An interlayer multiple wave identification method, device and related equipment

Abstract

The application discloses a kind of interlayer multiple wave identification method, device and related equipment, the method can include: based on the upgoing wave extracted in zero offset VSP data, determine the outer corridor mask of upgoing wave;Based on outer corridor mask, the abnormal sampling point included in zero offset VSP data in outer corridor is carried out outlier processing;The seismic data of processed inner and outer corridor is stacked respectively, to identify interlayer multiple wave.Inventor aims at the difficulty of inner and outer corridor stacking in VSP data, especially in outer corridor stacking, the spatial direction waveform inconsistency and time direction waveform incompleteness problem of VSP upgoing wave existing in outer corridor, etc.Abnormal value is carried out outlier processing, and the purpose is to improve the waveform matching degree between inner and outer corridor stacking, to more easily identify interlayer multiple wave and interlayer multiple wave generating interface.

Description

Technical Field

[0001] This invention relates to the field of geophysical exploration technology, and in particular to a method, apparatus and related equipment for identifying interlayer multiples. Background Technology

[0002] As oil and gas exploration extends to igneous rocks, carbonate rocks, and sub-coalbed oil and gas reservoirs, the problem of interlayer multiples is inevitably encountered. The suppression effect of interlayer multiples directly affects effective wave imaging and AVO (Amplitude Variation with Offset) or AVA inversion (AVA inversion is an effective means of obtaining subsurface elastic parameters using reflected wave data, and accurate extraction of AVA gathers is a prerequisite for using AVA gathers to invert reflected wave data), and indirectly affects subsequent reservoir prediction and reservoir description. Therefore, suppressing interlayer multiples, including the identification of interlayer multiples and the interfaces that generate interlayer multiples, has an urgent need and broad application prospects. Summary of the Invention

[0003] Corridor stacking records from conventional Vertical Seismic Profiles (VSPs) are generally used for horizon calibration. However, this calibration introduces errors when the strata are dipped. These errors increase with the dip angle and decrease with the distance between the downhole geophone and the stratigraphic interface. Currently, suppressing interlayer multiples is a highly challenging advanced seismic data processing technology that major geophysical service companies are vying to develop. The inventors have discovered that although some industrially produced interlayer multiple suppression processing modules exist, both the processing modules themselves and quality monitoring of the suppressed interlayer multiples require the identification of interlayer multiples and their generation interfaces. Therefore, the inventors believe that the most reliable method for identifying interlayer multiples and their generation interfaces is to compare the internal and external corridor stacking results of the upwaves in VSP seismic data to identify the interlayer multiples and, based on this, trace the generation interfaces.

[0004] In view of the above problems, the present invention is proposed to provide a method, apparatus and related equipment for identifying interlayer multiples that overcomes or at least partially solves the above problems.

[0005] In a first aspect, embodiments of the present invention provide a method for identifying inter-layer multiples, which may include:

[0006] Based on the uplink extracted from the zero-bias VSP data, the outer corridor mask of the uplink is determined.

[0007] Based on the outer corridor mask, outlier processing is performed on the abnormal sampling points included in the zero-bias VSP data within the outer corridor.

[0008] The processed seismic data of the inner and outer corridors are superimposed to identify the inter-layer multiples.

[0009] Optionally, the outlier processing of abnormal sampling points included in the zero-bias VSP data within the outer corridor, based on the outer corridor mask, may include:

[0010] Based on the outer corridor mask, the sample point value of the sampling point outside the outer corridor is set to zero;

[0011] For each time sampling point, determine the channel number in the depth direction corresponding to the inner and outer boundaries of the outer corridor;

[0012] Determine the mean and variance of the sampling points within the outer corridor based on the stated channel number;

[0013] Based on the mean and variance, outlier sampling points are identified, and outlier processing is performed on these outlier sampling points.

[0014] Optionally, it may also include: determining seismic data for all sampling points within the outer corridor based on the track number.

[0015] Optionally, the outlier processing for the outlier points may include:

[0016] The outlier values ​​of the outlier points are corrected using the mean, or the outlier values ​​of the outlier points are smoothed using median filtering of adjacent sampling points in the time direction.

