Flying probe test apparatus, method, device and storage medium

Abstract

The application discloses a flying probe testing device, method, equipment and storage medium, the flying probe testing device is applied to a flying probe testing machine, the flying probe testing machine includes a motion control system, the flying probe testing device includes an industrial computer, a main control module and a signal board module, the industrial computer outputs a first test instruction to the motion control system, so that the motion control system moves to a preset position, and receives a just-in-place signal fed back by the motion control system, and a second test instruction is output according to the just-in-place signal, the main control module and the industrial computer are connected by using a gigabit network cable, the main control module outputs an element detection signal according to the second test instruction, the signal board module is connected with the main control module through a flexible multi-core twisted-pair shielded wire, the signal board module feeds back a flying probe detection signal to the main control module according to the element detection signal, so that the main control module calculates target element parameters according to the flying probe detection signal.The application can improve the anti-interference ability of cable transmission signals, and in turn reduce the loss of cable transmission signals.

Description

Technical Field

[0001] This invention relates to the field of printed circuit board technology, and in particular to a flying probe testing device, method, equipment, and storage medium. Background Technology

[0002] Currently, flying probe testers are mainly used for testing bare PCB boards to test open or short circuits on the boards. Flying probe testers mainly use standard instruments or integrated standard ICT testers. The test module needs to be placed in a fixed position on the machine, and then connected to the test probe through a long cable before outputting to the component under test. Because long cables have signal loss, and the cable passing through a strong electromagnetic interference environment will also cause signal distortion, thus affecting the test accuracy. Summary of the Invention

[0003] This invention aims to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes a flying probe testing device that can improve the anti-interference capability of cable transmission signals, thereby reducing the loss of cable transmission signals.

[0004] This invention also proposes a flying needle testing method.

[0005] The present invention also proposes a flying probe testing device.

[0006] The present invention also proposes a computer-readable storage medium.

[0007] In a first aspect, one embodiment of the present invention provides a flying probe testing apparatus, which is applied to a flying probe testing machine, the flying probe testing machine including a motion control system, and the flying probe testing apparatus comprising:

[0008] An industrial control computer is used to output a first test command to the motion control system so that the built-in probe of the motion control system moves to a preset position, and receives the positioning signal fed back by the motion control system, and outputs a second test command according to the positioning signal.

[0009] The main control module, which is connected to the industrial computer via a gigabit network cable, is used to output component detection signals according to the second test command;

[0010] The signal board module is connected to the main control module via a flexible multi-core twisted-pair shielded cable. It is used to feed back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module can calculate the target component parameters based on the flying probe detection signal.

[0011] The flying probe testing device of this invention has at least the following beneficial effects: The user outputs a first test command to the motion control system via an industrial control computer. After receiving the first test command, the motion control system obtains the preset position to which the built-in probe needs to move. The motion control system moves the built-in probe to the preset position and controls the built-in linear motor to press the built-in probe down to the test point on the component under test. Then, the motion control system feeds back a positioning signal to the industrial control computer. After receiving the positioning signal, the industrial control computer outputs a second test command to the main control module via a gigabit network cable. After receiving the second test command, the main control module starts the built-in signal source and outputs the component test signal to the signal board module via a multi-core twisted pair shielded cable. After receiving the component test signal, the signal board module tests the component under test. The component under test feeds back a flying probe detection signal to the main control module. The main control module calculates the target component parameters based on the flying probe detection signal. The industrial control computer outputs a first test command, causing the motion control system to move the built-in probe to the test point of the component under test. The industrial control computer then outputs a second test command, causing the main control module to output a component test signal through a multi-core twisted-pair shielded cable. This enables the signal board module to test the component under test and feed back the flying probe detection signal to the main control module. The main control module calculates the target component parameters based on the flying probe detection signal, which can improve the anti-interference capability of the cable transmission signal and reduce the loss of the cable transmission signal.

[0012] According to other embodiments of the flying probe testing apparatus of the present invention, the component detection signal includes a first detection signal, the flying probe detection signal includes a first feedback signal, and the main control module includes:

[0013] The main control processor is composed of ARM and FPGA;

[0014] A digital-to-analog converter, one end of which is connected to the main control processor and the other end of which is connected to the signal board module, is used to set the first detection signal and output the first detection signal to the signal board module;

[0015] A filter, connected to the signal board module, is used to improve the stability of the first feedback signal;

[0016] A signal sampler, one end of which is connected to the filter and the other end of which is connected to the main control processor, is used to collect the first feedback signal.

