Detection device and test apparatus having the same

Abstract

The application discloses a detection device and test equipment with the same. The detection device comprises a mounting frame and at least two groups of test components. The test components are arranged on the mounting frame. The test components comprise a driving mechanism and a test mechanism. The driving mechanism is connected with the test mechanism to drive the test mechanism to move away from or approach a to-be-tested member. The test mechanism comprises a probe component. The probe component comprises a first probe and a second probe which are electrically connected. The first probe is a signal probe. The second probe is a ground probe or a signal probe. The types of the second probes of any two groups of test components are the same or different. According to the detection device, the type of the second probe can be flexibly selected according to the detection requirement of the to-be-tested member, so that the detection efficiency of the detection device on the to-be-tested member is improved.

Description

Technical Field

[0001] This invention relates to the field of printed circuit board testing technology, and in particular to a testing device and testing equipment having the same. Background Technology

[0002] With the continuous advancement of communication technology and increasingly higher communication speeds, more and more users are demanding impedance control and signal frequency regulation for PCB traces. Impedance testing typically includes single-ended impedance testing and differential impedance testing. Single-ended impedance testing is generally performed using a single-ended impedance probe assembly, while differential impedance testing is typically performed using a differential impedance probe assembly. A single-ended impedance probe assembly usually includes one signal probe and one ground probe, while a differential impedance probe assembly typically includes two signal probes. In related technologies, the testing device can only test one type of impedance—single-ended impedance or differential impedance—at a time, resulting in low PCB testing efficiency. Summary of the Invention

[0003] This invention proposes a detection device that has the advantage of high detection efficiency.

[0004] The present invention also proposes a testing device having the above-mentioned detection apparatus.

[0005] According to an embodiment of the present invention, a detection device includes: a mounting frame; at least two sets of test components, the test components being disposed on the mounting frame, each test component including a driving mechanism and a test mechanism, the driving mechanism being connected to the test mechanism to drive the test mechanism away from or towards the device under test, the test mechanism including a probe assembly, the probe assembly including a first probe and a second probe electrically connected, the first probe being a signal probe, the second probe being a ground probe or a signal probe, and the second probes of any two sets of the test components being of the same or different types.

[0006] The detection device according to an embodiment of the present invention includes at least two sets of test components. The test components include a driving mechanism and a testing mechanism. The test includes a probe assembly, which includes a first probe and a second probe. The first probe is a signal probe, and the second probe is a ground probe or a signal probe. The types of the second probes of any two sets of test components are the same or different, so that the detection device can flexibly select the type of the second probe according to the detection requirements of the device under test, thereby improving the detection efficiency of the detection device for the device under test.

[0007] According to some embodiments of the present invention, the testing mechanism includes: a base disposed on the mounting frame, a driving mechanism connected to the base to drive the base to slide along a first direction; the probe assembly includes a probe holder disposed on the base, and the first probe and the second probe are both disposed on the probe holder.

[0008] According to some embodiments of the present invention, the mounting bracket is provided with a first slide rail extending along a first direction, and the base is provided with a first slider that slides in cooperation with the first slide rail.

[0009] According to some embodiments of the present invention, the testing mechanism further includes a slide and an adjustment mechanism disposed on the base, the probe holder includes a first sub-probe holder and a second sub-probe holder arranged along a second direction, the first sub-probe holder is disposed on the base, the second sub-probe holder is disposed on the slide, and the adjustment mechanism is connected to the slide to drive the slide to slide along the second direction, the second direction being perpendicular to the first direction.

[0010] According to some embodiments of the present invention, the base is provided with a second slide rail extending along the second direction, and the slide block is provided with a second slider that slides in cooperation with the second slide rail.

[0011] According to some embodiments of the present invention, the base includes a main body and a first connecting arm connected along the first direction, the driving mechanism is connected to the main body, the adjusting mechanism and the second slide rail are both disposed on the main body and arranged along the second direction, the first sub-probe holder is connected to the first connecting arm through a first buffer elastic member, the slide includes a seat body and a second connecting arm connected along the first direction, the adjusting mechanism is connected to the seat body, and the second sub-probe holder is connected to the second connecting arm through a second buffer elastic member.

[0012] According to some embodiments of the present invention, the first buffer elastic member includes: a first pad and a second pad disposed opposite to each other and spaced apart along a third direction, the first pad being disposed on the first connecting arm and the second pad being disposed on the first sub-probe holder; a plurality of first connecting blocks, the plurality of first connecting blocks being spaced apart and disposed between the first pad and the second pad, one end of each first connecting block being connected to the first pad and the other end of each first connecting block being connected to the second pad, the third direction being perpendicular to the first direction and perpendicular to the second direction; the second buffer elastic member includes: a third pad and a fourth pad disposed opposite to each other and spaced apart along the third direction, the third pad being disposed on the second connecting arm and the fourth pad being disposed on the second sub-probe holder; a plurality of second connecting blocks, the plurality of second connecting blocks being spaced apart and disposed between the third pad and the fourth pad, one end of each second connecting block being connected to the third pad and the other end of each second connecting block being connected to the fourth pad.

[0013] According to some embodiments of the present invention, the testing mechanism further includes a distance sensor and a sensing block. The distance sensor is provided on both the first connecting arm and the second connecting arm, and the sensing block is provided on both the first sub-probe holder and the second sub-probe holder. The distance sensor on the first connecting arm cooperates with the sensing block on the first sub-probe holder to monitor the position of the first sub-probe holder, and the distance sensor on the second connecting arm cooperates with the sensing block on the second sub-probe holder to monitor the position of the second sub-probe holder.

