基于逻辑回归的医疗设备不良事件风险分级模型及其应用
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- 山东省立第三医院
- Filing Date
- 2023-05-23
- Publication Date
- 2026-07-17
AI Technical Summary
Current technologies for assessing the risk level of adverse events from medical devices lack scientific and objective data support, making it impossible to achieve automatic grading. This results in significant biases in the evaluation results and an inability to quickly and accurately identify high-risk signals.
A risk grading model for adverse events of medical devices based on logistic regression is adopted. By acquiring and processing adverse event report information of medical devices, extracting key parameters, constructing a dataset of risk level influencing factors, and using the logistic regression model for risk grading, automatic classification is achieved.
It provides an interpretable, objective, and unified risk level assessment model, which improves the accuracy and efficiency of adverse event monitoring for medical devices, can quickly identify high-risk signals, and reduces reliance on the technical skills of monitoring personnel.
Smart Images
Figure CN116628590B_ABST