An annealing method, system, device, and storage medium based on pulsed current.
Patent Information
- Application Number
- CN202310836774.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-07-07
- Publication Date
- 2026-09-01
- Estimated Expiration
- 2043-07-07
AI Technical Summary
这种方法存在周期长、能耗高等效率低下的问题
[0026]本申请通过夹具将样品安装在脉冲电源输出线正负极上;确定输入的电脉冲参数,对所述样品通脉冲电流,实现在低温度下促使马氏体转变成奥氏体。通过研究发现脉冲电流对不锈钢中马氏体逆向变为奥氏体有显著促进效果,能够降低动态再结晶问题,提高材料的性能,从而达到退火的目的。在样品两端接脉冲电流,其中电脉冲提高不锈钢塑性是通过促进其回复再结晶实现的,即使金属从塑性较差的变形态转变到塑性较好的组织均匀的状态,通过调节脉冲电流实现对样品材料塑性的提高。
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Figure CN116622941B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of annealing process technology, and in particular to an annealing method, system, device, and storage medium based on pulsed current. Background Technology
[0002] Currently, in industry, the traditional annealing process involves heat treatment, where metal is placed in an annealing furnace or heating device, heated to a certain temperature, held for a sufficient time, and then cooled at an appropriate rate. This method suffers from inefficiency due to its long cycle time and high energy consumption. Existing technologies for improving the plasticity of stainless steel involve optimizing the heat treatment process, specifically adjusting the annealing temperature and time. However, this adjustment method requires strict control over temperature and time, resulting in a low tolerance for errors during the process.
[0003] Therefore, how to improve the efficiency of annealing is a technical problem that urgently needs to be solved by those skilled in the art. Summary of the Invention
[0004] To address the aforementioned issues, this application provides an annealing method, system, device, and storage medium based on pulsed current, in order to improve the efficiency of the annealing process.
[0005] To address the above problems, the technical solutions provided in this application are as follows:
[0006] The first aspect of this application provides an annealing method based on pulsed current, comprising:
[0007] The sample is mounted on the positive and negative terminals of the pulse power supply output line using a clamp;
[0008] The input electrical pulse parameters are determined, and a pulse current is applied to the sample to induce the transformation of martensite into austenite at a low temperature.
[0009] Optionally, determining the input electrical pulse parameters and applying a pulse current to the sample includes:
[0010] The surface temperature of the sample is measured using a thermometer. When the surface temperature of the sample meets the preset conditions, the surface temperature of the sample is measured and recorded, and the changes in the metallographic structure of the sample are observed.
[0011] Optionally, after mounting the sample onto the positive and negative terminals of the pulse power supply output line using the clamp, the method further includes:
[0012] The angle of the pad is adjusted to ensure that the sample does not come into contact with the ground.
[0013] Optionally, determining the input electrical pulse parameters and applying a pulse current to the sample includes:
[0014] Enter the electrical pulse parameters in the pulse power supply operation page. After confirming that the electrical pulse parameters are set correctly, start applying the pulse current.
[0015] Optionally, the electrical pulse parameters include duty cycle and frequency.
[0016] Optionally, observing changes in the metallographic structure of the sample includes:
[0017] The changes in metallographic structure were observed using an optical microscope, and the metallographic structure of the sample before and after energization was compared.
[0018] Optionally, determining the input electrical pulse parameters and applying a pulse current to the sample includes:
[0019] By comparing the tensile strength of the sample material before and after energizing, the pulsed current improves the plasticity of the sample material.
[0020] A second aspect of this application provides an annealing system based on pulsed current, comprising:
[0021] The mounting unit is used to mount the sample onto the positive and negative terminals of the pulse power supply output line using a clamp.
[0022] The pulse current control unit is used to determine the input electrical pulse parameters and apply a pulse current to the sample to induce the transformation of martensite into austenite at low temperature.
[0023] A third aspect of this application provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, it implements the pulse current-based annealing method described in any one of the first aspects above.
[0024] A fourth aspect of this application provides a computer-readable storage medium storing instructions that, when executed on a terminal device, cause the terminal device to perform the pulse current-based annealing method as described in any of the preceding first aspects.