[0017] Optionally, the step of overlaying the seismic data from the inner and outer corridors to identify the inter-layer multiples may include:

[0018] Along the time axis, for each time point, the outer corridor is overlaid;

[0019] Along the time axis, for each time point, the inner corridor is overlaid;

[0020] Based on the superposition results of the outer corridor and the inner corridor, the waveform of the inner corridor superposition result that exceeds the outer corridor superposition result is determined as interlayer multiple wave.

[0021] Optionally, before superimposing the processed seismic data of the inner and outer corridors, the method may further include: obtaining the number of superpositions for the inner corridor.

[0022] Optionally, determining the outer corridor mask of the up-traveling wave may include:

[0023] Based on the upflow wave in the zero-bias VSP data, determine the mask function corresponding to each sampling point;

[0024] The outer corridor mask of the up-going wave is determined based on the mask function corresponding to each sampling point.

[0025] Optionally, determining the outer corridor mask of the up-traveling wave based on the mask function corresponding to each sampling point may include:

[0026] The endpoints of the mask function corresponding to each sampling point are connected to determine the outer corridor mask of the up-going wave.

[0027] Optionally, before determining the outer corridor mask of the up-going wave, the method may further include: obtaining the number of times the outer corridor is superimposed.

[0028] Optionally, before determining the outer corridor mask based on the extracted uplink wave, the process may further include:

[0029] Obtain zero-bias VSP data and corresponding sampling point parameters;

[0030] Extract the first arrival time of the zero-bias VSP data;

[0031] Based on the initial arrival time, the zero-bias VSP data is dynamically corrected;

[0032] Extract the uplink wave from the dynamically corrected zero-bias VSP data;

[0033] The sampling point parameters include: minimum sampling point depth, maximum sampling point depth, and sampling interval in the depth direction and sampling interval in the time direction.

[0034] Secondly, embodiments of the present invention provide a method for suppressing interlayer multiples, which may include:

[0035] Interlayer multiples identified according to the interlayer multiple identification method described in the first aspect;

[0036] The interlayer multiple waves are suppressed.

[0037] Thirdly, embodiments of the present invention provide an inter-layer multiple wave identification device, which may include:

[0038] A determination module is used to determine the outer corridor mask of the uplink wave based on the uplink wave extracted from the zero-bias VSP data.

[0039] The processing module is used to perform outlier processing on the abnormal sampling points included in the zero-bias VSP data in the outer corridor based on the outer corridor mask.

[0040] The overlay module is used to overlay the processed seismic data of the inner and outer corridors respectively;

[0041] The identification module is used to identify the interlayer multiples based on the superposition results of the inner corridor seismic data and the outer corridor seismic data.

[0042] Fourthly, embodiments of the present invention provide an interlayer multiple suppression device, which may include: a suppression module for suppressing interlayer multiples identified according to the interlayer multiple identification method described in the first aspect.

[0043] Fifthly, embodiments of the present invention provide an application of the inter-layer multiples identified by the inter-layer multiples identification method described in the first aspect in seismic processing.

[0044] In a sixth aspect, embodiments of the present invention provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the interlayer multiple identification method described in the first aspect, or the interlayer multiple suppression method described in the second aspect.

[0045] In a seventh aspect, embodiments of the present invention provide a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements the interlayer multiple identification method described in the first aspect, or the interlayer multiple suppression method described in the second aspect.

[0046] The beneficial effects of the above-described technical solutions provided in the embodiments of the present invention include at least the following:

[0047] This invention provides a method, apparatus, and related equipment for identifying inter-layer multiples. The method includes: determining an outer corridor mask for the upflowing wave extracted from zero-bias VSP data; processing outlier points in the zero-bias VSP data within the outer corridor based on the outer corridor mask; and superimposing the processed seismic data from the inner and outer corridors to identify inter-layer multiples. Addressing the difficulty of superimposing VSP data within and outside corridors, especially in the outer corridor, the inventors have implemented outlier processing to improve waveform matching between the superimposed inner and outer corridors, thereby facilitating the identification of inter-layer multiples and their generation interfaces.

[0048] Other features and advantages of the invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures particularly pointed out in the written description and the accompanying drawings.

[0049] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. Attached Figure Description

[0050] The accompanying drawings are provided to further illustrate the invention and form part of the specification. They are used in conjunction with embodiments of the invention to explain the invention and do not constitute a limitation thereof. In the drawings:

[0051] Figure 1 This is a flowchart illustrating the method for identifying inter-layer multiples provided in an embodiment of the present invention.

