An adjustable tip angle calibration probe and method of use thereof

Abstract

The application provides an adjustable needle tip angle type calibration probe and a use method thereof, and the calibration probe comprises a light reflection device frame, a needle body and a needle tip calibration position. The light reflection device frame is provided with a light reflection device, the needle body is divided into an upper needle body and a lower needle body and is connected through a needle tip adjusting mechanism, the needle tip adjusting mechanism is provided with a knob, the clamping force of the needle tip adjusting mechanism can be changed by rotating the knob, the angle adjustment and fixation of the needle tip of the calibration probe are realized, and the needle tip calibration position is provided with a spherical structure at the tail end. The needle tip angle of the calibration probe can be adjusted by rotating the knob of the needle tip adjusting mechanism of the calibration probe, the needle tip calibration position of the calibration probe can be placed on a registration part, the light reflection device of the calibration probe can be captured by a binocular camera, full position registration is realized, and the structure is simple and the use is convenient.

Description

Technical Field

[0001] This invention relates to the field of medical devices, specifically to an adjustable needle tip angle calibration probe and its usage method. Background Technology

[0002] With the development and advancement of science and technology, the demand for robot-assisted surgery in the medical field is increasing. Currently, when robots assist doctors in orthopedic surgery, calibration probes are used to register the patient's affected area, allowing the affected area to be fitted with a preoperative CT model within the surgical system, thereby enabling the assistive system to obtain the precise location of the affected area.

[0003] However, the position of the existing calibration probe tip is not adjustable. When registering the affected area, there may be some locations that the calibration probe cannot capture. Even if the tip of the calibration probe is calibrated to the corresponding position, it may affect the binocular camera's ability to capture the reflective device on the calibration probe, thus causing the registration to fail. Summary of the Invention

[0004] The purpose of this invention is to overcome the shortcomings of the prior art described in the background section and to provide an adjustable tip angle calibration probe and its usage method. The tip position of the calibration probe is adjustable, enabling registration at all positions. It also has a simple structure and is easy to use.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: an adjustable tip angle calibration probe, comprising: a reflective device frame, a needle body, and a tip calibration position.

[0006] The reflector frame is equipped with a reflector for reflecting infrared light emitted by the binocular camera. The needle body is divided into an upper needle body and a lower needle body, which are connected by a needle tip adjustment mechanism. The needle tip adjustment mechanism is used to adjust the angle of the calibration probe tip. The end of the needle tip calibration position is a spherical structure. One end of the needle body is connected to the reflector frame, and the other end is connected to the needle tip calibration position.

[0007] Furthermore, the needle tip adjustment mechanism is equipped with a knob, which can be rotated to change the clamping force of the needle tip adjustment mechanism, thereby adjusting and fixing the angle of the calibration probe tip.

[0008] Secondly, the present invention also provides a method for using an adjustable tip angle calibration probe, comprising the following steps: S100, the calibration probe is calibrated using a precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame; S200, the calibration probe tip is placed at the registration site; S300, the reflector on the calibration probe reflector frame reflects the infrared light emitted by the binocular camera to obtain the precise position of the calibration probe reflector; S400, by means of the positional relationship between the calibration probe reflective device and the calibration position of the calibration probe tip, the precise position of the part to be registered is obtained.

[0009] Further, the step S100, which involves calibrating the calibration probe using a precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame, includes: Prepare a precision calibration plate, which includes a reflector frame and a calibration device. The reflector frame is equipped with a reflector that can reflect infrared light emitted by the binocular camera. The calibration device has a conical groove. By rotating the knob of the tip adjustment mechanism, the tip angle of the calibration probe can be adjusted so that the tip calibration position of the calibration probe can be placed on the part to be registered and the reflective device of the calibration probe can be captured by the binocular camera. After adjustment, rotate the knob of the needle tip adjustment mechanism to change the clamping force of the needle tip adjustment mechanism and fix the angle of the calibration probe tip; The calibration probe tip is placed in the conical groove of the precision calibration plate calibration device, and the calibration probe is calibrated by the precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame.

[0010] This invention provides an adjustable tip angle calibration probe and its usage method. By rotating the knob of the calibration probe tip adjustment mechanism, the tip angle of the calibration probe can be adjusted, so that the calibration position of the calibration probe tip can be placed on the part to be registered, and the reflective device of the calibration probe can be captured by a binocular camera, thereby achieving full-position registration. The structure is simple and easy to use. Attached Figure Description

[0011] The features, advantages and technical effects of exemplary embodiments of the present invention will now be described with reference to the accompanying drawings.

[0012] Figure 1 This is a schematic diagram of an adjustable tip angle calibration probe provided in an embodiment of the present invention; Figure 2 This is a schematic diagram of the accuracy calibration plate provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of using a precision calibration plate to calibrate a calibration probe, as provided in an embodiment of the present invention. Detailed Implementation

[0013] The features and exemplary embodiments of various aspects of this disclosure will now be described in detail. To make the objectives, technical solutions, and advantages of this disclosure clearer, the disclosure will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are intended to explain this disclosure only and not to limit it. For those skilled in the art, this disclosure can be implemented without some of these specific details. The following description of the embodiments is merely to provide a better understanding of this disclosure by illustrating examples.

[0014] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus that includes said element.

[0015] In this document, it should also be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "assembly" should be interpreted broadly. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to direct connections or indirect connections through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0016] To better understand the present invention, the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0017] like Figure 1 As shown, the present invention provides an adjustable tip angle calibration probe, including: a reflective device frame 1, a needle body 2, and a tip calibration position 3.