[0017] According to other embodiments of the flying probe testing apparatus of the present invention, the flying probe detection signal further includes a second feedback signal, and the main control module further includes:

[0018] An analog-to-digital converter, one end of which is connected to the main control processor and the other end of which is connected to the signal board module, is used to read the second feedback signal fed back by the signal board module based on the first detection signal.

[0019] According to other embodiments of the flying probe testing apparatus of the present invention, the component detection signal further includes a second detection signal, and the main control module further includes:

[0020] A digital synthesizer, connected to the main control processor, is used to generate the second detection signal for testing capacitors or inductors;

[0021] An operational amplifier, one end of which is connected to the digital synthesizer and the other end of which is connected to the signal board module, is used to discharge and follow the second detection signal.

[0022] Secondly, an embodiment of the present invention provides a flying probe testing method, which is applied to a flying probe testing machine. The flying probe testing machine includes a motion control system and a flying probe testing device. The flying probe testing device includes an industrial computer, a main control module, and a signal board module. The flying probe testing device is as described in the first aspect. The flying probe testing method includes:

[0023] The industrial control computer is controlled to output a first test command to the motion control system, so that the motion control system moves to a preset position, and receives the positioning signal fed back by the motion control system, and outputs a second test command according to the positioning signal;

[0024] The main control module is controlled to output component detection signals according to the second test command;

[0025] The control signal board module feeds back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module can calculate the target component parameters based on the flying probe detection signal.

[0026] The flying probe testing method of this invention has at least the following beneficial effects: The industrial control computer outputs a first test command to the motion control system. After receiving the first test command, the motion control system obtains the preset position to which the built-in probe needs to move, moves the built-in probe to the preset position, and controls the built-in linear motor to press the built-in probe down to the test point on the component under test. A feedback positioning signal is output to the industrial control computer. After receiving the positioning signal, the industrial control computer outputs a second test command to the main control module via a gigabit network cable. After receiving the second test command, the main control module starts the built-in signal source and outputs a component test signal to the signal board module via a multi-core twisted-pair shielded cable. After receiving the component test signal, the signal board module tests the component under test. The component under test feeds back a flying probe detection signal to the main control module, which then calculates the target component parameters based on the flying probe detection signal. The industrial control computer outputs a first test command, causing the motion control system to move the built-in probe to the test point of the component under test. The industrial control computer then outputs a second test command, causing the main control module to output a component test signal through a multi-core twisted-pair shielded cable. This enables the signal board module to test the component under test and feed back the flying probe detection signal to the main control module. The main control module calculates the target component parameters based on the flying probe detection signal, which can improve the anti-interference capability of the cable transmission signal and reduce the loss of the cable transmission signal.

[0027] According to other embodiments of the flying probe testing method of the present invention, the component detection signal includes a first detection signal, the first detection signal including a resistance detection signal, the flying probe detection signal including a first feedback signal, the first feedback signal including a resistance feedback signal, the target component parameter including a target resistance parameter, the main control module including: a main control processor, a digital-to-analog converter, and a signal sampler, the control signal board module feeding back the flying probe detection signal to the main control module according to the component detection signal, so that the main control module calculates the target component parameter according to the flying probe detection signal, including:

[0028] The main control processor controls the digital-to-analog converter to set the resistance detection signal according to the second test instruction, and outputs the resistance detection signal to the signal board module;

[0029] The control signal board module starts the built-in constant current source according to the resistance detection signal. The constant current source outputs the detection current to the resistor under test, so that the resistor under test generates the resistance feedback signal.

[0030] The signal sampler is controlled to sample the resistance feedback signal and output the resistance feedback signal to the main control processor, so that the main control processor can calculate the target resistance parameter based on the resistance feedback signal.

[0031] According to other embodiments of the flying probe testing method of the present invention, the component detection signal further includes a second detection signal, the second detection signal including a capacitance detection signal, the first feedback signal including a capacitance feedback signal, the target component parameters including target capacitance parameters, the main control module further including: a digital synthesizer, the control signal board module feeding back the flying probe detection signal to the main control module according to the component detection signal, so that the main control module calculates the target component parameters according to the flying probe detection signal, and further including:

[0032] The main control processor controls the digital synthesizer to generate the capacitance detection signal with a preset first frequency and a preset first amplitude according to the second test instruction;

[0033] The main control processor is controlled to perform differential processing on the capacitance detection signal to obtain a differential capacitance detection signal;

[0034] The signal board module is controlled to perform signal restoration processing on the differential capacitance detection signal to obtain the capacitance detection signal, and the capacitance detection signal is input to the capacitor under test so that the capacitor under test generates the capacitance feedback signal.

