Direct current circuit verification method, apparatus and electronic device

Abstract

This invention provides a method, apparatus, and electronic device for verifying DC circuits. The method includes: grounding a first conductance to all high-impedance nodes; grounding a second conductance to all non-high-impedance nodes; adjusting the current gain and the first conductance of the three-terminal switching devices in all high-impedance nodes based on a first homotopy parameter; iteratively solving the voltage of all high-impedance nodes based on a first homotopy function to obtain an initial homotopy solution; adjusting the current gain and the second conductance of the three-terminal switching devices in all non-high-impedance nodes based on a second homotopy parameter; iteratively solving the voltage of all non-high-impedance nodes based on the initial homotopy solution and the second homotopy function to obtain a homotopy converged solution; and verifying the homotopy converged solution using Newton's iteration method to obtain a DC steady-state solution. This invention addresses the deficiency in existing technologies where the solution obtained by the homotopy method differs significantly from the actual steady-state solution of the circuit.

Description

Technical Field

[0001] This invention relates to the field of electronic technology, and in particular to a DC circuit verification method, apparatus, and electronic device. Background Technology

[0002] Convergence in DC analysis of nonlinear circuits has always been a major challenge in circuit simulation verification. Generally speaking, in DC simulation, due to the strong nonlinearity of analog circuits, it is difficult to provide a sufficiently close initial guess to the true solution for the standard Newton-Raphson iteration method (NR) and its variants, thus making convergence of these methods very difficult.

[0003] To address this problem, more robust homotopy algorithms have been proposed from various perspectives in recent years. From a mathematical standpoint, the homotopy method transforms a previously difficult-to-solve equation into one with a known or easily solvable solution, and theoretically always converges with a probability of 1. Using the homotopy method, we can often find a good initial solution for the traditional Newton's iteration method. Indeed, the homotopy method has proven to provide a feasible approach to solving the non-convergence problem of Newton's iteration method.

[0004] However, in actual circuit simulations, we discovered a new type of non-convergence. That is, although the homotopy method converges normally, the solution obtained by the homotopy method is far from the actual steady-state solution of the circuit, and cannot be used as a good initial solution for Newton's iteration method, thus causing the DC analysis to eventually fail to converge. Summary of the Invention

[0005] This invention provides a DC circuit verification method, apparatus, and electronic device to address the shortcomings of existing technologies where, although the homotopy method converges normally, the solution obtained by the homotopy method differs significantly from the actual steady-state solution of the circuit.

[0006] This invention provides a DC circuit verification method, comprising:

[0007] Identify all high-impedance nodes and non-high-impedance nodes in the DC circuit;

[0008] A first conductance is grounded for all the high-impedance nodes; a second conductance is grounded for all the non-high-impedance nodes; the current gain of the three-terminal switching devices in all the high-impedance nodes and the magnitude of the first conductance are adjusted based on the first homotopy parameter.

[0009] The voltage of all the high-impedance nodes is iteratively solved based on the first homotopy function to obtain the initial homotopy solution; the first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching device in the high-impedance node;

[0010] The current gain and the second conductance of the three-terminal switching devices in all the non-high-impedance nodes are adjusted based on the second homotopy parameter.

[0011] The voltages of all non-high-impedance nodes are iteratively solved based on the initial homotopy solution and the second homotopy function to obtain the homotopy converged solution; the second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high-impedance node.

[0012] The DC steady-state solution is obtained by verifying the homotopy convergent solution using the Newton-Raphson iteration method.

[0013] According to a DC circuit verification method provided by the present invention, the step of iteratively solving the voltage of all the high-impedance nodes based on a first homotopy function to obtain an initial homotopy solution includes:

[0014] Repeat the following steps until the first homotopy parameter equals the first set threshold:

[0015] The voltages of all the high-resistivity nodes are solved based on the first homotopy function;

[0016] Tracing homotopy solution curves based on the prediction-correction method;

[0017] The first homotopy parameter is incremented based on the current step size;

[0018] Update the final solution of the voltages of all the high-impedance nodes and the first homotopy parameter for the next iteration;

[0019] When the first homotopy parameter is equal to the first set threshold, the solution for obtaining the voltage of all the high-resistance nodes is the initial homotopy solution.