[0025] Compared with the prior art, this application has the following beneficial effects:
[0026] This application uses a clamp to mount the sample onto the positive and negative terminals of a pulsed power supply output line; determines the input electrical pulse parameters, and applies a pulsed current to the sample to induce the transformation of martensite into austenite at a low temperature. Research has shown that pulsed current significantly promotes the reverse transformation of martensite to austenite in stainless steel, reducing dynamic recrystallization problems, improving material properties, and thus achieving the purpose of annealing. By applying a pulsed current to both ends of the sample, the electrical pulse improves the plasticity of stainless steel by promoting its recovery recrystallization, transforming the metal from a less plastic deformed state to a more plastic and homogeneous state. Adjusting the pulsed current enhances the plasticity of the sample material. Attached Figure Description
[0027] To more clearly illustrate the technical solutions in this embodiment or the prior art, the drawings used in the description of the embodiment or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0028] Figure 1 A flowchart of an annealing method based on pulsed current provided in an embodiment of this application;
[0029] Figure 2 This is a schematic diagram of an electrical pulse processing scenario provided in an embodiment of this application;
[0030] Figure 3 A schematic diagram of pulse current provided in an embodiment of this application;
[0031] Figure 4 This is a schematic diagram of a test result provided in an embodiment of this application;
[0032] Figure 5 A structural diagram of an annealing system based on pulsed current provided in an embodiment of this application;
[0033] Figure 6 A schematic diagram of a computer-readable medium provided for an embodiment of this application;
[0034] Figure 7 This is a schematic diagram of the hardware structure of a server provided in an embodiment of this application. Detailed Implementation
[0035] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.
[0036] To facilitate understanding of the technical solutions provided in the embodiments of this application, the background technology involved in the embodiments of this application will be described below.
[0037] As mentioned earlier, the current industrial method for improving the plasticity of stainless steel is to optimize its heat treatment process, specifically by adjusting the annealing temperature and time. Research in this area is relatively mature, leaving little room for improvement. Furthermore, the traditional annealing process involves placing the metal in an annealing furnace or heating device, heating it to a certain temperature, holding it for a sufficient time, and then cooling it at an appropriate rate. This method suffers from problems such as long cycle time, high energy consumption, and environmental unfriendliness. Therefore, exploring and optimizing the processing technology of the corresponding stainless steel strips and sheets is of greater research significance.
[0038] Currently, the industrial annealing process involves heating the metal to a certain temperature, holding it for a sufficient time, and then cooling it at an appropriate rate. The annealing equipment used is an annealing furnace or heating device. This annealing method breaks through the existing annealing processes and models. Analysis of the processed data reveals that pulsed current has a significant promoting effect on the reverse transformation of martensite to austenite in stainless steel, which can reduce dynamic recrystallization problems, improve material properties, and thus achieve the purpose of annealing.
[0039] The method provided in this application embodiment can be executed by a control system, for example, by a control system server. The control system server can be a single server device or a server cluster consisting of multiple servers.
[0040] To address this issue, this application uses a fixture to mount the sample onto the positive and negative terminals of a pulsed power supply output line; determines the input electrical pulse parameters, and applies a pulsed current to the sample to induce the transformation of martensite into austenite at low temperatures. Research has shown that pulsed current significantly promotes the reverse transformation of martensite to austenite in stainless steel, reducing dynamic recrystallization problems, improving material properties, and thus achieving the purpose of annealing. By applying a pulsed current to both ends of the sample, the electrical pulse enhances the plasticity of stainless steel by promoting its recovery recrystallization, transforming the metal from a less plastic deformed state to a more plastic and homogeneous microstructure. Adjusting the pulsed current improves the plasticity of the sample material.
[0041] To facilitate understanding of the pulse current-based annealing method provided in the embodiments of this application, the following scenario examples of this application are described.
[0042] The following embodiment illustrates an annealing method based on pulsed current provided in this application. See also... Figure 1 ,Should Figure 1 The flowchart of an annealing method based on pulsed current provided in this application embodiment shows that the execution subject of this method can be a server, or more specifically, a control system within the server. In one possible implementation, the execution subject of this method can also be a human. The method includes:
[0043] S101: Mount the sample onto the positive and negative terminals of the pulse power supply output line using a clamp.
[0044] The sample can be a test sample, and the material of the sample can be stainless steel. In practical applications, the sample can be installed on the positive and negative terminals of the pulse power supply output line using bolts or clamps of the fixture. The fixing method in this solution can be adapted to actual needs; this is only an example and does not limit the protection range.
