A method, device and equipment for monitoring the state of an array card, and a readable storage medium

Abstract

The application discloses a kind of array card state monitoring method, device, equipment and readable storage medium, it is related to computer technical field, including: the running parameter and type information of each array card are acquired;In the case where target running parameter is abnormal in all running parameters, the first target fault information of the first target array card corresponding to target running parameter is acquired;According to each first target fault information and the first target type information of each first target array card, the first fault statistical information of all first target array cards corresponding to each first target type information is acquired;First fault statistical information includes the number of each type of first target fault information, to obtain the fault information of array card with abnormal running parameter, and the number of each type of fault information is counted, the state monitoring of array card is realized, without manual state monitoring of array card, improve work efficiency, solve the problem of low work efficiency in prior art.

Description

Technical Field

[0001] This application belongs to the field of computer technology, and specifically relates to a method, apparatus, device and readable storage medium for monitoring the status of an array card. Background Technology

[0002] During the operation of RAID (Redundant Array of Independent Disks, hereinafter referred to as RAID card), it is necessary to monitor the status of the RAID card, which requires a method for monitoring the status of the RAID card.

[0003] In the prior art, staff manually monitored the status of the RAID card.

[0004] In the process of developing this application, the inventors discovered that the prior art has at least the following problems: the need for staff to manually monitor the status of the array card leads to low work efficiency. Summary of the Invention

[0005] This application aims to provide a method, apparatus, device, and readable storage medium for monitoring the status of an array card, at least solving the problem of low work efficiency caused by the need for manual monitoring of the status of the array card in the prior art.

[0006] To solve the above-mentioned technical problems, this application is implemented as follows: In a first aspect, embodiments of this application provide a method for monitoring the status of an array card, the method comprising: Obtain the operating parameters and type information for each RAID card; If the target operating parameter is abnormal among all the operating parameters, obtain the first target fault information of the first target array card corresponding to the target operating parameter; Based on each first target fault information and each first target array card's first target type information, obtain the first fault statistics information of all first target array cards corresponding to each first target type information; the first fault statistics information includes the number of first target fault information of each type.

[0007] Secondly, embodiments of this application also provide a device for monitoring the status of an array card, the device comprising: The first acquisition module is used to acquire the operating parameters and type information of each array card; The second acquisition module is used to acquire the first target fault information of the first target array card corresponding to the target operating parameter when the target operating parameter is abnormal among all the operating parameters; The third acquisition module is used to acquire first fault statistics information of all first target array cards corresponding to each first target type information based on each first target fault information and each first target array card's first target type information; the first fault statistics information includes the number of first target fault information of each type.

[0008] Thirdly, embodiments of this application also provide an electronic device, which includes a processor, a memory, and a program or instructions stored in the memory and executable on the processor, wherein the program or instructions, when executed by the processor, implement the steps of the method described in the first aspect.

[0009] Fourthly, embodiments of this application also provide a readable storage medium storing a program or instructions that, when executed by a processor, implement the steps of the method described in the first aspect.

[0010] In this embodiment, by acquiring the operating parameters and type information of each array card; in the case of an abnormal target operating parameter among all operating parameters, acquiring the first target fault information of the first target array card corresponding to the target operating parameter; based on each first target fault information and the first target type information of each first target array card, acquiring the first fault statistics information of all first target array cards corresponding to each first target type information; the first fault statistics information includes the number of first target fault information of each type, so as to acquire the fault information of the array card with abnormal operating parameters, and to perform quantity statistics on each type of fault information, the status of the array card is monitored without the need for manual monitoring of the status of the array card, which improves work efficiency and solves the problem of low work efficiency caused by the need for manual monitoring of the status of the array card in the prior art. Attached Figure Description

[0011] Figure 1 This is a flowchart illustrating the steps of a method for monitoring the status of an array card provided in an embodiment of this application; Figure 2 This is a flowchart illustrating the specific steps of a method for monitoring the status of an array card provided in an embodiment of this application; Figure 3 This is a schematic diagram of an array card status monitoring system provided in an embodiment of this application; Figure 4 This is a schematic diagram of a monitoring process for the status of an array card provided in an embodiment of this application; Figure 5 This is a block diagram of a monitoring device for the status of an array card provided in an embodiment of this application; Figure 6 This is a schematic diagram of the hardware structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0012] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0013] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0014] The method for monitoring the status of an array card provided in this application will be described in detail below with reference to the accompanying drawings, through specific embodiments and application scenarios.

[0015] Figure 1 This is a flowchart illustrating the steps of a method for monitoring the status of an array card according to an embodiment of this application. Figure 1 As shown, the method may include: Step 101: Obtain the operating parameters and type information of each RAID card.

