Reference processing method and device, power module and storage medium

CN116382589BActive Publication Date: 2026-10-20SHIJIAZHUANG TONHE ELECTRONICS TECH CO LTD
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Patent Information

Application Number
CN202310398804.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-04-14
Publication Date
2026-10-20
Estimated Expiration
2043-04-14

AI Technical Summary

Technical Problem

[0002]电动汽车及其充电桩中的电源模块,通常会使用闭环控制,而闭环控制的各个基准值不是固定不变的,随着应用环境的变化,闭环基准值也有可能发生改变

Benefits of technology

[0033]本发明实施例通过将不同基准的基准信息注册到结构体缓存区中,在数据处理过程中,将会遍历整个结构体缓存区,循环进行基准处理,多个基准的处理过程有序进行,互不干扰,最终基准值存储到对应结构体中,以供电源模块使用。在本方案中,可以适配多个基准的处理,仅需要将基准信息提前注册到结构体缓存区即可,并且可根据用户的不同需求进行不同的基准处理,灵活性高,代码复用性强,适用于不同的电源模块的不同需求。

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Abstract

The application is suitable for the technical field of power supply control, and provides a reference processing method and device, a power supply module and a storage medium.The method comprises the following steps: obtaining current operation parameters of a power supply module; traversing all structures in a preset structure cache area; for each structure, determining a final reference value according to the current operation parameters and reference information in the structure; wherein the structure cache area comprises multiple structures, and each structure registers reference information of one reference; and storing the final reference value of each reference into the corresponding structure, so that the power supply module performs closed-loop control according to the final reference value of each reference.The application can orderly process reference values of each reference of the power supply module, and enhance code reusability.
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Description

Technical Field

[0001] This invention belongs to the field of power control technology, and particularly relates to a reference processing method, device, power module and storage medium. Background Technology

[0002] The power modules in electric vehicles and their charging stations typically employ closed-loop control. However, the reference values ​​for this closed-loop control are not fixed and can change with variations in the application environment. For example, the power module's power output may vary under different operating conditions. More precisely, if the voltage reference remains constant, the change in power corresponds to a change in the current reference, and vice versa. Furthermore, in some cases, the reference values ​​require calibration.

[0003] Therefore, how to ensure that the acquisition and processing of multiple benchmarks are carried out in an orderly manner without interfering with each other, while reducing coupling between codes and enhancing code reusability, is a problem that urgently needs to be solved. Summary of the Invention

[0004] In view of this, embodiments of the present invention provide a reference processing method, apparatus, power module, and storage medium to process the reference values ​​of each reference of the power module in an orderly manner, thereby enhancing code reusability.

[0005] A first aspect of the present invention provides a benchmark processing method, comprising:

[0006] Obtain the current operating parameters of the power module;

[0007] Iterate through all structures in the preset structure cache. For each structure, determine a final baseline value based on the current running parameters and the baseline information in the structure. The structure cache includes multiple structures, and each structure registers a baseline information for a baseline.

[0008] The final reference value for each reference is stored in the corresponding structure so that the power module can perform closed-loop control based on the final reference value for each reference.

[0009] In conjunction with the first aspect, in one possible implementation of the first aspect, each structure registers a benchmark information of a benchmark, including: registering benchmark selection information of the benchmark, wherein the benchmark selection information includes multiple valid benchmark values ​​and a benchmark value selection function;

[0010] Accordingly, based on the current operating parameters and the baseline information in this structure, a final baseline value is determined, including:

[0011] Based on the current operating parameters and the baseline value selection function, a valid baseline value is selected from multiple valid baseline values ​​to obtain the first baseline value, which is then used as the final baseline value.

[0012] In conjunction with the first aspect, in one possible implementation of the first aspect, each structure registers a reference information for a reference, and further includes: registering a reference calibration function for that reference;

[0013] Accordingly, based on the current operating parameters and the baseline information in the structure, a final baseline value is determined, which also includes:

[0014] After obtaining the first reference value, the first reference value is calibrated according to the reference calibration function to obtain the second reference value, which is then used as the final reference value.

[0015] In conjunction with the first aspect, in one possible implementation of the first aspect, the reference includes a voltage reference and a current reference; for each reference, the valid reference value includes at least one of the following:

[0016] The reference values ​​set by the host computer, the reference values ​​when the power module is limited to power output, the reference values ​​when the power module is constantly outputting power, and the reference values ​​of the power module under impact power conditions.