[0052] Figure 2 This is a flowchart illustrating a specific method for identifying inter-layer multiples provided in an embodiment of the present invention.

[0053] Figure 3 This is an example of synthesized zero-bias VSP data provided in an embodiment of the present invention;

[0054] Figure 4 Provided in the embodiments of the present invention Figure 3 First arrival time corresponding to zero bias VSP data;

[0055] Figure 5 This refers to the dynamically corrected zero-bias VSP data provided in this embodiment of the invention.

[0056] Figure 6 This refers to the upflow wave extracted from dynamically corrected zero-bias VSP data provided in this embodiment of the invention.

[0057] Figure 7 This refers to the mask function corresponding to the i-th sampling point provided in this embodiment of the invention;

[0058] Figure 8 This is an example of a mask function provided in an embodiment of the present invention;

[0059] Figure 9 This refers to the dynamically corrected upward wave within the outer corridor provided in this embodiment of the invention.

[0060] Figure 10 This is a statistically based definition of outliers within the outer corridor provided in this embodiment of the invention.

[0061] Figure 11 This is a comparison of local upflow wave data in the outer corridor before and after outlier processing provided in this embodiment of the invention.

[0062] Figure 12 The above describes the superposition results of the inner and outer corridors before outlier processing and the interlayer multiples determined in this embodiment of the invention.

[0063] Figure 13 The above describes the superposition result of the inner and outer corridors after outlier processing and the interlayer multiples determined in the embodiments of the present invention.

[0064] Figure 14 This is an example of an upflow wave after actual data inner and outer corridor superposition and dynamic correction provided in an embodiment of the present invention;

[0065] Figure 15 This is a schematic diagram of the structure of the interlayer multiple wave identification device provided in an embodiment of the present invention. Detailed Implementation

[0066] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0067] This invention provides a method for identifying inter-layer multiples, referring to... Figure 1 As shown, the method may include the following steps:

[0068] Step S11: Determine the outer corridor mask of the uplink wave based on the uplink wave extracted from the zero-bias VSP data.

[0069] Step S12: Based on the outer corridor mask, perform outlier processing on the abnormal sampling points included in the zero-bias VSP data in the outer corridor.

[0070] Step S13: Superimpose the processed seismic data of the inner and outer corridors to identify inter-layer multiples.

[0071] In this embodiment of the invention, the inventors address the difficulty of superimposing VSP data in the inner and outer corridors, especially in the outer corridor. They perform outlier processing on outliers such as spatial waveform inconsistency and temporal waveform incompleteness in the VSP upflow wave in the outer corridor. The aim is to improve the waveform matching degree between the inner and outer corridor superpositions, making it easier to identify interlayer multiples and the interface where interlayer multiples are generated.

[0072] In one specific embodiment, refer to Figure 2 As shown, the above-mentioned method for identifying inter-layer multiples may include the following steps:

[0073] Step S201: Obtain the zero-bias VSP data and the corresponding sampling point parameters. The sampling point parameters include: minimum sampling point depth, maximum sampling point depth, and the sampling interval in the depth direction and the sampling interval in the time direction.

[0074] The zero-bias VSP data described above in this embodiment of the invention uses d(z) r ,t) represents the minimum depth z of the sampling point.min This indicates that the maximum depth of the sampling point is represented by z. max The depth and time sampling intervals Δz and Δt are represented, where d represents the zero-bias VSP data, and z represents the depth and time sampling intervals Δz and Δt. r This represents the depth of the receiving point, and t is the time coordinate. (See reference...) Figure 3 The image shows an example of synthesized zero-bias VSP data.

[0075] Step S202: Extract the first arrival time of the zero bias VSP data.

[0076] In this embodiment of the invention, the following formula can be used for extraction:

[0077] t fb (z r )=Ap(d(z r ,t))

[0078] Where Ap represents the automatic or manual first-arrival picking operator, and t fb z represents the initial arrival time of the zero-bias VSP data. r The depth of the receiving point is represented by t, which is the time coordinate. Figure 4 This displays the first arrival time corresponding to the zero-bias VSP data.