[0016] In this embodiment of the application, by acquiring the operating parameters and type information of each RAID card in real time, the status of each RAID card can be monitored in real time, which serves as the basis for further statistical analysis of RAID card fault information based on the type information.

[0017] It should be noted that the type information of the RAID card can include brand, serial number (SN), firmware type, etc. Based on the type information of the RAID card, the manufacturer, model, batch, firmware version, etc. of the RAID card can be determined.

[0018] Step 102: If the target operating parameter is abnormal among all the operating parameters, obtain the first target fault information of the first target array card corresponding to the target operating parameter.

[0019] In this embodiment of the application, by obtaining the first target fault information of the first target array card corresponding to the target operating parameter when the target operating parameter is abnormal among all operating parameters, the fault information of the array card can be obtained in a timely manner when the array card operating parameters are abnormal.

[0020] Step 103: Based on each first target fault information and each first target array card's first target type information, obtain the first fault statistics information of all first target array cards corresponding to each first target type information.

[0021] The first fault statistics include the number of first target fault information for each type.

[0022] In this embodiment, by obtaining the first fault statistics of all first target array cards corresponding to each first target type information based on each first target fault information and the first target type information of each first target array card, the number of each fault for abnormal operating parameters of each type of array card is statistically analyzed. This helps staff to know the overall health status of all array cards, and also helps staff to know the failure rate, batch quality problems, etc. of each type of array card based on the fault statistics information, so as to report the array card quality to the faulty array card manufacturer and select the manufacturer with the lowest failure rate.

[0023] For example, if the first target array cards include array card 1 (first target type information is type a, first target fault information is fault A), array card 2 (first target type information is type b, first target fault information is fault A), array card 3 (first target type information is type b, first target fault information is fault B), array card 4 (first target type information is type c, first target fault information is fault A), array card 5 (first target type information is type c, first target fault information is fault C), and array card 6 (first target type information is type c, first target fault information is fault C), then all the first target array cards corresponding to type a ( The first fault statistics for array card 1) is 1 fault A, meaning that all first target array cards corresponding to type a have 1 fault A. The first fault statistics for all first target array cards (i.e., array card 2 and array card 3) corresponding to type b are 1 fault A and 1 fault B, meaning that all first target array cards corresponding to type b have 1 fault A and 1 fault B. The first fault statistics for all first target array cards (i.e., array card 4, array card 5 and array card 6) corresponding to type c are 1 fault A and 2 faults C, meaning that all first target array cards corresponding to type c have 1 fault A and 2 faults C.

[0024] Specifically, in some embodiments, the first fault statistics and first fault analysis results (such as failure rate) are displayed in real time on a visual interface. The display format can be a list, graph, animation, voice broadcast, etc. The displayed content includes the number and failure rate of each type of fault for each type of RAID card. In other embodiments, the content displayed in real time on the visual interface may also include the total number of RAID cards, the number and failure rate of faulty RAID cards in all RAID cards, the total number of RAID cards of each type, and the number and failure rate of faulty RAID cards of each type of RAID card. The failure rate is the ratio of the number of faults to the corresponding total number. The first fault statistics and first fault analysis results (such as failure rate) can be exported to file formats such as text, EXCEL, WORD, etc.

[0025] The embodiments of this application enable the acquisition of operating parameters and type information for each array card; in the event of an abnormal target operating parameter among all operating parameters, the acquisition of first target fault information for the first target array card corresponding to the target operating parameter; based on each first target fault information and the first target type information of each first target array card, the acquisition of first fault statistics information for all first target array cards corresponding to each first target type information; the first fault statistics information includes the number of first target fault information of each type, thereby acquiring fault information of array cards with abnormal operating parameters and performing quantity statistics on each type of fault information, realizing the monitoring of the status of array cards without the need for manual monitoring of the status of array cards, improving work efficiency, and solving the problem of low work efficiency caused by the need for manual monitoring of the status of array cards in the prior art.

[0026] Figure 2 This is a flowchart illustrating the specific steps of a method for monitoring the status of an array card provided in an embodiment of this application. Figure 2 As shown, the method may include: Step 201: Obtain the operating parameters and type information of each RAID card.

[0027] The implementation method of this step is similar to that of "Step 101" above, and will not be repeated here.

[0028] Step 202: If the target operating parameter is abnormal among all the operating parameters, obtain the first target fault information of the first target array card corresponding to the target operating parameter.

[0029] The implementation method of this step is similar to that of "Step 102" above, and will not be repeated here.

[0030] Optionally, in some embodiments, the operating parameters include transmission rate values ​​and bandwidth values; step 202 includes the following sub-steps (sub-step 2021, sub-step 2022): Sub-step 2021: If the transmission rate of the first target array card is less than the preset standard rate, determine that the first target fault information is a speed reduction fault.