[0035] The signal sampler is controlled to sample the capacitance feedback signal and output the capacitance feedback signal to the main control processor, so that the main control processor can calculate the target capacitance parameter based on the capacitance feedback signal.

[0036] According to other embodiments of the flying probe testing method of the present invention, the second detection signal includes an inductance detection signal, the first feedback signal includes an inductance feedback signal, the target component parameters include target inductance parameters, and the control signal board module feeds back the flying probe detection signal to the main control module according to the component detection signal, so that the main control module calculates the target component parameters according to the flying probe detection signal, further comprising:

[0037] The main control processor controls the digital synthesizer to generate the inductor detection signal with a preset second frequency and a preset second amplitude according to the second test instruction;

[0038] The main control processor is controlled to perform differential processing on the inductor detection signal to obtain a differential inductor detection signal;

[0039] The signal board module controls the differential inductor detection signal to perform signal restoration processing to obtain the inductor detection signal, and inputs the inductor detection signal to the inductor under test so that the inductor under test generates the inductor feedback signal;

[0040] The signal sampler is controlled to sample the inductor feedback signal and output the inductor feedback signal to the main control processor, so that the main control processor can calculate the target inductor parameters based on the inductor feedback signal.

[0041] Thirdly, one embodiment of the present invention provides a flying probe testing device, comprising:

[0042] At least one processor, and,

[0043] A memory communicatively connected to the at least one processor; wherein,

[0044] The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the flying probe testing method as described in the second aspect.

[0045] Fourthly, one embodiment of the present invention provides a computer-readable storage medium storing computer-executable instructions for causing a computer to perform the flying probe testing method as described in the second aspect.

[0046] Other features and advantages of this application will be set forth in the following description and will be apparent in part from the description or may be learned by practicing the application. The objectives and other advantages of this application may be realized and obtained by means of the structures particularly pointed out in the description and the accompanying drawings. Attached Figure Description

[0047] Figure 1 This is a module block diagram of a specific embodiment of the flying probe testing machine in this invention;

[0048] Figure 2 This is a circuit schematic diagram of a specific embodiment of the main control module and signal board module in this invention.

[0049] Figure 3 This is a schematic flowchart of a specific embodiment of the flying needle testing method in this invention;

[0050] Figure 4 yes Figure 3 A schematic diagram of a specific embodiment of step S303;

[0051] Figure 5 yes Figure 3 A schematic diagram of another specific embodiment of step S303;

[0052] Figure 6 yes Figure 3 A schematic diagram of another specific embodiment of step S303. Detailed Implementation

[0053] The following will describe the concept and technical effects of the present invention clearly and completely with reference to embodiments, so as to fully understand the purpose, features and effects of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are all within the scope of protection of the present invention.

[0054] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0055] It should be noted that although the system diagram shows functional modules and the flowchart shows the logical order, in some cases, the steps shown or described may be executed in a different order than the module division in the system or the order in the flowchart.

[0056] In the description of this invention, unless otherwise explicitly defined, terms such as "set up," "install," and "connect" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this invention in conjunction with the specific content of the technical solution.

[0057] In the description of the embodiments of the present invention, the term "several" means one or more, and the term "multiple" means two or more. The terms "greater than," "less than," and "exceeding" should be understood as excluding the stated number, while the terms "above," "below," and "within" should be understood as including the stated number. The terms "first" and "second" should be understood as distinguishing technical features, and not as indicating or implying relative importance, the number of indicated technical features, or the order of the indicated technical features.

[0058] Currently, flying probe testers are mainly used for testing bare PCB boards to test open or short circuits on the boards. Flying probe testers mainly use standard instruments or integrated standard ICT testers. The test module needs to be placed in a fixed position on the machine, and then connected to the test probe through a long cable before outputting to the component under test. Because long cables have signal loss, and the cable passing through a strong electromagnetic interference environment will also cause signal distortion, thus affecting the test accuracy.

[0059] Current flying probe testers mainly use standard instruments or integrated standard ICT testers, which have disadvantages such as large size, weak secondary development capabilities, great dependence on the testing environment and test lead length, weak anti-interference capabilities, and low test coverage for complex circuit boards. This invention adopts a modular integrated design, reducing its size to half that of conventional ICT testers. Furthermore, with its self-developed underlying program, it allows for the development of more configuration parameters for users, facilitating secondary development and improving the versatility of the flying probe tester and user work efficiency.

[0060] This invention aims to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes a flying probe testing device that can improve the anti-interference capability of cable transmission signals, thereby reducing the loss of cable transmission signals.