[0017] In conjunction with the first aspect, in one possible implementation of the first aspect, each structure pre-registers a final baseline value storage variable;

[0018] The final baseline value for each baseline is stored in the corresponding structure, including:

[0019] Assign the final baseline value for each baseline to the final baseline value storage variable in the corresponding structure.

[0020] A second aspect of the present invention provides a reference processing apparatus, comprising:

[0021] The acquisition module is used to acquire the current operating parameters of the power module;

[0022] The processing module is used to traverse all structures in the preset structure cache area. For each structure, a final benchmark value is determined based on the current running parameters and the benchmark information in the structure. The structure cache area includes multiple structures, and each structure registers benchmark information for a benchmark.

[0023] The update module is used to store the final reference value of each reference into the corresponding structure so that the power module can perform closed-loop control based on the final reference value of each reference.

[0024] In conjunction with the second aspect, in one possible implementation of the second aspect, each structure registers a benchmark information of a benchmark, including: registering benchmark selection information of the benchmark, wherein the benchmark selection information includes multiple valid benchmark values ​​and a benchmark value selection function;

[0025] Accordingly, the processing module is specifically used for:

[0026] Based on the current operating parameters and the baseline value selection function, a valid baseline value is selected from multiple valid baseline values ​​to obtain the first baseline value, which is then used as the final baseline value.

[0027] In conjunction with the second aspect, in one possible implementation of the second aspect, each structure registers a reference information of a reference, and also includes: registering a reference calibration function for that reference;

[0028] Correspondingly, the processing module is also specifically used for:

[0029] After obtaining the first reference value, the first reference value is calibrated according to the reference calibration function to obtain the second reference value, which is then used as the final reference value.

[0030] A third aspect of the present invention provides a power module including an electronic device. The electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of the reference processing method as described in the first aspect or any possible implementation of the first aspect.

[0031] A fourth aspect of the present invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the baseline processing method as described in the first aspect or any possible implementation thereof.

[0032] The beneficial effects of the embodiments of the present invention compared with the prior art are as follows:

[0033] This invention registers reference information for different benchmarks in a structure cache. During data processing, the entire structure cache is traversed, and benchmark processing is performed cyclically. The processing of multiple benchmarks proceeds in an orderly manner without interference. Finally, the benchmark values ​​are stored in the corresponding structures for use by the power module. This solution can adapt to the processing of multiple benchmarks by simply registering the benchmark information in the structure cache beforehand. Furthermore, different benchmark processing can be performed according to different user needs, offering high flexibility, strong code reusability, and applicability to the different requirements of different power modules. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a schematic diagram illustrating the implementation flow of the benchmark processing method provided in this embodiment of the invention;

[0036] Figure 2 This is a schematic diagram of the baseline information registration provided in an embodiment of the present invention;

[0037] Figure 3 This is a schematic diagram of the structure provided in an embodiment of the present invention;

[0038] Figure 4 This is a schematic diagram of the calibration structure provided in an embodiment of the present invention;

[0039] Figure 5 This is a schematic diagram of the benchmark processing procedure provided in an embodiment of the present invention;

[0040] Figure 6 This is a schematic diagram of the reference processing device provided in an embodiment of the present invention;

[0041] Figure 7 This is a schematic diagram of the structure of the electronic device provided in an embodiment of the present invention. Detailed Implementation

[0042] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of the invention. However, those skilled in the art will understand that the invention can be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods are omitted so as not to obscure the description of the invention with unnecessary detail.

[0043] To illustrate the technical solution described in this invention, specific embodiments are described below.

[0044] Traditionally, there is no unified method for processing multiple complex benchmarks. This invention provides a benchmark processing method for handling multiple benchmarks, and it can perform different benchmark processing according to different user needs. The main problems addressed by this solution include:

[0045] (1) How to ensure that the processing of multiple different benchmarks proceeds in an orderly manner without interfering with each other.

[0046] (2) With the same benchmark, different influencing power factors, how to orderly select a suitable influencing factor under the current state, that is, how to determine the appropriate benchmark value.

[0047] (3) How to use different calibration methods to calibrate the reference value.

[0048] See Figure 1 As shown, the benchmark processing method provided in this embodiment of the invention includes:

[0049] Step S101: Obtain the current operating parameters of the power module.

