Method, apparatus, storage medium and electronic device for measuring loop resistance

By obtaining the capacitance of the energy storage element, calculating the voltage deviation and compensation voltage value, and combining the discharge time to calculate the loop resistance, the problem of inaccurate measurement of loop resistance in the prior art is solved, and higher measurement accuracy and detection accuracy are achieved.

CN116381340BActive Publication Date: 2026-06-19GUIZHOU QUANAN MILING TECHNOLOGY LIMITED COMPANY

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
GUIZHOU QUANAN MILING TECHNOLOGY LIMITED COMPANY
Filing Date
2023-03-07
Publication Date
2026-06-19

AI Technical Summary

Technical Problem

Existing technologies make it difficult to directly measure small resistance values ​​when measuring loop resistance, and introduce errors, resulting in inaccurate resistance value calculations.

Method used

By acquiring the capacitance of the energy storage element, charging and calculating the voltage deviation value, compensating for the voltage value, and combining the discharge time to calculate the loop resistance, a device for measuring the loop resistance and a computer program are used for precise calculation.

🎯Benefits of technology

It improves the accuracy of loop resistance measurement and detection, and provides more reliable data support.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN116381340B_ABST
    Figure CN116381340B_ABST
Patent Text Reader

Abstract

This invention discloses a method for measuring loop resistance, belonging to the field of loop resistance measurement technology. It includes: acquiring the capacitance of an energy storage element; charging the energy storage element and determining the voltage deviation caused by the communication duration during the voltage reading process; acquiring the voltage at the end of charging to obtain a first voltage value; adding a compensation voltage value to the first voltage value based on the voltage deviation value, wherein the compensation voltage value is equal to the voltage deviation value; discharging the energy storage element for a first discharge duration and acquiring the voltage after the first discharge duration to obtain a second voltage value; and calculating the resistance value of the conductive loop based on the capacitance of the energy storage element, the first voltage value, the compensation voltage value, the first discharge duration, and the second voltage value. This method for measuring loop resistance improves the accuracy of measuring the resistance value of a loop.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This invention relates to the field of loop resistance measurement technology, and in particular to a method, apparatus, storage medium, and electronic device for measuring loop resistance. Background Technology

[0002] The loop resistance is a parameter characterizing the quality of a conductive circuit's connection. Currently, during chip testing, it's necessary to measure the resistance of the conductive circuit for testing purposes, and the loop resistance directly affects product stability. However, the loop resistance is relatively small, and directly measuring it is impractical. Existing technology involves charging and discharging the circuit and indirectly measuring the loop resistance through the discharge curve. This approach requires measuring the initial and final voltages and discharge time of the discharge curve, but the measuring equipment cannot directly measure these parameters. These parameters are often obtained by reading data collected from the chip, and the errors introduced by these parameters affect the final calculated loop resistance, thus increasing the error in the loop resistance value. Therefore, there is an urgent need for a method that improves the accuracy of measuring loop resistance. Summary of the Invention

[0003] The purpose of this invention is to overcome at least one deficiency of the prior art and provide a method for measuring loop resistance that is advantageous in improving the accuracy of measuring the resistance value of a loop; in addition, an apparatus for measuring loop resistance, a computer-readable storage medium, and an electronic device are also provided.

[0004] The technical solution of the present invention to solve the above-mentioned technical problems is as follows:

[0005] According to one aspect of this application, a method for measuring loop resistance is provided, comprising:

[0006] Obtain the capacitance of the energy storage element;

[0007] The energy storage element is charged, and the voltage deviation value of the energy storage element caused by the corresponding communication time during the process of reading the voltage of the energy storage element is determined. The two poles of the energy storage element are connected by a connecting line to form a conductive loop.

[0008] The voltage of the energy storage element at the moment when charging ends is collected to obtain a first voltage value;

[0009] Based on the voltage deviation value, a compensation voltage value is added to the first voltage value, wherein the compensation voltage value is equal to the voltage deviation value;

[0010] The energy storage element is discharged for a first discharge duration, and the voltage of the energy storage element after the first discharge duration is collected to obtain a second voltage value;

[0011] Based on the capacitance of the energy storage element, the first voltage value, the compensation voltage value, the first discharge duration, and the second voltage value, the resistance value of the circuit resistance of the conductive circuit is calculated.

