Spectrometer and its assembly method

Abstract

This application provides a spectrometer and its assembly method. The spectrometer includes a base, a light input element, a beam splitter, an image sensor, and a blocking element. The light input element is disposed on the base and is used to receive optical signals. The beam splitter is disposed on the base and is used to separate the optical signals received by the light input element into multiple spectral components. The image sensor is disposed on the base and has a sensing surface for receiving these spectral components. The sensing surface has a virtual center line extending in the alignment direction of these spectral components. The blocking element is disposed between the beam splitter and the image sensor according to optical influencing factors, and is located on the projection path of a portion of these spectral components, blocking a portion of these spectral components to suppress the portion with excessive light intensity. The shadow cast by the blocking element on the sensing surface does not fall on the virtual center line.

Description

Technical Field

[0001] This application relates to the technical field of optical measurement devices, and more particularly to a spectrometer and its assembly method. Background Technology

[0002] A spectrometer is a scientific instrument that uses optical principles to break down complex light into spectral lines. Spectrometers can observe, analyze, and process the structure and composition of substances, offering advantages such as high analytical precision, a wide measurement range, high speed, and small sample requirements. Therefore, the resolution of molecular characteristics, concentration measurement, substance identification, and astronomical spectrum measurement all require the assistance of a spectrometer. Furthermore, spectrometers are widely used in various fields, including metallurgy, geology, petrochemicals, medicine and health, environmental protection, resource and hydrological surveying, and more.

[0003] However, due to the influence of the initial spectrum of the input optical signal, the spectral dispersive efficiency of the grating for each wavelength of light, and the photosensitive efficiency of the image sensor for each wavelength of light, the spectrometer may experience excessive energy in a certain wavelength range, thus failing to achieve the expected measurement results. Summary of the Invention

[0004] This application provides a spectrometer capable of suppressing excessively high light intensity portions in spectral components.

[0005] This application provides a spectrometer, including a base, a light input element, a beam splitter, an image sensor, and a blocking element. The light input element is disposed on the base and is used to receive optical signals. The beam splitter is disposed on the base and is used to incident the optical signals received by the light input element to separate the optical signals into multiple spectral components. The image sensor is disposed on the base and has a sensing surface for receiving these spectral components, wherein the sensing surface has a virtual center line extending in the alignment direction of these spectral components. The blocking element is disposed between the beam splitter and the image sensor according to optical influencing factors and is located on a portion of the projection path of these spectral components, blocking a portion of these spectral components to suppress excessively high light intensity portions, wherein the shadow cast by the blocking element on the sensing surface does not fall on the virtual center line.

[0006] In one embodiment of this application, the sensing surface extends on the base and has two ends, wherein the shadow cast by the occluding element on the sensing surface does not fall on the two ends.

[0007] In one embodiment of this application, the occlusion element is directly attached to the image sensor, or located relatively close to or far from the base.

[0008] In one embodiment of this application, the spectrometer further includes a mounting assembly. A blocking element is disposed on the mounting assembly, and the mounting assembly is disposed on the base, such that the blocking element is mounted on the base via the mounting assembly.

[0009] In one embodiment of this application, the mounting assembly has an adjustment structure to adjust the setting angle or setting position of the shielding element relative to the base or cover, or to adjust the setting position of the shielding element in the direction parallel to the sensing surface, or to adjust the setting position of the shielding element between the cover and the base.

[0010] In one embodiment of this application, optical influencing factors include at least one of the initial spectrum of the optical signal, the beam splitting efficiency of the beam splitter for each wavelength of light, and the photosensitivity of the image sensor for each wavelength of light.

[0011] In one embodiment of this application, the blocking element is an opaque sheet, a light-reducing sheet, or a filter.

[0012] In one embodiment of this application, the shape of the blocking element varies according to optical influencing factors.

[0013] In one embodiment of this application, the blocking element includes a plurality of different blocking plates, which are alternatively disposed at a fixed position between the beam splitter and the image sensor according to optical influence factors, wherein these blocking plates are different in shape, size or tilt angle relative to the base.

[0014] In one embodiment of this application, the spectrometer further includes a mounting assembly, on which a shielding element is disposed. The mounting assembly is disposed on a base such that the shielding element is mounted on the base via the mounting assembly. The mounting assembly has an adjustment structure for adjusting the setting angle or setting position of the shielding element relative to the base or cover, or adjusting the setting position of the shielding element in a direction parallel to the sensing surface, or adjusting the setting position of the shielding element between the cover and the base. The sensing surface extends on the base and has two ends, wherein the shadow cast by the shielding element on the sensing surface does not fall on the two ends. Optical influencing factors include at least one of the source of the optical signal, the dispersive efficiency of the beam splitter for these spectral components of different wavelengths, and the photosensitivity of the image sensor for these spectral components of different wavelengths. The shielding element includes a plurality of dissimilar shielding plates, which are alternatively disposed at fixed positions between the beam splitter and the image sensor according to the optical influencing factors, wherein these shielding plates differ in shape, size, or tilt angle relative to the base.

