A method for tracing sediment
By sampling at and around the sampling point and drawing a sediment fingerprint matrix, the problem of inaccurate sediment source identification in the existing technology is solved, and accurate source tracing and classification of sediment is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI INVESTIGATION DESIGN & RES INST CO LTD
- Filing Date
- 2023-04-04
- Publication Date
- 2026-07-21
AI Technical Summary
Existing methods for tracing sediment sources are greatly affected by human factors, making it difficult to guarantee the integrity and accuracy of the data, resulting in inaccurate identification and classification of sediment sources.
By taking samples at the sampling point and multiple surrounding test points, the sediment gradation and mass percentage were measured, sediment particle size distribution curves were plotted, a sediment fingerprint matrix was formed, and the patterns were compared to determine whether the sampling points were of the same origin.
It enables precise source tracing and classification of sediment, improving the accuracy and precision of sediment source identification.
Smart Images

Figure CN116298208B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of soil and water conservation and river erosion and silt protection, specifically to a method for tracing the source of sediment. Background Technology
[0002] Rainfall runoff-induced soil erosion is the main driver of topsoil and nutrient loss, leading to soil degradation and threatening sustainable agricultural development. It also causes large amounts of sediment and related nutrients to enter rivers and lakes, resulting in the deterioration of water bodies and the ecological environment. Accurately identifying the source of sediment and calculating the sediment load entering rivers are prerequisites for effectively preventing sediment from entering rivers and lakes.
[0003] Existing methods for tracing sediment sources include observation and erosion monitoring. However, these methods are greatly affected by human factors and cannot guarantee the integrity of collected data and observation data in terms of time and space. At the same time, these methods lack an accurate understanding of the true source areas of sediment and the changes in source-sink relationships caused by changes in the migration process. As a result, the identification and classification of sediment source areas cannot fully and effectively reflect the source-sink process of sediment.
[0004] Therefore, how to improve the accuracy of source identification and classification when tracing sediment sources has become a technical problem that urgently needs to be solved by those skilled in the art. Summary of the Invention
[0005] In view of this, the purpose of this invention is to provide a sediment source tracing method to solve the technical problem that existing source tracing methods are inaccurate in identifying and classifying sediment sources.
[0006] The technical solution adopted in this invention is: a method for tracing the source of sediment, comprising:
[0007] S100: Sample the sampling point and multiple test points around the sampling point;
[0008] The sampling points include a first sampling point and a second sampling point;
[0009] S200: Measure the sediment gradation and mass percentage, and plot the sediment particle size distribution curves at the sampling points and the measurement points;
[0010] S300: Draw the mud and sand fingerprint matrix of the sampling points;
[0011] Wherein, the horizontal axis of the sediment fingerprint matrix represents particle size, the vertical axis represents mass percentage, and the elements of the sediment fingerprint matrix represent the number of sediment particle size distribution curves.
[0012] S400: Perform texture comparison on the first sampling point and the second sampling point, and determine whether the first sampling point and the second sampling point are from the same source;
[0013] The texture refers to the columns of a mud and sand fingerprint matrix.
[0014] Preferably, the ratio of the number of sampling points to the number of measurement points is 1:4, and the four measurement points are evenly distributed around the circumference of the sampling points.
[0015] Preferably, the four additional testing points are located upstream, downstream, and on both sides of the sampling point, respectively.
[0016] Preferably, the distance between the measurement point and the sampling point is 50cm to 100cm.
[0017] The beneficial effects of this invention are:
[0018] This invention samples sediment at sampling points and surrounding test points, and uses the sediment particle size distribution curves of the sampling points and test points to draw a sediment fingerprint matrix. From the sediment fingerprint matrix, the sediment characteristic variation areas of each particle size range can be obtained. For sampling points at different locations, the sediment characteristics of the corresponding particle size range can be compared to achieve accurate source tracing and classification of sediment at different locations. Attached Figure Description
[0019] Figure 1 The diagram shows the particle size distribution curves of sediment at the first testing point and the additional testing points.
