A computer chip package testing apparatus and a method of using the same

Abstract

This invention relates to the field of chip testing technology, specifically to a computer chip packaging testing device and its usage method, comprising: a testing rack body, with a motor fixedly connected to the upper end of the testing rack body; a testing mechanism for testing the packaged chip, the testing mechanism being disposed at the lower end of the motor, the lower end of the testing mechanism penetrating to the inner side of the testing rack body; wherein, the testing mechanism includes a testing component for testing the chip, the testing component being disposed on one side of the testing rack body; by setting the testing mechanism in this device, the chip to be tested can be tested under the action of the testing mechanism. When the chip needs to be removed, the device will move the chip horizontally away from the testing area when the testing probe resets, thus making it easier for operators to pick up, thereby reducing the occurrence of operator injuries and minimizing safety hazards during operation.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and in particular to a computer chip packaging testing device and its usage method. Background Technology

[0002] Computer chip packaging testing typically uses a current probe. The test is performed by raising and lowering the current probe to get closer to the chip. After the test, the chip is manually removed. However, the chip may not be easy to remove, and the position where it is removed is close to the test site, which can easily cause the operator to be pinched and injured, posing a risk to the personal safety of the staff.

[0003] Therefore, a computer chip packaging and testing device and its usage method are proposed to solve the above problems. Summary of the Invention

[0004] The present invention achieves the above-mentioned objective through the following technical solution: a computer chip packaging and testing device, comprising: a testing frame body, wherein a motor is fixedly connected to the upper end of the testing frame body; a testing mechanism for testing the packaged chip, wherein the testing mechanism is disposed at the lower end of the motor, and the lower end of the testing mechanism extends through to the inner side of the testing frame body; wherein the testing mechanism includes a testing component for testing the chip, the testing component is disposed on one side of the testing frame body, the lower end of the testing component extends through to the inner side of the testing frame body, and a moving mechanism is disposed on one side of the testing component, the moving mechanism being disposed on the surface of the testing frame body, and the moving mechanism being used to drive the chip to move horizontally.

[0005] Preferably, the moving mechanism includes a moving seat fixedly connected to the surface of the detection frame body. Two second sealing cylinders are fixedly connected to the inner wall of the moving seat. A fixed sleeve is fitted on the telescopic end of the second sealing cylinder. A detection seat is fixedly connected to the other end of the fixed sleeve. The detection seat is slidably connected to the inner wall of the moving seat. A placement groove is opened at the upper end of the detection seat. When the second sealing cylinder inside the moving seat receives gas from inside the detection component, it will move by pushing against the detection seat through the fixed sleeve, so that the detection seat will start to move towards the detection component on the inner wall of the moving seat.

[0006] Preferably, the detection component includes a sliding column fixedly connected to one side of the detection frame body. A threaded shaft is rotatably connected to the inner wall of the sliding column. The upper end of the threaded shaft extends through to the upper end of the detection frame body and is fixedly connected to the motor output shaft. A slider is threadedly connected to the surface of the threaded shaft. A detection probe is fixedly connected to one side of the slider. Driven by the motor output shaft, the threaded shaft will rotate, causing the slider threadedly connected to the surface of the threaded shaft to move downward, which will drive the detection probe to move downward synchronously.

[0007] Preferably, the lower end of the second sealing cylinder is connected to the surface of the detection component, the inner wall of the second sealing cylinder is slidably connected to a second piston, the side of the second piston near the fixed sleeve is fixedly connected to a transverse moving rod, the other end of the transverse moving rod extends to the outside of the second sealing cylinder and is fixedly connected to a stop block, when the air pressure inside the second sealing cylinder increases, the second piston, the transverse moving rod and the stop block will move synchronously.

[0008] Preferably, the surface of the abutment is slidably connected to the inner wall of the fixed sleeve, and a spring is fixedly connected to the other side of the abutment. The spring is fixedly connected to the inner wall of the fixed sleeve. The movement of the abutment can compress the spring to deform it, and then the fixed sleeve will move under the action of the spring.

[0009] Preferably, the surface of the slider is slidably connected to the surface of the sliding column, and two moving rods are fixedly connected to the lower end of the slider. A first piston is fixedly connected to the lower end of the moving rod. When the slider moves down synchronously, the moving rods will drive the first piston to squeeze the gas inside the first sealing cylinder.

[0010] Preferably, a first sealing cylinder is slidably connected to the surface of the first piston, the lower end of the first sealing cylinder extends through to the inner side of the detection frame body, and the surface of the first sealing cylinder is in communication with a second sealing cylinder. When the gas inside the first sealing cylinder is compressed, it will be injected into the second sealing cylinder through the connecting pipe.

