A high-temperature product precision positioning test system and method

Abstract

The application discloses a high-temperature product precision positioning test system and method, which comprises a carrier, a carrier positioning guide rod, a product positioning block, a positioning block spring, a positioning block guide rod, a test probe, a product ejector pin and a guide rod mounting plate, a main body bearing seat, a test circuit board and a probe mounting seat arranged in sequence from top to bottom, the test circuit board is electrically connected with the test probe, the carrier positioning guide rod extends into the positioning pin hole, the product ejector pin is in abutment with a product to be tested, the product positioning block is in abutment with the product to be tested, at this time, the lower end of the test probe is located below the product positioning block, and the test probe is in abutment with the pin of the product to be tested. The application not only improves the electrical test contact yield, but also avoids the pin deformation problem in the test process and the material clamping problem of the test mechanism.

Description

Technical Field

[0001] This invention relates to a high-temperature product precision positioning test system and method, belonging to the field of chip testing technology. Background Technology

[0002] Testing and inspecting TSSOP, MSOP, and SOP packaged products under high-temperature and special environments often reveals the following shortcomings during production testing due to their small size, narrow pin width, dense pin spacing, and large number of leads: 1. The electrical test probes are not properly positioned to contact the product's pins, resulting in a high failure rate.

[0003] 2. During the testing process of the pressing mechanism, the external force can easily cause pin deformation in the product.

[0004] 3. After the testing agency completes the test, the product may jam, causing test quality problems. Summary of the Invention

[0005] Purpose of the invention: In order to overcome the shortcomings of the existing technology, the present invention provides a high-temperature product precision positioning test system and method.

[0006] Technical solution: To achieve the above objectives, the technical solution adopted by this invention is as follows: A high-temperature product precision positioning testing system includes a carrier, a carrier positioning guide rod, a product positioning block, a positioning block spring, a positioning block guide rod, a test probe, a product ejector pin, and, from top to bottom, a guide rod mounting plate, a main bearing seat, a test circuit board, and a probe mounting seat. The test circuit board is electrically connected to the test probe. The carrier is used to place the product to be tested, and the carrier is provided with positioning pin holes.

[0007] The vehicle positioning guide rod passes through the test circuit board and the main bearing seat, and the top end of the vehicle positioning guide rod is fixedly connected to the guide rod mounting plate, while the lower end of the vehicle positioning guide rod is located below the main bearing seat.

[0008] The probe mounting base is fixedly mounted on the main bearing seat, and the test probe is fixedly mounted on the probe mounting base via a probe fixing block. The probe mounting base is equipped with a positioning block bearing; the lower end of the positioning block guide rod passes through the positioning block bearing and is fixedly connected to the product positioning block. The upper end of the positioning block spring abuts against the main bearing seat, and the lower end of the positioning block spring abuts against the product positioning block. The probe mounting base is provided with a ejector pin mounting hole, and an ejector pin spring is installed within the ejector pin mounting hole. The top end of the product ejector pin abuts against the ejector pin spring, and the lower end of the product ejector pin passes through the product positioning block and is located below the product positioning block.

[0009] When the main bearing seat moves downward to the first limit position, the carrier positioning guide rod extends into the positioning pin hole, the product ejector pin abuts against the product to be tested, the product ejector pin compresses the ejector pin spring to the first limit position one, the product positioning block abuts against the product to be tested, the product positioning block compresses the positioning block spring to the first limit position two, at this time the lower end of the test probe is located below the product positioning block, and the test probe abuts against the pin of the product to be tested.

[0010] Preferably, the device includes a tension adjusting bolt and a guide rod tensioning spring. The guide rod tensioning spring is sleeved on the tension adjusting bolt. The threaded section of the tension adjusting bolt is threadedly connected to the guide rod mounting plate, and the lower end of the threaded section of the tension adjusting bolt abuts against the main bearing seat. The upper end of the guide rod tensioning spring abuts against the tension adjusting bolt.

[0011] Preferably, the guide rod mounting plate is provided with a positioning detection block.

