Method for calculating the number of backup parts required for prolonging the life of electronic products

Abstract

The application relates to a backup quantity calculation method required for prolonging the service life of electronic products, and belongs to the technical field of delivery acceptance detection. The method solves the problem that the prior art cannot effectively calculate the backup quantity required for prolonging the service life of electronic products. The method comprises the following steps: obtaining a service life data type of a storage life of an electronic product whose backup quantity is to be calculated; calculating the reliability of a required service life prolonging time of the electronic product according to the service life data type of the electronic product; and calculating the quantity of backup parts required for prolonging the service life of the electronic product according to the service life data type of the storage life of the electronic product and the reliability of the required service life prolonging time.

Description

Technical Field

[0001] This invention relates to the field of delivery acceptance testing technology, and in particular to a method for calculating the number of backup components required to extend the lifespan of electronic products. Background Technology

[0002] With the rapid advancement and transformation of modern high technology, newer, higher, and more stringent technical requirements have been put forward for various electronic product systems. Subsystem-level and critical equipment-level products are required to have higher serviceability and reliability indicators.

[0003] Currently, the development of electronic product systems has shifted its focus to comprehensively improving system performance and meeting actual usage needs, placing higher demands on the overall performance of the entire system throughout its lifecycle. To reduce maintenance complexity and shorten technical preparation time, newly developed products are required to be shipped and tested and maintained in their entire lifecycle condition. This necessitates higher delivery reliability for their subsystems and critical equipment. Understanding product delivery reliability is essential to ensuring usability and mission success, thereby effectively improving overall operational reliability.

[0004] The lack of complete basic material data and corresponding performance data has severely affected the progress of reliability testing for system-level, subsystem-level, and critical equipment-level products.

[0005] Electronic products, from the date of formal delivery, must meet technical performance requirements for a specified period under prescribed packaging, maintenance, and storage conditions. A qualified product's ability to maintain its intended function within a specified storage time under prescribed conditions is called storage reliability. When this ability is measured probabilistically, it is called storage reliability. Before a product passes storage life certification, comprehensively utilizing various information related to product storage to conduct relevant analysis, calculations, and tests on product storage reliability has become an urgent problem to solve. In current practice, determining the number of backup parts required for extending the lifespan of electronic products usually involves acquiring a larger number of backup parts for unforeseen circumstances. However, this method wastes resources. Therefore, determining the number of backup parts required for extending the lifespan of electronic products is also a current challenge that needs to be addressed. Summary of the Invention

[0006] Based on the above analysis, the present invention aims to provide a method for calculating the number of backup components required for extending the lifespan of electronic products, in order to solve the problem that existing methods cannot effectively calculate the number of backup components required for extending the lifespan of electronic products.

[0007] On one hand, embodiments of the present invention provide a method for calculating the number of backup components required to extend the lifespan of electronic products, including:

[0008] The lifetime data type for obtaining the storage lifetime of electronic products for which the number of backup copies to be calculated;

[0009] Based on the data type of the electronic product's lifespan, calculate the reliability of the required lifespan extension time for the electronic product;

[0010] Based on the data type of the electronic product's storage lifespan and the reliability of the required lifespan extension time, calculate the number of backup components required to extend the lifespan of the electronic product.

[0011] Furthermore, calculating the number of backup components required for extending the lifespan of the electronic product based on its storage life and the reliability of the required lifespan extension includes:

[0012] Obtain the quantity of the electronic product to be assembled, and the satisfaction rate of the backup component requirements of the electronic product;

[0013] Determine whether the reliability of the required life extension time of the electronic product is greater than the reliability threshold;

[0014] When the reliability is greater than the reliability threshold, the number of backup components required to extend the lifespan is calculated based on the data type of the storage life, the required number of components to be assembled, and the satisfaction rate of the backup component requirements for the electronic product.

[0015] Furthermore, the step of calculating the required number of backup components for extending the lifespan based on the data type of the storage life, the required assembly quantity, and the satisfaction rate of the electronic product backup component requirements includes: calculating the number of backup components using the following formula:

[0016]

[0017] Where n is the quantity of the electronic product to be assembled, the storage life of the electronic product is an exponential life type with a failure rate of λ, t is the required life extension time, which is calculated from the time the product is delivered for use; K P Let P be the quantile of a normal distribution with probability P, where P is the satisfaction rate of the backup component requirements for electronic products.

[0018] Furthermore, when the reliability is less than or equal to the reliability threshold, the life extension time required for the electronic product with the number of backup components to be calculated is adjusted until the reliability is greater than the reliability threshold.