[0014] According to some embodiments of the present invention, the base is provided with a support block, the slide is provided with a limiting plate, the limiting plate and the support block are arranged opposite to each other in the second direction, the adjusting mechanism is located on the side of the support block away from the limiting plate, the output end of the adjusting mechanism passes through the support block and is connected to the limiting plate, and at least one of the surfaces of the limiting plate and the support block facing each other is provided with a buffer.

[0015] According to some embodiments of the present invention, the adjusting mechanism is a linear motor or an electric cylinder.

[0016] According to some embodiments of the present invention, the mounting bracket is further provided with limit sensors for detecting the position of the base, the limit sensors being disposed on both sides of the base along a second direction, the second direction being perpendicular to the first direction.

[0017] According to some embodiments of the present invention, the test components are in two sets and are respectively disposed on opposite sides of the mounting bracket along a third direction, the third direction being perpendicular to the first direction.

[0018] According to some embodiments of the present invention, the driving mechanism is a belt drive mechanism or a linear motor, wherein the belt drive mechanism includes a drive motor, a belt and an idler pulley, the drive motor is disposed at one end of the mounting frame along the first direction, the idler pulley is disposed at the other end of the mounting frame along the first direction, the belt is respectively wound around the output end of the drive motor and the idler pulley, and the base is connected to the belt.

[0019] According to some embodiments of the present invention, the belts of the two sets of drive mechanisms are located on opposite sides of the mounting frame along a second direction, which is perpendicular to the first direction.

[0020] According to some embodiments of the present invention, the detection device further includes: an image acquisition module for acquiring the location of detection points on the test piece, the image acquisition module being disposed on one side of the mounting frame and located on the same side of the two sets of test components.

[0021] According to some embodiments of the present invention, the detection device further includes: a rotary drive module, the mounting bracket including a connector and a plate, the connector being used to dock with the rotary drive module, the plate having a first mounting surface and a second mounting surface disposed opposite to each other, two sets of the test components being respectively mounted on the first mounting surface and the second mounting surface, the connector being disc-shaped, the connector having a through hole for passing a wire harness, and the plate having a clearance hole for avoiding the drive mechanism.

[0022] According to some embodiments of the present invention, the detection device further includes a mounting base, which is a hollow frame structure with an internal space for mounting the rotary drive module. The rotary drive module is a hollow reducer, which includes a housing and a motor disposed on one side of the housing. The housing has a hollow portion that communicates with the through hole and the clearance hole.

[0023] The testing equipment according to an embodiment of the present invention includes: the above-described detection device.

[0024] The testing device according to an embodiment of the present invention includes at least two sets of testing components. The testing components include a driving mechanism and a testing mechanism. The testing includes a probe assembly, which includes a first probe and a second probe. The first probe is a signal probe, and the second probe is a ground probe or a signal probe. The types of the second probes of any two sets of testing components are the same or different, so that the testing device can flexibly select the type of the second probe according to the testing requirements of the device under test, thereby improving the testing efficiency of the testing device for the device under test.

[0025] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0026] Figure 1 This is a schematic diagram of the detection device according to an embodiment of the present invention;

[0027] Figure 2 This is a schematic diagram of the detection device according to an embodiment of the present invention from another angle;

[0028] Figure 3 yes Figure 2 Enlarged view of region A in the middle;

[0029] Figure 4 This is a schematic diagram of the testing mechanism and mounting frame of the detection device according to an embodiment of the present invention;

[0030] Figure 5 This is a schematic diagram of the testing mechanism and mounting bracket of the testing device according to an embodiment of the present invention from another angle;

[0031] Figure 6 This is a schematic diagram of the mounting bracket, chassis, slide, and probe holder of the detection device according to an embodiment of the present invention;

[0032] Figure 7 This is a schematic diagram of the chassis and first sub-probe holder of the detection device according to an embodiment of the present invention;

[0033] Figure 8 This is a schematic diagram of the chassis and first sub-probe holder of the detection device according to an embodiment of the present invention from another angle;

[0034] Figure 9 This is a schematic diagram of the slide, the second sub-probe holder, and the second probe of the detection device according to an embodiment of the present invention;

[0035] Figure 10 This is a schematic diagram of the structure of the slide of the detection device according to an embodiment of the present invention;

[0036] Figure 11 This is a schematic diagram of the structure of the first buffer elastic element (second buffer elastic element) of the detection device according to an embodiment of the present invention;

[0037] Figure 12 This is a schematic diagram of the mounting bracket of the detection device according to an embodiment of the present invention;

[0038] Figure 13 This is a schematic diagram of the structure of the rotation drive module of the detection device according to an embodiment of the present invention.

[0039] Figure label:

[0040] Detection device 100;

[0041] Mounting bracket 1; First slide rail 11; Limit sensor 12; Connector 13; Through hole 131; Plate 14; First mounting surface 141; Second mounting surface 142; Clearance hole 143;

[0042] Test Component 2;

[0043] Drive mechanism 3; belt drive mechanism 31; drive motor 311; belt 312; idler pulley 313;

[0044] Testing facility 4;

[0045] Probe assembly 41; First probe 411; Second probe 412; Probe holder 413; First sub-probe holder 4131;

[0046] Second probe holder 4132; Conductor 414;

[0047] Base 42; First slider 421; Second slide rail 422; Main body 423; First connecting arm 424;

[0048] Support block 425;

[0049] Slide 43; Second slider 431; Seat 432; Second connecting arm 433; Adjustment mechanism 434;

[0050] Limiting plate 435; Buffer component 436;

[0051] First buffer elastic element 44; First pad 441; Second pad 442; First connecting block 443;