[0011] The beneficial effects of this invention are:

[0012] 1. By setting up a detection mechanism, the chip to be tested can be tested under the action of the detection mechanism. Compared with traditional devices, the chip may not be easy to remove, and the position of the chip is located at the test point, which may easily cause the operator to be pinched and cause injury, posing a risk to the personal safety of the staff. This device will move the chip horizontally away from the test point when the detection probe is reset, so that the staff can easily pick it up, thereby reducing the occurrence of operator injury and reducing safety hazards in the work.

[0013] 2. By setting up a stop block, a spring, and a fixing sleeve, the detection seat can reach the lower end of the detection probe first when it moves with the detection component, which reduces the friction between the detection component and the chip during detection. This ensures the detection effect on the chip and reduces the possibility of chip damage caused by detection. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the structure of the present invention;

[0015] Figure 2This is a schematic diagram showing the connection between the first piston and the first sealing cylinder of the present invention;

[0016] Figure 3 This is a schematic diagram of the connection between the sliding column and the threaded shaft of the present invention;

[0017] Figure 4 This is a schematic diagram showing the connection between the detection seat and the movable seat of the present invention;

[0018] Figure 5 This is a schematic diagram showing the connection between the second sealing cylinder and the second piston of the present invention.

[0019] In the diagram: 1. Detection frame body; 2. Motor; 3. Detection assembly; 301. Sliding column; 302. Threaded shaft; 303. Slider; 304. Moving rod; 305. First piston; 306. First sealing cylinder; 307. Detection probe; 4. Moving mechanism; 401. Moving seat; 402. Second sealing cylinder; 403. Second piston; 404. Lateral moving rod; 405. Abutment; 406. Spring; 407. Fixing sleeve; 408. Detection seat; 409. Placement slot. Detailed Implementation

[0020] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] In practical implementation: such as Figure 1-5As shown, a computer chip packaging and testing device includes: a testing rack body 1, with a motor 2 fixedly connected to the upper end of the testing rack body 1; a testing mechanism for testing the packaged chip, disposed at the lower end of the motor 2, the lower end of the testing mechanism penetrating into the inner side of the testing rack body 1; wherein, the testing mechanism includes a testing component 3 for testing the chip, the testing component 3 being disposed on one side of the testing rack body 1, the lower end of the testing component 3 penetrating into the inner side of the testing rack body 1, and a moving mechanism 4 disposed on one side of the testing component 3, the moving mechanism 4 being disposed on the surface of the testing rack body 1, the moving mechanism 4 being used to drive the chip to move horizontally, when the operator needs to perform chip testing, the chip to be tested can be placed on the upper end of the moving mechanism 4, at which time the motor 2 can be started to perform chip testing operation, when the motor 2 is working, it will drive the testing component to move horizontally. Component 3 operates synchronously. When the detection component 3 moves, the moving mechanism 4 will move synchronously under the action of the detection component 3. Through the action of the moving mechanism 4, the chip to be tested can be moved horizontally and moved to the detection area directly below the detection area of ​​the detection component 3. At this time, when the detection component 3 moves, it will perform an alignment and detection operation with the chip to be tested. After the detection is completed, the detection component 3 will be reset under the action of the motor 2. At this time, the detection component 3 will move upward first, and the chip will not move. After the detection component 3 moves a certain distance and separates from the moving mechanism 4 and the chip on it, the moving mechanism 4 will drive the chip to reset and move away from the detection area. This ensures the detection effect and makes it easier for the staff to remove the chip, reducing the risk of the staff being pinched.