[0015] This application also provides a spectrometer, including a base, a light input element, a mirror, a plane grating, a focusing lens, an image sensor, a blocking element, and a mounting assembly. The light input element is disposed on the base for receiving optical signals. The mirror is disposed on the base for incident and reflecting the optical signals received by the light input element. The plane grating is disposed on the base for incident and reflecting the optical signals reflected by the mirror, and for separating the optical signals into multiple spectral components. The focusing lens is disposed on the base for focusing these spectral components separated by the plane grating. The image sensor is disposed on the base and has a sensing surface for receiving these spectral components focused by the focusing lens, wherein the sensing surface extends on the base and has a virtual center line extending in the alignment direction of these spectral components and two ends. The blocking element is disposed between the focusing lens and the image sensor according to optical influencing factors. The blocking element is an opaque sheet located on a portion of the projection path of these spectral components, blocking a portion of these spectral components to suppress excessively high light intensity portions of these spectral components. The shadow cast by the occluding element on the sensing surface does not fall on the virtual center line or either end. A mounting assembly is disposed on the base, and the occluding element is disposed on the mounting assembly, such that the occluding element is mounted on the base via the mounting assembly. The mounting assembly has an adjustment structure to adjust the setting angle or setting position of the occluding element relative to the base.

[0016] This application also provides a method for assembling a spectrometer, comprising the following steps: A spectrometer is provided, including a base, a light input element, a beam splitter, and an image sensor. The light input element is disposed on the base. The beam splitter is disposed on the base. The image sensor is disposed on the base and has a sensing surface. The sensing surface has a virtual center line extending in the alignment direction of these spectral components. An optical signal is provided to the light input element, wherein the light input element separates the optical signal into multiple spectral components, and the image sensor receives these spectral components to generate a spectral signal, the spectral signal reflecting optical influencing factors. A blocking element is disposed between the beam splitter and the image sensor, and is located on a portion of the projection path of these spectral components. Based on the spectral signal, the position of the blocking element is adjusted or the blocking element is replaced with another blocking element different from the blocking element, to suppress excessively high light intensity portions in the spectral signal and to prevent the shadow cast by the blocking element on the sensing surface from falling on the virtual center line.

[0017] In one embodiment of this application, after adjusting the position of the shielding element or replacing it with another shielding element, the assembly method of the spectrometer further includes fixing the shielding element or another shielding element to the base.

[0018] In summary, the spectrometer provided in this application can block part of the spectral components by using a blocking element disposed between the spectroscopic element and the image sensor, thereby suppressing the part of the spectral components with excessively high light intensity. Attached Figure Description

[0019] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0020] Figure 1 A perspective view of a spectrometer according to an embodiment of this application is shown;

[0021] Figure 2 The drawing is as follows Figure 1 A top view of the spectrometer;

[0022] Figure 3 (A) in the diagram is used to represent Figure 1 A schematic diagram showing the relative relationship between the shielding element and the image sensor of the spectrometer;

[0023] Figure 3 (B) in the middle is drawn as Figure 1 A side view of the spectrometer showing the change in divergence angle before and after the shielding element is set;

[0024] Figure 4 The drawing is as follows Figure 1 The spectrum of the spectrometer;

[0025] Figure 5 (A) in the diagram is used to represent Figure 1 A top view of the spectrometer without any obstruction elements;

[0026] Figure 5 (B) in the diagram is used to represent Figure 5 The spectrometer spectrum of (A) in the image;

[0027] Figure 6 (A) in the diagram is used to represent Figure 1 The spectrometer will place the obscuring element close to the top view of the image sensor setup;

[0028] Figure 6 (B) in the diagram is used to represent Figure 6 The spectrometer spectrum of (A) in the image;

[0029] Figure 7 (A) in the diagram is used to represent Figure 1 The spectrometer will shield the components away from the top view of the image sensor setup;

[0030] Figure 7 (B) in the diagram is used to represent Figure 7 The spectrometer spectrum of (A) in the image;

[0031] Figure 8 (A) in the diagram is used to represent Figure 1 The side view of the spectrometer without any obstruction elements;