[0019] Furthermore, the step of calculating the reliability of the required lifespan extension time of the electronic product based on the lifespan data type of the electronic product includes:

[0020] Perform product reliability assurance testing on the product to be tested, and deliver the product that passes the product reliability assurance test into use;

[0021] Set the product delivery time as the start time for calculating product reliability, and record the time from product delivery to the last inspection and maintenance.

[0022] Obtain the data type of product lifespan, and calculate the reliability from the time the product is delivered for use until the last inspection and maintenance, based on the product's lifespan data type and the product's lifespan data type.

[0023] Furthermore, when the product's lifetime data type is an exponential lifetime type with a failure rate of λ, the product's reliability is expressed as:

[0024]

[0025] Where t0 is the time from delivery to the last inspection and maintenance, t is the required life extension time of the product, which is calculated from the time the product is delivered, and t≥t0≥0.

[0026] Furthermore, the product reliability assurance test includes N cycle tests, each cycle test includes one temperature stress test, p vibration stress tests and q electrical stress tests.

[0027] Furthermore, the product reliability assurance test consists of N cycles, performed as follows:

[0028] The first phase of the cyclic test includes one cyclic test. After the test is completed, a power-on test is performed. If the product does not fail, the test continues. If a failure occurs, the test is interrupted, the failure mechanism is analyzed, and the test is repeated.

[0029] The second phase of the cyclic test includes two cyclic tests. After the test is completed, a power-on test is performed. If the product does not fail, the test continues. If a failure occurs, the test is interrupted, the failure mechanism is analyzed, and the test is repeated.

[0030] The third stage is the cyclic testing, which begins from the fourth cycle and continues until the specified testing time is reached. After the test is completed, a power-on test is performed. If the product does not fail, it is considered reliable and can be delivered for use. If a failure occurs, the test is interrupted, the failure mechanism is analyzed, and the test is repeated.

[0031] Furthermore, the test time specified in the product reliability assurance test is 0.212 MTBF of the product.

[0032] Furthermore, in the temperature stress test, the temperature change rate of the product under test is 5°C / min.

[0033] Compared with the prior art, the present invention can achieve at least one of the following beneficial effects:

[0034] 1. This invention provides a method for determining the number of backup components required to extend the lifespan of electronic products. Compared with traditional methods, this method provides a more reasonable test for product reliability, calculates product reliability more accurately, and greatly saves manpower, material resources, and other resources required for testing.

[0035] 2. This invention proposes a method for determining the number of backup components required for extending the lifespan of electronic products based on their reliability, thereby solving the problem of inaccurate determination of the quantity in the prior art;

[0036] 3. The reliability calculation method provided by this invention adopts a three-stage detection method that divides N cycles into three stages within a specified test time of 0.212 MTBF of the electronic product with the number of backup components to be calculated. This method can effectively avoid the problem of excessive test costs caused by product failures and can greatly reduce test costs.

[0037] In this invention, the above-described technical solutions can be combined with each other to achieve more preferred combinations. Other features and advantages of this invention will be set forth in the following description, and some advantages may become apparent from the description or be learned by practicing the invention. The objects and other advantages of this invention can be realized and obtained from what is particularly pointed out in the description and drawings. Attached Figure Description

[0038] The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Throughout the drawings, the same reference numerals denote the same parts.

[0039] Figure 1 This is a flowchart illustrating a method for calculating the number of backup components required to extend the lifespan of an electronic product, as shown in one embodiment of this application.

[0040] Figure 2 This is a cross-sectional schematic diagram of an electronic product reliability assurance test method according to an embodiment of this application;

[0041] Figure 3 This is a cross-sectional view of an electronic product undergoing electrical stress testing, as shown in one embodiment of this application. Detailed Implementation

[0042] Preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, which form part of this application and are used together with the embodiments of the present invention to illustrate the principles of the present invention, but are not intended to limit the scope of the present invention.

[0043] A specific embodiment of the present invention discloses a method for calculating the number of backup components required to extend the lifespan of electronic products, such as... Figure 1 As shown, it includes:

[0044] S10. Obtain the lifetime data type of the electronic product whose number of backup parts to be calculated; specifically, obtain the lifetime data type of the product as an exponential lifetime type that follows the failure rate λ.