[0012] According to one embodiment of the present invention, obtaining the capacitance of the energy storage element includes:

[0013] The capacitance of the energy storage element is calibrated to obtain the calibrated capacitance of the energy storage element, and the calibrated capacitance is used as the capacitance of the energy storage element.

[0014] According to one embodiment of the present invention, calibrating the capacity of the energy storage element to obtain the calibrated capacity of the energy storage element includes:

[0015] The energy storage element is charged to a saturated state, and the capacity of the energy storage element in the saturated state is measured to obtain the actual capacity of the energy storage element. The actual capacity is used as the calibrated capacity of the energy storage element.

[0016] According to one embodiment of the present invention, the step of charging the energy storage element and determining the voltage deviation value of the energy storage element caused by the communication duration during the process of reading the voltage of the energy storage element includes:

[0017] During the charging process of the energy storage element, the process voltage of the energy storage element is collected multiple times to obtain multiple process voltage values;

[0018] Based on the multiple process voltage values, the charging rate of the energy storage element is calculated;

[0019] The voltage deviation value is calculated based on the charging rate and the fixed communication time required to complete one voltage measurement.

[0020] According to one embodiment of the present invention, the charging rate of the energy storage element is calculated using the following formula;

[0021] formula: ;

[0022] In the formula, K is the charging rate. Let be the voltage value at time i during the charging process. Let be the voltage value at time j during the charging process. Let be the duration from time i to time j. , The units are all V. The unit is ms;

[0023] The voltage deviation value is calculated using the following formula;

[0024] formula: ;

[0025] In the formula, T is the fixed communication time to complete one voltage measurement, and the unit of T is ms. K is the charging rate.

[0026] According to an embodiment of the present invention, the step of increasing the compensation voltage value of the first voltage value includes:

[0027] The first voltage value is increased by a compensation voltage value using the following formula;

[0028] formula: ;

[0029] In the formula, To collect the voltage value obtained at the moment when the energy storage element finishes charging, The compensation voltage value is... To calculate the obtained voltage deviation value, , , The unit for all values ​​is V.

[0030] According to one embodiment of the present invention, the resistance value of the circuit resistance of the conductive circuit is calculated by the following formula;

[0031] formula: ;

[0032] In the formula, FT is the first discharge duration parameter; OSCT is the oscillation frequency, and OSCT is also the second discharge duration parameter, with the unit of OSCT being kHz. FT and OSCT together characterize the first discharge duration; C is the capacitance value, with the unit of C being μF. The voltage value of the energy storage element before discharge, i.e., the initial voltage value. The unit is V; The voltage value after the first discharge duration of the energy storage element, i.e., the discharge termination voltage value. The unit is V.

[0033] According to one embodiment of the present invention, the method for measuring loop resistance further includes:

[0034] By setting different first discharge duration parameters and second discharge duration parameters, different first discharge durations are achieved for discharging the energy storage element, and the initial voltage value and discharge termination voltage value corresponding to the different first discharge durations are collected respectively, resulting in multiple initial voltage values ​​and discharge termination voltage values.

[0035] Based on the multiple initial voltage values ​​and the discharge termination voltage values ​​obtained from the acquisition, multiple resistance values ​​are calculated respectively, and an average resistance value is calculated for the multiple resistance values. The calculated average resistance value is used as the resistance value of the loop resistance of the conductive circuit.

[0036] According to another aspect of this application, an apparatus for measuring loop resistance is also provided, the apparatus comprising:

[0037] A capacity acquisition module is used to acquire the capacity of the energy storage element;

[0038] A charging control module is used to control the energy storage element to charge;

[0039] A voltage acquisition module is used to acquire the voltage of the energy storage element;

[0040] A discharge control module is used to control the energy storage element to discharge;

[0041] Clock module, used for timing;

[0042] A voltage deviation determination module is used to determine the voltage deviation value of the energy storage element caused by the corresponding communication time during the process of reading the voltage of the energy storage element;

[0043] The calculation module is used for calculations.

