Electrode aging test method

Abstract

The present disclosure provides an electrode aging test method, comprising: preparing a bearing part, the bearing part comprising a main part and a connecting part connected with the main part; arranging an access end of a to-be-tested electrode on the bearing part and connecting the access end with the main part; setting the bearing part with the to-be-tested electrode on a temperature control device, and immersing a to-be-tested end of the to-be-tested electrode in a liquid in a solution cavity in the temperature control device; connecting a power supply circuit in a test instrument with the connecting part, and connecting a loop circuit in the test instrument with the liquid; and enabling the test instrument to provide a test voltage to the to-be-tested electrode through the connecting part, so that the loop circuit, the liquid, the to-be-tested electrode, the connecting part and the power supply circuit form a loop. Thus, the electrode can be subjected to an aging test.

Description

[0001] This application is a divisional application of the patent application filed on December 19, 2019, with application number 201911320931.9 and invention title "Electrode Aging Test Device". Technical Field

[0002] This disclosure relates to a method for electrode aging testing. Background Technology

[0003] Currently, artificial retinas partially restore vision by replacing the function of photoreceptor cells damaged by retinitis pigmentosa and age-related macular degeneration. This is achieved, for example, by using stimulating electrodes to generate signals that stimulate retinal ganglion cells or bipolar cells, and by utilizing other intact visual pathways to generate light perception in the cerebral cortex. Because artificial retinas can significantly improve the lives of patients with these retinal diseases, they have received increasing attention and development as implantable medical devices in recent years.

[0004] The flexible electrodes in artificial retinas serve as the main part connecting the prosthesis to biological neural tissue. Their electrochemical impedance performance directly affects the effectiveness, safety, stability, and working strength of the prosthesis. Among these, impedance testing is a difficult aspect of electrode performance testing, and monitoring impedance changes during aging is even more challenging.

[0005] Currently, the aging methods commonly used for artificial retinas as active implantable medical products include: long-term immersion in saline solution to accelerate aging, and welding pre-made electrodes with electricity to accelerate aging with saline solution. However, single-temperature aging is unreliable, the performance change pattern is untrustworthy, flexible electrodes are not easy to age with electricity, and the connection method is difficult to manufacture and it is hard to know the performance changes of the electrodes during aging. Summary of the Invention

[0006] This disclosure was made in view of the above-mentioned state of the prior art, and its purpose is to provide an electrode aging test device that can perform salt water immersion while being energized and can monitor electrode impedance in real time.

[0007] Therefore, this disclosure provides an electrode aging test apparatus, characterized in that it includes: a support portion, which includes a main body portion having a pad array and a connection portion connected to the main body portion and having multiple ports, wherein the pad array is connected to the multiple ports via multiple independent wires; an electrode to be tested, which is arranged in the support portion, the electrode to be tested including an access end having a substrate and multiple electrodes penetrating the substrate, a test end having multiple stimulation points, and a connecting cable connecting the multiple electrodes of the access end to the multiple stimulation points of the test end, wherein the access end is correspondingly connected to the pad array, and Furthermore, the plurality of stimulation points of the test electrode are covered by an insulating layer; a temperature control device having a solution chamber for holding liquid, and the test electrode being immersed in the liquid, the temperature control device being configured to accelerate the aging of the test electrode by changing the temperature of the liquid; and a testing instrument having a circuit line connected to the liquid and a power supply line connected to the connection portion, the circuit line, the liquid, the test electrode, the plurality of independent wires, the connection portion and the power supply line forming a circuit, and the testing instrument providing a test voltage to the test electrode through the connection portion.

[0008] In the electrode aging test apparatus disclosed herein, the carrier is connected to the access end of the electrode under test via a pad array. The electrode under test, which is covered by an insulating layer, is immersed in the liquid contained in the temperature control device. The test instrument then supplies power to the electrode under test and forms a circuit to generate current. Under these conditions, the electrode under test can be subjected to aging tests while energized, thereby improving the reliability of the aging test.

[0009] Additionally, the electrode aging test apparatus disclosed herein may optionally include an impedance testing device connected to the connecting portion. This impedance testing device detects the aging state of the electrode under test by detecting its impedance. Thus, the impedance of the electrode under test can be measured at any time, thereby determining its aging state.

[0010] Additionally, the electrode aging test apparatus disclosed herein may optionally include a cover plate with an opening that matches the temperature control device, through which the test end of the electrode under test passes and contacts the liquid. This improves the heat preservation effect of the temperature control device.