[0020] According to a DC circuit verification method provided by the present invention, the first homotopy function is constructed based on the first homotopy parameter, the current gain of the three-terminal switching device in the high-impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0021] According to a DC circuit verification method provided by the present invention, the step of iteratively solving the voltage of all non-high-impedance nodes based on the initial homotopy solution and the second homotopy function includes:

[0022] Repeat the following steps until the second homotopy parameter equals the second set threshold:

[0023] The voltages of all non-high-resistance nodes are solved based on the initial homotopy solution and the second homotopy function;

[0024] Tracing homotopy solution curves based on the prediction-correction method;

[0025] The second homotopy parameter is incremented based on the current step size;

[0026] Update the final solution of the voltage of all the non-high-impedance nodes and the second homotopy parameter for the next iteration;

[0027] When the second homotopy parameter is equal to the second set threshold, the solution for the voltage of all the non-high resistance nodes is the homotopy converged solution.

[0028] According to a DC circuit verification method provided by the present invention, the second homotopy function is constructed based on the second homotopy parameter, the current gain of the three-terminal switching device in the non-high impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0029] The present invention also provides a DC circuit verification device, comprising:

[0030] The determination module is used to identify all high-impedance nodes and non-high-impedance nodes in a DC circuit;

[0031] The first adjustment module is used to ground a first conductance to all the high-impedance nodes; to ground a second conductance to all the non-high-impedance nodes; and to adjust the current gain of the three-terminal switching devices in all the high-impedance nodes and the magnitude of the first conductance based on the first homotopy parameter.

[0032] The first iterative solution module is used to iteratively solve the voltage of all the high-resistance nodes based on the first homotopy function to obtain the initial homotopy solution; the first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching device in the high-resistance node;

[0033] The second adjustment module is used to adjust the current gain and the second conductance of the three-terminal switching devices in all the non-high resistance nodes based on the second homotopy parameter.

[0034] The second iterative solution module is used to iteratively solve the voltage of all the non-high-impedance nodes based on the initial homotopy solution and the second homotopy function to obtain the homotopy converged solution; the second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high-impedance node;

[0035] The verification module is used to verify the homotopy convergent solution based on Newton's iteration method to obtain the DC steady-state solution.

[0036] According to a DC circuit verification device provided by the present invention, the first homotopy function is constructed based on the first homotopy parameter, the current gain of the three-terminal switching device in the high-impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0037] The second homotopy function is constructed based on the second homotopy parameter, the current gain of the three-terminal switching device in the non-high impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0038] The present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the DC circuit verification method as described above.

[0039] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the DC circuit verification method as described above.

[0040] The present invention also provides a computer program product, including a computer program that, when executed by a processor, implements the DC circuit verification method as described above.

[0041] The DC circuit verification method, apparatus, and electronic device provided by this invention iteratively solves the voltage of all high-resistance nodes in the DC circuit using a first homotopy function and a first homotopy parameter; it iteratively solves the voltage of all non-high-resistance nodes in the DC circuit using a second homotopy function and a second homotopy parameter; thus, through the first homotopy parameter, the second homotopy parameter, and the iterative solution in two stages, independent solutions are achieved for high-resistance nodes and non-high-resistance nodes respectively. This solves the problem that while existing homotopy methods converge normally, the solutions obtained by the homotopy method differ significantly from the true steady-state solutions of the DC circuit, enabling fast and robust DC circuit analysis. Attached Figure Description

[0042] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0043] Figure 1 This is a flowchart illustrating the DC circuit verification method provided by the present invention;

[0044] Figure 2 This is a schematic diagram illustrating the convergence failure caused by high-resistance nodes in the existing DC homotopy method.

[0045] Figure 3 This is a schematic diagram comparing the convergent solutions of the existing homotopy method and the DC circuit verification method of this invention.

[0046] Figure 4This is a schematic diagram of the structure of the DC circuit verification device provided by the present invention;

[0047] Figure 5 This is a schematic diagram of the structure of the electronic device provided by the present invention. Detailed Implementation

[0048] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0049] First, a simple example circuit is used to illustrate in detail the phenomenon that inserting a homotopy parameter at a specific high-impedance node can lead to the node voltage actually deviating from the true DC solution when the homotopy parameter reaches 1. For example... Figure 2 As shown in (a), three P-MOS transistors M1, M2, and M3 are interconnected through three linear resistors less than 100Ω. The source of M1 is connected to VDD, the drain of M2 is connected to VSS, and the gate of M3 is connected to resistors R2 and R3. During DC analysis, when the gate voltages of M1 and M2 change from low to high, M1 and M2 will be in the "off" state. M3 will remain off throughout the entire DC analysis. In this case, nodes n1 to n3 will be in a high-impedance state. At this point, we can consider M1 and M2 as two infinitely large resistors. and like Figure 2 As shown in (b). Because the three resistors R1, R2, and R3 are compared... and Since the resistance is very small, the DC solutions of the three high-resistance nodes n1 to n3 should be determined by formulas (1), (2) and (3).