[0031] In this embodiment of the application, when the transmission rate of the first target array card is less than the preset standard rate, the first target fault information is determined to be a speed reduction fault, which is beneficial for staff to troubleshoot the speed reduction fault based on the first target fault information.

[0032] It should be noted that the standard rate value is preset based on the first target type information and stored in the initial configuration file. The standard rate value is set by modifying the initial configuration file and obtained by reading the contents of the initial configuration file.

[0033] Sub-step 2022: If the bandwidth value of the first target array card is less than the preset standard bandwidth value, determine that the first target fault information is a bandwidth reduction fault.

[0034] In this embodiment of the application, when the bandwidth value of the first target array card is less than the preset standard bandwidth value, the first target fault information is determined to be a bandwidth reduction fault, which is beneficial for staff to conduct troubleshooting for the bandwidth reduction fault based on the first target fault information.

[0035] It should be noted that the standard bandwidth value is preset based on the first target type information and stored in the initial configuration file. The standard bandwidth value is set by modifying the initial configuration file and obtained by reading the contents of the initial configuration file.

[0036] Optionally, in some embodiments, after step 202, the method further includes: Step 210: Display alarm information for the fault information of the first target.

[0037] In this embodiment of the application, by displaying alarm information for the first target fault information, the staff are notified that the first target array card has malfunctioned, which helps the staff to troubleshoot based on the alarm information for the first target fault information.

[0038] It should be noted that alarm information for the first target fault information can be displayed in the form of a pop-up alarm window in the visual interface, voice alarm, SMS alarm, etc.

[0039] Optionally, in some embodiments, after step 202, the method further includes: Step 211: Generate a fault log for the first target fault information based on the first target fault information.

[0040] In this embodiment of the application, a fault log is generated based on the first target fault information. This is beneficial for staff to keep records of fault events and to send the fault log to the manufacturer of the first target array card so as to report the quality problems of the first target array card to the manufacturer.

[0041] It should be noted that the fault log may include information such as the fault information of the first target, the model of the first target RAID card, the cause of the fault, and the time of the fault.

[0042] Step 203: Based on each first target fault information and each first target array card's first target type information, obtain the first fault statistics information of all first target array cards corresponding to each first target type information; the first fault statistics information includes the number of first target fault information of each type.

[0043] The implementation method of this step is similar to that of "Step 103" above, and will not be repeated here.

[0044] Optionally, in some embodiments, the method further includes: Step 204: Obtain the event log for each of the array cards.

[0045] In this embodiment of the application, by periodically acquiring the event log of each array card, it is beneficial to obtain abnormal events in a timely manner and obtain fault information based on the abnormal events.

[0046] Specifically, in some embodiments, the event log file is named "event log", and the content of the event log is obtained by opening the "event log" file and reading its contents.

[0047] Step 205: If all the target event logs in the event logs include abnormal events, obtain the second target fault information of the second target array card corresponding to the target event log.

[0048] In this embodiment of the application, all the target event logs in the event logs include abnormal events, that is, the second target RAID card corresponding to the target event log has experienced an abnormal event. At this time, the second target fault information of the second target RAID card is obtained so that the fault information of the RAID card can be obtained in a timely manner when the event log of the RAID card includes abnormal events.

[0049] Optionally, in some embodiments, the abnormal events include disk abnormal events, cable abnormal events, transmission rate value abnormal events, and bandwidth value abnormal events.

[0050] Disk anomaly events include disk disconnection (disk kickback action), logical array alarms (e.g., displaying disk status information as "ubad failed"), etc.; cable anomaly events are link I / O (input / output) blockages, such as cable disconnection; transmission rate value anomaly events include speed reduction; bandwidth value anomaly events include bandwidth reduction.

[0051] It should be noted that the event log also includes normal events, and normal events are used as the standard for judging whether an event is abnormal. Normal events and abnormal events are pre-stored in the initial configuration file. Normal events include disk coming online and offline according to normal operation, disk status information displayed as "optimal", etc. By comparing the events in the event log with the corresponding normal events and abnormal events in the initial configuration file, if the event is inconsistent with the normal event but consistent with the abnormal event, the event is judged as an abnormal event.

[0052] In this embodiment of the application, abnormal events can be classified, which is beneficial for staff to conduct targeted troubleshooting based on the fault information obtained according to the type of abnormal event.

[0053] Optionally, in some embodiments, after step 205, the method further includes: Step 212: Display alarm information for the second target fault information.

[0054] In this embodiment of the application, by displaying alarm information for the second target fault information, the staff are notified that the second target array card has malfunctioned, which helps the staff to troubleshoot based on the alarm information for the second target fault information.

[0055] It should be noted that alarm information for the second target fault information can be displayed in the form of a pop-up alarm window in the visual interface, voice alarm, SMS alarm, etc.