[0079] Step S203: Based on the initial arrival time, dynamically correct the zero-bias VSP data.

[0080] In this embodiment of the invention, dynamic correction can be performed using the following formula:

[0081] d1(z r ,t)=d(z r ,t+t fb (z r ))

[0082] Where d and d1 represent the zero-bias VSP data and the dynamically corrected zero-bias VSP data, respectively, and t fb z represents the initial arrival time of the zero-bias VSP data. r The depth of the receiving point is represented by t, which is the time coordinate. Figure 5 The data shown is the dynamically corrected zero-bias VSP data, where the lighter-colored portion represents interlayer multiples.

[0083] Step S204: Extract the uplink wave from the dynamically corrected zero-bias VSP data.

[0084] In this embodiment of the invention, the upward wave can be extracted using the following formula:

[0085] d2(z r ,t)=Ug(d1(z r ,t))

[0086] Where Ug represents the operator used to extract the upflow wave, d1 and d2 represent the dynamically corrected zero-bias VSP data and the extracted upflow wave data, respectively, and z r The depth of the receiving point is represented by t, which is the time coordinate. Figure 6 The image shows the upflow extracted from dynamically corrected zero-bias VSP data.

[0087] Step S205: Obtain the number of times the outer corridor is stacked. In this embodiment of the invention, S2 represents the number of times the outer corridor is stacked. It should be noted that this step can be performed before, after, or simultaneously with steps S201 to S204, i.e., it can be obtained before step S206. This embodiment of the invention does not impose specific limitations on this.

[0088] Step S206: Determine the outer corridor mask for the up-going wave.

[0089] In this embodiment of the invention, the outer corridor mask is determined using the following formula:

[0090]

[0091]

[0092]

[0093] z i =z min +(i-1)Δz

[0094] Among them, R and R i The mask function represents the total sum corresponding to each sampling point, Π represents the product symbol, z represents the depth, i and m represent the seismic trace numbers in the depth direction, j and n represent the sampling point numbers in the time direction, and z min t represents the minimum depth of the VSP sampling point. fb The initial arrival time is represented by Δz and Δt, which represent the depth and time sampling intervals, respectively. S2 is the number of times the outer corridor is overlaid. Figure 7 This shows the mask function corresponding to the i-th sampling point. Figure 8 This demonstrates an example of a complete mask function.

[0095] The specific implementation of this step may include the following steps:

[0096] Based on the up-wave in the zero-bias VSP data, determine the mask function corresponding to each sampling point; based on the mask function corresponding to each sampling point, determine the outer corridor mask of the up-wave.

[0097] More specifically, the endpoints of the mask function corresponding to each sampling point can be connected to determine the outer corridor mask of the up-going wave.

[0098] Step S207: Based on the outer corridor mask, set the sample point value of the sampling point outside the outer corridor to zero.

[0099] Step S208: For each time sampling point, determine the channel number in the depth direction corresponding to the inner and outer boundaries of the outer corridor.

[0100] In this step, for each time sampling point, the channel numbers Za(j) and Zb(j) (j=1,2,…,Nt) corresponding to the inner and outer boundaries of the outer corridor in the depth direction are obtained, where j represents the index of the sampling point in the time direction and Nt is the index of the maximum sampling point in the time direction. Figure 9 This is a dynamically corrected upward wave in the outer corridor shown in an embodiment of the present invention, where waveform distortion can be clearly seen in a magnified view.

[0101] Step S209: Determine the seismic data of all sampling points in the outer corridor according to the track number.

[0102] Step S210: Determine the mean and variance of the sampling points in the outer corridor based on the channel number.

[0103] In this step, we first calculate the mean of the data in the outer corridor for each time sampling point along the time axis, as shown in the following formula:

[0104]

[0105] Where d2 represents the up-wave extracted from the dynamically corrected zero-bias VSP data, Δz and Δt represent the sampling intervals in the depth and time directions, respectively, i and j represent the sequence numbers of the sampling points in the depth and time directions, respectively, and Nt is the sequence number of the maximum sampling point in the time direction.

