Luminous flux testing instrument support mechanism and luminous flux testing instrument

Abstract

The application discloses a support mechanism for a light flux testing instrument and the light flux testing instrument, and belongs to the technical field of light flux testing. The support mechanism is designed to solve the problem of poor fixing effect of the existing support mechanism. The support mechanism for the light flux testing instrument comprises a support body, a limiting block arranged on the support body, a pressing rod configured to be movable to a set position to press and fix a to-be-tested light-emitting plate on the limiting block, and a positioning probe configured to be movable to a set position to penetrate into a positioning hole on the to-be-tested light-emitting plate. The support mechanism for the light flux testing instrument and the light flux testing instrument can fix the to-be-tested light-emitting plate in the horizontal direction and the vertical direction respectively, avoid movement of the to-be-tested light-emitting plate during the testing process, ensure the accuracy of the measurement data, and have high testing efficiency. The distance of forward movement of the pressing rod can be adjusted according to the thickness of the to-be-tested light-emitting plate, the application range is wider, and the use is more convenient.

Description

Technical Field

[0001] This invention relates to the field of light flux measurement technology, and more particularly to a support mechanism for a light flux measurement instrument and a light flux measurement instrument including the support mechanism. Background Technology

[0002] White organic light-emitting diodes (WOLEDs) are widely used, large-area, ultra-thin, high-efficiency, and low-energy-consumption solid-state light sources. To determine the quality of a light source, it is usually necessary to measure its total luminous flux. Given the differences in bandwidth, spectral continuity, and center wavelength between the spectrum of WOLED light sources and traditional metal halide lamps, incandescent lamps, or inorganic LED light sources, directly using traditional spherical photometers (luminous flux) will introduce errors, necessitating adaptation and correction using visual functions.

[0003] To address the aforementioned issues, a luminous flux meter based on the WOLED standard light source was used for measurement. Specifically, the luminous flux meter includes an openable housing with a test fixture inside, allowing the light-emitting panel to be fixed onto the fixture for testing.

[0004] The shortcomings of existing luminous flux testers based on WOLED standard light sources include: the structure of the test fixture is too simple, and it is fixed to the light-emitting plate only by a snap-fit ​​relationship. When there is a certain error between the thickness of the light-emitting plate and the thickness of the snap-fit ​​groove, the light-emitting plate is difficult to install into the snap-fit ​​groove, or the light-emitting plate is easy to shake in the snap-fit ​​groove, resulting in inaccurate test results. Summary of the Invention

[0005] The purpose of this invention is to provide a support mechanism for a luminous flux testing instrument and a luminous flux testing instrument including the support mechanism, which makes the light-emitting plate under test more secure and has a wider range of applications.

[0006] To achieve this objective, the present invention employs the following technical solution:

[0007] A support mechanism for a luminous flux testing instrument includes: a support body on which a limiting block is disposed; a pressure rod configured to move to a set position to press and fix the light-emitting plate under test against the limiting block; and a positioning probe configured to move to a set position to pass through a positioning hole on the light-emitting plate under test.

[0008] In one preferred embodiment, the support mechanism for the luminous flux testing instrument further includes a pressing block detachably connected to the support body. The pressing block includes a pressing sleeve, and the pressing rod passes through the pressing sleeve and moves along the axial direction of the pressing sleeve.

[0009] In one preferred embodiment, the support body includes a main sleeve, the limiting block is located at the front end of the main sleeve, and the pressing sleeve passes through the main sleeve.

[0010] In one preferred embodiment, the press-fit sleeve is provided with a probe hole, and the positioning probe passes through the probe hole and can move along the extension direction of the probe hole.

[0011] In one preferred embodiment, two limiting blocks are provided on the support body, and a gap is formed between the two limiting blocks to avoid the positioning probe.

[0012] In one preferred embodiment, the two limiting blocks are symmetrically arranged and each is arc-shaped, and the two limiting blocks hold the circular light-emitting plate to be tested from below.

[0013] In one preferred embodiment, the support mechanism for the luminous flux testing instrument further includes a cooling device connected to the pressure bar.

[0014] In one preferred embodiment, the pressure bar is made of metal.

[0015] In one preferred embodiment, the support mechanism for the luminous flux testing instrument further includes a rear cover and a fan. The rear cover is connected to the support body, the fan is disposed in the rear cover, and the rear cover has ventilation holes.

[0016] On the other hand, the present invention adopts the following technical solution:

[0017] A luminous flux measuring instrument includes a housing and a support mechanism for the luminous flux measuring instrument described above, wherein the support mechanism is disposed within the housing.

