A DIC speckle quality evaluation method and device based on an XGBoost algorithm and a storage medium

CN116363059BActive Publication Date: 2026-03-20SHANGHAI JIAOTONG UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-01-31
Publication Date
2026-03-20

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Abstract

The present application relates to a kind of DIC speckle quality evaluation method, device and storage medium based on XGBoost algorithm, wherein the method comprises: generating digital speckle image based on computer;Feature value is extracted from digital speckle image;Digital speckle image is subpixel translation, and a series of pictures after subpixel translation are calculated based on DIC method, and the root mean square error of calculation result is obtained;Speckle quality evaluation model is constructed, and speckle image feature value is used as model input, and root mean square error is used as model output, and XGBoost algorithm is used for model training;Speckle quality evaluation is carried out based on the speckle quality evaluation model of training completion.Compared with prior art, the present application has the advantages of fast calculation speed, accurate evaluation and the like.
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