[0012] Preferably, the test circuit board is equipped with a quick-connect circuit connector.

[0013] Preferably, an insulating pad is provided between the test circuit board and the probe mounting base.

[0014] Preferably, a buffer pad is provided on the carrier positioning guide rod between the guide rod mounting plate and the main bearing seat.

[0015] Preferably, the vehicle positioning guide rod is slidably connected to the main bearing seat through a positioning outer bushing bearing and a positioning inner bushing bearing.

[0016] A method for precise positioning testing of high-temperature products, using the aforementioned high-temperature product precise positioning testing system, includes the following steps: Step 1: Place the product to be tested into the carrier.

[0017] Step 2: The main bearing seat moves downward, and the carrier positioning guide rod is inserted into the positioning pin hole to correct the carrier position.

[0018] Step 3: The main bearing seat continues to move downwards, and the carrier positioning guide rod continues to be inserted into the positioning pin hole to complete the correction of the carrier position. The lower end of the product ejector pin presses on the upper surface of the plastic seal of the product to be tested, and the product ejector pin compresses the ejector pin spring.

[0019] Step 4: The main bearing seat continues to move downwards, the product ejector pin continues to compress the ejector pin spring, the product positioning block presses on the upper surface of the plastic seal of the product to be tested, and the product positioning block compresses the positioning block spring.

[0020] Step 5: When the main bearing seat moves downward to the first limit position, the carrier positioning guide rod extends into the positioning pin hole, the product ejector pin presses on the upper surface of the plastic encapsulation of the product to be tested, the product ejector pin compresses the ejector pin spring to the first limit position one, the product positioning block presses on the upper surface of the plastic encapsulation of the product to be tested, the product positioning block compresses the positioning block spring to the first limit position two, at this time the lower end of the test probe is located below the product positioning block, the test probe abuts against the pin of the product to be tested, and the product to be tested is subjected to electrical testing.

[0021] Preferably, the insertion tension of the carrier positioning guide rod is adjusted by adjusting the tension adjusting bolt.

[0022] Compared with the prior art, the present invention has the following advantages: This invention first positions the carrier and then corrects the product position to achieve precise positioning and consistent repetition of each product. Then, it performs electrical tests on the product, ensuring that the electrical test probes are precisely aligned with the product pins. This not only improves the contact yield of electrical tests but also avoids pin deformation problems that are prone to occur during the testing process, and also avoids material jamming problems that are prone to occur in the testing mechanism. Attached Figure Description

[0023] Figure 1 This is a three-dimensional schematic diagram of the testing system of the present invention; Figure 2 This is a front view of the test system of the present invention; Figure 3 This is the left view of the present invention; Figure 4 for Figure 3 BB-direction sectional view in the middle; Figure 5 This is a schematic diagram of the exploded structure of the test system of the present invention; Figure 6 This is a schematic diagram of the test structure of the present invention; Figure 7 This is a flowchart of the testing method of the present invention. Detailed Implementation

[0024] The present invention will be further illustrated below with reference to the accompanying drawings and specific embodiments. It should be understood that these examples are for illustrative purposes only and are not intended to limit the scope of the invention. After reading this invention, any modifications of the invention in various equivalent forms by those skilled in the art will fall within the scope defined by the appended claims.

[0025] A high-temperature product precision positioning testing system, such as Figure 1-5As shown, it includes a carrier 6, a main bearing seat 11, a test circuit board 12, a circuit quick connector 14, an insulating pad 13, a positioning guide rod 21, a positioning outer bushing bearing 22, a positioning inner bushing bearing 23, a buffer pad 24, a guide rod mounting plate 25, a tension adjusting bolt 26, a guide rod tensioning spring 27, a positioning detection block 28, a product positioning block 31, a positioning block spring 32, a positioning block bearing 33, a positioning block guide rod 34, a probe mounting seat 41, a test probe 42, a probe fixing block 43, a product ejector pin 44, and an ejector pin spring 45.

