一种提高离子迁移谱检测灵敏度的离子门控制方法

By periodically controlling the voltage of the BNG metal wire to switch the position of the ion clearing zone, the problem of ion loss during BNG gate closing is solved, achieving highly sensitive detection of ion mobility spectrometry, avoiding incomplete gate closing and ion flow leakage, and making it highly applicable.

CN116598185BActive Publication Date: 2026-07-17DALIAN INSTITUTE OF CHEMICAL PHYSICS CHINESE ACADEMY OF SCIENCES

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
DALIAN INSTITUTE OF CHEMICAL PHYSICS CHINESE ACADEMY OF SCIENCES
Filing Date
2022-12-02
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In existing ion mobility spectrometry detection, ion loss is caused by the ion clearing region generated when the Bradbury-Nielsen type ion gate (BNG) is closed, which reduces the detection sensitivity. Furthermore, existing improved methods suffer from incomplete shut-off or require complex high-voltage power supplies.

Method used

By periodically and synchronously controlling the voltage applied to the two sets of metal wires in the BNG, the position of the ion clearing region is switched to eliminate the influence of the ion clearing region on detection. A gradient voltage distribution is formed by using a ring electrode and a voltage divider resistor chain to achieve high-sensitivity detection of the ion gate.

Benefits of technology

It effectively eliminates ion loss caused by the ion clearing zone, achieves non-discriminatory and highly sensitive detection of ions with different mobility, avoids incomplete gate closing and ion flow leakage, and has low requirements for high voltage power supply and strong applicability.

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Abstract

本发明公开一种提高离子迁移谱检测灵敏度的离子门控制方法。通过周期性同步控制BNG两组金属丝上所施加的电压,对BNG开启之前和开启之后的两种关门状态中其两侧所产生的离子清空区进行位置切换,消除BNG开门注入离子过程中离子清空区所造成的离子损耗,实现迁移率K不同离子的无歧视、高灵敏检测。本发明仍然利用两组金属丝之间的径向电场实现BNG关门,可有效避免关门不完全、离子流泄露的现象,同时对离子门脉冲高压电源要求低,普适性强。
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