[0018] The luminous flux testing instrument support mechanism disclosed in this invention includes a pressure rod and a positioning probe, which can fix the light-emitting plate under test in both the horizontal and vertical directions, preventing the light-emitting plate under test from moving during the test, ensuring the accuracy of the measurement data, and improving testing efficiency. Both thin and thick light-emitting plates under test can be placed in the slot, and then the pressure rod is moved forward to press the light-emitting plate under test firmly onto the limiting block, ensuring the stability of the light-emitting plate under test. The distance of the pressure rod's forward movement can be adjusted according to the thickness of the light-emitting plate under test, making it more applicable and more convenient to use.

[0019] The luminous flux testing instrument disclosed in this invention also includes the aforementioned support mechanism for luminous flux testing instruments, which is suitable for various sizes of light-emitting panels to be tested. It eliminates the need to change the support mechanism when changing the type of light-emitting panel to be tested, thereby improving testing efficiency. Attached Figure Description

[0020] Figure 1This is one of the structural schematic diagrams of the support mechanism for the luminous flux testing instrument provided in a specific embodiment of the present invention;

[0021] Figure 2 This is the second structural schematic diagram of the support mechanism for the luminous flux testing instrument provided in a specific embodiment of the present invention;

[0022] Figure 3 This is a schematic diagram of the support mechanism for a light flux testing instrument with the back cover removed, provided in a specific embodiment of the present invention.

[0023] Figure 4 This is a schematic diagram of the combined structure of the pressure bar, the light-emitting plate to be tested, the positioning probe, and the cooling device provided in a specific embodiment of the present invention;

[0024] Figure 5 This is a schematic diagram of the structure of the pressing block provided in a specific embodiment of the present invention;

[0025] Figure 6 This is a schematic diagram of the combined structure of the pressure bar and cooling device provided in a specific embodiment of the present invention;

[0026] Figure 7 This is one of the structural schematic diagrams of the support body provided in a specific embodiment of the present invention;

[0027] Figure 8 This is the second structural schematic diagram of the support body provided in a specific embodiment of the present invention.

[0028] In the picture:

[0029] 1. Support body; 2. Pressure rod; 3. Light-emitting plate to be tested; 4. Positioning probe; 5. Pressing block; 6. Cooling device; 7. Back cover; 11. Limiting block; 12. Main body sleeve; 13. Sliding limiting surface; 51. Pressing sleeve; 52. Probe hole; 53. Side end face; 71. Ventilation hole. Detailed Implementation

[0030] To make the above-mentioned objects, features, and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of the present invention. However, the present invention can be practiced in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0031] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0032] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0033] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0034] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0035] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0036] This embodiment discloses a support mechanism for a luminous flux measuring instrument and a luminous flux measuring instrument including the support mechanism. Specifically, the support mechanism is disposed within the housing of the luminous flux measuring instrument. Other structures and usage methods of the luminous flux measuring instrument are the same as in the prior art and will not be described further here.

[0037] like Figures 1 to 4 As shown, the support mechanism for the luminous flux testing instrument includes a support body 1, a pressure rod 2, a positioning probe 4, and a lead wire interface (not shown). The support body 1 is equipped with a limiting block 11. The lead wire interface is compatible with various high-precision test power supplies for power supply testing. The pressure rod 2 can move to a set position, thereby pressing and fixing the light-emitting plate 3 under test against the limiting block 11, thus fixing the light-emitting plate 3 under test along its axial direction. The positioning probe 4 can move to a set position until it penetrates the positioning hole on the light-emitting plate 3 under test, fixing the light-emitting plate 3 under test in a direction perpendicular to its axial direction.

[0038] By setting up a pressure rod 2 and a positioning probe 4 that can move along the axis of the light-emitting plate 3 under test, the light-emitting plate 3 under test is fixed in the horizontal and vertical directions respectively, which can prevent the light-emitting plate 3 under test from moving during the test, ensuring the accuracy of the measurement data and high testing efficiency. A relatively wide slot can be formed between the limiting block 11 and the bracket body 1, and both thin and thick light-emitting plates 3 under test can be placed in the slot. Then, the pressure rod 2 moves forward to press the light-emitting plate 3 under test onto the limiting block 11, ensuring the stability of the light-emitting plate 3 under test. The distance of the pressure rod 2 moving forward is adjustable. When the light-emitting plate 3 under test is thin, the pressure rod 2 moves forward a longer distance; when the light-emitting plate 3 under test is thick, the pressure rod 2 moves forward a shorter distance, so that the light-emitting plate 3 under test is tightly attached to the limiting block 11, which has a wider range of applications and is more convenient to use.