[0052] Second buffer elastic element 45; Third pad 451; Fourth pad 452; Second connecting block 453;

[0053] Distance sensor 46;

[0054] Sensor block 47;

[0055] Rotary drive module 5; housing 51; hollow part 511; motor 52;

[0056] Mounting base 6; Image acquisition module 7; First direction S1; Second direction S2; Third direction S3. Detailed Implementation

[0057] Embodiments of the present invention are described in detail below. Examples of these embodiments are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0058] The following disclosure provides numerous different embodiments or examples for implementing various structures of the invention. To simplify the disclosure, specific examples of components and arrangements are described below. These are merely examples and are not intended to limit the invention. Furthermore, reference numerals and / or letters may be repeated in different examples. Such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. Additionally, examples of various specific processes and materials are provided in this invention; however, those skilled in the art will recognize the applicability of other processes and / or the use of other materials.

[0059] The detection apparatus 100 according to an embodiment of the present invention will now be described with reference to the accompanying drawings.

[0060] like Figures 1-3As shown, the detection device 100 according to an embodiment of the present invention includes: a mounting frame 1 and at least two sets of test components 2. That is, the number of test components 2 is not less than two sets, and can be two, three, four, etc., without specific limitation. The test components 2 are mounted on the mounting frame 1, and each test component 2 includes a drive mechanism 3 and a test mechanism 4. The drive mechanism 3 is connected to the test mechanism 4 to drive the test mechanism 4 away from or towards the test object. Specifically, the drive mechanism 3 can drive the test mechanism 4 to move towards the test object until the test mechanism 4 can detect the data of the test object; at this time, the test mechanism 4 is in a detection state. After detection, the drive mechanism 3 can drive the test mechanism 4 to move away from the test object to avoid interference between the test object and the test components 2, and to facilitate the handling of the test object; at this time, the test mechanism 4 is in a standby state. Therefore, the automation level of the detection device 100 in detecting the test object can be significantly improved, and the safety is high.

[0061] Furthermore, the testing mechanism 4 includes a probe assembly 41, which includes a first probe 411 and a second probe 412 that are electrically connected. That is, when the testing mechanism 4 is in the detection state, both the first probe 411 and the second probe 412 are in contact with corresponding detection points on the test piece, and the first probe 411 and the second probe 412 are electrically connected to each other (e.g., ...). Figure 4 As shown, the first probe 411 and the second probe 412 can be connected by a conductor 414, so that the first probe 411 and the second probe 412 can acquire data information between the two detection points.

[0062] The first probe 411 is a signal probe, and the second probe 412 is a ground probe or a signal probe. Specifically, the probe assembly 41 can be a combination of the first probe 411 being a signal probe and the second probe 412 being a ground probe, so that the test assembly 2 can detect the single-ended impedance of the device under test (such as a printed circuit board) through the first probe 411 and the second probe 412; the probe assembly 41 can also be a combination of the first probe 411 and the second probe 412 being both signal probes, so that the test assembly 2 can detect the differential impedance of the device under test (such as a printed circuit board) through the first probe 411 and the second probe 412.

[0063] In this test, the second probes 412 of any two sets of test components 2 may be of the same or different types. Specifically, the second probes 412 of any two sets of test components 2 may be of the same type. For example, the second probes 412 of multiple sets of test components 2 may all be ground probes, so that multiple sets of test components 2 can detect the single-ended impedance of the device under test. Of course, the second probes 412 of multiple sets of test components 2 may all be signal probes, so that multiple sets of test components 2 can detect the differential impedance of the device under test. Alternatively, the second probes 412 of any two sets of test components 2 may be of different types. For example, the second probes 412 of one set of test components 2 may be ground probes to detect the single-ended impedance of the device under test through this set of test components 2, and the second probes 412 of the other set of test components 2 may be signal probes to detect the differential impedance of the device under test through this set of test components 2. That is, the detection device 100 can simultaneously detect the single-ended impedance and differential impedance of the device under test.

[0064] In other words, when only the single-ended impedance of the device under test (DUT) (such as a printed circuit board) needs to be detected, all the second probes 412 of the test assembly 2 can be set as ground probes; when only the differential impedance of the DUT needs to be detected, all the second probes 412 of the test assembly 2 can be set as signal probes; when both the single-ended impedance and differential impedance of the DUT need to be detected simultaneously, some of the second probes 412 can be set as signal probes, and the rest can be set as ground probes. This allows the testing device 100 to flexibly select the type of second probe 412 according to the testing requirements of the DUT, thereby improving the testing efficiency of the testing device 100 and providing strong applicability.

[0065] The detection device 100 according to an embodiment of the present invention includes at least two sets of test components 2. The test components 2 include a driving mechanism 3 and a test mechanism 4. The test includes a probe component 41. The probe component 41 includes a first probe 411 and a second probe 412. The first probe 411 is a signal probe, and the second probe 412 is a ground probe or a signal probe. The second probes 412 of any two sets of test components 2 may be of the same or different types, so that the detection device 100 can flexibly select the type of the second probe 412 according to the detection requirements of the device under test, thereby improving the detection efficiency of the detection device 100 in detecting the device under test.

[0066] According to some embodiments of the present invention, reference Figures 4-6 The testing mechanism 4 also includes: a base 42 disposed on the mounting frame 1, a driving mechanism 3 connected to the base 42 to drive the base 42 to slide along the first direction S1, and a probe assembly 41 including a probe holder 413 disposed on the base 42, and a first probe 411 and a second probe 412 both disposed on the probe holder 413.