[0011] Furthermore, in the electrode aging test apparatus disclosed herein, the liquid may optionally be physiological saline. This allows for the simulation of the environment within the human body.

[0012] Furthermore, in the electrode aging test apparatus disclosed herein, optionally, the connecting portion is elongated, and the plurality of ports are arranged side by side in the connecting portion. This facilitates the connection of the testing instrument to the plurality of ports.

[0013] Furthermore, in the electrode aging test apparatus disclosed herein, optionally, the plurality of electrodes at the access end are soldered to the pad array at the connection portion using gold wire ball bonding. This allows for precise soldering of the access end's solder points onto the pad array.

[0014] Additionally, in the electrode aging test apparatus disclosed herein, optionally, the multiple independent wires connect the multiple ports of the connection portion to the pad array in a manner that does not cross each other. Thus, the multiple electrodes at the access end can be connected to their respective ports.

[0015] Furthermore, in the electrode aging test apparatus disclosed herein, optionally, the aging state of the electrode under test is determined by an electrode aging model, which includes the appearance and impedance of the electrode under test. In this case, the aging state of the electrode under test can be determined by the aging model, thereby allowing the degree of aging of the electrode under test to be determined by its appearance and impedance.

[0016] Furthermore, in the electrode aging test apparatus disclosed herein, optionally, the appearance of the electrode under test includes at least one of the following: electrode discoloration, solder joint discoloration, polymer delamination, electrode circuit cracks, or channel changes. Therefore, the degree of aging of the electrode under test can be determined by its appearance.

[0017] Furthermore, in the electrode aging test apparatus disclosed herein, optionally, the connection end of the electrode under test does not come into contact with the liquid. This reduces the possibility of a short circuit.

[0018] According to this disclosure, an electrode aging test device can be provided that can perform salt water immersion while being energized and can monitor electrode impedance in real time. Attached Figure Description

[0019] Embodiments of this disclosure will now be explained in further detail by way of example only with reference to the accompanying drawings, in which:

[0020] Figure 1 This is a schematic diagram showing the usage state of the electrode aging test apparatus according to the embodiments of this disclosure.

[0021] Figure 2 This is a schematic diagram showing the structure of the support part of the electrode aging test apparatus according to the embodiments of this disclosure.

[0022] Figure 3 This is a schematic diagram of the electrode structure to be tested in the electrode aging test apparatus according to an embodiment of the present disclosure.

[0023] Figure 4This is a schematic diagram showing the connection state between the electrode under test and the support portion of the electrode aging test apparatus according to the embodiments of this disclosure.

[0024] Figure 5 This is a schematic diagram showing the structure of the temperature control device of the electrode aging test apparatus according to the embodiments of this disclosure.

[0025] Figure 6 This is a schematic cross-sectional view showing the electrode aging test apparatus according to the embodiments of this disclosure in use.

[0026] Figure 7 This is a schematic diagram of the test instrument structure of the electrode aging test apparatus according to the embodiments of this disclosure.

[0027] Explanation of icon numbers:

[0028] 1…Electrode aging test device, 10…Bearing part, 11…Main body, 12…Connecting part, 121…Port, 13…Pad array, 14…Independent wire, 20…Electrode under test, 21…Connection end, 211…Electrode, 22…Test end, 221…Stimulation point, 23…Connecting cable, 24…Isolation layer, 30…Temperature control device, 31…Solution chamber, 32…Cover plate, 40…Test instrument, 41…Power supply line, 42…Circuit line, 43…Plug. Detailed Implementation

[0029] The present disclosure will now be described in further detail with reference to the accompanying drawings and specific embodiments. In the drawings, the same components or components having the same function are denoted by the same symbols, and repeated descriptions of them are omitted.

[0030] Figure 1 This is a schematic diagram showing the usage state of the electrode aging test apparatus 1 according to the embodiments of this disclosure.

