单斜坡模数转换器、读出电路、图像传感器及量化方法
By employing a single-slope analog-to-digital converter in a CMOS image sensor, and through segmented quantization and counter resolution adjustment, the problem of slow quantization speed of SS ADC was solved, thereby improving quantization speed and reducing power consumption.
CN116567446BActive Publication Date: 2026-07-17SMARTSENS TECH (SHANGHAI) CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SMARTSENS TECH (SHANGHAI) CO LTD
- Filing Date
- 2022-01-26
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
The slow quantization speed of existing SS ADCs limits the development of CMOS image sensors toward high resolution or large pixel arrays.
Method used
A single-slope analog-to-digital converter is used. The initial slope signal is divided into several segments of final slope signals with increasing slope through the slope adjustment module. The counter resolution is adjusted through the pixel signal quantization module to achieve segmented quantization.
Benefits of technology
It improves quantization speed, reduces power consumption, and avoids increasing chip area.
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Figure CN116567446B_ABST
Abstract
本发明提供一种单斜坡模数转换器、读出电路、图像传感器及量化方法，单斜坡模数转换器包括斜坡发生模块、斜率调节模块及像素信号量化模块；所述斜坡发生模块用于提供初始斜坡信号；所述斜率调节模块的第一连接端连接所述斜坡发生模块的输出端，用于根据所述初始斜坡信号产生若干段斜率呈递增变化的最终斜坡信号；所述像素信号量化模块连接所述斜率调节模块的第二连接端，用于调节各段的计数器分辨率，使其对应各段呈递增变化的所述最终斜坡信号呈递减变化，及对像素信号进行分段式量化并得到对应数字码值。通过本发明提供的单斜坡模数转换器、读出电路、图像传感器及量化方法，解决了现有SS ADC量化速度慢的问题。
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