[0050]

[0051]

[0052]

[0053] It should be noted that, although and Its resistance is very high, but and The ratio should be a precise value. In this circuit, we can obtain v1 = v2 = v3 ≈ 3.73V.

[0054] When we use the homotopy method to solve the above DC circuit, such as Figure 2 As shown in (c), we ground each node with a conductance Gmin of 1. Typically, after several iterations, if the embedded conductance value decreases from 1 to a very small value (e.g., 10), the network will be inactive. -12 S), we will use the solution at this time as the initial value for the final NR verification stage. However, for high-impedance nodes such as n1 to n3, their node voltages at this time point are actually very far from the actual DC operating point. This is because at this moment, according to the series-parallel relationship, the node voltages of the three high-impedance nodes should be determined by formulas (4), (5), (6) and (7).

[0055]

[0056]

[0057]

[0058]

[0059] But in reality, due to R M1 (>>10 12 Ω) is usually much greater than 1 / Gmin (≈10 12 Since Ω), we have v1=v2=v3≈0 at this moment, which will lead to the failure of the final verification by Newton's iteration method.

[0060] In view of this, the present invention provides a DC circuit verification method, apparatus and electronic device to solve the defect in the prior art that although the homotopy method converges normally, the solution obtained by the homotopy method is far from the true steady-state solution of the circuit.

[0061] The applicant discovered that the convergence failure of existing homotopy methods is mainly caused by a class of high-impedance nodes (HiZ) with DC paths, whose node voltages affect circuit performance. However, embedding homotopy parameters pushes the voltages of these high-impedance nodes towards zero, resulting in an initial guess solution far removed from the true solution. Unlike existing homotopy methods that simultaneously solve for all node voltages, this application employs a multi-stage, multi-homtopy-parameter hybrid method, solving for high-impedance and non-high-impedance nodes separately, thus avoiding the convergence problem encountered during the final verification of Newton's iteration method.

[0062] The following is combined Figure 1 - Describes the DC circuit verification method of the present invention. Please refer to... Figure 1 The DC circuit verification method of this invention includes:

[0063] Step 100: Identify all high-impedance nodes and non-high-impedance nodes in the DC circuit.

[0064] Electronic devices identify all high-resistance nodes and non-high-resistance nodes in a DC circuit. A high-resistance node is a node in the DC circuit with a high resistance value, while a non-high-resistance node is a node in the DC circuit with a non-high resistance value. A non-high-resistance node is a node in the DC circuit with zero resistance or a resistance value that is not zero.

[0065] By distinguishing between all high-resistance nodes and non-high-resistance nodes in a DC circuit, it is easier to solve for the node voltages of all high-resistance nodes and non-high-resistance nodes separately. This avoids the non-convergence phenomenon that occurs during the final verification of the Newton-Raphson iteration method.

[0066] Step 200: Ground a first conductance to all the high-impedance nodes; ground a second conductance to all the non-high-impedance nodes; adjust the current gain of the three-terminal switching devices in all the high-impedance nodes and the magnitude of the first conductance based on the first homotopy parameter.

[0067] The electronic device grounds a first conductance to all the high-impedance nodes; grounds a second conductance to all the non-high-impedance nodes; and adjusts the current gain of the three-terminal switching device in all the high-impedance nodes and the magnitude of the first conductance based on a first homotopy parameter.

[0068] Specifically, in one embodiment, the electronic device grounds a first conductance of (1-λ1)Gmin to all the high-impedance nodes. The current gain of the three-terminal switching device at all the high-impedance nodes is multiplied by λ1, where λ1 is the first homotopy parameter. All non-high-impedance nodes are grounded with a second conductance of constant Gmin. The three-terminal switching device can be a bipolar junction transistor or a MOSFET (i.e., a metal-oxide-semiconductor field-effect transistor).

[0069] Step 300: Iteratively solve the voltage of all the high-resistance nodes based on the first homotopy function to obtain the initial homotopy solution.