[0031] like Figure 1As shown, the electrode aging test apparatus 1 disclosed herein may include a carrier 10, a test electrode 20, a temperature control device 30, and a testing instrument 40. The carrier 10 may include a main body 11 having a pad array 13 and a connecting part 12 connected to the main body 11. The pad array 13 is connected to the connecting part 12 via multiple independent wires 14. The test electrode 20 may include an access end 21 having a substrate and multiple electrodes 211 penetrating the substrate, a test end 22 having multiple stimulation points 221, and connecting cables 23 connecting the multiple electrodes 211 of the access end 21 to the multiple stimulation points 221 of the test end 22. The access end 21 is correspondingly connected to the pad array 13, and the multiple stimulation points 221 of the test end 22 are covered by an insulating layer 24. The temperature control device 30 may have a solution chamber 31 for holding liquid and is configured to accelerate the aging of the test end 22 by changing the temperature of the liquid. The testing instrument 40 may have a loop line 42 connected to the liquid and a power supply line 41 connected to the connection part 12. The loop line 42, the liquid, the electrode under test 20, multiple independent wires 14, the connection part 12 and the power supply line 41 form a loop, and the testing instrument 40 provides a test voltage to the electrode under test 20 through the connection part 12.

[0032] In the electrode aging test apparatus 1 disclosed herein, the carrier 10 is connected to the access end 21 of the electrode under test 20 via the pad array 13. The end under test 22 covered by the insulating layer 24 is immersed in the liquid contained in the temperature control device 30. The test instrument 40 supplies power to the electrode under test 20 and forms a circuit to generate current. Under these conditions, the electrode under test 20 can be subjected to aging test while energized, thereby improving the reliability of the aging test.

[0033] Figure 2 This is a schematic diagram showing the structure of the support portion 10 of the electrode aging test apparatus 1 according to the embodiments of this disclosure.

[0034] like Figure 2 As shown, in this embodiment, the carrier portion 10 may include a main body portion 11 having a pad array 13. In some examples, the main body portion 11 may be cuboid in shape. Specifically, the main body portion 11 may be a PCB board. Therefore, the required circuit patterns can be printed on the main body portion 11 as needed. Furthermore, in some examples, the PCB board may have a multi-layer structure. Therefore, the area of ​​the PCB board can be minimized as much as possible. In other examples, circuit patterns may be present on both sides of the PCB board.

[0035] In some examples, the pad array 13 can be a rectangular array. This allows it to be matched with the access terminal 21 of the electrode under test 20. In other examples, the pad array 13 can be disposed on both sides of the PCB board. This allows any one or more sides of the PCB board to be selected for soldering the access terminal 21 of the electrode under test 20.

[0036] In some examples, the pad array 13 can be disposed on the side of the PCB board away from the connection portion 12. This facilitates the connection of the electrode under test 20. In other examples, the pad array 13 can be disposed in the middle of the side of the PCB board away from the connection portion 12. This provides sufficient routing space for the multiple independent wires 14 connecting the pad array 13 to the multiple ports 121.

[0037] In this embodiment, the carrier portion 10 may include a connecting portion 12 connected to the main body portion 11 and having a plurality of ports 121. In some examples, the connecting portion 12 is elongated, and the plurality of ports 121 are arranged side by side in the connecting portion 12. This facilitates the connection of the test instrument 40 to the plurality of ports 121. In other examples, the connecting portion 12 may have 60 ports 121, arranged in two rows of 30 ports 121 each. In some examples, the ports 121 may be conductive metal sheets. In other examples, the ports 121 may be conductive sockets. In this case, the plurality of ports 121 can form a current in the circuit by connecting the test instrument 40 (described later).

[0038] In some examples, the pad array 13 may have the same number of pads as the ports 121 of the connection portion 12. This improves the utilization of the ports 121. In other examples, the pad array 13 may have the same number of pads as the plurality of electrodes 211 of the access terminal 21 in the electrode under test 20. In some examples, the pad array 13 may have the same shape as the arrangement of the plurality of electrodes 211 of the access terminal 21 in the electrode under test 20. This allows for better matching of the electrode under test 20.

[0039] In some examples, the pads in the pad array 13 are exposed on the PCB board surface. This allows for easy soldering to the electrode under test 20.

[0040] In this embodiment, the pad array 13 can be connected to multiple ports 121 via multiple independent wires 14. In some examples, the multiple independent wires 14 can be circuits disposed in the PCB board. In this case, the independent wires 14 can be disposed inside the PCB board, thereby enabling a stable connection between the ports 121 and the pads.

[0041] In some examples, multiple independent wires 14 can connect the multiple ports 121 of the connector 12 to the pad array 13 in a non-crossing manner. Specifically, the multiple independent wires 14 can be radially connected from the pad array 13 to the multiple ports 121. Thus, the multiple electrodes 211 of the access terminal 21 can be connected to their respective ports 121. In other examples, the multiple independent wires 14 can be interleaved in their connection to the multiple ports 121 of the connector 12 and the pad array 13.