[0045] S20. Based on the data type of the electronic product's lifespan, calculate the reliability of the required lifespan extension time for the electronic product;

[0046] Specifically, the step of calculating the reliability of the required lifespan extension time of the electronic product based on the lifespan data type of the electronic product includes:

[0047] S201. Conduct product reliability assurance testing on the product to be tested, and deliver the product that has passed the product reliability assurance test into use.

[0048] Specifically, the product reliability assurance test includes N cycle tests, each cycle test includes one temperature stress test, p vibration stress tests and q electrical stress tests.

[0049] Specifically, a temperature stress test includes, in sequence: a low-temperature stress test section, a normal-temperature stress test section, two high-temperature stress test sections, a normal-temperature stress test section, and a low-temperature stress test section;

[0050] Between two adjacent temperature stress test sections, there is also a temperature change stage and a heat preservation stage;

[0051] Each temperature stress stage lasts for time T1, and the temperature change stage and the heat preservation stage together last for time T2.

[0052] Specifically, during the temperature change phase of the temperature stress test, the temperature change rate of the product under test is 5°C / min.

[0053] Specifically, a vibration stress test includes:

[0054] (1) With power spectral density W1 g 2 The vibration stress of / Hz lasts for time T3;

[0055] (2) With power spectral density W2g 2 The vibration stress of / Hz lasts for time T4;

[0056] (3) With a power spectral density of W3 g 2 The vibration stress of / Hz lasts for time T5;

[0057] (4) No vibration stress is applied for a duration of T2;

[0058] Where T1 = T3 + T4 + T5.

[0059] Specifically, an electrical stress test includes:

[0060] (1) The voltage is V 上限 The first voltage stress test segment lasts for time T1.

[0061] (2) The voltage is V 标称 The second voltage stress test section lasts for time T1.

[0062] (3) The voltage is V 下限 The third voltage stress test section lasts for time T1;

[0063] (4) No voltage stress is applied between different voltage stress test sections for a duration of T2.

[0064] Specifically, the product reliability assurance test consists of N cycles, completed as follows:

[0065] The first phase of the cyclic test includes one cyclic test. After the test is completed, a power-on test is performed. If the product does not fail, the test continues. If a failure occurs, the test is interrupted to analyze the failure mechanism, a failure report form is filled out, and the test is repeated.

[0066] The second phase of the cyclic test includes two cyclic tests. After the test is completed, a power-on test is performed. If the product does not fail, the test continues. If a failure occurs, the test is interrupted to analyze the failure mechanism, a failure report form is filled out, and the test is repeated.

[0067] The third stage is the cyclical testing, which begins from the fourth cyclical test and continues until the specified testing time is reached. After the test is completed, a power-on test is performed. If the product does not malfunction, it is considered reliable and can be delivered for use. If a malfunction occurs, the test is interrupted for fault mechanism analysis, a fault report form is filled out, and the test is repeated.

[0068] When a product is deemed reliable, it can be concluded that the product has high delivery reliability, meeting the military's requirements for high out-of-pack pass rates and mission success rates when delivered in a maintenance-free state.

[0069] Specifically, the test time specified in the product reliability assurance test is 0.212 MTBF of the product. The reliability assurance test uses a no-failure-range concept to verify the MTBF (Mean Time Between Failures), ensuring that the product reaches a specified minimum MTBF value after mass production. The prerequisite for reliability acceptance testing is that the product must undergo reliability qualification testing during the type approval stage, using the reliability qualification test information as prior information for the batch of products. Generally, the optimal time should be chosen to provide the buyer with a very high probability of passing the test (i.e., 98%); therefore, the preferred value of the specified test time is 0.212 times the product's MTBF value. Optionally, in this embodiment, the MTBF of the electronic product to be evaluated is 821 hours, thus the specified test time can be calculated to be 174.06 hours.

[0070] Specifically, fault mechanism analysis involves determining whether a fault is a Class A or Class B fault.

[0071] (1) Class A faults

[0072] Faults occurring in the test product during testing due to improper manufacturing, component defects, or other reasons serve as the basis for determining the environmental stress limit value of the test product. Class A faults include:

[0073] a. Faults caused by improper manufacturing of parts or defects in components;

[0074] b. Unconfirmed faults: These are faults that cannot be reproduced or whose causes have not yet been identified.

[0075] More specifically, Class A faults are further divided into:

[0076] A1: Life-related liability failures; A2: Life-independent liability failures;

[0077] Only A1 type faults are used for test statistics.