[0044] According to another aspect of this application, a computer-readable storage medium is also provided, wherein a computer program is stored therein, wherein the computer program, when executed by a processor, implements the above-described method.

[0045] According to another aspect of this application, an electronic device is also provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method described above.

[0046] The technical solution provided in this application has at least the following beneficial effects:

[0047] In this embodiment, during the charging process of the energy storage element, when a charge termination command is issued, a communication time difference exists due to the communication time required. During the communication process to terminate charging, the energy storage element continues to charge, and its voltage continues to change. Therefore, by calculating the voltage deviation value and adding a compensation voltage value to the first voltage value, where the compensation voltage value equals the voltage deviation value, the voltage value at the beginning of the energy storage element's discharge is equal to the voltage value actually obtained during charging, improving the accuracy of the voltage value at the beginning of the discharge. Furthermore, a fixed first discharge duration for the energy storage element avoids voltage differences caused by communication time differences during voltage measurement. Therefore, using the method for measuring loop resistance in this embodiment can improve the accuracy of the measured resistance value, thereby improving the detection accuracy of the loop resistance and providing more reliable data support for determining whether the resistance value of the loop resistance is within the acceptable range.

[0048] Furthermore, in this embodiment, the capacitance of the energy storage element is calibrated, and the calibrated capacitance is used as the capacitance of the energy storage element. This is beneficial for calibrating the capacitance of the energy storage element and for further improving the accuracy of the resistance value of the measurement circuit. Attached Figure Description

[0049] To more clearly illustrate the technical solutions in this invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0050] Figure 1 This is a schematic diagram of the circuit connection used for measuring and acquiring the voltage of the capacitor in an embodiment of the present invention;

[0051] Figure 2 This is a flowchart of a method for measuring loop resistance in an embodiment of the present invention;

[0052] Figure 3 This is a charging curve diagram of the capacitor being charged in an embodiment of the present invention;

[0053] Figure 4 Discharge curve of the capacitor in the embodiment of the present invention;

[0054] Figure 5 This is a structural block diagram of a device for measuring loop resistance according to an embodiment of the present invention. Detailed Implementation

[0055] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0056] To better understand the above-mentioned objectives, features, and advantages of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other.

[0057] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and therefore the scope of protection of the invention is not limited to the specific embodiments disclosed below.

[0058] This embodiment provides a method for measuring loop resistance, such as... Figure 2 As shown, it includes:

[0059] Step S202: Obtain the capacitance of the energy storage element;

[0060] Step S204: Charge the energy storage element and determine the voltage deviation value of the energy storage element caused by the communication time during the process of reading the voltage of the energy storage element. The two poles of the energy storage element are connected by a connecting line to form a conductive loop 2.

[0061] Step S206: Collect the voltage of the energy storage element at the moment of completion of charging to obtain the first voltage value;

[0062] Step S208: Based on the voltage deviation value, add a compensation voltage value to the first voltage value, wherein the compensation voltage value is equal to the voltage deviation value;

[0063] Step S210: Discharge the energy storage element for a first discharge duration, and collect the voltage of the energy storage element after the first discharge duration to obtain a second voltage value;

[0064] Step S212: Based on the energy storage element's capacitance, first voltage value, compensation voltage value, first discharge duration, and second voltage value, calculate the resistance value of the circuit resistance of the conductive circuit 2.

[0065] In this embodiment, as Figure 2As shown, during the charging process of the energy storage element, when a charge termination command is issued, a communication time difference exists due to the communication time required. During the communication process to terminate charging, the energy storage element continues to charge, and its voltage continues to change. Therefore, by calculating the voltage deviation value and adding a compensation voltage value to the first voltage value, where the compensation voltage value is equal to the voltage deviation value, the voltage value at the beginning of the energy storage element's discharge is equal to the voltage value actually obtained during charging, thus improving the accuracy of the voltage value at the beginning of the energy storage element's discharge. In addition, the fixed first discharge duration avoids voltage differences caused by communication time differences during the voltage measurement process when the energy storage element is discharging. Therefore, using the method for measuring loop resistance in this embodiment can improve the accuracy of the measured resistance value of the loop resistance, thereby improving the detection accuracy of the loop resistance and providing more reliable data support for determining whether the resistance value of the loop resistance is within the acceptable range.