[0106] Then, along the time axis, for each time sampling point, the standard deviation of the data in the corresponding outer corridor is calculated, as shown in the following formula:

[0107] er(i,j)=d2((i-1)Δz,(j-1)Δt)-mean(j)

[0108]

[0109] Where d2 represents the up-wave extracted from the dynamically corrected zero-bias VSP data, er represents the difference between the value of d2 and its mean, sd represents the standard deviation, Δz and Δt represent the sampling intervals in the depth and time directions, respectively, i and j represent the indexes of the sampling points in the depth and time directions, respectively, and Nt is the index of the maximum sampling point in the time direction.

[0110] Step S211: Based on the mean and variance, identify outlier sampling points and perform outlier processing on them.

[0111] In this step, outliers at outliers are corrected using the mean, or smoothed using median filtering of adjacent sampling points in the time direction. This invention transforms the outlier processing into a mathematical problem of probability statistics and function smoothness, and provides a solution by replacing waveform values ​​exceeding one variance in the spatial direction with the mean and employing a three-point median filter in the time direction.

[0112] Specifically, along the time axis, for each time sampling point, outlier processing is performed on the data within the outer corridor, as shown in the following formula:

[0113] A1(j) = mean(j) - sd(j)

[0114] A2(j) = mean(j) + sd(j)

[0115]

[0116] Where d2 represents the up-wave extracted from the dynamically corrected zero-bias VSP data, mean and sd represent the mean and standard deviation, Δz and Δt represent the sampling intervals in the depth and time directions, respectively, i and j represent the indexes of the sampling points in the depth and time directions, respectively, and Nt is the index of the maximum sampling point in the time direction. Figure 10 The document explains the causes of outliers, their statistical definition, and methods for handling them. Point A shows waveform incompleteness at the outer corridor boundary due to time window cutting; point B shows waveform distortion due to upper and lower wave separation. Both outliers require processing to achieve a more accurate waveform match. Figure 11 The image shows a comparison of upwave data in a local area of ​​the outer corridor before and after outlier processing. It can be seen that the abnormal waveform was corrected after outlier processing.

[0117] Step S212: Along the time axis, perform outer corridor overlay on the sampling points at each time point.

[0118] In this embodiment of the invention, the superposition process can be performed using the following formula:

[0119]

[0120] Where stko represents the outer corridor overlay, d3 represents the up-wave after outlier processing, i and j represent the sequence numbers of the sampling points in the depth and time directions, respectively, and Nt is the sequence number of the maximum sampling point in the time direction.

[0121] Step S213: Obtain the number of times the inner corridor is stacked. In this embodiment of the invention, S1 is used to represent the number of times the outer corridor is stacked. It should be noted that this step can be performed before, after, or simultaneously with steps S201 to S212, i.e., it can be obtained before step S214. This embodiment of the invention does not impose specific limitations on this.

[0122] Step S214: Along the time axis, perform inner corridor overlay on the sampling points at each time point.

[0123] In this embodiment of the invention, the superposition process can be performed using the following formula:

[0124]

[0125] Where stki represents the inner corridor overlay, d2 represents the up-wave extracted from the dynamically corrected zero-bias VSP data, i and j represent the sequence numbers of the sampling points in the depth and time directions, respectively, and Nt is the sequence number of the maximum sampling point in the time direction. Figure 12 The display shows the result of the superposition of the inner and outer corridors before data outlier processing, as well as the difference between the superposition of the inner and outer corridors. Figure 13 The display shows the result of the superposition of the inner and outer corridors after data outlier processing, as well as the difference between the superposition of the inner and outer corridors.

[0126] Step S215: Based on the superposition results of the outer corridor and the inner corridor, the waveform of the inner corridor superposition result that exceeds the outer corridor superposition result is determined as interlayer multiple wave.

[0127] Comparing the results of the inner and outer corridor superposition, the waveform that exceeds the outer corridor superposition in the inner corridor superposition is the interlayer multiple wave. Figure 14 The example given is based on actual data. By comparing the superimposed results of the inner and outer corridors, it can be found that there are interlayer multiples at two locations.

[0128] Based on the same inventive concept, this invention also provides an interlayer multiple wave identification device, referring to... Figure 15 As shown, the device may include: a determining module 151, a processing module 152, an overlay module 153, and an identification module 154, and its working principle is as follows:

[0129] The determination module 151 is used to determine the outer corridor mask of the uplink wave based on the uplink wave extracted from the zero-bias VSP data.