[0078] (2) Class B faults

[0079] Failures of the tested product caused by reasons other than design flaws. Category B failures are not considered as a basis for determining the environmental stress limit value of the tested product. Category B failures include:

[0080] c. The failure of the tested product was caused by the malfunction of the testing equipment provided by the testing laboratory, as well as the instruments and meters used for testing;

[0081] d. Failures caused by improper operation, maintenance, and repair of the tested products by human error.

[0082] S202. Set the product delivery time as the start time for calculating product reliability, and record the time from product delivery to the last inspection and maintenance. Specifically, if the product passes the product reliability assurance test without failure, the product is considered qualified. Qualified products are usually delivered directly, and the delivery time is set as the start time for calculating product reliability. After product delivery, the product can undergo one or more inspections and maintenance, and the corresponding times are recorded. Products tested using the method of this invention can be directly delivered for use without affecting their performance. This is an advantage of this method compared to existing technologies, as it facilitates testing while significantly saving economic costs.

[0083] S203. Obtain the data type of product lifespan, and calculate the reliability from the time the product is delivered for use until the last inspection and maintenance, and the data type of product lifespan, from the time the product is delivered for use until the required life extension time.

[0084] Specifically, when the product's lifetime data type is an exponential lifetime type with a failure rate of λ, the product's reliability is expressed as:

[0085]

[0086] Where t0 is the time from delivery to the last inspection and maintenance, t is the required life extension time of the product, which is calculated from the time the product is delivered, and t≥t0≥0.

[0087] S30. Calculate the number of backup components required to extend the lifespan of the electronic product based on the data type of the product's storage lifespan and the reliability of the required lifespan extension time.

[0088] Specifically, calculating the number of backup components required for extending the lifespan of the electronic product based on its storage life and the reliability of the required lifespan extension includes:

[0089] S301. Obtain the quantity of the electronic product to be assembled and the satisfaction rate of the backup components of the electronic product;

[0090] S302. Determine whether the reliability of the required life extension time of the electronic product is greater than the reliability threshold.

[0091] Specifically, comparing the product's reliability with a reliability threshold prepares for calculating the number of backup components required to extend the product's lifespan. If the reliability is too low, it indicates that the product cannot be stored for the required time, necessitating adjustments to the product's usage period. Calculating the number of backup components required to extend the product's lifespan is only meaningful when the reliability is greater than the reliability threshold. Optionally, the reliability threshold should ensure that the electronic product's reliability is above 0.75. Otherwise, excessive resource consumption will occur in practical applications.

[0092] Specifically, when the reliability is less than or equal to the reliability threshold, the time required to extend the life of the electronic product with the number of backup components to be calculated is adjusted until the reliability is greater than the reliability threshold; if the reliability of the product is less than the reliability threshold, then the number of backup components required to extend the life of the product is determined to be infinite.

[0093] S303. When the reliability is greater than the reliability threshold, calculate the number of backup components required for the extended lifespan based on the data type of the storage life, the required assembly quantity, and the satisfaction rate of the electronic product backup component requirements.

[0094] Specifically, the step of calculating the required number of backup components for extending the lifespan based on the data type of the storage life, the required assembly quantity, and the satisfaction rate of the backup component requirements for the electronic product includes: calculating the number of backup components using the following formula:

[0095]

[0096] Where n is the quantity of the electronic product to be assembled, the storage life of the electronic product is an exponential life type with a failure rate of λ, that is, the storage life T of the electronic product follows an exponential distribution with a failure rate of λ, t is the required life extension time of the product, and K P Let P be the quantile of a normal distribution with probability P, where P is the satisfaction rate of the backup component requirements for electronic products, and optionally, P is 0.7.

[0097] Compared with existing technologies, this invention provides a method for determining the number of backup components required for extending the lifespan of electronic products. Compared with traditional methods, this method provides a more reasonable reliability test for products, calculates product reliability more accurately, and significantly saves manpower and material resources required for testing. This invention proposes a method for determining the number of backup components required for lifespan extension based on the reliability of electronic products, thereby solving the problem of inaccurate quantity determination in existing technologies. The reliability calculation method provided by this invention uses a three-stage testing method with N cycles within a specified test time of 0.212 MTBF of the electronic product to be calculated for backup components. This effectively avoids the problem of excessively high testing costs caused by product failures and can greatly reduce testing costs.

[0098] Specifically, the following text describes in detail how product reliability assurance testing is performed in the method for calculating the number of backup components required to extend the lifespan of electronic products, using specific embodiments:

[0099] Specifically, in this embodiment, an electronic measuring device is used as an example for detailed explanation. The test plan is shown in Table 1. The MTBF of the electronic measuring device is 821h, from which the specified test time can be calculated to be 174.06h. Specifically, for reliability assurance tests performed on other electronic products, their corresponding task profiles and usage and storage conditions should be followed. Therefore, the specific test values ​​will vary depending on the electronic product.