[0045] In practical applications, prepare an energized sample and securely mount it to the positive and negative terminals of the pulse power supply output line using the bolts of the clamp. For more information on the application scenarios of the clamp, sample, and pulse power supply, please refer to [link to relevant documentation]. Figure 2 , Figure 2 This is a schematic diagram of an electrical pulse processing scenario provided in an embodiment of this application. The positive and negative terminals of the pulse power supply are connected to a clamp, which is used to fix the sample. The pulse current in the diagram can be found in [reference needed]. Figure 3 , Figure 3 The diagram shows a pulse current provided in the embodiments of this application, where T1 represents the high-level time, T2 represents the low-level time, T represents the period time, the frequency is the number of cycles within 1 second, and the duty cycle is the proportion of the high-level time within 1 cycle.
[0046] S102: Determine the input electrical pulse parameters, apply a pulse current to the sample, and induce the transformation of martensite into austenite at a low temperature.
[0047] By applying pulsed current to both ends of cold-rolled stainless steel strips and sheets, and adjusting the pulse parameters—duty cycle and frequency—optimal material plasticity for stainless steel of various thicknesses can be achieved. Electrical pulses improve the plasticity of stainless steel by promoting its recovery recrystallization, transforming the metal from a less plastic deformed state to a more plastic and homogeneous microstructure. In practical applications, test results of some electrically pulsed samples show that pulsed current can induce the transformation of martensite into austenite at lower temperatures. The martensite-to-austenite transformation rate varies depending on the parameter settings used for pulsed treatment.
[0048] In one possible implementation, determining the input electrical pulse parameters and applying a pulse current to the sample includes:
[0049] The surface temperature of the sample is measured using a thermometer. When the surface temperature of the sample meets the preset conditions, the surface temperature of the sample is measured and recorded, and the changes in the metallographic structure of the sample are observed.
[0050] In one possible implementation, after mounting the sample onto the positive and negative terminals of the pulse power supply output line using a clamp, the method further includes:
[0051] The angle of the pad is adjusted to ensure that the sample does not come into contact with the ground.
[0052] In practical applications, a pad can be used to adjust the angle to ensure that the energized sample does not contact the ground. Other devices can also be used to adjust the angle; the selection of devices can be adjusted according to actual needs and is not limited here.
[0053] In one possible implementation, determining the input electrical pulse parameters and applying a pulse current to the sample includes:
[0054] Enter the electrical pulse parameters in the pulse power supply operation page. After confirming that the electrical pulse parameters are set correctly, start applying the pulse current.
[0055] The electrical pulse parameters include duty cycle and frequency. To verify the correctness of the electrical pulse parameter settings, an alarm module can be configured. For example, a normal value range can be set to a to b. When the entered electrical pulse parameters do not conform to the preset value range, an alarm is issued and power is prohibited under the current condition. The alarm can be a horn or a flashing indicator light. In practical applications, the alarm form, normal value range, and whether power can be supplied can be adjusted according to actual needs.
[0056] In one possible implementation, observing changes in the metallographic structure of the sample includes:
[0057] The changes in metallographic structure were observed using an optical microscope, and the metallographic structure of the sample before and after energization was compared.
[0058] Comparative samples annealed with and without electrical pulse annealing were examined using an optical microscope to observe changes in their metallographic structure. The conclusion is that electrical pulse annealing can lower the recrystallization temperature of 304 stainless steel. The electrical pulse sample showed the highest elongation at 65.6%, compared to 1.3% before treatment. The pulsed current can promote the transformation of martensite into austenite at a lower temperature. Observing the changes in the metallographic structure before and after the experiment, it was found that conventional heat treatment typically requires at least 1000℃ for half an hour to induce recrystallization in 304 stainless steel, while pulsed current can induce recrystallization at a lower temperature and for a shorter time.
[0059] In one possible implementation, determining the input electrical pulse parameters and applying a pulse current to the sample includes:
[0060] By comparing the tensile strength of the sample material before and after energizing, the pulsed current improves the plasticity of the sample material.
[0061] By comparing the tensile test forces of the samples before and after the experiment, it was found that electrical pulse treatment can increase the elongation of the original 304 stainless steel by up to 26%, from 35% before treatment to 61% after treatment. Compared with cold-rolled 304 stainless steel, the elongation of the electro-pulse treatment increases by up to 60%.
[0062] The electrical pulse treatment method can promote the solid-state phase transformation of metals. This stage of the experiment also proved that the electrical pulse has a promoting effect on the recovery recrystallization of 304 stainless steel. It can improve the plasticity of stainless steel to a high level in a short time and at a low temperature (the elongation after fracture can reach up to 70%). Figure 4 This is a schematic diagram of a test result provided in an embodiment of this application. The test results of some electrical pulse samples show that the pulse current can promote the transformation of martensite into austenite at a lower temperature. The transformation rate of martensite to austenite varies depending on the parameters of the pulse treatment of the material.