[0032] Figure 8 (B) in the diagram is used to represent Figure 8 The spectrometer spectrum of (A) in the image;

[0033] Figure 9 (A) in the diagram is used to represent Figure 1 The spectrometer sets the obscuring element to a side view at the first height;

[0034] Figure 9 (B) in the diagram is used to represent Figure 9 The spectrometer spectrum of (A) in the image;

[0035] Figure 10 (A) in the diagram is used to represent Figure 1 The spectrometer sets the shielding element as a side view at a second height;

[0036] Figure 10 (B) in the diagram is used to represent Figure 10 The spectrometer spectrum of (A) in the image;

[0037] Figure 11 Drawing for representation Figure 1 The spectrometer replaces the blocking element with a schematic diagram of another shape;

[0038] Figure 12 Drawing for representation Figure 1 A schematic diagram of a spectrometer with the shielding element placed outside the image sensor;

[0039] Figure 13 Drawing for representation Figure 1 A schematic diagram of the spectrometer rotating the blocking element by a first angle;

[0040] Figure 14 Drawing for representation Figure 1 The spectrometer uses multiple shielding elements, with the first shielding element rotated by a second angle.

[0041] Figure 15 Drawing for representation Figure 1 A schematic diagram of the spectrometer rotating the blocking element by a third angle; and

[0042] Figure 16 The drawing is as follows Figure 1 A flowchart of the assembly method for the spectrometer. Detailed Implementation

[0043] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0044] Figure 1 The illustration shows a perspective view of a spectrometer according to an embodiment of this application. Figure 2 The drawing is as follows Figure 1 A top view of the spectrometer. Please refer to... Figure 1 and Figure 2 The spectrometer 100 includes a base 110, a light input element 120, a beam splitter 130, an image sensor 140, and a blocking element 150. The light input element 120 is disposed on the base 110 and is used to receive an optical signal L. The beam splitter 130 is disposed on the base 110 and is used to receive the optical signal L received by the light input element 120, and to separate the optical signal L into multiple spectral components S. In this embodiment, the spectrometer 100 may further include a reflector M1 disposed on the base 110, used to receive the optical signal L received by the light input element 120 and reflect it to the beam splitter 130. The beam splitter 130 is, for example, a planar grating, used to receive the optical signal L reflected by the reflector M1, and to separate the optical signal L into multiple spectral components S. In another embodiment not shown, the beam splitter 130 may also be a concave grating, and is not limited thereto. An image sensor 140 is disposed on a base 110 and has a sensing surface 142 for receiving these spectral components S. In this embodiment, the spectrometer 100 may further include a focusing lens M2 disposed on the base 110 for focusing the spectral components S separated by the beam splitter 130. The image sensor 140 can then receive the spectral components S focused by the focusing lens M2. A blocking element 150 is disposed between the beam splitter 130 and the image sensor 140 according to optical influencing factors, and is located on the projection path of a portion of these spectral components S, blocking a portion of these spectral components S to suppress the portion of these spectral components S with excessively high light intensity. In this embodiment, optical influencing factors include at least one of the initial spectrum of the optical signal L, the beam splitting efficiency of the beam splitter 130 for each wavelength of light, the reflectivity of the mirror M1 and the focusing lens M2, and the photosensitivity of the image sensor 140 for each wavelength of light. For example, a spectral component S with excessive light intensity refers to a spectral component S with light intensity greater than a certain threshold, which can be determined based on optical influencing factors.

[0045] Specifically, the blocking element 150 is located between the focusing lens M2 and the image sensor 140, and can be an opaque film, a neutral density filter, or a filter to block a portion of the spectral component S focused by the focusing lens M2. Furthermore, the spectrometer 100 may also include a mounting assembly 160. The blocking element 150 is disposed on the mounting assembly 160, and the mounting assembly 160 is disposed on the base 110, such that the blocking element 150 is mounted on the base 110 via the mounting assembly 160. The mounting assembly 160 may also have an adjustment structure 162 to adjust the setting angle or setting position of the blocking element 150 relative to the base 110, or to adjust the setting position of the blocking element 150 in the direction parallel to the sensing surface 142, or to adjust the blocking element 150 away from or closer to the base 110. In this embodiment, the adjustment structure 162 consists of at least one locking fastener 162A and at least one guide groove 162B, so that the locking fastener 162A and the guide groove 162B cooperate to guide the blocking element 150 to move, position, and fix it in the X or Z direction. In another embodiment not shown, the blocking element 150 may be directly attached to the image sensor 140, or may be moved along the Y direction to a position relatively close to or away from the base 110.