[0061] Please refer to Figure 1 , Figure 1 This invention discloses a module block diagram of a flying probe testing machine according to one embodiment. In some embodiments, the flying probe testing device is applied to the flying probe testing machine, which includes a motion control system. The flying probe testing device includes an industrial computer, a main control module, and a signal board module. The industrial computer is used to output a first test command to the motion control system to move the built-in probe of the motion control system to a preset position, and to receive a positioning signal fed back by the motion control system, and output a second test command according to the positioning signal. The main control module and the industrial computer are connected using a gigabit network cable. The main control module is used to output a component detection signal according to the second test command. The signal board module is connected to the main control module through a flexible multi-core twisted-pair shielded cable. The main control module is used to feed back the flying probe detection signal to the main control module according to the component detection signal, so that the main control module can calculate the target component parameters according to the flying probe detection signal.

[0062] The industrial control computer outputs a first test command to the motion control system. Upon receiving the first test command, the motion control system obtains the preset position to which the built-in probe needs to move. The motion control system moves the built-in probe to the preset position and controls the built-in linear motor to press the built-in probe down onto the test point on the component under test (DUT). It outputs a feedback positioning signal to the industrial control computer. Upon receiving the positioning signal, the industrial control computer outputs a second test command to the main control module via a gigabit network cable. Upon receiving the second test command, the main control module starts the built-in signal source and outputs the component test signal to the signal board module via a multi-core twisted-pair shielded cable. Upon receiving the component test signal, the signal board module tests the DUT. The DUT feeds back a flying probe detection signal to the main control module, which then calculates the target component parameters based on the flying probe detection signal. The industrial control computer outputs a first test command, causing the motion control system to move the built-in probe to the test point of the component under test. The industrial control computer then outputs a second test command, causing the main control module to output a component test signal through a multi-core twisted-pair shielded cable. This enables the signal board module to test the component under test and feed back the flying probe detection signal to the main control module. The main control module calculates the target component parameters based on the flying probe detection signal, which can improve the anti-interference capability of the cable transmission signal and reduce the loss of the cable transmission signal.

[0063] It should be noted that the industrial control computer is equipped with host computer control software. The testing system consists of a main control module and signal board modules for eight motion axis pin ends. The industrial control computer and the main control module are connected via a network cable using 1000M TCP / IP protocol communication, which improves the stability and transmission rate of control commands. The main control board and the pin end signal boards are connected via flexible multi-core twisted-pair shielded cable. Using shielded twisted-pair cable to transmit differential and power signals improves the anti-interference capability of signal transmission and ensures signal stability. Simultaneously, the highly flexible cable can withstand high-speed bending during axis movement.

[0064] The user sends the first test command to the motion control system via the industrial control computer. The motion control system uses the coordinates of each component on the circuit board under test exported from the host computer software to calculate the preset position to which the built-in probe needs to move. It then moves the built-in probe to the preset position and controls the linear motor to descend the corresponding motion axis, moving the built-in probe to the corresponding coordinate point and pressing it down to pierce the corresponding component pad or test point. Finally, it sends a signal indicating successful probe placement to the industrial control computer, which then sends a corresponding command to the main control module of the test system via the host computer software. The second test command activates the main control module's built-in signal source and outputs a component test signal to the signal board module, enabling the signal board module to activate its built-in signal source to test the component under test on the circuit board. After a delay, once the signal sources of both the main control module and the signal board module are stable, the main control module acquires the corresponding flying probe detection signal and calculates the target component parameters based on the acquired flying probe detection signal. Finally, the calculated target component parameters are fed back to the host computer software, where they are displayed to the test technicians and stored in the corresponding test table.

[0065] Please refer to Figure 2 , Figure 2 This invention discloses a block diagram of a main control module and a signal board module according to one embodiment. In some embodiments, the component detection signal includes a first detection signal, and the flying probe detection signal includes a first feedback signal. The main control module includes a main control processor, a digital-to-analog converter (DAC), a filter, and a signal sampler. The main control processor is composed of an ARM processor and an FPGA. One end of the DAC is connected to the main control processor, and the other end is connected to the signal board module. The DAC is used to set the first detection signal and output the first detection signal to the signal board module. The filter is connected to the signal board module and is used to improve the stability of the first feedback signal. One end of the signal sampler is connected to the filter, and the other end is connected to the main control processor. The signal sampler is used to acquire the first feedback signal.