[0067] In other words, the base 42 is slidably mounted on the mounting frame 1 along the first direction S1, so that the driving mechanism 3 can drive the base 42 to slide away from or near the test piece on the mounting frame 1, thereby moving the probe holder 413 away from or near the test piece, and simultaneously moving the first probe 411 and the second probe 412 away from or near the test piece. This effectively maintains the consistency of movement of the first probe 411 and the second probe 412, which helps improve the detection accuracy of the detection device 100.

[0068] Optionally, the mounting bracket 1 is provided with a first slide rail 11 extending along the first direction S1, and the base 42 is provided with a first slider 421 that slides in cooperation with the first slide rail 11 (see reference). Figure 8 In other words, the base 42 and the mounting bracket 1 are slidably connected through the cooperation of the first slider 421 and the first slide rail 11. The first slider 421 is disposed on the first slide rail 11 and can slide along the first direction S1 on the first slide rail 11. In other words, the first slide rail 11 can effectively restrict the sliding direction of the first slider 421. Thus, by restricting the sliding direction of the second slider 431 by the first slide rail 11, the sliding direction of the base 42 is restricted, ensuring that the first probe 411 and the second probe 412 can approach or move away from the test piece along a preset angle, i.e., the first direction S1, which is beneficial to improving the detection accuracy of the detection device 100.

[0069] Optionally, refer to Figures 4-6 The testing mechanism 4 also includes a slide 43 and an adjustment mechanism 434 disposed on the base 42. The probe holder 413 includes a first sub-probe holder 4131 and a second sub-probe holder 4132 arranged along the second direction S2. The first sub-probe holder 4131 is disposed on the base 42, and the second sub-probe holder 4132 is disposed on the slide 43. The adjustment mechanism 434 is connected to the slide 43 to drive the slide 43 to slide along the second direction S2, which is perpendicular to the first direction S1. That is, the slide 43 is slidably disposed on the base 42 along the second direction S2. Thus, under the drive of the adjustment mechanism 434, as the slide 43 slides relative to the base 42, it drives the second sub-probe holder 4132 to move closer to or away from the first sub-probe holder 4131 in the second direction S2. This, in turn, can drive the second probe 412 to move closer to or away from the second probe 412 in the second direction S2, thereby adjusting the distance between the first probe 411 and the second probe 412 in the second direction S2. Therefore, the detection device 100 can flexibly adjust the distance between the first probe 411 and the second probe 412 according to the distance between the detection points. That is, the detection device 100 can be applied to detection operations where there are multiple distances between the detection points, which helps to improve the applicability of the detection device 100 and has high detection performance of the test piece.

[0070] Further optional, refer to Figures 7-10The base 42 is provided with a second slide rail 422 extending along the second direction S2, and the slide block 43 is provided with a second slider 431 that slides in cooperation with the second slide rail 422. That is, the slide block 43 and the base 42 are slidably connected through the cooperation of the second slider 431 and the second slide rail 422. The second slider 431 is located on the second slide rail 422 and can slide along the second direction S2 on the second slide rail 422. In other words, the second slide rail 422 can effectively restrict the sliding direction of the second slider 431. Therefore, by restricting the sliding direction of the second slider 431 by the second slide rail 422, the sliding direction of the slide block 43 is restricted, thereby allowing the second probe 412 to approach or move away from the first probe 411 along a preset angle, i.e., the second direction S2, which helps to improve the detection accuracy of the detection device 100.

[0071] Further optional, refer to Figure 7 and Figure 8 The base 42 includes a main body 423 and a first connecting arm 424 connected along the first direction S1. The drive mechanism 3 is connected to the main body 423. The adjustment mechanism 434 and the second slide rail 422 are both located on the main body 423 and arranged along the second direction S2. The first sub-probe holder 4131 is connected to the first connecting arm 424 through a first buffer elastic member 44. That is, the main body 423 is slidably mounted on the mounting frame 1 along the first direction S1. The drive mechanism 3 can drive the main body 423 to slide relative to the mounting frame 1, thereby driving the first connecting arm 424, the first sub-probe holder 4131, and the first probe 411 on the first sub-probe holder 4131 to approach or move away from the test piece. When the first probe 411 contacts the test piece, the first buffer elastic member 44 can effectively buffer the interaction force between the first probe 411 and the test piece through elastic deformation, thereby avoiding damage caused by mutual compression and deformation of the first probe 411 and the test piece, which helps to improve the reliability of the detection device 100.

[0072] In addition, refer to Figure 9 and Figure 10 The slide 43 includes a base 432 and a second connecting arm 433 connected along the first direction S1. An adjustment mechanism 434 is connected to the base 432, and the second sub-probe holder 4132 is connected to the second connecting arm 433 via a second buffer elastic member 45. That is, the base 432 is slidably disposed on the base 42 along the second direction S2. When the driving mechanism 3 drives the first probe 411 to approach or move away from the test piece, it simultaneously drives the second probe 412 to approach or move away from the test piece. When the second probe 412 contacts the test piece, the second buffer elastic member 45 can effectively buffer the interaction force between the second probe 412 and the test piece through elastic deformation, avoiding damage caused by mutual compression deformation between the second probe 412 and the test piece, which helps to improve the reliability of the detection device 100.

[0073] Further, refer to Figure 11 The first buffer elastic element 44 includes: a first pad 441, a second pad 442, and a plurality of first connecting blocks 443, which are arranged opposite to each other and spaced apart along a third direction S3. The first pad 441 is disposed on the first connecting arm 424, and the second pad 442 is disposed on the first sub-probe holder 4131. That is, the first sub-probe holder 4131 and the first connecting arm 424 are partially opposite to each other along the third direction S3, and the opposite portions of the first sub-probe holder 4131 and the first connecting arm 424 can be connected by the first buffer elastic element 44. Therefore, the connection area between the first sub-probe holder 4131 and the first connecting arm 424 and the first buffer elastic element 44 can be improved, thereby improving the connection strength between the first sub-probe holder 4131 and the first connecting arm 424 and the first buffer elastic element 44.