[0018] The reflector frame 1 is equipped with a reflector 101 for reflecting infrared light emitted by the binocular camera. The needle body 2 is divided into an upper needle body and a lower needle body, which are connected by a needle tip adjustment mechanism 4. The needle tip adjustment mechanism 4 is used to adjust the angle of the calibration probe tip. The end of the needle tip calibration position 3 is a spherical structure. One end of the needle body 2 is connected to the reflector frame 1, and the other end is connected to the needle tip calibration position 3.

[0019] Furthermore, the needle tip adjustment mechanism 4 is provided with a knob. By rotating the knob, the clamping force of the needle tip adjustment mechanism 4 can be changed, thereby realizing the angle adjustment and fixation of the calibration probe tip.

[0020] Secondly, the present invention also provides a method for using an adjustable tip angle calibration probe, comprising the following steps: S100, the calibration probe is calibrated using a precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame; S200, the calibration probe tip is placed at the registration site; S300, the reflector on the calibration probe reflector frame reflects the infrared light emitted by the binocular camera to obtain the precise position of the calibration probe reflector; S400, by means of the positional relationship between the calibration probe reflective device and the calibration position of the calibration probe tip, the precise position of the part to be registered is obtained.

[0021] Further, the step S100, which involves calibrating the calibration probe using a precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame, includes: Prepare a precision calibration board, such as Figure 2 As shown, the precision calibration plate includes a reflector frame 5 and a calibration device 6. The reflector frame 5 is equipped with a reflector that can reflect the infrared light emitted by the binocular camera. The calibration device has a conical groove. By rotating the knob of the tip adjustment mechanism, the tip angle of the calibration probe can be adjusted so that the tip calibration position of the calibration probe can be placed on the part to be registered and the reflective device of the calibration probe can be captured by the binocular camera. After adjustment, rotate the knob of the needle tip adjustment mechanism to change the clamping force of the needle tip adjustment mechanism and fix the angle of the calibration probe tip; like Figure 3 As shown, the calibration probe tip is placed in the conical groove of the precision calibration plate calibration device, and the calibration probe is calibrated by the precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame.

[0022] This invention provides an adjustable tip angle calibration probe and its usage method. By rotating the knob of the calibration probe tip adjustment mechanism, the tip angle of the calibration probe can be adjusted, so that the calibration position of the calibration probe tip can be placed on the part to be registered, and the reflective device of the calibration probe can be captured by a binocular camera, thereby achieving full-position registration. The structure is simple and easy to use.

[0023] Although the invention has been described with reference to preferred embodiments, various modifications can be made and components can be replaced with equivalents without departing from the scope of the invention. In particular, the technical features mentioned in the various embodiments can be combined in any manner, provided there is no structural conflict. The invention is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. An adjustable tip angle calibration probe, characterized in that, include: The system includes a reflector frame, a needle body, and a needle tip calibration position. The reflector frame is equipped with a reflector for reflecting infrared light emitted by a binocular camera. The needle body consists of an upper needle body and a lower needle body, which are connected by a needle tip adjustment mechanism. The needle tip adjustment mechanism is used to adjust the angle of the calibration probe tip. The end of the needle tip calibration position has a spherical structure. One end of the needle body is connected to the reflector frame, and the other end is connected to the needle tip calibration position. The calibration probe is calibrated using a precision calibration plate to obtain the tip calibration position of the calibration probe and the relevant positional relationship of the reflector frame, including: Prepare a precision calibration plate, which includes a calibration plate reflector frame and a calibration device. The calibration plate reflector frame is equipped with a calibration plate reflector that can reflect infrared light emitted by the binocular camera. The calibration device has a conical groove. By rotating the knob of the tip adjustment mechanism, the tip angle of the calibration probe can be adjusted so that the tip calibration position of the calibration probe can be placed on the part to be registered and the reflective device of the calibration probe can be captured by the binocular camera. After adjustment, rotate the knob of the needle tip adjustment mechanism to change the clamping force of the needle tip adjustment mechanism and fix the angle of the calibration probe tip; The calibration probe tip is placed in the conical groove of the precision calibration plate calibration device, and the calibration probe is calibrated by the precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame.

2. The adjustable tip angle calibration probe according to claim 1, characterized in that, The needle tip adjustment mechanism is equipped with a knob. By rotating the knob, the clamping force of the needle tip adjustment mechanism can be changed, thereby adjusting and fixing the angle of the calibration probe tip.

3. A method for using an adjustable tip angle calibration probe, characterized in that, The adjustable tip angle calibration probe as described in claim 1 or 2 includes the following steps: S100, the calibration probe is calibrated using a precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame; S200, the calibration probe tip is placed at the registration site; S300, the reflector on the calibration probe reflector frame reflects the infrared light emitted by the binocular camera to obtain the precise position of the calibration probe reflector; S400, by using the relative positional relationship between the calibration probe reflective device and the calibration position of the calibration probe tip, the precise position of the part to be registered is obtained; The step S100 describes calibrating the calibration probe using a precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame, including: Prepare a precision calibration plate, which includes a calibration plate reflector frame and a calibration device. The calibration plate reflector frame is equipped with a calibration plate reflector that can reflect infrared light emitted by the binocular camera. The calibration device has a conical groove. By rotating the knob of the tip adjustment mechanism, the tip angle of the calibration probe can be adjusted so that the tip calibration position of the calibration probe can be placed on the part to be registered and the reflective device of the calibration probe can be captured by the binocular camera. After adjustment, rotate the knob of the needle tip adjustment mechanism to change the clamping force of the needle tip adjustment mechanism and fix the angle of the calibration probe tip; The calibration probe tip is placed in the conical groove of the precision calibration plate calibration device, and the calibration probe is calibrated by the precision calibration plate to obtain the calibration position of the calibration probe tip and the relevant positional relationship of the reflector frame.

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