[0066] In step S202 of this embodiment, since the capacity of the energy storage element is one of the standard parameters, the capacity parameter of the energy storage element can be collected and read by a data acquisition device. Alternatively, the user can read and configure the capacity parameter of the energy storage element into the software, inputting the capacity parameter into the software for subsequent calculations. Furthermore, the capacity parameter is one of the standard parameters of the energy storage element, and the standard parameter can be recorded in an information panel. The capacity parameter can be obtained by reading the information in the information panel. In this embodiment, "capacity" refers to the amount of free charge stored under a given potential difference, i.e., the ability to accommodate charge.

[0067] Furthermore, in this embodiment, the energy storage element is capacitor 1, which is mounted on the chip. Alternatively, the energy storage element can also be a battery, a battery pack, or other energy storage device capable of storing electrical energy. Additionally, since the energy storage element in this embodiment is assembled within the chip, the resistance value of the loop resistance of the energy storage element assembled within the chip is measured. Therefore, the method for measuring the loop resistance in this embodiment essentially tests the stability of the chip, providing data support for chip quality inspection and further improvement.

[0068] Furthermore, such as Figure 1 As shown, in this embodiment, the measurement and acquisition device 3 measures and acquires the voltage of capacitor 1. The measurement and acquisition device 3 is connected to a host computer, which controls the measurement and acquisition device 3 to measure and acquire the voltage of capacitor 1. Furthermore, the host computer performs calculations based on the acquired data. It should be noted that... Figure 1 The host computer is not shown in the diagram.

[0069] Furthermore, such as Figure 1 As shown, in this embodiment, a MOS transistor 20 and an ignition resistor 21 are connected to the conductive circuit 2. The resistance of the circuit includes the resistance of the MOS transistor 20, the resistance of the ignition resistor 21, and the internal resistance of the capacitor 1.

[0070] One embodiment of the present invention involves obtaining the capacitance of an energy storage element, including:

[0071] The capacity of the energy storage element is calibrated to obtain the calibrated capacity of the energy storage element, and the calibrated capacity is used as the capacity of the energy storage element.

[0072] In this embodiment, by calibrating the capacitance of the energy storage element and using the calibrated capacitance as the capacitance of the energy storage element, it is beneficial to calibrate the capacitance of the energy storage element and further improve the accuracy of the resistance value of the measurement circuit.

[0073] In one embodiment of the present invention, calibrating the capacity of an energy storage element to obtain the calibrated capacity of the energy storage element includes:

[0074] The energy storage element is charged to saturation, and the capacity of the saturated energy storage element is measured to obtain the actual capacity of the energy storage element. The actual capacity is used as the calibrated capacity of the energy storage element.

[0075] In this embodiment, a device for measuring loop resistance is used to calibrate the capacity of the energy storage element. The charging control module 51 in the device for measuring loop resistance controls the charging of the energy storage element to a saturated state. The voltage acquisition module 52 in the device for measuring loop resistance measures the capacity of the saturated energy storage element to obtain the actual capacity of the energy storage element. The device for measuring loop resistance controls the use of the actual capacity as the calibrated capacity of the energy storage element, thereby automating the steps of charging, voltage measurement, and obtaining the calibrated capacity, and realizing automatic calibration of the capacity of the energy storage element. Furthermore, the calibration of the capacity of the energy storage element can also be performed with human assistance.

[0076] In one embodiment of the present invention, charging an energy storage element and determining the voltage deviation value of the energy storage element caused by the communication duration during the process of reading the voltage of the energy storage element includes:

[0077] During the charging process of the energy storage element, the process voltage of the energy storage element is collected multiple times to obtain multiple process voltage values;

[0078] The charging rate of the energy storage element is calculated based on multiple process voltage values.