[0074] Furthermore, multiple first connecting blocks 443 are spaced apart between the first pad 441 and the second pad 442. One end of each first connecting block 443 is connected to the first pad 441, and the other end of each first connecting block 443 is connected to the second pad 442. The third direction S3 is perpendicular to the first direction S1 and perpendicular to the second direction S2. Thus, while ensuring the connection strength between the first pad 441 and the second pad 442, a certain relative movement can be generated between the first pad 441 and the second pad 442. For example, when the first probe 411 approaches the test piece vertically downward and comes into contact with it, the pushing force of the test piece on the first probe 411 causes the first sub-probe holder 4131 to push the second pad 442 upward relative to the first pad 441, thereby buffering the interaction force between the first probe 411 and the test piece. In addition, it is understood that the detection device 100 usually needs to perform high-frequency detection. Therefore, multiple first connecting blocks 443 can better extend the service life of the first buffer elastic element 44, thereby improving the reliability of the detection device 100.

[0075] The second buffer elastic member 45 includes a third pad 451, a fourth pad 452, and a plurality of second connecting blocks 453 spaced apart along a third direction S3. The third pad 451 is disposed on the second connecting arm 433, and the fourth pad 452 is disposed on the second sub-probe holder 4132. That is, the second sub-probe holder 4132 and the second connecting arm 433 are partially opposite each other along the third direction S3, and the opposite portions of the second sub-probe holder 4132 and the second connecting arm 433 can be connected by the second buffer elastic member 45. Therefore, the connection area between the second sub-probe holder 4132 and the second connecting arm 433 and the second buffer elastic member 45 can be significantly increased, thereby improving the connection strength between the second sub-probe holder 4132 and the second connecting arm 433 and the second buffer elastic member 45.

[0076] Furthermore, multiple second connecting blocks 453 are spaced apart between the third pad 451 and the fourth pad 452. One end of each second connecting block 453 is connected to the third pad 451, and the other end of each second connecting block 453 is connected to the fourth pad 452. This ensures the connection strength between the first pad 441 and the second pad 442 while allowing for a certain relative movement between them. For example, when the second probe 412 approaches the test piece vertically downwards and contacts it, the thrust of the test piece on the second probe 412 causes the second sub-probe holder 4132 to push the fourth pad 452 upwards relative to the third pad 451, thus buffering the interaction force between the second probe 412 and the test piece. Moreover, it is understood that the detection device 100 typically requires high-frequency detection; therefore, the multiple second connecting blocks 453 can effectively extend the service life of the second buffer elastic member 45, thereby improving the reliability of the detection device 100.

[0077] According to some embodiments of the present invention, reference Figure 4 and Figure 5 The testing mechanism 4 also includes a distance sensor 46 and a sensing block 47. The first connecting arm 424 and the second connecting arm 433 are both equipped with distance sensors 46, and the first sub-probe holder 4131 and the second sub-probe holder 4132 are both equipped with sensing blocks 47. The distance sensor 46 on the first connecting arm 424 cooperates with the sensing block 47 on the first sub-probe holder 4131 to monitor the position of the first sub-probe holder 4131, and the distance sensor 46 on the second connecting arm 433 cooperates with the sensing block 47 on the second sub-probe holder 4132 to monitor the position of the second sub-probe holder 4132.

[0078] In other words, the distance sensor 46 is located on the side of the sensing block 47 away from the test piece. When the first probe 411 moves toward the test piece and comes into contact with it, the pushing force of the test piece on the first probe 411 causes the first sub-probe holder 4131 to press the first buffer elastic member 44 and move away from the test piece, thereby causing the sensing block 47 to move toward the distance sensor 46. Thus, by obtaining the distance between the distance sensor 46 and the sensing block 47, it can be determined whether the first sub-probe holder 4131 has moved away from the test piece, and further, whether the first probe 411 is in full contact with the test piece. That is, when the distance sensor 46 detects a shortening of the distance between itself and the sensing block 47, the first probe 411 is in full contact with the test piece. Furthermore, the cooperation method between the distance sensor 46 on the second connecting arm 433 and the sensing block 47 on the second sub-probe holder 4132 is the same as that between the distance sensor 46 on the first connecting arm 424 and the sensing block 47 on the first sub-probe holder 4131, and will not be repeated here.

[0079] Therefore, when both the first probe 411 and the second probe 412 are in full contact with the device under test, the probe assembly 41 can stably acquire signals, thereby avoiding misjudgments or mismeasurements by the detection device 100 due to unstable contact between the first probe 411 or the second probe 412 and the device under test, thus improving the reliability of the detection device 100. Simultaneously, when the distance sensor 46 detects a change in the distance to the sensing block 47, it determines that the first probe 411 and the second probe 412 have contacted the device under test, sends a signal to the control system, and the control system immediately stops driving the first probe 411 and the second probe 412 to continue moving towards the device under test.