[0066] It should be noted that, Figure 2 This is the circuit schematic showing the connection between the main control module and a signal board module. The connections of other signal board modules are also shown. Figure 2 The connection structure is the same. The main control processor is... Figure 2 The MCU processor in the middle has a digital-to-analog converter. Figure 2 The DAC component and filter are... Figure 2 The filter element and signal sampler in the middle are Figure 2 The DMM-Module component in the system. Among them, Figure 2 There are two circuit boards: one for the main control processor, which is the main control module, and the other for the signal board module.

[0067] The main control processor, internally composed of an ARM and an FPGA, is capable of high-speed logic processing and data computation. Users set the corresponding voltage signal value via a digital-to-analog converter to obtain the first detection signal. The signal sampler is a high-precision DC and AC voltage and current sampling module. Filters improve the anti-interference capability and stability of signal transmission.

[0068] Please refer to Figure 2 In some embodiments, the flying probe detection signal further includes a second feedback signal, and the main control module further includes an analog-to-digital converter, one end of which is connected to the main control processor and the other end is connected to the signal board module. The analog-to-digital converter is used to read the second feedback signal fed back by the signal board module based on the first detection signal.

[0069] It should be noted that the analog-to-digital converter is... Figure 2 The ADC component in the circuit is used to read the value of the voltage signal set by the digital-to-analog converter to obtain the second feedback signal.

[0070] Please refer to Figure 2 In some embodiments, the component detection signal further includes a second detection signal. The main control module also includes a digital synthesizer and an operational amplifier. The digital synthesizer is connected to the main control processor and is used to generate a second detection signal for testing the capacitor or inductor. One end of the operational amplifier is connected to the digital synthesizer, and the other end is connected to the signal board module. The operational amplifier is used to discharge and follow the second detection signal.

[0071] It should be noted that the digital synthesizer is Figure 2 The DDS component in the diagram is a digital synthesis chip that converts a series of digital signals into analog signals via a digital-to-analog converter. It is used to generate a second detection signal for testing, where the second detection signal is an AC signal. The operational amplifier is... Figure 2 The INA element in [the text].

[0072] Please refer to Figure 3 , Figure 3 This is a schematic flowchart of a flying probe testing method according to an embodiment of the present invention. In some embodiments, the flying probe testing method is applied to a flying probe testing machine, which includes a motion control system and a flying probe testing device. The flying probe testing device includes an industrial control computer, a main control module, and a signal board module. The flying probe testing device is like the flying probe testing device of the first aspect. The flying probe testing method specifically includes, but is not limited to, steps S301 to S303.

[0073] Step S301: Control the industrial control computer to output the first test command to the motion control system so that the built-in probe of the motion control system moves to the preset position and receives the positioning signal fed back by the motion control system, and outputs the second test command according to the positioning signal.

[0074] Step S302: The main control module outputs the component detection signal according to the second test command;

[0075] In step S303, the control signal board module feeds back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module can calculate the target component parameters based on the flying probe detection signal.

[0076] In steps S301 to S303 of this embodiment, the industrial control computer outputs a first test command to the motion control system. After receiving the first test command, the motion control system obtains the preset position to which the built-in probe needs to move, moves the built-in probe to the preset position, and controls the built-in linear motor to press the built-in probe down to the test point on the component under test. It outputs a feedback positioning signal to the industrial control computer. After receiving the positioning signal, the industrial control computer outputs a second test command to the main control module through a gigabit network cable. After receiving the second test command, the main control module starts the built-in signal source and outputs the component test signal to the signal board module through a multi-core twisted pair shielded cable. After receiving the component test signal, the signal board module tests the component under test. The component under test feeds back a flying probe detection signal to the main control module, and the main control module calculates the target component parameters based on the flying probe detection signal. The industrial control computer outputs a first test command, causing the motion control system to move the built-in probe to the test point of the component under test. The industrial control computer then outputs a second test command, causing the main control module to output a component test signal through a multi-core twisted-pair shielded cable. This enables the signal board module to test the component under test and feed back the flying probe detection signal to the main control module. The main control module calculates the target component parameters based on the flying probe detection signal, which can improve the anti-interference capability of the cable transmission signal and reduce the loss of the cable transmission signal.

[0077] Please refer to Figure 4 , Figure 4 This is a schematic flowchart of a flying probe testing method according to an embodiment of the present invention. In some embodiments, the component detection signal includes a first detection signal, which includes a resistance detection signal; the flying probe detection signal includes a first feedback signal, which includes a resistance feedback signal; the target component parameter includes a target resistance parameter; the main control module includes a main control processor, a digital-to-analog converter, and a signal sampler; the control signal board module feeds back the flying probe detection signal to the main control module according to the component detection signal, so that the main control module calculates the target component parameter according to the flying probe detection signal, specifically including but not limited to steps S401 to S403.