[0079] The voltage deviation value is calculated based on the charging rate and the fixed communication time required to complete one voltage measurement.

[0080] In one embodiment of the present invention, the charging rate of the energy storage element is calculated using the following formula;

[0081] formula: ;

[0082] In the formula, K is the charging rate. Let be the voltage value at time i during the charging process. Let be the voltage value at time j during the charging process. Let be the duration from time i to time j. , The units are all V. The unit is ms;

[0083] The voltage deviation value is calculated using the following formula;

[0084] formula: ;

[0085] In the formula, T is the fixed communication time to complete one voltage measurement, and the unit of T is ms. K is the charging rate.

[0086] In this embodiment, the fixed communication duration is the communication duration between the voltage measuring device and the voltage measuring host computer to complete one voltage measurement. The communication duration includes: the voltage measuring host computer sending a voltage measurement command to the voltage measuring device, the voltage measuring device receiving the voltage measurement command and executing the voltage measurement command, and feeding back the measured voltage value to the voltage measuring host computer, and the voltage measuring host computer receiving the voltage value fed back by the voltage measuring device.

[0087] In this embodiment, as Figure 2 As shown, in this embodiment, at time 600ms, corresponding to point i, The voltage value is 2.0V; at time 1200ms, corresponding to point j, The voltage value is 4.12V; If it is 600ms, then: .

[0088] Furthermore, in this embodiment, the fixed communication duration for completing one voltage measurement is 188ms, i.e., T is set to 188; then .

[0089] In one embodiment of the present invention, when collecting multiple voltages during the charging process, the voltage near the end of the charging process is collected to obtain a more accurate charging rate during the reading of the voltage of the energy storage element, thereby further improving the accuracy of the voltage deviation value of the energy storage element caused by the communication time during the reading of the voltage of the energy storage element.

[0090] Furthermore, during the calculation of the charging rate, multiple sets of voltages can be collected, each set including voltage values ​​at two different times, and the charging rate of each set of voltages can be calculated separately to obtain multiple charging rates. Then, the average of the multiple charging rates is taken, and the average charging rate is used as the charging rate in the formula for calculation, so that the calculated voltage deviation value is more accurate.

[0091] It should be noted that in this embodiment... Figure 3 The charging curve of capacitor 1 shown is only used to illustrate the charging trend and voltage acquisition method. Figure 3 The charging curve shown in the image does not represent the actual charging curve. The actual charging curve can be obtained using calculation software.

[0092] In one embodiment of the present invention, increasing the compensation voltage value of the first voltage value includes:

[0093] The first voltage value is increased by a compensation voltage value using the following formula;

[0094] formula: ;

[0095] In the formula, To collect the voltage value obtained at the moment when the energy storage element finishes charging, The compensation voltage value is... To calculate the obtained voltage deviation value, , , The unit for all values ​​is V.

[0096] In this embodiment, as Figure 3 As shown, at time 1600ms, corresponding to point m, the voltage value obtained is 4.71V. Therefore: =4.71+0.66=5.37V.

[0097] In one embodiment of the present invention, the resistance value of the circuit resistance of the conductive circuit is calculated using the following formula;

[0098] formula: ;

[0099] In the formula, FT is the first discharge duration parameter; OSCT is the oscillation frequency, and OSCT is also the second discharge duration parameter, with the unit of OSCT being kHz. FT and OSCT together characterize the first discharge duration; C is the capacitance value, with the unit of C being μF. The voltage value of the energy storage element before discharge, i.e., the initial voltage value. The unit is V; The voltage value after the first discharge duration of the energy storage element, i.e., the discharge termination voltage value. The unit is V.

[0100] In this embodiment, FT is the first discharge duration parameter for discharging, and FT is dimensionless. OSCT is the second discharge duration parameter for discharging. FT and OSCT together determine the first discharge duration. That is, each set of determined FT and OSCT corresponds to a fixed first discharge time. The first discharge time is t in the formula used to calculate the resistance value of the circuit resistance of conductive circuit 2. t is determined by FT and OSCT. Therefore, in this embodiment, a fixed first discharge duration is obtained by determining FT and OSCT. Furthermore, OSCT is a parameter of the chip, and OSCT is determined by the characteristics of the chip itself.