[0050] In this embodiment, the current operating parameters include voltage, current, and output power. Based on these operating parameters, the operating conditions of the power module can be determined, and different references have different requirements under different operating conditions.

[0051] Step S102: Traverse all structures in the preset structure cache area. For each structure, determine a final baseline value based on the current running parameters and the baseline information in the structure. The structure cache area includes multiple structures, and each structure registers a baseline information of a baseline.

[0052] In this embodiment, see Figure 2 As shown, the structure cache includes multiple structures, which are equivalent to storage areas. For each benchmark, the benchmark information of that benchmark is pre-registered in a structure. Subsequently, by traversing all the structures in the structure cache, the final benchmark value of each benchmark can be obtained based on the benchmark information in the structure.

[0053] Because the reference information in the structure is written by the user, this solution has extremely high applicability. For example, the power module can register not only voltage and current references, but also other references according to specific needs, and all references can still be processed in an orderly manner. Furthermore, the reference information for each reference is also written by the user, so the determination of the reference value can be user-defined.

[0054] Step S103: Store the final reference value of each reference into the corresponding structure so that the power module can perform closed-loop control based on the final reference value of each reference.

[0055] In this embodiment, the power module reads the stored final reference value to achieve closed-loop control.

[0056] As can be seen, this embodiment of the invention registers reference information for different references in a structure cache. During data processing, the entire structure cache is traversed, and reference processing is performed cyclically. The processing of multiple references proceeds in an orderly manner without interference. Finally, the reference values ​​are stored in the corresponding structures for use by the power module. This solution can adapt to the processing of multiple references; only the reference information needs to be pre-registered in the structure cache. Furthermore, different reference processing can be performed according to different user needs, offering high flexibility, strong code reusability, and suitability for the diverse requirements of different power modules.

[0057] As one possible implementation, each structure registers baseline information for a specific baseline, including: registering baseline selection information for that baseline, whereby the baseline selection information includes multiple valid baseline values ​​and a baseline value selection function. Correspondingly, based on the current running parameters and the baseline information in the structure, a final baseline value is determined, including:

[0058] Based on the current operating parameters and the baseline value selection function, a valid baseline value is selected from multiple valid baseline values ​​to obtain the first baseline value, which is then used as the final baseline value.

[0059] In this embodiment, the closed-loop reference value may change as the application environment changes.

[0060] For example:

[0061] (1) In order to adapt to various harsh environments and ensure that the power module can operate safely in different environments without unexpected failures, the power module will usually operate with limited power. That is, in harsh environments, in order to ensure that the power module will not cause the device temperature to continue to overheat due to excessive load, which will lead to damage to the internal devices, the power module will operate with limited power. For example, under normal temperature, the rated power of the power module is 3000W, but when the ambient temperature is above 80℃, the power of the power module will be reduced to 2000W.

[0062] (2) Some power modules are designed with sufficient margin in the selection of components, and can be overloaded for a certain period of time in certain special situations. For example, the rated power of the power module is 3000W, and it is allowed to achieve a continuous output of 3600W for 6 minutes within the normal temperature range. After 6 minutes, it will return to the rated power of 3000W.

[0063] (3) Some power modules are designed with a constant power range, that is, the power is guaranteed to be constant and the rated output current decreases as the output voltage increases. For example, for a 2000W power module, the rated current is 100A when the output voltage is 20V and 80A when the output voltage is 25V.

[0064] It can be seen that the power of the power module needs to change under different operating conditions. To be precise, when the voltage reference remains unchanged, the change in power is the change in the current reference; when the current reference remains unchanged, the change in power is the change in the voltage reference.

[0065] In this embodiment, see Figure 3 As shown, each structure includes a reference structure variable. During registration, the reference structure variable stores the reference selection information from the reference information. The reference selection information includes, but is not limited to, multiple valid reference values ​​(or sub-references, including but not limited to the reference value set by the host computer, the reference value when the power module is limited to power output, the reference value when the power module is at constant power output, and the reference value of the power module under impact power conditions) and a reference value selection function. For the same reference, a contiguous memory space is allocated to store multiple valid reference values ​​for the same reference. For example, an array of length 3 is allocated, with address 0 storing the current reference value of the power limiting method result, address 1 storing the current reference value of the constant power method result, and address 2 storing the current reference value of the impact power method result.