[0022] like Figure 1 , Figure 4 and Figure 5As shown, the moving mechanism 4 includes a moving base 401 fixedly connected to the surface of the detection frame body 1. Two second sealing cylinders 402 are fixedly connected to the inner wall of the moving base 401. A fixed sleeve 407 is fitted onto the telescopic end of each second sealing cylinder 402. A detection seat 408 is fixedly connected to the other end of the fixed sleeve 407. The detection seat 408 is slidably connected to the inner wall of the moving base 401. A placement groove 409 is provided at the upper end of the detection seat 408. The lower end of each second sealing cylinder 402 communicates with the surface of the detection assembly 3. A second piston 403 is slidably connected to the inner wall of the second sealing cylinder 402. A transverse moving rod 404 is fixedly connected to the side of the second piston 403 near the fixed sleeve 407. The other end of the transverse moving rod 404 extends through to… A stop block 405 is fixedly connected to the outside of the second sealing cylinder 402. The surface of the stop block 405 is slidably connected to the inner wall of the fixed sleeve 407. A spring 406 is fixedly connected to the other side of the stop block 405 and is also fixedly connected to the inner wall of the fixed sleeve 407. The two second sealing cylinders 402 are interconnected, and the connecting pipe is connected to the surface of the detection component 3. When the operator needs to perform the test, the chip can be placed in the placement slot 409. The cross-sectional shape of the placement slot 409 matches the chip to be tested. When the detection component 3 is activated, the gas inside the second sealing cylinder 402 will increase, which will cause the second piston 403 to move along the inner wall of the second sealing cylinder 402. The piston moves towards the abutment 405. When the second piston 403 moves, it drives the transverse moving rod 404 to move synchronously. As the transverse moving rod 404 moves, the abutment 405 moves synchronously with it. At this time, the abutment 405 deforms through the abutment spring 406. When the spring 406 deforms, one end of the fixed sleeve 407 slides on the surface of the transverse moving rod 404. Simultaneously, the abutment 405 moves against the inner wall of the fixed sleeve 407. Under the action of the spring 406, the fixed sleeve 407 abuts against the detection seat 408, which slides against the inner wall of the moving seat 401. As the detection seat 408 moves, it gradually approaches the detection... Component 3 will eventually come into contact with the surface of detection component 3. At this time, since detection component 3 is still moving, it will drive the abutment 405 to compress the spring 406 on the inner wall of the fixed sleeve 407 through the transverse moving rod 404. Due to the action of the spring 406, the position of the detection seat 408 and the chip will remain unchanged. At this time, detection component 3 can perform detection operation on the chip more conveniently. When the detection is completed, detection component 3 performs a reset operation. When the detection end of detection component 3 moves upward, the second piston 403 will follow the movement. The spring 406 keeps the position of the detection seat 408 and the chip from changing, so that the detection end of detection component 3 can move out smoothly.

[0023] like Figure 1 , Figure 2 and Figure 3As shown, the detection assembly 3 includes a sliding column 301 fixedly connected to one side of the detection frame body 1. A threaded shaft 302 is rotatably connected to the inner wall of the sliding column 301. The upper end of the threaded shaft 302 extends through to the upper end of the detection frame body 1 and is fixedly connected to the output shaft of the motor 2. A slider 303 is threadedly connected to the surface of the threaded shaft 302. A detection probe 307 is fixedly connected to one side of the slider 303. The surface of the slider 303 is slidably connected to the surface of the sliding column 301. Two moving rods 304 are fixedly connected to the lower end of the slider 303. The lower end of the moving rod 304 is fixedly connected to a first piston 305. A first sealing cylinder 306 is slidably connected to the surface of the first piston 305. The lower end of the first sealing cylinder 306 extends through the inner side of the detection frame body 1. The surface of the first sealing cylinder 306 communicates with the second sealing cylinder 402. When the detection component 3 needs to detect the chip, the motor 2 can be started. Driven by the output shaft, the threaded shaft 302 will rotate. At this time, the slider 303, which is threadedly connected to the surface of the threaded shaft 302, will move downward. When slider 303 moves downward, it will drive detection probe 307 to move downward synchronously. At the same time, when slider 303 moves downward, the two moving rods 304 will also move downward synchronously. When the two moving rods 304 move downward, the first piston 305 will squeeze the gas inside the first sealing cylinder 306, so that the gas inside the first sealing cylinder 306 will be injected into the second sealing cylinder 402 through the connecting pipe. As detection probe 307 descends, detection seat 408 will move synchronously to the lower end of detection probe 307 until detection seat 408 contacts the surface of sliding column 301. The detection chip will be kept directly below detection probe 307 without displacement. At this time, slider 303 will continue to move, so that detection probe 307 will perform a test operation on the chip to be tested. After the test is completed, the rotation of motor 2 output shaft will drive slider 303 to reset. At this time, as detection probe 307 moves upward with slider 303, detection probe 307 will separate from chip, completing the detection operation.

