A radio frequency probe
Patent Information
- Application Number
- CN202211625187.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-12
- Publication Date
- 2026-09-22
- Estimated Expiration
- 2042-12-12
AI Technical Summary
[0006]本发明的主要目的在于提供一种射频探针,以解决现有技术中的射频探针不能满足高性能、低成本的问题
[0015]按照固定角度加工一个斜向切口,并将同轴电缆与接触片焊接后,接触片上三个接触面的三个端面位于同一直线上并且与切面相齐平,即同轴电缆外导体延伸到接触片前端,仅接触片上的极小的探针触点不被外导体覆盖。这样设置便可以解决现有射频探针结构无法低成本、低难度实现极小外露探针的问题,本发明提供的射频探针结构能够降低辐射,具有信号性能优异的特点。因为不需要制作软基板微带片和电铸触点,对工艺要求降低,加工过程简单,降低了制造成本。
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Figure CN116381293B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of radio frequency probe technology, and specifically to a radio frequency probe. Background Technology
[0002] In existing technologies, there are two common structures for manufacturing radio frequency probes:
[0003] The first type of radio frequency probe structure is shown in Chinese patent CN217404361U, consisting of... Figure 4 It can be seen that this type of RF probe welds a miniature contact piece to the vertical notch of the coaxial cable and processes the probe contact on the coplanar waveguide exposed to the air. The RF probe made using this method has a relatively large signal radiation, especially when the RF signal frequency is high, it is difficult to meet the performance requirements.
[0004] The second type of RF probe structure involves obliquely cutting the coaxial cable to form an oblique notch, welding a microstrip piece to the notch, so that the front end of the microstrip piece extends out of the notch, and electroforming a probe contact on the lower surface of the front end of the microstrip piece. Resin glue is then filled into the upper surface of the microstrip. This type of RF probe has excellent signal performance, but it requires high-end electroforming technology and extremely high assembly requirements, resulting in high production and assembly costs.
[0005] Therefore, a high-performance, low-cost radio frequency probe is needed. Summary of the Invention
[0006] The main objective of this invention is to provide a radio frequency probe to solve the problem that existing radio frequency probes cannot meet the requirements of high performance and low cost.
[0007] To achieve the above objectives, the present invention provides an RF probe, comprising: a coaxial cable with a beveled cut at one end, the coaxial cable comprising: an inner conductor, an inner dielectric, and an outer conductor arranged coaxially; the front end of the beveled cut of the coaxial cable having a cut opposite to that of the inner conductor; the RF probe further comprising: a contact piece having: a first contact surface, a second contact surface, and a third contact surface arranged adjacent to each other; the second contact surface contacting the beveled cut of the inner conductor; the first contact surface and the third contact surface respectively contacting the beveled cut of the outer conductor and located on the left and right sides of the second contact surface; three probe contacts integrally formed on one end face of the first contact surface, the second contact surface, and the third contact surface; the three probe contacts being flush and protruding a certain distance from the first cut surface; the distance between the front end of the three probe contacts and the first cut surface being 40μm-80μm.
[0008] Furthermore, the coaxial cable also has a second cut surface, which is connected to the first cut surface.
[0009] Furthermore, the first contact surface and the second contact surface are symmetrically arranged, and the shapes of the two contact surfaces are adapted to the oblique tangent of the outer conductor.
[0010] Furthermore, the contact piece is welded to the oblique cut surface of the coaxial cable.
[0011] Furthermore, the oblique cross-section of the coaxial cable is U-shaped.
[0012] Furthermore, the contact surface is coated with gold or other precious metals.
[0013] Furthermore, the angle between the oblique cut and the opposite cut of the coaxial cable is between 80° and 100°.
[0014] The present invention has the following beneficial effects:
[0015] A beveled cut is machined at a fixed angle, and after the coaxial cable is soldered to the contact piece, the three end faces of the three contact surfaces on the contact piece are aligned on the same straight line and flush with the cut surface. This means the outer conductor of the coaxial cable extends to the front end of the contact piece, with only the extremely small probe contact on the contact piece not covered by the outer conductor. This design solves the problem that existing RF probe structures cannot achieve extremely small exposed probes at low cost and with low difficulty. The RF probe structure provided by this invention reduces radiation and has excellent signal performance. Because it eliminates the need to fabricate flexible substrate microstrip sheets and electroformed contacts, the process requirements are reduced, the manufacturing process is simplified, and the manufacturing cost is lowered. Attached Figure Description
[0016] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. In the drawings:
[0017] Figure 1 A schematic diagram of the overall structure of the radio frequency probe of the present invention is shown;
[0018] Figure 2 It shows Figure 1 A schematic diagram of the overall structure of the radio frequency probe from another angle;
[0019] Figure 3 It shows Figure 1 A schematic diagram of the structure of a coaxial cable;
[0020] Figure 4 A schematic diagram of the overall structure of the radio frequency probe of Chinese patent CN217404361U is shown.
[0021] The reference numerals in the above figures are as follows:
[0022] 10. Coaxial cable; 11. Inner conductor; 12. Outer conductor; 13. First cross-section; 14. Inner dielectric; 15. Second cross-section; 21. First contact surface; 22. Second contact surface; 23. Third contact surface; 24. Probe contact. Detailed Implementation
[0023] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0024] like Figure 1 , Figure 2 and Figure 3 The radio frequency probe shown includes: a coaxial cable 10 with a beveled cut at one end, the coaxial cable 10 including: an inner conductor 11, an inner dielectric 14 and an outer conductor 12 arranged coaxially, the front end of the beveled cut of the coaxial cable 10 having a first cut 13 opposite to it, the radio frequency probe also includes: a contact piece having: a first contact surface 21, a second contact surface 22 and a third contact surface 23 arranged adjacently, the second contact surface 22 contacting the beveled cut of the inner conductor 11, the first contact surface 21 and the third contact surface 23 respectively contacting the beveled cut of the outer conductor 12 and located on the left and right sides of the second contact surface 22, three probe contacts 24 integrally formed on one end face of the first contact surface 21, the second contact surface 22 and the third contact surface 23, the three probe contacts 24 being flush with each other and protruding a distance beyond the first cut 13, the distance between the front end of the three probe contacts 24 and the first cut 13 being 40μm-80μm.