[0066] When traversing this structure, the reference value selection function selects one of multiple valid reference values ​​as the final reference value based on the current operating parameters of the power module. It should be noted that the reference value selection function is user-defined; for example, it could take the minimum of the four valid reference values ​​mentioned above as the final reference value. Alternatively, according to certain specifications, a specific valid reference value may be obtained as the final reference value under specific conditions, such as selecting the reference value for constant power output under constant power output conditions.

[0067] The reference selection information may also include the number of valid reference values, which are used in the processing.

[0068] As one possible implementation, each structure registers reference information for a specific reference, and also includes registering a reference calibration function for that reference. Correspondingly, determining a final reference value based on the current operating parameters and the reference information in the structure further includes:

[0069] After obtaining the first reference value, the first reference value is calibrated according to the reference calibration function to obtain the second reference value, which is then used as the final reference value.

[0070] In this embodiment, during closed-loop control of the power module, the limitations of the sampling resistor's accuracy within the module can cause variations in the sampling resistor, resulting in slight differences in the output after closed-loop control. For example, if the user's target closed-loop voltage is 25V, power module A's output voltage after closed-loop control is 24.4V, while power module B's output voltage is 25.7V. This is clearly unacceptable for power modules with an accuracy requirement of ±0.5V, especially since some power modules have even higher accuracy requirements. Furthermore, the length of the output line will also cause line voltage drop, which will also affect the power supply's output. These effects typically require power module calibration to ensure consistency and accuracy across all modules.

[0071] See Figure 3 As shown, each structure also registers a calibration structure variable. This calibration structure variable stores the reference calibration function and the variable information required for calibration. The content of the calibration structure variable can be determined by the user according to their desired calibration method. The variable information required for calibration depends on the variables required by the reference calibration function. If the function is a linear function, the required variable information includes: slope calibration value and zero-point calibration value. If the calibration function is applied to integer data processing and cannot use floating-point data, then slope amplification factor and zero-point amplification factor are also required. Typically, the calibration range does not start from 0V or 0A; calibration only needs to begin within a specific calibration range. For example, the output voltage calibration range is 20-40V, where 20 is the zero-point reference value. In this case, the zero-point reference value also needs to be included as variable information for data calibration.

[0072] For example, in one embodiment, the calibration structure includes: a zero-point reference value, a slope magnification factor, a zero-point magnification factor, a zero-point calibration value pointer, a slope calibration value pointer, and a calibration function pointer. There are many implementations for this type of single calibration method; that is, there are many calibration functions, which can be designed according to user requirements. For example, to ensure:

[0073] k can be greater than 1 or less than or equal to 1;

[0074] b can only be greater than 0 or less than or equal to 0.

[0075] The slope calibration value ∈ (0, 150) and the zero-point calibration value ∈ (0, 150) have a default value of 75. The default values ​​for slope magnification and zero-point magnification are 1. Within the range of reference ∈ (zero-point reference value, upper limit reference value), the calibration function is:

[0076]

[0077] b = (Zero point calibration value - 75) * Zero point magnification

[0078] The final baseline variable = (the original baseline variable - the zero baseline value)k + the zero baseline value + b.

[0079] Within the range of reference ∈ (0, zero-point reference value), calibration function 1 is:

[0080] Final baseline variable = zero baseline value + b

[0081] Within the range of reference ∈ (zero reference value, upper limit reference value), calibration function 2 is:

[0082] Final baseline variable = (original baseline variable - zero baseline value + b)k + zero baseline value

[0083] Within the range of reference ∈ (0, zero-point reference value), calibration function 2 is:

[0084] Final baseline variable = zero-point baseline value + b*k

[0085] Since it is only necessary to ensure that the reference can be perfectly fitted within the calibration range, the fitting function in the range of reference ∈ (0, zero reference value) only needs to be continuous with the reference ∈ (zero reference value, upper limit of reference value) at the zero reference value. Whether it can fit effectively is not required.

[0086] The specific calibration function used—calibration function 1, calibration function 2, or other primary calibration functions—is designed by the user. The design principle is to minimize the number of parameters and simulate the reference's variation trend within the calibration range as perfectly as possible. For the examples of calibration function 1 and calibration function 2 above, the calibration structure is as follows: Figure 4 For the calibration function used by the user, the user can design the calibration function based on the changing trend of the current reference value within the range to be calibrated. The calibration function can be designed as a first-order, second-order, or third-order function according to the user's needs, and the function form can also be changed according to the needs. This application does not limit this.