[0026] The guide rod mounting plate 25, the main bearing seat 11, the test circuit board 12, the insulating pad 13, and the probe mounting seat 41 are arranged sequentially from top to bottom, and the test circuit board 12 is electrically connected to the test probe 42.

[0027] The carrier 6 is used to place the product to be tested. The carrier is designed with a molded lower surface of the plastic seal of the product to be tested facing upwards, which is used to limit the movement range of the product during production. At the same time, a pair of positioning pin holes 61 are designed on both sides of the positioning mold for the positioning guide rod 21 to accurately position the carrier.

[0028] The positioning guide rod 21 passes through the insulating pad 13, the test circuit board 12, and the main bearing seat 11 from bottom to top. The top end of the positioning guide rod 21 is fixedly connected to the guide rod mounting plate 25, while the lower end of the positioning guide rod 21 is located below the main bearing seat 11. The guide rod tension spring 27 is sleeved on the tension adjusting bolt 26. The threaded section of the tension adjusting bolt 26 is threadedly connected to the guide rod mounting plate 25. The upper end of the guide rod tension spring 27 abuts against the tension adjusting bolt 26, and the lower end of the guide rod tension spring 27 abuts against the guide rod mounting plate 25. The positioning guide rod 21 is slidably connected to the main bearing seat 11 via the positioning outer bushing bearing 22 and the positioning inner bushing bearing 23, allowing the positioning guide rod 21 to slide up and down with the main bearing seat 11. Therefore, the tension between the positioning guide rod 21 and the main bearing seat 11 can be adjusted by adjusting the tension adjusting bolt 26, so that when the positioning guide rod 21 is inserted into the positioning pin hole 61, the tension of the positioning pin hole 61 is convenient for positioning the carrier 6.

[0029] The probe mounting base 41 is fixedly mounted on the main bearing seat 11, and the test probe 42 is fixedly mounted on the probe mounting base 41 via a probe fixing block 43. The probe mounting base 41 is provided with a positioning block bearing 33. The lower end of the positioning block guide rod 34 passes through the positioning block bearing 33 and is fixedly connected to the product positioning block 31. The upper end of the positioning block spring 32 abuts against the main bearing seat 11, and the lower end of the positioning block spring 32 abuts against the product positioning block 31. The probe mounting base 41 is provided with a ejector pin mounting hole, in which an ejector pin spring 45 is installed. The top end of the product ejector pin 44 abuts against the ejector pin spring 45, and the lower end of the product ejector pin 44 passes through the product positioning block 31 and is located below the product positioning block 31.

[0030] When the main bearing housing 11 moves downward to the first extreme position, the carrier positioning guide rod 21 extends into the positioning pin hole 61, the product ejector pin 44 abuts against the product to be tested, the product ejector pin 44 compresses the ejector pin spring 45 to the first extreme position one, the product positioning block 31 abuts against the product to be tested, and the product positioning block 31 compresses the positioning block spring 32 to the first extreme position two. At this time, the lower end of the test probe 42 is located below the product positioning block 31, and the test probe 42 abuts against the pin 71 of the product to be tested 7. Through the secondary positioning of the product to be tested by the product ejector pin 44 and the product positioning block 31, the product to be tested 7 is kept fixed. When the main bearing housing 11 continues to move downward, the test probe 42 moves to align with the pin 71 until the test probe 42 abuts against the pin 71.

[0031] A quick-connector 14 is connected to the test circuit board 12. An insulating pad 13 is provided between the test circuit board 12 and the probe mounting base 41. A buffer pad 24 is provided on the carrier positioning guide rod 21 between the guide rod mounting plate 25 and the main bearing seat 11.

[0032] The external mechanism moves from top to bottom. First, the two positioning guide rods are inserted into the positioning pin holes of the carrier at the same time. Then, the ejector mechanism presses down on the upper surface of the product to prevent the product from moving. Next, the positioning mechanism uses the designed upper surface mold to correct the product position. Then, test probes are extended from the upper surface of each pin of the product to perform precise positioning tests.