[0042] Figure 3 This is a schematic diagram showing the structure of the electrode 20 to be tested in the electrode aging test apparatus 1 according to the embodiments of this disclosure. Figure 4 This is a schematic diagram showing the connection state between the electrode under test 20 and the support part 10 of the electrode aging test apparatus 1 according to the embodiments of this disclosure.

[0043] like Figure 3 , Figure 4 As shown, in this embodiment, the electrode under test 20 can be arranged on the support portion 10. In some examples, the electrode under test 20 can be arranged on the support portion 10 by means of bonding, snap-fitting, coupling, or welding. In some examples, the multiple electrodes 211 of the access terminal 21 can be soldered to the pad array 13 of the connection portion 12 by gold wire ball soldering. This allows for precise soldering of the solder points of the access terminal 21 to the pad array 13. In some examples, after the access terminal 21 is soldered to the pad array 13, a layer of adhesive can be applied. This further secures the access terminal 21 to the main body portion 11.

[0044] In some examples, the electrode under test 20 can be a multilayer structure. Specifically, the electrode under test 20 may include multiple metal wiring layers for routing and multiple insulating layers for insulation, with the insulating layers and metal wiring layers stacked alternately. In this case, the electrode under test 20 can arrange multiple conductive lines within a small area. In other examples, the insulating layers may be made of insulating materials, such as polyimide. In still other examples, the top and bottom layers of the electrode under test 20 may be insulating layers.

[0045] In this embodiment, the electrode under test 20 may include an access terminal 21 having a substrate and a plurality of electrodes 211 penetrating the substrate, the access terminal 21 being correspondingly connected to the pad array 13. In some examples, the plurality of electrodes 211 of the access terminal 21 may not be penetrating the substrate. In other examples, the plurality of electrodes 211 of the access terminal 21 are at least partially embedded in the substrate. In this case, the access terminal 21 can be soldered to the pad array 13 on the main body 11 through the side with the plurality of electrodes 211 embedded therein, thereby enabling the plurality of electrodes 211 to be connected to the pad array 13.

[0046] In some examples, the electrode under test 20 can be arranged on both sides of the main body 11. Thus, one carrier 10 can simultaneously measure two electrodes under test 20.

[0047] In this embodiment, the electrode to be tested 20 may have a test end 22 with multiple stimulation points 221. In some examples, the test end 22 may have the same size as the access end 21. In other examples, the test end 22 is slightly smaller than the access end 21. This makes it easier to distinguish between the access end 21 and the test end 22. In some examples, the stimulation points 221 on the test end 22 may be arranged in a through-hole manner. In other examples, the stimulation points 221 on the test end 22 may be arranged in an embedded manner. In some examples, the multiple stimulation points 221 on the test end 22 may have the same number as the multiple electrodes 211 of the access end 21. This allows each of the multiple electrodes 211 to be energized.

[0048] In this embodiment, the electrode under test 20 may have connecting cables 23 that connect multiple electrodes 211 of the access terminal 21 to multiple stimulation points 221 of the test terminal 22. In some examples, the connecting cables 23 may include multiple wires. Thus, each stimulation point 221 can have an independent line connected to the multiple electrodes 211 on the access terminal 21. In other examples, the connecting cables 23 may be a single wire. Thus, the entire test terminal 22 can be powered by energizing any one of the multiple electrodes 211.

[0049] In this embodiment, multiple stimulation points 221 of the test electrode 22 can be covered by the insulating layer 24. This improves the stability of the test electrode 22. In some examples, the insulating layer 24 can be silicone. This allows for insulation without isolating temperature and humidity, thus facilitating better aging tests of the test electrode 20. In some examples, the insulating layer 24 can be applied to the outer periphery of the test electrode 22 by injection molding, coating, spin coating, spraying, or other methods. In some examples, the insulating layer 24 can cover part of the connecting cable 23 and the test electrode 22. In other examples, the insulating layer 24 can cover the entire test cable and the test electrode 22. This further improves the stability of the test electrode 22.

[0050] Figure 5 This is a schematic diagram showing the structure of the temperature control device 30 of the electrode aging test apparatus 1 according to the embodiments of this disclosure. Figure 6 This is a schematic cross-sectional view showing the electrode aging test apparatus 1 according to the embodiments of this disclosure in its usage state.