[0039] The specific movement method of the pressure rod 2 and the positioning probe 4 is not limited; it can be moved forward to fix the light-emitting plate 3 under test during the test, and released after the test is completed. Figures 1 to 3 as well as Figure 5As shown, the support mechanism for the luminous flux testing instrument also includes a pressing block 5 detachably connected to the support body 1. The pressing block 5 includes a pressing sleeve 51, and a pressure rod 2 passes through the pressing sleeve 51 and moves along the axial direction of the pressing sleeve 51. The pressing sleeve 51 can guide and support the pressure rod 2, but the specific connection method between the pressing sleeve 51 and the pressure rod 2 is not limited.

[0040] In the first connection method, the pressing sleeve 51 and the pressure rod 2 are clearance-fitted, and the pressure rod 2 is connected to the driving device. The driving device can push and pull the pressure rod 2, causing it to move forward and backward along the axial direction of the pressing sleeve 51. In this structure, the requirements for the machining accuracy of the pressing sleeve 51 and the pressure rod 2 are low, the machining cost is low, and the pressure rod 2 can be easily replaced after long-term use, reducing the operating cost.

[0041] In the second connection method, the pressing sleeve 51 and the pressing rod 2 are interference-fitted, and the pressing block 5 is connected to the driving device. In this case, the pressing rod 2 cannot move relative to the pressing sleeve 51, but the driving device can push and pull the pressing block 5 forward and backward, and the pressing rod 2 moves synchronously with the pressing block 5. In this structure, the movement of the pressing rod 2 is more stable; moreover, as... Figure 6 As shown, the pressure rod 2 can be directly connected to the cooling device 6, resulting in good heat dissipation.

[0042] In order to provide support and guidance for the press-fit sleeve 51, such as Figure 7 and Figure 8 As shown, the support body 1 includes a main sleeve 12, and a limiting block 11 is located at the front end of the main sleeve 12. The compression sleeve 51 is inserted into the main sleeve 12 and can move along the extension direction of the main sleeve 12.

[0043] To prevent the compression sleeve 51 from moving radially during the movement, such as Figure 5 As shown, vertical side end faces 53 are formed on both sides of the pressing block 5; as Figure 7 As shown, a groove is provided on the back of the support body 1, and sliding limiting surfaces 13 are formed on both sides of the groove. The pressing block 5 is engaged in the groove, and its side end face 53 abuts against the sliding limiting surface 13. The sliding limiting surface 13 can abut against the pressing block 5 from the left and right sides to prevent the pressing block 5 from moving radially. The sliding limiting surface 13 extends in a direction parallel to the moving direction of the pressing block 5 and does not obstruct the pressing block 5 from moving forward or backward.

[0044] The specific installation method of the positioning probe 4 is not limited; it can be moved forward during testing to fix the light-emitting plate 3 under test, and reset after testing. In this embodiment, as shown... Figure 5 As shown, the compression sleeve 51 is provided with a probe hole 52, and the positioning probe 4 is inserted into the probe hole 52.

[0045] The specific movement of the positioning probe 4 is not limited, as long as it can move along the extension direction of the probe hole 52. One method is that the diameter of the positioning probe 4 is smaller than the diameter of the probe hole 52, and the positioning probe 4 is connected to a driving device, which drives the positioning probe 4 to move within the probe hole 52. Another method is that the positioning probe 4 is tightly locked in the probe hole 52, and the pressing block 5 is connected to the driving device. The driving device can push and pull the pressing block 5 forward and backward, thereby driving the positioning probe 4 to move.

[0046] The specific shape of the positioning probe 4 is not limited. It can be a columnar structure with a constant diameter from beginning to end, which has high processing efficiency and the head and tail ends can be interchanged. Alternatively, it can be an integral structure formed by two columnar structures with different diameters, where the diameter of the rear section is the same as the diameter of the probe hole 52, and the diameter of the front section is designed according to the diameter of the positioning hole on the light-emitting plate 3 to be tested.

[0047] When the diameter of the front section of the positioning probe 4 can differ from that of the rear section, a series of products can be designed. The front section diameter of this series of products can vary to accommodate the positioning hole diameter of various light-emitting plates 3 under test, thus having a wider range of applications and being more convenient to use.