[0101] In this embodiment, as Figure 4 As shown, before discharging capacitor 1, This is the voltage value of the energy storage element before it discharges. The value is 5.37V; the discharge stops after the first discharge time, corresponding to point p. The value is 2.08V; furthermore, in this embodiment, the value of FT is 5, the value of OSCT is 120KHz, and the value of C is 110uF. In the calculation process, the OSCT value was converted to 120000Hz, and the C value was converted to 0.000110F. Therefore, the resistance value of the loop resistor in this embodiment is 1.92Ω.

[0102] In this embodiment, the first discharge duration is characterized by both the first discharge duration parameter and the second discharge duration parameter, thus fixing the discharge time and obtaining the voltage value before and after discharge. Compared to collecting voltage during the discharge process, this avoids voltage deviations in the energy storage element caused by the communication time required to read the voltage of capacitor 1 during discharge. Furthermore, each set of FT and OSCT values ​​corresponds to a fixed discharge duration, thus FT and OSCT jointly characterize the first discharge duration. Additionally, the oscillation frequency in this embodiment is obtained through an oscillator mounted on the chip. However, in this embodiment, the oscillator is mounted on the chip and is not illustrated.

[0103] It should be noted that in this embodiment... Figure 4 The discharge curve of capacitor 1 shown is only used to illustrate the discharge trend of capacitor 1. Figure 4 There is an error between the discharge curve diagram in the image and the actual discharge curve diagram, but this does not affect the pass rate. Figure 4 This is to demonstrate the technical solution.

[0104] In one embodiment of the present invention, the method for measuring loop resistance further includes: setting different first discharge duration parameters and second discharge duration parameters to achieve different first discharge durations for discharging the energy storage element, and collecting the initial voltage value and discharge termination voltage value corresponding to different first discharge durations respectively, thereby obtaining multiple initial voltage values ​​and discharge termination voltage values;

[0105] Based on the multiple initial voltage values ​​and discharge termination voltage values ​​obtained from the acquisition, multiple resistance values ​​are calculated, and the average resistance value is calculated for the multiple resistance values. The calculated average resistance value is used as the resistance value of the loop resistance of the conductive circuit.

[0106] In this embodiment, by setting different first discharge duration parameters and second discharge duration parameters, different fixed discharge durations are obtained, resulting in different discharge termination voltage values. Multiple resistance values ​​are then calculated, and the average resistance value is calculated from these multiple resistance values, which helps to further improve the accuracy of the obtained resistance values.

[0107] Another aspect of this application provides an apparatus for measuring loop resistance, such as... Figure 5 As shown, the device for measuring loop resistance includes:

[0108] The capacity acquisition module 50 is used to acquire the capacity of the energy storage element;

[0109] The charging control module 51 is used to control the energy storage element to charge.

[0110] Voltage acquisition module 52 is used to acquire the voltage of the energy storage element;

[0111] Discharge control module 53 is used to control the energy storage element to discharge;

[0112] Clock module 54, used for timing;

[0113] The voltage deviation determination module 55 is used to determine the voltage deviation value of the energy storage element caused by the corresponding communication time during the process of reading the voltage of the energy storage element.

[0114] Calculation module 56 is used for calculations.

[0115] In this embodiment, the device for measuring loop resistance can calculate the voltage deviation value and add a compensation voltage value to the first voltage value. The compensation voltage value is equal to the voltage deviation value, so that the voltage value of the energy storage element at the beginning of discharge is equal to the voltage value obtained during actual charging, thereby improving the accuracy of the voltage value at the beginning of discharge. In addition, the first discharge time of the energy storage element is fixed, avoiding voltage differences caused by communication time differences during voltage measurement during the discharge process. Therefore, using the device for measuring loop resistance in this embodiment can improve the accuracy of measuring the resistance value of the loop resistance, thereby improving the detection accuracy of the loop resistance and providing more reliable data support for determining whether the resistance value of the loop resistance is within the acceptable range.