[0051] like Figure 5 , Figure 6As shown, in this embodiment, the temperature control device 30 may have a solution chamber 31 for holding liquid. In some examples, the liquid may be physiological saline. Specifically, the physiological saline may be a 0.85–0.9% sodium chloride solution, for example, a 0.9% sodium chloride solution. This allows for the simulation of the environment inside the human body. In some examples, the solution chamber 31 may be cuboid, cylindrical, prismatic, or other irregular shapes. In some examples, the solution chamber 31 has an upward-facing opening. This facilitates the pouring of the solution or the immersion of the electrode 20 under test. In some examples, the solution chamber 31 may be made of transparent glass. In other examples, the solution chamber 31 may be made of an insulated box. This improves the temperature control effect and the reliability of the aging test.

[0052] In this embodiment, the terminal under test 22 can be immersed in a liquid. In some examples, the access terminal 21 of the electrode under test 20 is not in contact with the liquid. This reduces the possibility of a short circuit.

[0053] In this embodiment, the temperature control device 30 can be configured to accelerate the aging of the test end 22 by changing the temperature of the liquid. In some examples, the temperature control device 30 can have a thermometer. This allows for accurate control of the liquid temperature. In other examples, the temperature control device 30 can have a water level gauge. Specifically, the water level gauge can be, for example, a float-type water level gauge, a fiber optic water level gauge, a tracking water level gauge, a pressure-type water level gauge, or an acoustic water level gauge. This allows for observation of the water level within the solution chamber 31 via the water level gauge.

[0054] In some examples, the electrode aging test apparatus 1 may have a cover plate 32 with an opening that matches the temperature control device 30, through which the test end 22 of the electrode under test 20 passes and contacts the liquid. This improves the heat preservation effect of the temperature control device 30. In some examples, the cover plate 32 may have a groove for embedding the support portion 10. Specifically, the groove may have a width and length slightly larger than the support portion 10. Furthermore, the groove may have a through hole for the electrode under test 20 to pass through. In some examples, the through hole may have an inner diameter larger than the width of the groove. In this case, the support portion 10 can be fixed to the surface of the cover plate 32 by the groove, and the test end 22 of the electrode under test 20 can be immersed in the liquid in the solution chamber 31 through the through hole, thereby facilitating placement and stable testing. In addition, in some examples, the surface of the cover plate 32 may have multiple grooves. The grooves may be arranged in the same direction or randomly. In other examples, the cover plate 32 may also have an opening for the circuit line 42 to pass through. Additionally, in some examples, the cover plate 32 may also have a handle for easy lifting.

[0055] Figure 7This is a schematic diagram of the test instrument structure of the electrode aging test apparatus 1 according to the embodiments of this disclosure.

[0056] like Figure 7 As shown, in this embodiment, the testing instrument 40 may have a loop line 42 connected to the liquid and a power supply line 41 connected to the connection part 12. In some examples, the loop line 42 may include a metal rod for insertion into the liquid. In some examples, the testing instrument 40 may be a power supply. In some examples, the power supply line 41 may have parallel connectors 43. Thus, the connectors 43 can be connected to multiple carrier parts 10 simultaneously, so that the power supply line 41 can supply power to multiple carrier parts 10 simultaneously.

[0057] In this embodiment, the circuit 42, the liquid, the electrode under test 20, the multiple independent wires 14, the connector 12, and the power supply line 41 form a circuit, and the test instrument 40 provides a test voltage to the electrode under test 20 through the connector 12. In this case, current can be generated in the circuit, thereby enabling the electrode under test 20 to undergo an aging test while energized, thus improving the reliability of the aging test.

[0058] In some examples, the electrode aging test apparatus 1 may include an impedance testing device (not shown) connected to the connection portion 12. The impedance testing device detects the aging state of the electrode under test 20 by detecting the impedance of the electrode under test 20. Thus, the impedance of the electrode under test 20 can be measured at any time, thereby determining the aging state of the electrode under test 20.

[0059] In some examples, the aging state of the electrode under test 20 is determined by an electrode aging model, which includes the appearance and impedance of the electrode under test 20. In this case, the aging state of the electrode under test 20 can be determined by the aging model, and thus, the degree of aging of the electrode under test 20 can be determined by its appearance and impedance.

[0060] In some examples, the appearance of the electrode under test 20 includes at least one of the following: electrode discoloration, solder joint discoloration, polymer delamination, electrode circuit cracks, or channel changes. Polymer delamination refers to the separation of the multilayer structure of the electrode under test 20, specifically the separation of the insulating layer and the metal circuit layer. Therefore, the degree of aging of the electrode under test 20 can be determined by its appearance.