[0056] Optionally, in some embodiments, after step 205, the method further includes: Step 213: Generate a fault log for the second target fault information based on the second target fault information.

[0057] In this embodiment of the application, a fault log is generated based on the fault information of the second target. This is beneficial for staff to keep records of fault events and to send the fault log to the manufacturer of the second target array card so as to report the quality problems of the second target array card to the manufacturer.

[0058] It should be noted that the fault log may include information such as the fault information of the second target, the model of the second target RAID card, the cause of the fault, and the time of the fault.

[0059] Step 206: Based on each second target fault information and each second target array card's second target type information, obtain the second fault statistics information of all second target array cards corresponding to each second target type information.

[0060] The second fault statistics include the number of second target fault information for each type.

[0061] In this embodiment of the application, by obtaining the second fault statistics information of all second target array cards corresponding to each second target type information based on each second target fault information and the second target type information of each second target array card, the number of each fault for each type of array card in response to abnormal events is statistically analyzed. This is beneficial for staff to know the overall health status of all array cards, and also for staff to know the failure rate, batch quality problems, etc. of each type of array card based on the fault statistics information, so as to provide feedback on the array card quality to the faulty array card manufacturer and to select the manufacturer with the lowest failure rate.

[0062] Specifically, in some embodiments, the second fault statistics and second fault analysis results (such as failure rate) are displayed in real time on a visual interface. The display format can be a list, graph, animation, voice broadcast, etc. The displayed content includes the number and failure rate of each type of fault for each type of RAID card. In other embodiments, the content displayed in real time on the visual interface may also include the total number of RAID cards, the number and failure rate of faulty RAID cards in all RAID cards, the total number of RAID cards of each type, and the number and failure rate of faulty RAID cards of each type of RAID card. The failure rate is the ratio of the number of faults to the corresponding total number. The second fault statistics and second fault analysis results (such as failure rate) can be exported to file formats such as text, EXCEL, WORD, etc.

[0063] By executing steps 204 to 206, fault information of the array card that has experienced an abnormal event can be obtained, and the number of fault information of each type can be counted. This enables the monitoring of the status of the array card without the need for manual monitoring, thus improving work efficiency and solving the problem of low work efficiency caused by the need for manual monitoring of the status of the array card in the prior art.

[0064] Optionally, in some embodiments, the method further includes: Step 207: Obtain the configuration log for each of the array cards.

[0065] In this embodiment of the application, by periodically acquiring the configuration log of each array card, it is beneficial to obtain abnormal states in a timely manner and obtain fault information based on the abnormal states.

[0066] Specifically, in some embodiments, the configuration log file is named "config log". The contents of the configuration log are obtained by opening the "config log" file and reading its contents.

[0067] Step 208: If all the target configuration logs in the configuration logs include abnormal states, obtain the third target fault information of the third target array card corresponding to the target configuration log.

[0068] In this embodiment of the application, all the target configuration logs in the configuration logs include abnormal states, that is, the third target array card corresponding to the target configuration log has an abnormal state. At this time, the third target fault information of the third target array card is obtained so that the fault information of the array card can be obtained in a timely manner when the configuration log of the array card includes an abnormal state.

[0069] Optionally, in some embodiments, the abnormal state includes an abnormal state of the array controller, an abnormal state of the backup power supply, an abnormal temperature of the array card, and an abnormal temperature of the disk.

[0070] Among these, the array controller status is abnormal, such as the serial number of the queried array card being empty; the backup power unit (BBU) status is abnormal, such as the backup power unit power being less than the preset standard power; the array card temperature is abnormal, such as the array card temperature being higher than the preset array card high temperature threshold; and the disk temperature is abnormal, such as the disk temperature being higher than the preset disk high temperature threshold.

[0071] It should be noted that the criteria for determining whether the states recorded in the configuration log are abnormal, such as the abnormal states of the array controller, the abnormal states of the backup power supply, the preset high temperature thresholds for the array cards, and the preset high temperature thresholds for the disks, are stored in a preset initial configuration file. The abnormal state is determined by comparing the states recorded in the configuration log with the criteria in the initial configuration file. For example, if the state of the array controller recorded in the configuration log is the same as "the serial number of the queried array card is empty" stored in the initial configuration file, then the state of the array controller recorded in the configuration log is determined to be abnormal, i.e., the array controller is in an abnormal state. Similarly, if the array card temperature recorded in the configuration log is higher than the preset high temperature threshold for the array card stored in the initial configuration file, then the state of the array card temperature recorded in the configuration log is determined to be abnormal, i.e., the array card temperature is abnormal.

[0072] In this embodiment of the application, abnormal states can be classified, which is beneficial for staff to conduct targeted troubleshooting based on the fault information obtained according to the type of abnormal state.