[0078] Step S401: Control the main control processor to control the digital-to-analog converter to set the resistance detection signal according to the second test instruction, and output the resistance detection signal to the signal board module;

[0079] In step S402, the control signal board module starts the built-in constant current source according to the resistance detection signal. The constant current source outputs the detection current to the resistor under test so that the resistor under test generates a resistance feedback signal.

[0080] In step S403, the control signal sampler samples the resistance feedback signal and outputs the resistance feedback signal to the main control processor, so that the main control processor can calculate the target resistance parameters based on the resistance feedback signal.

[0081] In steps S401 to S403 of this embodiment, after receiving the second test command, the main control processor sends a corresponding control signal to the digital-to-analog converter (DAC), causing the DAC to set and generate a corresponding resistance detection signal. The generated resistance detection signal is then output to the signal board module. Upon receiving the resistance detection signal, the signal board module activates its built-in constant current source, generating a detection current. This detection current value is then output to the resistor under test on the circuit board. When the detection current flows through the resistor under test, a resistance feedback signal is generated. The signal sampler samples the resistance feedback signal and outputs it to the main control processor. The main control processor calculates the resistance parameters of the resistance feedback signal using a preset resistance calculation algorithm based on Ohm's law, obtaining the target resistance parameters. By controlling the DAC to output the resistance detection signal to the signal board module, the main control processor activates the constant current source to detect the resistor under test and sends the resistance feedback signal back to the main control processor. The main control processor calculates the target resistance parameters based on the resistance feedback signal, enabling stable detection of the resistance parameters of the resistor under test.

[0082] Please refer to Figure 5 , Figure 5 This is a schematic flowchart of a flying probe testing method according to an embodiment of the present invention. In some embodiments, the component detection signal further includes a second detection signal, which includes a capacitance detection signal, the first feedback signal includes a capacitance feedback signal, the target component parameter includes a target capacitance parameter, and the main control module further includes: a digital synthesizer, and a control signal board module feeding back the flying probe detection signal to the main control module according to the component detection signal, so that the main control module calculates the target component parameter according to the flying probe detection signal, which also includes, but is not limited to, steps S501 to S504.

[0083] Step S501: Control the main control processor to control the digital synthesizer to generate a capacitor detection signal with a preset first frequency and a preset first amplitude according to the second test instruction;

[0084] Step S502: Control the main control processor to perform differential processing on the capacitance detection signal to obtain a differential capacitance detection signal;

[0085] Step S503: The control signal board module performs signal restoration processing on the differential capacitance detection signal to obtain the capacitance detection signal, and inputs the capacitance detection signal to the capacitor under test so that the capacitor under test generates a capacitance feedback signal.

[0086] In step S504, the control signal sampler samples the capacitor feedback signal and outputs the capacitor feedback signal to the main control processor, so that the main control processor can calculate the target capacitor parameters based on the capacitor feedback signal.

[0087] In steps S501 to S504 of this embodiment, after receiving the second test command, the main control processor sends a corresponding control signal to the digital synthesizer, causing the digital synthesizer to generate a capacitance detection signal with a corresponding first frequency and a corresponding first amplitude. The generated capacitance detection signal is differentially processed to obtain a differential capacitance detection signal, which is then output to the signal board module. After receiving the differential capacitance detection signal, the signal board module performs signal restoration processing on the differential capacitance detection signal to obtain a capacitance detection signal, which is then output to the capacitor under test on the circuit board under test. The capacitor under test generates a corresponding voltage and current based on the capacitance detection signal to obtain a capacitance feedback signal. The control signal sampler samples the capacitance feedback signal and outputs it to the main control processor. The main control processor calculates the capacitance impedance based on the voltage and current of the capacitance feedback signal and calculates the capacitance value based on the known frequency to obtain the target capacitance parameters. The main control processor controls the digital synthesizer to output a capacitance detection signal to the signal board module. The signal board module then detects the capacitor under test based on the capacitance detection signal and sends a capacitance feedback signal back to the main control processor. The main control processor calculates the target resistance parameter based on the capacitance feedback signal, thus enabling stable detection of the capacitance parameter of the capacitor under test.

[0088] Please refer to Figure 6 , Figure 6 This is a schematic flowchart of a flying probe testing method according to an embodiment of the present invention. In some embodiments, the component detection signal further includes a second detection signal, which includes an inductance detection signal, the first feedback signal includes an inductance feedback signal, the target component parameter includes a target inductance parameter, and the main control module further includes: a digital synthesizer, and a control signal board module feeding back the flying probe detection signal to the main control module according to the component detection signal, so that the main control module calculates the target component parameter according to the flying probe detection signal, which also includes, but is not limited to, steps S501 to S504.

