一种应用系统压测数据的处理方法、装置、设备及介质
By associating random values and test fields with each request data in the application system, the problem of accidental data deletion during load testing was solved, enabling accurate data search and deletion and improving database management efficiency.
CN116450652BActive Publication Date: 2026-07-17PINGAN YIQIANBAO E COMMERCE CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- PINGAN YIQIANBAO E COMMERCE CO LTD
- Filing Date
- 2023-04-11
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
During application system load testing, existing technologies can easily lead to the accidental deletion of data belonging to other testers, resulting in a reduction in database capacity.
Method used
Before the load testing system generates request data, the application system associates a random value and a test field with each request data, and adds these values to the test data to facilitate subsequent searching and deletion.
Benefits of technology
By using a dual association between random values and test fields, application data processed during load testing can be accurately located and deleted, avoiding accidental deletion of other data and improving the management efficiency of the test database.
✦ Generated by Eureka AI based on patent content.
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Figure CN116450652B_ABST
Abstract
本发明涉及数据处理、数据存储领域，提供一种应用系统压测数据的处理方法、装置、设备和介质，该方法包括：压测系统生成多个请求数据，并发送至应用信息；应用系统接收多个请求数据，并根据每个请求数据生成一个随机值，对每个请求数据与生成的随机值进行关联；应用系统利用多个请求数据进行测试处理，生成测试数据；应用系统按照测试处理，从预设的字段组中关联对应的测试字段；并将随机值和测试字段，添加至测试数据中，记为应用数据；应用系统将应用数据发送至测试数据库进行存储，并将随机值发送至压测系统；压测系统将随机值与请求数据进行关联并保存。本发明可对压测处理的应用数据进行删除，避免了误删其他数据的情况。
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