[0025] like Figure 2 As shown, a beveled cut is machined at a fixed angle, and after the coaxial cable 10 is soldered to the contact piece, the three probe contacts 24 are flush, and the distance between the frontmost tip of the three probe contacts 24 and the first cut surface 13 is 40μm-80μm. That is, the outer conductor 12 extends to the position near the probe contact at the front end of the contact piece, with only the extremely small probe contacts on the contact piece not covered by the outer conductor 12. This configuration solves the problem that existing RF probe structures cannot achieve extremely small exposed probes at low cost and with low difficulty. The RF probe structure provided by this invention can reduce radiation and has excellent signal performance. Because it does not require the fabrication of a flexible substrate microstrip sheet and electroformed contacts, the process requirements are reduced, the processing is simple, and the manufacturing cost is reduced.
[0026] Specifically, such as Figure 3As shown, the coaxial cable 10 also has a second cut surface 15, which is connected to the first cut surface 13. The second cut surface 15 can better expose the position of the probe contact 24 and facilitate the processing of the probe contact 24 on the contact plate.
[0027] Specifically, such as Figure 1 As shown, the first contact surface 21 and the second contact surface 22 are symmetrically arranged, and the shapes of the two contact surfaces are adapted to the oblique tangent of the outer conductor 12.
[0028] Specifically, the contact piece is soldered onto the oblique cut surface of the coaxial cable 10. The contact piece is soldered onto the oblique cut surface of the coaxial cable 10 by a soldering process. Since both contact surfaces are flat, the processing is simple, efficient, and cost-effective.
[0029] Specifically, the coaxial cable 10 has a U-shaped oblique cross-section. This ensures that the second contact surface 22 only contacts the inner conductor 11.
[0030] Specifically, the contact surface is coated with gold or other precious metals. The stable metallic properties of precious metals ensure the high quality of the RF probe.
[0031] Specifically, the angle between the oblique cut surface of the coaxial cable 10 and the opposite first cut surface 13 is between 80° and 100°. This arrangement allows the probe contact 24 to be exposed and not covered by the coaxial cable 10.
[0032] The RF probe structure provided by this invention extends the outer conductor of the coaxial cable to the very tip of the contact piece, exposing only a very small probe contact. This effectively solves the problems of high radiation and poor isolation capability of coplanar waveguide probes at high frequencies. This invention eliminates the need for soft microstrip fabrication and electroforming contact processes, reducing process requirements and thus lowering product costs while maintaining high performance. Furthermore, the contact surface between the coaxial cable and the contact piece in this invention is planar, simplifying the manufacturing process and increasing efficiency.
[0033] Of course, the above description is not intended to limit the present invention, and the present invention is not limited to the examples given above. Any changes, modifications, additions or substitutions made by those skilled in the art within the scope of the present invention should also fall within the protection scope of the present invention.
Claims
1. A radio frequency probe, comprising: A coaxial cable (10) with a beveled cut at one end, the coaxial cable (10) comprising: an inner conductor (11), an inner dielectric (14), and an outer conductor (12) arranged coaxially, characterized in that the front end of the beveled cut of the coaxial cable (10) has a first cut (13) opposite to it, the radio frequency probe further comprising: a contact piece having: a first contact surface (21), a second contact surface (22), and a third contact surface (23) arranged adjacently, the second contact surface (22) contacting the beveled cut of the inner conductor (11), the first contact surface (21) and the third contact surface (23) respectively contacting the outer conductor (12). The oblique cut surfaces of the three probe contacts (24) are in contact with each other and located on the left and right sides of the second contact surface (22). The three probe contacts (24) are integrally formed on one end face of the first contact surface (21), the second contact surface (22) and the third contact surface (23). The three probe contacts (24) are flush with each other and extend a distance beyond the first cut surface (13). The distance between the front end of the three probe contacts (24) and the first cut surface (13) is 40μm-80μm. The outer conductor (12) extends to the position near the probe contacts at the front end of the contact piece. Only the probe contacts (24) on the contact piece are not covered by the outer conductor (12). The coaxial cable (10) also has a second cut surface (15), which is connected to the first cut surface (13).
2. The radio frequency probe according to claim 1, characterized in that, The first contact surface (21) and the third contact surface (23) are symmetrically arranged, and the shapes of the two contact surfaces are adapted to the oblique sectional surface of the outer conductor (12).
3. The radio frequency probe according to claim 1, characterized in that, The contact piece is welded to the coaxial cable (10).
4. The radio frequency probe according to claim 1, characterized in that, The coaxial cable (10) has a U-shaped oblique cross section.
5. The radio frequency probe according to claim 1, characterized in that, The surface of the contact piece is coated with gold or other precious metals.
6. The radio frequency probe according to claim 1, characterized in that, The angle between the oblique cut of the coaxial cable (10) and the first cut (13) opposite to it is between 80° and 100°.
Citation Information
Patent Citations
Radio frequency probe
CN217404361U
Semiconductor test radio frequency probe
CN114113719A