[0089] Step S501: Control the main control processor to control the digital synthesizer to generate an inductor detection signal with a preset second frequency and a preset second amplitude according to the second test instruction;

[0090] Step S502: Control the main control processor to perform differential processing on the inductance detection signal to obtain a differential inductance detection signal;

[0091] Step S503: The control signal board module performs signal restoration processing on the differential inductance detection signal to obtain the inductance detection signal, and inputs the inductance detection signal to the inductor under test so that the inductor under test generates an inductance feedback signal.

[0092] In step S504, the control signal sampler samples the inductor feedback signal and outputs the inductor feedback signal to the main control processor, so that the main control processor can calculate the target inductor parameters based on the inductor feedback signal.

[0093] In steps S501 to S504 of this embodiment, after receiving the second test command, the main control processor sends a corresponding control signal to the digital synthesizer, causing the digital synthesizer to generate an inductor detection signal with a corresponding second frequency and a corresponding second amplitude. The generated inductor detection signal is differentially processed to obtain a differential inductor detection signal, which is then output to the signal board module. After receiving the differential inductor detection signal, the signal board module performs signal restoration processing on the differential inductor detection signal to obtain an inductor detection signal, which is then output to the inductor under test on the circuit board under test. The inductor under test generates a corresponding voltage and current based on the inductor detection signal to obtain an inductor feedback signal. The control signal sampler samples the inductor feedback signal and outputs the inductor feedback signal to the main control processor. The main control processor calculates the inductor impedance based on the voltage and current of the inductor feedback signal and calculates the inductor capacitance based on the known frequency to obtain the target inductor parameters. The main control processor controls the digital synthesizer to output an inductance detection signal to the signal board module. The signal board module then detects the inductor under test based on the inductance detection signal and feeds back an inductance feedback signal to the main control processor. The main control processor calculates the target resistance parameter based on the inductance feedback signal, thus enabling stable detection of the inductance parameter of the inductor under test.

[0094] Another embodiment of the present invention discloses a flying probe testing device, comprising: at least one processor, and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform, for example... Figure 3 Control method steps S301 to S303 Figure 4 Control method steps S401 to S403 Figure 5 The control method steps S501 to S504 and Figure 6 The flying probe test method in steps S601 to S604 of the control method.

[0095] Another embodiment of the present invention discloses a computer-readable storage medium, the storage medium comprising: the storage medium storing computer-executable instructions, the computer-executable instructions being configured to cause a computer to perform, such as Figure 3 Control method steps S301 to S303 Figure 4 Control method steps S401 to S403 Figure 5 The control method steps S501 to S504 and Figure 6 The flying probe test method in steps S601 to S604 of the control method.

[0096] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0097] It will be understood by those skilled in the art that all or some of the steps and systems in the methods disclosed above can be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components can be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, which can include computer storage media (or non-transitory media) and communication media (or transient media). As is known to those skilled in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data). Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disc (DVD) or other optical disc storage, magnetic cartridges, magnetic tape, disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and is accessible to a computer. Furthermore, as is known to those skilled in the art, communication media typically contain computer-readable instructions, data structures, program modules, or other data in modulated data signals such as carrier waves or other transmission mechanisms, and may include any information delivery medium.

[0098] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments, and various changes can be made within the scope of knowledge possessed by those skilled in the art without departing from the spirit of the present invention. Furthermore, the embodiments of the present invention and the features thereof can be combined with each other unless otherwise specified.

Claims

1. A flying probe testing device, characterized in that, The flying probe testing device is used in a flying probe testing machine, which includes a motion control system. The flying probe testing device includes: An industrial control computer is used to output a first test command to the motion control system so that the built-in probe of the motion control system moves to a preset position, and receives the positioning signal fed back by the motion control system, and outputs a second test command according to the positioning signal. The main control module, which is connected to the industrial computer via a gigabit network cable, is used to output component detection signals according to the second test command; The signal board module is connected to the main control module via a flexible multi-core twisted-pair shielded cable. It is used to feed back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module can calculate the target component parameters based on the flying probe detection signal.

2. The flying probe testing device according to claim 1, characterized in that, The component detection signal includes a first detection signal, the flying probe detection signal includes a first feedback signal, and the main control module includes: The main control processor is composed of ARM and FPGA; A digital-to-analog converter, one end of which is connected to the main control processor and the other end of which is connected to the signal board module, is used to set the first detection signal and output the first detection signal to the signal board module; A filter, connected to the signal board module, is used to improve the stability of the first feedback signal; A signal sampler, one end of which is connected to the filter and the other end of which is connected to the main control processor, is used to collect the first feedback signal.