[0046] Figure 3 (A) in the diagram is used to represent Figure 1 A schematic diagram showing the relative relationship between the shielding element of the spectrometer and the image sensor. Please refer to... Figure 3 In (A), the sensing surface 142 has a virtual center line A extending in the arrangement direction of these spectral components S, wherein the shadow cast by the occluding element 150 on the sensing surface 142 does not fall on the virtual center line A. Although Figure 3 In diagram (A), the virtual center line A is shown as a straight line, but it is actually a virtual line connecting the centers of the spectral components S of each wavelength, and can be a curve depending on the light pattern. It is worth noting that since the shadow cast by the blocking element 150 on the sensing surface 142 does not fall on the virtual center line A where the light intensity is higher, the numerical aperture is reduced, improving the resolution of the blocked band. Furthermore, the sensing surface 142 extends on the base 110 and has two ends 142a. The shadow cast by the blocking element 150 on the sensing surface 142 may also not fall on either end 142a. Since the spectral components received at the ends 142a are generally weaker, the feature that the shadow cast by the blocking element 150 on the sensing surface 142 does not fall on either end 142a also prevents a decrease in resolution.

[0047] Figure 3 (B) in the middle is drawn as Figure 1 A side view showing the change in divergence angle before and after setting up the shielding element on the spectrometer. Please refer to... Figure 3In (B), the divergence angle θ1 of the optical path after the shielding element 150 is set in the spectrometer 100 is smaller than the divergence angle θ0 of the optical path before the shielding element 150 is set. Therefore, the optical resolution corresponding to the divergence angle θ1 will be greater than the optical resolution corresponding to the divergence angle θ0. That is to say, in this embodiment (i.e., when the shielding element 150 is not directly attached to the image sensor 140), since the focusing numerical aperture is reduced due to the shielding element 150, the numerical aperture is reduced, the imaging aberration is reduced, and the optical resolution of the shielded band is improved.

[0048] Figure 4 The drawing is as follows Figure 1 The spectrum of the spectrometer. Please refer to... Figure 4 The spectrum includes two spectral curves, C0 and C1. Spectral curve C0 presents experimental data without the obstruction element 150 on the spectrometer 100, while spectral curve C1 presents experimental data with the obstruction element 150 on the spectrometer 100. As can be seen from the figure, in the wavelength range Δλ... A (In the wavelength range of approximately 220~280nm), compared to spectral curve C0, the excessively high light intensity portions in spectral curve C1 are significantly suppressed without exceeding the maximum light sensitivity of the image sensor 140. Therefore, it is possible to further increase the light intensity of other wavelengths by integrating the time, thereby improving the overall balance of light intensity. Furthermore, within the wavelength range Δλ... A Outside of this range, the optical resolution of the spectral curves C0 and C1 is, for example, 0.5 nm. However, within the wavelength range Δλ... A Within this range, the optical resolution of spectral curve C0 is, for example, 0.5 nm, and the optical resolution of spectral curve C1 is, for example, 0.3 nm. That is, within the wavelength range Δλ... A Within the range, the optical resolution corresponding to spectral curve C1 is higher than that of spectral curve C0.

[0049] Figure 5 (A) in the diagram is used to represent Figure 1 The top view of the spectrometer without any obstruction elements. Figure 5 (B) in the diagram is used to represent Figure 5 The spectrum of the spectrometer in (A) is shown below. Please refer to [reference needed]. Figure 5 (A) and Figure 5 (B) in the text is for ease of explanation. Figure 5 (A) only schematically illustrates the focusing lens M2, the image sensor 140, and the spectral component S focused on the sensing surface 142, and Figure 5 The spectral curve C2 in (B) is represented by a straight line (vertical axis I is light intensity, horizontal axis λ is wavelength). Figure 6 (A) in the diagram is used to represent Figure 1The spectrometer will obscure the components near the top view of the image sensor setup. Figure 6 (B) in the diagram is used to represent Figure 6 The spectrum of the spectrometer in (A) is shown below. Please refer to it for comparison. Figure 5 (A) and Figure 6 (A) in Figure 6 In section (A), an obstruction element 150A is provided near the image sensor 140. Please refer to the reference for further details. Figure 5 (B) in Figure 6 As shown in (B), the wavelength range Δλ0 in spectral curve C3 is suppressed from light intensity I0 to light intensity I1 compared to spectral curve C2.