[0130] The processing module 152 is used to perform outlier processing on the abnormal sampling points included in the zero-bias VSP data in the outer corridor based on the outer corridor mask.

[0131] The overlay module 153 is used to overlay the processed seismic data of the inner and outer corridors respectively;

[0132] The identification module 154 is used to identify the interlayer multiples based on the superposition results of the inner corridor seismic data and the superposition results of the outer corridor seismic data.

[0133] In an optional embodiment, the processing module 152 is specifically used for:

[0134] Based on the outer corridor mask, the sample point value of the sampling point outside the outer corridor is set to zero;

[0135] For each time sampling point, determine the channel number in the depth direction corresponding to the inner and outer boundaries of the outer corridor;

[0136] Determine the mean and variance of the sampling points within the outer corridor based on the stated channel number;

[0137] Based on the mean and variance, outlier sampling points are identified, and outlier processing is performed on these outlier sampling points.

[0138] In another alternative embodiment, the processing module 152 is further configured to: determine the seismic data of all sampling points within the outer corridor based on the track number.

[0139] More specifically, the above-mentioned processing module 152 is also specifically used to: correct the outlier value of the outlier point using the mean, or to smooth the outlier value of the outlier point using the median filtering method of adjacent sampling point values ​​in the time direction.

[0140] In another alternative embodiment, the overlay module 153 is specifically used for:

[0141] Along the time axis, for each time point, the outer corridor is overlaid;

[0142] Along the time axis, the sampling points at each time point are overlaid with inner corridors.

[0143] In another optional embodiment, the identification module 154 is specifically used to: determine the waveform of the inner corridor superposition result that exceeds the outer corridor superposition result as an interlayer multiple wave based on the outer corridor superposition result and the inner corridor superposition result.

[0144] In another alternative embodiment, refer to Figure 15 As shown, it may also include: acquisition module 155;

[0145] The acquisition module 155 is used to acquire the number of times the inner corridor is superimposed; it is also used to acquire the number of times the outer corridor is superimposed; and it is used to acquire zero-bias VSP data and corresponding sampling point parameters. The sampling point parameters include: minimum sampling point depth, maximum sampling point depth, and sampling intervals in the depth direction and time direction.

[0146] In another alternative embodiment, refer to Figure 15 As shown, it may also include: an extraction module 156 and a correction module 157;

[0147] Extraction module 156 extracts the first arrival time of the zero-bias VSP data;

[0148] The correction module 157 performs dynamic correction on the zero-bias VSP data based on the initial arrival time;

[0149] The extraction module 156 extracts the uplink wave from the dynamically corrected zero-bias VSP data.

[0150] Based on the same inventive concept, this embodiment of the invention also provides a method for suppressing interlayer multiples, which may include: identifying interlayer multiples according to the above-described interlayer multiples identification method; and then suppressing the interlayer multiples.

[0151] Based on the same inventive concept, this embodiment of the invention also provides an interlayer multiple suppression device, characterized in that it includes: a suppression module, used to suppress the interlayer multiples identified by the above-mentioned interlayer multiple identification method.

[0152] Based on the same inventive concept, this embodiment of the invention also provides an application of the inter-layer multiples identified by the above-described inter-layer multiples identification method in seismic processing. For example, its application in seismic interpretation based on seismic data.

[0153] Based on the same inventive concept, this embodiment of the invention also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-mentioned method for identifying interlayer multiples or the above-mentioned method for suppressing interlayer multiples.

[0154] Based on the same inventive concept, this embodiment of the invention also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, when the processor executes the program, it implements the above-mentioned method for identifying interlayer multiples or the above-mentioned method for suppressing interlayer multiples.

[0155] The principles by which the above-mentioned devices, media, and related equipment in the embodiments of the present invention solve the problem are similar to those of the aforementioned methods. Therefore, their implementation can refer to the implementation of the aforementioned methods, and repeated details will not be repeated.

[0156] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage and optical storage) containing computer-usable program code.