3. The flying probe testing device according to claim 2, characterized in that, The flying probe detection signal also includes a second feedback signal, and the main control module also includes: An analog-to-digital converter, one end of which is connected to the main control processor and the other end of which is connected to the signal board module, is used to read the second feedback signal fed back by the signal board module based on the first detection signal.

4. The flying probe testing device according to claim 3, characterized in that, The component detection signal further includes a second detection signal, and the main control module further includes: A digital synthesizer, connected to the main control processor, is used to generate the second detection signal for testing capacitors or inductors; An operational amplifier, one end of which is connected to the digital synthesizer and the other end of which is connected to the signal board module, is used to discharge and follow the second detection signal.

5. A flying probe testing method, characterized in that, The flying probe testing method is applied to a flying probe testing machine, which includes a motion control system and a flying probe testing device. The flying probe testing device includes an industrial computer, a main control module, and a signal board module. The flying probe testing device is as described in any one of claims 1 to 4, and the flying probe testing method includes: The industrial control computer is controlled to output a first test command to the motion control system, so that the built-in probe of the motion control system moves to a preset position, and receives the positioning signal fed back by the motion control system, and outputs a second test command according to the positioning signal; The main control module is controlled to output component detection signals according to the second test command; The control signal board module feeds back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module can calculate the target component parameters based on the flying probe detection signal.

6. The flying probe testing method according to claim 5, characterized in that, The component detection signal includes a first detection signal, which includes a resistance detection signal; the flying probe detection signal includes a first feedback signal, which includes a resistance feedback signal; the target component parameter includes a target resistance parameter; the main control module includes a main control processor, a digital-to-analog converter, and a signal sampler; the control signal board module feeds back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module calculates the target component parameter based on the flying probe detection signal, including: The main control processor controls the digital-to-analog converter to set the resistance detection signal according to the second test instruction, and outputs the resistance detection signal to the signal board module; The control signal board module starts the built-in constant current source according to the resistance detection signal. The constant current source outputs the detection current to the resistor under test, so that the resistor under test generates the resistance feedback signal. The signal sampler is controlled to sample the resistance feedback signal and output the resistance feedback signal to the main control processor, so that the main control processor can calculate the target resistance parameter based on the resistance feedback signal.

7. The flying probe testing method according to claim 6, characterized in that, The component detection signal further includes a second detection signal, which includes a capacitance detection signal. The first feedback signal includes a capacitance feedback signal. The target component parameters include target capacitance parameters. The main control module further includes a digital synthesizer. The control signal board module feeds back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module calculates the target component parameters based on the flying probe detection signal. The module also includes: The main control processor controls the digital synthesizer to generate the capacitance detection signal with a preset first frequency and a preset first amplitude according to the second test instruction; The main control processor is controlled to perform differential processing on the capacitance detection signal to obtain a differential capacitance detection signal; The signal board module is controlled to perform signal restoration processing on the differential capacitance detection signal to obtain the capacitance detection signal, and the capacitance detection signal is input to the capacitor under test so that the capacitor under test generates the capacitance feedback signal. The signal sampler is controlled to sample the capacitance feedback signal and output the capacitance feedback signal to the main control processor, so that the main control processor can calculate the target capacitance parameter based on the capacitance feedback signal.

8. The flying probe testing method according to claim 7, characterized in that, The second detection signal includes an inductance detection signal, the first feedback signal includes an inductance feedback signal, the target component parameters include target inductance parameters, and the control of the signal board module to feed back the flying probe detection signal to the main control module based on the component detection signal, so that the main control module calculates the target component parameters based on the flying probe detection signal, further includes: The main control processor controls the digital synthesizer to generate the inductor detection signal with a preset second frequency and a preset second amplitude according to the second test instruction; The main control processor is controlled to perform differential processing on the inductor detection signal to obtain a differential inductor detection signal; The signal board module controls the differential inductor detection signal to perform signal restoration processing to obtain the inductor detection signal, and inputs the inductor detection signal to the inductor under test so that the inductor under test generates the inductor feedback signal; The signal sampler is controlled to sample the inductor feedback signal and output the inductor feedback signal to the main control processor, so that the main control processor can calculate the target inductor parameters based on the inductor feedback signal.

9. A flying probe testing device, characterized in that, include: At least one processor, and, A memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the flying probe testing method as described in any one of claims 5 to 8.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions for causing a computer to perform the flying probe testing method as described in any one of claims 5 to 8.

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