[0048] like Figure 1 and Figure 2 As shown, the main body 1 of the support is provided with two limiting blocks 11, and a gap is formed between the two limiting blocks 11 to avoid the positioning probe 4. Compared with the positioning probe 4 passing through the positioning hole of the light-emitting plate 3 under test and abutting against the limiting block 11, the gap between the two limiting blocks 11 can play a role in avoiding the probe 4, reducing the accuracy requirements for the movement distance of the positioning probe 4. Moreover, the positioning probe 4 can completely penetrate the positioning hole of the light-emitting plate 3 under test, resulting in a better fixation effect on the light-emitting plate 3 under test.

[0049] The specific shape of the limiting block 11 is not limited, as long as it can fix and support the light-emitting plate 3 to be tested. In this embodiment, both limiting blocks 11 are arc-shaped and symmetrically arranged relative to the vertical plane. One of the two limiting blocks 11 is located at the lower left of the light-emitting plate 3 to be tested, and the other of the two limiting blocks 11 is located at the lower right of the light-emitting plate 3 to be tested. Together, they hold the circular light-emitting plate 3 to be tested from below, providing good fixation and support for the light-emitting plate 3 to be tested, and making it easy to assemble and disassemble the light-emitting plate 3 to be tested.

[0050] Based on the above structure, the pressure rod 2 is made of a metal with good thermal conductivity, such as copper or red copper. It has a fast temperature conduction speed and can quickly transfer the heat generated during the test from the light-emitting plate 3 to the cooling device 6 through the pressure rod 2, so as to avoid the high temperature affecting the measurement accuracy.

[0051] To further improve the cooling rate, the support mechanism for the luminous flux testing instrument also includes a rear cover 7 and a fan (not shown). The rear cover 7 is connected to the support body 1, and the fan is housed within the rear cover 7. Ventilation holes 71 are provided on the rear cover 7. When the fan is activated, airflow passes through the cooling device 6 from inside the rear cover 7 and is then blown out through the ventilation holes 71, thereby carrying away heat from the cooling device 6. The cooling device 6 is preferably a heat sink composed of multiple metal blocks, which has low manufacturing costs and high heat dissipation efficiency.

[0052] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.

Claims

1. A support mechanism for a luminous flux measuring instrument, characterized in that, include: The support body (1) is provided with a limit block (11); A pressure bar (2) is configured to move to a set position to press and fix the light-emitting plate (3) under test against the limiting block (11), thereby fixing the light-emitting plate (3) under test (3) in the axial direction of the light-emitting plate (3); and, A positioning probe (4) is configured to move to a set position to insert into a positioning hole on the light-emitting plate (3) to be tested, and to fix the light-emitting plate (3) to be tested in a direction perpendicular to the axis of the light-emitting plate (3). Two limiting blocks (11) are provided on the main body (1) of the bracket, and a gap is formed between the two limiting blocks (11) to avoid the positioning probe (4); The two limiting blocks (11) are symmetrically arranged and are arc-shaped respectively. The two limiting blocks (11) hold the circular light-emitting plate (3) to be tested from below. The support mechanism for the light flux testing instrument also includes a pressing block (5) detachably connected to the support body (1). The pressing block (5) includes a pressing sleeve (51). The pressing rod (2) passes through the pressing sleeve (51) and moves along the axial direction of the pressing sleeve (51). The support body (1) includes a main sleeve (12), the limiting block (11) is located at the front end of the main sleeve (12), and the pressing sleeve (51) passes through the main sleeve (12).

2. The support mechanism for a luminous flux testing instrument according to claim 1, characterized in that, The press sleeve (51) is provided with a probe hole (52), and the positioning probe (4) passes through the probe hole (52) and can move along the extension direction of the probe hole (52).

3. The support mechanism for a luminous flux measuring instrument according to any one of claims 1 to 2, characterized in that, The support mechanism for the luminous flux testing instrument also includes a cooling device (6), which is connected to the pressure rod (2).

4. The support mechanism for a luminous flux testing instrument according to claim 3, characterized in that, The pressure bar (2) is made of metal.

5. The support mechanism for a luminous flux measuring instrument according to any one of claims 1 to 2, characterized in that, The support mechanism for the light flux testing instrument also includes a rear cover (7) and a fan. The rear cover (7) is connected to the support body (1). The fan is located in the rear cover (7). The rear cover (7) has ventilation holes (71).

6. A luminous flux measuring instrument, comprising a housing, characterized in that, It also includes a support mechanism for a light flux testing instrument as described in any one of claims 1 to 5, the support mechanism being disposed in the housing.

Images