[0050] Figure 7 (A) in the diagram is used to represent Figure 1 The spectrometer will obscure the components away from the top view of the image sensor setup. Figure 7 (B) in the diagram is used to represent Figure 7 The spectrum of the spectrometer in (A) is shown below. Please refer to it for comparison. Figure 6 (A) and Figure 7 (A) in the middle, compared to Figure 6 The blocking element 150A in (A) is... Figure 7 In (A), a blocking element 150B is provided that is located away from the image sensor 140 (i.e., relatively close to the focusing lens M2). Please refer to the reference. Figure 6 (B) in Figure 7 As shown in (B), the wavelength range Δλ1 in spectral curve C4 is smaller than the wavelength range Δλ0 in spectral curve C4 compared to spectral curve C3. In other words, both blocking elements 150A and 150B suppress light intensity I0 to light intensity I1, but the range of wavelengths they block differs. With the size and shape remaining constant, the closer blocking elements 150A and 150B are to the focusing lens M2, the wider the range of wavelengths they block (i.e., the gentler the angle of spectral blocking) and the higher the percentage of light intensity they block. Conversely, with the size and shape remaining constant, the closer blocking elements 150A and 150B are to the image sensor 140, the narrower and more precise the range of wavelengths they block (i.e., the more vertical the angle of spectral blocking) and the lower the percentage of light intensity they block.

[0051] Figure 8 (A) in the diagram is used to represent Figure 1 The side view of the spectrometer does not include any obstruction elements. Figure 8 (B) in the diagram is used to represent Figure 8 The spectrum of the spectrometer in (A) is shown. For ease of explanation, Figure 8 (A) only schematically illustrates the focusing lens M2, the image sensor 140, and the spectral component S focused on the sensing surface 142, and Figure 8 The spectral curve C5 in (B) is represented by a straight line (vertical axis I is light intensity, horizontal axis λ is wavelength). Figure 9 (A) in the diagram is used to represent Figure 1 The spectrometer sets the obscuring element to the first height of the side view. Figure 9 (B) in the diagram is used to represent Figure 9 The spectrum of the spectrometer in (A) is shown below. Please refer to it for comparison. Figure 8 (A) and Figure 9 (A) in Figure 9 In (A), a blocking element 150C with a first height (i.e., the dimension in the Y direction) is provided, and the first height is approximately the same as the height of the center of the spectral component S. Please refer to the reference. Figure 8 (B) in Figure 9 As shown in (B), the wavelength range in spectral curve C6 is suppressed from light intensity I0 to light intensity (i.e., approximately 50% of the light intensity is suppressed) compared to spectral curve C5.

[0052] Figure 10 (A) in the diagram is used to represent Figure 1 The spectrometer sets the obscuring element as a side view at a second height. Figure 10 (B) in the diagram is used to represent Figure 10 The spectrum of the spectrometer in (A) is shown below. Please refer to it for comparison. Figure 9 (A) and Figure 10 (A) in the middle, compared to Figure 9 The blocking element 150C in (A) is... Figure 10 In (A), a second height (i.e., the dimension in the Y direction) of the occlusion element 150D is provided, wherein the second height of the occlusion element 150D is smaller than the first height of the occlusion element 150C. Please refer to the reference. Figure 9 (B) in Figure 10 In (B), the result is that in the wavelength range Δλ1 of the spectral curve C7, the light intensity I' is suppressed to a higher intensity than that of the light intensity I in the spectral curve C6. 50% In other words, both blocking element 150C and blocking element 150D suppress the light intensity within the same wavelength range Δλ1, but the percentage of light intensity suppressed differs. With the size, shape, and position of blocking elements 150C and 150D remaining unchanged, the first height of blocking element 150C is higher, resulting in a higher percentage of suppressed light intensity; conversely, the second height of blocking element 150D is lower, resulting in a lower percentage of suppressed light intensity. Please refer to [further details]. Figure 9 (A) and Figure 10In (A), since the spectral component S is focused by the focusing lens M2, the spectral component S becomes narrower the closer it is to the image sensor 140 (i.e., the size in the Y direction). Therefore, as the blocking elements 150C and 150D move closer to the image sensor 140, it becomes more difficult to adjust the required percentage of suppressed light intensity (e.g., 20%) by changing the height.

[0053] Figure 11 Drawing for representation Figure 1 The spectrometer shows a diagram where the blocking element has been replaced with another shape. Please refer to the diagram for comparison. Figure 3 (A) and Figure 11 Compared to Figure 3 The occlusion element 150 in (A) is a regular shape, such as a rectangle. Figure 11 The occlusion element 150E is trapezoidal. Alternatively, the occlusion element 150E can be directly attached to the image sensor 140, or positioned either close to or away from the image sensor 140. In another embodiment not shown, the occlusion element 150E can also be selected in a gradient or other irregular shape depending on optical influence factors.