[0087] As one possible implementation, see Figure 3 As shown, each structure has a pre-registered storage variable for the final baseline value.

[0088] The final baseline value for each baseline is stored in the corresponding structure, including:

[0089] Assign the final baseline value for each baseline to the final baseline value storage variable in the corresponding structure.

[0090] Based on the above, see [link / reference] Figure 5 The benchmark processing procedure includes:

[0091] The first step is to traverse the base information registered in the cache area.

[0092] The second step is to use the benchmark selection function to obtain the required benchmark values ​​based on the number of valid benchmarks and the number of valid benchmark variables in the current cache.

[0093] The third step is to use the calibration information in the current buffer to calibrate the above baseline values.

[0094] Step 4: Update the final baseline variable pointer content in the current buffer using the calibration results. Continue executing Step 1 until all baseline information in the buffer has been traversed.

[0095] The above scheme enables the orderly acquisition and calibration of multiple different benchmarks without interference, reduces code coupling, enhances code reusability, and is suitable for different power module designs.

[0096] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0097] See Figure 6 As shown, an embodiment of the present invention provides a reference processing apparatus 60, which includes:

[0098] The acquisition module 61 is used to acquire the current operating parameters of the power supply module.

[0099] The processing module 62 is used to traverse all structures in the preset structure cache area. For each structure, a final benchmark value is determined based on the current running parameters and the benchmark information in the structure. The structure cache area includes multiple structures, and each structure registers benchmark information for a benchmark.

[0100] The update module 63 is used to store the final reference value of each reference into the corresponding structure so that the power supply module can perform closed-loop control based on the final reference value of each reference.

[0101] As one possible implementation, each structure registers reference information for a reference, including: registering reference selection information for that reference, the reference selection information including multiple valid reference values ​​and a reference value selection function; correspondingly, the processing module 62 is specifically used for:

[0102] Based on the current operating parameters and the baseline value selection function, a valid baseline value is selected from multiple valid baseline values ​​to obtain the first baseline value, which is then used as the final baseline value.

[0103] As one possible implementation, each structure registers reference information for a reference, and also includes: registering a reference calibration function for that reference; correspondingly, the processing module 62 is also specifically used for:

[0104] After obtaining the first reference value, the first reference value is calibrated according to the reference calibration function to obtain the second reference value, which is then used as the final reference value.

[0105] As one possible implementation, the references include voltage references and current references; for each reference, the valid reference value includes at least one of the following:

[0106] The reference values ​​set by the host computer, the reference values ​​when the power module is limited to power output, the reference values ​​when the power module is constantly outputting power, and the reference values ​​of the power module under impact power conditions.

[0107] As one possible implementation, each structure pre-registers a variable to store the final baseline value; update module 63 is specifically used for:

[0108] Assign the final baseline value for each baseline to the final baseline value storage variable in the corresponding structure.

[0109] This invention provides a power module, including an electronic device. The electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of the benchmark processing method described above.

[0110] Figure 7 This is a schematic diagram of an electronic device 70 provided according to an embodiment of the present invention. Figure 7 As shown, the electronic device 70 of this embodiment includes: a processor 71, a memory 72, and a computer program 73 stored in the memory 72 and executable on the processor 71, such as a benchmark processing program. When the processor 71 executes the computer program 73, it implements the steps in the various benchmark processing method embodiments described above, for example... Figure 1 The steps S101 to S103 are shown. Alternatively, when the processor 71 executes the computer program 73, it implements the functions of each module in the above-described device embodiments, for example... Figure 6 The functions of modules 61 to 63 are shown.

[0111] For example, computer program 73 may be divided into one or more modules / units, one or more of which are stored in memory 72 and executed by processor 71 to complete the present invention. One or more modules / units may be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of computer program 73 in electronic device 70.

[0112] Electronic device 70 can be a desktop computer, laptop, handheld computer, cloud server, or other computing device. Electronic device 70 may include, but is not limited to, a processor 71 and a memory 72. Those skilled in the art will understand that... Figure 7 This is merely an example of electronic device 70 and does not constitute a limitation on electronic device 70. It may include more or fewer components than shown, or combine certain components, or different components. For example, electronic device 70 may also include input / output devices, network access devices, buses, etc.