[0100] Table 1

[0101] Phase 1 1 cold standard heating cycle 18h Phase Two 2 cold and hot cycles 54h Phase Three Continue testing up to 0.212 MTBF 174.06h

[0102] The reliability testing phase of this invention includes a first-stage cyclic test and a third-stage cyclic test. Dividing the reliability testing phase into three cyclic tests effectively avoids excessive testing costs when product failures occur, significantly reducing testing costs. The number of cycles in the three stages is determined through analysis of data from multiple experiments; it is not common knowledge or a conventional technique used by those skilled in the art, nor is it a routine technical choice. Compared to other settings, this setting offers higher testing efficiency and lower testing costs.

[0103] like Figure 2 As shown, during a cycle test, three types of stresses—temperature stress, vibration stress, and electrical stress—are tested simultaneously.

[0104] I. The specific process of temperature stress testing is as follows:

[0105] 1. The temperature cycle begins at a low temperature of -35℃;

[0106] 2. Test at -35℃ for 150 minutes;

[0107] 3. Select a temperature change rate of 5℃ / minute, raise the temperature to 15℃ (room temperature), and keep it at that temperature for 20 minutes;

[0108] 4. Test at room temperature (15℃) for 150 minutes;

[0109] 5. Raise the temperature to 55℃ and keep it warm for 22 minutes;

[0110] 6. Test at a high temperature of 55℃ for 150 minutes;

[0111] 7. Keep warm for 30 minutes;

[0112] 8. Continue testing at a high temperature of 55℃ for 150 minutes;

[0113] 9. Lower the temperature to 15℃ and keep it warm for 22 minutes;

[0114] 10. Test at room temperature (15℃) for 150 minutes;

[0115] 11. Lower the temperature to -35℃ and keep it warm for 20 minutes;

[0116] 12. Test at a low temperature of -35℃ for 150 minutes.

[0117] To avoid temperature shocks during testing, the heating rate was set at 5°C / minute and the cooling rate at -5°C / minute. Experiments determined that an absolute temperature change rate of 3-8°C / minute was most effective, with 5°C / minute providing the best protection against temperature shocks.

[0118] II. The specific process of vibration stress testing is as follows:

[0119] (1) Apply vibrational stress with an acceleration power spectral density of 0.00260 g² / Hz for 53 minutes;

[0120] (2) Apply vibrational stress with an acceleration power spectral density of 0.00353 g² / Hz for 40 minutes;

[0121] (3) Apply vibrational stress with an acceleration power spectral density of 0.00217 g² / Hz for 57 minutes;

[0122] Each temperature range vibrates for a total of 150 minutes.

[0123] III. The specific process of electrical stress testing is as follows:

[0124] The nominal voltage is +28.5V, the upper limit voltage is +31.5V, and the lower limit voltage is +25V.

[0125] (1) First cycle: direct current, 31.5V;

[0126] (2) Second cycle: direct current, 28.5V;

[0127] (3) Third cycle: direct current, 25.5V;

[0128] (4) For subsequent cycles (number of cycles n>3), as shown in Figure 3 , electrical stress is applied in the following order:

[0129] (5) For the cycle with a remainder of 1 when n is divided by 3: direct current, 31.5V

[0130] (6) For the cycle with a remainder of 2 when n is divided by 3: direct current, 28.5V

[0131] (7) For the cycle with a remainder of 3 when n is divided by 3: direct current, 25.5V

[0132] The total power-on time for each temperature section is 150 minutes;

[0133] In the specific embodiment of the present invention, the duration of one temperature stress cycle shall include several vibration stress cycles and electrical stress cycles. The duration of one temperature stress cycle is exactly equal to the duration of one cycle period.

[0134] If no failure occurs in the product, the product is considered qualified. Generally, qualified products are directly delivered for use, and the delivery time is set as the starting time for calculating the product reliability. After the product is delivered for use, one or more inspections and maintenance can be performed on the product, and their corresponding time shall be recorded respectively.

[0135] If the product fails, failure mechanism analysis shall be carried out, the test shall be interrupted, and the test shall be re-performed after filling in the failure report form.