[0033] A method for precise positioning testing of high-temperature products, such as Figure 6-7 As shown, the high-temperature product precision positioning test system described above includes the following steps: Step 1: Place the product 7 to be tested into the carrier 6. Adjust the insertion tension of the carrier positioning guide rod 21 by adjusting the tension adjusting bolt 26.

[0034] Step 2: The main bearing seat 11 moves downward, and the carrier positioning guide rod 21 is inserted into the positioning pin hole 61 to correct the position of the carrier.

[0035] Step 3: The main bearing seat 11 continues to move downward, and the carrier positioning guide rod 21 continues to be inserted into the positioning pin hole 61 to complete the correction of the carrier position. The lower end of the product ejector pin 44 presses on the upper surface of the plastic seal of the product to be tested, and the product ejector pin 44 compresses the ejector pin spring 45.

[0036] Step 4: The main bearing seat 11 continues to move downward, the product ejector pin 44 continues to compress the ejector pin spring 45, the product positioning block 31 presses on the upper surface of the plastic seal of the product to be tested, and the product positioning block 31 compresses the positioning block spring 32.

[0037] Step 5: When the main bearing seat 11 moves downward to the first limit position, the carrier positioning guide rod 21 extends into the positioning pin hole 61, the product ejector pin 44 presses on the upper surface of the plastic encapsulation of the product to be tested, the product ejector pin 44 compresses the ejector pin spring 45 to the first limit position one, the product positioning block 31 presses on the upper surface of the plastic encapsulation of the product to be tested, the product positioning block 31 compresses the positioning block spring 32 to the first limit position two, at this time the lower end of the test probe 42 is located below the product positioning block 31, the test probe 42 abuts against the pin 71 of the product to be tested, and the product to be tested 7 is subjected to electrical testing.

[0038] Step 6: After the electrical test of the product under test 7 is completed, the main bearing housing 11 moves upward and the test probe 42 leaves the pin 71 of the product under test 7.

[0039] Step 7: The main bearing seat 11 continues to move upward, and the positioning block spring 32 returns to its original position until the product positioning block 31 leaves the upper surface of the plastic seal of the product to be tested. Step 8: The main bearing seat 11 continues to move upward, and the ejector spring 45 returns to its original position until the product ejector pin 44 leaves the upper surface of the plastic seal of the product to be tested.

[0040] Step 9: The main bearing seat 11 continues to move upward, and the carrier positioning guide rod 21 is pulled out from the positioning pin hole 61 and leaves the carrier 6.

[0041] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A high-temperature product precision positioning testing system, characterized in that: The product includes a carrier (6), a carrier positioning guide rod (21), a product positioning block (31), a positioning block spring (32), a positioning block guide rod (34), a test probe (42), a product ejector pin (44), and a guide rod mounting plate (25), a main bearing seat (11), a test circuit board (12), and a probe mounting seat (41) arranged sequentially from top to bottom. The test circuit board (12) is electrically connected to the test probe (42). The carrier (6) is used to place the product to be tested, and the carrier (6) is provided with a positioning pin hole (61). The vehicle positioning guide rod (21) passes through the test circuit board (12) and the main bearing seat (11), and the top end of the vehicle positioning guide rod (21) is fixedly connected to the guide rod mounting plate (25), while the lower end of the vehicle positioning guide rod (21) is located below the main bearing seat (11). The probe mounting base (41) is fixedly mounted on the main bearing seat (11), and the test probe (42) is fixedly mounted on the probe mounting base (41) through the probe fixing block (43); the probe mounting base (41) is provided with a positioning block bearing (33), the lower end of the positioning block guide rod (34) passes through the positioning block bearing (33) and is fixedly connected to the product positioning block (31), the upper end of the positioning block spring (32) abuts against the main bearing seat (11), and the lower end of the positioning block spring (32) abuts against the product positioning block (31); the probe mounting base (41) is provided with a pin mounting hole, a pin spring (45) is provided in the pin mounting hole, and the top end of the product pin (44) abuts against the pin spring (45), and the lower end of the product pin (44) passes through the product positioning block (31) and is located below the product positioning block (31); When the main bearing seat (11) moves downward to the first limit position, the carrier positioning guide rod (21) extends into the positioning pin hole (61), the product ejector pin (44) abuts against the product to be tested, the product ejector pin (44) compresses the ejector pin spring (45) to the first limit position one, the product positioning block (31) abuts against the product to be tested, the product positioning block (31) compresses the positioning block spring (32) to the first limit position two, at this time the lower end of the test probe (42) is located below the product positioning block (31), the test probe (42) abuts against the pin of the product to be tested; through the secondary positioning of the product to be tested by the product ejector pin (44) and the product positioning block (31), the product to be tested (7) is kept fixed. When the main bearing seat (11) continues to move downward, the test probe (42) moves to the pin (71) until the test probe (42) abuts against the pin (71).