[0054] Figure 12 Drawing for representation Figure 1 A schematic diagram showing that the spectrometer places the blocking element outside the image sensor. Please refer to... Figure 12 The blocking element 150F can be disposed on the base 110, extending upward from the outside of the base 110 and the image sensor 140, then extending towards the image sensor 140 until it reaches the position corresponding to the wavelength range to be blocked, and then extending downward. Those skilled in the art will also understand that the extension angle does not necessarily have to be completely vertical or horizontal, and can be determined according to optical influencing factors.

[0055] Figure 13 Drawing for representation Figure 1 The diagram shows the spectrometer rotating the blocking element by a first angle. Please refer to it. Figure 3 (A) and Figure 14 150G shielding element and Figure 3 In (A), the occlusion element 150 is also rectangular, but relative to the occlusion element 150, the occlusion element 150G is rotated by a first angle in the XY plane, where the first angle is a multiple of 90 degrees. Figure 14 Drawing for representation Figure 1 The spectrometer uses multiple shielding elements, with a first shielding element rotated by a second angle, as shown in the schematic diagram. Please refer to... Figure 14The blocking element 150H may include a first blocking plate 150H1 and a second blocking plate 150H2. In this embodiment, the first blocking plate 150H1 is rotated by a second angle in the XZ plane. Because the blocking element 150H is closer to the image sensor 140, the more accurate the band range of the blocked spectral component S is, and closer to the focusing lens M2, the easier it is to adjust the percentage of light intensity to be suppressed. Therefore, by setting the first blocking plate 150H1 and the second blocking plate 150H2 at different positions between the focusing lens M2 and the image sensor 140, coarse and fine adjustments can be made according to optical image factors and requirements to obtain the desired effect. Furthermore, in another embodiment not shown, the blocking element 150H may include multiple different blocking plates, which may be alternatively arranged at fixed positions between the beam splitter 130 and the image sensor 140 according to optical influence factors. These different blocking plates may differ in shape, size, or tilt angle relative to the base. After replacing the obscuring plate with a different one to achieve the desired optical effect, it can be fixed to the base 110 by applying adhesive or locking to ensure that the same optical effect can be maintained in subsequent use.

[0056] Figure 15 Drawing for representation Figure 1 The diagram shows the spectrometer rotating the blocking element by a third angle. Please refer to it. Figure 10 (A) and Figure 15 Shielding element 150I and Figure 10 The height dimensions of the blocking element 150D in (A) are similar, but the blocking element 150I is tilted relative to the base 110 (i.e., rotated by a third angle relative to the YZ plane). Although Figures 13-15 The diagrams illustrate the rotation of the blocking element relative to different single planes. However, in another embodiment not shown, the blocking element may also tilt or rotate at different angles on two or more planes depending on optical influences and requirements, and is not limited thereto.

[0057] Figure 16 The drawing is as follows Figure 1 The flowchart illustrates the assembly method of the spectrometer. Those skilled in the art will understand that variations of the spectrometer 100 in the foregoing embodiments can all be summarized into a single spectrometer assembly method, and the design can be modified or adjusted as needed, without limitation. Please refer to... Figure 16 and Figure 1 The following will be coordinated Figure 1 Spectrometer 100 Description Figure 16The assembly process, the assembly details of which have been described in the foregoing embodiments, will not be repeated here. First, step S110 is performed, providing a spectrometer 100, including a base 110, a light input element 120, a beam splitter 130, and an image sensor 140. In this embodiment, in step S110, the aforementioned or other optical components can be assembled and positioned first. Next, step S120 is performed, providing an optical signal L into the light input element 120, where the beam splitter 130 separates the optical signal L into spectral components S. The image sensor 140 receives these spectral components S and generates a spectral signal (not shown), which reflects optical influencing factors. Next, step S130 is performed, placing a blocking element 150 between the beam splitter 130 and the image sensor 140, located on a portion of the projection path of these spectral components S. Then, in step S140, based on the spectral signal, the position of the blocking element 150 is adjusted or the blocking element 150 is replaced with another blocking element (not shown) different from the blocking element 150, in order to suppress the portion of the spectral signal with excessive light intensity and to prevent the shadow cast by the blocking element 150 on the sensing surface 142 from falling on the virtual center line A. In this embodiment, the position of the blocking element 150 can be determined by... Figure 1 The installation components 160 can be adjusted, or adjustments can be made manually or using fixtures; this is not a limitation. It is worth mentioning that, since spectrometers will have individual differences based on the different batches of components, this embodiment reflects the actual optical influencing factors of the spectrometer through the spectral signal, and then, by adjusting or replacing appropriate shielding components, the excessively high light intensity in the spectral signal can be suppressed, thereby reducing the impact of individual differences in the spectrometer.

