Propeller drive unit and test sorter
CN116371759BActive Publication Date: 2026-08-28SYSTEM ENGINEERING MEGA SOLUTION CO LTD
Patent Information
- Application Number
- CN202211560698.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2021-12-30
- Filing Date
- 2022-12-07
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2042-12-07
AI Technical Summary
Technical Problem
[0005]在测试空间中搬动半导体器件的结构由于以暴露在通过温度调节单元营造的高温环境或者低温环境中的状态重复工作，产生的应力高而可能容易损坏
Benefits of technology
[0026]根据本发明的实施例，能够更积极地抑制隔膜由于重复工作所产生的应力引起的损坏而防止隔膜的使用寿命缩短。另外，通过在测试温度下也确保隔膜的稳定的可工作性而能够提高检查可靠性。
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN116371759B_ABST
Abstract
The present invention provides a kind of propeller drive unit and test sorting machine, the propeller drive unit includes: drive block, with the internal space formed with the open end opposite to the propeller that pressurizes electronic accessories to tester side and gas introduction hole being communicated with the internal space;Gas supply module is connected to the gas introduction hole;And diaphragm, in the internal space forms the drive chamber that is cut off with the open end and is communicated with the gas introduction hole, and is connected with the propeller by the open end, and according to the pressure of the gas introduced into the drive chamber from the gas supply module, while the propeller is advanced or retreated relative to the electronic accessories, the drive chamber is deformed to enlarge or restore, the central region of the diaphragm is connected with the propeller, the edge region of the diaphragm is combined in the drive chamber, the intermediate region between the central region and the edge region is formed to have at least one flexure.
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Citation Information
Patent Citations
Pushing apparatus for testing a semiconductor device and test handler including the same
KR101228207B1
Test handler
KR1020140141405A
Apparatus for connecting a semiconductor of test handler
KR1020170049690A
Pushing apparatus for testing a semiconductor device and test handler including the same
KR1020120063576A
KR20210003437A