[0063] The above are some specific implementations of the pulse current-based annealing method provided in the embodiments of this application. Based on this, this application also provides a corresponding system for pulse current-based annealing. The system provided in the embodiments of this application will be described below from the perspective of functional modularity. Figure 5 This is a structural diagram of an annealing system based on pulsed current provided in an embodiment of this application.
[0064] The system includes:
[0065] Mounting unit 201 is used to mount the sample onto the positive and negative terminals of the pulse power output line using a clamp;
[0066] The pulse current control unit 202 is used to determine the input electrical pulse parameters and apply a pulse current to the sample to induce the transformation of martensite into austenite at a low temperature.
[0067] Optionally, the pulse current control unit is used for:
[0068] The surface temperature of the sample is measured using a thermometer. When the surface temperature of the sample meets the preset conditions, the surface temperature of the sample is measured and recorded, and the changes in the metallographic structure of the sample are observed.
[0069] Optional, also includes:
[0070] An angle adjustment unit is used to adjust the angle based on the pad block to ensure that the sample does not contact the ground.
[0071] Optionally, the pulse current control unit is used for:
[0072] Enter the electrical pulse parameters in the pulse power supply operation page. After confirming that the electrical pulse parameters are set correctly, start applying the pulse current.
[0073] Optionally, the electrical pulse parameters include duty cycle and frequency.
[0074] Optionally, observing changes in the metallographic structure of the sample includes:
[0075] The changes in metallographic structure were observed using an optical microscope, and the metallographic structure of the sample before and after energization was compared.
[0076] Optionally, the pulse current control unit is specifically used to compare the tensile force of the sample material before and after energizing, and the pulse current improves the plasticity of the sample material.
[0077] This application also provides corresponding devices and computer storage media for implementing the pulse current-based annealing method provided in this application.
[0078] The device includes a memory and a processor. The memory stores instructions or code, and the processor executes the instructions or code to cause the device to perform the pulse current-based annealing method described in any embodiment of this application.
[0079] The computer storage medium stores code, and when the code is executed, the device running the code implements the pulse current-based annealing method described in any embodiment of this application.
[0080] The functions described above in this document can be performed, at least in part, by one or more hardware logic components. For example, exemplary types of hardware logic components that can be used, without limitation, include: Field Programmable Gate Arrays (FPGAs), Application-Specific Integrated Circuits (ASICs), Application Standard Products (ASSPs), System-on-Chip (SoCs), Complex Programmable Logic Devices (CPLDs), and so on.
[0081] like Figure 6 As shown, Figure 6 This is a schematic diagram of a computer-readable medium provided in an embodiment of this application. This embodiment provides a computer-readable medium 300 on which a computer program 311 is stored. When the computer program 311 is executed by a processor, it implements the above-described... Figure 1 The steps of the pulse current-based annealing method.
[0082] It should be noted that, in the context of this application, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. Machine-readable media can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.
[0083] It should be noted that the machine-readable medium described above in this application can be a computer-readable signal medium or a computer-readable storage medium, or any combination of the two. A computer-readable storage medium can be, for example,—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of a computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this application, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. In this application, a computer-readable signal medium can include a data signal propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals can take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. A computer-readable signal medium can be any computer-readable medium other than a computer-readable storage medium, which can send, propagate, or transmit a program for use by or in connection with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium can be transmitted using any suitable medium, including but not limited to: wires, optical fibers, RF (radio frequency), etc., or any suitable combination thereof.
[0084] The aforementioned computer-readable medium may be included in the aforementioned electronic device; or it may exist independently and not assembled into the electronic device.
[0085] Please see Figure 7 , Figure 7This is a schematic diagram of the hardware structure of a server provided in an embodiment of this application. The server 400 can vary significantly due to different configurations or performance. It may include one or more central processing units (CPUs) 422 (e.g., one or more processors) and memory 432, and one or more storage media 430 (e.g., one or more mass storage devices) for storing application programs 440 or data 444. The memory 432 and storage media 430 can be temporary or persistent storage. The program stored in the storage media 430 may include one or more modules (not shown in the diagram), each module may include a series of instruction operations on the server. Furthermore, the CPU 422 may be configured to communicate with the storage media 430 and execute the series of instruction operations stored in the storage media 430 on the server 400.