[0020] Figure 2 The diagram shows the particle size distribution curves of the sediment at the second testing point and the additional testing point. Detailed Implementation
[0021] The specific embodiments of the present invention will be further described in detail below with reference to the accompanying drawings. These embodiments are for illustrative purposes only and are not intended to limit the scope of the invention.
[0022] In the description of this invention, it should be noted that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0023] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.
[0024] Furthermore, in the description of this invention, unless otherwise stated, "a plurality of" means two or more.
[0025] Examples, such as Figure 1 , Figure 2 As shown, a sediment source tracing method includes:
[0026] S100: Samples are taken from the sampling point and multiple additional testing points around the sampling point to obtain multiple samples of sediment for later use.
[0027] The sampling points include the first sampling point and the second sampling point, meaning that there are two or more sampling points.
[0028] S200: First, measure the sediment gradation and the mass percentage of sediment with different particle sizes for each sampled sediment. Then, plot the sediment particle size distribution curves for the sampling points and the measurement points.
[0029] S300: Select multiple particle size ranges and the corresponding mass percentages for each particle size range on the sediment particle size distribution curves of the sampling points and the test points, and plot the sediment fingerprint matrix of the sampling points.
[0030] In this matrix, the horizontal axis represents particle size, the vertical axis represents mass percentage, and the elements represent the number of particle size distribution curves.
[0031] S400: Compare the textures of the first sampling point and the second sampling point, and determine whether the first sampling point and the second sampling point are from the same source.
[0032] Among them, the patterns are columns of a mud and sand fingerprint matrix.
[0033] This application samples sediment at sampling points and surrounding test points, and uses the sediment particle size distribution curves of the sampling points and test points to draw a sediment fingerprint matrix. The sediment fingerprint matrix can be used to obtain the sediment characteristic variation areas of each particle size range. For sampling points at different locations, the sediment characteristics of the corresponding particle size range can be compared to achieve accurate source tracing and classification of sediment at different locations.
[0034] In one specific embodiment, the ratio of sampling points to measurement points is 1:4, that is, there are four measurement points around each sampling point, and the four measurement points are evenly distributed around the circumference of the sampling point.
[0035] Preferably, the four additional testing points are located upstream, downstream, and on both sides of the sampling point, respectively.
[0036] More preferably, the distance between the measurement point and the sampling point is 50cm to 100cm.
[0037] In a specific embodiment, a sediment source tracing method includes:
[0038] S100: Samples are taken from sampling point A and four additional measurement points located 1000mm apart in all directions before, after, and to the left and right of sampling point A. Samples are also taken from sampling point B and four additional measurement points located 1000mm apart in all directions of sampling point B. Sampling point A is located upstream of sampling point B. A total of ten sediment samples are obtained from sampling point A, sampling point B, and eight additional measurement points.
[0039] S200: Ten sediment samples were tested in succession. The sediment gradation of each sediment sample was accurately measured, and the mass percentage corresponding to different particle sizes of sediment was calculated. Then, the sediment particle size distribution curves of sampling point A, sampling point B and eight additional testing points were plotted.
[0040] S300: Select multiple particle size ranges and the corresponding mass percentages on the sediment particle size distribution curves at the sampling points and test points, and plot the sediment fingerprint matrix at the sampling points; for example, the particle size ranges can be: 0.1mm, 0.05mm, 0.02mm, 0.015mm, 0.007mm, 0.005mm, 0.003mm and 0.001mm; the mass percentages are divided as: (0%, 10%), (10%, 25%), (25%, 40%), (40%, 55%), (55%, 70%), (70%, 85%) and (85%, 100%).
[0041] In this matrix, the horizontal axis represents particle size, the vertical axis represents mass percentage, and the elements represent the number of particle size distribution curves.
[0042] For example, Table 1 shows the mass percentages corresponding to various particle size ranges on five sediment particle size distribution curves for sampling point A and its four additional measurement points (before, after, to the left, and right).
[0043]
[0044] Table 1
[0045] The mud and sand fingerprint matrix of sampling point A is plotted according to Table 1, as shown in Table 2.
[0046]
[0047]
[0048] Table 2
[0049] Table 3 shows the mass percentages corresponding to various particle size ranges on five sediment particle size distribution curves for sampling point B and its four additional measurement points (front, back, left, and right).