[0070] The electronic device iteratively solves for the voltages of all the high-impedance nodes based on a first homotopy function to obtain an initial homotopy solution. The first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching devices in the high-impedance nodes.

[0071] During iterative solution, the second homotopy function λ2 is set to ≡ 0, and the first homotopy function λ1 is set to gradually change from 0 to 1. When the first homotopy function λ1 is strictly equal to 1, the first conductance connected to the high-resistivity node is completely eliminated. Afterward, the second stage is activated.

[0072] It should be noted that, since this embodiment of the invention only iteratively solves for the voltages of all the high-resistance nodes in the first stage, the initial homotopy solution only includes the solutions for the voltages of the high-resistance nodes. For example, the complete solution vector for all nodes in a DC circuit includes solutions in five dimensions, namely x1, x2, x3, x4, and x5. Among them, x1 and x2 are the solutions for the voltages of the high-resistance nodes. At this time, the initial homotopy solution only includes the values ​​of x1 and x2. The values ​​of x3, x4, and x5 are 0.

[0073] Step 400: Adjust the current gain and the second conductance of the three-terminal switching devices in all the non-high-impedance nodes based on the second homotopy parameter.

[0074] The electronic device adjusts the current gain of the three-terminal switching devices in all the non-high-impedance nodes and the magnitude of the second conductance based on the second homotopy parameter. A second conductance of (1-λ2)Gmin is grounded to all non-high-impedance nodes, and the current gain of the three-terminal switching devices in the non-high-impedance nodes is multiplied by λ2. Here, λ2 is the second homotopy parameter. The three-terminal switching devices are MOS transistors (i.e., metal-oxide-semiconductor field-effect transistors).

[0075] Step 500: Iteratively solve the voltage of all the non-high-impedance nodes based on the initial homotopy solution and the second homotopy function to obtain the homotopy converged solution; the second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high-impedance node.

[0076] The electronic device iteratively solves for the voltages of all non-high-impedance nodes based on the initial homotopy solution and the second homotopy function to obtain a homotopy converged solution. The second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching devices in the non-high-impedance nodes.

[0077] In this embodiment of the invention, the initial homotopy solution of the first stage is used as the initial value for iteration. This embodiment uses a second homotopy parameter λ2 to control all non-high-resistance nodes. A conductance of (1-λ2)Gmin is grounded to all non-high-resistance nodes. The current gain of the MOS nodes among the non-high-resistance nodes is multiplied by λ2. Then, while setting the first homotopy parameter λ1≡1, the second homotopy parameter λ2 gradually changes from 0 to 1. When λ2 is sufficiently close to 1, we can consider the solution at this point to be the correct homotopy convergent solution, which is a solution sufficiently close to the true DC solution.

[0078] Step 600: Verify the homotopy convergent solution using the Newton iteration method to obtain the DC steady-state solution.

[0079] Finally, in this embodiment of the invention, all embedded homotopy operators (first homotopy parameter and second homotopy parameter) are eliminated. Starting from the above homotopy converged solution, the final DC steady-state solution can be obtained by verifying the homotopy converged solution using the Newton iteration method.

[0080] This invention provides an embodiment for iteratively solving the voltage of all high-resistance nodes in a DC circuit using a first homotopy function and a first homotopy parameter; and iteratively solving the voltage of all non-high-resistance nodes in the DC circuit using a second homotopy function and a second homotopy parameter. Thus, by using the first and second homotopy parameters, and the iterative solution in two stages, independent solutions are achieved for high-resistance nodes and non-high-resistance nodes respectively. This solves the problem that while existing homotopy methods converge normally, the solutions obtained by the homotopy method differ significantly from the true steady-state solutions of the DC circuit, enabling fast and robust DC circuit analysis.

[0081] In other aspects of the embodiments of the present invention, the first homotopy function is constructed based on the first homotopy parameter, the current gain of the three-terminal switching device in the high-impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0082] Specifically, in one embodiment, the first homotopy function is as shown in formula (8):

[0083]

[0084] Formula (8) is the first homotopy function, where p and m represent the number of high-impedance nodes and the number of non-high-impedance nodes, respectively (p+m=n). Em and Ep are identity matrices. The nonlinear function g(·) defines the current gain of the three-terminal switching devices (i.e., MOS nodes) in the high-impedance nodes, and its parameter vector... These are subsets of the unknown vector x that needs to be solved. F(x) represents the original circuit equation of the DC circuit. h(x,λ1) represents the homotopy equation. x is the unknown vector to be solved, consisting of the node voltages of the DC circuit and the internal currents of the independent voltage sources. λ1 represents the first homotopy parameter.