[0136] Those skilled in the art can understand that all or part of the processes of implementing the method of the above embodiments can be completed by instructing relevant hardware through a computer program, and the program can be stored in a computer-readable storage medium. Wherein, the computer-readable storage medium is a magnetic disk, an optical disc, a read-only memory or a random access memory, etc.

[0137] The above description is only a preferred specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any modification or replacement that can be easily conceived by a person skilled in the art within the technical scope disclosed by the present invention shall be covered within the protection scope of the present invention.

Claims

1. A method for calculating the number of spare parts required to extend the lifespan of electronic products, characterized in that, include: The lifetime data type for obtaining the storage lifetime of electronic products for which the number of backup copies to be calculated; Based on the data type of the electronic product's lifespan, calculate the reliability of the required lifespan extension time for the electronic product; Based on the data type of the electronic product's storage lifespan and the reliability of the required lifespan extension time, calculate the number of backup components required for extending the lifespan of the electronic product. The step of calculating the reliability of the required lifespan extension time of the electronic product based on the lifespan data type of the electronic product includes: The product under test shall be subjected to product reliability assurance testing, and the product that passes the product reliability assurance testing shall be delivered for use; if the product fails, the failure mechanism shall be analyzed, the test shall be interrupted, a failure report form shall be filled out, and the test shall be repeated. Set the product delivery time as the start time for calculating product reliability, and record the time from product delivery to the last inspection and maintenance. Obtain the data type of product lifespan, and calculate the reliability from the time the product is delivered for use until the last inspection and maintenance, based on the product's lifespan data type and the product's lifespan data type. The step of calculating the number of backup components required for extending the lifespan of the electronic product based on its storage life and the reliability of the required lifespan extension includes: Obtain the quantity of the electronic product to be assembled, and the satisfaction rate of the backup component requirements of the electronic product; Determine whether the reliability of the required life extension time of the electronic product is greater than the reliability threshold; When the reliability is greater than the reliability threshold, the number of backup components required to extend the lifespan is calculated based on the data type of the storage life, the required assembly quantity, and the satisfaction rate of the electronic product backup component requirements. The calculation of the required number of backup components for extending the lifespan based on the data type of the storage life, the required assembly quantity, and the satisfaction rate of the backup component requirements for the electronic product includes: calculating the number of backup components using the following formula: Where n is the quantity of the electronic product to be assembled, and the storage life of the electronic product is a data type that follows the failure rate. The index of lifespan types, The required life extension time for the product, which is calculated from the time the product is delivered and put into use; Let P be the quantile of a normal distribution with probability P, where P is the satisfaction rate of the backup component requirements for electronic products. When the product's lifespan data type is subject to failure rate When the exponential lifetime type is used, the reliability of the product is expressed as: in, This refers to the time from delivery and use to the last inspection and maintenance. The required lifespan extension for the product, calculated from the date the product is delivered and put into use, and .

2. The method for calculating the number of backup components required for extending the lifespan of electronic products according to claim 1, characterized in that, When the reliability is less than or equal to the reliability threshold, the life extension time required for the electronic product with the number of backup components to be calculated is adjusted until the reliability is greater than the reliability threshold.

3. The method for calculating the number of backup components required for extending the lifespan of electronic products according to claim 1, characterized in that, The product reliability assurance test includes N cycle tests, each cycle test includes one temperature stress test, p vibration stress tests and q electrical stress tests.

4. The method for calculating the number of backup components required for extending the lifespan of electronic products according to claim 3, characterized in that, The product reliability assurance test consists of N cycles, performed as follows: The first phase of the cyclic test includes one cyclic test. After the test is completed, a power-on test is performed. If the product does not fail, the test continues. If a failure occurs, the test is interrupted, the failure mechanism is analyzed, and the test is repeated. The second phase of the cyclic test includes two cyclic tests. After the test is completed, a power-on test is performed. If the product does not fail, the test continues. If a failure occurs, the test is interrupted to analyze the failure mechanism and then the test is repeated. The third stage is the cyclic testing, which begins from the fourth cycle and continues until the specified testing time is reached. After the test is completed, a power-on test is performed. If the product does not fail, it is considered reliable and can be delivered for use. If a failure occurs, the test is interrupted, the failure mechanism is analyzed, and the test is repeated.

5. The method for calculating the number of backup components required for extending the lifespan of electronic products according to claim 4, characterized in that, The test time specified in the product reliability assurance test is 0.212 MTBF of the product.

6. The method for calculating the number of backup components required for extending the lifespan of electronic products according to claim 3, characterized in that, In the temperature stress test, the temperature change rate of the product under test is 5℃ / min.

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