[0058] Optionally, proceed to step S150 to fix the blocking element 150 or another blocking element to the base 110. That is, after adjusting the position of the blocking element 150 or replacing it with a different blocking element to obtain the desired optical effect, it can be fixed to the base 110 by applying adhesive or locking to ensure that a consistent optical effect can be maintained in subsequent use. Of course, the blocking element 150 or another blocking element can be fixed to the base 110 directly or indirectly through components such as the mounting assembly 160, and this is not limited.

[0059] In summary, the spectrometer provided in this application, by using a shielding element disposed between the spectroscopic element and the image sensor, can block part of the spectral components, thereby suppressing the excessively high light intensity portions of the spectral components. Furthermore, by employing different arrangements of the shielding element, this application can overcome the adverse effects of various optical influencing factors, effectively achieving the desired optical effect.

[0060] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0061] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are protected by this application.

Claims

1. A spectrometer, characterized in that, include: Base; An optical input element is disposed on the base for receiving optical signals; A beam splitter is disposed on the base and is used to receive the optical signal received by the optical input element and to separate the optical signal into multiple spectral components. An image sensor, disposed on the base, has a sensing surface for receiving the plurality of spectral components. The sensing surface has a virtual center line extending in the arrangement direction of the plurality of spectral components. The virtual center line is a virtual line connecting the centers of the plurality of spectral components at each wavelength. The plurality of spectral components determine high-intensity wavelength ranges and non-high-intensity wavelength ranges based on an initial spectrum. The high-intensity wavelength range is the wavelength range where the light intensity of the plurality of spectral components is greater than a threshold. The sensing surface further has a virtual vertical line perpendicular to the virtual center line, and a virtual plane perpendicular to the sensing surface is defined along the virtual vertical line. A blocking element is disposed between the beam splitter and the image sensor. The blocking element is an opaque sheet and is located on the projection path of the high-intensity wavelength range of the plurality of spectral components in the direction of the virtual center line, but not on the projection path of the non-high-intensity wavelength range of the plurality of spectral components. The shadow cast by the blocking element on the sensing surface falls on the portion of the sensing surface corresponding to the high-intensity wavelength range, but does not fall on the portion of the sensing surface corresponding to the non-high-intensity wavelength range, thereby suppressing excessively high light intensity portions of the plurality of spectral components. The optical paths of the non-high intensity wavelength ranges in the plurality of spectral components form a first divergence angle on the virtual plane, and the optical paths of the high intensity wavelength ranges in the plurality of spectral components form a second divergence angle on the virtual plane. The first divergence angle remains unchanged after the spectrometer is equipped with the blocking element, and the second divergence angle decreases after the spectrometer is equipped with the blocking element.

2. The spectrometer according to claim 1, characterized in that, The sensing surface extends on the base and has two ends, wherein the shadow cast by the shading element on the sensing surface does not fall on the two ends.

3. The spectrometer according to claim 1, characterized in that, It further includes a mounting assembly, on which the shielding element is disposed, wherein the mounting assembly is disposed on the base such that the shielding element is mounted on the base via the mounting assembly.

4. The spectrometer according to claim 3, characterized in that, The mounting assembly has an adjustment structure for adjusting the setting angle or setting position of the blocking element relative to the base, or adjusting the setting position of the blocking element in a direction parallel to the sensing surface, or adjusting the blocking element to be relatively far away from or close to the base.

5. The spectrometer according to claim 1, characterized in that, The shape of the occlusion element corresponds to the initial spectrum as a regular shape, an irregular shape, or a gradient shape.

6. The spectrometer according to claim 1, characterized in that, The blocking element includes a plurality of different blocking plates, which are alternatively disposed at fixed positions between the beam splitter and the image sensor according to the initial spectrum, wherein the plurality of blocking plates are different in shape, size or tilt angle relative to the base.

7. The spectrometer according to claim 1, characterized in that, It further includes a mounting assembly, on which the shielding element is disposed, wherein the mounting assembly is disposed on the base such that the shielding element is mounted on the base via the mounting assembly; The mounting assembly has an adjustment structure for adjusting the setting angle or setting position of the blocking element relative to the base or a cover, or for adjusting the setting position of the blocking element in a direction parallel to the sensing surface; The sensing surface extends on the base and has two ends, wherein the shadow cast by the shading element on the sensing surface does not fall on the two ends; and The blocking element includes a plurality of different blocking plates, which are alternatively disposed at fixed positions between the beam splitter and the image sensor according to the initial spectrum, wherein the plurality of blocking plates are different in shape, size or tilt angle relative to the base.