2. The high-temperature product precision positioning test system according to claim 1, characterized in that: Includes a tension adjusting bolt (26) and a guide rod tensioning spring (27). The guide rod tensioning spring (27) is sleeved on the tension adjusting bolt (26). The threaded section of the tension adjusting bolt (26) is threadedly connected to the guide rod mounting plate (25), and the lower end of the threaded section of the tension adjusting bolt (26) abuts against the main bearing seat (11), while the upper end of the guide rod tensioning spring (27) abuts against the tension adjusting bolt (26).

3. The high-temperature product precision positioning test system according to claim 1, characterized in that: The guide rod mounting plate (25) is provided with a positioning detection block (28).

4. The high-temperature product precision positioning test system according to claim 1, characterized in that: The test circuit board (12) is connected to a circuit quick connector (14).

5. The high-temperature product precision positioning test system according to claim 1, characterized in that: An insulating pad (13) is provided between the test circuit board (12) and the probe mounting base (41).

6. The high-temperature product precision positioning test system according to claim 1, characterized in that: A buffer pad (24) is provided on the carrier positioning guide rod (21) between the guide rod mounting plate (25) and the main bearing seat (11).

7. The high-temperature product precision positioning test system according to claim 1, characterized in that: The vehicle positioning guide rod (21) is slidably connected to the main bearing seat (11) through the positioning outer bushing bearing (22) and the positioning inner bushing bearing (23).

8. A method for precise positioning testing of high-temperature products, characterized in that, The high-temperature product precision positioning test system according to claim 1 includes the following steps: Step 1: Place the product to be tested into the carrier; Step 2: The main bearing seat (11) moves downward and the carrier positioning guide rod (21) is inserted into the positioning pin hole (61) to correct the position of the carrier; Step 3, the main bearing seat (11) continues to move downward, the carrier positioning guide rod (21) continues to be inserted into the positioning pin hole (61) to complete the correction of the carrier position, the lower end of the product ejector pin (44) presses on the upper surface of the plastic seal of the product to be tested, and the product ejector pin (44) compresses the ejector pin spring (45). Step 4, the main bearing seat (11) continues to move downward, the product ejector pin (44) continues to compress the ejector pin spring (45), the product positioning block (31) presses on the upper surface of the plastic seal of the product to be tested, and the product positioning block (31) compresses the positioning block spring (32). Step 5: When the main bearing seat (11) moves downward to the first limit position, the carrier positioning guide rod (21) extends into the positioning pin hole (61), the product ejector pin (44) presses on the upper surface of the plastic encapsulation of the product to be tested, the product ejector pin (44) compresses the ejector pin spring (45) to the first limit position one, the product positioning block (31) presses on the upper surface of the plastic encapsulation of the product to be tested, the product positioning block (31) compresses the positioning block spring (32) to the first limit position two, at this time the lower end of the test probe (42) is located below the product positioning block (31), the test probe (42) abuts against the pin of the product to be tested, and the product to be tested is subjected to electrical testing.

9. The method for precise positioning testing of high-temperature products according to claim 8, characterized in that: The insertion tension of the vehicle positioning guide rod (21) is adjusted by adjusting the tension adjusting bolt (26).

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