A positron annihilation lifetime measurement device and method for thin film sample characterization

By designing a device consisting of a positron emitter, a detector, and a gamma detector, the problem of thickness limitation in thin film sample measurement was solved, enabling thickness-free and non-contact measurement of thin film samples, expanding the application range and improving measurement accuracy.

CN116500072BActive Publication Date: 2026-06-26INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
Filing Date
2023-06-19
Publication Date
2026-06-26

AI Technical Summary

Technical Problem

Conventional positron annihilation lifetime spectrometers cannot effectively measure thin film samples because the positrons generated by the radiation source have a continuous energy distribution that may penetrate the thin film, resulting in a limitation on the measurement thickness.

Method used

Design a device consisting of a positron emitter, a positron detector, and a gamma detector. The sample is placed between the emitter and the detector, and the gamma detector is placed around the sample. By filtering signals and processing data, non-sample positron annihilation information is eliminated, enabling non-contact measurement. This device is suitable for different types of radiation sources and environmental conditions.

Benefits of technology

It enables thickness-free measurement of thin film samples, applicable to both non-contaminating and contaminating materials, broadens the application range of positron annihilation lifetime measurement, and improves measurement accuracy and applicability.

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Abstract

The application discloses a positron annihilation lifetime measurement device and method for thin film sample characterization, which is composed of a positron emitter, a positron detector and a gamma detector; a sample is placed between the positron emitter and the positron detector. The positron emitter contains a radioactive source and is responsible for detecting the positrons entering the sample, and the positron detector is responsible for detecting the positrons penetrating the sample. The gamma detector is responsible for detecting the 0.511 MeV gamma photons generated after the positrons are annihilated. The application can break through the limitation of measuring the sample thickness, is suitable for all types of positron radioactive sources, and sufficiently widens the experimental conditions; meanwhile, the non-contact measurement function can expand the application of the positron annihilation lifetime measurement method in the measurement of special samples and special environments.
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