[0085] In other aspects of this embodiment of the invention, step 300, iteratively solving for the voltages of all the high-resistance nodes based on the first homotopy function to obtain an initial homotopy solution, includes:

[0086] Repeat the following steps until the first homotopy parameter equals the first set threshold:

[0087] Step 310: Solve for the voltage of all the high-resistivity nodes based on the first homotopy function;

[0088] Step 320: Trace the homotopy solution curve based on the prediction-correction method;

[0089] Step 330: Increment the first homotopy parameter based on the current step size;

[0090] Step 340: Update the final solution of the voltage of all the high-impedance nodes and the first homotopy parameter for the next iteration;

[0091] The iteration ends when the first homotopy parameter equals a first set threshold, and the solution for the voltages of all the high-resistivity nodes is the initial homotopy solution. In this embodiment, while setting the second homotopy parameter λ2≡0, the first homotopy parameter λ1 gradually changes from 0 to 1, for example, increasing by 0.1 each time. When the first homotopy parameter λ1 is strictly equal to 1, the first conductance Gmin connected to the high-resistivity node is completely eliminated. The solution for the voltages of all the high-resistivity nodes at this time is the initial homotopy solution.

[0092] It should be noted that the embodiments of the present invention use a prediction-correction method to track the homotopy solution curve. While ensuring continuous tracking of the homotopy path, it also keeps the original matrix dimension unchanged, providing a good interface for existing SPICE-like simulators.

[0093] In other aspects of the embodiments of the present invention, the second homotopy function is constructed based on the second homotopy parameter, the current gain of the three-terminal switching device in the non-high impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0094] Specifically, in one embodiment, the second homotopy function is as shown in formula (9):

[0095]

[0096] Formula (9) is the second homotopy function, where m represents the number of non-high-impedance nodes. Em is the identity matrix. The nonlinear function g(·) defines the current gain of the three-terminal switching device (i.e., MOS node) in the high-impedance node, and its parameter vector... These are subsets of the unknown vector x that needs to be solved. F(x) represents the original circuit equation of the DC circuit. h(x,λ2) represents the homotopy equation. x is the unknown vector to be solved, consisting of the node voltages of the DC circuit and the internal currents of the independent voltage sources. λ2 represents the second homotopy parameter.

[0097] In other aspects of this invention, step 500, the iterative solution of the voltages of all the non-high-resistance nodes based on the initial homotopy solution and the second homotopy function, includes:

[0098] Repeat the following steps until the second homotopy parameter equals the second set threshold:

[0099] Step 510: Solve for the voltage of all the non-high resistance nodes based on the initial homotopy solution and the second homotopy function.

[0100] Step 520: Trace the homotopy solution curve based on the prediction-correction method.

[0101] Step 530: Increment the second homotopy parameter based on the current step size.

[0102] Step 540: Update the final solution of the voltage of all the non-high impedance nodes and the second homotopy parameter for the next iteration.

[0103] When the second homotopy parameter is equal to the second set threshold, the solution for the voltage of all the non-high resistance nodes is the homotopy converged solution.

[0104] The iteration ends when the second homotopy parameter equals the second set threshold, and the solution for obtaining the voltages of all the non-high-resistance nodes is the homotopy converged solution. In this embodiment of the invention, while setting the first homotopy parameter λ1≡1, the second homotopy parameter λ2 gradually changes from 0 to 1. For example, it increases by 0.1 each time. When the second homotopy parameter λ2 is sufficiently close to 1, we can consider the solution at this point to be the correct homotopy converged solution, which is a solution sufficiently close to the true DC solution (true DC solution, DC stands for direct-current).

[0105] It should be noted that the embodiments of the present invention use a prediction-correction method to track the homotopy solution curve. While ensuring continuous tracking of the homotopy path, it also keeps the original matrix dimension unchanged, providing a good interface for existing SPICE-like simulators.