[0116] In another aspect, this application provides a computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the above-described method.

[0117] In this embodiment, the computer program implements the above-described method when executed by the processor, such as... Figure 2 As shown, it includes:

[0118] Step S202: Obtain the capacitance of the energy storage element;

[0119] Step S204: Charge the energy storage element and determine the voltage deviation value of the energy storage element caused by the communication time during the process of reading the voltage of the energy storage element. The two poles of the energy storage element are connected by a connecting line to form a conductive loop 2.

[0120] Step S206: Collect the voltage of the energy storage element at the moment of completion of charging to obtain the first voltage value;

[0121] Step S208: Based on the voltage deviation value, add a compensation voltage value to the first voltage value, wherein the compensation voltage value is equal to the voltage deviation value;

[0122] Step S210: Discharge the energy storage element for a first discharge duration, and collect the voltage of the energy storage element after the first discharge duration to obtain a second voltage value;

[0123] Step S212: Based on the energy storage element's capacitance, first voltage value, compensation voltage value, first discharge duration, and second voltage value, calculate the resistance value of the circuit resistance of the conductive circuit 2.

[0124] Furthermore, when the computer program in this embodiment is executed by the processor to implement the above-described method, it also includes other steps included in the method for measuring loop resistance.

[0125] In another aspect, an electronic device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method described above.

[0126] In this embodiment, the computer program implements the above-described method when executed by the processor, such as... Figure 2 As shown, it includes:

[0127] Step S202: Obtain the capacitance of the energy storage element;

[0128] Step S204: Charge the energy storage element and determine the voltage deviation value of the energy storage element caused by the communication time during the process of reading the voltage of the energy storage element. The two poles of the energy storage element are connected by a connecting line to form a conductive loop 2.

[0129] Step S206: Collect the voltage of the energy storage element at the moment of completion of charging to obtain the first voltage value;

[0130] Step S208: Based on the voltage deviation value, add a compensation voltage value to the first voltage value, wherein the compensation voltage value is equal to the voltage deviation value;

[0131] Step S210: Discharge the energy storage element for a first discharge duration, and collect the voltage of the energy storage element after the first discharge duration to obtain a second voltage value;

[0132] Step S212: Based on the energy storage element's capacitance, first voltage value, compensation voltage value, first discharge duration, and second voltage value, calculate the resistance value of the circuit resistance of the conductive circuit 2.

[0133] Furthermore, when the computer program in this embodiment is executed by the processor to implement the above-described method, it also includes other steps included in the method for measuring loop resistance.

[0134] In the above embodiments of this application, the descriptions of each embodiment have their own emphasis. Parts not described in detail in a particular embodiment can be found in the relevant descriptions of other embodiments. Furthermore, for the specific operations of program upgrades, please refer to the relevant prior art in this field, and will not be elaborated upon here.

[0135] The technical solution of this application, in essence, or the part that contributes to related technologies, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard drive, magnetic disk, or optical disk.

[0136] A schematic block diagram of the electronic device in this embodiment, such as... Figure 5 The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0137] In this embodiment, the program code for implementing the methods of this application can be written in any combination of one or more programming languages. This program code can be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing device, such that when executed by the processor or controller, the functions / operations specified in the flowcharts and / or block diagrams are implemented. The program code can be executed entirely on the machine, partially on the machine, as a standalone software package partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0138] In addition to the technical solutions disclosed in this embodiment, the capacitor 1, oscillator, chip and their working principle in this invention can be referred to conventional technical solutions in this technical field. However, these conventional technical solutions are not the focus of this invention and will not be described in detail here.

[0139] In the description of this specification, the terms "one embodiment," "some embodiments," "specific embodiment," etc., refer to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0140] It should be understood that the various forms of processes shown above can be used to rearrange, add, or delete steps. For example, the steps described in this disclosure can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution provided in this disclosure can be achieved, and this is not limited herein.