[0080] According to some embodiments of the present invention, reference Figure 6 , Figure 7 and Figure 9 The base 42 is provided with a support block 425, and the slide 43 is provided with a limiting plate 435. The limiting plate 435 and the support block 425 are arranged opposite each other in the second direction S2. The adjustment mechanism 434 is located on the side of the support block 425 away from the limiting plate 435. The output end of the adjustment mechanism 434 passes through the support block 425 and is connected to the limiting plate 435. That is, the adjustment mechanism 434 can drive the limiting plate 435 to approach or move away from the support block 425 in the second direction S2. As a result, the support block 425 can effectively limit the extreme position of the limiting plate 435 moving toward the support block 425 in the second direction S2, thereby effectively limiting the distance between the first sub-probe holder 4131 and the second sub-probe holder 4132 in the second direction S2. This can prevent the first probe 411 and the second probe 412 from colliding and being damaged when they move close to each other in the second direction S2, thus improving the reliability of the detection device 100.

[0081] Furthermore, the support block 425 can effectively reduce the installation and positioning difficulty of the adjustment mechanism 434, improve the assembly efficiency of the testing mechanism 4, and enhance the connection stability between the adjustment mechanism 434 and the base 42. Further, a buffer member 436 is provided on at least one of the surfaces of the limiting plate 435 and the support block 425 facing each other. That is, the buffer member 436 can be provided on only one of the surfaces of the limiting plate 435 and the support block 425 facing each other, or it can be provided on both surfaces. Thus, the buffer member 436 can effectively separate the support block 425 and the limiting plate 435, thereby preventing collision wear caused by hard contact between the support block 425 and the limiting plate 435. In addition, the buffer member 436 can effectively buffer the impact force during relative movement between the support block 425 and the limiting plate 435, thereby suppressing vibrations caused by collisions and improving the stability of the testing device 100.

[0082] According to some embodiments of the present invention, the adjusting mechanism 434 is a lead screw feed mechanism or an electric cylinder. In a specific example, such as Figure 4 As shown, the adjusting mechanism 434 is a lead screw feed mechanism, which includes a rotary motor and a lead screw assembly. The lead screw assembly is driven and connected to the output shaft of the motor. The lead screw passes through a slide block 43, which is slidably mounted on the base 42 along the second direction S2. Thus, the output shaft of the rotary motor drives the lead screw to rotate, thereby causing the slide block 43 to slide on the chassis along the second direction S2. Of course, the adjusting mechanism 434 can also be an electric cylinder. The output end of the electric cylinder is connected to the slide block 43, thereby driving the slide block 43 to perform linear motion, making the adjusting mechanism 434 simpler and the driving method more direct.

[0083] According to some embodiments of the present invention, reference Figure 1 and Figure 3 The mounting bracket 1 is also equipped with limit sensors 12 for detecting the position of the base 42. The limit sensors 12 are located on both sides of the base 42 along the second direction S2. The position of the base 42 refers to its position relative to the mounting base 6 in the first direction S1. Therefore, by detecting the position of the base 42 through the limit sensors 12, the position of the probe assembly 41 can be obtained more effectively, so that the detection device 100 can perform corresponding operations. In addition, interference between the limit sensors 12 and the sliding test mechanism 4 can be better avoided, thereby improving the stability of the detection device 100.

[0084] Specifically, when the probe assembly 41 is in standby mode, the position of the base 42 can be set as the first position. When the limit sensor 12 detects that the base 42 is in the first position, it is determined that the test assembly 2 to which the base 42 belongs is in standby mode. This allows the test assembly 4 to be driven by the drive mechanism 3 of this assembly to perform the test on the workpiece when testing is required. Furthermore, the maximum moving distance of the base 42 toward the workpiece can be set as the second position. When the limit sensor 12 detects that the base 42 is in the second position, the drive mechanism 3 stops to prevent the probe assembly 41 from moving excessively, thereby improving the reliability of the testing device 100.

[0085] According to some embodiments of the present invention, the test components 2 are in two sets and are respectively disposed on opposite sides of the mounting frame 1 along a third direction S3, wherein the third direction S3 is perpendicular to the first direction S1. That is, one set of test components 2 is installed on one side of the mounting frame 1 along the second direction S2, and the other set of test components 2 is installed on the other side of the mounting frame 1 along the second direction S2, making the overall layout of the detection device 100 more symmetrical and reasonable. At the same time, it can better avoid the risk of movement of the two sets of test components 2 and interference during the detection process, thereby improving the stability of the detection device 100.

[0086] In addition, the second probes 412 of the two sets of test components 2 can be set to different types, that is, the second probes 412 of one set of test components 2 are signal probes and the second probes 412 of the other set of test components 2 are ground probes, so that the detection device 100 can detect the single-ended impedance of the device under test and also detect the differential impedance of the device under test, which helps to improve the detection efficiency of the detection device 100.

[0087] According to some embodiments of the present invention, the drive mechanism 3 is a belt drive mechanism 31 or a linear motor to improve the stability of the drive mechanism 3 driving the base 42. The belt drive mechanism 31 includes a drive motor 311, a belt 312, and an idler pulley 313. The drive motor 311 is located at one end of the mounting frame 1 along the first direction S1, and the idler pulley 313 is located at the other end of the mounting frame 1 along the first direction S1. The belt 312 is wound around the output shaft of the drive motor 311 and the idler pulley 313, respectively. The base 42 is connected to the belt 312. That is, the output end of the drive motor 311 is connected to the idler pulley 313 via the belt 312, which can better ensure the stability of the belt 312 during rotation. When the output shaft of the drive motor 311 rotates, it drives the belt 312 to rotate on the output shaft and the idler pulley 313, causing the base 42 to move synchronously with the rotation of the belt 312. Therefore, the stability of the drive mechanism 3 can be significantly improved, thereby enhancing the movement accuracy of the probe assembly 41.