[0073] Optionally, in some embodiments, after step 208, the method further includes: Step 214: Display alarm information for the fault information of the third target.

[0074] In this embodiment of the application, by displaying alarm information for the fault information of the third target, the staff are notified that the third target array card has malfunctioned, which helps the staff to troubleshoot based on the alarm information for the fault information of the third target.

[0075] It should be noted that alarm information for the fault information of the third target can be displayed in the form of a pop-up alarm window in the visual interface, voice alarm, SMS alarm, etc.

[0076] Optionally, in some embodiments, after step 208, the method further includes: Step 215: Generate a fault log for the third target fault information based on the third target fault information.

[0077] In this embodiment of the application, a fault log is generated based on the fault information of the third target. This is beneficial for staff to keep records of fault events and to send the fault log to the manufacturer of the third target array card so as to report the quality problems of the third target array card to the manufacturer.

[0078] It should be noted that the fault log may include information such as the fault information of the third target, the model of the third target RAID card, the cause of the fault, and the time of the fault.

[0079] Step 209: Based on each third target fault information and each third target array card's third target type information, obtain the third fault statistics information of all third target array cards corresponding to each third target type information.

[0080] The third fault statistics include the number of third target fault information for each type.

[0081] In this embodiment, by obtaining the third fault statistics of all third target array cards corresponding to each third target type information based on each third target fault information and the third target type information of each third target array card, the number of each fault for each type of array card in abnormal state is statistically analyzed. This is beneficial for staff to know the overall health status of all array cards, and also for staff to know the failure rate, batch quality problems, etc. of each type of array card based on the fault statistics information, so as to report the array card quality to the faulty array card manufacturer and select the manufacturer with the lowest failure rate.

[0082] Specifically, in some embodiments, third fault statistics and third fault analysis results (such as failure rate) are displayed in real time on a visual interface. The display format can be a list, graph, animation, voice broadcast, etc. The displayed content includes the number and failure rate of each type of fault for each type of RAID card. In other embodiments, the content displayed in real time on the visual interface may also include the total number of RAID cards, the number and failure rate of faulty RAID cards in all RAID cards, the total number of RAID cards of each type, and the number and failure rate of faulty RAID cards of each type of RAID card. The failure rate is the ratio of the number of faults to the corresponding total number. The third fault statistics and third fault analysis results (such as failure rate) can be exported to file formats such as text, EXCEL, WORD, etc.

[0083] By executing steps 207 to 209, fault information of array cards in abnormal states can be obtained, and the number of each type of fault information can be counted. This enables the monitoring of the array card status without the need for manual monitoring, improving work efficiency and solving the problem of low work efficiency caused by the need for manual monitoring of array card status in prior art.

[0084] Optionally, in some embodiments, the method further includes: Step 216: Obtain and display the location information and PCI (Peripheral Component Interconnect) address of each RAID card.

[0085] In this embodiment of the application, by obtaining and displaying the location information and PCI address of the array card, it is helpful for staff to locate the location and PCI address of the array card, especially to quickly locate the location and PCI address of the array card that has failed, so as to further troubleshoot the fault.

[0086] It should be noted that the location information may include information such as the computer room where the RAID card is located and the rack where the RAID card is located. The location information can be obtained by staff through input.

[0087] Furthermore, the location information and PCI address of each RAID card (including RAID cards that have sent faults) can be displayed in real time on the visualization interface. The display format can be a list and can be exported to file formats such as text, EXCEL, WORD and other file formats.

[0088] Specifically, in some embodiments, a database can be created that maintains location information, serial number, brand, event logs, configuration logs, and real-time operating parameters for each RAID card.

[0089] Optionally, refer to Figure 3 In some embodiments, the RAID card status monitoring system corresponding to the RAID card status monitoring method consists of multiple data servers (e.g., data server 1, data server 2, data server 3... data server n), switches, and maintenance servers. The storage unit of each data server is a RAID card. The maintenance server obtains data such as the RAID card type information, operating parameters, event logs, configuration logs, location information, and PCI address of each data server through the switch, and executes the steps of the RAID card status monitoring method.

[0090] Specifically, refer to Figure 4 In some embodiments, the RAID card status monitoring process includes: X1, the operations and maintenance server creates an RAID card database; X2, all data servers are powered on and running; X3, the operations and maintenance server periodically obtains the transmission rate value, bandwidth value, event log, and configuration log for each RAID card; X4, the data center where each RAID card is located, the rack where each RAID card is located, the serial number of each RAID card, brand, bandwidth value, transmission rate value, event log, and configuration log are stored in the RAID card database; X5, according to the manufacturer and model of the RAID card, standard rate value, standard bandwidth value, abnormal events, and abnormal states are set and stored in the initial database. In the configuration file: X6 displays alarm information for fault information, including alarm information for the first fault information, alarm information for the second fault information, and alarm information for the third fault information. The method for obtaining the first fault information, the second fault information, and the third fault information is similar to that described above and will not be repeated here; X7 generates fault logs for fault information, including fault logs for the first fault information, the second fault information, and the third fault information; X8 displays fault statistics information, including first fault statistics information, second fault statistics information, and third fault statistics information.