8. The spectrometer according to claim 1, characterized in that, It further includes a focusing lens, disposed on the base and located between the beam splitter and the image sensor, for focusing the plurality of spectral components separated by the beam splitter onto the image sensor, wherein the blocking element is not disposed at the focal length of the focusing lens.

9. A spectrometer, characterized in that, include: Base; An optical input element is disposed on the base for receiving optical signals; A reflector, disposed on the base, is used to incident and reflect the optical signal received by the light input element; A planar grating is disposed on the base for incident optical signals reflected by the mirror, and for separating the optical signals into multiple spectral components; A focusing lens, disposed on the base, is used to focus the multiple spectral components separated by the planar grating; An image sensor is disposed on the base and has a sensing surface for receiving the plurality of spectral components focused by the focusing lens. The sensing surface extends on the base and has a virtual center line extending in the arrangement direction of the plurality of spectral components and two ends. The virtual center line is a virtual line connecting the centers of the plurality of spectral components of each wavelength. The plurality of spectral components determine a high-intensity wavelength range and a non-high-intensity wavelength range according to an initial spectrum. The high-intensity wavelength range is the wavelength range in which the light intensity of the plurality of spectral components is greater than a threshold. The sensing surface further has a virtual vertical line perpendicular to the virtual center line, and a virtual plane perpendicular to the sensing surface is defined along the virtual vertical line. A blocking element is disposed between the focusing lens and the image sensor according to optical influencing factors. The blocking element is an opaque sheet and is located on the projection path of the high light intensity wavelength range of the multiple spectral components in the direction of the virtual center line, and not on the projection path of the non-high light intensity wavelength range of the multiple spectral components, so as to suppress the part of the multiple spectral components with excessive light intensity. The optical path of the non-high light intensity wavelength range of the multiple spectral components forms a first divergence angle on the virtual plane, and the optical path of the high light intensity wavelength range of the multiple spectral components forms a second divergence angle on the virtual plane. The first divergence angle remains unchanged after the spectrometer is equipped with the blocking element, and the second divergence angle decreases after the spectrometer is equipped with the blocking element. as well as The mounting assembly is disposed on the base, and the shielding element is disposed on the mounting assembly, such that the shielding element is mounted on the base via the mounting assembly. The mounting assembly has an adjustment structure for adjusting the setting angle or setting position of the shielding element relative to the base.

10. A method for assembling a spectrometer, characterized in that, include: Provide spectrometers, including: Base; An optical input element is disposed on the base; A beam-splitting element is disposed on the base; and An image sensor is mounted on the base and has a sensing surface; An optical signal is provided to the optical input element, wherein the beam splitter separates the optical signal into multiple spectral components, the image sensor receives the multiple spectral components and generates a spectral signal, wherein the sensing surface has a virtual center line extending in the arrangement direction of the multiple spectral components, wherein the virtual center line is a virtual line connecting the centers of the multiple spectral components of each wavelength, the multiple spectral components determine a high light intensity wavelength range and a non-high light intensity wavelength range according to an initial spectrum, wherein the high light intensity wavelength range is the wavelength range of the multiple spectral components where the light intensity is greater than a threshold, wherein the sensing surface further has a virtual vertical line perpendicular to the virtual center line, and a virtual plane perpendicular to the sensing surface is defined along the virtual vertical line; An obstruction element is positioned between the beam splitter and the image sensor, and is located on a portion of the projection path of the plurality of spectral components; Based on the spectral signal, the position of the blocking element is adjusted or the blocking element is replaced with another blocking element different from the blocking element, wherein the blocking element and the other blocking element are opaque sheets to suppress the part of the spectral signal with excessive light intensity. The light path of the non-high light intensity wavelength range of the plurality of spectral components forms a first divergence angle on the virtual plane, and the light path of the high light intensity wavelength range of the plurality of spectral components forms a second divergence angle on the virtual plane. The first divergence angle remains unchanged after the spectrometer sets the blocking element, and the second divergence angle decreases after the spectrometer sets the blocking element.

11. The method for assembling a spectrometer according to claim 10, after adjusting the position of the shielding element or replacing it with another shielding element, further includes fixing the shielding element or the other shielding element to the base.

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