[0106] In summary, to evaluate the practical effect of the embodiments of the present invention, an industrial DC circuit was tested. This circuit consists of 69,334 devices (including 715 MOS transistors). The solution curve for the high-impedance node (HiZ node) is shown below. Figure 3 As shown in (a). Figure 3 In (a), the horizontal axis represents the first and second homotopy parameters, and the vertical axis represents the node voltage, in V. For this circuit, we can see that the existing homotopy method can converge successfully, but fails to converge in the final Newton iteration stage. As expected, through the DC circuit verification method of this embodiment, the DC circuit successfully converges to its true DC solution in the final Newton iteration stage. The homotopy converged solution of this embodiment is 3.58V, which is close to the true DC solution of 3.73V. This achieves fast and robust DC circuit analysis. The detailed solution curve (λ→1) of the final stage is shown below. Figure 3 As shown in (b). Figure 3 In (b), the horizontal axis represents the second homotopy parameter, and the vertical axis represents the node voltage, in V. Figure 3(b) It can be observed that the final convergence voltage of the existing homotopy method is very close to zero, which is far from the true DC solution. This phenomenon is consistent with... Figure 2 The phenomena described in the text are consistent.

[0107] It is also worth noting that although the framework proposed in this embodiment of the invention requires a two-stage extension, it does not introduce much additional overhead, because the solution stages for the high-impedance node voltages can usually be easily brought to a steady state with a small number of iterations.

[0108] The DC circuit verification device provided by the present invention is described below. The DC circuit verification device described below and the DC circuit verification method described above can be referred to in correspondence.

[0109] Please refer to Figure 4 The present invention also provides a DC circuit verification device, comprising:

[0110] Module 201 is used to determine all high-resistance nodes and non-high-resistance nodes in a DC circuit.

[0111] The first adjustment module 202 is used to ground a first conductance to all the high-resistance nodes; to ground a second conductance to all the non-high-resistance nodes; and to adjust the current gain of the three-terminal switching devices in all the high-resistance nodes and the magnitude of the first conductance based on the first homotopy parameter.

[0112] The first iterative solution module 203 is used to iteratively solve the voltage of all the high-resistance nodes based on the first homotopy function to obtain the initial homotopy solution; the first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching device in the high-resistance node;

[0113] The second adjustment module 204 is used to adjust the current gain and the second conductance of the three-terminal switching devices in all the non-high resistance nodes based on the second homotopy parameter.

[0114] The second iterative solution module 205 is used to iteratively solve the voltage of all the non-high-impedance nodes based on the initial homotopy solution and the second homotopy function to obtain the homotopy converged solution; the second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high-impedance node;

[0115] Verification module 206 is used to verify the homotopy convergent solution based on Newton's iteration method to obtain the DC steady-state solution.

[0116] This invention provides an embodiment for iteratively solving the voltage of all high-resistance nodes in a DC circuit using a first homotopy function and a first homotopy parameter; and iteratively solving the voltage of all non-high-resistance nodes in the DC circuit using a second homotopy function and a second homotopy parameter. Thus, by using the first and second homotopy parameters, and the iterative solution in two stages, independent solutions are achieved for high-resistance nodes and non-high-resistance nodes respectively. This solves the problem that while existing homotopy methods converge normally, the solutions obtained by the homotopy method differ significantly from the true steady-state solutions of the DC circuit, enabling fast and robust DC circuit analysis.

[0117] According to a DC circuit verification device provided by the present invention, the first homotopy function is constructed based on the first homotopy parameter, the current gain of the three-terminal switching device in the high-impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0118] The second homotopy function is constructed based on the second homotopy parameter, the current gain of the three-terminal switching device in the non-high impedance node, the original circuit equation of the DC circuit, and the identity matrix.

[0119] According to a DC circuit verification device provided by the present invention, the first iterative solution module includes:

[0120] The first solution module is used to solve for the voltage of all the high-resistivity nodes based on the first homotopy function;

[0121] The first tracking module is used to track the homotopy solution curve based on the prediction-correction method;

[0122] The first increment module is used to increment the first homotopy parameter based on the current step size;

[0123] The first update module is used to update the final solution of the voltage of all the high-impedance nodes and the first homotopy parameter for the next iteration;

[0124] When the first homotopy parameter is equal to the first set threshold, the solution for obtaining the voltage of all the high-resistance nodes is the initial homotopy solution.