[0086] Server 400 may also include one or more power supplies 426, one or more wired or wireless network interfaces 450, one or more input / output interfaces 458, and / or one or more operating systems 441, such as Windows Server™, Mac OS X™, Unix™, Linux™, FreeBSD™, etc.
[0087] The steps performed by the pulse current-based annealing method in the above embodiments can be based on this... Figure 7 The server structure shown.
[0088] It should also be noted that, according to the embodiments of this application, the above... Figure 1 The process of the pulsed current-based annealing method described in the flowchart can be implemented as a computer software program. For example, embodiments of this application include a computer program product comprising a computer program carried on a non-transitory computer-readable medium, the computer program containing instructions for performing the above-described... Figure 1 The program code for the method shown in the flowchart.
[0089] Although the subject matter has been described using language specific to structural features and / or methodological logic, it should be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or actions described above. Rather, the specific features and actions described above are merely illustrative examples of implementing the claims.
[0090] While several specific implementation details are included in the foregoing discussion, these should not be construed as limiting the scope of this application. Certain features described in the context of individual embodiments may also be implemented in combination in a single embodiment. Conversely, various features described in the context of a single embodiment may also be implemented individually or in any suitable sub-combination in multiple embodiments.
[0091] The above description is merely a preferred embodiment of this application and an explanation of the technical principles employed. Those skilled in the art should understand that the scope of disclosure in this application is not limited to technical solutions formed by specific combinations of the above-described technical features, but should also cover other technical solutions formed by arbitrary combinations of the above-described technical features or their equivalents without departing from the above-described concept. For example, technical solutions formed by substituting the above features with (but not limited to) technical features with similar functions disclosed in this application.
Claims
1. An annealing method based on pulsed current, characterized in that, include: The sample is mounted on the positive and negative terminals of the pulse power supply output line using a clamp. The sample is a cold-rolled stainless steel strip or sheet made of 304 stainless steel, and the martensite in the sample is cold-rolled deformation-induced martensite. The input electrical pulse parameters are determined, and a pulse current is applied to the sample to induce the transformation of martensite into austenite at a low temperature. After applying the pulse current, forced water cooling is not performed, so that the austenite is retained. After the electrical pulse treatment, the elongation of the sample increases by up to 60%.
2. The method according to claim 1, characterized in that, The determination of the input electrical pulse parameters and the application of a pulse current to the sample include: The surface temperature of the sample is measured using a thermometer. When the surface temperature of the sample meets the preset conditions, the surface temperature of the sample is measured and recorded, and the changes in the metallographic structure of the sample are observed.
3. The method according to claim 1, characterized in that, After mounting the sample onto the positive and negative terminals of the pulse power supply output line using a clamp, the process further includes: The angle of the pad is adjusted to ensure that the sample does not come into contact with the ground.
4. The method according to claim 1, characterized in that, The determination of the input electrical pulse parameters and the application of a pulse current to the sample include: Enter the electrical pulse parameters in the pulse power supply operation page. After confirming that the electrical pulse parameters are set correctly, start applying the pulse current.
5. The method according to claim 1, characterized in that, The electrical pulse parameters include duty cycle and frequency.
6. The method according to claim 2, characterized in that, The observation of changes in the metallographic structure of the sample includes: The changes in metallographic structure were observed using an optical microscope, and the metallographic structure of the sample before and after energization was compared.
7. The method according to claim 1, characterized in that, The determination of the input electrical pulse parameters and the application of a pulse current to the sample include: By comparing the tensile strength of the sample material before and after energizing, the pulsed current improves the plasticity of the sample material.
8. An annealing system based on pulsed current, characterized in that, The system includes: The mounting unit is used to mount the sample on the positive and negative terminals of the pulse power supply output line using a clamp. The sample is a cold-rolled stainless steel strip or sheet made of 304 stainless steel, and the martensite in the sample is cold-rolled deformation-induced martensite. The pulse current control unit is used to determine the input electrical pulse parameters and apply a pulse current to the sample to induce the transformation of martensite into austenite at a low temperature. After applying the pulse current, forced water cooling is not performed, so that the austenite can be retained. After the electrical pulse treatment, the elongation of the sample can be increased to up to 60%.
9. An electronic device, characterized in that, include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, implements the pulse current-based annealing method as described in any one of claims 1-7.
10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores instructions that, when executed on a terminal device, cause the terminal device to perform the pulse current-based annealing method as described in any one of claims 1-7.