[0141] The above are merely preferred embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for measuring a loop resistance, characterized by, The method includes: Obtain the capacitance of the energy storage element; The energy storage element is charged, and the voltage deviation value of the energy storage element caused by the corresponding communication time during the process of reading the voltage of the energy storage element is determined. The two poles of the energy storage element are connected by a connecting line to form a conductive loop. The voltage of the energy storage element at the moment when charging ends is collected to obtain a first voltage value; Based on the voltage deviation value, a compensation voltage value is added to the first voltage value, wherein the compensation voltage value is equal to the voltage deviation value; The energy storage element is discharged for a first discharge duration, and the voltage of the energy storage element after the first discharge duration is collected to obtain a second voltage value; Based on the capacitance of the energy storage element, the first voltage value, the compensation voltage value, the first discharge duration, and the second voltage value, the resistance value of the circuit resistance of the conductive circuit is calculated. The step of charging the energy storage element and determining the voltage deviation caused by the communication duration during the process of reading the voltage of the energy storage element includes: During the charging process of the energy storage element, the process voltage of the energy storage element is collected multiple times to obtain multiple process voltage values; Based on the multiple process voltage values, the charging rate of the energy storage element is calculated; The voltage deviation value is calculated based on the charging rate and the fixed communication time for completing one voltage measurement. The charging rate of the energy storage element is calculated using the following formula; Equation: ; In the formula, K is the charging rate. Let be the voltage value at time i during the charging process. Let be the voltage value at time j during the charging process. Let be the duration from time i to time j. , The units are all V. The unit is ms; The voltage deviation value is calculated using the following formula; Equation: ; In the formula, T is the fixed communication time to complete one voltage measurement, and the unit of T is ms. K is the charging rate.

2. The method of claim 1, wherein, The process of obtaining the capacitance of the energy storage element includes: The capacitance of the energy storage element is calibrated to obtain the calibrated capacitance of the energy storage element, and the calibrated capacitance is used as the capacitance of the energy storage element.

3. The method of claim 2, wherein, The calibration of the energy storage element's capacity to obtain the calibrated capacity of the energy storage element includes: The energy storage element is charged to a saturated state, and the capacity of the energy storage element in the saturated state is measured to obtain the actual capacity of the energy storage element. The actual capacity is used as the calibrated capacity of the energy storage element.

4. The method of claim 1, wherein, The step of adding a compensation voltage value to the first voltage value includes: The first voltage value is increased by a compensation voltage value using the following formula; Equation: ; In the formula, To collect the voltage value obtained at the moment when the energy storage element finishes charging, The compensation voltage value is... To calculate the obtained voltage deviation value, , , The unit for all values ​​is V.

5. The method according to claim 4, characterized in that, The resistance value of the circuit resistance of the conductive circuit is calculated using the following formula; official: ; In the formula, FT is the first discharge duration parameter for discharging; OSCT is the oscillation frequency, and OSCT is the second discharge duration parameter for discharging. The unit of OSCT is KHz, and FT and OSCT together characterize the first discharge duration. C is the capacitance value, and the unit of C is μF. The voltage value of the energy storage element before discharge, i.e., the initial voltage value. The unit is V; The voltage value after the first discharge duration of the energy storage element, i.e., the discharge termination voltage value. The unit is V.

6. The method of claim 5, wherein, The method further includes: By setting different first discharge duration parameters and second discharge duration parameters, different first discharge durations are achieved for discharging the energy storage element, and the initial voltage value and discharge termination voltage value corresponding to the different first discharge durations are collected respectively, resulting in multiple initial voltage values ​​and discharge termination voltage values. Based on the multiple initial voltage values ​​and the discharge termination voltage values ​​obtained from the acquisition, multiple resistance values ​​are calculated respectively, and an average resistance value is calculated for the multiple resistance values. The calculated average resistance value is used as the resistance value of the loop resistance of the conductive circuit.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the method described in any one of claims 1 to 6.

8. An electronic device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the method described in any one of claims 1 to 6.

Citation Information

Patent Citations

  • Multi-contact-finger contact state detection method of conductive circuit of electrical equipment

    CN103616636A

  • Detection circuit and electronic device using same

    CN108321773A