[0091] In summary, the embodiments of this application enable the acquisition of fault information of malfunctioning RAID cards and the statistical analysis of the number of each type of fault information. This allows for the monitoring of the RAID card status without the need for manual monitoring, thus improving work efficiency and solving the problem of low work efficiency caused by the need for manual monitoring of RAID card status in prior art.

[0092] Figure 5 This is a block diagram of a monitoring device for the status of an array card provided in an embodiment of this application, such as... Figure 5 As shown, the device 300 includes: The first acquisition module 301 is used to acquire the operating parameters and type information of each array card; The second acquisition module 302 is used to acquire the first target fault information of the first target array card corresponding to the target operating parameter when the target operating parameter is abnormal among all the operating parameters; The third acquisition module 303 is used to acquire first fault statistics information of all first target array cards corresponding to each first target type information based on each first target fault information and each first target array card's first target type information; the first fault statistics information includes the number of first target fault information of each type.

[0093] Optionally, the operating parameters include transmission rate values ​​and bandwidth values; the second acquisition module 302 specifically includes: The first acquisition submodule is used to determine that the first target fault information is a speed reduction fault when the transmission rate value of the first target array card is less than the preset standard rate value. The second acquisition submodule is used to determine that the first target fault information is a bandwidth reduction fault when the bandwidth value of the first target array card is less than the preset standard bandwidth value.

[0094] Optionally, the device 300 further includes: The fourth acquisition module is used to acquire the event logs of each of the array cards; The fifth acquisition module is used to acquire the second target fault information of the second target array card corresponding to the target event log when the target event log in all the event logs includes abnormal events; The sixth acquisition module is used to acquire second fault statistics information of all second target array cards corresponding to each second target type information based on each second target fault information and the second target type information of each second target array card; the second fault statistics information includes the number of second target fault information of each type.

[0095] Optionally, the abnormal events include disk abnormal events, cable abnormal events, transmission rate value abnormal events, and bandwidth value abnormal events.

[0096] Optionally, the device 300 further includes: The seventh acquisition module is used to acquire the configuration log of each of the array cards; The eighth acquisition module is used to acquire the third target fault information of the third target array card corresponding to the target configuration log when the target configuration log in all the configuration logs includes an abnormal state; The ninth acquisition module is used to acquire third fault statistics information of all third target array cards corresponding to each third target type information based on each third target fault information and the third target type information of each third target array card; the third fault statistics information includes the number of third target fault information of each type.

[0097] Optionally, the abnormal states include abnormal states of the array controller, abnormal states of the backup power supply, abnormal array card temperature, and abnormal disk temperature.

[0098] Optionally, the device 300 further includes: The display module is used to display alarm information for the fault information of the first target.

[0099] Optionally, the device 300 further includes: The generation module is used to generate a fault log for the first target fault information based on the first target fault information.

[0100] The RAID card status monitoring device in this application embodiment can be a device, or a component, integrated circuit, or chip in a terminal. The device can be a mobile electronic device or a non-mobile electronic device. For example, mobile electronic devices can be mobile phones, tablets, laptops, PDAs, in-vehicle electronic devices, wearable devices, ultra-mobile personal computers (UMPCs), netbooks, or personal digital assistants (PDAs), etc., while non-mobile electronic devices can be servers, network attached storage (NAS), personal computers (PCs), televisions (TVs), ATMs, or self-service machines, etc. This application embodiment does not impose specific limitations.

[0101] The RAID card status monitoring device in this embodiment can be a device with an operating system. This operating system can be Android, iOS, or other possible operating systems; this embodiment does not specifically limit it.

[0102] The array card status monitoring device provided in this application embodiment can achieve Figure 1 The various processes implemented by the array card status monitoring device in the method embodiment will not be described again here to avoid repetition.

[0103] The embodiments of this application enable the acquisition of fault information of array cards with abnormal operating parameters, and the statistical analysis of the number of each type of fault information. This realizes the monitoring of the status of the array cards without the need for manual monitoring, thus improving work efficiency and solving the problem of low work efficiency caused by the need for manual monitoring of the status of array cards in the prior art.

[0104] Optionally, embodiments of this application also provide an electronic device, including a processor, a memory, and a program or instructions stored in the memory and executable on the processor. When the program or instructions are executed by the processor, they implement the various processes of the above-described method for monitoring the status of the array card and achieve the same technical effect. To avoid repetition, they will not be described again here.