[0061] The specific embodiments involved in this disclosure will be further described below.

[0062] First, a pre-designed support portion 10 is prepared, which is a flat, elongated rectangle with a certain thickness. The connecting portion 12 is arranged along one long side, and the pad array 13 is arranged in the middle of the other long side.

[0063] Subsequently, the access terminal 21 of the electrode under test 20 is soldered to the pad array 13 by gold wire ball soldering, and glue is applied to the access terminal 21 to further fix the access terminal 21. Next, silicone is injected into the test terminal 22 of the electrode under test 20 and the connecting cable 23 near the test terminal 22 so that the silicone can completely cover the test terminal 22.

[0064] Then, the carrier part 10 with the electrode to be tested 20 is placed on the cover plate 32 of the temperature control device 30. The temperature control device 30 contains physiological saline. At this time, the end 22 of the electrode to be tested 20 is immersed in the physiological saline of the temperature control device 30 through the through hole on the cover plate 32, and the carrier part 10 is engaged with the groove on the cover plate 32.

[0065] Finally, the power supply line 41 is connected to the connection part 12 of the carrier part 10, and the loop line 42 is brought into contact with the liquid in the solution chamber 31 to form a loop. Under constant temperature, the impedance of the electrode under test 20 is observed and recorded by the impedance testing device over a period of time, and its appearance is observed. The aging state of the electrode under test 20 is judged by combining the aging model.

[0066] While the present disclosure has been specifically described above in conjunction with the accompanying drawings and embodiments, it is to be understood that the above description does not limit the present disclosure in any way. Those skilled in the art can make modifications and variations to the present disclosure as needed without departing from its essential spirit and scope, and all such modifications and variations fall within the scope of the present disclosure.

Claims

1. A method for electrode aging test, characterized in that, include: Prepare a carrier part, the carrier part including a main body part having a pad array and a connecting part connected to the main body part, the connecting part including multiple ports, and the pad array being connected to the multiple ports via multiple independent wires; The access end of the electrode to be tested is arranged in the bearing part and connected to the main body. The electrode to be tested is a flexible electrode and includes an access end having a substrate and multiple electrodes disposed on the substrate, a test end having multiple stimulation points, and a connecting cable connecting the multiple electrodes of the access end to the multiple stimulation points of the test end. The access end is correspondingly connected to the pad array. The carrier with the electrode to be tested is placed on the cover plate of the temperature control device, and the test end of the electrode to be tested is immersed in the liquid in the solution chamber of the temperature control device through the through hole in the cover plate. Multiple stimulation points of the test end are covered with silicone. The silicone has an insulating effect but does not isolate temperature and humidity. Connect the power supply line in the testing instrument to the connection part, and connect the circuit line in the testing instrument to the liquid; The testing instrument supplies a test voltage to the electrode under test through the connection, so that the circuit, the liquid, the electrode under test, the multiple independent wires, the connection and the power supply line form a circuit and generate current in the circuit.

2. The method according to claim 1, characterized in that: It also includes connecting the connection part to an impedance testing device, which detects the aging state of the electrode under test by detecting the impedance of the electrode under test.

3. The method according to claim 2, characterized in that: It also includes real-time observation and recording of the impedance of the electrode under test using the impedance testing device, observation of the appearance of the electrode under test, and determination of the aging state of the electrode under test in combination with the electrode aging model, wherein the electrode aging model includes the appearance of the electrode under test and the impedance of the electrode under test.

4. The method according to claim 3, characterized in that: The appearance of the electrode under test includes at least one of the following: electrode discoloration, solder joint discoloration, polymer delamination, or electrode line cracks.

5. The method according to claim 1, characterized in that: The liquid is physiological saline.

6. The method according to claim 1, characterized in that: The cover plate has an opening and is matched with the temperature control device, through which the test end of the electrode to be tested is passed to contact the liquid.

7. The method according to claim 6, characterized in that: The cover plate has a groove, into which the supporting part is embedded.

8. The method according to claim 1, characterized in that: The electrode to be tested is arranged on the support part by means of bonding, snap-fitting or welding.

9. The method according to claim 1, characterized in that: The access point is soldered to the pad array using gold wire ball soldering.

10. The method according to claim 1, characterized in that: Before immersing the test end in the liquid, the test end is covered with silicone.

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