[0113] The processor 71 may be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0114] The memory 72 can be an internal storage unit of the electronic device 70, such as a hard disk or RAM of the electronic device 70. The memory 72 can also be an external storage device of the electronic device 70, such as a plug-in hard disk, Smart Media Card (SMC), Secure Digital (SD) card, or Flash Card equipped on the electronic device 70. Furthermore, the memory 72 can include both internal and external storage units of the electronic device 70. The memory 72 is used to store computer programs and other programs and data required by the electronic device 70. The memory 72 can also be used to temporarily store data that has been output or will be output.

[0115] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0116] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0117] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0118] In the embodiments provided by this invention, it should be understood that the disclosed devices / electronic devices and methods can be implemented in other ways. For example, the device / electronic device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0119] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0120] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0121] If integrated modules / units are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of the present invention can also be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include: any entity or device capable of carrying computer program code, recording media, USB flash drives, portable hard drives, magnetic disks, optical disks, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signals, telecommunication signals, and software distribution media, etc.

[0122] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included within the protection scope of the present invention.

Claims

1. A benchmark processing method, characterized in that, include: Obtain the current operating parameters of the power module; Traverse all structures in the preset structure cache. For each structure, determine a final baseline value based on the current running parameters and the baseline information in the structure. The structure cache includes multiple structures, and each structure registers baseline information for a baseline. The final reference value of each reference is stored in the corresponding structure so that the power module can perform closed-loop control based on the final reference value of each reference. Each structure registers reference information for a reference, including: registering reference selection information for that reference, wherein the reference selection information includes multiple valid reference values ​​and a reference value selection function; the reference includes a voltage reference and a current reference; for each reference, the valid reference value includes at least one of the following: the reference value set by the host computer, the reference value when the power module is limited to power output, the reference value when the power module is constantly outputting power, and the reference value of the power module under impact power conditions; Based on the current operating parameters and the baseline information in this structure, a final baseline value is determined, including: Based on the current operating parameters and the baseline value selection function, a valid baseline value is selected from multiple valid baseline values ​​to obtain the first baseline value, which is then used as the final baseline value.

2. The benchmark processing method as described in claim 1, characterized in that, Each structure registers reference information for a reference, and also registers the reference calibration function for that reference; Accordingly, based on the current operating parameters and the baseline information in the structure, a final baseline value is determined, which also includes: After obtaining the first reference value, the first reference value is calibrated according to the reference calibration function to obtain the second reference value, and the second reference value is used as the final reference value.

3. The benchmark processing method as described in claim 1, characterized in that, Each structure has a pre-registered variable storing the final baseline value; The final baseline value for each baseline is stored in the corresponding structure, including: Assign the final baseline value for each baseline to the final baseline value storage variable in the corresponding structure.

4. A reference processing apparatus, characterized in that, include: The acquisition module is used to acquire the current operating parameters of the power module; The processing module is used to traverse all structures in the preset structure cache area. For each structure, a final baseline value is determined based on the current running parameters and the baseline information in the structure. The structure cache includes multiple structures, each of which registers a type of reference information; The update module is used to store the final reference value of each reference into the corresponding structure so that the power module can perform closed-loop control based on the final reference value of each reference. Each structure registers reference information for a reference, including: registering reference selection information for that reference, wherein the reference selection information includes multiple valid reference values ​​and a reference value selection function; the reference includes a voltage reference and a current reference; for each reference, the valid reference value includes at least one of the following: the reference value set by the host computer, the reference value when the power module is limited to power output, the reference value when the power module is constantly outputting power, and the reference value of the power module under impact power conditions; Based on the current operating parameters and the baseline information in this structure, a final baseline value is determined, including: Based on the current operating parameters and the baseline value selection function, a valid baseline value is selected from multiple valid baseline values ​​to obtain the first baseline value, which is then used as the final baseline value.

5. The reference processing apparatus as described in claim 4, characterized in that, Each structure registers reference information for a reference, and also registers the reference calibration function for that reference; Correspondingly, the processing module is also specifically used for: After obtaining the first reference value, the first reference value is calibrated according to the reference calibration function to obtain the second reference value, and the second reference value is used as the final reference value.

6. A power module comprising electronic equipment, the electronic equipment including a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method as described in any one of claims 1 to 3.

7. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method as described in any one of claims 1 to 3.

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