according to any one of claims 1 to 6, characterized in that, The high-energy diffused electron beam includes a high-energy diffused electron beam generated by a laser plasma accelerator.

8. A high-energy dissipative electron beam focusing and scanning system, characterized in that, include: The low-energy filtering module is used to filter out low-energy electrons in the high-energy diffused electron beams of different firing orders to obtain high-energy diffused high-energy electron beams of different firing orders; the high-energy diffused electron beams include electron beams with a full width at half maximum (FWHM) of 1% to 50%; the low-energy electrons include electrons with an energy of less than 30 MeV. The focusing module includes a diverging diode and a focusing diode, wherein the diverging diode and the focusing diode generate varying magnetic induction intensities in opposite directions; the diverging diode is used to deflect high-energy electron beams of different bursts to different positions and direct them into the focusing diode; the focusing diode is used to deflect high-energy electron beams of different bursts to different angles and direct them into the target object and focus them onto the target area within the target object.

9. The system according to claim 8, characterized in that, The diverging diode is also used to deflect electrons with different energies in high-energy diverging electron beams of different firing cycles to different positions and inject them into the focusing diode. The focusing diode is also used to deflect electrons injected at different positions to different angles and to focus them onto the target area within the target object.

10. The system according to claim 8, characterized in that, The low-energy filtering module includes a deflecting diode and a low-energy barrier plate. The deflecting diode in the low-energy filtering module is used to deflect each electron in a high-energy diffused electron beam of different emanations to obtain a deflected high-energy diffused electron beam. Electrons of different energies in the deflected high-energy diffused electron beam have different deflection radii. The low-energy barrier is used to filter out low-energy electrons in the deflected high-energy diffused electron beam to obtain high-energy diffused high-energy electron beams of different firing orders.

11. The system according to claim 10, characterized in that, The low-energy filtering module also includes a collimated diode, which has the same magnetic induction intensity and opposite direction as the deflection diode. The collimating diode is used to adjust the high-energy electron beams of different firing orders back to collimation, so as to obtain high-energy electron beams of different firing orders after collimation. The diverging diode in the focusing module is also used to deflect high-energy electron beams of different purgings after collimation to different positions and inject them into the focusing diode.

12. The system according to claim 8, characterized in that, The system also includes a control module, which is electrically connected to the diverging diode and the focusing diode in the focusing module. The control module is used to control the diverging diode and the focusing diode to generate varying magnetic induction intensities in opposite directions. Wherein, controlling the magnetic induction intensity of the diverging diode and the focusing diode to change in opposite directions includes: For different high-energy divergent electron beams to be focused, the magnetic induction intensity that the divergent diode and the focusing diode should have under different high-energy divergent electron beams is determined according to the focusing depth corresponding to the target area. Based on the magnetic induction intensity that the diverging diode and the focusing diode should each have under different high-energy diverging electron beams, the magnitude and direction of the current flowing through the diverging diode and the focusing diode are controlled so that the diverging diode and the focusing diode produce varying magnetic induction intensities in opposite directions.

13. The system according to claim 8, characterized in that, The low-energy filtering module and the focusing module are disposed outside the beam transmission channel of the high-energy diffused electron beam. The diverging diode and the focusing diode in the focusing module can rotate around the axis of the beam transmission channel so that the high-energy diffused electron beams of different blasts enter the target object from different planes and different angles and are focused on the target area within the target object.

14. The system according to any one of claims 8 to 13, characterized in that, The high-energy diffused electron beam includes a high-energy diffused electron beam generated by a laser plasma accelerator.

15. A radiotherapy device, characterized in that, include: Laser plasma accelerators are used to generate high-energy dissipation electron beams; And, the high-energy diffuse electron beam focusing scanning system as described in any one of claims 8 to 14.

16. The device according to claim 15, characterized in that, The high-energy diffused electron beam focusing scanning system is installed in the rotating gantry of the radiotherapy equipment, and the rotating gantry can rotate around the target object.

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