[0125] According to a DC circuit verification device provided by the present invention, the second iterative solution module includes:

[0126] The second solution module is used to solve for the voltage of all the non-high resistance nodes based on the initial homotopy solution and the second homotopy function;

[0127] The second tracking module is used to track the homotopy solution curve based on the prediction-correction method;

[0128] The second increment module is used to increment the second homotopy parameter based on the current step size;

[0129] The second update module is used to update the final solution of the voltage of all the non-high impedance nodes and the second homotopy parameter for the next iteration;

[0130] When the second homotopy parameter is equal to the second set threshold, the solution for the voltage of all the non-high resistance nodes is the homotopy converged solution.

[0131] Figure 5 An example is a schematic diagram of the physical structure of an electronic device, such as... Figure 5 As shown, the electronic device may include: a processor 510, a communication interface 520, a memory 530, and a communication bus 540, wherein the processor 510, the communication interface 520, and the memory 530 communicate with each other through the communication bus 540. Processor 510 can call logic instructions in memory 530 to execute a DC circuit verification method, which includes: determining all high-resistance nodes and non-high-resistance nodes in the DC circuit; grounding a first conductance to all the high-resistance nodes; grounding a second conductance to all the non-high-resistance nodes; adjusting the current gain of the three-terminal switching devices in all the high-resistance nodes and the magnitude of the first conductance based on a first homotopy parameter; iteratively solving the voltage of all the high-resistance nodes based on a first homotopy function to obtain an initial homotopy solution; constructing the first homotopy function based on the first homotopy parameter and the current gain of the three-terminal switching devices in the high-resistance nodes; adjusting the current gain of the three-terminal switching devices in all the non-high-resistance nodes and the magnitude of the second conductance based on a second homotopy parameter; iteratively solving the voltage of all the non-high-resistance nodes based on the initial homotopy solution and the second homotopy function to obtain a homotopy converged solution; constructing the second homotopy function based on the second homotopy parameter and the current gain of the three-terminal switching devices in the non-high-resistance nodes; and verifying the homotopy converged solution using Newton's iteration method to obtain a DC steady-state solution.

[0132] Furthermore, the logical instructions in the aforementioned memory 530 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, essentially, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0133] On the other hand, the present invention also provides a computer program product, which includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer is able to execute the DC circuit verification method provided by the above methods. The method includes: determining all high-resistance nodes and non-high-resistance nodes in the DC circuit; grounding a first conductance to all the high-resistance nodes; grounding a second conductance to all the non-high-resistance nodes; adjusting the current gain of the three-terminal switching devices in all the high-resistance nodes and the magnitude of the first conductance based on a first homotopy parameter; and adjusting the current gain of the three-terminal switching devices in all the high-resistance nodes and the magnitude of the first conductance based on the first homotopy function. The voltage of the high-impedance node is iteratively solved to obtain an initial homotopy solution; the first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching device in the high-impedance node; the current gain of the three-terminal switching device in all the non-high-impedance nodes and the second conductance are adjusted based on the second homotopy parameter; the voltage of all the non-high-impedance nodes is iteratively solved based on the initial homotopy solution and the second homotopy function to obtain a homotopy converged solution; the second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high-impedance node; the homotopy converged solution is verified using the Newton iteration method to obtain a DC steady-state solution.

[0134] In another aspect, the present invention also provides a non-transitory computer-readable storage medium storing a computer program thereon, which, when executed by a processor, performs the DC circuit verification method provided by the methods described above. The method includes: determining all high-resistance nodes and non-high-resistance nodes in the DC circuit; grounding a first conductance to all said high-resistance nodes; grounding a second conductance to all said non-high-resistance nodes; adjusting the current gain of the three-terminal switching devices in all said high-resistance nodes and the magnitude of the first conductance based on a first homotopy parameter; and iteratively solving for the voltage of all said high-resistance nodes based on a first homotopy function. An initial homotopy solution is obtained; the first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching device in the high-impedance node; the current gain of the three-terminal switching device in all the non-high-impedance nodes and the second conductance are adjusted based on the second homotopy parameter; the voltage of all the non-high-impedance nodes is iteratively solved based on the initial homotopy solution and the second homotopy function to obtain a homotopy converged solution; the second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high-impedance node; the homotopy converged solution is verified based on the Newton iteration method to obtain a DC steady-state solution.