[0088] Specifically, such as Figure 2 and Figure 3 As shown, the base 42 is slidably mounted on the mounting bracket 1 along the first direction S1. When the output shaft of the drive motor 311 rotates counterclockwise, the belt 312 rotates counterclockwise along the output shaft of the drive motor 311 and the idler pulley 313, causing the connection position between the belt 312 and the base 42 to move downward away from the drive motor 311, thereby driving the base 42 to slide away from the drive motor 311. When the output shaft of the drive motor 311 rotates clockwise, the connection position between the belt 312 and the base 42 moves towards the drive motor 311, thereby driving the base 42 to slide towards the drive motor 311.

[0089] Furthermore, the belts 312 of the two sets of drive mechanisms 3 are located on opposite sides of the mounting frame 1 along the second direction S2, which is perpendicular to the first direction S1 and perpendicular to the third direction S3. This effectively avoids the risk of interference between the belts 312 and the testing mechanism 4, thereby improving the stability of the drive mechanism 3 driving the testing mechanism 4 to slide.

[0090] Optionally, refer to Figure 1 and Figure 2The testing device 100 further includes an image acquisition module 7 for acquiring the position of the test point on the test piece. The image acquisition module 7 is located on one side of the mounting frame 1 and on the same side of the two sets of test components 2. This allows the testing device 100 to precisely control the probe assembly 41 to contact the test point based on the position information acquired by the image acquisition module 7, thereby improving the testing accuracy of the testing device 100. Furthermore, by not placing the image acquisition module 7 on the same side as the two sets of test components 2, mutual interference between the image acquisition module 7 and the test components 2 can be better avoided, thus improving the reliability of the testing device 100.

[0091] Optionally, refer to Figure 12 and Figure 13 The detection device 100 also includes a rotation drive module 5. The mounting frame 1 includes a connector 13 and a plate 14. The connector 13 is used to dock with the rotation drive module 5. The plate 14 has a first mounting surface 141 and a second mounting surface 142 that are arranged opposite to each other. The two sets of test components 2 are respectively mounted on the first mounting surface 141 and the second mounting surface 142. That is, the first mounting surface 141 is formed on one side of the plate 14 along the third direction S3, and the second mounting surface 142 is formed on the other side of the plate 14 along the third direction S3, making the overall layout of the detection device 100 more symmetrical and reasonable. At the same time, it can better avoid the movement of the two sets of test components 2 and the risk of interference during the detection process, thereby improving the stability of the detection device 100. Thus, by driving the connector 13 to rotate through the rotation drive module 5, the test components 2 on the plate 14 are driven to rotate, so that the probe assembly 41 can be more flexibly adjusted according to the position of the detection point.

[0092] In a specific example, as shown in 1, the rotation drive module 5 is adapted to drive the connector 13 to rotate on the plane formed by the straight line of the second direction S2 and the straight line of the third direction S3, that is, to rotate around the first direction S1. Furthermore, the probe assembly 41 can move in the first direction S1, so that the detection range of the probe assembly 41 can cover the detection points on the test piece, which is beneficial to improving the detection efficiency of the detection device 100.

[0093] Among them, reference Figure 12 The connector 13 is disc-shaped and has a through hole 131 for wire harness passage. The plate 14 has a clearance hole 143 to avoid the drive mechanism 3. This makes it less likely for the outer edge of the connector 13 to interfere during rotation. Data cables, power cables, etc. can be connected to the drive mechanism 3 and the testing mechanism 4 through the through hole 131. The clearance hole 143 can better accommodate at least part of the drive mechanism 3, reducing the positioning difficulty of the drive mechanism 3 during installation. The layout is reasonable and the structure is compact.

[0094] Further, refer to Figure 1 and Figure 2The detection device 100 further includes a mounting base 6, which is a hollow frame structure with an internal space for mounting the rotary drive module 5. This provides good protection for the rotary drive module 5, enhancing its anti-interference capability. (Refer to...) Figure 13 The rotary drive module 5 is a hollow reducer. The rotary drive module 5 includes a housing 51 and a motor 52 located on one side of the housing 51. The housing 51 has a hollow portion 511, which is connected to a through hole 131 and a clearance hole 143. Therefore, the hollow reducer can better ensure the torque required by the rotary drive module 5 to drive the mounting bracket 1 to rotate, thus ensuring the stability of the mounting bracket 1's rotation. Furthermore, data cables, power cables, etc., can be electrically and communicatively connected to the drive mechanism 3 and the testing mechanism 4 through the hollow portion 511, the through hole 131, and the clearance hole 143, thereby avoiding interference from the wiring harness on the rotation of the mounting bracket 1 and improving the reliability of the testing device 100.

[0095] The control system of the rotation drive module 5 can be a closed-loop control system. By comparing the feedback information, such as the detection point position information obtained by the image acquisition module 7, deviation from the predetermined position can be better avoided, thereby improving the control accuracy of the probe assembly 41 and the stability of the detection device 100.

[0096] The testing equipment according to an embodiment of the present invention includes: the detection device 100 described above.

[0097] According to an embodiment of the present invention, the testing device includes at least two sets of testing components 2. The testing components 2 include a driving mechanism 3 and a testing mechanism 4. The testing includes a probe assembly 41, which includes a first probe 411 and a second probe 412. The first probe 411 is a signal probe, and the second probe 412 is a ground probe or a signal probe. The second probes 412 of any two sets of testing components 2 may be of the same or different types, so that the detection device 100 can flexibly select the type of the second probe 412 according to the detection requirements of the device under test, thereby improving the detection efficiency of the detection device 100 for the device under test.

[0098] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly, referring to fixed connections, detachable connections, or integral connections; direct connections or indirect connections through an intermediate medium; and connections within two components or interactions between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0099] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0100] Although embodiments of the invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.