[0157] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0158] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0159] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0160] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A method for identifying inter-layer multiples, characterized in that, include: Based on the uplink extracted from the zero-bias VSP data, the mask function corresponding to each sampling point is determined; The outer corridor mask of the up-traveling wave is determined based on the mask function corresponding to each sampling point; Based on the outer corridor mask, the sample point value of the sampling point outside the outer corridor is set to zero; For each time sampling point, determine the channel number in the depth direction corresponding to the inner and outer boundaries of the outer corridor; determine the mean and variance of the sampling points in the outer corridor based on the channel number; determine outlier sampling points based on the mean and variance; correct the outlier values ​​of the outlier sampling points using the mean, or smooth the outlier values ​​of the outlier sampling points using the median filtering method of adjacent sampling point values ​​in the time direction; perform outlier processing on the outlier sampling points included in the zero-bias VSP data in the outer corridor. The processed seismic data of the inner and outer corridors are superimposed to identify the inter-layer multiples.

2. The method according to claim 1, characterized in that, Also includes: Based on the track number, determine the seismic data of all sampling points within the outer corridor.

3. The method according to claim 1, characterized in that, Seismic data from the inner and outer corridors are overlaid separately to identify the inter-layer multiples, including: Along the time axis, for each time point, the outer corridor is overlaid; Along the time axis, for each time point, the inner corridor is overlaid; Based on the superposition results of the outer corridor and the inner corridor, the waveform of the inner corridor superposition result that exceeds the outer corridor superposition result is determined as interlayer multiple wave.

4. The method according to claim 1, characterized in that, Before stacking the processed seismic data of the inner and outer corridors, the process also includes obtaining the number of stacking operations for the inner corridor.

5. The method according to claim 1, characterized in that, The determination of the outer corridor mask of the up-traveling wave based on the mask function corresponding to each sampling point includes: The endpoints of the mask function corresponding to each sampling point are connected to determine the outer corridor mask of the up-going wave.

6. The method according to claim 1, characterized in that, Before determining the outer corridor mask of the up-going wave, the method further includes: obtaining the number of times the outer corridor is superimposed.

7. The method according to any one of claims 1 to 6, characterized in that, Before determining the outer corridor mask based on the extracted uplink wave, the following steps are also included: Obtain zero-bias VSP data and corresponding sampling point parameters; Extract the first arrival time of the zero-bias VSP data; Based on the initial arrival time, the zero-bias VSP data is dynamically corrected; Extract the uplink wave from the dynamically corrected zero-bias VSP data; The sampling point parameters include: minimum sampling point depth, maximum sampling point depth, and sampling interval in the depth direction and sampling interval in the time direction.

8. A method for suppressing interlayer multiple waves, characterized in that, include: Interlayer multiples identified by the method for identifying interlayer multiples according to any one of claims 1 to 7; The interlayer multiple waves are suppressed.

9. A multi-wavelength interlayer identification device, characterized in that, include: The determination module is used to determine the mask function corresponding to each sampling point based on the up-flowing wave extracted from the zero-bias VSP data. The outer corridor mask of the up-traveling wave is determined based on the mask function corresponding to each sampling point; The processing module is used to set the sample point value of the sampling point outside the outer corridor to zero based on the outer corridor mask; For each time sampling point, determine the channel number in the depth direction corresponding to the inner and outer boundaries of the outer corridor; determine the mean and variance of the sampling points in the outer corridor based on the channel number; determine outlier sampling points based on the mean and variance; correct the outlier values ​​of the outlier sampling points using the mean, or smooth the outlier values ​​of the outlier sampling points using the median filtering method of adjacent sampling point values ​​in the time direction; perform outlier processing on the outlier sampling points included in the zero-bias VSP data in the outer corridor. The overlay module is used to overlay the processed seismic data of the inner and outer corridors respectively; The identification module is used to identify the interlayer multiples based on the superposition results of the inner corridor seismic data and the outer corridor seismic data.

10. A device for suppressing interlayer multiple waves, characterized in that, include: The suppression module is used to suppress the inter-layer multiples identified by the inter-layer multiples identification method according to any one of claims 1 to 7.

11. The application of inter-layer multiples identified by the method for identifying inter-layer multiples according to any one of claims 1 to 7 in seismic processing.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by the processor, the program implements the method for identifying interlayer multiples as described in any one of claims 1 to 7, or the method for suppressing interlayer multiples as described in claim 8.

13. A computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the method for identifying interlayer multiples as described in any one of claims 1 to 7, or the method for suppressing interlayer multiples as described in claim 8.

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