[0135] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0136] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0137] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A direct current circuit verification method characterized by, include: Identify all high-impedance nodes and non-high-impedance nodes in the DC circuit; A first conductance is grounded for all the aforementioned high-resistance nodes; A second conductance is grounded for all the non-high-impedance nodes; the current gain of the three-terminal switching devices in all the high-impedance nodes and the magnitude of the first conductance are adjusted based on the first homotopy parameter. The voltage of all the high-resistance nodes is iteratively solved based on the first homotopy function to obtain the initial homotopy solution; The first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching device in the high-impedance node; The current gain and the second conductance of the three-terminal switching devices in all the non-high-impedance nodes are adjusted based on the second homotopy parameter. The voltages of all non-high-resistance nodes are iteratively solved based on the initial homotopy solution and the second homotopy function to obtain the homotopy converged solution. The second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high impedance node; The DC steady-state solution is obtained by verifying the homotopy convergent solution using the Newton-Raphson iteration method.

2. The DC circuit verification method according to claim 1, characterized in that, The iterative solution of the voltages of all high-resistance nodes based on the first homotopy function to obtain the initial homotopy solution includes: Repeat the following steps until the first homotopy parameter equals the first set threshold: The voltages of all the high-resistivity nodes are solved based on the first homotopy function; Tracing homotopy solution curves based on the prediction-correction method; The first homotopy parameter is incremented based on the current step size; Update the final solution of the voltages of all the high-impedance nodes and the first homotopy parameter for the next iteration; When the first homotopy parameter is equal to the first set threshold, the solution for obtaining the voltage of all the high-resistance nodes is the initial homotopy solution.

3. The direct current circuit verification method of claim 1, wherein The first homotopy function is constructed based on the first homotopy parameter, the current gain of the three-terminal switching device in the high-impedance node, the original circuit equation of the DC circuit, and the identity matrix.

4. The direct current circuit verification method of claim 1, wherein The iterative solution for the voltages of all non-high-resistance nodes based on the initial homotopy solution and the second homotopy function includes: Repeat the following steps until the second homotopy parameter equals the second set threshold: The voltages of all non-high-resistance nodes are solved based on the initial homotopy solution and the second homotopy function; Tracing homotopy solution curves based on the prediction-correction method; The second homotopy parameter is incremented based on the current step size; Update the final solution of the voltage of all the non-high-impedance nodes and the second homotopy parameter for the next iteration; When the second homotopy parameter is equal to the second set threshold, the solution for the voltage of all the non-high resistance nodes is the homotopy converged solution.

5. The direct current circuit verification method of claim 1, wherein The second homotopy function is constructed based on the second homotopy parameter, the current gain of the three-terminal switching device in the non-high impedance node, the original circuit equation of the DC circuit, and the identity matrix.

6. A direct current circuit verification device characterized by, include: The determination module is used to identify all high-impedance nodes and non-high-impedance nodes in a DC circuit; The first adjustment module is used to ground a first conductance to all the high-impedance nodes; to ground a second conductance to all the non-high-impedance nodes; and to adjust the current gain of the three-terminal switching devices in all the high-impedance nodes and the magnitude of the first conductance based on the first homotopy parameter. The first iterative solution module is used to iteratively solve the voltage of all the high-resistance nodes based on the first homotopy function to obtain the initial homotopy solution; The first homotopy function is constructed based on the first homotopy parameter and the current gain of the three-terminal switching device in the high-impedance node; The second adjustment module is used to adjust the current gain and the second conductance of the three-terminal switching devices in all the non-high resistance nodes based on the second homotopy parameter. The second iterative solution module is used to iteratively solve the voltage of all the non-high resistance nodes based on the initial homotopy solution and the second homotopy function to obtain the homotopy converged solution. The second homotopy function is constructed based on the second homotopy parameter and the current gain of the three-terminal switching device in the non-high impedance node; The verification module is used to verify the homotopy convergent solution based on Newton's iteration method to obtain the DC steady-state solution.

7. The DC circuit verification device according to claim 6, characterized in that, The first homotopy function is constructed based on the first homotopy parameter, the current gain of the three-terminal switching device in the high-impedance node, the original circuit equation of the DC circuit, and the identity matrix. The second homotopy function is constructed based on the second homotopy parameter, the current gain of the three-terminal switching device in the non-high impedance node, the original circuit equation of the DC circuit, and the identity matrix.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the DC circuit verification method as described in any one of claims 1 to 5. 9.A non-transitory computer-readable storage medium having stored thereon a computer program, characterized in that, When the computer program is executed by the processor, it implements the DC circuit verification method as described in any one of claims 1 to 5.

10. A computer program product comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the DC circuit verification method as described in any one of claims 1 to 5.

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