[0105] It should be noted that the electronic devices in the embodiments of this application include the mobile electronic devices and non-mobile electronic devices described above.

[0106] Figure 6 A schematic diagram of the hardware structure of an electronic device to implement an embodiment of this application.

[0107] The electronic device 400 includes, but is not limited to, components such as: radio frequency unit 401, network module 402, audio output unit 403, input unit 404, sensor 405, display unit 406, user input unit 407, interface unit 408, memory 409, and processor 410.

[0108] Those skilled in the art will understand that the electronic device 400 may also include a power supply (such as a battery) for supplying power to various components. The power supply may be logically connected to the processor 410 through a power management system, thereby enabling functions such as managing charging, discharging, and power consumption through the power management system. Figure 6 The electronic device structure shown does not constitute a limitation on the electronic device. The electronic device may include more or fewer components than shown, or combine certain components, or have different component arrangements, which will not be elaborated here.

[0109] The processor 410 is used to obtain the operating parameters and type information of each array card; If the target operating parameter is abnormal among all the operating parameters, obtain the first target fault information of the first target array card corresponding to the target operating parameter; Based on each first target fault information and each first target array card's first target type information, obtain the first fault statistics information of all first target array cards corresponding to each first target type information; the first fault statistics information includes the number of first target fault information of each type.

[0110] The embodiments of this application enable the acquisition of fault information of array cards with abnormal operating parameters, and the statistical analysis of the number of each type of fault information. This realizes the monitoring of the status of the array cards without the need for manual monitoring, thus improving work efficiency and solving the problem of low work efficiency caused by the need for manual monitoring of the status of array cards in the prior art.

[0111] Optionally, the operating parameters include a transmission rate value and a bandwidth value; the processor 410 is further configured to determine that the first target fault information is a speed reduction fault when the transmission rate value of the first target array card is less than a preset standard rate value; and to determine that the first target fault information is a bandwidth reduction fault when the bandwidth value of the first target array card is less than a preset standard bandwidth value.

[0112] Optionally, the processor 410 is further configured to acquire event logs for each of the array cards; if the target event logs in all the event logs include abnormal events, acquire second target fault information of the second target array card corresponding to the target event logs; and acquire second fault statistics information of all the second target array cards corresponding to each type of second target type information based on each second target fault information and the second target type information of each second target array card; the second fault statistics information includes the number of second target fault information of each type.

[0113] Optionally, the abnormal events include disk abnormal events, cable abnormal events, transmission rate value abnormal events, and bandwidth value abnormal events.

[0114] Optionally, the processor 410 is further configured to acquire configuration logs for each of the array cards; if the target configuration logs in all the configuration logs include an abnormal state, acquire third target fault information of the third target array card corresponding to the target configuration log; and acquire third fault statistics information of all third target array cards corresponding to each third target type information based on each third target fault information and the third target type information of each third target array card; the third fault statistics information includes the number of third target fault information of each type.

[0115] Optionally, the abnormal states include abnormal states of the array controller, abnormal states of the backup power supply, abnormal array card temperature, and abnormal disk temperature.

[0116] Optionally, the processor 410 is also configured to display alarm information for the fault information of the first target.

[0117] Optionally, the processor 410 is further configured to generate a fault log for the first target fault information based on the first target fault information.

[0118] In this embodiment, fault information of array cards with abnormal operating parameters is obtained, and the number of each type of fault information is counted, thereby realizing the monitoring of the status of the array cards without the need for manual monitoring of the status of the array cards, which improves work efficiency and solves the problem of low work efficiency caused by the need for manual monitoring of the status of the array cards in the prior art.

[0119] It should be understood that, in this embodiment, the input unit 404 may include a graphics processing unit (GPU) 4041 and a microphone 4042. The GPU 4041 processes image data of still images or videos obtained by an image capture device (such as a camera) in video capture mode or image capture mode. The display unit 406 may include a display panel 4061, which may be configured in the form of a liquid crystal display, an organic light-emitting diode, or the like. The user input unit 407 includes at least one of a touch panel 4071 and other input devices 4072. The touch panel 4071 is also called a touch screen. The touch panel 4071 may include a touch detection device and a touch controller. Other input devices 4072 may include, but are not limited to, physical keyboards, function keys (such as volume control buttons, power buttons, etc.), trackballs, mice, and joysticks, which will not be described in detail here.

[0120] The memory 409 can be used to store software programs and various data. The memory 409 may primarily include a first storage area for storing programs or instructions and a second storage area for storing data. The first storage area may store the operating system, application programs or instructions required for at least one function (such as sound playback, image playback, etc.). Furthermore, the memory 409 may include volatile memory or non-volatile memory, or both. The non-volatile memory may be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. Volatile memory can be random access memory (RAM), static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDRSDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), and direct memory bus RAM (DRRAM). The memory 409 in the embodiments of this application includes, but is not limited to, these and any other suitable types of memory.