[0050]
[0051] Table 3 shows the sediment fingerprint matrix for sampling point B.
[0052] 86%~100% 5 2 0 0 0 0 0 0 71%~85% 0 3 1 0 0 0 0 0 56%~70% 0 0 3 2 0 0 0 0 41%~55% 0 0 1 1 0 0 0 0 26%~40% 0 0 0 2 3 0 0 0 11%~25% 0 0 0 0 2 3 2 0 1%~10% 0 0 0 0 0 2 3 0 0 0 0 0 0 0 0 0 5 Particle size 0.1 0.05 0.02 0.015 0.007 0.005 0.003 0.001
[0053] Table 4
[0054] In Tables 2 and 4, the first column reflects the maximum particle size, and the last column reflects the minimum particle size. Typically, the data in the first and last columns are not used for fingerprint comparison. Specifically, in Table 1, the first column is characterized by four sampling points with particle sizes less than 0.1 mm and one sampling point with a particle size greater than 0.1 mm; the last column is characterized by one sampling point with a particle size less than 0.001 mm and four sampling points with a particle size greater than 0.001 mm.
[0055] In Tables 1 and 2, the fourth column of the texture means: the number of particles with a diameter less than 0.015 mm that are between (55%, 70%) is 2, the number of particles that are between (40%, 55%) is 1, and the number of particles that are between (25%, 40%) is 2.
[0056] S400: Compare the fingerprint matrix of mud and sand at sampling point A and sampling point B, that is, compare the texture of the particle size range. The fingerprint code of the fourth column of sampling point A is 00212000, and the fingerprint code of the fourth column of sampling point B is also 00212000. Therefore, the textures of sampling point A and sampling point B are similar, that is, sampling point A and sampling point B are of the same origin.
[0057] Based on river dynamics and sediment transport mechanics, the approximate direction of sediment movement between different locations is determined, and the source of B is determined to be A.
[0058] Compared with the prior art, this application has at least the following beneficial technical effects:
[0059] This application focuses on a single sampling point, adding measurements around the sampling point to precisely measure the gradation of sediment, obtaining the mass percentage corresponding to different particle sizes, forming an accurate sediment gradation curve, and plotting and forming a sediment fingerprint matrix. From the sediment fingerprint matrix, the variation areas of sediment characteristics in each particle size range can be accurately identified. For sediment fingerprint matrices at different locations, the sediment characteristics of the corresponding particle size range can be compared, thereby comparing the patterns of the particle size ranges. Good matching of the patterns indicates that the sediment at different locations belongs to the same origin.
[0060] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and substitutions can be made without departing from the technical principles of the present invention, and these improvements and substitutions should also be considered within the scope of protection of the present invention.
Claims
1. A method for tracing the source of sediment, characterized in that, include: S100: Sample the sampling point and multiple test points around the sampling point; The sampling points include a first sampling point and a second sampling point; S200: Measure the sediment gradation of each sediment sample and calculate the mass percentage corresponding to different particle sizes of sediment, and plot the sediment particle size distribution curves of the sampling points and the measurement points; S300: Select multiple particle size ranges and the corresponding mass percentages for each particle size range on the sediment particle size distribution curves of the sampling points and the test points, and plot the sediment fingerprint matrix of the sampling points. Wherein, the horizontal axis of the sediment fingerprint matrix represents particle size, the vertical axis represents mass percentage, and the elements of the sediment fingerprint matrix represent the number of sediment particle size distribution curves. S400: Perform texture comparison on the first sampling point and the second sampling point, and determine whether the first sampling point and the second sampling point are from the same source; The texture refers to the columns of a mud and sand fingerprint matrix.
2. The sediment source tracing method according to claim 1, characterized in that, The ratio of the number of sampling points to the number of additional measurement points is 1:4, and the four additional measurement points are evenly distributed around the circumference of the sampling points.
3. The sediment source tracing method according to claim 2, characterized in that, The four additional testing points are located upstream, downstream, and on both sides of the sampling point, respectively.
4. The sediment source tracing method according to claim 1, characterized in that, The distance between the additional measurement point and the sampling point is 50cm to 100cm.