Claims

1. A detection device, characterized in that, include: Mounting rack; At least two sets of test components are provided on the mounting bracket. Each test component includes a drive mechanism and a test mechanism. The drive mechanism is connected to the test mechanism to drive the test mechanism away from or towards the device under test (DUT). The test mechanism includes a probe assembly, which includes a first probe and a second probe that are electrically connected. The first probe is a signal probe, and the second probe is a ground probe or a signal probe. The second probes of any two sets of test components may be of the same or different types. The test mechanism includes: A base is provided on the mounting bracket, a driving mechanism is connected to the base to drive the base to slide along a first direction, and the first probe is provided on the base; The testing mechanism further includes a slide and an adjustment mechanism disposed on the base. The adjustment mechanism is connected to the slide to drive the slide to slide along a second direction, which is perpendicular to the first direction. The second probe is disposed on the slide. A support block is provided on the base, and a limiting plate is provided on the slide. The limiting plate and the support block are arranged opposite to each other in the second direction. The adjustment mechanism is located on the side of the support block away from the limiting plate. The output end of the adjustment mechanism passes through the support block and is connected to the limiting plate. At least one of the surfaces of the limiting plate and the support block facing each other is provided with a buffer.

2. The detection device according to claim 1, characterized in that, The probe assembly includes a probe holder, which is mounted on the base, and both the first probe and the second probe are mounted on the probe holder.

3. The detection device according to claim 2, characterized in that, The probe holder includes a first sub-probe holder and a second sub-probe holder arranged along a second direction. The first sub-probe holder is mounted on the base, and the second sub-probe holder is mounted on the slide.

4. The detection device according to claim 3, characterized in that, The base includes a main body and a first connecting arm connected along the first direction. The driving mechanism is connected to the main body. The adjusting mechanism is disposed on the main body and arranged along the second direction. The first sub-probe holder is connected to the first connecting arm through a first buffer elastic element. The slide includes a seat body and a second connecting arm connected along the first direction. The adjusting mechanism is connected to the seat body. The second sub-probe holder is connected to the second connecting arm through a second buffer elastic element.

5. The detection device according to claim 4, characterized in that, The first buffer elastic element includes: A first pad and a second pad are arranged opposite to each other and spaced apart along a third direction, the first pad being disposed on the first connecting arm and the second pad being disposed on the first sub-probe holder; Multiple first connecting blocks are spaced apart between the first pad block and the second pad block. One end of each first connecting block is connected to the first pad block and the other end of each first connecting block is connected to the second pad block. The third direction is perpendicular to the first direction and perpendicular to the second direction. The second buffer elastic element includes: A third pad and a fourth pad are arranged opposite to and spaced apart along the third direction, the third pad being disposed on the second connecting arm and the fourth pad being disposed on the second sub-probe holder; Multiple second connecting blocks are spaced apart between the third pad block and the fourth pad block. One end of each second connecting block is connected to the third pad block and the other end of each second connecting block is connected to the fourth pad block.

6. The detection device according to claim 4, characterized in that, The testing mechanism further includes a distance sensor and a sensing block. The distance sensor is provided on both the first connecting arm and the second connecting arm, and the sensing block is provided on both the first sub-probe holder and the second sub-probe holder. The distance sensor on the first connecting arm cooperates with the sensing block on the first sub-probe holder to monitor the position of the first sub-probe holder, and the distance sensor on the second connecting arm cooperates with the sensing block on the second sub-probe holder to monitor the position of the second sub-probe holder.

7. The detection device according to claim 1, characterized in that, The adjustment mechanism is a lead screw feed mechanism or an electric cylinder.

8. The detection device according to claim 2, characterized in that, The mounting bracket is also provided with limit sensors for detecting the position of the base. The limit sensors are located on both sides of the base along a second direction, which is perpendicular to the first direction.

9. The detection device according to any one of claims 2-8, characterized in that, The test components are in two sets and are respectively located on opposite sides of the mounting bracket along a third direction, which is perpendicular to the first direction.

10. The detection device according to any one of claims 2-8, characterized in that, The driving mechanism is a belt drive mechanism or a linear motor, wherein the belt drive mechanism includes a drive motor, a belt and an idler pulley, the drive motor is located at one end of the mounting frame along the first direction, the idler pulley is located at the other end of the mounting frame along the first direction, the belt is wound around the output end of the drive motor and the idler pulley respectively, and the base is connected to the belt.

11. The detection device according to claim 10, characterized in that, The belts of the two sets of drive mechanisms are located on opposite sides of the mounting bracket along a second direction, which is perpendicular to the first direction.

12. The detection device according to claim 9, characterized in that, Also includes: An image acquisition module is used to acquire the location of the detection points on the test piece. The image acquisition module is located on one side of the mounting frame and on the same side of the two sets of test components.

13. The detection device according to claim 9, characterized in that, Also includes: The rotary drive module, the mounting bracket includes a connector and a plate. The connector is used to dock with the rotary drive module. The plate has a first mounting surface and a second mounting surface that are arranged opposite to each other. Two sets of test components are respectively mounted on the first mounting surface and the second mounting surface. The connector is disc-shaped and has a through hole for passing wire harness. The plate has a clearance hole for avoiding the drive mechanism.

14. The detection device according to claim 13, characterized in that, It also includes a mounting base, which is a hollow frame structure with an internal space for mounting the rotary drive module. The rotary drive module is a hollow reducer. The rotary drive module includes a housing and a motor located on one side of the housing. The housing has a hollow portion that connects to the through hole and the clearance hole.

15. A testing device, characterized in that, include: The detection device according to any one of claims 1-14.

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