[0121] Processor 410 may include one or more processing units; optionally, processor 410 integrates an application processor and a modem processor, wherein the application processor mainly handles operations involving the operating system, user interface, and applications, and the modem processor mainly handles wireless communication signals, such as a baseband processor. It is understood that the aforementioned modem processor may also not be integrated into processor 410.

[0122] This application also provides a readable storage medium storing a program or instructions. When the program or instructions are executed by a processor, they implement the various processes of the above-described array card status monitoring method embodiments and achieve the same technical effect. To avoid repetition, they will not be described again here.

[0123] The processor is the processor in the electronic device described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0124] This application embodiment also provides a chip, which includes a processor and a communication interface. The communication interface and the processor are coupled. The processor is used to run programs or instructions to implement the various processes of the above-described array card status monitoring method embodiment, and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0125] It should be understood that the chip mentioned in the embodiments of this application may also be referred to as a system-on-a-chip, system chip, chip system, or system-on-a-chip, etc.

[0126] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

[0127] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0128] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

Claims

1. A method for monitoring the status of an array card, characterized in that, The method includes: Obtain the operating parameters and type information for each RAID card; If the target operating parameter is abnormal among all the operating parameters, obtain the first target fault information of the first target array card corresponding to the target operating parameter; Based on each first target fault information and each first target array card's first target type information, obtain first fault statistics information for all first target array cards corresponding to each first target type information; the first fault statistics information includes the number of first target fault information of each type.

2. The method according to claim 1, characterized in that, The operating parameters include transmission rate values ​​and bandwidth values; In the event that the target operating parameter is abnormal among all the operating parameters, the method of obtaining the first target fault information of the first target array card corresponding to the target operating parameter includes: If the transmission rate of the first target array card is less than the preset standard rate, the fault information of the first target is determined to be a speed reduction fault. If the bandwidth value of the first target array card is less than the preset standard bandwidth value, the first target fault information is determined to be a bandwidth reduction fault.

3. The method according to claim 1, characterized in that, The method further includes: Obtain the event log for each of the array cards; If all the target event logs in the event logs include abnormal events, obtain the second target fault information of the second target array card corresponding to the target event log; Based on each second target fault information and each second target array card's second target type information, obtain the second fault statistics information of all second target array cards corresponding to each second target type information; the second fault statistics information includes the number of second target fault information of each type.

4. The method according to claim 3, characterized in that, The abnormal events include disk abnormal events, cable abnormal events, transmission rate value abnormal events, and bandwidth value abnormal events.

5. The method according to claim 1, characterized in that, The method further includes: Obtain the configuration log for each of the array cards; If the target configuration log in all the configuration logs includes an abnormal state, obtain the third target fault information of the third target array card corresponding to the target configuration log; Based on each third target fault information and each third target array card's third target type information, obtain the third fault statistics information of all third target array cards corresponding to each third target type information; the third fault statistics information includes the number of third target fault information of each type.

6. The method according to claim 5, characterized in that, The abnormal states include abnormal states of the array controller, abnormal states of the backup power supply, abnormal array card temperature, and abnormal disk temperature.

7. The method according to any one of claims 1 to 6, characterized in that, In the event that the target operating parameter is abnormal among all the operating parameters, after obtaining the first target fault information of the first target array card corresponding to the target operating parameter, the method further includes: Display alarm information for the fault information of the first target.

8. The method according to any one of claims 1 to 6, characterized in that, In the event that the target operating parameter is abnormal among all the operating parameters, after obtaining the first target fault information of the first target array card corresponding to the target operating parameter, the method further includes: Based on the first target fault information, a fault log is generated for the first target fault information.

9. A device for monitoring the status of an array card, characterized in that, The device includes: The first acquisition module is used to acquire the operating parameters and type information of each array card; The second acquisition module is used to acquire the first target fault information of the first target array card corresponding to the target operating parameter when the target operating parameter is abnormal among all the operating parameters; The third acquisition module is used to acquire first fault statistics information of all first target array cards corresponding to each first target type information based on each first target fault information and each first target array card's first target type information; the first fault statistics information includes the number of first target fault information of each type.

10. An electronic device, characterized in that, It includes a processor, a memory, and a program or instructions stored in the memory and executable on the processor, wherein the program or instructions, when executed by the processor, implement the steps of the method for monitoring the status of an array card as described in any one of claims 1 to 8.

11. A readable storage medium, characterized in that, The readable storage medium stores a program or instructions that, when executed by a processor, implement the steps of the RAID card status monitoring method as described in any one of claims 1 to 8.

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