[0024] The method of using this invention is as follows: When the operator needs to perform a chip inspection operation, the chip to be inspected is placed on the upper end of the moving mechanism 4. At this time, the motor 2 can be started to perform the chip inspection operation. When the motor 2 is working, it will drive the inspection component 3 to work synchronously. When the inspection component 3 moves, the moving mechanism 4 will move synchronously under the movement of the inspection component 3. The output shaft of the motor 2 drives the threaded shaft 302 to rotate, and the slider 303 drives the inspection probe 307 to move down synchronously. At the same time, when the slider 303 moves down, the two moving rods 304 will move down synchronously. When the two moving rods 304 move down, the gas inside the first sealing cylinder 306 will be squeezed by the first piston 305 and injected into the second sealing cylinder 402. The chip is placed in the placement slot 409. The gas in the second sealing cylinder 402 increases, and the second piston 403 moves horizontally through the moving rods. 404 drives the stop block 405 to move synchronously. At this time, the stop block 405 abuts the spring 406 to deform, and through the fixed sleeve 407, it abuts the detection seat 408 to slide on the inner wall of the moving seat 401. When the detection seat 408 moves, it first contacts the surface of the detection component 3. When the chip to be detected is directly below the detection probe 307, the slider 303 continues to move. The detection probe 307 tests the chip to be detected. After the test is completed, the output shaft of the motor 2 will rotate to drive the slider 303 to reset. When the detection end of the detection component 3 moves upward, the second piston 403 will follow. The spring 406 keeps the position of the detection seat 408 and the chip from changing, so that the detection end of the detection component 3 can move smoothly. As the detection probe 307 moves upward with the slider 303, the detection probe 307 will separate from the chip to complete the detection operation.

[0025] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A computer chip packaging and testing device, characterized in that, include: The testing frame body (1) has a motor (2) fixedly connected to its upper end; The testing mechanism, used to test the packaged chip, is located at the lower end of the motor (2), and the lower end of the testing mechanism extends through the inner side of the testing frame body (1). The testing mechanism includes a testing component (3) for testing the chip. The testing component (3) is disposed on one side of the testing frame body (1). The lower end of the testing component (3) extends through the inner side of the testing frame body (1). A moving mechanism (4) is disposed on one side of the testing component (3). The moving mechanism (4) is disposed on the surface of the testing frame body (1). The moving mechanism (4) is used to drive the chip to move horizontally. The moving mechanism (4) includes a moving seat (401) fixedly connected to the surface of the detection frame body (1). Two second sealing cylinders (402) are fixedly connected to the inner wall of the moving seat (401). The telescopic end of the second sealing cylinder (402) is fitted with a fixed sleeve (407). The other end of the fixed sleeve (407) is fixedly connected to a detection seat (408). The detection seat (408) is slidably connected to the inner wall of the moving seat (401). The upper end of the detection seat (408) is provided with a placement groove (409). The lower end of the second sealing cylinder (402) is in communication with the surface of the detection component (3); The detection component (3) includes a sliding column (301) fixedly connected to one side of the detection frame body (1). The inner wall of the sliding column (301) is rotatably connected to a threaded shaft (302). The upper end of the threaded shaft (302) extends through to the upper end of the detection frame body (1) and is fixedly connected to the output shaft of the motor (2). The surface of the threaded shaft (302) is threadedly connected to a slider (303). A detection probe (307) is fixedly connected to one side of the slider (303). The surface of the slider (303) is slidably connected to the surface of the sliding column (301), and two moving rods (304) are fixedly connected to the lower end of the slider (303). The lower end of the moving rod (304) is fixedly connected to a first piston (305). The surface of the first piston (305) is slidably connected to a first sealing cylinder (306), the lower end of the first sealing cylinder (306) extends through to the inner side of the detection frame body (1), and the surface of the first sealing cylinder (306) is in communication with the second sealing cylinder (402).

2. The computer chip packaging and testing equipment according to claim 1, characterized in that: The inner wall of the second sealing cylinder (402) is slidably connected to a second piston (403). A transverse moving rod (404) is fixedly connected to the side of the second piston (403) near the fixed sleeve (407). The other end of the transverse moving rod (404) extends through to the outside of the second sealing cylinder (402) and is fixedly connected to a stop block (405).

3. The computer chip packaging and testing equipment according to claim 2, characterized in that: The surface of the abutment (405) is slidably connected to the inner wall of the fixed sleeve (407), and a spring (406) is fixedly connected to the other side of the abutment (405). The spring (406) is fixedly connected to the inner wall of the fixed sleeve (407); the two second sealing cylinders (402) are interconnected, and the connecting pipe is connected to the surface of the detection component (3).

4. A computer chip packaging and testing device according to any one of claims 1-3, characterized in that: The two second sealing cylinders (402) are interconnected, and the connecting pipe is connected to the surface of the detection component (3).

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